Journal articles on the topic 'Design for testability'
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Ting-Hua Chen and M. A. Breuer. "Automatic Design for Testability Via Testability Measures." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 4, no. 1 (January 1985): 3–11. http://dx.doi.org/10.1109/tcad.1985.1270093.
Full textRoberts, D. H., J. A. Elmore, R. Balcombe, R. B. Bennett, and J. M. Hodge. "Design for testability." IEE Proceedings A Physical Science, Measurement and Instrumentation, Management and Education, Reviews 132, no. 4 (1985): 241. http://dx.doi.org/10.1049/ip-a-1.1985.0054.
Full textBennetts, R. G., and M. A. Jack. "Design for testability." IEE Proceedings G (Electronic Circuits and Systems) 132, no. 3 (1985): 73. http://dx.doi.org/10.1049/ip-g-1.1985.0017.
Full textMcGrew, Lydia. "Testability, Likelihoods, and Design." Philo 7, no. 1 (2004): 5–21. http://dx.doi.org/10.5840/philo2004711.
Full textUngar, Louis Y. "Testability design prevents harm." IEEE Aerospace and Electronic Systems Magazine 25, no. 3 (March 2010): 35–43. http://dx.doi.org/10.1109/maes.2010.5463955.
Full textZhou, Ping, and Dong Feng Liu. "Research on Design for Testability of Marine Diesel Engine." Applied Mechanics and Materials 110-116 (October 2011): 4234–39. http://dx.doi.org/10.4028/www.scientific.net/amm.110-116.4234.
Full textLiu, Ye, and Yi Chen Wang. "The Study of the Requirement of Software Testability Based on Causal Analysis." Applied Mechanics and Materials 513-517 (February 2014): 1944–50. http://dx.doi.org/10.4028/www.scientific.net/amm.513-517.1944.
Full textZhao, Jing, Wen Jun Zhao, and Qiang Zhang. "Design and Realization of an Avionics Equipment Testability Model Based on TADS." Applied Mechanics and Materials 644-650 (September 2014): 964–67. http://dx.doi.org/10.4028/www.scientific.net/amm.644-650.964.
Full textDssouli, R., K. Karoui, K. Saleh, and O. Cherkaoui. "Communications software design for testability: specification transformations and testability measures." Information and Software Technology 41, no. 11-12 (September 1999): 729–43. http://dx.doi.org/10.1016/s0950-5849(99)00033-6.
Full textOoi, Chia Yee, and Hideo Fujiwara. "A New Design-for-Testability Method Based on Thru-Testability." Journal of Electronic Testing 27, no. 5 (September 1, 2011): 583–98. http://dx.doi.org/10.1007/s10836-011-5241-8.
Full textBennetts, R. G. "Conference report. Design for testability." Computer-Aided Engineering Journal 2, no. 4 (1985): 134. http://dx.doi.org/10.1049/cae.1985.0029.
Full textYamada, Akihiko, and Shigeniro Funatsu. "Design for Testability of LSI." IEEJ Transactions on Electronics, Information and Systems 107, no. 3 (1987): 240–44. http://dx.doi.org/10.1541/ieejeiss1987.107.3_240.
Full textYe, Bo-Yuan, Po-Yu Yeh, Sy-Yen Kuo, and Ing-Yi Chen. "Design-for-testability techniques for CORDIC design." Microelectronics Journal 40, no. 10 (October 2009): 1436–40. http://dx.doi.org/10.1016/j.mejo.2009.06.002.
Full textKornegay, Kevin T., and Robert W. Brodersen. "Integrated Test Solutions for a System Design Environment." VLSI Design 1, no. 4 (January 1, 1994): 345–57. http://dx.doi.org/10.1155/1994/39791.
Full textNikfard, Pourya, Suhaimi Bin Ibrahim, Babak Darvish Rohani, Harihodin Bin Selamat, and Mohd Nazri Mahrin. "A Comparative Evaluation of approaches for Model Testability." INTERNATIONAL JOURNAL OF COMPUTERS & TECHNOLOGY 9, no. 1 (July 15, 2013): 948–55. http://dx.doi.org/10.24297/ijct.v9i1.4157.
Full textNikfard, Pourya, Suhaimi Bin Ibrahim, Babak Darvish Rohani, Harihodin Bin Selamat, and Mohd Nazri Mahrin. "An Evaluation for Model Testability approaches." INTERNATIONAL JOURNAL OF COMPUTERS & TECHNOLOGY 9, no. 1 (June 30, 2013): 938–47. http://dx.doi.org/10.24297/ijct.v9i1.4159.
