Relevant bibliographies by topics / Debye Scherrer

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  1. Journal articles
  2. Dissertations / Theses
  3. Book chapters
  4. Conference papers

Academic literature on the topic 'Debye Scherrer'

Author: Grafiati
Published: 4 June 2021
Last updated: 1 February 2022

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Journal articles on the topic "Debye Scherrer"

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Holzwarth, Uwe, and Neil Gibson. "The Scherrer equation versus the 'Debye-Scherrer equation'." Nature Nanotechnology 6, no. 9 (August 28, 2011): 534. http://dx.doi.org/10.1038/nnano.2011.145.

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Reznik, B. I., V. D. Rusov, M. U. Semenov, and V. I. Petrashevich. "Autoradiographic Image Enhancement of Debye-Scherrer Patterns." Materials Science Forum 79-82 (January 1991): 405–8. http://dx.doi.org/10.4028/www.scientific.net/msf.79-82.405.

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Eckerlin, Peter. "The Absorption Correction of Debye-Scherrer Diagrams." Powder Diffraction 6, no. 3 (September 1991): 161–63. http://dx.doi.org/10.1017/s0885715600017334.

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AbstractAn extension of the Nelson-Riley absorption correction of Debye-Scherrer diagrams is given. This enables the calculation of the shifts of the reflection angles if the absorption coefficient is known. Alternatively, these shifts can be found by including the corresponding coefficient in a least-squares lattice constant refinement.
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Lutterotti, Luca, A. F. Gualtieri, and S. Aldrighetti. "Rietveld Refinement Using Debye-Scherrer Film Techniques." Materials Science Forum 228-231 (July 1996): 29–34. http://dx.doi.org/10.4028/www.scientific.net/msf.228-231.29.

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Logiurato, F., L. M. Gratton, and S. Oss. "Optical Simulation of Debye-Scherrer Crystal Diffraction." Physics Teacher 46, no. 2 (February 2008): 109–12. http://dx.doi.org/10.1119/1.2834534.

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Hall, B. D., D. Zanchet, and D. Ugarte. "Estimating nanoparticle size from diffraction measurements." Journal of Applied Crystallography 33, no. 6 (December 1, 2000): 1335–41. http://dx.doi.org/10.1107/s0021889800010888.

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Nanometre-sized particles are of considerable current interest because of their special size-dependent physical properties. Debye–Scherrer diffraction patterns are often used to characterize samples, as well as to probe the structure of nanoparticles. Unfortunately, the well known `Scherrer formula' is unreliable at estimating particle size, because the assumption of an underlying crystal structure (translational symmetry) is often invalid. A simple approach is presented here which takes the Fourier transform of a Debye–Scherrer diffraction pattern. The method works well on noisy data and when only a narrow range of scattering angles is available.
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Chiu, N. S., and S. H. Bauer. "Scaling EXAFS to Debye-Scherrer diffraction data. 1." Journal of Physical Chemistry 92, no. 3 (February 1988): 565–70. http://dx.doi.org/10.1021/j100314a001.

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Zypman, Fredy R., and Denis Donnelly. "Symbolic Programming Helps to Teach Debye-Scherrer Diffraction." Computers in Physics 7, no. 1 (1993): 22. http://dx.doi.org/10.1063/1.4823137.

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Miyazaki, Toshiyuki, Yohei Fujimoto, and Toshihiko Sasaki. "Improvement in X-ray stress measurement using Debye–Scherrer rings by in-plane averaging." Journal of Applied Crystallography 49, no. 1 (February 1, 2016): 241–49. http://dx.doi.org/10.1107/s160057671600128x.

