Books on the topic 'Design en vue du test'

Turino, Jon L. Design to Test. Dordrecht: Springer Netherlands, 1990. http://dx.doi.org/10.1007/978-94-011-6044-5.

Rajaram, S., N. B. Balamurugan, D. Gracia Nirmala Rani, and Virendra Singh, eds. VLSI Design and Test. Singapore: Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-13-5950-7.

Gaur, Manoj Singh, Mark Zwolinski, Vijay Laxmi, Dharmendra Boolchandani, Virendra Sing, and Adit D. Sing, eds. VLSI Design and Test. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-42024-5.

Sengupta, Anirban, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, and Santosh Kumar Vishvakarma, eds. VLSI Design and Test. Singapore: Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-32-9767-8.

Kaushik, Brajesh Kumar, Sudeb Dasgupta, and Virendra Singh, eds. VLSI Design and Test. Singapore: Springer Singapore, 2017. http://dx.doi.org/10.1007/978-981-10-7470-7.

Acciardi, Raymond G. Pinhole test equipment design and test result evaluation. Denver, Colo: Geotechnical Branch, Division of Research and Laboratory Services, Engineering and Research Center, U.S. Dept. of the Interior, Bureau of Reclamation, 1985.

Stewart, George. Well test design and analysis. Tulsa, Okla: PennWell, 2010.

Well test design and analysis. Tulsa, Okla: PennWell, 2010.

Reis, Ricardo, Marcelo Lubaszewski, and Jochen A. G. Jess, eds. Design of Systems on a Chip: Design and Test. Boston, MA: Springer US, 2006. http://dx.doi.org/10.1007/0-387-32500-x.

1969-, Janssen Dennis, and Pinkster Iris 1972-, eds. Integrated test design and automation: Using the test frame method. Reading, Mass: Addison-Wesley, 2001.

Schuster, C. E. Test structure implementation document: DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs). Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995.

Schuster, C. E. Test structure implementation document: DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs). Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995.

Schuster, C. E. Test structure implementation document: DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs). Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995.

Butler, Keith James. The design of environmental test rigs. Birmingham: Aston University. Department of Mechanical and Production Engineering, 1986.

Tursky, Christine. Test system design: A systematic approach. Upper Saddle River, NJ: Prentice Hall PTR, 2001.

Shepherd, Peter. Integrated circuit design, fabrication, and test. New York: McGraw-Hill, 1996.

Rahaman, Hafizur, Sanatan Chattopadhyay, and Santanu Chattopadhyay, eds. Progress in VLSI Design and Test. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-31494-0.

Shepherd, Peter. Integrated Circuit Design, Fabrication and Test. London: Macmillan Education UK, 1996. http://dx.doi.org/10.1007/978-1-349-13656-8.

Lauwereins, Rudy, and Jan Madsen, eds. Design, Automation, and Test in Europe. Dordrecht: Springer Netherlands, 2008. http://dx.doi.org/10.1007/978-1-4020-6488-3.

van der Linden, Wim J. Linear Models for Optimal Test Design. New York, NY: Springer New York, 2005. http://dx.doi.org/10.1007/0-387-29054-0.

Navabi, Zainalabedin. Digital System Test and Testable Design. Boston, MA: Springer US, 2011. http://dx.doi.org/10.1007/978-1-4419-7548-5.

Kett, Irving. Engineered concrete: Mix design and test methods. 2nd ed. Boca Raton: Taylor & Francis, 2010.

Kett, Irving. Engineered concrete: Mix design and test methods. 2nd ed. Boca Raton: Taylor & Francis, 2010.

E, Moon J., and Commission of the European Communities. Directorate-General for Science, Research, and Development., eds. Solar collectors: Test methods and design guidelines. Dordrecht, Holland: D. Reidel Pub. Co. for the Commission of the European Communities, 1985.

Engineered concrete: Mix design and test methods. 2nd ed. Boca Raton: CRC Press/Taylor & Francis, 2010.

Jacopo, Romei, ed. Pro PHP refactoring with test driven design. [Berkley, CA]: Apress, 2010.

Engineered concrete: Mix design and test methods. Boca Raton, FL: CRC Press, 2000.

Doug, Rosenberg, and SpringerLink (Online service), eds. Design Driven Testing: Test Smarter, Not Harder. Berkeley, CA: Matt Stephens, Doug Rosenberg, 2010.

Abadir, Magdy, and Tony Ambler, eds. Economics of Electronic Design, Manufacture and Test. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4757-5048-5.

Asai, Shojiro, ed. VLSI Design and Test for Systems Dependability. Tokyo: Springer Japan, 2019. http://dx.doi.org/10.1007/978-4-431-56594-9.

A practitioner's guide to software test design. Boston, Mass: Artech House, 2004.

Kett, Irving. Engineered concrete: Mix design and test methods. 2nd ed. Boca Raton: CRC Press/Taylor & Francis, 2010.

Andrei, Pavlov. CMOS SRAM circuit design and parametric test in nano-scaled technologies: Process-aware SRAM design and test. [Dordrecht]: Springer, 2008.

Blanc, Odile, and Florence Charpigny. Tissu-papier, échanges d'impressions: Question de points de vue. Lyon: ENS, 2005.

Raymond, Mark R. Guide to test item development. Kansas City, Mo. (2420 Pershing Rd., Kansas City 64108): American Nurses' Association, 1986.

Noia, Brandon, and Krishnendu Chakrabarty. Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-02378-6.

Design to test: A definitive guide for electronic design, manufacture, and service. 2nd ed. New York, N.Y: Van Nostrand Reinhold, 1990.

López, Juan Carlos. Advanced Techniques for Embedded Systems Design and Test. Boston, MA: Springer US, 1998.

M, Rudnick Elizabeth, ed. Genetic algorithms for VLSI design, layout & test automation. Upper Saddle River, NJ: Prentice Hall PTR, 1999.

NASA. Office of Safety and Mission Quality. NASA reliability preferred practices for design and test. Washington, D. C: NASA, Office of Safety and Mission Quality, 1991.

Mulder, Jan Albert. Design and evaluation of dynamic flight test manoeuvres. Delft: Technical University of Delft, 1986.

Test Design. Elsevier, 1985. http://dx.doi.org/10.1016/c2013-0-10620-4.

Turino, John. Design to Test. Springer, 1990.

Turino, Jon L. Design to Test. 2nd ed. Logical Solutions Technology, Incorporated, 1989.

Reis, Ricardo, Marcelo Soares Lubaszewski, and Jochen A. G. Jess. Design of Systems on a Chip : Design and Test: Design and Test. Springer, 2010.

Education, Kaplan AEC. Pre-Design Test Bank. Kaplan AEC Education, 2005.

Atkinson. The Test Design Handbook. Pearson Education Ltd., 2001.

Engineers, Institute Of Electrical and Electronics. Test Symposium, 10th Anniversary Design, Test and Application. Institute of Electrical & Electronics Engineers (IEEE) Inc.,US, 1993.

Surface Warfare Test Ship Design. Storming Media, 2000.

(Editor), Ricardo Reis, Marcelo Lubaszewski (Editor), and Jochen A.G. Jess (Editor), eds. Design of Systems on a Chip: Design and Test. Springer, 2006.