Journal articles on the topic 'Bulk Current Injection'
Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles
Consult the top 50 journal articles for your research on the topic 'Bulk Current Injection.'
Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.
You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.
Browse journal articles on a wide variety of disciplines and organise your bibliography correctly.
Grassi, Flavia, Filippo Marliani, and Sergio A. Pignari. "Circuit Modeling of Injection Probes for Bulk Current Injection." IEEE Transactions on Electromagnetic Compatibility 49, no. 3 (August 2007): 563–76. http://dx.doi.org/10.1109/temc.2007.902385.
Full textKim, Yanghyun, and Chulhun Seo. "Power Electric Module Verification and Optimization Study using Bulk Current Injection Simulation." Journal of the Institute of Electronics and Information Engineers 59, no. 11 (November 30, 2022): 9–15. http://dx.doi.org/10.5573/ieie.2022.59.11.9.
Full textPignari, S., and F. G. Canavero. "Theoretical assessment of bulk current injection versus radiation." IEEE Transactions on Electromagnetic Compatibility 38, no. 3 (1996): 469–77. http://dx.doi.org/10.1109/15.536077.
Full textKrál, P., and J. E. Sipe. "Quantum kinetic theory of two-beam current injection in bulk semiconductors." Physical Review B 61, no. 8 (February 15, 2000): 5381–91. http://dx.doi.org/10.1103/physrevb.61.5381.
Full textOrlandi, A. "Circuit model for bulk current injection test on shielded coaxial cables." IEEE Transactions on Electromagnetic Compatibility 45, no. 4 (November 2003): 602–15. http://dx.doi.org/10.1109/temc.2003.819060.
Full textGrassi, Flavia, Giordano Spadacini, Filippo Marliani, and Sergio A. Pignari. "Use of Double Bulk Current Injection for Susceptibility Testing of Avionics." IEEE Transactions on Electromagnetic Compatibility 50, no. 3 (August 2008): 524–35. http://dx.doi.org/10.1109/temc.2008.926810.
Full textMiropolsky, S., and S. Frei. "Reproducing system-level bulk current injection test in direct power injection setup for multiple-port DUTs." Advances in Radio Science 11 (July 4, 2013): 177–82. http://dx.doi.org/10.5194/ars-11-177-2013.
Full textJalalifar, Majid, and Gyung-Su Byun. "An Ultra-Low Power QVCO Using Current-Coupling and Bulk-Injection Techniques." IEEE Microwave and Wireless Components Letters 24, no. 11 (November 2014): 781–83. http://dx.doi.org/10.1109/lmwc.2014.2348318.
Full textGrassi, Flavia, and Sergio A. Pignari. "Bulk Current Injection in Twisted Wire Pairs With Not Perfectly Balanced Terminations." IEEE Transactions on Electromagnetic Compatibility 55, no. 6 (December 2013): 1293–301. http://dx.doi.org/10.1109/temc.2013.2255295.
Full textKondo, Yosuke, Masato Izumichi, and Osami Wada. "Simulation of Bulk Current Injection Test for Automotive Components Using Electromagnetic Analysis." IEEE Transactions on Electromagnetic Compatibility 60, no. 4 (August 2018): 866–74. http://dx.doi.org/10.1109/temc.2017.2751580.
Full textLee, Sang‐Gun, and Reiji Hattori. "Current density equations representing the transition between the injection‐ and bulk‐limited currents for organic semiconductors." Journal of Information Display 10, no. 4 (December 2009): 143–48. http://dx.doi.org/10.1080/15980316.2009.9652098.
Full textAiello, Orazio. "Hall-Effect Current Sensors Susceptibility to EMI: Experimental Study." Electronics 8, no. 11 (November 8, 2019): 1310. http://dx.doi.org/10.3390/electronics8111310.
Full textIslam, Mirwazul, and Grigory Simin. "Bulk Current Model for GaN-on-Si High Electron Mobility Transistors." International Journal of High Speed Electronics and Systems 25, no. 01n02 (March 2016): 1640002. http://dx.doi.org/10.1142/s0129156416400024.
Full textKwak, SangKeun, Wansoo Nah, and SoYoung Kim. "Electromagnetic Susceptibility Analysis of I/O Buffers Using the Bulk Current Injection Method." JSTS:Journal of Semiconductor Technology and Science 13, no. 2 (April 30, 2013): 114–26. http://dx.doi.org/10.5573/jsts.2013.13.2.114.
