Academic literature on the topic 'Coverage metric'
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Journal articles on the topic "Coverage metric"
Ng, Marie, Nancy Fullman, Joseph L. Dieleman, Abraham D. Flaxman, Christopher J. L. Murray, and Stephen S. Lim. "Effective Coverage: A Metric for Monitoring Universal Health Coverage." PLoS Medicine 11, no. 9 (September 22, 2014): e1001730. http://dx.doi.org/10.1371/journal.pmed.1001730.
Full textD’Angelo, Gianlorenzo, Martin Olsen, and Lorenzo Severini. "Coverage Centrality Maximization in Undirected Networks." Proceedings of the AAAI Conference on Artificial Intelligence 33 (July 17, 2019): 501–8. http://dx.doi.org/10.1609/aaai.v33i01.3301501.
Full textAMMANN, PAUL E., and PAUL E. BLACK. "A SPECIFICATION-BASED COVERAGE METRIC TO EVALUATE TEST SETS." International Journal of Reliability, Quality and Safety Engineering 08, no. 04 (December 2001): 275–99. http://dx.doi.org/10.1142/s0218539301000530.
Full textLiu, C. N., and J. Y. Jou. "Efficient coverage analysis metric for HDL design validation." IEE Proceedings - Computers and Digital Techniques 148, no. 1 (January 1, 2001): 1–6. http://dx.doi.org/10.1049/ip-cdt:20010203.
Full textMukherjee, Debashis, and Rajib Mall. "An integration test coverage metric for Java programs." International Journal of System Assurance Engineering and Management 10, no. 4 (June 15, 2019): 576–601. http://dx.doi.org/10.1007/s13198-019-00787-9.
Full textde Moya-Anegón, Félix, Zaida Chinchilla-Rodríguez, Benjamín Vargas-Quesada, Elena Corera-Álvarez, Francisco José Muñoz-Fernández, Antonio González-Molina, and Victor Herrero-Solana. "Coverage analysis of Scopus: A journal metric approach." Scientometrics 73, no. 1 (July 10, 2007): 53–78. http://dx.doi.org/10.1007/s11192-007-1681-4.
Full textArdito, Luca, Riccardo Coppola, Luca Barbato, and Diego Verga. "A Tool-Based Perspective on Software Code Maintainability Metrics: A Systematic Literature Review." Scientific Programming 2020 (August 4, 2020): 1–26. http://dx.doi.org/10.1155/2020/8840389.
Full textMasaoka, Kenichiro, and Yukihiro Nishida. "Metric of color-space coverage for wide-gamut displays." Optics Express 23, no. 6 (March 17, 2015): 7802. http://dx.doi.org/10.1364/oe.23.007802.
Full textCruz, Pedro, Rodrigo S. Couto, Luís Henrique M. K. Costa, Anne Fladenmuller, and Marcelo Dias de Amorim. "A delay-aware coverage metric for bus-based sensor networks." Computer Communications 156 (April 2020): 192–200. http://dx.doi.org/10.1016/j.comcom.2020.03.043.
Full textWarren, Joshua L., Montserrat Fuentes, Amy H. Herring, and Peter H. Langlois. "Air Pollution Metric Analysis While Determining Susceptible Periods of Pregnancy for Low Birth Weight." ISRN Obstetrics and Gynecology 2013 (January 30, 2013): 1–9. http://dx.doi.org/10.1155/2013/387452.
Full textDissertations / Theses on the topic "Coverage metric"
Milne, Andrew Steven. "A benchmark fault coverage metric for analogue circuits." Thesis, University of Huddersfield, 1997. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.285669.
Full textBansal, Kunal. "Increasing Branch Coverage with Dual Metric RTL Test Generation." Thesis, Virginia Tech, 2018. http://hdl.handle.net/10919/96581.
Full textMS
Linn, Jane Ostergar. "A Coverage Metric to Aid in Testing Multi-Agent Systems." BYU ScholarsArchive, 2017. https://scholarsarchive.byu.edu/etd/6666.
Full textMathaikutty, Deepak Abraham. "Metamodeling Driven IP Reuse for System-on-chip Integration and Microprocessor Design." Diss., Virginia Tech, 2007. http://hdl.handle.net/10919/29598.
Full textPh. D.
Mishra, Shashank. "Analysis of test coverage metrics in a business critical setup." Thesis, KTH, Skolan för datavetenskap och kommunikation (CSC), 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-213698.
Full textTesttäckning är en viktig parameter för att analysera hur väl en produkt är testad inom alla domäner i IT-industrin. Enhetstestning är en av de viktiga processerna som har ökat sin popularitet med testdriven utveckling. Detta examensarbete, utfört på NASDAQ Technology AB, analyserar de befintliga testen i en av produkterna, och jämför olika kvalitetsmodeller. Vidare undersöker undersökningen de faktorer som påverkar koddekning, presenterar de bästa metoderna för enhetstestning och en beprövad testprocess som används i ett verkligt världsprojekt. Avslutningsvis ges rekommendationer till NASDAQ baserat på resultaten från denna studie och industristandarder.
