Relevant bibliographies by topics / Dielectrics

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Dielectrics'

Author: Grafiati
Published: 4 June 2021
Last updated: 25 July 2025

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Journal articles on the topic "Dielectrics"

1

Yang, Zhijie, Dong Yue, Yuanhang Yao, et al. "Energy Storage Application of All-Organic Polymer Dielectrics: A Review." Polymers 14, no. 6 (2022): 1160. http://dx.doi.org/10.3390/polym14061160.

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With the wide application of energy storage equipment in modern electronic and electrical systems, developing polymer-based dielectric capacitors with high-power density and rapid charge and discharge capabilities has become important. However, there are significant challenges in synergistic optimization of conventional polymer-based composites, specifically in terms of their breakdown and dielectric properties. As the basis of dielectrics, all-organic polymers have become a research hotspot in recent years, showing broad development prospects in the fields of dielectric and energy storage. Th
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Shabgard, Mohammad Reza, Hossein Faraji, Behnam Khosrozade, Hadi Eivazi-Bagheri та Keivan Amini. "Study the Effects of Dielectric Type on the Machining Characteristics of γ-Ti Al in Electrical Discharge Machining". International Journal of Engineering Research in Africa 33 (листопад 2017): 40–49. http://dx.doi.org/10.4028/www.scientific.net/jera.33.40.

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The current study surveys the results of using deionized water and kerosene as dielectrics in the machining outputs of γ-TiAl intermetallic compound obtained in electric discharge machining. Influences of these different dielectrics properties on machining speed, tool wear, surface cracks and roughness were compared. Scanning electron microscopy micrographs were prepared to investigate influences of dielectrics on the surface characteristics of electrically discharged samples. Results indicate which by kerosene dielectric; the material removal rate (MRR) is further compared to another one. But
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Gebremedhn, W. Wagaye. "Performance Investigation of Coaxial Cable with Transmission Line Parameters Based on Lossy Dielectric Medium." Indonesian Journal of Electrical Engineering and Computer Science 11, no. 2 (2018): 424–28. https://doi.org/10.11591/ijeecs.v11.i2.pp424-428.

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This paper presents the analysis of high performance for coaxial cable with transmission line parameters. The modeling for performance of coaxial cable contains many parameters, in this paper will discuss the more effective parameter is the type of dielectric mediums. This analysis of the performance related to dielectric mediums with respect to dielectric losses and its effect upon cable properties, dielectrics versus characteristic impedance, and the attenuation in the coaxial line for different dielectrics. The analysis depends on a simple mathematical model for coaxial cables to test the i
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Li, Xuechen, Yuqi Ge, Wenjie Wan, et al. "Comparative study on atmospheric pressure helium barrier discharges with the planar dielectric surfaces and the wavy ones simulated by a fluid model." Physica Scripta 100, no. 7 (2025): 075602. https://doi.org/10.1088/1402-4896/addc49.

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Abstract As a popular plasma source at atmospheric pressure, dielectric barrier discharge (DBD) has been extensively used in various application fields, which normally operates in a uniform mode or a filamentary mode depending on the experimental conditions. Previous studies revealed that the uniform mode transitions to the filamentary mode when one planar dielectric is replaced by a wavy dielectric [Plasma Process. Polym. 17 1900182 (2019)]. In their paper gap width varies for different positions along the radial directions. Hence, it is hard to know whether the surface morphology or the gap
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Singh, Rajenda, and Richard K. Ulrich. "High and Low Dielectric Constant Materials." Electrochemical Society Interface 8, no. 2 (1999): 26–30. http://dx.doi.org/10.1149/2.f06992if.

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Silicon-based dielectrics (SiO2, Si3N4, SiOxNy etc.) have been widely used as the key dielectrics in the manufacturing of silicon integrated circuits (ICs) and virtually all other semiconductor devices. Dielectrics having a value of dielectric constant k × 8.854 F/cm more than that of silicon nitride (k > 7) are classified as high dielectric constant materials, while those with a value of k less than the dielectric constant of silicon dioxide (k < 3.9) are classified as the low dielectric constant materials. The minimum value of (k) is one for air. The highest value of k has been reporte
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Wagaye, Gebremedhn Wubet. "Performance Investigation of Coaxial Cable with Transmission Line Parameters Based on Lossy Dielectric Medium." Indonesian Journal of Electrical Engineering and Computer Science 11, no. 2 (2018): 424. http://dx.doi.org/10.11591/ijeecs.v11.i2.pp424-428.

