Academic literature on the topic 'Design en vue du test'
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Journal articles on the topic "Design en vue du test"
Bayrakçeken, Hüseyin, Faruk Emre Aysal, and İbrahim Mutlu. "The Design and Manufacturing of Brake‐Suspension Test Device." Afyon Kocatepe University Journal of Sciences and Engineering 16, no. 2 (June 1, 2016): 454–60. http://dx.doi.org/10.5578/fmbd.27861.
Full textAlavi, Omid, Leander Van Cappellen, Ward De Ceuninck, and Michaël Daenen. "Practical Challenges of High-Power IGBT’s I-V Curve Measurement and Its Importance in Reliability Analysis." Electronics 10, no. 17 (August 29, 2021): 2095. http://dx.doi.org/10.3390/electronics10172095.
Full textOlson, John D., Mark T. Cunningham, Russell A. Higgins, Charles S. Eby, and John T. Brandt. "D-dimer: Simple Test, Tough Problems." Archives of Pathology & Laboratory Medicine 137, no. 8 (August 1, 2013): 1030–38. http://dx.doi.org/10.5858/arpa.2012-0296-cp.
Full textLi, Xu, Li Min Chang, Li Jing Zhang, and Yan Bin Shi. "Design of Integrated Control and Support Platform for Airborne Digital Image Transmission System." Applied Mechanics and Materials 380-384 (August 2013): 2845–49. http://dx.doi.org/10.4028/www.scientific.net/amm.380-384.2845.
Full textAlmheiri, Zayed, Rawan Aleid, and Sharul Sham Dol. "Design of Fixed-Wing and Multi-Copter Hybrid Drone System for Human Body Temperature Measurement during COVID-19 Pandemic." WSEAS TRANSACTIONS ON SYSTEMS 20 (March 16, 2021): 31–39. http://dx.doi.org/10.37394/23202.2021.20.5.
Full textKim, Soobin, Jessie Klugman, Sarah Norell, Alexandra Kenefake, Laurel Komos, Divya Jain, Moire Corcoran, et al. "Improving VTE prophylaxis adherence among hospitalized adolescents using Human-Centered Design." Journal of Patient Safety and Risk Management 26, no. 4 (July 2021): 172–78. http://dx.doi.org/10.1177/25160435211036784.
Full textDaniyanti, Selly Nur, Anna Fitri Hindriana, and Sri Redjeki. "Implementasi Praktikum Berbasis Diagram Vee Untuk Memunculkan Kemampuan Metakognitif Dan Penguasaan Konsep Siswa." Edubiologica Jurnal Penelitian Ilmu dan Pendidikan Biologi 6, no. 1 (December 28, 2019): 44. http://dx.doi.org/10.25134/edubiologica.v6i1.2362.
Full textTin, Tan Geok, Noor Azean Atan, Mohd Nihra Haruzuan Mohamad Said, Mohd Fazli Ali, Sanitah Mohd, and Mohd Zolkifli Abd Hamid. "Integrating Animations in Chinese Character Writing Based on Cognitive Theory of Multimedia Learning to Promote Students’ Writing Skills." International Journal of Interactive Mobile Technologies (iJIM) 12, no. 7 (November 8, 2018): 97. http://dx.doi.org/10.3991/ijim.v12i7.9671.
Full textSuryani, Irma, and Riski Muliyani. "Penerapan Model Pembelajaran Heuristic Vee terhadap Peningkatan Pemahaman Konsep Siswa Pada Materi Fluida Statis." Journal of Natural Science and Integration 2, no. 2 (October 28, 2019): 52. http://dx.doi.org/10.24014/jnsi.v2i2.7885.
Full textRobinson, Reagan N., and Anthony N. Taneh. "DIGITAL ILLITERACY: A CONSTRAINT TO TECHNOLOGY EDUCATION ADVANCEMENT IN SOUTH-SOUTH REGION OF NIGERIA." International Journal of Research -GRANTHAALAYAH 6, no. 11 (November 30, 2018): 307–14. http://dx.doi.org/10.29121/granthaalayah.v6.i11.2018.1132.
Full textDissertations / Theses on the topic "Design en vue du test"
Fkih, Yassine. "Conception en vue du Test des Circuits Intégrés 3D à base de TSVs." Thesis, Montpellier 2, 2014. http://www.theses.fr/2014MON20063/document.
