Relevant bibliographies by topics / Compression test

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Compression test'

Author: Grafiati
Published: 4 June 2021
Last updated: 7 September 2023

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Journal articles on the topic "Compression test"

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Anggraini, Nurti Kusuma, Seno Suharyo, and Desy Ratna Arthaningtyas. "ANALISIS UJI KUAT TEKAN PAVING BLOCK DENGAN COMPRESSION TEST DAN HAMMER TEST." Menara: Jurnal Teknik Sipil 18, no. 2 (July 8, 2023): 159–65. http://dx.doi.org/10.21009/jmenara.v18i2.36679.

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Based on its quality, paving blocks are used in the construction sector and an alternative choice for surface pavement layers. Several other advantages are concrete bricks (paving blocks) better than other pavements and are economical in maintenance, artistic in terms of the exterior of a building, do not require heavy equipment to work/install, and can be mass-produced. This study aims to compare the compressive strength of paving blocks using a compression test and hammer test and to determine the quality of paving blocks. In this study there are 9 objects, 3 different shapes of paving blocks consist of 3 pieces of each form. The form of paving blocks used are brick paving blocks, hexagons and worms (univape). Based on the test results, there is a difference in the compressive strength value of the compression test and the hammer test, where the compression test compressive strength value is greater than the hammer test compressive strength value. The results of the compressive strength test showed that the paving blocks were in the category of quality B paving blocks.
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Huang, Zhong Hua, Shao Jun Liu, Ying Guang Xu, and Wang Hu. "Seafloor Polymetallic Sulfides Mechanical Property Test." Advanced Materials Research 1015 (August 2014): 316–19. http://dx.doi.org/10.4028/www.scientific.net/amr.1015.316.

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Seafloor polymetallic sulfide specimens were developed according to engineering rock test method standard (GB/T 50266-2013). Seafloor polymetallic sulfide wet density and dry density were tested. Uniaxial compressive strength and triaxial compression strength of seafloor polymetallic sulfide were tested using rock mechanics test system MTS 815. Elasticity modulus and Poisson's ratio of seafloor polymetallic sulfide were calculated based on specimens stress-strain curves. Cohesion and internal friction angle were calculated based on specimens triaxial test Mohr stress circle. Test results show that seafloor polymetallic sulfide dry density average value is 2.6 g/cm3, wet density average value is 2.94 g/cm3. Uniaxial compressive strength and triaxial compression strength of seafloor polymetallic sulfide are unstable. Average value of the uniaxial compressive strength is 10.243MPa. Average value of triaxial compression strength test peak load is 47.166KN. Cohesion is 2.447MPa and internal friction angle is 38.04o.
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McCluskey, E. J., D. Burek, B. Koenemann, S. Mitra, J. Patel, J. Rajski, and J. Waicukauski. "Test data compression." IEEE Design & Test of Computers 20, no. 2 (March 2003): 76–87. http://dx.doi.org/10.1109/mdt.2003.1188267.

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CHEN, S. C. "The Scaphoid Compression Test." Journal of Hand Surgery 14, no. 3 (June 1989): 323–25. http://dx.doi.org/10.1016/0266-7681_89_90094-6.

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A clinical test for scaphoid waist fractures is described in which the first ray is compressed longitudinally. This has the advantage that it can be done when the patient is in a plaster cast. Of 52 patients with suspected scaphoid fractures, 37 had negative tests and proved by X-rays then and later to have no fracture. 12 had positive tests and X-rays. Two patients with positive tests had fractures nearby: one of the scaphoid tuberosity and one of the radial styloid. One patient with a negative test had de Quervain’s disease. Once union has occurred, the test becomes negative.
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CHEN, S. "The scaphoid compression test." Journal of Hand Surgery: Journal of the British Society for Surgery of the Hand 14, no. 3 (August 1989): 323–25. http://dx.doi.org/10.1016/0266-7681(89)90094-6.

