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Journal articles on the topic 'Bright-field/dark-field imaging'

Author: Grafiati

Published: 4 June 2021

Last updated: 14 February 2022

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1

Herring, R. A., and M. E. Twigg. "High-Resolution Bright-Field and Dark-Field Hollow Cone Illumination." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 36–37. http://dx.doi.org/10.1017/s0424820100178938.

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Hollow cone illumination using a large C2 blocked-aperture (bl apt) in the conventional TEM (CTEM) can remove the beams within the zero-order Laue zone (ZOLZ) thereby making lattice images more simply interpretable. Dark-field (DF) hollow cone illumination has the added advantage of enhancing the Z-contrast within the lattice image, since the electrons contributing to the image must be scattered over a large angle (approximately 10 mrad). Both of these imaging methods have been explored, using a 600 um C2 bl apt and objective aperture sizes of 70, 20 and 10 um, and are reported in this paper.M

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Patel, Binay, Raymond Pearson, and Masashi Watanabe. "Bright field and dark field STEM-IN-SEM imaging of polymer systems." Journal of Applied Polymer Science 131, no. 19 (2014): n/a. http://dx.doi.org/10.1002/app.40851.

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3

Helvoort, A. T. J. van, B. S. Tanem, and R. Holmestad. "Annular bright and dark field imaging of soft materials." Journal of Physics: Conference Series 26 (February 22, 2006): 42–45. http://dx.doi.org/10.1088/1742-6596/26/1/010.

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Patel, B. S., and M. Watanabe. "Simultaneous Bright Field and Dark Field STEM-IN-SEM Imaging of Polymer Nanocomposites." Microscopy and Microanalysis 19, S2 (2013): 362–63. http://dx.doi.org/10.1017/s1431927613003802.

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Mitsuishi, K., A. Hashimoto, M. Takeguchi, M. Shimojo, and K. Ishizuka. "Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy." Ultramicroscopy 111, no. 1 (2010): 20–26. http://dx.doi.org/10.1016/j.ultramic.2010.08.004.

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6

Vanfleet, R. R. "Toward Quantitative Annular Dark Field Imaging." Microscopy and Microanalysis 7, S2 (2001): 188–89. http://dx.doi.org/10.1017/s143192760002701x.

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Annular Dark Field imaging has the potential to be directly quantifiable. By this I mean that with careful measurement, the absolute image intensity has physical meaning. Unlike Bright Field TEM, the ADF image has no contrast reversals with focus and with the exception of thick specimens there are no contrast reversals with changes in thickness. Thus, image intensity is related to thickness, composition, orientation, and structure of local regions whose size is determined by the electron probe. The ability to extract quantitative information about the specimen from the intensity requires caref

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Sugimoto, Ryo, Ryoji Maruyama, and Wataru Watanabe. "Acquisition of Multi-Modal Images of Structural Modifications in Glass with Programmable LED-Array-Based Illumination." Applied Sciences 9, no. 6 (2019): 1136. http://dx.doi.org/10.3390/app9061136.

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Ultrashort laser pulses can induce structural modifications in bulk glass, leading to refractive index change and scattering damage. As bright-field, dark-field, and phase imaging each provide complementary information about laser-induced structures, it is often desired to use multiple observations simultaneously. As described herein, we present the acquisition of bright-field, dark-field, and differential phase-contrast images of structural modifications induced in glass by femtosecond laser pulses with an LED array microscope. The contrast of refractive index change can be enhanced by differ

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Xu, Jun, Yoshio Matsui, Tsuyoshi Kimura, and Yoshinori Tokura. "Dark‐field and bright‐field imaging of charge order domains in Nd0.5Ca0.5(Mn0.98Cr0.02)O3." Journal of Electron Microscopy 51, suppl 1 (2002): S155—S158. http://dx.doi.org/10.1093/jmicro/51.supplement.s155.