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<p>This paper presents the analysis of high performance for coaxial cable with transmission line parameters. The modeling for performance of coaxial cable contains many parameters, in this paper will discuss the more effective parameter is the type of dielectric mediums. This analysis of the performance related to dielectric mediums with respect to dielectric losses and its effect upon cable properties, dielectrics versus characteristic impedance, and the attenuation in the coaxial line for different dielectrics. The analysis depends on a simple mathematical model for coaxial cables to t
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Su, Yipin, Xudong Shen, Zinan Zhao, Bin Wu, and Weiqiu Chen. "Electromechanical Deformations and Bifurcations in Soft Dielectrics: A Review." Materials 17, no. 7 (2024): 1499. http://dx.doi.org/10.3390/ma17071499.

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Dielectric elastomers have attracted considerable attention both from academia and industry alike over the last two decades due to their superior mechanical properties. In parallel, research on the mechanical properties of dielectrics has been steadily advancing, including the theoretical, experimental, and numerical aspects. It has been recognized that the electromechanical coupling property of dielectric materials can be utilized to drive deformations in functional devices in a more controllable and intelligent manner. This paper reviews recent advances in the theory of dielectrics, with spe
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Chi, Xiaohong, Wenfeng Liu, Shengtao Li, and Xiaohong Zhang. "The Effect of Humidity on Dielectric Properties of PP-Based Nano-Dielectric." Materials 12, no. 9 (2019): 1378. http://dx.doi.org/10.3390/ma12091378.

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Nano-dielectrics are sensitive to humidity and easily degraded in damp environment because of the high surface energy of nanoparticles. In order to study the effect of humidity on the dielectric properties of nano-dielectric, polypropylene (PP) was modified by polyolefin elastomer (POE) and nano-SiO2, and the samples with obvious filling concentration were pre-selected by breakdown strength for damp aging. The aging experiments were carried out in different relative humidity. The dielectric properties of new, hygroscopic saturation and samples after drying were measured and analyzed. It is fou
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Wallace, Robert M., and Glen Wilk. "Alternative Gate Dielectrics for Microelectronics." MRS Bulletin 27, no. 3 (2002): 186–91. http://dx.doi.org/10.1557/mrs2002.70.

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AbstractThis brief article sets the context for the March 2002 issue of MRS Bulletin focusing on Alternative Gate Dielectrics for Microelectronics. Contributors are several experts from industry and academia engaged in the search for manufacturable solutions for a suitable alternative gate dielectric to SiO2 using high-dielectric-constant (high-ĸ) materials. Issues discussed in the articles include thermodynamics criteria for materials selection, materials interactions in the construction of the transistor gate stack, characterization of alternative materials, determination of suitable band of
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Meza-Arroyo, Javier, and Rafael Ramírez-Bon. "Organic–Inorganic Hybrid Dielectric Layers for Low-Temperature Thin-Film Transistors Applications: Recent Developments and Perspectives." Technologies 13, no. 1 (2025): 20. https://doi.org/10.3390/technologies13010020.

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This paper reviews the recent development of organic–inorganic hybrid dielectric materials for application as gate dielectrics in thin-film transistors (TFTs). These hybrid materials consist of the blending of high-k inorganic dielectrics with polymers, and their resulting properties depend on the amount and type of interactions between the organic and inorganic phases. The resulting amorphous networks, characterized by crosslinked organic and inorganic phases, can be tailored for specific applications, including gate dielectrics in TFTs. As dielectric materials, they offer a synergistic combi
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Dissertations / Theses on the topic "Dielectrics"

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Fromille, Samuel S. IV. "Novel Concept for High Dielectric Constant Composite Electrolyte Dielectrics." Thesis, Monterey, California. Naval Postgraduate School, 2013. http://hdl.handle.net/10945/53408.

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Approved for public release<br>This research was part of an ongoing program studying the concept of multi-material dielectrics (MMD) with dielectric constants much higher than homogenous materials. MMD described in this study have dielectric constants six orders of magnitude greater than the best single materials. This is achieved by mixing conductive particles with an insulating surface layer into a composite matrix phase composed of high surface area ceramic powder and aqueous electrolyte. Specifically examined in this study was micron-scale nickel powder treated in hydrogen peroxide (H2O2)
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Grove, Nicole R. "Characterization of functionalized polynorbornenes as interlevel dielectrics." Diss., Georgia Institute of Technology, 1997. http://hdl.handle.net/1853/11204.

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Balu, Venkatasubramani. "Barium strontium titanate thin film capacitors for high-density memories /." Digital version accessible at:, 1999. http://wwwlib.umi.com/cr/utexas/main.

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Hu, Chuan. "Study of the thermal properties of low k dielectric thin films /." Full text (PDF) from UMI/Dissertation Abstracts International, 2000. http://wwwlib.umi.com/cr/utexas/fullcit?p9992820.