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Kim, Yang-Soo, Jung-Man Kim, Kee-Yong Ha, Soon Choy, Min-Wook Joo, and Yang-Guk Chung. "The Passive Compression Test." American Journal of Sports Medicine 35, no. 9 (September 2007): 1489–94. http://dx.doi.org/10.1177/0363546507301884.

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Background Even though there are several physical tests available for superior labrum anterior posterior lesions, there have been very few reports on their accuracy, and none can be regarded as completely predictive for the presence of a superior labrum anterior posterior lesion in the shoulder joint. Hypothesis This new clinical test is a useful and accurate technique for detecting superior labral tears in the shoulder joint. Study Design Cohort study (diagnosis); Level of evidence, 2. Methods This test was conducted independently by 2 physicians before any other diagnostic evaluation. In all cases, the glenohumeral joint was investigated first, and the appropriate treatments were performed on the lesion. A protocol was established to evaluate the sensitivity, specificity, and positive and negative predictive values of this new clinical test. The reproducibility of this test was evaluated with a κ coefficient. Results Sixty-one patients (61 shoulders) were examined with the passive compression test, and all underwent arthroscopic surgery. In 31 patients with a positive passive compression test result, 27 had a superior labrum anterior posterior lesion, and in 30 patients with a negative passive compression test result, 6 had a superior labrum anterior posterior lesion. The sensitivity of the test was 81.8%, and the specificity was 85.7%. The positive predictive value was 87.1%, and the negative predictive value was 80.0%. The κ coefficient was 0.771 between the 2 independent examiners (P < .01). Conclusion The passive compression test is a useful and accurate technique for predicting superior labral tears of the shoulder joint.
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TIERI, O., A. POLZELLA, and V. IURA. "THE ISOTONOMETRIC COMPRESSION TEST." Acta Ophthalmologica 51, no. 2 (May 27, 2009): 129–41. http://dx.doi.org/10.1111/j.1755-3768.1973.tb03789.x.

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Kumar, Amit, Mark Kassab, Elham Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, and Chen Wang. "Isometric Test Data Compression." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 34, no. 11 (November 2015): 1847–59. http://dx.doi.org/10.1109/tcad.2015.2432133.

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Tanuja*, P. S. L., and Mrs K. Prasanthi. "Reduction of Test Data with Hybrid Test Points." International Journal of Innovative Technology and Exploring Engineering 9, no. 3 (January 30, 2020): 2535–38. http://dx.doi.org/10.35940/ijitee.c7969.019320.

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ATPG vectors for a combinational circuit exhibit correlations among the bits of a test vector. We propose a BIST circuit design methodology using spectral methods which utilizes the correlation information. This circuit serves dual purposes. It generates BIST vectors that are similar to the ATPG vectors with higher test coverage as compared to random and weighted random vectors. The same circuit can also function as a test data de-compressor for compressed ATPG vectors applied from an external tester. Logic built-in self-test (LBIST) is now increasingly used with on-chip test compression as a complementary solution for in-system test, where high quality, low power, low silicon area, and most importantly short test application time are key factors affecting ICs targeted for safety-critical systems. Test points, common in LBIST-ready designs, can help to reduce test time and the overall silicon overhead so that one can get desired test coverage with the minimal number of patterns. Typically, LBIST test points are dysfunctional when enabled in an ATPG-based test compression mode. Similarly, test points used to reduce ATPG pattern counts cannot guarantee desired random testability. We present a hybrid test point technology designed to reduce deterministic pattern counts and to improve fault detection likelihood by means of the same minimal set of test points. The hybrid test points are subsequently deployed in a scan-based LBIST scheme addressing stringent test requirements of certain application domains such as the automotive electronics market. These requirements, largely driven by safety standards, are met by significantly reducing test application time while preserving the high fault coverage. The new scheme is a combination of pseudorandom test patterns delivered in a test-per-clock fashion through conventional scan chains and per cycle-driven hybrid observation test points that capture faulty effects every shift cycle into dedicated scan chains. We also exhibit test data compression capabilities of the proposed BIST architecture. This architecture provides a maximum test data compression exceeding and a proportional test time reduction for serial interface reseeding.
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Wang, Hong Yun, and Hui Qiang Zheng. "Shear and Squeeze Rheometry of Magnetorheological Fluids." Advanced Materials Research 305 (July 2011): 344–47. http://dx.doi.org/10.4028/www.scientific.net/amr.305.344.