Acharya, Vineeth Vadiraj. "Branch Guided Metrics for Functional and Gate-level Testing." Thesis, Virginia Tech, 2015. http://hdl.handle.net/10919/51661.
Full textMaster of Science
Santa, Marek. "Zpětnovazební funkční verifikace hardware." Master's thesis, Vysoké učení technické v Brně. Fakulta informačních technologií, 2011. http://www.nusl.cz/ntk/nusl-237045.
Full textPagliarini, Samuel Nascimento. "VEasy : a tool suite towards the functional verification challenges." reponame:Biblioteca Digital de Teses e Dissertações da UFRGS, 2011. http://hdl.handle.net/10183/34758.
Full textThis thesis describes a tool suite, VEasy, which was developed specifically for aiding the process of Functional Verification. VEasy contains four main modules that perform linting, simulation, coverage collection/analysis and testcase generation, which are considered key challenges of the process. Each of those modules is commented in details throughout the chapters. All the modules are integrated and built on top of a Graphical User Interface. This framework enables the testcase automation methodology which is based on layers, where one is capable of creating complex test scenarios using drag-anddrop operations. Whenever possible the usage of the modules is exemplified using simple Verilog designs. The capabilities of this tool and its performance were compared with some commercial and academic functional verification tools. Finally, some conclusions are drawn, showing that the overall simulation time is considerably smaller with respect to commercial and academic simulators. The results also show that the methodology is capable of enabling a great deal of testcase automation by using the layering scheme.
Zachariášová, Marcela. "Metody akcelerace verifikace logických obvodů." Doctoral thesis, Vysoké učení technické v Brně. Fakulta informačních technologií, 2015. http://www.nusl.cz/ntk/nusl-261278.
Full textStarigazda, Michal. "Optimalizace testování pomocí algoritmů prohledávání prostoru." Master's thesis, Vysoké učení technické v Brně. Fakulta informačních technologií, 2015. http://www.nusl.cz/ntk/nusl-234928.
Full textBooks on the topic "Coverage metric"
Didi maža tauta: Lietuvos įvaizdžio kampanija JAV 1919 metais = A great little nation : Lithuania's image campaign of 1919 in the U.S. Vilnius: Bonus animus, 2008.
Find full textE, Black Paul, and National Institute of Standards and Technology (U.S.), eds. A specification-based coverage metric to evaluate test sets. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.
Find full textE, Black Paul, and National Institute of Standards and Technology (U.S.), eds. A specification-based coverage metric to evaluate test sets. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.
Find full textA specification-based coverage metric to evaluate test sets. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.
Find full textE, Black Paul, and National Institute of Standards and Technology (U.S.), eds. A specification-based coverage metric to evaluate test sets. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.
Find full textE, Black Paul, and National Institute of Standards and Technology (U.S.), eds. A specification-based coverage metric to evaluate test sets. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.
Find full textE, Black Paul, and National Institute of Standards and Technology (U.S.), eds. A specification-based coverage metric to evaluate test sets. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.
Find full textSolberg, Rorie. Covering the Courts. Edited by Lee Epstein and Stefanie A. Lindquist. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199579891.013.28.
Full textDelhi Metro Rail Corporation Ltd., ed. A dream revisited: An archival journey into the making of the Delhi Metro Rail. [New Delhi]: Delhi Metro Rail Corp., 2003.
Find full textHamlin, Hannibal. The Bible. Edited by Andrew Hiscock and Helen Wilcox. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199672806.013.34.
Full textBook chapters on the topic "Coverage metric"
Dieckmann, Andreas. "Developing a Coverage-Driven SoC Methodology." In Metric- Driven Design Verification, 285–96. Boston, MA: Springer US, 2007. http://dx.doi.org/10.1007/978-0-387-38152-7_20.
Full textKichenamourty, Vedha. "Metric for Effective Test Coverage." In Software Measurement, 127–40. Wiesbaden: Deutscher Universitätsverlag, 1999. http://dx.doi.org/10.1007/978-3-663-08949-0_8.
Full textBhattacharya, Subhrajit, Robert Ghrist, and Vijay Kumar. "Multi-robot Coverage and Exploration in Non-Euclidean Metric Spaces." In Springer Tracts in Advanced Robotics, 245–62. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-36279-8_15.
Full textFürtig, Andreas, Sebastian Steinhorst, and Lars Hedrich. "Feature-Based State Space Coverage Metric for Analog Circuit Verification." In Lecture Notes in Electrical Engineering, 83–101. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-62920-9_5.
Full textTasiran, Serdar, Tayfun Elmas, Guven Bolukbasi, and M. Erkan Keremoglu. "A Novel Test Coverage Metric for Concurrently-Accessed Software Components." In Formal Approaches to Software Testing, 62–71. Berlin, Heidelberg: Springer Berlin Heidelberg, 2006. http://dx.doi.org/10.1007/11759744_5.
