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Dissertations / Theses on the topic 'Circuit transient analysis'

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Published: 4 June 2021

Last updated: 2 February 2022

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1

Sickenberger, Thorsten. "Efficient transient noise analysis in circuit simulation." Berlin Logos-Verl, 2008. http://d-nb.info/989242609/04.

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2

Ma, Hong. "Representation of multivariable-controlled MOSFET nonlinearities in transient analysis programs." Thesis, University of British Columbia, 1991. http://hdl.handle.net/2429/30001.

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This thesis deals with the modelling and circuit simulation problems of nonlinear electronic devices. Emphasis has been aimed at MOSFET devices. A Piecewise Linear (PWL) modelling scheme has been proposed for a general four-terminal nonlinear charge device. The charge functions are all nonlinear and are approximated by PWL functions. If analytical expressions for the nonlinear functions are not available, PWL function approximations can be built from a data table in which discrete data points are recorded. In the time domain, the critical-damping-adjustment (CDA ) scheme is used as the integ

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3

Singh, Sanchit. "IGCT Transient Analysis and Clamp Circuit Design for VSC valves." Thesis, KTH, Elektrisk energiomvandling, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-109650.

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In today’s high power VSCs (Voltage Source Converters), IGBTs (Insulated Gate Bipolar Transistors) are the dominant semiconductors. These converters are in general modular multilevel based and contain several building blocks that are series connected. Each of these building blocks in turn consist of several series connected IGBT valves. One of the advantages of using modular multilevel based VSCs is the ability to switch each building block at a lower frequency compared to the average total switching frequency of the converter. IGBTs generally have lower switching losses than other semiconduct

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4

Vishnubhotla, Phanilatha Carleton University Dissertation Engineering Electronics. "Transient thermal analysis of printed circuit boards and electronic packages." Ottawa, 1996.

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5

Tsuei, Yuh-sheng 1958. "Incorporation of Linear/Nonlinear Lumped Circuit Models in a Full-Wave Electromagnetic Simulator for Transient Electromagnetic Analysis of High-Speed Electronic Systems." Diss., The University of Arizona, 1996. http://hdl.handle.net/10150/565554.

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6

Kathi, Lokesh. "Small-Signal Analysis of Non-isolated Cuk DC-DC Converter." Wright State University / OhioLINK, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=wright1598899911848989.

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7

Holmberg, Pär. "Modelling the transient response of windings, laminated steel coresand electromagnetic power devices by means of lumped circuits : With special reference to windings with a coaxial insulation system." Doctoral thesis, Uppsala University, Department of High Voltage Research, 2000. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-548.

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<p>Electromagnetic transients impinging on electromagnetic power devices - such as electric machines, transformers and reactors - can stress the design severely. Thus the magnitudes of the transients are often decisive for the design of the devices. Further, the operation of a device can be transient in itself. This is the case for the explosive magnetic flux compression generator (EMG) and a ferromagnetic actuator. </p><p>Models are presented that are mainly intended for transients in the millisecond range and faster. Hence, eddy currents and the related skin and proximity effect become signi

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8

Manney, Sanjay (Sanjay Leela) Carleton University Dissertation Engineering Electrical. "Transient analysis of nonuniform high-speed interconnects." Ottawa, 1992.

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9

Lee, Anyu 1963. "Transient analysis of interconnections using spectral method." Thesis, The University of Arizona, 1988. http://hdl.handle.net/10150/276750.

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The present paper introduces one very efficient and flexible time-domain analysis technique to predict the kinds of reflections and crosstalk. Numerical results show that this technique is indeed efficient and accurate in the transient analysis of a general multiple line system. Furthermore, this algorithm can be eventually coded in a form of a subroutine compatible with any standard CAD program, such as SPICE.

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10

Salomonsson, Daniel. "Modeling, Control and Protection of Low-Voltage DC Microgrids." Doctoral thesis, Stockholm : Elektriska energisystem, Electric Power Systems, 2008. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-4666.

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11

Bèges, Rémi. "Analysis and modeling methods for predicting functional robustness of integrated circuits during fast transient events." Thesis, Toulouse 3, 2017. http://www.theses.fr/2017TOU30046/document.