Full textKONDO, Yosuke, Masato IZUMICHI, Kei SHIMAKURA, and Osami WADA. "Modeling of Bulk Current Injection Setup for Automotive Immunity Test Using Electromagnetic Analysis." IEICE Transactions on Communications E98.B, no. 7 (2015): 1212–19. http://dx.doi.org/10.1587/transcom.e98.b.1212.
Full textMashriki, I. M., S. M. J. Razavi, and S. H. M. Armaki. "Analyzing the Resonance Resultant from the Capacitive Effects in Bulk Current Injection Probe." Radioengineering 29, no. 1 (April 14, 2020): 109–16. http://dx.doi.org/10.13164/re.2020.0109.
Full textSpadacini, G., and S. A. Pignari. "A Bulk Current Injection Test Conforming to Statistical Properties of Radiation-Induced Effects." IEEE Transactions on Electromagnetic Compatibility 46, no. 3 (August 2004): 446–58. http://dx.doi.org/10.1109/temc.2004.831896.
Full textGe, Haiwen, Jaclyn E. Johnson, Hari Krishnamoorthy, Seong-Young Lee, Jeffrey D. Naber, Nan Robarge, and Eric Kurtz. "A comparison of computational fluid dynamics predicted initial liquid penetration using rate of injection profiles generated using two different measurement techniques." International Journal of Engine Research 20, no. 2 (December 15, 2017): 226–35. http://dx.doi.org/10.1177/1468087417746475.
Full textOrlandi, Antonio, Giulio Antonini, and Romeo Michele Rizzi. "Equivalent Circuit Model of a Bundle of Cables for Bulk Current Injection (BCI) Test." IEEE Transactions on Electromagnetic Compatibility 48, no. 4 (November 2006): 701–13. http://dx.doi.org/10.1109/temc.2006.882850.
Full textToscani, Nicola, Flavia Grassi, Giordano Spadacini, and Sergio A. Pignari. "Circuit and Electromagnetic Modeling of Bulk Current Injection Test Setups Involving Complex Wiring Harnesses." IEEE Transactions on Electromagnetic Compatibility 60, no. 6 (December 2018): 1752–60. http://dx.doi.org/10.1109/temc.2018.2794823.
Full textSingh, Pragati, Rudra Sankar Dhar, and Srimanta Baishya. "Micro-features of ambipolar snapback behaviour under high current injection to design capacitorless memory device." Physica Scripta 96, no. 12 (December 1, 2021): 124069. http://dx.doi.org/10.1088/1402-4896/ac3b69.
Full textGao, Weiying, and Antoine Kahn. "Electronic structure and current injection in zinc phthalocyanine doped with tetrafluorotetracyanoquinodimethane: Interface versus bulk effects." Organic Electronics 3, no. 2 (June 2002): 53–63. http://dx.doi.org/10.1016/s1566-1199(02)00033-2.
Full textMashriki, Issa M., Seyyed Mohammad Javad Razavi, and Seyyed Hossein Mohseni Armaki. "Electromagnetic and circuit modelling of a modified design of bulk current injection probe calibration jig." IET Science, Measurement & Technology 14, no. 9 (November 1, 2020): 715–21. http://dx.doi.org/10.1049/iet-smt.2019.0447.
Full textSpadacini, Giordano, Flavia Grassi, Sergio A. Pignari, Patrick Bisognin, and Alexandre Piche. "Bulk Current Injection as an Alternative Radiated Susceptibility Test Enforcing a Statistically Quantified Overtesting Margin." IEEE Transactions on Electromagnetic Compatibility 60, no. 5 (October 2018): 1270–78. http://dx.doi.org/10.1109/temc.2018.2810074.
Full textAsghari, Meysam, and Mohammad Yavari. "Using the Gate–Bulk Interaction and a Fundamental Current Injection to Attenuate IM3 and IM2 Currents in RF Transconductors." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24, no. 1 (January 2016): 223–32. http://dx.doi.org/10.1109/tvlsi.2015.2394244.
Full textBaiocchi, Benedetta, Lorenzo Figini, Alessandro Bruschi, Francesco Fanale, Saul Garavaglia, Gustavo Granucci, and Afra Romano. "ECH and ECCD modelling studies for DTT." EPJ Web of Conferences 277 (2023): 01006. http://dx.doi.org/10.1051/epjconf/202327701006.
Full textAkinnikawe, Oyewande, Anish Chaudhary, Oscar Vasquez, Chijioke Enih, and Christine A. Ehlig-Economides. "Increasing CO2-Storage Efficiency Through a CO2/Brine-Displacement Approach." SPE Journal 18, no. 04 (June 25, 2013): 743–51. http://dx.doi.org/10.2118/139467-pa.
