Academic literature on the topic 'Dielectrics. Electric insulators and insulation'
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Journal articles on the topic "Dielectrics. Electric insulators and insulation"
Xia, Rong. "Characteristic Analysis and Measurement of Dielectric Loss in Non-Linear Insulating Materials." Advanced Materials Research 986-987 (July 2014): 1471–76. http://dx.doi.org/10.4028/www.scientific.net/amr.986-987.1471.
Full textLiu, Yong, and Xingwang Huang. "Effects of Flash Sintering Parameters on Performance of Ceramic Insulator." Energies 14, no. 4 (February 22, 2021): 1157. http://dx.doi.org/10.3390/en14041157.
Full textGavrilă, Doina Elena, and Horia Catalin Gavrilă. "Dielectric Properties of the Composite Insulator Mica Epoxy-Novolac." Advanced Materials Research 701 (May 2013): 47–52. http://dx.doi.org/10.4028/www.scientific.net/amr.701.47.
Full textSiagian, Marganda Harliman, T. Haryono, and Bambang Sugiyantoro. "Testing of Several Paper Types as Insulators for Electric Power Systems." IJITEE (International Journal of Information Technology and Electrical Engineering) 2, no. 3 (March 27, 2019): 91. http://dx.doi.org/10.22146/ijitee.43818.
Full textHadi, Nabipour Afrouzi, Zulkurnain Abdul-Malek, Saeed Vahabi Mashak, and A. R. Naderipour. "Three-Dimensional Potential and Electric Field Distributions in HV Cable Insulation Containing Multiple Cavities." Advanced Materials Research 845 (December 2013): 372–77. http://dx.doi.org/10.4028/www.scientific.net/amr.845.372.
Full textAli, Muhammad, and Muhammad Ahmad Choudhry. "Preparation and characterization of EPDM-silica nano/micro composites for high voltage insulation applications." Materials Science-Poland 33, no. 1 (March 1, 2015): 213–19. http://dx.doi.org/10.1515/msp-2015-0002.
Full textMarín-Genescà, Marc, Jordi García-Amorós, Ramon Mujal-Rosas, Lluís Massagués Vidal, and Xavier Colom Fajula. "Application Properties Analysis as a Dielectric Capacitor of End-of-Life Tire-Reinforced HDPE." Polymers 12, no. 11 (November 12, 2020): 2675. http://dx.doi.org/10.3390/polym12112675.
Full textJurado, Washington Colón Castillo, Antonio Vázquez Pérez Pérez, Alcira Magdalena Vélez Quiroz, and María Rodríguez Gámez. "Environmental Impact On Electrical Networks Near The Manabita Litoral." International Journal of Life Sciences (IJLS) 1, no. 2 (August 10, 2017): 18. http://dx.doi.org/10.21744/ijls.v1i2.30.
Full textDouar, Mohammed Adnane, Abderrahmane Beroual, and Xavier Souche. "Ignition and advancement of surface discharges at atmospheric air under positive lightning impulse voltage depending on perpendicular electric stress and solid dielectrics: modelling of the propagating phenomenology." European Physical Journal Applied Physics 82, no. 2 (May 2018): 20801. http://dx.doi.org/10.1051/epjap/2018180074.
Full textThabet, Ahmed, Youssef Mobarak, Nourhan Salem, and A. M. El-noby. "Performance comparison of selection nanoparticles for insulation of three core belted power cables." International Journal of Electrical and Computer Engineering (IJECE) 10, no. 3 (June 1, 2020): 2779. http://dx.doi.org/10.11591/ijece.v10i3.pp2779-2786.
Full textDissertations / Theses on the topic "Dielectrics. Electric insulators and insulation"
Grove, Nicole R. "Characterization of functionalized polynorbornenes as interlevel dielectrics." Diss., Georgia Institute of Technology, 1997. http://hdl.handle.net/1853/11204.
Full textRux, Lorelynn Mary. "The physical phenomena associated with stator winding insulation condition as detected by the ramped direct high-voltage method." Master's thesis, Mississippi State : Mississippi State University, 2004. http://library.msstate.edu/etd/show.asp?etd=etd-04042004-112949.