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La miniaturisation des circuits intégrés se poursuit de nos jours avec le développement de technologies toujours plus fines et denses. Elle permet une intégration des circuits toujours plus massive, avec des performances plus élevées et une réduction des coûts de production. La réduction de taille des circuits s'accompagne aussi d'une augmentation de leur sensibilité électrique. L'électronique automobile est un acteur majeur dans la nouvelle tendance des véhicules autonomes. Ce type d'application a besoin d'analyser des données et d'appliquer des actions sur le véhicule en temps réel. L'object

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12

Watkins, Adam. "Analysis and Mitigation of Multiple Radiation Induced Errors in Modern Circuits." OpenSIUC, 2016. https://opensiuc.lib.siu.edu/dissertations/1325.

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Due to technology scaling, the probability of a high energy radiation particle striking multiple transistors has continued to increase. This, in turn has created a need for new circuit designs that can tolerate multiple simultaneous errors. A common type of error in memory elements is the double node upset (DNU) which has continued to become more common. All existing DNU tolerant designs either suffer from high area and performance overhead, may lose the data stored in the element during clock gating due to high impedance states or are vulnerable to an error after a DNU occurs. In this dissert

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13

Liu, Haotian, and 劉昊天. "Analytical and numerical procedures for fast periodic steady-state and transient analyses of nonlinear circuits." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2014. http://hdl.handle.net/10722/206326.

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14

Bavidge, Nathan Giles. "Analysis of transient effects in low temperature polycrystalline silicon thin film transistors for application in digital circuits." Thesis, University of Cambridge, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.620501.

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15

Fry, John. "'Life in the Travelling Circus' : a sociological analysis of the lives of touring professional golfers." Thesis, University of Chester, 2014. http://hdl.handle.net/10034/621727.

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As sports become more professionalised and international in scope athletes increasingly migrate from one country to another. These individuals are required to adjust and adapt quickly when moving internationally. Literature on sports migration, however, tends to focus on routes and pathways rather than the effects of movement on the athletes themselves. The aim of this study, therefore, was to explore how the frequent workplace circulation inherent in the lives of highly skilled migrants affects their social selves. Using professional golf as a case study, this project includes an analysis of

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16

Lalgudi, Subramanian N. "Transient simulation of power-supply noise in irregular on-chip power distribution networks using latency insertion method, and causal transient simulation of interconnects characterized by band-limited data and terminated by arbitrary terminations." Diss., Atlanta, Ga. : Georgia Institute of Technology, 2008. http://hdl.handle.net/1853/22561.

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17

Vakanas, Loizos Petrou. "A scattering parameter based method for the transient analysis of lossy, coupled, nonlinearly terminated transmission line systems in high-speed microelectronic circuits." Diss., The University of Arizona, 1994. http://hdl.handle.net/10150/186753.

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The problem of accurate and efficient calculation of transient signal waveforms microelectronic circuits consisting of arbitrarily connected systems of multiple, coupled transmission lines and nonlinear devices such as transistors and diodes has been considered. Both non-dispersive and dispersive transmission lines can be handled. For the dispersive case, the dispersion is due to geometric or material nonuniformity as well as dielectric and conductor losses which may also exhibit frequency dependence. A general approach has been formulated which enables the simulation of arbitrarily connected

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18

Balen, Tiago Roberto. "Teste de dispositivos analógicos programáveis (FPAAS)." reponame:Biblioteca Digital de Teses e Dissertações da UFRGS, 2006. http://hdl.handle.net/10183/7891.

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Neste trabalho o teste de dispositivos analógicos programáveis é abordado. Diversas metodologias de teste analógico existentes são estudadas e algumas delas são utilizadas nas estratégias desenvolvidas. Dois FPAAs (Field Programmable Analog Arrays) comerciais de fabricantes e modelos distintos são utilizados para validar as estratégias de teste propostas. O primeiro dispositivo estudado é um FPAA de tempo contínuo (capaz de implementar circuitos contínuos no tempo) da Lattice Semiconductors. Tal dispositivo é marcado pela característica estrutural de sua programabilidade. Por esta razão, a est

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19

Silva, Bárbara Pereira. "Modelagens e solução de aterramentos sujeitos a surtos de corrente: respostas nos domínios da frequência e do tempo." Universidade Federal de Goiás, 2016. http://repositorio.bc.ufg.br/tede/handle/tede/6018.

