Journal articles: 'Debye Scherrer'

1

Holzwarth, Uwe, and Neil Gibson. "The Scherrer equation versus the 'Debye-Scherrer equation'." Nature Nanotechnology 6, no. 9 (August 28, 2011): 534. http://dx.doi.org/10.1038/nnano.2011.145.

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2

Reznik, B. I., V. D. Rusov, M. U. Semenov, and V. I. Petrashevich. "Autoradiographic Image Enhancement of Debye-Scherrer Patterns." Materials Science Forum 79-82 (January 1991): 405–8. http://dx.doi.org/10.4028/www.scientific.net/msf.79-82.405.

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3

Eckerlin, Peter. "The Absorption Correction of Debye-Scherrer Diagrams." Powder Diffraction 6, no. 3 (September 1991): 161–63. http://dx.doi.org/10.1017/s0885715600017334.

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AbstractAn extension of the Nelson-Riley absorption correction of Debye-Scherrer diagrams is given. This enables the calculation of the shifts of the reflection angles if the absorption coefficient is known. Alternatively, these shifts can be found by including the corresponding coefficient in a least-squares lattice constant refinement.

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4

Lutterotti, Luca, A. F. Gualtieri, and S. Aldrighetti. "Rietveld Refinement Using Debye-Scherrer Film Techniques." Materials Science Forum 228-231 (July 1996): 29–34. http://dx.doi.org/10.4028/www.scientific.net/msf.228-231.29.

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5

Logiurato, F., L. M. Gratton, and S. Oss. "Optical Simulation of Debye-Scherrer Crystal Diffraction." Physics Teacher 46, no. 2 (February 2008): 109–12. http://dx.doi.org/10.1119/1.2834534.

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6

Hall, B. D., D. Zanchet, and D. Ugarte. "Estimating nanoparticle size from diffraction measurements." Journal of Applied Crystallography 33, no. 6 (December 1, 2000): 1335–41. http://dx.doi.org/10.1107/s0021889800010888.

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Nanometre-sized particles are of considerable current interest because of their special size-dependent physical properties. Debye–Scherrer diffraction patterns are often used to characterize samples, as well as to probe the structure of nanoparticles. Unfortunately, the well known `Scherrer formula' is unreliable at estimating particle size, because the assumption of an underlying crystal structure (translational symmetry) is often invalid. A simple approach is presented here which takes the Fourier transform of a Debye–Scherrer diffraction pattern. The method works well on noisy data and when only a narrow range of scattering angles is available.

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7

Chiu, N. S., and S. H. Bauer. "Scaling EXAFS to Debye-Scherrer diffraction data. 1." Journal of Physical Chemistry 92, no. 3 (February 1988): 565–70. http://dx.doi.org/10.1021/j100314a001.

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8

Zypman, Fredy R., and Denis Donnelly. "Symbolic Programming Helps to Teach Debye-Scherrer Diffraction." Computers in Physics 7, no. 1 (1993): 22. http://dx.doi.org/10.1063/1.4823137.

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9

Miyazaki, Toshiyuki, Yohei Fujimoto, and Toshihiko Sasaki. "Improvement in X-ray stress measurement using Debye–Scherrer rings by in-plane averaging." Journal of Applied Crystallography 49, no. 1 (February 1, 2016): 241–49. http://dx.doi.org/10.1107/s160057671600128x.

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A technique to improve X-ray stress measurement using Debye–Scherrer rings is reported. In previous work, a Fourier-series-based generalization of the cosα method was proposed, which can measure the stress from a Debye–Scherrer ring. That technique and the cosα method have difficulties in determining the stress when the grain size of the specimen is relatively large and the Debye–Scherrer ring is grainy. To cope with this problem, in-plane averaging has been used to improve the cosα method when measuring coarse-grained specimens. In this study, Fourier series analysis is incorporated with in-plane averaging and it is explained how in-plane averaging improves the stress measurement. Furthermore, the validity of the new technique is demonstrated by measuring the stress of a carbon steel specimen.

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10

Delgado, José Miguel. "The contributions of Albert W. Hull to X-ray powder diffraction at one hundred years of his landmark publication." Powder Diffraction 32, no. 1 (January 18, 2017): 2–9. http://dx.doi.org/10.1017/s0885715616000750.