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A technique to improve X-ray stress measurement using Debye–Scherrer rings is reported. In previous work, a Fourier-series-based generalization of the cosα method was proposed, which can measure the stress from a Debye–Scherrer ring. That technique and the cosα method have difficulties in determining the stress when the grain size of the specimen is relatively large and the Debye–Scherrer ring is grainy. To cope with this problem, in-plane averaging has been used to improve the cosα method when measuring coarse-grained specimens. In this study, Fourier series analysis is incorporated with in-plane averaging and it is explained how in-plane averaging improves the stress measurement. Furthermore, the validity of the new technique is demonstrated by measuring the stress of a carbon steel specimen.
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Delgado, José Miguel. "The contributions of Albert W. Hull to X-ray powder diffraction at one hundred years of his landmark publication." Powder Diffraction 32, no. 1 (January 18, 2017): 2–9. http://dx.doi.org/10.1017/s0885715616000750.

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One hundred years ago X-ray powder diffraction, one of the premier techniques used in the characterization of materials, was invented. Its origins can be traced to two landmark contributions presented to the scientific community in 1916. They are the better known and celebrated work carried out by Paul Scherrer under the guidance of Peter W. Debye, at the University of Göttingen, Germany, and the lesser known work of Albert W. Hull performed at the Research Laboratory of the General Electric Company, Schenectady, NY, USA. The great contributions of Scherrer and Debye have been prominently recognized. They are presented in many textbooks and in technical and scientific articles published in the area of characterization of materials using powder diffraction techniques. The camera designed by them, later called “the Debye–Scherrer camera”, was used extensively for many years and the experimental setup (“the Debye–Scherrer geometry”) is still used today. On the other hand, the work performed by Hull has not been adequately appreciated and remembered. In this communication, an account of his contributions to X-ray powder diffraction and to crystallography is presented at 100 years of his landmark publication, which appeared in the first issue of Physical Review of 1917.
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Dissertations / Theses on the topic "Debye Scherrer"

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Francis, Philip Sydney, and phil francis@rmit edu au. "Crystallisation spectrometer." RMIT University. SET, 2002. http://adt.lib.rmit.edu.au/adt/public/adt-VIT20050617.121435.

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An improved crystallisation spectrometer has been designed, built and tested. It is to be used by others to gain new knowledge about the solidification of matter by study of the crystallisation of hard sphere colloid samples that are an established model for the behaviour of some aspects of atoms. In this crystallisation spectrometer, expanded and collimated green laser light is Bragg scattered from the colloidal crystals as they form, and the diffracted light is focused by a liquid filled hollow glass hemispherical lens onto low cost CCD array detectors that are rotated about the optical axis to average the intensities around the whole Debye-Scherrer cone of scattered light. The temperature of the sample is controlled to +/-0.1„a, and because of the ability to change the refractive index of the sample particles with temperature, this is utilised to control the amount of scattering from the sample Also, this spectrometer uniquely exploits the refractive index match of the colloidal particles, the solvent, the bath liquid, and the glass used for both the sample bottle and the hollow glass hemisphere. A unique facility has been incorporated to permit tumbling of the sample prior to the measurement commencing to shear-melt any pre-existing crystals. This ensures that the sample is completely fluid and is at the correct temperature at the start of the measurement. The instrument is assembled on an optical table and is computer controlled. Results presented show that this new spectrometer with its use of the whole Debye-Scherrer cone of Bragg scattered light and other enhancements gives insight into the crystallisation process more than one order of magnitude of time earlier than previous light scattering experiments, providing new knowledge about the crystallisation process.
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McKnight, Thomas Kevin. "An Improved Flexible Neutron Detector For Powder Diffraction Experiments." BYU ScholarsArchive, 2005. https://scholarsarchive.byu.edu/etd/463.