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Submitted by Jaqueline Silva (jtas29@gmail.com) on 2016-08-29T17:39:21Z No. of bitstreams: 3 Dissertação - Bárbara Pereira Silva - 2016 - parte 1.pdf: 12258499 bytes, checksum: 8af480355ae4ffedb4ed79cbf7484361 (MD5) Dissertação - Bárbara Pereira Silva - 2016 - parte 2.pdf: 12730012 bytes, checksum: d173d49860226f3a2179be40d51ef666 (MD5) license_rdf: 0 bytes, checksum: d41d8cd98f00b204e9800998ecf8427e (MD5)<br>Approved for entry into archive by Jaqueline Silva (jtas29@gmail.com) on 2016-08-29T17:39:44Z (GMT) No. of bitstreams: 3 Dissertação - Bárbara Pereira Silva - 2016 - parte 1.pdf: 12258499

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20

Domínguez, Mosquera Jacobo. "Nuevas técnicas de simulación y optimización de circuitos osciladores y lazos de enganche en fase de microondas." Doctoral thesis, Universidad de Cantabria, 2009. http://hdl.handle.net/10803/10670.

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El objetivo de este trabajo es el desarrollo de técnicas para la simulación y optimización del diseño de circuitos osciladores y lazos de enganche en fase de microondas. La intención de estas técnicas es que puedan ser utilizadas por el diseñador para optimizar las prestaciones de este tipo de circuitos durante la etapa de diseño. Por este motivo, se ha intentado que en todo momento las técnicas puedan ser utilizadas en combinación con un programa comercial de simulación de circuitos de microondas.En el caso de los circuitos osciladores, inicialmente se han optimizado sus prestaciones cuando s

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21

Lee, Siang-Ru, and 李翔儒. "Applications of Circuit Breaker Arc Model for Transient Behavior Analysis of Circuit Breaker Interrupting." Thesis, 2008. http://ndltd.ncl.edu.tw/handle/41122242319872728972.

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碩士<br>逢甲大學<br>電機工程所<br>96<br>Be used ATPDraw software in this paper, simulating the transformation of voltage and current in the system when circuit breaker is acting. Using ATPDraw simulates circuit breaker arc model. The mathematic operation of arc model is done by TACS function. And feedbacks continuously operate in the simulated system. The model, that has the dynamic refreshing function, can get the more precisely simulating results. In this paper, circuit breaker arc effect at opening shunt reactor is simulated by this model in Taipower power system. This simulating result compared with

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22

Huang, Chih-Yuan, and 黃志源. "Transient Analysis of Bootstrapped BiCMOS Logic Circuits and a Readout Circuit for Microelectromechanical System Gyroscope." Thesis, 1998. http://ndltd.ncl.edu.tw/handle/99369974449929980052.

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碩士<br>國立臺灣大學<br>電機工程學系研究所<br>86<br>This thesis reports an analytical transient model for Bootstrapped BiCMOS log ic circuit using Gummel-Poon charge control model for deep submicron BiCMOS VL SI.This is also the transient model of Bootstrapped BiCMOS logic ciruit for the first time .With this model,circuit designer can analyze the transient respons e of bootstrapped BiCMOS logic circuits easily.Besides,we also present a measu rement circuit of pick-up electrode capacitance for readout electronics of Micr

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23

Guha, Anirudh. "Circuit breaker transient recovery voltage analysis with shunt capacitor bank configurations." Thesis, 2010. http://hdl.handle.net/2152/ETD-UT-2010-12-2263.

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Transient Recovery Voltage (TRV) is an important consideration in the selection and installation of circuit breakers with appropriate ratings. Capacitor banks with inrush current limiting reactors are an integral part of the power system. Capacitor banks with inrush reactors on the load side terminal of the capacitor breaker alter the TRV seen across the breaker and it is critical to carry out the TRV analysis to prevent circuit breaker failure. TRV analysis has been performed for various capacitor bank - inrush reactor configurations, with the fault occurring at different terminals on the loa

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24

Wei, Cheng-yi, and 魏政義. "Modeling and Transient Analysis for Shunt Reactor Circuit of 161kV System." Thesis, 2008. http://ndltd.ncl.edu.tw/handle/57234897986642344618.