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One hundred years ago X-ray powder diffraction, one of the premier techniques used in the characterization of materials, was invented. Its origins can be traced to two landmark contributions presented to the scientific community in 1916. They are the better known and celebrated work carried out by Paul Scherrer under the guidance of Peter W. Debye, at the University of Göttingen, Germany, and the lesser known work of Albert W. Hull performed at the Research Laboratory of the General Electric Company, Schenectady, NY, USA. The great contributions of Scherrer and Debye have been prominently recognized. They are presented in many textbooks and in technical and scientific articles published in the area of characterization of materials using powder diffraction techniques. The camera designed by them, later called “the Debye–Scherrer camera”, was used extensively for many years and the experimental setup (“the Debye–Scherrer geometry”) is still used today. On the other hand, the work performed by Hull has not been adequately appreciated and remembered. In this communication, an account of his contributions to X-ray powder diffraction and to crystallography is presented at 100 years of his landmark publication, which appeared in the first issue of Physical Review of 1917.

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11

Shahzad, Saadia, Nazar Khan, Zubair Nawaz, and Claudio Ferrero. "Automatic Debye–Scherrer elliptical ring extractionviaa computer vision approach." Journal of Synchrotron Radiation 25, no. 2 (February 21, 2018): 439–50. http://dx.doi.org/10.1107/s1600577518000425.

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The accurate calibration of powder diffraction data acquired from area detectors using calibration standards is a crucial step in the data reduction process to attain high-quality one-dimensional patterns. A novel algorithm has been developed for extracting Debye–Scherrer rings automatically using an approach based on computer vision and pattern recognition techniques. The presented technique requires no human intervention and, unlike previous approaches, makes no restrictive assumptions on the diffraction setup and/or rings. It can detect complete rings as well as portions of them, and works on several types of diffraction images with various degrees of ring graininess, textured diffraction patterns and detector tilt with respect to the incoming beam.

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12

Straasø, Tine, Jacob Becker, Bo Brummerstedt Iversen, and Jens Als-Nielsen. "The Debye–Scherrer camera at synchrotron sources: a revisit." Journal of Synchrotron Radiation 20, no. 1 (November 10, 2012): 98–104. http://dx.doi.org/10.1107/s0909049512039441.

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In a powder diffraction pattern one measures the intensity of Miller-indexed Bragg peaksversusthe wavevector transfer sinθ/λ. With increasing wavevector transfer the density of occurrence of Bragg peaks increases while their intensity decreases until they vanish into the background level. The lowest possible background level is that due to Compton scattering from the powder. A powder diffraction instrument has been designed and tested that yields this ideal low-background level, obtainable by having the space between sample and detector all in vacuum with the entrance window so far upstream that scattering from it is negligible. To minimize overlap of Bragg peaks the combination of fine collimation of synchrotron radiation, a thin cylindrical sample and a high-resolution imaging plate detector is taken advantage of.

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13

Gozzo, Fabia, A. Cervellino, Matteo Leoni, Paolo Scardi, A. Bergamaschi, and B. Schmitt. "Instrumental profile of MYTHEN detector in Debye-Scherrer geometry." Zeitschrift für Kristallographie 225, no. 12 (December 2010): 616–24. http://dx.doi.org/10.1524/zkri.2010.1345.

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14

Hall, B. D., and R. Monot. "Calculating the Debye–Scherrer diffraction pattern for large clusters." Computers in Physics 5, no. 4 (1991): 414. http://dx.doi.org/10.1063/1.168397.

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15

Heuer, J. P., J. P. Fernandez, R. L. Lewis, and C. G. Cleaver. "Application of a Flatbed Transparency Scantier as an XRD Scanning Densitometer." Advances in X-ray Analysis 37 (1993): 433–39. http://dx.doi.org/10.1154/s0376030800015950.

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The days of Debye-Scherrer film as a recording medium for X-ray powder patterns are all but gone with the development of precise, high sensitivity diffractometer systems. However, film does present some advantages over diffractometry (digital positioning and recording) for certain applications, A scanning densitometer system is described which totally automates the analysis of Debye-Scherrer film. It is much more precise and more capable than the simple line readers available in the past and can reduce the analysis time of complicated patterns from hours to minutes.