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The mechanical properties of a magnetorheological (MR) fluid in shearing, compression and shearing after compression have been studied in the magnetic field which is generated by a coil carrying different magnitudes of DC electrical current on a self-constructed test system. The relations of compression stress versus compression strain, yield stress versus compression stress were studied under different magnetic fields. The compressing tests showed that the MR fluid is very stiff at small compressive strains lower than 0.13. The shear yield stress of MR fluids after compression was much stronger than that of uncompressed MR fluids under the same magnetic field. The enhanced shear yield stress of MR fluids can be utilized to design the MR clutch and brake for new structure and will make MR fluids technology attractive for many applications.
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Dissertations / Theses on the topic "Compression test"

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Gattis, Sherri L. "Ruggedized Television Compression Equipment for Test Range Systems." International Foundation for Telemetering, 1988. http://hdl.handle.net/10150/615062.

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International Telemetering Conference Proceedings / October 17-20, 1988 / Riviera Hotel, Las Vegas, Nevada
The Wideband Data Protection Program was necessitated from the need to develop digitized, compressed video to enable encryption.
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Jas, Abhijit. "Test vector compression techniques for systems-on-chip /." Full text (PDF) from UMI/Dissertation Abstracts International, 2001. http://wwwlib.umi.com/cr/utexas/fullcit?p3008359.

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Sjöstrand, Björn. "Evaluation of Compression Testing and Compression Failure Modes of Paperboard : Video analysis of paperboard during short-span compression and the suitability of short- and long-span compression testing of paperboard." Thesis, Karlstads universitet, Institutionen för ingenjörs- och kemivetenskaper (from 2013), 2013. http://urn.kb.se/resolve?urn=urn:nbn:se:kau:diva-27519.

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The objectives of the thesis were to find the mechanisms that govern compression failures in paperboard and to find the link between manufacturing process and paperboard properties. The thesis also investigates two different test methods and evaluates how suitable they are for paperboard grades. The materials are several commercial board grades and a set of hand-formed dynamic sheets that are made to mimic the construction of commercial paperboard. The method consists of mounting a stereomicroscope on a short-span compression tester and recording the compression failure on video, long-span compression testing and standard properties testing. The observed failure modes of paperboard under compression were classified into four categories depending on the appearance of the failures. Initiation of failure takes place where the structure is weakest and fiber buckling happens after the initiation, which consists of breaking of fiber-fiber bonds or fiber wall delamination. The compression strength is correlated to density and operations and raw materials that increase the density also increases the compression strength. Short-span compression and Long-span compression are not suitable for testing all kinds of papers; the clamps in short-span give bulky specimens an initial geometrical shape that can affect the given value of compression strength. Long-span compression is only suitable for a limited range of papers, one problem with too thin papers are low wavelength buckling.
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Navickas, T. A., and S. G. Jones. "PULSE CODE MODULATION DATA COMPRESSION FOR AUTOMATED TEST EQUIPMENT." International Foundation for Telemetering, 1991. http://hdl.handle.net/10150/612065.

