Academic literature on the topic 'Couloir de mobilité'
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Journal articles on the topic "Couloir de mobilité"
Bovey, Laurent. "De la classe spéciale à la classe régulière." Revue suisse de pédagogie spécialisée 14, no. 01 (2024): 13–19. http://dx.doi.org/10.57161/r2024-01-03.
Full textScalettaris, Giulia. "L’impact de la crise de 2015 sur la mobilité des Afghans à travers l’Europe." Mondes & Migrations 1348 (2025): 55–62. https://doi.org/10.4000/13lne.
Full textNagy, Raluca. "Tourisme et migration dans le Maramureş." Ethnologies 31, no. 1 (2009): 111–26. http://dx.doi.org/10.7202/038502ar.
Full textPotbhare, Siddharth, Gary Pennington, Neil Goldsman, et al. "Using a First Principles Coulomb Scattering Mobility Model for 4H-SiC MOSFET Device Simulation." Materials Science Forum 527-529 (October 2006): 1321–24. http://dx.doi.org/10.4028/www.scientific.net/msf.527-529.1321.
Full textPérez-Tomás, Amador, Michael R. Jennings, Philip A. Mawby, et al. "SiC MOSFET Channel Mobility Dependence on Substrate Doping and Temperature Considering High Density of Interface Traps." Materials Science Forum 556-557 (September 2007): 835–38. http://dx.doi.org/10.4028/www.scientific.net/msf.556-557.835.
Full textJi, Qizheng, Jun Liu, Ming Yang, et al. "Influence of Proton Irradiation Energy on Gate–Channel Low-Field Electron Mobility in AlGaN/GaN HEMTs." Electronics 12, no. 6 (2023): 1473. http://dx.doi.org/10.3390/electronics12061473.
Full textPérez-Tomás, Amador, Miquel Vellvehi, Narcis Mestres, José Millan, P. Vennegues, and J. Stoemenos. "Modelling of the Anomalous Field-Effect Mobility Peak of O-Ta2Si/4H-SiC High-k MOSFETs Measured in Strong Inversion." Materials Science Forum 527-529 (October 2006): 1059–62. http://dx.doi.org/10.4028/www.scientific.net/msf.527-529.1059.
Full textChen, W. P. N., Pin Su, and K. I. Goto. "Investigation of Coulomb Mobility in Nanoscale Strained PMOSFETs." IEEE Transactions on Nanotechnology 7, no. 5 (2008): 538–43. http://dx.doi.org/10.1109/tnano.2008.2004771.
Full textDriussi, Francesco, and David Esseni. "Simulation Study of Coulomb Mobility in Strained Silicon." IEEE Transactions on Electron Devices 56, no. 9 (2009): 2052–59. http://dx.doi.org/10.1109/ted.2009.2026394.
Full textWalczak, Jakub, and Bogdan Majkusiak. "Scattering mechanisms in MOS/SOI devices with ultrathin semiconductor layers." Journal of Telecommunications and Information Technology, no. 1 (March 30, 2004): 39–49. http://dx.doi.org/10.26636/jtit.2004.1.230.
Full textDissertations / Theses on the topic "Couloir de mobilité"
Cortina, Mélanie. "Fostering synergy between public transportation and autonomous mobility on demand : the prospects of regulation." Electronic Thesis or Diss., Vaulx-en-Velin, École nationale des travaux publics de l’État, 2023. http://www.theses.fr/2023ENTP0010.
Full textPotbhare, Siddharth. "Characterization of 4H-SiC MOSFETs using first principles coulomb scattering mobility modeling and device simulation." College Park, Md. : University of Maryland, 2005. http://hdl.handle.net/1903/3347.
Full textDevogelaere, Jonathan. "Les couleurs du mobilier d'apparat en bronze dans le monde gréco-romain, du IIe siècle avant notre ère au IIe siècle de notre ère : de la caractérisation technique aux valeurs symboliques." Thesis, Aix-Marseille, 2018. http://www.theses.fr/2018AIXM0602.
Full textLiu, Liu. "Corridors urbains et Transit Oriented Development : Enseignements d’une modélisation intégrée des transports et de l’usage du sol appliquée à la métropole lilloise." Thesis, Lille 1, 2016. http://www.theses.fr/2016LIL10117/document.
Full textCassilde, Stéphanie. "Choix rationnel, langage et représentations des inégalités et des discriminations. Une étude des déclarations de couleurs de peau dans le Brésil contemporain." Phd thesis, Université d'Auvergne - Clermont-Ferrand I, 2012. http://tel.archives-ouvertes.fr/tel-00713948.
Full textWu, Chih-Jung, and 吳致融. "Investigation of Remote Coulomb Scattering Induced Mobility Degradation in Advanced VLSI Devices." Thesis, 2007. http://ndltd.ncl.edu.tw/handle/46699028835799800777.
Full textBook chapters on the topic "Couloir de mobilité"
Potbhare, S., Gary Pennington, Neil Goldsman, et al. "Using a First Principles Coulomb Scattering Mobility Model for 4H-SiC MOSFET Device Simulation." In Silicon Carbide and Related Materials 2005. Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-425-1.1321.
Full textBonnefoy, Baptiste. "Chapitre IV. Les officiers de couleur : mobilité sociale, mobilité spatiale." In Au-delà de la couleur. Presses universitaires de Rennes, 2022. http://dx.doi.org/10.4000/books.pur.164481.