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9

Zhang, J. P. "Structures and defects identified by dark-field HREM." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (1992): 124–25. http://dx.doi.org/10.1017/s0424820100121028.

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The tilted illumination dark field high resolution imaging technique was applied to structures and defects of semiconductors and superconductors. We used a Hitachi-H9000 top entry microscope with a high resolution pole-piece of Cs=0.9 mm, operated at 300 Kv. Proper apertures, tilting angle and imaging conditions were chosen to minimize the phase shift due to aberrations. Since the transmitted beam was moved outside the aperture, the noise ratio was greatly reduced, which resulted in a significant enhancement of image contrast and apparent resolution. Images are not difficult to interpret if th

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Kheireddine, Sara, Ayyappasamy Sudalaiyadum Perumal, Zachary J. Smith, Dan V. Nicolau, and Sebastian Wachsmann-Hogiu. "Dual-phone illumination-imaging system for high resolution and large field of view multi-modal microscopy." Lab on a Chip 19, no. 5 (2019): 825–36. http://dx.doi.org/10.1039/c8lc00995c.

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11

Liu, Yang, and Tang Huiming. "A digital processing method for obtaining dark-field HREM image." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 730–31. http://dx.doi.org/10.1017/s0424820100155621.

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The contrast of images can be increased by use of dark-field HREM. But in comparison with bright-field imaging, the increased exposure times required will result in more serious radiation damage effects on the specimen. This work is to develop a method to obtain computing dark-field images from bright-field images by use of computer processing, which can overcome the shortcome above.For A weak phase object,σϕ≤1, the transmission function can be written as[1].(1)Assuming that the amplitude of an incident wave is unity, the distribution of amplitude on the back focal plane of an ideal lens is(2)

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12

Ando, Masami, Anton Maksimenko, Hiroshi Sugiyama, Wanwisa Pattanasiriwisawa, Kazuyuki Hyodo, and Chikao Uyama. "Simple X-Ray Dark- and Bright-Field Imaging Using Achromatic Laue Optics." Japanese Journal of Applied Physics 41, Part 2, No. 9A/B (2002): L1016—L1018. http://dx.doi.org/10.1143/jjap.41.l1016.

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13

Eugui, Pablo, Danielle J. Harper, Antonia Lichtenegger, et al. "Polarization-sensitive imaging with simultaneous bright- and dark-field optical coherence tomography." Optics Letters 44, no. 16 (2019): 4040. http://dx.doi.org/10.1364/ol.44.004040.

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14

Leroux, F., E. Bladt, J. P. Timmermans, G. Van Tendeloo, and S. Bals. "Annular Dark-Field Transmission Electron Microscopy for Low Contrast Materials." Microscopy and Microanalysis 19, no. 3 (2013): 629–34. http://dx.doi.org/10.1017/s1431927613000020.

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AbstractImaging soft matter by transmission electron microscopy (TEM) is anything but straightforward. Recently, interest has grown in developing alternative imaging modes that generate contrast without additional staining. Here, we present a dark-field TEM technique based on the use of an annular objective aperture. Our experiments demonstrate an increase in both contrast and signal-to-noise ratio in comparison to conventional bright-field TEM. The proposed technique is easy to implement and offers an alternative imaging mode to investigate soft matter.

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15

Wang, Z. L. "Diffraction contrast and Huang scattering in dark-field imaging of diffusely scattered electrons." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 974–75. http://dx.doi.org/10.1017/s0424820100172607.

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It has been demonstrated that dark-field, atomic number sensitive images can be obtained either inscanning transmission electron microscopy (STEM) using a high-angle annular dark field detector (HAADF) or in transmission electron microscopy (TEM) using an on-axis objective aperture under the hollow cone beam illumination. The images are formed using the high-angle diffusely scattered electrons presuming that the high angle Bragg reflections are weak. Diffuse scattering can be generated by both thermal diffuse scattering (TDS) and Huang scattering, The local lattice distortion due to the presen

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Patel, B. S., and M. Watanabe. "Simultaneous Bright Field and Dark Field STEM-IN-SEM Imaging of Hard-Soft Composites and Crystalline Materials." Microscopy and Microanalysis 19, S2 (2013): 390–91. http://dx.doi.org/10.1017/s1431927613003942.