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碩士<br>逢甲大學<br>資訊電機工程碩士在職專班<br>96<br>This research is to inquires into in high intensive the environment of underground cable, if the burden is lighter, the port toward bitter end consumer voltage heat up the phenomenon, may cause the consumer equipment damage. Therefore, the Taipower Company will add the shunt reactor to provide the time lag in order to mutually the reactive power, in order to in suppress low voltage of the bitter end effectively. This research intends to use the ATPDraw creates underground cable and the model of synchronous generator, and with distribution constant the compon

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25

Su, YI-Wen, and 蘇意雯. "Applications of Jiles-Atherton Model for Transient Behavior Analysis of Core Magnetic Circuit." Thesis, 2003. http://ndltd.ncl.edu.tw/handle/68394946275424502230.

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碩士<br>逢甲大學<br>電機工程所<br>91<br>The direct current (DC) offset component of current will be produced when the fault occurs in power system. If this DC offset of current is flowing into a protective current transformer (CT), it will cause the core of CT to saturate and produce a distorted secondary current because of too large DC offset component, and core hysteresis results in a residual flux that also affects the CT transient behavior. Using Jiles-Atherton (J-A) model, in convention, need the known excitation current of ferromagnetic core or magnetic field, and just can build ferromagnetic hyste

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26

Sanyal, Alodeep. "On detection, analysis and characterization of transient and parametric failures in nano-scale CMOS VLSI." 2010. https://scholarworks.umass.edu/dissertations/AAI3409842.

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As we move deep into nanometer regime of CMOS VLSI (45nm node and below), the device noise margin gets sharply eroded because of continuous lowering of device threshold voltage together with ever increasing rate of signal transitions driven by the consistent demand for higher performance. Sharp erosion of device noise margin vastly increases the likelihood of intermittent failures (also known as parametric failures) during device operation as opposed to permanent failures caused by physical defects introduced during manufacturing process. The major sources of intermittent failures are capaciti

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27

LI, JUNG-CHIEN, and 李榮乾. "HARMONIC, TRANSIENT, AND STEADY-STATE ANALYSIS OF LINEAR AND NONLINEAR CIRCUITS." Thesis, 1990. http://ndltd.ncl.edu.tw/handle/77141701583485169969.

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博士<br>國立臺灣大學<br>電機工程研究所<br>79<br>Past studies on circuit theory mostly concentrate on the steady-styate analysis of linear networks. As we know, in addition to linear circuits, the research on nonlinear circuits should be emphasized. We will also discuss the computation of the transient response of the circult. When the excitation source is nonsinusoidal or the circuit of interest is nonlinear, the circuit output will contain harmonic components, and the Fourier series or fast Fourier transform (FFT) must

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28

Garg, Rajesh. "Analysis and Design of Resilient VLSI Circuits." 2009. http://hdl.handle.net/1969.1/ETD-TAMU-2009-05-410.

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The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors. Among these noise sources, soft errors (or error caused by radiation particle strikes) have become an increasingly troublesome issue for memor

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29

Chiang, I.-Ting, and 江怡霆. "Matrix Approach for Transient Analysis of Complex Transmission Line Circuits Using HWSD and SATD." Thesis, 2002. http://ndltd.ncl.edu.tw/handle/96219205438736248218.

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博士<br>國立臺灣大學<br>電信工程學研究所<br>90<br>Two matrix approaches, the Haar wavelet scale domain (HWSD) method and the staircase-approximation time-domain (SATD) method, for transient analysis of transmission line circuits are proposed in this dissertation. By basis expansion in the time domain, the transmission line equations, dispersive or not, are converted into matrix differential equations. Transient response is obtained by matrix operations. Both methods are essentially suitable for lossy and dispersive transmission lines with nonlinear terminations. Problems of nonuniform lines can easily be exte

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30

Lin, Yu Hsuan, and 林佑軒. "Transient Analysis and Experiment of Driving Active Matrix Organic Light Emitting Diode Associated with Inverter Circuitry." Thesis, 2017. http://ndltd.ncl.edu.tw/handle/ff4vg3.

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碩士<br>國立臺北科技大學<br>光電工程系研究所<br>105<br>This thesis research is to experimentally investigate the function of suppressing the current surges as organic light-emitting diodes (OLED) undergo rapidly charging and discharging in active-matrix driving scheme by applying external inverter circuitry. The phenomenon of current surge is caused by the capacitive characteristic of an OLED in which organic layers are sandwiched by anode and cathode electrodes. The inverter circuit module composed of four independent transistors with several operational modes is parallel connected to the power line of an OLED

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