Full textFor several years, the complexity of integrated circuits continues to increase, from SOC (System On Chip) to SIP (System In Package) , and more recently 3D SICs (Stacked Integrated Circuits) based on TSVs (Through Silicon Vias ) that vertically interconnect stacked circuits in a 3D system. 3D SICs have many advantages in terms of small form factor, high performances and low power consumption but have many challenges regarding their test which is a necessary step before the commissioning of these complex systems. In this thesis we focus on defining the test infrastructure that will detect any occurring defects during the manufacturing process of TSVs or the different sacked chips in the system. We propose a BIST (Built In Self Test) solution for TSVs testing before stacking, this solution is based on the use of ring oscillators which their oscillation frequencies depend on the electrical characteristics of the TSVs. The proposed test solution not only allows the detection of faulty TSVs but also gives information about the number of defective TSVs and their location. On the other hand, we propose a 3D DFT (Design For Test) architecture based on the new proposed test standard IEEE P1687. The proposed test architecture provides test access to the components of the 3D system before and after stacking. Also it allows the re-use of recycled test data developed and applied before stacking to each die in the mid-bond and post-bond test levels. This work lead to the opening of a new problem related to the test scheduling under constraints such as: power consumption, temperature.Keywords: test, 3D circuits, TSV, BIST, ring oscillators, 3D DFT architecture, IEEE P1687, pre-bond test, post-bond test
Laraba, Asma. "Conception en vue de test de convertisseurs de signal analogique-numérique de type pipeline." Phd thesis, Université de Grenoble, 2013. http://tel.archives-ouvertes.fr/tel-00947360.
Full textRenaud, Guillaume. "Auto test de convertisseurs de signal de type pipeline." Thesis, Université Grenoble Alpes (ComUE), 2016. http://www.theses.fr/2016GREAT064/document.
Full textThis PhD thesis is aimed at exploring new Built-In-Self-Test (BIST) techniques for static linearity characterization of pipeline ADCs. During the production phase, the static and dynamic performances of the ADCs are tested. Static linearity test techniques are one of the more expensive test procedures that are performed at production line. The measurement of the static linearity performance requires the application of a low frequency high linearity stimulus and the collection of a high volume of output samples for noise averaging, usually using a histogram-based test setup. Thus, as the resolution of state-of-the-art ADCs increases, test time for static linearity characterization increases exponentially. For this reason, the reduction of the ADC test time is a hot topic that has gained an increasing interest over the past years. New techniques have recently been proposed to effectively reduce test time, but no BIST technique has yet been developed that considers a high resolution signal generator in combination with an on-chip analysis technique that dramatically reduces the amount of data. In this thesis, static linearity BIST techniques will be investigated for pipeline ADCs. In particular, this thesis presents a novel high-linearity on-chip test stimulus generator and a modified servo-loop technique that, in combination with reduced-code linearity test algorithms, lead to the definition of an efficient and accurate BIST strategy for pipeline ADCs. The work includes the experimental validation of the proposed techniques in collaboration with STMicroelectronics, Grenoble
Dimakos, Athanasios. "Test embarqué des circuits RF en utilisant des capteurs non-intrusifs." Thesis, Université Grenoble Alpes (ComUE), 2016. http://www.theses.fr/2016GREAT019/document.
