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Journal articles on the topic 'Diffraction des Rayons X synchrotron'

Author: Grafiati

Published: 25 May 2024

Last updated: 31 July 2025

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1

Ravy, Sylvain. "La diffraction cohérente des rayons X." Reflets de la physique, no. 34-35 (June 2013): 60–64. http://dx.doi.org/10.1051/refdp/201334060.

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2

Popescu, M., F. Sava, A. Lörinczi, I. N. Mihailescu, I. Cojocaru, and G. Mihailova. "Diffraction de rayons X sur le silicium poreux." Le Journal de Physique IV 08, PR5 (1998): Pr5–31—Pr5–37. http://dx.doi.org/10.1051/jp4:1998505.

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3

Grousson, Mathieu. "Amélie Juhin: tient théorie et expérience dans une seule main." Reflets de la physique, no. 57 (April 2018): 39. http://dx.doi.org/10.1051/refdp/201857039.

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Spécialiste de spectroscopie des rayons X, lauréate de la médaille de bronze du CNRS en 2016, cette physico-chimiste se sent aussi à l’aise auprès d’une ligne de lumière d’un synchrotron qu’avec des équations.

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4

Cox, D. E. "Synchrotron X-Ray Powder Diffraction." MRS Bulletin 12, no. 1 (1987): 16–20. http://dx.doi.org/10.1557/s088376940006869x.

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X-ray powder diffraction is one of the most widely used techniques by scientists engaged in the synthesis, analysis, and characterization of solids. It is estimated that there are now about 25,000 users throughout the world, of which about one third are in the United States. Any single-phase polycrystalline material gives an x-ray pattern which can be regarded as a unique “fingerprint,” and modern automated search-and-match techniques used in conjunction with the Powder Diffraction File (maintained by the International Center for Diffraction Data, Swarthmore, PA) allow routine analysis of samp

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5

Bonod, Nicolas. "Physicien célèbre : Max von Laue." Photoniques, no. 98 (September 2019): 18–19. http://dx.doi.org/10.1051/photon/20199818.

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Max von Laue est un physicien théoricien allemand spécialiste de la diffraction des ondes, de la relativité et de la superconductivité. Il propose en 1912 de sonder l’arrangement périodique de la matière avec des faisceaux de courtes longueurs d’onde, les rayons X ; et sera récompensé par le prix Nobel de Physique en 1914. La découverte de la diffraction des rayons X par des cristaux sera à l’origine d’avancées majeures dans les 100 ans qui suivirent, de la découverte de la structure de l’ADN à celle des quasi-cristaux.

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6

Bach, M., N. Broll, A. Cornet, and L. Gaide. "Diffraction X en traitements thermiques : dosage de l'austénite résiduelle par diffraction des rayons X." Le Journal de Physique IV 06, no. C4 (1996): C4–887—C4–895. http://dx.doi.org/10.1051/jp4:1996485.

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7

Bourret, A. "Étude des interfaces enterrées par diffraction de rayons X." Le Journal de Physique IV 07, no. C6 (1997): C6–19—C6–29. http://dx.doi.org/10.1051/jp4:1997602.

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8

Abbas, S., A. Raho, and M. Kadi-Hanifi. "Caractérisation de solutions solides par diffraction des rayons X." Le Journal de Physique IV 10, PR10 (2000): Pr10–49—Pr10–54. http://dx.doi.org/10.1051/jp4:20001006.

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9

Kadi-Hanifi, M., H. Yousfi, and A. Raho. "Caractérisation de solutions solides par diffraction des rayons X." Revue de Métallurgie 90, no. 9 (1993): 1116. http://dx.doi.org/10.1051/metal/199390091116.

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10

Sutton, S. R., M. L. Rivers, and J. V. Smith. "Synchrotron x-ray fluorescence: diffraction interference." Analytical Chemistry 58, no. 11 (1986): 2167–71. http://dx.doi.org/10.1021/ac00124a013.

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11

Baruchel, José, Armelle Philip, and Paul Tafforeau. "Nouvelles applications de l’imagerie aux rayons X en utilisant le rayonnement synchrotron." Reflets de la physique, no. 34-35 (June 2013): 32–37. http://dx.doi.org/10.1051/refdp/201334032.

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12

Brunel, M., and F. de Bergevin. "Diffraction d'un faisceau de rayons X en incidence très rasante." Acta Crystallographica Section A Foundations of Crystallography 42, no. 5 (1986): 299–303. http://dx.doi.org/10.1107/s010876738609921x.