Full textBilbro, Jeffrey. "Fidelity." In Virtues of Renewal. University Press of Kentucky, 2018. http://dx.doi.org/10.5810/kentucky/9780813176406.003.0007.
Full textSingleton, John. "Inhomogeneous and hot carrier distributions in semiconductors." In Band Theory and Electronic Properties of Solids. Oxford University PressOxford, 2001. http://dx.doi.org/10.1093/oso/9780198506454.003.0012.
Full textGhosh, Rahul, Tanmoy Majumder, Abhishek Bhattacharjee, and Rupanjal Debbarma. "FinFET Advancements and Challenges: A State-of-the-Art Review." In Nanoelectronics Devices: Design, Materials, and Applications (Part I). BENTHAM SCIENCE PUBLISHERS, 2023. http://dx.doi.org/10.2174/9789815136623123010011.
Full textSri, G. V. Keerthi, Venkataramana Veeramsetty, and D. M. Vinod Kumar. "Next-Generation Battery Monitoring Using AI for Sustainable Electric Mobility." In Driving Innovation at the Intersection of Renewable Energy and the Internet of Vehicles. IGI Global, 2025. https://doi.org/10.4018/979-8-3373-3321-2.ch007.
Full textBaker, Jack R., Jeffrey Bilbro, and Wendell Berry. "Introduction." In Wendell Berry and Higher Education. University Press of Kentucky, 2017. http://dx.doi.org/10.5810/kentucky/9780813169026.003.0001.
Full textGraf, William L. "Fluvial Sediment, Forms, and Processes." In Plutonium and the Rio Grande. Oxford University Press, 1995. http://dx.doi.org/10.1093/oso/9780195089332.003.0009.
Full textConference papers on the topic "Couloir de mobilité"
Xu, Haoyu, Jing Zhang, Shuhua Wei, Xiaolei Wang, and Wenwu Wang. "Electron Mobility Degradation Due to Remote Coulomb Scattering in Ge MOSFET." In 2016 International Conference on Computer Science and Electronic Technology. Atlantis Press, 2016. http://dx.doi.org/10.2991/cset-16.2016.72.
Full textDriussi, Francesco, and David Esseni. "Revised analysis of Coulomb scattering limited mobility in biaxially strained silicon MOSFETs." In 2009 Proceedings of the European Solid State Device Research Conference (ESSDERC). IEEE, 2009. http://dx.doi.org/10.1109/essderc.2009.5331465.
Full textKumar, Raman, MD SAIF AHMAD, Krishna Challa, Ashish Ranjan, and Madhuri Bayya. "Precise and Robust SoC Estimation Using Adaptive Filters-Based Techniques for Electric Trucks." In 11th SAEINDIA International Mobility Conference (SIIMC 2024). SAE International, 2024. https://doi.org/10.4271/2024-28-0152.
Full textWeber, Olivier, and Shin-ichi Takagi. "New Findings on Coulomb Scattering Mobility in Strained-Si nFETs and its Physical Understanding." In 2007 IEEE Symposium on VLSI Technology. IEEE, 2007. http://dx.doi.org/10.1109/vlsit.2007.4339755.
Full textZhao, Yi, Mitsuru Takenaka, and Shinichi Takagi. "Comprehensive understanding of surface roughness and Coulomb scattering mobility in biaxially-strained Si MOSFETs." In 2008 IEEE International Electron Devices Meeting (IEDM). IEEE, 2008. http://dx.doi.org/10.1109/iedm.2008.4796755.
Full textN. Chen, W. P., P. Su, and K. Goto. "A Comprehensive Study of Coulomb Scattering Mobility in Short-Channel Process-Induced Strain NMOSFETs." In 2008 International Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 2008. http://dx.doi.org/10.7567/ssdm.2008.b-6-4.
Full textYang, J., Z. Xia, G. Du, X. Liu, R. Han, and J. Kang. "Coulomb Scattering induced mobility degradation in Ultrathin-body SOI MOSFETs with high-k gate stack." In 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings. IEEE, 2006. http://dx.doi.org/10.1109/icsict.2006.306146.
Full textTakahashi, N., A. Aki, T. Ukai, Y. Nakajima, T. Maekawa, and T. Hanajiri. "Electrophoretic mobility and resultant zeta potential of an individual cell analyzed by electrophoretic coulter method." In 2009 International Semiconductor Device Research Symposium (ISDRS 2009). IEEE, 2009. http://dx.doi.org/10.1109/isdrs.2009.5378234.
Full textOka, Hiroshi, Takumi Inaba, Shota Iizuka, Hidehiro Asai, Kimihiko Kato, and Takahiro Mori. "Effect of Conduction Band Edge States on Coulomb-Limiting Electron Mobility in Cryogenic MOSFET Operation." In 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits). IEEE, 2022. http://dx.doi.org/10.1109/vlsitechnologyandcir46769.2022.9830505.
Full textZhang, Xianle, Pengying Chang, Gang Du, and Xiaoyan Liu. "Impacts of Remote Coulomb Scattering on Hole Mobility in Si p-MOSFFETs at Cryogenic Temperatures." In 2019 Silicon Nanoelectronics Workshop (SNW). IEEE, 2019. http://dx.doi.org/10.23919/snw.2019.8782899.
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