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International Telemetering Conference Proceedings / November 04-07, 1991 / Riviera Hotel and Convention Center, Las Vegas, Nevada
Development of automated test equipment for an advanced telemetry system requires continuous monitoring of PCM data while exercising telemetry inputs. This requirements leads to a large amount of data that needs to be stored and later analyzed. For example, a data stream of 4 Mbits/s and a test time of thirty minutes would yield 900 Mbytes of raw data. With this raw data, information needs to be stored to correlate the raw data to the test stimulus. This leads to a total of 1.8 Gb of data to be stored and analyzed. There is no method to analyze this amount of data in a reasonable time. A data compression method is needed to reduce the amount of data collected to a reasonable amount. The solution to the problem was data reduction. Data reduction was accomplished by real time limit checking, time stamping, and smart software. Limit checking was accomplished by an eight state finite state machine and four compression algorithms. Time stamping was needed to correlate stimulus to the appropriate output for data reconstruction. The software was written in the C programming language with a DOS extender used to allow it to run in extended mode. A 94 - 98% compression in the amount of data gathered was accomplished using this method.
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Poirier, Régis. "Compression de données pour le test des circuits intégrés." Montpellier 2, 2004. http://www.theses.fr/2004MON20119.

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Khayat, Moghaddam Elham. "On low power test and low power compression techniques." Diss., University of Iowa, 2011. https://ir.uiowa.edu/etd/997.

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With the ever increasing integration capability of semiconductor technology, today's large integrated circuits require an increasing amount of data to test them which increases test time and elevated requirements of tester memory. At the same time, as VLSI design sizes and their operating frequencies continue to increase, timing-related defects are high proportion of the total chip defects and at-speed test is crucial. DFT techniques are widely used in order to improve the testability of a design. While DFT techniques facilitate generation and application of tests, they may cause the test vectors to contain non-functional states which result in higher switching activities compared to the functional mode of operation. Excessive switching activity causes higher power dissipation as well as higher peak supply currents. Excessive power dissipation may cause hot spots that could cause damage the circuit. Excessive peak supply currents may cause higher IR drops which increase signal propagation delays during test causing yield loss. Several methods have been proposed to reduce the switching activity in the circuit under test during shift and capture cycles. While these methods reduce switching activity during test and eliminate the abnormal IR drop, circuits may now operate faster on the tester than they would in the actual system. For speed related and high resistance defect mechanisms, this type of undertesting means that the device could be rejected by the systems integrator or by the end consumer and thus increasing the DPPM of the devices. Therefore, it is critical to ensure that the peak switching activity generated during the two functional clock cycles of an at-speed test is as close as possible to the functional switching activity levels specified for the device. The first part of this dissertation proposes a new method to generate test vectors that mimic functional operation from the switching activity point of view. It uses states obtained by applying a number of functional clock cycles starting from the scan-in state of a test vector to fill unspecified scan cells in test cubes. Experimental results indicate that for industrial designs, the proposed techniques can reduce the peak capture switching on average by 49% while keeping the quality of test very close to conventional ATPG. The second part of this dissertation addresses IR-drop and power minimization techniques in embedded deterministic test environment. The proposed technique employs a controller that allows a given scan chain to be driven by either the decompressor or pseudo functional background. Experimental results indicate an average of 36% reduction in peak switching activity during capture using the proposed technique. In the last part of this dissertation, a new low power test data compression scheme using clock gater circuitry is proposed to simultaneously reduce test data volume and test power by enabling only a subset of the scan chains in each test phase. Since, most of the total power during test is typically in clock tree, by disabling significant portion of clock tree in each test phase, significant reduction in the test power in both combinational logic and clock distribution network are achieved. Using this technique, transitions in the scan chains during both loading of test stimuli and unloading of test responses decrease which will permit increased scan shift frequency and also increase in the number of cores that can be tested in parallel in multi-core designs. The proposed method has the ability of decreasing, in a power aware fashion, the test data volume. Experimental results presented for industrial designs demonstrate that on average reduction factors of 2 and 4 in test data volume and test power are achievable, respectively.
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Zacharia, Nadime. "Compression and decompression of test data for scan-based designs." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1997. http://www.collectionscanada.ca/obj/s4/f2/dsk1/tape11/PQDD_0004/MQ44048.pdf.