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17

Liu, R. J., and J. M. Cowley. "Dark-Field and Marginal Imaging with a Thin-Annular Detector in STEM." Microscopy and Microanalysis 2, no. 1 (1996): 9–19. http://dx.doi.org/10.1017/s1431927696210098.

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The use of a thin annular detector in a scanning transmission electron microscope is shown, theoretically and experimentally, to allow several imaging modes that may be of value for the study of thin specimens. The diffraction pattern on the detector plane may be expanded or contracted by means of post-specimen lenses to vary the collection angle of the thin annular detector to form dark- or bright-field images. Dark-field images obtained from annuli of various radii in the diffraction pattern can selectively reveal different components of the sample, as illustrated in the case of a sample con

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18

Piper, Jörg. "Improved Techniques For Imaging Of Three-Dimensional Transparent Specimens In Advanced Darkfield And Interference Contrast Modes." Microscopy Today 17, no. 3 (2009): 20–29. http://dx.doi.org/10.1017/s1551929500050070.

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In light microscopy, dark field and interference contrast are widely used for examination of transparent specimens. These methods both suffer from various limitations when photomicrographs have to be taken from fine details, especially in three-dimensional specimens requiring a large depth of field.In common dark field illumination, the condenser either is not equipped with an aperture diaphragm, or an existing condenser diaphragm has to remain in the wide-open position. Thus, the depth of field is lower than in bright field images. Moreover, dark field imaging is associated with marginal bloo

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19

Rez, P. "Which is Better for Protein Imaging: Phase Contrast TEM or Annular Dark Field STEM?" Microscopy and Microanalysis 7, S2 (2001): 382–83. http://dx.doi.org/10.1017/s1431927600027987.

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In a landmark paper Henderson compared X-ray, neutrons and electrons for protein structure determination. He showed that electron microscopy should be superior to X-ray or neutron diffraction in terms of dose for a given resolution. in addition he presented a theoretical analysis to determine the smallest size molecule whose structure could be determined by phase contrast microscopy. Although he qualitatively considered amplitude contrast mechanisms and concluded they were inferior to phase contrast, no explicit numerical analysis was performed. It has been implicitly assumed that bright field

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Patel, Binay, and Masashi Watanabe. "An Inexpensive Approach for Bright-Field and Dark-Field Imaging by Scanning Transmission Electron Microscopy in Scanning Electron Microscopy." Microscopy and Microanalysis 20, no. 1 (2014): 124–32. http://dx.doi.org/10.1017/s1431927613014049.

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AbstractScanning transmission electron microscopy in scanning electron microscopy (STEM-in-SEM) is a convenient technique for soft materials characterization. Various specimen-holder geometries and detector arrangements have been used for bright-field (BF) STEM-in-SEM imaging. In this study, to further the characterization potential of STEM-IN-SEM, a new specimen holder has been developed to facilitate direct detection of BF signals and indirect detection of dark-field (DF) signals without the need for substantial instrument modification. DF imaging is conducted with the use of a gold (Au)-coa

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21

Mitsuishi, K., A. Hashimoto, M. Takeguchi, M. Shimojo, and K. Ishizuka. "Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy: II. Point spread function analysis." Ultramicroscopy 112, no. 1 (2012): 53–60. http://dx.doi.org/10.1016/j.ultramic.2011.10.004.

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22

Uliana, João H., Diego R. T. Sampaio, Guilherme S. P. Fernandes, et al. "Multiangle Long-Axis Lateral Illumination Photoacoustic Imaging Using Linear Array Transducer." Sensors 20, no. 14 (2020): 4052. http://dx.doi.org/10.3390/s20144052.