Full textWang, Yi Chen, and Feng Xie. "Research on Software Testability Requirement Analysis Method." Advanced Materials Research 760-762 (September 2013): 1084–88. http://dx.doi.org/10.4028/www.scientific.net/amr.760-762.1084.
Full textFU, Jian-ping, and Min-yan LU. "Survey of software design for testability." Journal of Computer Applications 28, no. 11 (June 5, 2009): 2915–18. http://dx.doi.org/10.3724/sp.j.1087.2008.02915.
Full textTakagi, Kiyoshi, and Yoshiyuki Kocho. "Design for Testability ^|^mdash; Case Study." Journal of The Japan Institute of Electronics Packaging 16, no. 7 (2013): 513–16. http://dx.doi.org/10.5104/jiep.16.513.
Full textMorsy, Sherif, Mohamed El-Mahlawy, and Gouda Mohamed. "Design for Testability Technique for Microcontroller." International Conference on Electrical Engineering 8, no. 8th (May 1, 2012): 1–18. http://dx.doi.org/10.21608/iceeng.2012.30809.
Full textZwolinski, M., and M. S. Gaur. "Integrating testability with design space exploration." Microelectronics Reliability 43, no. 5 (May 2003): 685–93. http://dx.doi.org/10.1016/s0026-2714(03)00034-9.
Full textSpalding, G. R., and P. M. VanPeteghem. "Design for testability using behavioral models." IEEE Transactions on Instrumentation and Measurement 39, no. 6 (1990): 881–85. http://dx.doi.org/10.1109/19.65789.
Full textMou Hu and Smith. "Ternary Scan Design for VLSI Testability." IEEE Transactions on Computers C-35, no. 2 (February 1986): 167–70. http://dx.doi.org/10.1109/tc.1986.1676735.
Full textKrylov, Gleb, and Eby G. Friedman. "Design for Testability of SFQ Circuits." IEEE Transactions on Applied Superconductivity 27, no. 8 (December 2017): 1–7. http://dx.doi.org/10.1109/tasc.2017.2759239.
Full textSun, X., and F. Lombardi. "Design for testability of sequential circuits." IEE Proceedings - Computers and Digital Techniques 141, no. 3 (1994): 153. http://dx.doi.org/10.1049/ip-cdt:19941099.
Full textVasudevan, D. P., P. K. Lala, J. Di, and J. P. Parkerson. "Reversible-Logic Design With Online Testability." IEEE Transactions on Instrumentation and Measurement 55, no. 2 (April 2006): 406–14. http://dx.doi.org/10.1109/tim.2006.870319.
Full textFasang, P. P. "Analog/digital ASIC design for testability." IEEE Transactions on Industrial Electronics 36, no. 2 (May 1989): 219–26. http://dx.doi.org/10.1109/41.19072.
Full textChakradhar, Srimat T., Vishwani D. Agrawal, and Michael L. Bushnell. "Energy minimization and design for testability." Journal of Electronic Testing 5, no. 1 (February 1994): 57–66. http://dx.doi.org/10.1007/bf00971963.
Full textBrown, A. D. "Logic testing and design for testability." Computer-Aided Design 18, no. 6 (July 1986): 339. http://dx.doi.org/10.1016/0010-4485(86)90109-0.
Full textWen, Zhen Hua, Yuan Peng Liu, and Xin Yin. "Testability Design of the PHM System for Aero-Engines." Advanced Materials Research 544 (June 2012): 94–98. http://dx.doi.org/10.4028/www.scientific.net/amr.544.94.
Full textSun, Jian, Qin Lei Sun, Kao Li Huang, Ying Xie, and Hong Ru Li. "Study on Method for Test Points Selection under Uncertainty Based on MBQPSO." Applied Mechanics and Materials 239-240 (December 2012): 730–34. http://dx.doi.org/10.4028/www.scientific.net/amm.239-240.730.
Full textLandrault, Christian, and Pascal Nouet. "Testability improvements using E-Beam controllability: Principle and design for Electron-Beam testability." Microelectronic Engineering 31, no. 1-4 (February 1996): 47–54. http://dx.doi.org/10.1016/0167-9317(95)00325-8.
