Books on the topic 'CMOS process'
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Prall, Kirk. CMOS Plasma and Process Damage. Springer Nature Switzerland, 2025. https://doi.org/10.1007/978-3-031-89029-1.
Full textG, Buehler Martin, ed. End-of-fabrication CMOS process monitor. National Aeronautics and Space Administration, 1990.
Find full textG, Buehler Martin, ed. End-of-fabrication CMOS process monitor. National Aeronautics and Space Administration, 1990.
Find full textZjajo, Amir. Stochastic Process Variation in Deep-Submicron CMOS. Springer Netherlands, 2014. http://dx.doi.org/10.1007/978-94-007-7781-1.
Full textMagierowski, Sebastian Claudiusz. A PMOS transistor for a low-power 1 V CMOS process. National Library of Canada = Bibliothèque nationale du Canada, 1999.
Find full textMadrid, Philip E. Device design and process window analysis of a deep submicron CMOS VLSI technology. Addison-Wesley, 1992.
Find full textTsu-Jae, King, Materials Research Society Meeting, and Symposium on CMOS Front-End Materials and Process Technology (2003 : San Francisco, Calif.), eds. CMOS front-end materials and process technology: Symposium held April 22-24, 2003, San Francisco, California, U.S.A. Materials Research Society, 2003.
Find full textAndrei, Pavlov. CMOS SRAM circuit design and parametric test in nano-scaled technologies: Process-aware SRAM design and test. Springer, 2008.
Find full textMurashko, Mikhail, Igor Ivanov, and Nadezhda Knyazyuk. THE BASICS OF MEDICAL CARE QUALITY AND SAFETY PROVISION. Advertising and Information Agency "Standards and quality», 2020. http://dx.doi.org/10.35400/978-5-600-02711-4.
Full textAdvanced CMOS Process Technology. Elsevier, 1989. http://dx.doi.org/10.1016/b978-0-12-234119-9.x5001-9.
Full textPimbley, J. Advanced CMOS Process Technology. Elsevier Science & Technology Books, 2012.
Find full textEl-Kareh, Badih. CMOS and BiCMOS Process Integration and Device Characterization. Springer, 2007.
Find full textStochastic Process Variation In Deepsubmicron Cmos Circuits And Algorithms. Springer, 2013.
Find full textCMOS Front-End Materials and Process Technology: Volume 765. Materials Research Society, 2003.
Find full textZürich, Eidgenössische Technische Hochschule, ed. An industrial CMOS process family for integrated silicon sensors. 1999.
Find full textZjajo, Amir. Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms. Springer Netherlands, 2016.
Find full textZjajo, Amir. Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms. Springer London, Limited, 2013.
Find full textZürich, Eidgenössische Technische Hochschule, ed. CMOS force sensors for wire bonding and flip chip process characterization. 2003.
Find full textNelson, Taylor. MIC4420/9 - 6A Peak Low-Side MOSFET Driver Biploar/CMOS/DMOS Process. Microchip Technology Incorporated, 2018.
Find full textIEEE Electron Devices Society. Latchup Committee. IEEE Recommended Practice for Latchup Test Methods for Cmos and Bicmos Integrated-Circuit Process Characterization. Institute of Electrical & Electronics Enginee, 1991.
Find full textPavlov, Andrei, and Manoj Sachdev. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test. Springer, 2010.
Find full textChatterjee, Amitava. Analog Cmos Process Integration for Rf and Mixed Signal Soc (Synthesis Lectures on Solid State Materials and Devices). Morgan & Claypool Publishers, 2007.
Find full textHierlemann, Andreas, Markus Graf, Diego Barrettino, and Henry P. Baltes. CMOS Hotplate Chemical Microsensors. Springer, 2010.
Find full textMather, Daryl. Cmms: A Timesaving Implementation Process. Taylor & Francis Group, 2002.
Find full textMather, Daryl. Cmms: A Timesaving Implementation Process. Taylor & Francis Group, 2003.
Find full textMather, Daryl. Cmms: A Timesaving Implementation Process. Taylor & Francis Group, 2002.
Find full textShiraishi, K., and T. Nakayama. Role of computational sciences in Si nanotechnologies and devices. Edited by A. V. Narlikar and Y. Y. Fu. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199533060.013.1.
Full textMather, Daryl. CMMS: A Timesaving Implementation Process (Plant Engineering Series). CRC, 2002.
Find full textvan Bommel, Koen, and André Spicer. Critical Management Studies and Paradox. Edited by Wendy K. Smith, Marianne W. Lewis, Paula Jarzabkowski, and Ann Langley. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780198754428.013.6.
Full textWittmann, Stacy Ann, and Julianne T. Stam. Redesign Your Library Website. ABC-CLIO, LLC, 2016. http://dx.doi.org/10.5040/9798216006213.
Full textAlvesson, Mats, and Maxine Robertson. Organizational Identity. Edited by Michael G. Pratt, Majken Schultz, Blake E. Ashforth, and Davide Ravasi. Oxford University Press, 2016. http://dx.doi.org/10.1093/oxfordhb/9780199689576.013.12.
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