Full textEgeberg, Matthew C., Sez Atamturktur, and François M. Hemez. "Defining Coverage of a Domain Using a Modified Nearest-Neighbor Metric." In Topics in Model Validation and Uncertainty Quantification, Volume 5, 113–22. New York, NY: Springer New York, 2013. http://dx.doi.org/10.1007/978-1-4614-6564-5_12.
Full textZhu, Jinsong, and Son T. Vuong. "Generalized metric based test selection and coverage measure for communication protocols." In Formal Description Techniques and Protocol Specification, Testing and Verification, 299–314. Boston, MA: Springer US, 1997. http://dx.doi.org/10.1007/978-0-387-35271-8_19.
Full textQuader, Niamul, Antony J. Hodgson, Kishore Mulpuri, Anthony Cooper, and Rafeef Abugharbieh. "A 3D Femoral Head Coverage Metric for Enhanced Reliability in Diagnosing Hip Dysplasia." In Medical Image Computing and Computer Assisted Intervention − MICCAI 2017, 100–107. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-66182-7_12.
Full textAhmed, Izhar, K. E. Tepe, and B. K. Singh. "Reliable Coverage Area Based Link Expiration Time (LET) Routing Metric for Mobile Ad Hoc Networks." In Ad Hoc Networks, 466–76. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-11723-7_31.
Full textBen-David, Shoham, Hana Chockler, and Orna Kupferman. "Attention-Based Coverage Metrics." In Hardware and Software: Verification and Testing, 230–45. Cham: Springer International Publishing, 2013. http://dx.doi.org/10.1007/978-3-319-03077-7_16.
Full textConference papers on the topic "Coverage metric"
Nabi, Majid, Hamid Shojaei, Siamak Mohammadi, and Zainalabedin Navabi. "Assignment coverage, a complementary coverage metric in formal verification." In 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era. IEEE, 2007. http://dx.doi.org/10.1109/dtis.2007.4449496.
Full textWang, Xuexiang, and Jun Yang. "Domain Coverage Metric for SoC Validation." In 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis. ICTD'09. IEEE, 2009. http://dx.doi.org/10.1109/cas-ictd.2009.4960810.
Full textVerma, Shireesh, Kiran Ramineni, and Ian G. Harris. "An efficient control-oriented coverage metric." In the 2005 conference. New York, New York, USA: ACM Press, 2005. http://dx.doi.org/10.1145/1120725.1120858.
Full textHaedicke, F., D. Grosse, and R. Drechsler. "A guiding coverage metric for formal verification." In 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012). IEEE, 2012. http://dx.doi.org/10.1109/date.2012.6176546.
Full textSomeoliayi, Khashayar Etemadi, Sajad Jalali, Mostafa Mahdieh, and Seyed-Hassan Mirian-Hosseinabadi. "Program State Coverage: A Test Coverage Metric Based on Executed Program States." In 2019 IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER). IEEE, 2019. http://dx.doi.org/10.1109/saner.2019.8667968.
Full textRamineni, Kiran, Shireesh Verma, and Ian G. Harris. "Evaluation of an efficient control-oriented coverage metric." In 2008 IEEE International High Level Design Validation and Test Workshop (HLDVT). IEEE, 2008. http://dx.doi.org/10.1109/hldvt.2008.4695895.
Full textKang, Jian, Sharad C. Seth, and Vijay Gangaram. "Efficient RTL Coverage Metric for Functional Test Selection." In 25th IEEE VLSI Test Symmposium. IEEE, 2007. http://dx.doi.org/10.1109/vts.2007.30.
Full textPark, Sungchul, Li Chen, Praveen Parvathala, Srinivas Patil, and Irith Pomeranz. "A Functional Coverage Metric for Estimating the Gate-Level Fault Coverage of Functional Tests." In 2006 IEEE International Test Conference. IEEE, 2006. http://dx.doi.org/10.1109/test.2006.297674.
Full textHarris, I. G. "A Coverage Metric for the Validation of Interacting Processes." In 2006 Design, Automation and Test in Europe. IEEE, 2006. http://dx.doi.org/10.1109/date.2006.243900.
Full textZhang, Yu, and Vishwani D. Agrawal. "A diagnostic test generation system and a coverage metric." In 2010 15th IEEE European Test Symposium (ETS). IEEE, 2010. http://dx.doi.org/10.1109/etsym.2010.5512739.
Full textReports on the topic "Coverage metric"
Ammann, Paul E., and Paul E. Black. A specification-based coverage metric to evaluate test sets. Gaithersburg, MD: National Institute of Standards and Technology, 1999. http://dx.doi.org/10.6028/nist.ir.6403.
Full textOrr, Kyla, Ali McKnight, Kathryn Logan, and Hannah Ladd-Jones. Scottish Inshore Fisheries Integrated Data System (SIFIDS): work package 7 final report engagement with inshore fisheries to promote and inform. Edited by Mark James. Marine Alliance for Science and Technology for Scotland (MASTS), 2020. http://dx.doi.org/10.15664/10023.23453.
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