Full textBlanco, Agnes M. Padovani. "Low dielectric constant porous spin-on glass for microelectronic applications." Diss., Georgia Institute of Technology, 2002. http://hdl.handle.net/1853/11840.
Full textLiu, Xin. "Partial discharge detection and analysis in low pressure environments." Columbus, Ohio : Ohio State University, 2006. http://rave.ohiolink.edu/etdc/view?acc%5Fnum=osu1155573657.
Full textShrestha, Prakash. "Study of the dielectric degradation of XLPE and EPR power cables by switching impulses." Master's thesis, Mississippi State : Mississippi State University, 2008. http://library.msstate.edu/etd/show.asp?etd=etd-08212008-151448.
Full textAboutorabi, Seyed Sadreddin. "Étude des conditions critiques de la propagation de l'arc sur les isolateurs recouverts de glace = Study of critical conditions of arc propagation on ice-covered insulators /." Thèse, Chicoutimi : Université du Québec à Chicoutimi, 2003. http://theses.uqac.ca.
Full textLee, Ethan S. "Dielectric reliability in GaN metal-insulator-semiconductor high electron mobility transistors." Thesis, Massachusetts Institute of Technology, 2018. http://hdl.handle.net/1721.1/120368.
Full textThis electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.
Cataloged from student-submitted PDF version of thesis.
Includes bibliographical references (pages 73-74).
GaN Metal Insulator Semiconductor High Electron Mobility Transistors (GaN MIS-HEMTs) show excellent promise as high voltage power transistors that can operate efficiently at high temperatures and frequencies. However, current GaN technology faces several obstacles, one of which is Time-Dependent Dielectric Breakdown (TDDB) of the gate dielectric. Under prolonged electrical stress, the gate dielectric suffers a catastrophic breakdown that renders the transistor useless. Understanding the physics behind gate dielectric breakdown and accurately estimating the average time to failure of the dielectric are of critical importance. TDDB is conventionally studied under DC conditions. However, as actual device operation in power circuits involves rapid switching between on and off states, it is important to determine if estimations done from DC stress results are accurate. Due to the rich dynamics of the GaN MIS-HEMT system such as electron trapping and carrier accumulation at the dielectric/AlGaN interface, unaccounted physics might be introduced under AC stress that may cause error in DC estimation. To this end, we characterize TDDB behavior of GaN MIS-HEMTs at both DC stress conditions and more accurate AC stress conditions. We find that TDDB behavior is improved for AC stress compared to DC stress conditions at high stress frequencies. At 100 kHz, the average dielectric breakdown time is twice the average dielectric breakdown time under DC stress conditions. Furthermore, the impact of tensile mechanical stress on TDDB under DC stress is investigated. This is an important concern because of the piezoelectric nature of GaN and the substantial lattice mismatch between Si, GaN and AlGaN that results in high mechanical strain in the active portion of the device. If mechanical stress significantly impacts TDDB, designers will have to work with further constraints to ensure minimal stress across the dielectric. To address this, we have carried out measurements of TDDB under [epsilon] = 0.29% tensile strain. We find that TDDB in both the On-state and Off-state stress conditions are unaffected by this mechanical stress. Through measurements done in this thesis, we gather further insight towards understanding the physics behind TDDB. Through AC stress we find that the dynamics of the GaN MIS-HEMTs prolong dielectric breakdown times. Through mechanical stress we find that modulation of the 2-Dimensional Electron Gas and dielectric bond straining have minimal impact on TDDB.
by Ethan S. Lee.
S.M.
Ribeiro, Júnior Sebastião. "Desenvolvimento de metodologia para análise de arborescências em materiais dielétricos por contraste de fase de raios X." Universidade Tecnológica Federal do Paraná, 2013. http://repositorio.utfpr.edu.br/jspui/handle/1/690.