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Photoacoustic imaging (PAI) combines optical contrast with ultrasound spatial resolution and can be obtained up to a depth of a few centimeters. Hand-held PAI systems using linear array usually operate in reflection mode using a dark-field illumination scheme, where the optical fiber output is attached to both sides of the elevation plane (short-axis) of the transducer. More recently, bright-field strategies where the optical illumination is coaxial with acoustic detection have been proposed to overcome some limitations of the standard dark-field approach. In this paper, a novel multiangle lon

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23

Miller, Kelsey, Olivier Guyon, and Jared Males. "Spatial linear dark field control: stabilizing deep contrast for exoplanet imaging using bright speckles." Journal of Astronomical Telescopes, Instruments, and Systems 3, no. 04 (2017): 1. http://dx.doi.org/10.1117/1.jatis.3.4.049002.

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24

Bradley, S. A., and H. J. Robota. "Microdiffraction studies of small crystallites." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 708–9. http://dx.doi.org/10.1017/s0424820100105606.

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Identification of nano-crystallites (<5 nm) on a high surface area support such as a catalyst is critical in the development of improved catalysts. Bright field imaging of small particles can be obscured by the phase contrast of the support. A common approach is to utilize annular dark field microscopy; however, wide angle scattering from the high surface area support can easily appear in the annular dark field image. Often one utilizes the energy dispersive detector to identify conclusively the nanosized metal crystallite, but this approach is troublesome when crystallites are very thin si

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Otten, Max T., and Marc J. C. de Jong. "The CM20/STEM: A new 200-kV Scanning Transmission Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 106–7. http://dx.doi.org/10.1017/s0424820100152501.

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With the rapid advances in new materials and production techniques in fields such as ceramics, semiconductors, metals, polymers and composites, the demands on analytical techniques for studying these materials are ever increasing. The TEM is ideally suited because of its spatial resolution and large number of different signals (bright-field and dark-field imaging, high-resolution imaging, convergent beam diffraction. X-ray and energy-loss analysis, scanning with bright-field, dark-field, backscattered and secondary electrons, etc). Many TEM’s suffer, however, from an unnecessary restrictivenes

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Li, Xiang, Xiaojuan Zhu, Dong Pan, et al. "Magnetic domains characterization of crystalline Fe3O4 under DC and AC magnetic field." Microscopy 68, no. 4 (2019): 310–15. http://dx.doi.org/10.1093/jmicro/dfz018.

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Abstract Fe3O4 nanoparticles with crystallite sizes around 10 nm were synthesized by an emulsion method. X-ray diffractometer (XRD) shows that nanocrystalline Fe3O4 possesses face center cubic structure. The magnetic characteristics are investigated by magnetic force microscopy (MFM). Magnetic field directions were applied parallel and perpendicular to the Fe3O4 sample surface for magnetic measurements. Under the perpendicular magnetic field, the phase images of most magnetic nanoparticles exhibit bright or dark MFM contrast. In comparison, the parallel field phase images display a bright–dark

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Patel, B. S., and M. Watanabe. "Development of a New Specimen Holder for Simultaneous Bright Field and Dark Field STEM-IN-SEM Imaging of Polymer Systems." Microscopy and Microanalysis 18, S2 (2012): 1236–37. http://dx.doi.org/10.1017/s1431927612008033.

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Chapman, Henry N., Shawn Williams, and Chris Jacobsen. "Imaging of 30nm gold spheres by dark-field scanning transmission x-ray microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 52–53. http://dx.doi.org/10.1017/s0424820100167998.