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13

Kahloun, C., K. F. Badawi, and A. Diou. "Incertitude sur l'analyse des contraintes par diffraction des rayons X." Revue de Physique Appliquée 25, no. 12 (1990): 1225–38. http://dx.doi.org/10.1051/rphysap:0199000250120122500.

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14

Bulteel, D., E. Garcia-Diaz, J. Durr, L. Khouchaf, C. Vernet, and J. M. Siwak. "Étude d'un granulat alcali-réactif par diffraction des rayons X." Le Journal de Physique IV 10, PR10 (2000): Pr10–513—Pr10–520. http://dx.doi.org/10.1051/jp4:20001055.

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15

Louër, D. "Microstructure et profil des raies de diffraction des rayons X." Journal de Physique IV (Proceedings) 103 (February 2003): 321–37. http://dx.doi.org/10.1051/jp4:200300013.

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16

Gablot, Ginette. "Yvette Cauchois (1908-1999) : pionnière et visionnaire de la spectrométrie des rayons X au rayonnement synchrotron." Reflets de la physique, no. 81 (June 2025): 39–41. https://doi.org/10.1051/refdp/202581039.

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Yvette Cauchois est une des physiciennes les plus importantes du 20e siècle. Dès son premier travail de recherche avec le spectrographe éponyme elle n’a cessé d’élargir le champ de la spectrographie X. Ses nombreuses publications, ainsi que celles de ses collaborateurs, ont contribué à la compréhension des niveaux d’énergie des atomes, en particulier pour la matière condensée. Au début des années 1960, elle a aussi organisé les premières démonstrations de l’intérêt potentiel du rayonnement synchrotron avec des expériences réalisées sous sa direction sur le synchrotron à électrons de Frascati (

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17

Riekel, C. "Microfocus diffraction with X-ray synchrotron radiation." Acta Crystallographica Section A Foundations of Crystallography 60, a1 (2004): s2. http://dx.doi.org/10.1107/s0108767304099969.

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18

Hall, C., P. Barnes, J. K. Cockcroft, et al. "Synchrotron energy-dispersive X-ray diffraction tomography." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 140, no. 1-2 (1998): 253–57. http://dx.doi.org/10.1016/s0168-583x(97)00994-4.

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19

Barroso, R. C., R. T. Lopes, E. F. O. de Jesus, and L. F. Oliveira. "X-ray diffraction microtomography using synchrotron radiation." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 471, no. 1-2 (2001): 75–79. http://dx.doi.org/10.1016/s0168-9002(01)00918-4.

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20

Maehlen, J. P., V. A. Yartys, A. B. Riabov, A. Budziak, H. Figiel, and J. Żukrowski. "Synchrotron X-ray diffraction study of ErMn2D2." Journal of Alloys and Compounds 437, no. 1-2 (2007): 140–45. http://dx.doi.org/10.1016/j.jallcom.2006.07.088.

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21

Parrish, William. "Advances in Synchrotron X-ray Polycrystalline Diffraction." Australian Journal of Physics 41, no. 2 (1988): 101. http://dx.doi.org/10.1071/ph880101.

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The advantages of synchrotron radiation for X-ray polycrystalline diffraction are illustrated by a number of examples. The plane wave parallel-beam X-ray optics uses a Si(lll) channel monochromator for easy wavelength selection and a set of long parallel slits to define the diffracted beam. The constant simple instrument function and the high resolution symmetrical profiles (FWHM 0.05") greatly simplify the data analysis and add a new dimension to profile broadening studies. The geometry permits uncoupling the 6-26 sample-detector relationship without changing the profile shape and makes possi

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22

KOBAYASHI, MASAMICHI. "X-rey Diffraction: Dynamics Studied by Time-resolved Synchrotron X-ray Diffraction." Sen'i Gakkaishi 49, no. 4 (1993): P130—P134. http://dx.doi.org/10.2115/fiber.49.4_p130.

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23

Bergmann, Uwe, Rafaella Georgiou, Pierre Gueriau, Jean-Pascal Rueff, and Loïc Bertrand. "Nouvelles spectroscopies Raman X du carbone pour les matériaux anciens." Reflets de la physique, no. 63 (October 2019): 22–25. http://dx.doi.org/10.1051/refdp/201963022.

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L’identification des composés à base de carbone, bien que difficile, est une source d’information essentielle dans de nombreuses études archéologiques et paléontologiques. La diffusion Raman de rayons X est une méthode de spectroscopie sur synchrotron qui permet d’identifier des signatures organiques, de retracer l’origine chimique des systèmes étudiés et de comprendre l’altération des composés organiques dans le temps. Cette technique, conduite de manière non destructive, dans l’air, avec une sensibilité en profondeur afin de fournir des informations non compromises par la contamination super

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24

Fitch, Andrew N. "Applications of High-Resolution Powder X-Ray Diffraction." Solid State Phenomena 130 (December 2007): 7–14. http://dx.doi.org/10.4028/www.scientific.net/ssp.130.7.