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Duong, Danny. "The complex dielectric properties of aqueous ammonia from 2 GHz - 8.5 GHz in support of the NASA Juno mission." Thesis, Georgia Institute of Technology, 2011. http://hdl.handle.net/1853/42891.

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A new model for the complex dielectric constant, ε, of aqueous ammonia (NH4OH) has been developed based on laboratory measurements in the frequency range between 2-8.5 GHz for ammonia concentrations of 0-8.5 %NH3/volume and temperatures between 277-297 K. The new model has been validated for temperatures up to 313 K, but may be consistently extrapolated up to 475 K and ammonia concentrations up to 20 %NH3/volume. The model fits 60.26 % of all laboratory measurements within 2σ uncertainty. The new model is identical to the Meissner and Wentz (2004) model of the complex dielectric constant of pu
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Cicerrella, Elizabeth. "Dielectric functions and optical bandgaps of high-K dielectrics by far ultraviolet spectroscopic ellipsometry /." Full text open access at:, 2006. http://content.ohsu.edu/u?/etd,2.

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Cho, Taiheui. "Anisotropy of low dielectric constant materials and reliability of Cu/low-k interconnects /." Digital version accessible at:, 2000. http://wwwlib.umi.com/cr/utexas/main.

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Ahchawarattaworn, Jutharat. "Perovskite oxynitride dielectrics." Thesis, University of Newcastle Upon Tyne, 2011. http://hdl.handle.net/10443/1186.

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The synthesis, crystal structures and dielectric properties of perovskite oxynitrides of the type LnTiO2N (Ln = La, Nd and mixtures) and ATaO2N (A = Ca, Sr, Ba and mixtures), have been investigated. The end-member oxynitrides and their associated LaxNd1-xTiO2N, CaxSr1-xTaO2N and BaxSr1-xTaO2N solid solutions were successfully prepared by ammonolysis of the appropriate precursor oxides at temperatures in the range 900-1200ºC. The complete range of LaxNd1-xTiO2N solid solution are orthorhombic perovskites, which show a small increase in unit cell parameters with increasing La content across the
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Saura, Mas Xavier. "Filamentos conductores de ruptura dieléctrica en aislantes delgados." Doctoral thesis, Universitat Autònoma de Barcelona, 2014. http://hdl.handle.net/10803/285732.

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La industria micro y nanoelectrónica requiere de múltiples líneas de investigación para la introducción de continuas mejoras en los dispositivos en términos de rendimiento, funcionalidad y escalabilidad. Una de estas mejoras se centra en la idea de utilizar el fenómeno de la ruptura dieléctrica como principio de operación de dispositivos electrónicos. Esta idea ha generado mucho interés recientemente, especialmente en el campo de las memorias no volátiles. Así, la investigación realizada a lo largo de esta tesis doctoral gira en torno a la ruptura dieléctrica de óxidos de alta permitividad y
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Cousins, Jesse. "Simulation of the Variability in Microelectronic Capacitors having Polycrystalline Dielectrics with Columnar Microstructure." Fogler Library, University of Maine, 2003. http://www.library.umaine.edu/theses/pdf/CousinsJL2003.pdf.

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Books on the topic "Dielectrics"

1

Fröhlich, H. Theory of dielectrics: Dielectrics constant and dielectric loss. 2nd ed. Clarendon Press, 1986.

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Fröhlich, H. Theory of dielectrics: Dielectric constant and dielectric loss. 2nd ed. Clarendon, 1986.

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Juan, Martinez-Vega, ed. Dielectric materials for electric engineering. ISTE, 2010.

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International Symposium on Science and Technology of Dielectrics in Emerging Fields (1st 2003 Paris, France). Dielectrics in emerging technologies: Proceedings of the international symposium. Edited by Misra D, Wörhoff K, Mascher P, Electrochemical Society. Dielectric Science and Technology Division., and Electrochemical Society Electronics Division. Electrochemical Society, 2003.

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M, Nair K., American Ceramic Society Meeting, and Advances in Dielectric Materials and Multilayer Electronic Devices Symposium (2000 : St. Louis, Missouri)., eds. Dielectric materials and devices. American Ceramic Society, 2002.

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Darko, Kajfez, and Guillon Pierre, eds. Dielectric resonators. 2nd ed. Noble Publishing, 1998.

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7

Kacprzyk, Ryszard. Wybrane zagadnienia badań ładunku i jego zaniku w dielektrykach stałych. Oficyna Wydawn. Politechniki Wrocławskiej, 2004.