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16

Howard, C. J., and E. H. Kisi. "Preferred orientation in Debye–Scherrer geometry: interpretation of the March coefficient." Journal of Applied Crystallography 33, no. 6 (December 1, 2000): 1434–35. http://dx.doi.org/10.1107/s0021889800012267.

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The March function is a widely used preferred-orientation correction function that, in flat-plate geometry, often closely approximates the pole-density profile of axially symmetric textures. It is shown that in Debye–Scherrer geometry, the assumption that the pole-density profile of a powder specimen can be described by a March function with coefficientR, leads to an intensity correction factor that can be approximated quite well by another March function, with coefficientR−1/2. This result validates the use of the March function correction in Debye–Scherrer geometry, facilitates the comparison of results obtained in the different geometries and should prove useful in some studies of axially symmetric textures and in residual-stress analysis.

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17

Busch, Peter, Markus Rauscher, Jean-François Moulin, and Peter Müller-Buschbaum. "Debye–Scherrer rings from block copolymer films with powder-like order." Journal of Applied Crystallography 44, no. 2 (February 22, 2011): 370–79. http://dx.doi.org/10.1107/s0021889810053823.

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The powder-like orientation of lamellar domains in thin films of the diblock copolymer polystyrene-block-poly(methyl methacrylate) is investigated using grazing-incidence small-angle X-ray scattering (GISAXS) and grazing-incidence small-angle neutron scattering (GISANS). Conventional monochromatic GISANS and GISAXS measurements are compared with neutron time-of-flight GISANS. For angles of incidence and exit larger than the critical angle of total external reflection of the polymer, Debye–Scherrer rings are observed. The position of the Debye–Scherrer rings is described quantitatively based on a reduced version of the distorted-wave Born approximation. A strong distortion of the ring shape is caused by refraction and reflections from the film interfaces. Close to the critical angle, the ring shape collapses into a banana shape.

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18

Miyazaki, Toshiyuki, and Toshihiko Sasaki. "X-ray stress measurement from an imperfect Debye–Scherrer ring." International Journal of Materials Research 106, no. 3 (March 11, 2015): 237–41. http://dx.doi.org/10.3139/146.111179.

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19

Hester, J., and B. Kennedy. "Obtaining accurate lattice parameters from Debye-Scherrer image plate data." Acta Crystallographica Section A Foundations of Crystallography 61, a1 (August 23, 2005): c145. http://dx.doi.org/10.1107/s0108767305093839.

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20

Higginbotham, Andrew, and David McGonegle. "Prediction of Debye-Scherrer diffraction patterns in arbitrarily strained samples." Journal of Applied Physics 115, no. 17 (May 7, 2014): 174906. http://dx.doi.org/10.1063/1.4874656.

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21

Pramanick, A., S. Omar, J. C. Nino, and J. L. Jones. "Lattice parameter determination using a curved position-sensitive detector in reflection geometry and application to Smx/2Ndx/2Ce1–xO2–δceramics." Journal of Applied Crystallography 42, no. 3 (April 3, 2009): 490–95. http://dx.doi.org/10.1107/s0021889809010085.

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X-ray diffractometers with curved position-sensitive (CPS) detectors have become popular for their ability to perform fast data collection over a wide 2θ range, enabling kinetics studies of chemical reactions and measurement of other time-resolved solid-state phenomena. While the effect of sample displacement onhkl-specific apparent lattice parameters has been explored for a transmission-mode Debye–Scherrer geometry, such effects for a reflection-mode Debye–Scherrer geometry are not yet well understood. The reflection-mode Debye–Scherrer geometry for CPS detectors is unique in the sense that the angle for the incident X-ray beam is kept fixed with respect to the normal of a flat diffracting sample, while the diffracted beams are measured at multiple angles with respect to the sample normal. An efficient method for precise lattice parameter determination using linear extrapolation of apparent lattice parameters calculated from differenthkldiffraction peaks is proposed for such geometries. The accuracy involved with this method is investigated for an Si powder standard. The extrapolation method is then applied to develop an empirical relationship between composition (x) and the lattice parameter (ao) of Smx/2Ndx/2Ce1−xO2−δceramics for solid oxide fuel cell electrolytes. In this system, the empirical relationship betweenxandaois compared with a previous theoretical prediction.