Full textThe water tree or electrical tree occurrence is identified as the main phenomena in the degradation in solid isolations of the electric energy distribution cables. The water tree evolution can lead to dielectric breakdown of the isolation layer and, consequently, to the failure this equipment and the interruption of the electric energy supply. The understanding this phenomenon is necessary for the development analysis methods and to prevent collapse in the polymeric insulation. This work demonstrates the application of X-ray phase contrast technique as a methodology for the study of the water tree and electrical tree in Ethylene propylene rubber (EPR) and crosslinked polyethylene (XLPE).
Warnock, Shireen M. "Dielectric reliability in high-voltage GaN metal-insulator-semiconductor high electron mobility transistors." Thesis, Massachusetts Institute of Technology, 2017. http://hdl.handle.net/1721.1/112032.
Full textCataloged from PDF version of thesis.
Includes bibliographical references.
As the demand for more energy-efficient electronics increases, GaN has emerged as a promising transistor material candidate for high-voltage power management applications. The AlGaN/GaN Metal-Insulator-Semiconductor High Electron Mobility Transistor (MIS-HEMT) constitutes the most suitable device structure for this application as it offers lower gate leakage than its HEMT counterpart. GaN has excellent material properties, but there are still many challenges to overcome before its widespread commercial deployment. Time-dependent dielectric breakdown (TDDB), a catastrophic condition arising after prolonged high-voltage gate stress, is a particularly important concern. This thesis investigates this crucial reliability issue in depth. Using a robust characterization strategy, we have studied not only the dielectric breakdown behavior in GaN MIS-HEMTs but also the evolution of the device subthreshold characteristics in the face of high bias stress. This allows us to work towards understanding on a more physical level the underlying degradation behind dielectric breakdown in order to inform future device lifetime models. We begin by looking at positive gate stress TDDB, a classic condition studied in the silicon CMOS community for many years. In order to understand the impact of TDDB, we must also understand how transient degradation effects such as threshold voltage (VT) shift may impact our results and ensure we can disentangle the permanent degradation associated with TDDB. With the foundational understanding of TDDB we establish under these positive gate stress conditions, we turn our attention to OFF-state stress which is a more relevant stress condition that mimics the most common state of these GaN power switching transistors in power management circuits. In order to develop accurate lifetime models for GaN MIS-HEMTs, we show that much care must be taken to ensure that device lifetime does not become distorted by transient trapping-related degradation effects. It is also crucial to have a physics-based lifetime model that gives confidence in making lifetime projections from data collected in the span of hours to lifetime estimations on the order of many years.
by Shireen Warnock.
Ph. D.
Tsuchiya, Kenji, Hitoshi Okubo, Tsugunari Ishida, Hidenori Kato, and Katsumi Kato. "Influence of Surface Charges on Impulse Flashover Characteristics of Alumina Dielectrics in Vacuum." IEEE, 2009. http://hdl.handle.net/2237/14600.
Full textBooks on the topic "Dielectrics. Electric insulators and insulation"
1951-, Al-Arainy A. A., and Qureshi Mohammad Iqbal 1947-, eds. Electrical insulation in power systems. New York: Marcel Dekker, 1997.
Find full textMalik, N. H. Electrical insulation in power systems. New York: Marcel Dekker, 1998.
Find full text(1888), Denki Gakkai, IEEE Dielectrics and Electrical Insulation Society., and Asian International Conference on Dielectrics and Electrical Insulation (2nd : 1998 : Toyohashi-shi, Japan), eds. Proceedings of 1998 International Symposium on Electrical Insulating Materials: 1998 Asian International Conference on Dielectrics and Electrical Insulation : 30th Symposium on Electrical Insulating Materials : September 27-30, 1998, Holiday Inn Crowne Plaza Toyohashi, Toyohashi, Japan. Tokyo: Institute of Electrical Engineers of Japan, 1998.
Find full textInternational Conference on Dielectric Materials, Measurements, and Applications (7th 1996 University of Bath). Seventh International Conference on Dielectric Materials, Measurements, and Applications, 23-26 September 1996, venue, University of Bath, UK. London: The Institution, 1996.