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Zacharia, Nadime. "Compression and decompression of test data for scan based designs." Thesis, McGill University, 1996. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=20218.

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Traditional methods to test integrated circuits (ICs) require enormous amount of memory, which make them increasingly expensive and unattractive. This thesis addresses this issue for scan-based designs by proposing a method to compress and decompress input test patterns. By storing the test patterns in a compressed format, the amount of memory required to test ICs can be reduced to manageable levels. The thesis describes the compression and decompression scheme in details. The proposed method relies on the insertion of a decompression unit on the chip. During test application, the patterns are decompressed by the decompression unit as they are applied. Hence, decompression is done on-the-fly in hardware and does not slow down test application.
The design of the decompression unit is treated in depth and a design is proposed that minimizes the amount of extra hardware required. In fact, the design of the decompression unit uses flip-flops already on the chip: it is implemented without inserting any additional flip-flops.
The proposed scheme is applied in two different contexts: (1) in (external) deterministic-stored testing, to reduce the memory requirements imposed on the test equipment; and (2) in built-in self test, to design a test pattern generator capable of generating deterministic patterns with modest area and memory requirements.
Experimental results are provided for the largest ISCAS'89 benchmarks. All of these results point to show that the proposed technique greatly reduces the amount of test data while requiring little area overhead. Compression factors of more than 20 are reported for some circuits.
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Pateras, Stephen. "Correlated and cube-contained random patterns : test set compression techniques." Thesis, McGill University, 1991. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=70300.

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Two novel methods to reduce the number of random test patterns required to fully test a circuit are proposed in this thesis. In the concept of correlated random patterns, reductions in a circuit's random pattern test length are achieved by taking advantage of correlations measured between values applied at different input positions in a complete deterministic test set. Instead of being generated independently, correlated inputs have their random values generated from a common source with each input's value then individually biased at a rate necessary to match the measured correlation. In the concept of cube-contained random patterns, reductions in random pattern test lengths are achieved by the successive assignment of temporarily fixed values to selected inputs during the random pattern generation process.
The concepts of correlated and cube-contained random patterns can be viewed as methods to compress a deterministic test set into a small amount of information which is then used to control the generation of a superset of the deterministic test set. The goal is to make this superset as small as possible while maintaining its containment of the original test set. The two concepts are meant to be used in either a Built-In Self-Test (BIST) environment or with an external tester when the storage requirements of a deterministic test are too large.
Experimental results show that both correlated and cube-contained random patterns can achieve 100% fault coverage of synthesized circuits using orders or magnitude less patterns than when equiprobable random patterns are used.
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Dalmasso, Julien. "Compression de données de test pour architecture de systèmes intégrés basée sur bus ou réseaux et réduction des coûts de test." Thesis, Montpellier 2, 2010. http://www.theses.fr/2010MON20061/document.