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22

Cernik, Robert J., and G. Bushnell-Wye. "The Use of Debye Scherrer Geometry for High Resolution Powder Diffraction." Materials Science Forum 79-82 (January 1991): 455–62. http://dx.doi.org/10.4028/www.scientific.net/msf.79-82.455.

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23

Potter, J., J. E. Parker, A. R. Lennie, S. P. Thompson, and C. C. Tang. "Low-temperature Debye–Scherrer powder diffraction on Beamline I11 at Diamond." Journal of Applied Crystallography 46, no. 3 (May 4, 2013): 826–28. http://dx.doi.org/10.1107/s0021889813006912.

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A bespoke capillary sample holder is described that attaches to the cold head of a commercially manufactured (PheniX) closed-cycle helium cryostat originally intended for flat-plate geometry. The new holder allows high-resolution synchrotron powder diffraction data to be collected from samples in Debye–Scherrer geometry over the temperature range 11–295 K. To demonstrate that high-quality powder data can be obtained using this new sample holder, structural refinement (Rietveld) and thermal expansion results measured from reference samples (Si and Al) are presented.

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24

MacDonald, M. J., J. Vorberger, E. J. Gamboa, R. P. Drake, S. H. Glenzer, and L. B. Fletcher. "Calculation of Debye-Scherrer diffraction patterns from highly stressed polycrystalline materials." Journal of Applied Physics 119, no. 21 (June 6, 2016): 215902. http://dx.doi.org/10.1063/1.4953028.

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25

Thompson, P., D. E. Cox, and J. B. Hastings. "Rietveld refinement of Debye–Scherrer synchrotron X-ray data from Al2O3." Journal of Applied Crystallography 20, no. 2 (April 1, 1987): 79–83. http://dx.doi.org/10.1107/s0021889887087090.

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26

Angilello, J., R. D. Thompson, and K. N. Tu. "High-speed X-ray diffraction and in situ resistivity measurements at temperatures of 100 to 1000 K." Journal of Applied Crystallography 22, no. 6 (December 1, 1989): 523–27. http://dx.doi.org/10.1107/s0021889889006412.

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A system has been constructed which uses a primary-beam focusing monochromator Debye–Scherrer X-ray method to perform simultaneously in situ X-ray diffraction and resistivity measurements at temperatures of 100 to 1000 K. The Inel curved linear detector, which is capable of recording 120° of 20 angle without moving the detector, makes the Debye–Scherrer geometry possible for high-speed dynamic studies. The angular resolution of this system is sufficient to observe the separation of a mixture of tungsten and molybdenum powders. The sensitivity of the system makes it possible to record the diffraction pattern from a 100 Å gold film. The sheet resistivity of the sample can be recorded simultaneously to provide a structure-property correlation. Comparisons with other X-ray diffraction methods using thin films are discussed.

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27

Mildner, D. F. R., and R. Cubitt. "The effect of gravity on the Debye–Scherrer ring in small-angle neutron scattering." Journal of Applied Crystallography 45, no. 1 (January 14, 2012): 124–26. http://dx.doi.org/10.1107/s0021889812000945.

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Gravity distorts the circular contours found for small-angle neutron scattering data from azimuthally symmetric scattering systems when taken at long wavelength and with large wavelength spreads. The resolution is calculated for a Debye–Scherrer ring and compared with results from measurements taken on a sample of opal.

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28

Barckhaus, R. H., I. Fromm, H. J. Höhling, and L. Reimer. "Advantage of Electron Spectroscopic Diffraction on Calcified Tissue Sections." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 362–63. http://dx.doi.org/10.1017/s0424820100135411.

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Different stages in the mineralization of calcified tissues can be investigated by electron diffraction. A disadvantage is the strong background below the Debye—Scherrer rings caused by the large massthickness of calcified products and the high ratio (≃ 3) of the inelastic—to—elastic scattering cross—sections of the embedding material. Therefore, a large fraction of the background consists of inelastically scattered electrons with energy losses. The electron spectroscopic diffraction (ESD) mode of an energy—filtering microscope (ZEISS EM902) allows to record diffraction patterns using only the zero—loss electrons which consist of the primary beam, Bragg diffracted electrons and a smaller fraction of elastically scattered electrons between the Debye—Scherrer rings by thermal—diffuse scattering. Small—area diffraction patterns with different camera lengths are generated at the filter—entrance plane and the zero—loss electrons are selected by a slit in the energy—dispersive plane behind the Castaing—Henry filter lens.