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8

Christophorou, Loucas G., and James K. Olthoff, eds. Gaseous Dielectrics IX. Springer US, 2001. http://dx.doi.org/10.1007/978-1-4615-0583-9.

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Christophorou, Loucas G., and David R. James, eds. Gaseous Dielectrics VII. Springer US, 1994. http://dx.doi.org/10.1007/978-1-4899-1295-4.

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Christophorou, Loucas G., and Isidor Sauers, eds. Gaseous Dielectrics VI. Springer US, 1991. http://dx.doi.org/10.1007/978-1-4615-3706-9.

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Book chapters on the topic "Dielectrics"

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Bird, John. "Dielectrics and dielectric loss." In Bird's Electrical Circuit Theory and Technology, 7th ed. Routledge, 2021. http://dx.doi.org/10.1201/9781003130338-46.

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Bettini, Alessandro. "Dielectrics." In Undergraduate Lecture Notes in Physics. Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-40871-2_4.

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Sirdeshmukh, Dinker B., Lalitha Sirdeshmukh, and K. G. Subhadra. "Dielectrics." In Atomistic Properties of Solids. Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-19971-4_11.

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de Oliveira, Mário J. "Dielectrics." In Equilibrium Thermodynamics. Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-36549-2_15.

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Warnes, L. A. A. "Dielectrics." In Electronic Materials. Springer US, 1990. http://dx.doi.org/10.1007/978-1-4615-6893-3_8.

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de Oliveira, Mário J. "Dielectrics." In Equilibrium Thermodynamics. Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-662-53207-2_15.

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Warnes, L. A. A. "Dielectrics." In Electronic Materials. Macmillan Education UK, 1990. http://dx.doi.org/10.1007/978-1-349-21045-9_8.

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Anderson, J. C., K. D. Leaver, R. D. Rawlings, and J. M. Alexander. "Dielectrics." In Materials Science. Springer US, 1990. http://dx.doi.org/10.1007/978-1-4899-6826-5_17.

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Etzold, K. F. "Dielectrics." In RF and Microwave Passive and Active Technologies. CRC Press, 2018. https://doi.org/10.1201/9781315221854-31.

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Sibley, Martin J. N. "Dielectrics." In Introduction to Electromagnetism, 2nd ed. CRC Press, 2021. http://dx.doi.org/10.1201/9780367462703-6.

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Conference papers on the topic "Dielectrics"

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Li, Shengtao, and Yang Feng. "High Dielectric and Energy Storage Polymer Dielectrics." In 2021 IEEE International Conference on the Properties and Applications of Dielectric Materials (ICPADM). IEEE, 2021. http://dx.doi.org/10.1109/icpadm49635.2021.9493998.

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Rajić, Tomislav, Koviljka Stanković, Đorđe Čubrić, and Kovica Bibić. "MERENJE FAKTORA DIELEKTRIČNIH GUBITAKA DIELEKTRIKA." In 35. Savetovanje Srpskog nacionalnog komiteta Međunarodnog saveta za velike električne mreže. Srpski nacionalni komitet Međunarodnog saveta za velike električne mreže CIGRE Srbija, 2023. http://dx.doi.org/10.46793/cigre35.1155r.

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Dielectrics are an important group of materials from the aspect of electric power systems. They have the task of separating highvoltage parts from grounding system. Also, it is necessary to separate the parts that are at different potentials. Over time, during operation, due to weather or other factors, such as low / high temperature, humidity, etc. there are changes in the dielectric properties of the material. This weakens the characteristics and dielectric breakdown can occur. A breakdown can also occur due to the increased value of the voltage at the ends of the dielectric. This also incre
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Singh, Nirmal Kumar, Rajesh Sahoo, and Vivek Bajpai. "Operational Feasibility of Maglev EDM Using Different Non-Conductive Powder Mixed Dielectric for Machining Inconel 625 Alloy." In ASME 2023 18th International Manufacturing Science and Engineering Conference. American Society of Mechanical Engineers, 2023. http://dx.doi.org/10.1115/msec2023-104659.

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Abstract Currently, powder mixed dielectric application in electro-discharge machining (EDM) is an emerging field to enhance process efficiency and achieve better surface quality along with surface modification. The current investigation utilizes two non-conductive powder mixed dielectrics i.e., urea mixed distilled water and silica mixed distilled water for feasibility analysis by machining Inconel 625 alloy in Maglev EDM. The study emphasizes on the effect of both the dielectrics on material removal rate (MRR), tool wear rate (TWR) and surface roughness (Ra) achieved during Maglev EDM operat
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Cerchiara, R. R., H. A. Cook, P. E. Fischione, et al. "Automated Sample Preparation of Low-k Dielectrics for FESEM." In ISTFA 2005. ASM International, 2005. http://dx.doi.org/10.31399/asm.cp.istfa2005p0231.