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Les circuits intégrés devenant de plus en plus complexes, leur test demande des efforts considérables se répercutant sur le coût de développement et de production de ces composants. De nombreux travaux ont donc porté sur la réduction du coût de ce test en utilisant en particulier les techniques de compression de données de test. Toutefois ces techniques n'adressent que des coeurs numériques dont les concepteurs détiennent la connaissance de toutes les informations structurelles et donc en pratique n'adressent que le test de sous-blocs d'un système complet. Dans cette thèse, nous proposons tout d'abord une nouvelle technique de compression des données de test pour les circuits intégrés compatible avec le paradigme de la conception de systèmes (SoC) à partir de fonctions pré-synthétisées (IPs ou coeurs). Puis, deux méthodes de test des systèmes utilisant la compression sont proposées. La première est relative au test des systèmes SoC utilisant l'architecture de test IEEE 1500 (avec un mécanisme d'accès au test de type bus), la deuxième concerne le test des systèmes pour lesquels la communication interne s'appuie sur des structures de type réseau sur puce (NoC). Ces deux méthodes utilisent conjointement un ordonnancement du test des coeurs du système avec une technique de compression horizontale afin d'augmenter le parallélisme du test des coeurs constituant le système et ce, à coût matériel constant. Les résultats expérimentaux sur des systèmes sur puces de référence montrent des gains de l'ordre de 50% sur le temps de test du système complet
While microelectronics systems become more and more complex, test costs have increased in the same way. Last years have seen many works focused on test cost reduction by using test data compression. However these techniques only focus on individual digital circuits whose structural implementation (netlist) is fully known by the designer. Therefore, they are not suitable for the testing of cores of a complete system. The goal of this PhD work was to provide a new solution for test data compression of integrated circuits taking into account the paradigm of systems-on-chip (SoC) built from pre-synthesized functions (IPs or cores). Then two systems testing method using compression are proposed for two different system architectures. The first one concerns SoC with IEEE 1500 test architecture (with bus-based test access mechanism), the second one concerns NoC-based systems. Both techniques use test scheduling methods combined with test data compression for better exploration of the design space. The idea is to increase test parallelism with no hardware extra cost. Experimental results performed on system-on-chip benchmarks show that the use of test data compression leads to test time reduction of about 50% at system level
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Books on the topic "Compression test"

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Cold Regions Research and Engineering Laboratory (U.S.), ed. Axial double-ball test versus the uniaxial unconfined compression test for measuring the compressive strength of freshwater and sea ice. [Hanover, N.H.]: US Army Corps of Engineers, Cold Regions Research & Engineering Laboratory, 1993.

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Davis, Randall C. Analysis and test of superplastically formed titanium hat-stiffened panels under compression. [S.l.]: [s.n.], 1986.

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Baussan, Reginald. Concrete block masonry test program. New York: Columbia University, Department of Civil Engineering and Engineering Mechanics, 1985.

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Masters, John E. Standard test methods for textile composites. [Washington, DC: National Aeronautics and Space Administration, 1996.

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Masters, John E. Standard test methods for textile composites. Hampton, Va: National Aeronautics and Space Administration, Langley Research Center, 1996.

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Li, Jian. Test and analysis of composite hat stringer pull-off test specimens. Hampton, Va: National Aeronautics and Space Administration, Langley Research Center, 1996.

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Verderaime, V. Test load verification through strain data analysis. Washington, DC: National Aeronautics and Space Administration, 1995.

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J, Fields R., Agulyansky A, and National Institute of Standards and Technology (U.S.), eds. Evaluation of press-and-sinter parameters for tantalum pentoxide by the diametral compression test. Gaithersburg, Md: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

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J, Fields R., Agulyansky A, and National Institute of Standards and Technology (U.S.), eds. Evaluation of press-and-sinter parameters for tantalum pentoxide by the diametral compression test. Gaithersburg, Md: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

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J, Fields R., Agulyansky A, and National Institute of Standards and Technology (U.S.), eds. Evaluation of press-and-sinter parameters for tantalum pentoxide by the diametral compression test. Gaithersburg, Md: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

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Book chapters on the topic "Compression test"

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Navabi, Zainalabedin. "Test Compression." In Digital System Test and Testable Design, 345–73. Boston, MA: Springer US, 2010. http://dx.doi.org/10.1007/978-1-4419-7548-5_10.

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Brown, Roger. "Compression." In Physical Test Methods for Elastomers, 155–60. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-66727-0_11.

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Molenda, Marek. "Triaxial Compression Test." In Encyclopedia of Agrophysics, 924–25. Dordrecht: Springer Netherlands, 2011. http://dx.doi.org/10.1007/978-90-481-3585-1_177.

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Chattopadhyay, Santanu. "Test-Data Compression." In Thermal-Aware Testing of Digital VLSI Circuits and Systems, 53–70. First edition. | Boca Raton, FL : Taylor & Francis Group, CRC Press, 2018.: CRC Press, 2018. http://dx.doi.org/10.1201/9781351227780-3.