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29

Shabelskaya, N. P., S. I. Sulima, E. V. Sulima, and A. I. Vlasenko. "STUDY OF SYNTHESIS FEATURES OF NANOCRYSTALLINE ZINC FERRITE." IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENIY KHIMIYA KHIMICHESKAYA TEKHNOLOGIYA 59, no. 1 (June 7, 2018): 39. http://dx.doi.org/10.6060/tcct.20165901.5223.

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In work the process of formation of nanocrystal zinc ferrite was studied. The samples obtained were characterized with XPS, BET and SEM. The received samples have the developed surface. The average size of crystallites determined by Debye-Scherrer equation was 3 nm.

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30

Hall, B. D., D. Ugarte, D. Reinhard, and R. Monot. "Calculations of the dynamic Debye–Scherrer diffraction patterns for small metal particles." Journal of Chemical Physics 103, no. 7 (August 15, 1995): 2384–94. http://dx.doi.org/10.1063/1.469662.

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31

Marques, L. ""Debye-Scherrer Ellipses" from 3D Fullerene Polymers: An Anisotropic Pressure Memory Signature." Science 283, no. 5408 (March 12, 1999): 1720–23. http://dx.doi.org/10.1126/science.283.5408.1720.

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32

Miyazaki, Toshiyuki, and Toshihiko Sasaki. "Linearized analysis of X-ray stress measurement using the Debye–Scherrer ring." International Journal of Materials Research 106, no. 9 (September 15, 2015): 1002–4. http://dx.doi.org/10.3139/146.111268.

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33

Dinnebier, Robert. "93 years after Debye and Scherrer: powder diffraction in the 21st century." Acta Crystallographica Section A Foundations of Crystallography 65, a1 (August 16, 2009): s6. http://dx.doi.org/10.1107/s0108767309099905.

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34

Nishibori, E., M. Takata, K. Kato, Y. Kubota, Aoyagi, Y. Kuroiwa, S. Ikeda, and M. Sakata. "Structural Studies by the Debye-Scherrer Camera installed at BL02B2, Spring-8." Acta Crystallographica Section A Foundations of Crystallography 56, s1 (August 25, 2000): s219. http://dx.doi.org/10.1107/s0108767300024788.

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35

Dwight, A. E. "The CaIn2-Type Structure in YAg0.4Ga1.6." Powder Diffraction 1, no. 4 (December 1986): 328–29. http://dx.doi.org/10.1017/s088571560001201x.

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AbstractThe ternary compound YAg0.4Ga1.6 has the CaIn2-type structure. The only variable positional parameter z was determined by graphical methods from visual observations of intensities on a Debye-Scherrer pattern. Cu or Ni substitutions for Ag also result in a ternary CaIn2-type structure.

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36

Delbergue, Dorian, Damien Texier, Martin Lévesque, and Philippe Bocher. "Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin2ψ and cosα methods." Journal of Applied Crystallography 52, no. 4 (July 24, 2019): 828–43. http://dx.doi.org/10.1107/s1600576719008744.

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X-ray diffraction (XRD) is a widely used technique to evaluate residual stresses in crystalline materials. Several XRD measurement methods are available. (i) The sin2ψ method, a multiple-exposure technique, uses linear detectors to capture intercepts of the Debye–Scherrer rings, losing the major portion of the diffracting signal. (ii) The cosα method, thanks to the development of compact 2D detectors allowing the entire Debye–Scherrer ring to be captured in a single exposure, is an alternative method for residual stress measurement. The present article compares the two calculation methods in a new manner, by looking at the possible measurement errors related to each method. To this end, sets of grains in diffraction condition were first identified from electron backscatter diffraction (EBSD) mapping of Inconel 718 samples for each XRD calculation method and its associated detector, as each method provides different sets owing to the detector geometry or to the method specificities (such as tilt-angle number or Debye–Scherrer ring division). The X-ray elastic constant (XEC) ½S 2, calculated from EBSD maps for the {311} lattice planes, was determined and compared for the different sets of diffracting grains. It was observed that the 2D detector captures 1.5 times more grains in a single exposure (one tilt angle) than the linear detectors for nine tilt angles. Different XEC mean values were found for the sets of grains from the two XRD techniques/detectors. Grain-size effects were simulated, as well as detector oscillations to overcome them. A bimodal grain-size distribution effect and `artificial' textures introduced by XRD measurement techniques are also discussed.