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Large amounts of money are being applied to the construction of the next generation of spallation sources for neutron scattering. Neutron powder diffraction instruments will be an important element of these facilities and the incorporation of detectors into these instruments with a high neutron capture efficiency is desirable. A new detector design named the Flexible Embedded Fiber Detector (FEFD) has been developed and tested for this thesis. This detector is based on wavelength shifting fibers embedded in a zinc-sulfide lithium-fluoride based scintillator. The virtue of this design is that the detecting surface can be curved around the Debye-Scherrer rings. This virtue is lacking in other detector designs, making them more complex and poorer in performance than our FEFD detectors. Monte Carlo calculations were performed to determine the neutron capture efficiencies of our FEFD detectors, which proved to be much higher than those of the proposed powder diffractometer design for the Spallation Neutron Source and about equal with the efficiency for the ISIS powder diffractometer design. Four FEFD detector prototypes were then fabricated and tested at the Intense Pulsed Neutron Source at Argonne National Laboratory. We find that our measured and calculated relative efficiencies are in good agreement.
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Sheridan, Andrew Keith. "Kinetics and temperature- and pressure-induced polymorphic phase transformations in molecular crystals." Thesis, King's College London (University of London), 1994. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.322597.

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Book chapters on the topic "Debye Scherrer"

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"Debye-Scherrer method." In Dictionary Geotechnical Engineering/Wörterbuch GeoTechnik, 340. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-41714-6_40436.

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"Debye-Scherrer-Aufnahme f." In Wörterbuch GeoTechnik/Dictionary Geotechnical Engineering, 223. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-33335-4_40204.

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"Debye-Scherrer-Methode f." In Wörterbuch GeoTechnik/Dictionary Geotechnical Engineering, 223. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-33335-4_40205.

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Krishnan, Kannan M. "X-Ray Diffraction." In Principles of Materials Characterization and Metrology, 408–80. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.003.0007.

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X-rays diffraction is fundamental to understanding the structure and crystallography of biological, geological, or technological materials. X-rays scatter predominantly by the electrons in solids, and have an elastic (coherent, Thompson) and an inelastic (incoherent, Compton) component. The atomic scattering factor is largest (= Z) for forward scattering, and decreases with increasing scattering angle and decreasing wavelength. The amplitude of the diffracted wave is the structure factor, F hkl, and its square gives the intensity. In practice, intensities are modified by temperature (Debye-Waller), absorption, Lorentz-polarization, and the multiplicity of the lattice planes involved in diffraction. Diffraction patterns reflect the symmetry (point group) of the crystal; however, they are centrosymmetric (Friedel law) even if the crystal is not. Systematic absences of reflections in diffraction result from glide planes and screw axes. In polycrystalline materials, the diffracted beam is affected by the lattice strain or grain size (Scherrer equation). Diffraction conditions (Bragg Law) for a given lattice spacing can be satisfied by varying θ or λ — for study of single crystals θ is fixed and λ is varied (Laue), or λ is fixed and θ varied to study powders (Debye-Scherrer), polycrystalline materials (diffractometry), and thin films (reflectivity). X-ray diffraction is widely applied.
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"On the intensity distribution within Debye-Scherrer rings. What is different in high pressure experiments? Part I: Theory." In Eleventh European Powder Diffraction Conference, 139–46. Oldenbourg Wissenschaftsverlag, 2009. http://dx.doi.org/10.1524/9783486992588-024.

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"On the intensity distribution within Debye-Scherrer rings. What is different in high pressure experiments? Part II: Practical application." In Eleventh European Powder Diffraction Conference, 147–54. Oldenbourg Wissenschaftsverlag, 2009. http://dx.doi.org/10.1524/9783486992588-025.

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Conference papers on the topic "Debye Scherrer"

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Kalabushkin, Alexander E. "Debye-Scherrer simulation and its use for nano-materials testing." In Eighth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, edited by Alexander I. Melker. SPIE, 2005. http://dx.doi.org/10.1117/12.619496.

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Osaka, Keiichi, Shigeru Kimura, Kenichi Kato, and Masaki Takata. "A New Attachment of the Large Debye-Scherrer Camera at BL02B2 of the SPring-8 for Thin Film X-ray Diffraction." In SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation. AIP, 2007. http://dx.doi.org/10.1063/1.2436412.

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