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In a scanning transmission x-ray microscope (STXM), such as that operated at the beamline X-lA at the National Synchrotron Light Source, it is possible to obtain dark-field images by blocking the undeviated transmitted photons so that only x rays scattered by the specimen are detected. Although the signal that is detected in dark-field is much weaker than the conventional bright-field signal the method offers much higher contrast of small features and the possibility of detecting small features with higher signal to noise for the same incident x-ray flux. Also, the signal depends on both the a

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Perovic, D. D., and J. H. Paterson. "High-angle annular dark-field STEM imaging of doped semiconductor layers." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 704–5. http://dx.doi.org/10.1017/s0424820100087835.

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With the development of crystal growth techniques such as molecular beam epitaxy (MBE), it is now possible to fabricate modulation-doped superlattices consisting of alternating ultrathin layers of n-and/or p-type material abruptly separated by undoped material. At sufficiently high dopant concentrations these abrupt layers may be imaged in cross section by electron microscopy. Pennycook et al. and Treacy et al. have used high angle annular dark-field (HAAD) imaging in the scanning transmission electron microscope (STEM) to image low levels of dopants (∼1 at. %) in semiconductors. This work is

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Wang, Z. L., L. L. Horton, R. E. Clausing, L. Heatherly, and J. Bentley. "Imaging micro-twin distributions in as-grown CVD diamond films with TEM." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (1992): 336–37. http://dx.doi.org/10.1017/s0424820100122083.

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Fractured edges of diamond films grown by chemical vapor deposition (CVD) have been examined directly in a conventional transmission electron microscope (TEM) without thinning, An important advantage of the fracture specimen preparation technique is that the microstructures in the diamond grains at the growth face can be characterized directly by bright-field (BF) and dark-field (DF) TEM imaging and diffraction. Additionally, the topography of the same region can be directly determined from secondary electron (SE) images available in the same TEM.

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Jones, A. V. "New imaging modes in STEM." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 648–49. http://dx.doi.org/10.1017/s0424820100105308.

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The most often quoted advantage of STEM over conventional TEM is the ability to produce multiple simultaneous images by the use of multiple detector systems. In practice, this postulated advantage has seldom been fully utilised, mainly because of the practical difficulties in designing such detector systems.Most STEMs to date have been constructed as two-channel instruments combining annular dark-field imaging with either filtered bright-freld or inelastic imaging. More complex forms of bright-field detector have been employed1, as have parallel-readout systems for energy-loss spectra but the

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Chapman, Henry N., Jenny Fu, Chris Jacobsen, and Shawn Williams. "Dark-Field X-Ray Microscopy of Immunogold-Labeled Cells." Microscopy and Microanalysis 2, no. 2 (1996): 53–62. http://dx.doi.org/10.1017/s1431927696210530.

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The methods of immunolabeling make visible the presence of specific antigens, proteins, genetic sequences, or functions of a cell. In this paper we present examples of imaging immunolabels in a scanning transmission x-ray microscope using the novel method of dark-field contrast. Colloidal gold, or silver-enhanced colloidal gold, is used as a label, which strongly scatters x-rays. This leads to a high-contrast dark-field image of the label and reduced radiation dose to the specimen. The x-ray images are compared with electron micrographs of the same labeled, unsectioned, whole cell. It is verif

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von Harrach, H. S., D. E. Jesson, and S. J. Pennycook. "Towards 1-Ångstrom-resolution STEM." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 996–97. http://dx.doi.org/10.1017/s0424820100150812.

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Phase contrast TEM has been the leading technique for high resolution imaging of materials for many years, whilst STEM has been the principal method for high-resolution microanalysis. However, it was demonstrated many years ago that low angle dark-field STEM imaging is a priori capable of almost 50% higher point resolution than coherent bright-field imaging (i.e. phase contrast TEM or STEM). This advantage was not exploited until Pennycook developed the high-angle annular dark-field (ADF) technique which can provide an incoherent image showing both high image resolution and atomic number contr

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Liu, J., G. E. Spinnler, M. Pan, and J. M. Cowley. "STEM characterization of supported catalyst clusters." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (1990): 294–95. http://dx.doi.org/10.1017/s0424820100174606.