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37

Szpunar, J. A., P. Blandford, and D. C. Hinz. "Calculation of the crystal orientation distribution function from synchrotron radiation experimental data." Journal of Applied Crystallography 22, no. 6 (December 1, 1989): 559–61. http://dx.doi.org/10.1107/s0021889889007673.

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Series-expansion coefficients for an orientation distribution function (ODF) of cold-rolled aluminium sheet were calculated from the intensity of Debye–Scherrer rings obtained in an experiment using synchrotron radiation. Calculated and observed pole figures demonstrate that a sufficiently good approximation to the ODF is obtained from coefficients calculated to l = 8.

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38

McCusker, Lynne B., and Christian Baerlocher. "Solving the Structures of Polycrystalline Materials: from the Debye-Scherrer Camera to SwissFEL." CHIMIA International Journal for Chemistry 68, no. 1 (February 26, 2014): 19–25. http://dx.doi.org/10.2533/chimia.2014.19.

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39

Hartmann, Thomas, and Sascha Correll. "STOE InSitu HT2 – a new in situ reaction chamber in Debye-Scherrer geometry." Acta Crystallographica Section A Foundations and Advances 72, a1 (August 28, 2016): s424. http://dx.doi.org/10.1107/s2053273316093785.

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40

Gupta, Ashish. "Determination of residual stresses for helical compression spring through Debye-Scherrer ring method." Materials Today: Proceedings 25 (2020): 654–58. http://dx.doi.org/10.1016/j.matpr.2019.07.702.

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41

O'Connor, Brian H., Arie Riessen, John Carter, Graeme R. Burton, David J. Cookson, and Richard F. Garrett. "Characterization of Ceramic Materials with BIGDIFF: A Synchrotron Radiation Debye-Scherrer Powder Diffractometer." Journal of the American Ceramic Society 80, no. 6 (January 21, 2005): 1373–81. http://dx.doi.org/10.1111/j.1151-2916.1997.tb02994.x.

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42

Stachs, Oliver, Thomas Gerber, and Valeri Petkov. "An image plate chamber for x-ray diffraction experiments in Debye–Scherrer geometry." Review of Scientific Instruments 71, no. 11 (2000): 4007. http://dx.doi.org/10.1063/1.1318915.

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43

Kasten, Peter. "The search for electron rings inside atoms led to the Debye-Scherrer method." Annalen der Physik 528, no. 11-12 (December 2016): 761–64. http://dx.doi.org/10.1002/andp.201600306.

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44

Von Dreele, R. B. "A rapidly filled capillary mount for both dry powder and polycrystalline slurry samples." Journal of Applied Crystallography 39, no. 1 (January 12, 2006): 124–26. http://dx.doi.org/10.1107/s002188980503284x.

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A method of rapid capillary sample loading of either dry powder or polycrystalline slurry has been developed. By embedding a Millipore filter in a Kapton capillary tube, one can then draw either loose dry powder or polycrystalline slurry into the tube and pack the solid against the filter, creating a dense column of powder suitable for a Debye–Scherrer powder diffraction experiment.

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45

Ginting, A. R., B. H. O'Connor, and J. G. Dunn. "X-ray powder data for synthetic dolerophanite, copper(II) oxysulphate [Cu2O(SO4)]." Powder Diffraction 9, no. 1 (March 1994): 21–27. http://dx.doi.org/10.1017/s0885715600019643.