Full textThis thesis addresses the high-volume production test problem for RF and millimeter-wave (mm-wave) circuits. Testing the RF/mm-wave functions of systems-on-chip (SoCs) incurs a very high cost. Built-in test is a promising alternative to facilitate testing and reduce costs, but it is challenging since it should by no means degrade the performance of the Circuit Under Test (CUT). In this work, we study a built-in test technique which is based on non-intrusive variation-aware sensors. The non-intrusive property is very appealing for designers since the sensors are totally transparent to the design and, thereby, the test is completely dissociated from the design. The non-intrusive sensors are dummy analog stages and single layout components that are copied from the topology of the CUT and are placed on the die in close physical proximity to the CUT. They simply offer an “image” of process variations and by virtue of this they are capable of tracking variations in the performances of the CUT. In essence, the technique capitalizes on the undesired phenomenon of process variations. The alternate test paradigm is employed to map the outputs of the non-intrusive sensors to the performances of the CUT, in order to replace the standard tests for measuring the performances directly. The proposed test idea is applied to two different CUTs, namely a 2.4GHz CMOS 65nm inductive degenerated Low-Noise Amplifier (LNA) and a wide-band mm-wave 60GHz CMOS 65nm 3-stage LNA. We demonstrate that by adding on-chip a few non-intrusive sensors of practically zero area-overhead and by obtaining on these non-intrusive sensors DC or low-frequency measurements, we are able to track variations in all performances of the CUT with an average prediction error lower than one standard deviation of the performance and a maximum prediction error that is lower or at least comparable to the measurement and repeatability errors in a conventional Automatic Test Equipment (ATE) environment
Dubois, Matthieu. "Méthodologie d'estimation des métriques de test appliquée à une nouvelle technique de BIST de convertisseur SIGMA / DELTA." Phd thesis, Université de Grenoble, 2011. http://tel.archives-ouvertes.fr/tel-00633056.
Full textJoaquim, da Rolt Jean. "Testabilité versus Sécurité : Nouvelles attaques par chaîne de scan & contremesures." Thesis, Montpellier 2, 2012. http://www.theses.fr/2012MON20168.
Full textIn this thesis, we firstly analyze the vulnerabilities induced by test infrastructures onto embedded secrecy in digital integrated circuits dedicated to cryptography. Then we propose new scan-based attacks and effective countermeasures. Scan chains insertion is the most used technique to ensure the testability of digital cores, providing high-fault coverage. However, for ICs dealing with secret information, scan chains can be used as back doors for accessing secret data, thus becominga threat to device's security. We start by describing a series of new attacks that exploit information leakage out of advanced Design-for-Testability structures such as response compaction, X-Masking and partial scan. Conversely to some previous works that proposed that these structures are immune to scan-based attacks, we show that our new attacks can reveal secret information that is embedded inside the chip boundaries. Regarding the countermeasures, we propose three new solutions. The first one moves the comparison between test responses and expected responses from the AutomaticTest Equipment to the chip. This solution has a negligible area overhead, no effect on fault coverage. The second countermeasure aims to protect the circuit against unauthorized access, for instance to the test mode, and also ensure the authentication of the circuit. For thatpurpose, mutual-authentication using Schnorr protocol on Elliptic Curves is implemented. As the last countermeasure, we propose that Differential Analysis Attacks algorithm-level countermeasures, suchas point-blinding and scalar-blinding can be reused to protect the circuit against scan-based attacks
Hély, David. "Conception en vue du test de circuits sécurisés." Montpellier 2, 2005. http://www.theses.fr/2005MON20123.
Full textEldh, Sigrid. "On Test Design." Doctoral thesis, Mälardalens högskola, Akademin för innovation, design och teknik, 2011. http://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-13040.
Full textBenabdenbi, Mounir. "Conception en vue du test de systèmes intégrés sur silicium (SoC)." Paris 6, 2002. http://www.theses.fr/2002PA066031.
Full textEudeline, Laurence. "Modélisation structurelle et fonctionnelle des circuits logiques en vue du test." Montpellier 2, 1991. http://www.theses.fr/1991MON20057.
Full textBooks on the topic "Design en vue du test"
Turino, Jon L. Design to Test. Dordrecht: Springer Netherlands, 1990. http://dx.doi.org/10.1007/978-94-011-6044-5.
Full textRajaram, S., N. B. Balamurugan, D. Gracia Nirmala Rani, and Virendra Singh, eds. VLSI Design and Test. Singapore: Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-13-5950-7.
Full textGaur, Manoj Singh, Mark Zwolinski, Vijay Laxmi, Dharmendra Boolchandani, Virendra Sing, and Adit D. Sing, eds. VLSI Design and Test. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-42024-5.
Full textSengupta, Anirban, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, and Santosh Kumar Vishvakarma, eds. VLSI Design and Test. Singapore: Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-32-9767-8.
Full textKaushik, Brajesh Kumar, Sudeb Dasgupta, and Virendra Singh, eds. VLSI Design and Test. Singapore: Springer Singapore, 2017. http://dx.doi.org/10.1007/978-981-10-7470-7.