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Matoušek, I., and O. Matúšek. "Simulation of Isothermal Compression Test." In Advances in Mechanism Design II, 199–205. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-44087-3_26.

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DALMASSO, Julien, Marie-Lise FLOTTES, and Bruno ROUZEYRE. "Compression-based SoC Test Infrastructures." In VLSI-SoC: Advanced Topics on Systems on a Chip, 1–15. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-89558-1_4.

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Huhn, Sebastian, and Rolf Drechsler. "Embedded Multichannel Test Compression for Low-Pin Count Test." In Design for Testability, Debug and Reliability, 105–21. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-69209-4_7.

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Nishijima, S., T. Okada, S. Ueno, and K. Niwa. "Stress Analysis of Shear/Compression Test." In Advances in Cryogenic Engineering Materials, 169–75. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-9059-7_23.

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Lee, Jong Woong, Cheol Won Kong, Se Won Eun, Jae Sung Park, Young Soon Jang, Yeong Moo Yi, and Gwang Rae Cho. "Compression Test of Composite Sandwich Panel." In Advances in Fracture and Damage Mechanics VI, 605–8. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-448-0.605.

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Rooban, S., and R. Manimegalai. "Test Data Compression Methods: A Review." In Proceedings of International Conference on Artificial Intelligence, Smart Grid and Smart City Applications, 791–99. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-24051-6_74.

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Conference papers on the topic "Compression test"

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Wang, Seongmoon, Wenlong Wei, and Srimat T. Chakradhar. "A High Compression and Short Test Sequence Test Compression Technique to Enhance Compressions of LFSR Reseeding." In 16th Asian Test Symposium (ATS 2007). IEEE, 2007. http://dx.doi.org/10.1109/ats.2007.4387987.

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Wang, Seongmoon, Wenlong Wei, and Srimat T. Chakradhar. "A High Compression and Short Test Sequence Test Compression Technique to Enhance Compressions of LFSR Reseeding." In 16th Asian Test Symposium (ATS 2007). IEEE, 2007. http://dx.doi.org/10.1109/ats.2007.52.

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Tahoori, Mehdi B., and Subhasish Mitra. "Test Compression for FPGAs." In 2006 IEEE International Test Conference. IEEE, 2006. http://dx.doi.org/10.1109/test.2006.297645.

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Cory, Bruce, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion Keller, Kee Kim, Dwayne Burek, Steve Oakland, and Benoit Nadeau-Dostie. "OCI: Open Compression Interface." In 2006 IEEE International Test Conference. IEEE, 2006. http://dx.doi.org/10.1109/test.2006.297746.

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Williams, T. W. "The Limits of Compression." In 2008 IEEE International Test Conference. IEEE, 2008. http://dx.doi.org/10.1109/test.2008.4700670.

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Balcarek, Jiri, Petr Fier, and Jan Schmidt. "PBO-Based Test Compression." In 2014 17th Euromicro Conference on Digital System Design (DSD). IEEE, 2014. http://dx.doi.org/10.1109/dsd.2014.86.

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Mukherjee, N. "Improving Test Quality Using Test Data Compression." In 14th Asian Test Symposium (ATS'05). IEEE, 2005. http://dx.doi.org/10.1109/ats.2005.70.

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Wang, Xing, Zezhong Wang, Naixing Wang, Weiwei Zhang, and Yu Huang. "Compression-Aware ATPG." In 2022 IEEE International Test Conference (ITC). IEEE, 2022. http://dx.doi.org/10.1109/itc50671.2022.00018.

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Yuan, Feng, and Qiang Xu. "Compression-aware pseudo-functional testing." In 2009 IEEE International Test Conference (ITC). IEEE, 2009. http://dx.doi.org/10.1109/test.2009.5355548.

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Threatt, Vance, Atchyuth Gorti, Jeff Rearick, Shaishav Parikh, Anirudh Kadiyala, Aditya Jagirdar, and Andy Halliday. "Vendor-agnostic native compression engine." In 2010 IEEE International Test Conference (ITC). IEEE, 2010. http://dx.doi.org/10.1109/test.2010.5699311.