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Scanning transmission electron microscopy (STEM) offers a powerful extension to the conventional transmission electron microscopy (TEM) by combining high resolution microanalysis with a variety of imaging and diffraction modes. Bright-field (BF) and dark-field STEM imaging (with or without energy filtering) can be used to obtain structural images or to locate small particles and other inhomogeneous sample areas for microanalysis. The microdiffraction technique can provide crystallographic information on nanometer-scale small particles. Secondary electron (SE) images with a resolution approachi

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Usukura, Jiro, and Shiho Minakata. "Simultaneous Imaging of Cryo-Bright Field, Dark Field STEM and SEM Using Unroofed Living Cells with Special Reference to Membrane Cytoskeletons." Microscopy and Microanalysis 20, S3 (2014): 1226–27. http://dx.doi.org/10.1017/s1431927614007867.

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Baumbach, S., B. Kanngießer, W. Malzer, H. Stiel, and T. Wilhein. "A laboratory 8 keV transmission full-field x-ray microscope with a polycapillary as condenser for bright and dark field imaging." Review of Scientific Instruments 86, no. 8 (2015): 083708. http://dx.doi.org/10.1063/1.4929602.

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Otten, Max T. "High-sensitivity detection of gold labels by high-angle dark-field STEM imaging." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 3 (1990): 892–93. http://dx.doi.org/10.1017/s0424820100162028.

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Labelling of antibodies with small gold probes is a highly sensitive technique for detecting specific molecules in biological tissue. Larger gold probes are usually well visible in TEM or STEM Bright-Field images of unstained specimens. In stained specimens, however, the contrast of the stain is frequently the same as that of the gold labels, making it virtually impossible to identify the labels, especially when smaller gold labels are used to increase the sensitivity of the immunolabelling technique. TEM or STEM Dark-Field images fare no better (Figs. 1a and 2a), again because of the absence

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Xu, Peirong. "Imaging of Silicon (111) at 1.92Å Resolution using a 100keV STEM." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 34–35. http://dx.doi.org/10.1017/s0424820100178926.

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Atomic structure imaging using bright field phase contrast at less than 2Å resolution has become routinely possible in medium and high voltage microscopes (>200 keV). Radiation damage at these elevated voltages can be serious and this limits the length of useful observation time. For example, the knock-on threshold energy for silicon is 120-190keV. Recently, a VG HB501A STEM equipped with a newly developed ultra-high resolution pole piece (Cs=0.7mm) has demonstrated the capability of achieving sub-2Å resolution in imaging the (111) silicon latticer using both bright field (BF) and annular d

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Okuda, Mitsuhiro, Nobuhiro Ogawa, Masaki Takeguchi, et al. "Minerals and Aligned Collagen Fibrils in Tilapia Fish Scales: Structural Analysis Using Dark-Field and Energy-Filtered Transmission Electron Microscopy and Electron Tomography." Microscopy and Microanalysis 17, no. 5 (2011): 788–98. http://dx.doi.org/10.1017/s1431927611011949.

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AbstractThe mineralized structure of aligned collagen fibrils in a tilapia fish scale was investigated using transmission electron microscopy (TEM) techniques after a thin sample was prepared using aqueous techniques. Electron diffraction and electron energy loss spectroscopy data indicated that a mineralized internal layer consisting of aligned collagen fibrils contains hydroxyapatite crystals. Bright-field imaging, dark-field imaging, and energy-filtered TEM showed that the hydroxyapatite was mainly distributed in the hole zones of the aligned collagen fibrils structure, while needle-like ma

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Solórzano, I. G., and W. Probst. "Dark-field electron spectroscopic imaging of aged microstructures in an aluminium lithium base alloy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (1990): 444–45. http://dx.doi.org/10.1017/s0424820100175351.