Full textAcciardi, Raymond G. Pinhole test equipment design and test result evaluation. Denver, Colo: Geotechnical Branch, Division of Research and Laboratory Services, Engineering and Research Center, U.S. Dept. of the Interior, Bureau of Reclamation, 1985.
Find full textReis, Ricardo, Marcelo Lubaszewski, and Jochen A. G. Jess, eds. Design of Systems on a Chip: Design and Test. Boston, MA: Springer US, 2006. http://dx.doi.org/10.1007/0-387-32500-x.
Full text1969-, Janssen Dennis, and Pinkster Iris 1972-, eds. Integrated test design and automation: Using the test frame method. Reading, Mass: Addison-Wesley, 2001.
Find full textBook chapters on the topic "Design en vue du test"
Marwedel, Peter. "Test." In Embedded System Design, 321–33. Dordrecht: Springer Netherlands, 2011. http://dx.doi.org/10.1007/978-94-007-0257-8_8.
Full textWu, Margaret, Hak Ping Tam, and Tsung-Hau Jen. "Test Design." In Educational Measurement for Applied Researchers, 41–57. Singapore: Springer Singapore, 2016. http://dx.doi.org/10.1007/978-981-10-3302-5_3.
Full textLee, Weng Fook. "Design for Test." In Learning from VLSI Design Experience, 73–109. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-030-03238-8_5.
Full textLoo-Dinkins, J. "Field Test Design." In Handbook of Quantitative Forest Genetics, 96–139. Dordrecht: Springer Netherlands, 1992. http://dx.doi.org/10.1007/978-94-015-7987-2_4.
Full textRuff, Ronald. "Design Fluency Test." In Encyclopedia of Clinical Neuropsychology, 1118–21. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-57111-9_1426.
Full textGreen, Anthony, and Glenn Fulcher. "Test Design Cycle." In The Routledge Handbook of Second Language Acquisition and Language Testing, 69–77. New York: Routledge, 2020. | Series: The Routledge handbooks in second language acquisition: Routledge, 2020. http://dx.doi.org/10.4324/9781351034784-9.
Full textRuff, Ronald. "Design Fluency Test." In Encyclopedia of Clinical Neuropsychology, 821–22. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-0-387-79948-3_1426.
Full textBhathagar, Himanshu. "Design for Test." In Advanced ASIC Chip Synthesis, 147–58. Boston, MA: Springer US, 1999. http://dx.doi.org/10.1007/978-1-4419-8668-9_8.
Full textRuff, Ronald. "Design Fluency Test." In Encyclopedia of Clinical Neuropsychology, 1–2. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-56782-2_1426-2.
Full textHörbst, Egon, Christian Müller-Schloer, and Heinz Schwärtzel. "Test Concepts." In Design of VLSI Circuits, 136–71. Berlin, Heidelberg: Springer Berlin Heidelberg, 1987. http://dx.doi.org/10.1007/978-3-642-95525-9_4.
Full textConference papers on the topic "Design en vue du test"
Stansbury, Richard S., Massood Towhidnejad, Darris White, and Jack McKisson. "EcoEagles Hybrid Vehicle Control Architecture." In ASME 2009 3rd International Conference on Energy Sustainability collocated with the Heat Transfer and InterPACK09 Conferences. ASMEDC, 2009. http://dx.doi.org/10.1115/es2009-90310.
Full textGantt, Lynn R., Patrick M. Walsh, and Douglas J. Nelson. "Design and Development Process for a Range Extended Split Parallel Hybrid Electric Vehicle." In ASME 2010 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2010. http://dx.doi.org/10.1115/detc2010-28576.
Full textSun, Jianhong, and Martin Hardwick. "Building an Integrated Large Scale Step Database for Virtual Enterprises." In ASME 1999 Design Engineering Technical Conferences. American Society of Mechanical Engineers, 1999. http://dx.doi.org/10.1115/detc99/dfm-8965.
Full textPeng, Gaoliang, Wenjian Liu, Xinhua Liu, and Xin Li. "A Petri Net Based Interactive Manager Model for Virtual Maintenance Environment Application." In ASME 2010 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2010. http://dx.doi.org/10.1115/detc2010-29140.
Full textCecil, J., and S. Albuhamood. "An Internet-of-Things Based Cyber-Physical Test Bed for Collaborative Manufacturing." In ASME 2016 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/imece2016-65029.