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The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

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25

de Vries, J. L. "Historique de la diffraction et de la fluorescence des rayons X." Le Journal de Physique IV 06, no. C4 (1996): C4–695—C4–701. http://dx.doi.org/10.1051/jp4:1996467.

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26

Edhokkar, Fadhila, Ahmed Hadrich, Mohsen Graia, and Tahar Mhiri. "Ba1.01Sr0.99P2O7: un nouveau site Ba2+révélé par diffraction des rayons X." Acta Crystallographica Section C Crystal Structure Communications 68, no. 12 (2012): i86—i88. http://dx.doi.org/10.1107/s0108270112047002.

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Single crystals of barium strontium diphosphate, Ba1.01Sr0.99P2O7, were prepared by a solid-state reaction. The compound is isostructural with α-Ba2P2O7, α-Sr2P2O7and BaPbP2O7. The structure has only one diphosphate group of the dichromate type that is repeated by symmetry to form sheets. These sheets present mirror planes perpendicular to theaaxis, situated atx= {1 \over 4} and {3 \over 4}. All the cations and three of the five independent O atoms are located on these mirror planes. The Ba2+cations are nine-coordinated by O atoms. The Ba2+and Sr2+cations are distributed on three different sit

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27

Peng, Hong Yu, Ze Yu Chen, Ya Fei Liu, et al. "Dislocation Contrast Analysis in Weak Beam Synchrotron X-Ray Topography." Materials Science Forum 1062 (May 31, 2022): 356–60. http://dx.doi.org/10.4028/p-u7m9jr.

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Synchrotron monochromatic beam X-ray topography has been widely applied to characterize structural defects in SiC crystals. Using ray tracing simulations, the dislocation contrast in X-ray topography under strong diffraction conditions (diffraction takes place at or near Bragg angle) has been intensively investigated. However, the contrast and the configurations of the dislocation images recorded under weak diffraction conditions have not been fully investigated. Recently, we demonstrated that the contrast of dislocations in synchrotron grazing incidence topography under weak diffraction condi

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28

ITO, Masahisa. "Synchrotron Radiation. III. Measurement by Synchrotron Radiation. 9. X-Ray Magnetic Diffraction." RADIOISOTOPES 47, no. 5 (1998): 435–45. http://dx.doi.org/10.3769/radioisotopes.47.435.

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29

Parrish, W., M. Hart, C. G. Erickson, N. Masciocchi, and T. C. Huang. "Instrumentation for Synchrotron X-Ray Powder Diffractometry." Advances in X-ray Analysis 29 (1985): 243–50. http://dx.doi.org/10.1154/s0376030800010326.

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AbstractThe instrumentation developed for poly crystalline diffractometry using the storage ring at the Stanford Synchrotron Radiation Laboratory is described. A pair of automated vertical scan diffractometers was used for a Si (111) channel monochromator and the powder specimens. The parallel beam powder diffraction was defined by horizontal parallel slits which had several times higher intensity than a receiving slit at the same resolution. The patterns were obtained with 2:1 scanning with’ a selected monochromatic beam, and an energy dispersive diffraction method in which the monochromator

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30

Chen, Liu Ran, Xi Chen, Ji Cai Liang та Ji Dong Zhang. "Analysis the Actual Nanostructure of α Phase Polyoctylfluorene Thin Film via Synchrotron Grazing-Incidence X-Ray Diffraction". Applied Mechanics and Materials 333-335 (липень 2013): 1832–35. http://dx.doi.org/10.4028/www.scientific.net/amm.333-335.1832.

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The nanostructure of α phase polyoctylfluorene thin film was characterized using normal X-ray diffraction, one-dimensional out-of-plane grazing incidence X-ray diffraction and two-dimensional grazing incidence X-ray diffraction with lab diffractometer and synchrotron diffractometer. The results show that using grazing incidence X-ray diffraction the weak diffraction signal of thin film can be observed after the elimination of background signals. Incorrect (h10) diffraction signals can be collected by lab diffractometer due to its low collimation and resolution, which can be overcome by using s

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31

Gu, Qinfen, Helen Brand, and Justin Kimpton. "Battery research using synchrotron powder X-ray diffraction." Acta Crystallographica Section A Foundations and Advances 70, a1 (2014): C951. http://dx.doi.org/10.1107/s2053273314090482.