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The examination of microstructures make very high demands on the imaging quality and, therefore, on the instrumentation. In Al-Li base alloys it is of great interest to determine parameters such as size, distribution, morphology and coherency of precipitate phases as they dictate their mechanical behavior. In order to reveal morphological features with high quality the electron spectroscopic imaging (ESI) in dark field mode has shown to be quite a powerful technique.The ESI technique in the TEM is based on the possibility that accelerated electrons can be elastic and inelastically scattered by

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Piper, Timm, and Jörg Piper. "Variable Phase Dark-Field Contrast—A Variant Illumination Technique for Improved Visualizations of Transparent Specimens." Microscopy and Microanalysis 18, no. 2 (2012): 343–52. http://dx.doi.org/10.1017/s1431927612000153.

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AbstractVariable phase dark-field contrast has been developed as an illumination technique in light microscopy, which promises significant improvements and a higher variability in imaging of several transparent specimens. In this method, a phase contrast image is optically superimposed on a dark-field image so that a partial image based on the principal zeroth-order maximum (phase contrast) interferes with an image that is based on the secondary maxima (dark field). The background brightness and character of the resulting image can be continuously modulated from a phase-contrast-dominated to a

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Shimizu, Toshiki, Masaki Tsuji, and Shinzo Kohjiya. "Crystalline Morphologies of Polychloroprene Thin Films as Revealed by Transmission Electron Microscopy Observation." Journal of Materials Research 14, no. 4 (1999): 1645–52. http://dx.doi.org/10.1557/jmr.1999.0221.

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Thin films of polychloroprene (CR; Neoprene-W) were made by casting its solution (2.0 wt%) in benzene onto the water surface, and some of them were stretched by a desired amount of strain (ε) in their “molten” state. The specimens thus prepared were then crystallized and examined by transmission electron microscopy. Morphological observations in bright- and dark-field imaging modes and selected-area electron diffraction analysis revealed directly that filamentous entities observed in the bright-field image are the edge-on lamellar crystals. It was, therefore, confirmed that the morphological r

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Awaji, M. "Detection of a point defect in a silicon single crystal by high-resolution TEM." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 466–67. http://dx.doi.org/10.1017/s0424820100138701.

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It is necessary to improve the resolution, brightness and signal-to-noise ratio(s/n) for the detection and identification of point defects in crystals. In order to observe point defects, multi-beam dark-field imaging is one of the useful methods. Though this method can improve resolution and brightness compared with dark-field imaging by diffuse scattering, the problem of s/n still exists. In order to improve the exposure time due to the low intensity of the dark-field image and the low resolution, we discuss in this paper the bright-field high-resolution image and the corresponding subtracted

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Weyland, M., P. A. Midgley, and J. M. Thomas. "High Angle Annular Dark Field (HAADF) STEM Tomography of Nanostructured Catalysts." Microscopy and Microanalysis 7, S2 (2001): 1104–5. http://dx.doi.org/10.1017/s1431927600031597.

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Progress in the design of catalysts based on nanoparticles supported within a mesoporous silica framework requires structural analysis at high spatial resolution. While bulk analysis by X-ray diffraction and EXAFS can give the structure of active sites they are unable to determine their relative positions and local physical structure. Some success has been achieved using a combination of STEM ADF imaging and EDX mapping to elucidate such structures but these results are limited to giving 2D projections of 3D arrangements. The need exists therefore to analyse specimens in full 3D. A suitable ap

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Zhang, X., Masaki Takeguchi, Ayako Hashimoto, Kazutaka Mitsuishi, and Masayuki Shimojo. "Application of Scanning Confocal Electron Microscopy to Nanomaterials and the Improvement in Resolution by Image Processing." Materials Science Forum 675-677 (February 2011): 259–62. http://dx.doi.org/10.4028/www.scientific.net/msf.675-677.259.