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Reports on the topic "Compression test"

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Corona, Edmundo. Numerical Simulations of the Kolsky Compression Bar Test. Office of Scientific and Technical Information (OSTI), October 2015. http://dx.doi.org/10.2172/1226520.

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Kovacs, Austin. Axial Double-Ball Test Versus the Uniaxial Unconfined Compression Test for Measuring the Compressive Strength of Freshwater and Sea Ice. Fort Belvoir, VA: Defense Technical Information Center, December 1993. http://dx.doi.org/10.21236/ada277025.

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Jadaan, Osama M., and Andrew A. Wereszczak. Effective Size Analysis of the Diametral Compression (Brazil) Test Specimen. Office of Scientific and Technical Information (OSTI), April 2009. http://dx.doi.org/10.2172/951944.

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Dyer, S., A. Faburada, K. Gallavan, M. Hoogendyk, and P. Hui. Compression Strength and Drop Test Performance of XM232 Case Assemblies,. Fort Belvoir, VA: Defense Technical Information Center, December 1995. http://dx.doi.org/10.21236/ada303269.

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Tantawi, Sami. The Next Linear Collider Test Accelerator's RF Pulse Compression and Transmission Systems. Office of Scientific and Technical Information (OSTI), February 1999. http://dx.doi.org/10.2172/10192.

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Croop, Harold C. Fabrication of Curved Graphite/Epoxy Compression Test Panels and Generation of Material Properties. Fort Belvoir, VA: Defense Technical Information Center, October 1985. http://dx.doi.org/10.21236/ada368444.

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Trim, M., Matthew Murray, and C. Crane. Modernization and structural evaluation of the improved Overhead Cable System. Engineer Research and Development Center (U.S.), March 2021. http://dx.doi.org/10.21079/11681/40025.

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Abstract:
A modernized Overhead Cable System prototype for a 689 ft (210 m) Improved Ribbon Bridge crossing was designed, assembled, and structurally tested. Two independent structural tests were executed, i.e., a component-level compression test of the BSS tower was performed to determine its load capacity and failure mode; and a system-level ‘dry’ test of the improved OCS prototype was conducted to determine the limit state and failure mode of the entire OCS. In the component-level compression test of the BSS tower, the compressive capacity was determined to be 102 kips, and the failure mode was localized buckling in the legs of the tower section. During system-level testing, the prototype performed well up to 40.5 kips of simulated drag load, which corresponds to a uniformly distributed current velocity of 10.7 ft/s. If a more realistic, less conservative parabolic velocity distribution is assumed instead, the drag load for an 11 ft/s current is 21.1 kips. Under this assumption, the improved OCS prototype has a factor of safety of 1.9, based on a 689-ft crossing and 11-ft/s current. The OCS failed when one of the tower guy wires pulled out of the ground, causing the tower to overturn.
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Livne, Z., R. J. Fields, and A. Agulyansky. Evaluation of press-and-sinter parameters for tantalum pentoxide by the diametral compression test. Gaithersburg, MD: National Institute of Standards and Technology, 1997. http://dx.doi.org/10.6028/nist.ir.6024.

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Lawson, J. Randall, William H. Twilley, and Kevin S. Malley. Development of a dynamic compression test apparatus for measuring thermal performance of fire fighters' protective clothing. Gaithersburg, MD: National Institute of Standards and Technology, 2000. http://dx.doi.org/10.6028/nist.ir.6502.

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Aguilar Valero, Franscisco, Daniel Neyer, and Pedro Vicente Quiles. Monitoring Procedure for Field Test & Demo Systems with Compression Heat Pumps Driven by Photovoltaic Solar Energy. IEA SHC Task 53, June 2019. http://dx.doi.org/10.18777/ieashc-task53-2019-0008.

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