Full textEllman, A., J. Laitinen, and T. Tiainen. "Combination of Virtual and Physical Objects in User-Centered Design of a Mobile Work Machine Cabin." In ASME 2007 International Mechanical Engineering Congress and Exposition. ASMEDC, 2007. http://dx.doi.org/10.1115/imece2007-41778.
Full textYi, Yan, and Zichun Li. "Design and Implementation of Music Web Application based on Vue and Spring Boot." In EITCE 2020: 2020 4th International Conference on Electronic Information Technology and Computer Engineering. New York, NY, USA: ACM, 2020. http://dx.doi.org/10.1145/3443467.3443875.
Full textDe Souza, Matheus, and Eduardo Alves da Silva. "Estudo Comparativo de Tecnologias de Desenvolvimento front-end paraWeb." In Computer on the Beach. São José: Universidade do Vale do Itajaí, 2021. http://dx.doi.org/10.14210/cotb.v12.p201-208.
Full textLeis, Brian N., Robert J. Eiber, L. Carlson, and A. Gilroy-Scott. "Relationship Between Apparent (Total) Charpy Vee-Notch Toughness and the Corresponding Dynamic Crack-Propagation Resistance." In 1998 2nd International Pipeline Conference. American Society of Mechanical Engineers, 1998. http://dx.doi.org/10.1115/ipc1998-2084.
Full textGuan, Cindy, Brian Rothwell, Joe Kondo, Masahiko Murata, and Keith Armstrong. "Full Scale Burst Validation Tests for Crack Arrestor Designs for NPS 48 Grade 550 Rich Gas Pipeline." In 2016 11th International Pipeline Conference. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/ipc2016-64112.
Full textReports on the topic "Design en vue du test"
Gerassimenko, M. Test Design Calculations II. Office of Scientific and Technical Information (OSTI), July 2000. http://dx.doi.org/10.2172/793924.
Full textStepanek, G. Uranium Plate Test Stack: Test of CC Design. Office of Scientific and Technical Information (OSTI), December 1985. http://dx.doi.org/10.2172/1030019.
Full textKelley, Christopher Lee, and Brian Thomas Naughton. NRT Design Verification Test Plan. Office of Scientific and Technical Information (OSTI), December 2018. http://dx.doi.org/10.2172/1489535.
Full textSnead, Mary A., Yong Yan, Michael Howell, James R. Keiser, and Kurt A. Terrani. Severe Accident Test Station Design Document. Office of Scientific and Technical Information (OSTI), September 2015. http://dx.doi.org/10.2172/1252142.
Full textGrandy, C., H. Belch, A. J. Brunett, F. Heidet, R. Hill, E. Hoffman, E. Jin, et al. FASTER Test Reactor Preconceptual Design Report. Office of Scientific and Technical Information (OSTI), March 2016. http://dx.doi.org/10.2172/1345032.
Full textHassan Ranganath, Nagarjun. Training Set Design for Test Removal Classication in IC Test. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.2028.
Full textGrandy, C., H. Belch, A. Brunett, F. Heidet, R. Hill, E. Hoffman, E. Jin, et al. FASTER test reactor preconceptual design report summary. Office of Scientific and Technical Information (OSTI), February 2016. http://dx.doi.org/10.2172/1246340.
Full textLisowski, Darius D., Craig D. Gerardi, Rui Hu, Dennis J. Kilsdonk, Nathan C. Bremer, Stephen W. Lomperski, Adam R. Kraus, Matthew D. Bucknor, and Mitchell T. Farmer. Water NSTF Design, Instrumentation, and Test Planning. Office of Scientific and Technical Information (OSTI), August 2017. http://dx.doi.org/10.2172/1375452.
Full textWoloshun, Keith Albert, Gregory E. Dale, Eric Richard Olivas, Angela Carol Naranjo, and Frank Patrick Romero. 29 mm Diameter Test Target Design Report. Office of Scientific and Technical Information (OSTI), August 2016. http://dx.doi.org/10.2172/1325690.
Full textHardin, Ernest. Deep Borehole Field Test Conceptual Design Report. Office of Scientific and Technical Information (OSTI), October 2016. http://dx.doi.org/10.2172/1431188.
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