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Scanning confocal electron microscopy (SCEM) is a novel technique for threedimensional observation with a nanometer-scale resolution. Annular dark field (ADF) SCEM imaging has been demonstrated to have better depth resolution than bright field (BF) SCEM imaging. However, the depth resolution of ADF-SCEM images is limited by the vertical probe size determined by spherical aberration and convergence angle. Therefore, we attempted to employ a deconvolution image processing method to improve the depth resolution of SCEM images. The result of the deconvolution process for vertically sliced SCEM ima

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Takaki, Seiya, Tomokazu Yamamoto, Masanori Kutsuwada, Kazuhiro Yasuda, and Syo Matsumura. "Atomistic observation of electron irradiation-induced defects in CeO2." MRS Proceedings 1514 (2013): 93–98. http://dx.doi.org/10.1557/opl.2013.199.

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ABSTRACTWe have investigated the atomistic structure of radiation-induced defects in CeO2 formed under 200 keV electron irradiation. Dislocation loops on {111} habit planes are observed, and they grow accompanying strong strain-field. Atomic resolution scanning transmission electron microscopy (STEM) observations with high angle annular dark-field (HAADF) and annular bright-field (ABF) imaging techniques showed that no additional Ce layers are inserted at the position of the dislocation loop, and that strong distortion and expansion is induced around the dislocation loops. These results are di

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Rice, Stephen B., Michael M. J. Treacy, and Mark M. Disko. "Imaging single platinum atoms on zeolites in the STEM." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (1990): 240–41. http://dx.doi.org/10.1017/s0424820100174333.

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High angle annular dark-field (HAAD) imaging in the scanning transmission electron microscope has been shown in recent years to be a very effective tool in characterizing materials in which there are large differences in atomic number. Supported metal catalysts, in particular, have been explored extremely successfully using this Z-contrast technique. HAAD has very good sensitivity to high atomic number clusters on low atomic number supports, due to the approximately Z2 relationship. Furthermore, since the image contrast is due primarily to amplitude contrast, the resulting images are maps of m

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Lazar, Sorin, Yang Shao, Lina Gunawan, Riad Nechache, Alain Pignolet, and Gianluigi A. Botton. "Imaging, Core-Loss, and Low-Loss Electron-Energy-Loss Spectroscopy Mapping in Aberration-Corrected STEM." Microscopy and Microanalysis 16, no. 4 (2010): 416–24. http://dx.doi.org/10.1017/s1431927610013504.

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AbstractHigh-angle annular dark-field and annular bright-field imaging experiments were carried out on an aberration-corrected transmission electron microscope. These techniques have been demonstrated on thin films of complex oxides Ba3.25La0.75Ti3O12 and on LaB6. The results show good agreement between theory and experiments, and for the case of LaB6 they demonstrate the detection of contrast from the B atoms in the annular bright-field images. Elemental mapping with electron-energy-loss spectroscopy has been used to deduce the distribution of Cr and Fe in a thin film of the complex oxide Bi2

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Sourty, Erwan, Svetlana van Bavel, Kangbo Lu, Ralph Guerra, Georg Bar, and Joachim Loos. "High-Angle Annular Dark Field Scanning Transmission Electron Microscopy on Carbon-Based Functional Polymer Systems." Microscopy and Microanalysis 15, no. 3 (2009): 251–58. http://dx.doi.org/10.1017/s1431927609090278.

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AbstractTwo purely carbon-based functional polymer systems were investigated by bright-field conventional transmission electron microscopy (CTEM) and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). For a carbon black (CB) filled polymer system, HAADF-STEM provides high contrast between the CB agglomerates and the polymer matrix so that details of the interface organization easily can be revealed and assignment of the CB phase is straightforward. For a second system, the functional polymer blend representing the photoactive layer of a polymer solar cell, de

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Tong, Yu-Xin, Qing-Hua Zhang, and Lin Gu. "Scanning transmission electron microscopy: A review of high angle annular dark field and annular bright field imaging and applications in lithium-ion batteries." Chinese Physics B 27, no. 6 (2018): 066107. http://dx.doi.org/10.1088/1674-1056/27/6/066107.

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