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Abstract The SiLK resins, composed of aromatic hydrocarbons, are a family of highly cross-linked thermoset polymers with isotropic dielectric properties. Patterning of SiLK for high aspect ratio copper interconnects has depended on reactive ion etching with oxygen/nitrogen gas mixtures. Reactive ion etching is therefore also accomplished with reducing plasmas such as nitrogen/hydrogen. An additional plasma cleaning step can be inserted after the reactive ion etching (RIE) step, so that any residual contamination is removed prior to imaging or final sputter coating. Automated sample preparation
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Shen, Y. L. "Modeling of Thermo-Mechanical Stresses in Copper Interconnect/Low-k Dielectric Systems." In ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/ipack2005-73450.

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Systematic finite element analyses are carried out to model the thermomechanical stresses in on-chip copper interconnect systems. Constitutive behavior of encapsulated copper films, determined by experimentally measuring the stress-temperature response during thermal cycling, is used in the model for predicting stresses in copper interconnect/low-k dielectric structures. Various combinations of oxide and polymer-based low-k dielectric schemes are considered. The evolution of stresses and deformation pattern in the dual-damascene copper, barrier layers, and the dielectrics is seen to have direc
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Alford, N. M. "Microwave dielectrics." In IEE Colloquium on Electro-Technical Ceramics - Processing, Properties and Applications. IEE, 1997. http://dx.doi.org/10.1049/ic:19971054.

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Wu, Ernest Y., and Jordi Sune. "Recent advances in dielectric breakdown of modern gate dielectrics." In 2013 IEEE International Integrated Reliability Workshop (IIRW). IEEE, 2013. http://dx.doi.org/10.1109/iirw.2013.6804141.

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Shin, SangHoon, Yen-Pu Chen, Woojin Ahn, et al. "High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics." In 2018 IEEE International Reliability Physics Symposium (IRPS). IEEE, 2018. http://dx.doi.org/10.1109/irps.2018.8353669.

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Xu, Hairu, Yewen Zhang, and Feihu Zheng. "Study on measuring method of dielectric spectroscopy for polymer dielectrics." In 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials (ICPADM). IEEE, 2009. http://dx.doi.org/10.1109/icpadm.2009.5252247.

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Prosandeev, S. "Dielectric Response in Microscopically Heterogeneous Dielectrics: Example of KTaO3:Nb." In FUNDAMENTAL PHYSICS OF FERROELECTRICS 2002. AIP, 2002. http://dx.doi.org/10.1063/1.1499565.

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Reports on the topic "Dielectrics"

1

van Dover, Robert Bruce. Complex Amorphous Dielectrics. Office of Scientific and Technical Information (OSTI), 2014. http://dx.doi.org/10.2172/1164295.

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Lohrmann, Dieter R., David Ma, and David Wu. On Energy Density in Dielectrics. Defense Technical Information Center, 1998. http://dx.doi.org/10.21236/ada351834.

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Ren, F., C. R. Abernathy, and J. D. MacKenzie. Dielectrics for GaN based MIS-diodes. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/634115.

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Cooke, Chathan M. Space-Charge-Induced Breakdown in Dielectrics. Defense Technical Information Center, 1986. http://dx.doi.org/10.21236/ada176969.

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Tuttle, B. A., J. A. Voigt, D. L. Sipola, W. R. Olson, and D. M. Goy. Chemically prepared lead magnesium niobate dielectrics. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/666017.

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Lawless, W. N. Research on High-Specific-Heat Dielectrics. Defense Technical Information Center, 1990. http://dx.doi.org/10.21236/ada221215.

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Bacon, Larry Donald. Calculations of precursor propagation in dispersive dielectrics. Office of Scientific and Technical Information (OSTI), 2003. http://dx.doi.org/10.2172/918350.

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Skvarenina, T. L. An Introduction to Electrical Breakdown in Dielectrics. Defense Technical Information Center, 1985. http://dx.doi.org/10.21236/ada156465.

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Wu, Richard L., and Kevin R. Bray. High Energy Density Dielectrics for Pulsed Power Applications. Defense Technical Information Center, 2008. http://dx.doi.org/10.21236/ada494790.

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Williamson, Kenneth, Sean Simpson, Rebecca Coats, Roy Jorgenson, Harold Hjalmarson, and Michael Pasik. High-voltage atmospheric breakdown across intervening rutile dielectrics. Office of Scientific and Technical Information (OSTI), 2013. http://dx.doi.org/10.2172/1096248.

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