Full textZucchetti, C., F. Scali, P. Grassi, M. Bollani, L. Anzi, G. Isella, M. Finazzi, F. Ciccacci, and F. Bottegoni. "Non-local architecture for spin current manipulation in silicon platforms." APL Materials 11, no. 2 (February 1, 2023): 021102. http://dx.doi.org/10.1063/5.0130759.
Full textPark, Jinsu, Jaemin Kim, Sanchari Showdhury, Changhwan Shin, Hwasung Rhee, Myung Soo Yeo, Eun-Chel Cho, and Junsin Yi. "Electrical Characteristics of Bulk FinFET According to Spacer Length." Electronics 9, no. 8 (August 11, 2020): 1283. http://dx.doi.org/10.3390/electronics9081283.
Full textKim, NaHyun, Wansoo Nah, and SoYoung Kim. "Immunity Test for Semiconductor Integrated Circuits Considering Power Transfer Efficiency of the Bulk Current Injection Method." JSTS:Journal of Semiconductor Technology and Science 14, no. 2 (April 30, 2014): 202–11. http://dx.doi.org/10.5573/jsts.2014.14.2.202.
Full textSun, Jiangning, Xiaodong Pan, Xinfu Lu, Haojiang Wan, and Guanghui Wei. "Test Method of Bulk Current Injection for High Field Intensity Electromagnetic Radiated Susceptibility Into Shielded Wire." IEEE Transactions on Electromagnetic Compatibility 64, no. 2 (April 2022): 275–85. http://dx.doi.org/10.1109/temc.2021.3120018.
Full textAntonini, G., A. C. Scogna, and A. Orlandi. "Grounding, Unbalancing and Length Effects on Termination Voltages of a Twinax Cable During Bulk Current Injection." IEEE Transactions on Electromagnetic Compatibility 46, no. 2 (May 2004): 302–8. http://dx.doi.org/10.1109/temc.2004.826882.
Full textCheaito, Hassan, Mor-Sokhna Diop, Marwan Ali, Edith Clavel, Christian Vollaire, and Leonce Mutel. "Virtual Bulk Current Injection: Modeling EUT for Several Setups and Quantification of CM-to-DM Conversion." IEEE Transactions on Electromagnetic Compatibility 59, no. 3 (June 2017): 835–44. http://dx.doi.org/10.1109/temc.2016.2631721.
Full textLü, Zhihui, Dongwen Zhang, Zhaoyan Zhou, Lin Sun, Zengxiu Zhao, and Jianmin Yuan. "Coherently controlled terahertz source for a time domain spectroscopy system via injection current in bulk ZnSe." Applied Optics 51, no. 5 (February 10, 2012): 676. http://dx.doi.org/10.1364/ao.51.000676.
Full textYoshimi, R., K. Yasuda, A. Tsukazaki, K. S. Takahashi, M. Kawasaki, and Y. Tokura. "Current-driven magnetization switching in ferromagnetic bulk Rashba semiconductor (Ge,Mn)Te." Science Advances 4, no. 12 (December 2018): eaat9989. http://dx.doi.org/10.1126/sciadv.aat9989.
Full textPALTIEL, Y., G. JUNG, Y. MYASOEDOV, M. L. RAPPAPORT, E. ZELDOV, S. BHATTACHARYA, and M. J. HIGGINS. "FLUX-FLOW NOISE IN THE VICINITY OF THE PEAK EFFECT." Fluctuation and Noise Letters 02, no. 01 (March 2002): L31—L36. http://dx.doi.org/10.1142/s0219477502000567.
Full textSuvanam, Sethu Saveda, Luigia Lanni, Bengt Gunnar Malm, Carl Mikael Zetterling, and Anders Hallén. "Total Dose Effects on 4H-SiC Bipolar Junction Transistors." Materials Science Forum 897 (May 2017): 579–82. http://dx.doi.org/10.4028/www.scientific.net/msf.897.579.
Full textDai, Zhenbang, and Andrew M. Rappe. "Recent progress in the theory of bulk photovoltaic effect." Chemical Physics Reviews 4, no. 1 (March 2023): 011303. http://dx.doi.org/10.1063/5.0101513.