Full textELBABLY, M., G. MUSGRAVE, and I. IBRAHIM. "A NEW DESIGN FOR COMPRESSION TECHNIQUE FOR TESTABILITY DESIGN." International Conference on Aerospace Sciences and Aviation Technology 3, ASAT CONFERENCE (April 1, 1989): 1–11. http://dx.doi.org/10.21608/asat.1989.25979.
Full textChen, Chien-In Henry, and Mahesh Wagh. "Testability Synthesis for Jumping Carry Adders." VLSI Design 14, no. 2 (January 1, 2002): 155–69. http://dx.doi.org/10.1080/10655140290010079.
Full textFarhat, H., and S. From. "A Quadratic Programming Approach to Estimating the Testability and Random or Deterministic Coverage of a VLSl Circuit." VLSI Design 2, no. 3 (January 1, 1994): 223–31. http://dx.doi.org/10.1155/1994/75615.
Full textShiny, M. I., and Nirmala Devi M. "LFSR Based Secured Scan design Testability Techniques." Procedia Computer Science 115 (2017): 174–81. http://dx.doi.org/10.1016/j.procs.2017.09.123.
Full textHatayama, Kazumi. "Design-for-Testability Techniques for Logic LSIs." Journal of SHM 11, no. 2 (1995): 14–17. http://dx.doi.org/10.5104/jiep1993.11.2_14.
Full textParsan, Farhad A., Scott C. Smith, and Waleed K. Al-Assadi. "Design for Testability of Sleep Convention Logic." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24, no. 2 (February 2016): 743–53. http://dx.doi.org/10.1109/tvlsi.2015.2419816.
Full textAgrawal, Vishwani D. "Design of mixed-signal systems for testability." Integration 26, no. 1-2 (December 1998): 141–50. http://dx.doi.org/10.1016/s0167-9260(98)00025-x.
Full textJoseph, Arun A., and Hans G. Kerkhoff. "Design for the testability of superconductor electronics." Superconductor Science and Technology 16, no. 12 (November 13, 2003): 1559–65. http://dx.doi.org/10.1088/0953-2048/16/12/052.
Full textWilkins, B. R. "Design for testability—the need for change." Computer-Aided Engineering Journal 4, no. 4 (1987): 175. http://dx.doi.org/10.1049/cae.1987.0040.
Full textLi, TAO. "Design of VLSI asynchronous circuits for testability." International Journal of Electronics 64, no. 6 (June 1988): 859–68. http://dx.doi.org/10.1080/00207218808962860.
Full textGaur, H. M., and A. K. Singh. "Design of reversible circuits with high testability." Electronics Letters 52, no. 13 (June 2016): 1102–4. http://dx.doi.org/10.1049/el.2016.0161.
Full textAylor, James, Barry Johnson, and Bruce Rector. "Structured Design for Testability in Semicustom VLSI." IEEE Micro 6, no. 1 (February 1986): 51–58. http://dx.doi.org/10.1109/mm.1986.304637.
Full textKusiak, A., and C. C. Huang. "Design of modular digital circuits for testability." IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part C 20, no. 1 (1997): 48–57. http://dx.doi.org/10.1109/3476.585144.
Full textWey, Chin-Long. "Design of testability for analogue fault diagnosis." International Journal of Circuit Theory and Applications 15, no. 2 (April 1987): 123–42. http://dx.doi.org/10.1002/cta.4490150204.
Full textHu, Yongtong, and Janos Gertler. "DESIGN OF DIRECTIONAL RESIDUALS FOR OPTIMAL TESTABILITY." IFAC Proceedings Volumes 35, no. 1 (2002): 131–36. http://dx.doi.org/10.3182/20020721-6-es-1901.00753.
Full textBinder, Robert V. "Design for testability in object-oriented systems." Communications of the ACM 37, no. 9 (September 1994): 87–101. http://dx.doi.org/10.1145/182987.184077.
Full textWagner, K. D., and T. W. Williams. "Design for testability of analog/digital networks." IEEE Transactions on Industrial Electronics 36, no. 2 (May 1989): 227–30. http://dx.doi.org/10.1109/41.19073.
Full textVranken, H. P. E., M. F. Witteman, and R. C. Van Wuijtswinkel. "Design for testability in hardware software systems." IEEE Design & Test of Computers 13, no. 3 (1996): 79–86. http://dx.doi.org/10.1109/54.536098.
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