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Bragg–Brentano X-ray powder diffractometry data and refined unit cell parameters are reported for a synthetic sample of dolerophanite, copper (II) oxysulphate [Cu2O(SO4)], prepared by heating AR copper (II) sulphate anhydrate in a muffle furnace at 725 °C. The data are compared with (i) two Debye–Scherrer patterns published by Mrose [Am. Mineral. 6, 146–153 (1961)]—for a synthetic sample and for a natural dolerophanite, the latter being pattern 13–189 in the ICDD Powder Diffraction File and (ii) a Debye–Scherrer pattern for a synthetic dolerophanite described by Borchardt and Daniels [J. Phys. Chem. 61, 917–921 (1957)]. A calculated pattern is also presented for the crystal structure of dolerophanite described by Effenberger [Monatschefte fur Chemie. 116, 927–931 (1985)]. The measured and calculated patterns reported here show reasonable internal consistency for both line positions and intensity data. While the agreement between these results and the data sets of Mrose is sound in terms of line positions, there is substantial disagreement overall between the intensity values given by the authors and those of Mrose. There is closer agreement between the intensities from the current study and those of Borchardt and Daniels.

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46

Gao, Mei, Yueliang Gu, Li Li, Zhengliang Gong, Xingyu Gao, and Wen Wen. "Facile usage of a MYTHEN 1K with a Huber 5021 diffractometer and angular calibration inoperandoexperiments." Journal of Applied Crystallography 49, no. 4 (June 23, 2016): 1182–89. http://dx.doi.org/10.1107/s1600576716008566.

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A facile usage of a MYTHEN 1K detector with a Huber 5021 six-circle diffractometer is described in detail. A mechanical support has been custom designed for the first time to combine the MYTHEN 1K detector with a point detector, which can be used as a reference point for each individual pixel of the MYTHEN 1K during measurements. The MYTHEN 1K is mounted on the arm of the 2θ circle of the Huber diffractometer with an intrinsic angular resolution of ∼0.0038°, and its pitch angle can be automatically adjusted with an accuracy of 0.0072°. Standard procedures are discussed for its calibration. Programs have been written in theSPECenvironment for simultaneous data conversion, integration and acquisition. The X-ray powder diffraction patterns of standard samples were measured in the Debye–Scherrer geometry and matched well with those of references. The angular shift due to sample-to-center displacement in the `flat-plate transmission' geometry, which is frequently employed inoperandoexperiments, has been successfully investigated and can be efficiently corrected. Oneoperandoexperiment using the MYTHEN 1K is presented. This work provides a straightforward procedure to use the MYTHEN 1K detector properly in Debye–Scherrer geometry, and could facilitate its application at other synchrotron facilities.

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Rowles, Matthew R., and Craig E. Buckley. "Aberration corrections for non-Bragg–Brentano diffraction geometries." Journal of Applied Crystallography 50, no. 1 (February 1, 2017): 240–51. http://dx.doi.org/10.1107/s1600576717000085.

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The construction of peak intensity, profile and displacement aberration functions based on the geometry of a powder diffraction measurement allows for physically realistic corrections to be applied in Rietveld modelling through a fundamental parameters approach. Parallel-beam corrections for asymmetric reflection and Debye–Scherrer geometry are summarized, and corrections for thin-plate transmission are derived and validated. Geometrically correct implementations of preferred orientation models are also summarized.

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48

Psycharis, V., V. Perdikatsis, H. Göbel, A. Gantis, and D. Loukas. "X-Ray Powder Diffractometer with an Elliptic Focusing Göbel Mirror and Debye Scherrer Geometry." Materials Science Forum 378-381 (October 2001): 229–34. http://dx.doi.org/10.4028/www.scientific.net/msf.378-381.229.

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FUJIMOTO, Yohei, Toshiyuki MIYAZAKI, and Toshihiko SASAKI. "X-ray Stress Measurement of Ferritic Steel Using Fourier Analysis of Debye-Scherrer Ring." Journal of the Society of Materials Science, Japan 64, no. 7 (2015): 567–72. http://dx.doi.org/10.2472/jsms.64.567.

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50

Nishibori, E., M. Takata, K. Kato, M. Sakata, Y. Kubota, S. Aoyagi, Y. Kuroiwa, M. Yamakata, and N. Ikeda. "The large Debye–Scherrer camera installed at SPring-8 BL02B2 for charge density studies." Journal of Physics and Chemistry of Solids 62, no. 12 (December 2001): 2095–98. http://dx.doi.org/10.1016/s0022-3697(01)00164-0.

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Journal articles on the topic 'Debye Scherrer'

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