Full textLiu, Guannan, Jishan Liu, and Feng Gao. "Constraints of Pore-Bulk Strain Ratio and Interference Time on the Evolution of Coal Permeability during CO2 Injection." Geofluids 2021 (March 16, 2021): 1–16. http://dx.doi.org/10.1155/2021/6616315.
Full textSun, Jiangning, Xiaodong Pan, Xinfu Lu, Haojiang Wan, and Guanghui Wei. "Unshielded Two-Wire Circuit Systems under Weak Unbalance for High-Intensity Radiated Field Radiated Susceptibility by Double Bulk Current Injection." Electronics 11, no. 14 (July 11, 2022): 2175. http://dx.doi.org/10.3390/electronics11142175.
Full textTan, Ligang, Ziwen Li, Yunxiu Xiang, Pengfei Feng, and Yage Guo. "A critical analysis of the bulk current injection immunity test based on common-mode and differential-mode." Microelectronics Reliability 91 (December 2018): 188–93. http://dx.doi.org/10.1016/j.microrel.2018.10.004.
Full textBajerlein, Maciej, Wojciech Karpiuk, and Rafał Smolec. "Application of Gas Dissolved in Fuel in the Aspect of a Hypocycloidal Pump Design." Energies 15, no. 23 (December 2, 2022): 9163. http://dx.doi.org/10.3390/en15239163.
Full textvan der Kooij, Renée S., Rob Steendam, Johan Zuidema, Henderik W. Frijlink, and Wouter L. J. Hinrichs. "Microfluidic Production of Polymeric Core-Shell Microspheres for the Delayed Pulsatile Release of Bovine Serum Albumin as a Model Antigen." Pharmaceutics 13, no. 11 (November 3, 2021): 1854. http://dx.doi.org/10.3390/pharmaceutics13111854.
Full textHo, Cheng-Yu, Kai-Syaun Chen, and Tzyy-Sheng Horng. "ESTIMATING RADIATED EMISSION REDUCTION FROM PRINTED CIRCUIT BOARD USING VECTOR NETWORK ANALYZER WITH A BULK CURRENT INJECTION PROBE." Progress In Electromagnetics Research 135 (2013): 1–16. http://dx.doi.org/10.2528/pier12110102.
Full textHe, Kai, Daojie Yu, Baiseng Guo, Mengjuan Chai, Changlin Zhou, and Dongyao Zhang. "An Equivalent Dynamic Test System for Immunity Characterization of the UAV Positioning Module Using Bulk Current Injection Method." IEEE Letters on Electromagnetic Compatibility Practice and Applications 2, no. 4 (December 2020): 161–64. http://dx.doi.org/10.1109/lemcpa.2020.3037499.
Full textPeng, Ying-Quan, Chang-An Song, and Shuo Sun. "Numerical model for current conduction in single layer organic light-emitting devices including both bulk and injection effects." Semiconductor Science and Technology 19, no. 9 (July 29, 2004): 1117–21. http://dx.doi.org/10.1088/0268-1242/19/9/008.
Full textHo, C. Y., K. S. Chen, and T. S. Horng. "Prediction of common-mode radiated emission from PCB using vector network analyzer with a bulk injection current probe." Journal of Electromagnetic Waves and Applications 26, no. 16 (September 21, 2012): 2121–29. http://dx.doi.org/10.1080/09205071.2012.727533.
Full textHo, Cheng-Yu, Kai-Syaun Chen, and Tzyy-Sheng Horng. "Estimating the Reduction of Radiated Emissions From Microstrip Components Using Network Analyzer With a Bulk Current Injection Probe." IEEE Microwave and Wireless Components Letters 23, no. 2 (February 2013): 108–10. http://dx.doi.org/10.1109/lmwc.2012.2236887.
Full textЖуков, Н. Д., В. Ф. Кабанов, А. И. Михайлов, Д. С. Мосияш, А. А. Хазанов, and М. И. Шишкин. "Особенности свойств полупроводников А-=SUP=-III-=/SUP=-В-=SUP=-V-=/SUP=- в мультизеренной наноструктуре." Физика и техника полупроводников 52, no. 1 (2018): 83. http://dx.doi.org/10.21883/ftp.2018.01.45323.8515.
Full textDhar Badgayan, Nitesh, Santosh Kumar Sahu, Sutanu Samanta, and Pattela Srinivasa Rama Sreekanth. "Assessment of Bulk Mechanical Properties of HDPE Hybrid Composite Filled with 1D/2D Nanofiller System." Materials Science Forum 917 (March 2018): 12–16. http://dx.doi.org/10.4028/www.scientific.net/msf.917.12.
Full text