Find full textInternational, Conference on Properties and Applications of Dielectric Materials (2nd 1988 Beijing China). Proceedings: Second International Conference on Properties and Applications of Dielectric Materials, Beijing, China, September 12-16, 1988. Beijing, China: Tsinghua University Press, 1988.
Find full textInternational Conference on Properties and Applications of Dielectric Materials (2nd 1988 Beijing, China). Proceedings: Second International Conference on Properties and Applications of Dielectric Materials, Beijing, China, September 12-16, 1988. New York, NY (345 E. 47th St., New York 10017): Institute of Electrical and Electronics Engineers, Inc., 1988.
Find full textInternational Conference on Dielectric Materials, Measurements, and Applications (7th 1996 University of Bath). Seventh International Conference on Dielectric Materials, Measurements and Applications, 23-26 September 1996: Venue, University of Bath, UK. London: Institution of Electrical Engineers, 1996.
Find full textInternational Conference on Dielectric Materials, Measurements, and Applications (6th 1992 Manchester, England). Sixth International Conference on Dielectric Materials, Measurements, and Applications, 7-10 September 1992, venue, University of Manchester Institute of Science and Technology Conference Center, Manchester, UK. London: The Institution, 1992.
Find full textInternational Conference on Properties and Applications of Dielectric Materials (1st 1985 Sian, China). Conference record of the 1985 International Conference on Properties and Applications of Dielectric Materials, Shaanxi Guesthouse, Xian, China, June 24-29, 1985. Xi'an, China: Xi'an Jiaotong University Press, 1985.
Find full textInternational Conference on Dielectric Materials, Measurements, and Applications (8th 2000 Heriot-Watt University). Eighth International Conference on Dielectric Materials, Measurements and Applications, 17-21 September 2000: Venue, Heriot Watt University, Edinburgh, UK. London: Institution of Electrical Engineers, 2000.
Find full textBook chapters on the topic "Dielectrics. Electric insulators and insulation"
Mahajan, S. M., and K. W. Lam. "Contribution of a Solid Insulator to an Electron Avalanche in Nitrogen Gas." In Gaseous Dielectrics VI, 297–303. Boston, MA: Springer US, 1991. http://dx.doi.org/10.1007/978-1-4615-3706-9_37.
Full textVilla, A., L. Barbieri, and R. Malgesini. "Insulator Diagnostics Through a Dielectric E-Field Sensor." In Lecture Notes in Electrical Engineering, 429–36. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-31676-1_41.
Full textHoussa, M., P. W. Mertens, M. M. Heyns, and A. Stesmans. "Electrical Properties of Metal-Insulator-Semiconductor Devices with High Permittivity Gate Dielectric Layers." In Supermaterials, 1–20. Dordrecht: Springer Netherlands, 2000. http://dx.doi.org/10.1007/978-94-010-0912-6_1.
Full textEkpunobi, Uchenna, Christopher Ihueze, Philomena Igbokwe, Azubike Ekpunobi, Happiness Obiora-Ilouno, Chijioke Onu, Sunday Agbo, et al. "Production of Electrical Porcelain Insulators from Local Raw Materials: A Review." In Clay and Clay Minerals [Working Title]. IntechOpen, 2021. http://dx.doi.org/10.5772/intechopen.98902.
Full textNewnham, Robert E. "Dielectric constant." In Properties of Materials. Oxford University Press, 2004. http://dx.doi.org/10.1093/oso/9780198520757.003.0011.
Full text"Solid Dielectrics, their Sources, Properties, and Behavior in Electric Fields." In High Voltage and Electrical Insulation Engineering, 319–70. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2011. http://dx.doi.org/10.1002/9780470947906.ch7.
Full textBunker, Bruce C., and William H. Casey. "Glass Dissolution and Leaching." In The Aqueous Chemistry of Oxides. Oxford University Press, 2016. http://dx.doi.org/10.1093/oso/9780199384259.003.0023.
Full textCantor, Brian. "The Fermi Level." In The Equations of Materials, 267–300. Oxford University Press, 2020. http://dx.doi.org/10.1093/oso/9780198851875.003.0013.
Full textJolivet, Jean-Pierre. "Nanomaterials: Specificities of Properties and Synthesis." In Metal Oxide Nanostructures Chemistry. Oxford University Press, 2019. http://dx.doi.org/10.1093/oso/9780190928117.003.0004.
Full textConference papers on the topic "Dielectrics. Electric insulators and insulation"
Da Silva, E., and S. M. Rowland. "In-Service Surface Degradation of MV Composite Insulators under Severe Environmental Conditions and Low Electric Stress." In 2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP). IEEE, 2008. http://dx.doi.org/10.1109/ceidp.2008.4772828.
Full textCao, Wen, Hao Xue, Yan Du, Hao Yang, Long Zhao, Xiaoxue Guo, Yang Wang, Wei Shen, Zengpeng Lv, and Wen Cao. "Study on the Law of Water Drop Movement on the Surface of Insulators under AC and DC Electric Field." In 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP). IEEE, 2019. http://dx.doi.org/10.1109/ceidp47102.2019.9009765.
Full textCampbell, A. N., D. M. Tanner, J. M. Soden, D. K. Stewart, A. Doyle, E. Adams, M. Gibson, and M. Abramo. "Electrical and Chemical Characterization of FIB-Deposited Insulators." In ISTFA 1997. ASM International, 1997. http://dx.doi.org/10.31399/asm.cp.istfa1997p0223.
Full textMunoz-Hernandez, Andres, and Gerardo Diaz. "Dielectric Breakdown Process for Biomass Gasification." In ASME 2014 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2014. http://dx.doi.org/10.1115/imece2014-36402.
Full textOno, M., T. Ishihara, and A. Nishiyama. "Dependence of electron mobility by remote coulomb scattering on dielectric constant distribution in stacked gate dielectrics." In Extended Abstracts of International Workshop on Gate Insulator. IEEE, 2003. http://dx.doi.org/10.1109/iwgi.2003.159205.
Full textBhattacharjee, Biddut, and Homayoun Najjaran. "Effects of the Properties of Dielectric Materials on the Fabrication and Operation of Digital Microfluidic Systems." In ASME 2010 International Mechanical Engineering Congress and Exposition. ASMEDC, 2010. http://dx.doi.org/10.1115/imece2010-39512.
Full textMei, Hongwei, Yingke Mao, Liming Wang, Jianchao Zheng, and Zhicheng Guan. "Influence of sugar in contaminant to outdoor insulation characteristics of glass insulator." In 2009 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP). IEEE, 2009. http://dx.doi.org/10.1109/ceidp.2009.5377760.
Full textSubba Reddy, B., B. Satish Naik, Udaya Kumar, and L. Satish. "Potential and electric field distribution in a ceramic disc insulator string with faulty insulators." In 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials (ICPADM). IEEE, 2012. http://dx.doi.org/10.1109/icpadm.2012.6318928.
Full textBirmpiliotis, D., M. Koutsoureli, L. Buhagier, G. Papaioannou, and A. Ziaei. "Mitigation of Dielectric Charging in MEMS Capacitive Switches with Stacked TiO2/Y2O3 Insulator Film." In ISTFA 2018. ASM International, 2018. http://dx.doi.org/10.31399/asm.cp.istfa2018p0324.
Full textAsheghi, Mehdi. "Nanoscale Heat Conduction in the SOI, Strained-Si and Tri-Gate Transistors." In ASME 2004 3rd Integrated Nanosystems Conference. ASMEDC, 2004. http://dx.doi.org/10.1115/nano2004-46050.
Full textReports on the topic "Dielectrics. Electric insulators and insulation"
Eager, G. S. Jr, G. W. Seman, and B. Fryszczyn. Determination of threshold and maximum operating electric stresses for selected high voltage insulations: Investigation of aged polymeric dielectric cable. Final report. Office of Scientific and Technical Information (OSTI), November 1995. http://dx.doi.org/10.2172/212744.
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