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Research and development of rechargeable batteries is critical to meet the worldwide demand for clean and sustainable energy collection and storage. A vital part of this research is to get clear understanding of how the crystal structures of electrode materials affect the the resulting properties of the batteries. As structural changes in both the anode and cathode materials play an important role in overall battery performance, synchrotron powder X-ray diffraction (PXRD), with high beam flux and resolution, is an extremely useful tool for studying the battery both in-situ and ex-situ. Several

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32

Lepore, G. O., S. Checchia, T. Baroni, M. Brunelli, and F. d’Acapito. "Outstation for x-ray powder diffraction at the Italian beamline at the European synchrotron." Review of Scientific Instruments 93, no. 11 (2022): 113903. http://dx.doi.org/10.1063/5.0107024.

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LISA [ Linea Italiana per la Spettroscopia di Assorbimento X, Italian beamline for X-ray Absorption Spectroscopy (XAS)] is the Italian CRG ( Collaborating Research Group) beamline at the ESRF ( European Synchrotron Radiation Facility) dedicated to XAS [d’Acapito et al., J. Synchrotron Radiat. 26, 551–558 (2019)]. In this work, a methodical test of the LISA beamline in performing diffraction measurements is carried out. Synchrotron x-ray diffraction measurements would complement absorption spectroscopy techniques with the long-range characterization of the material under investigation, while XA

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33

KAWADO, Seiji. "Historical Development of Synchrotron X-ray Diffraction Topography." Nihon Kessho Gakkaishi 54, no. 1 (2012): 2–11. http://dx.doi.org/10.5940/jcrsj.54.2.

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34

DiMasi, E., and M. Sarikaya. "Synchrotron x-ray microbeam diffraction from abalone shell." Journal of Materials Research 19, no. 5 (2004): 1471–76. http://dx.doi.org/10.1557/jmr.2004.0196.

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Microstructured biomaterials such as mollusk shells receive much attention at present, due to the promise that advanced materials can be designed and synthesized with biomimetic techniques that take advantage of self-assembly and aqueous, ambient processing conditions. A satisfactory understanding of this process requires characterization of the microstructure not only in the mature biomaterial, but at the growth fronts where the control over crystal morphology and orientation is enacted. In this paper, we present synchrotron microbeam x-ray diffraction (XRD) and electron microscopy observatio

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35

Komizo, Y., and H. Terasaki. "In situtime resolved X‐ray diffraction using synchrotron." Science and Technology of Welding and Joining 16, no. 1 (2011): 79–86. http://dx.doi.org/10.1179/136217110x12785889549822.

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36

Dutta, Pulak. "Studies of monolayers using synchrotron X-ray diffraction." Current Opinion in Solid State and Materials Science 2, no. 5 (1997): 557–62. http://dx.doi.org/10.1016/s1359-0286(97)80044-7.

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37

Kamishima, K., T. Noda, F. Kadonome, K. Kakizaki, and N. Hiratsuka. "Synchrotron X-ray diffraction for pyrolytic magnetic carbon." Journal of Magnetism and Magnetic Materials 310, no. 2 (2007): e346-e348. http://dx.doi.org/10.1016/j.jmmm.2006.10.325.

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38

Barroso, R. C., M. J. Anjos, R. T. Lopes, et al. "Matrix characterization using synchrotron radiation X-ray diffraction." Radiation Physics and Chemistry 61, no. 3-6 (2001): 739–41. http://dx.doi.org/10.1016/s0969-806x(01)00392-9.

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39

Cernik, R. J., and P. Barnes. "Industrial aspects of synchrotron X-ray powder diffraction." Radiation Physics and Chemistry 45, no. 3 (1995): 445–57. http://dx.doi.org/10.1016/0969-806x(94)00147-c.

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40

Sosnowska, I. M., and M. Shiojiri. "Oxides: neutron and synchrotron X-ray diffraction studies." Journal of Electron Microscopy 48, no. 6 (1999): 681–87. http://dx.doi.org/10.1093/oxfordjournals.jmicro.a023736.

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41

Carpentier, P., C. Berthet-Colominas, M. Capitan, et al. "Anomalous Diffraction with Soft X-ray Synchrotron Radiation." Acta Crystallographica Section A Foundations of Crystallography 56, s1 (2000): s61. http://dx.doi.org/10.1107/s0108767300022054.

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42

Quantock, Andrew J., Keith M. Meek, Eugene J.-M. A. Thonar, and Kerry K. Assil. "Synchrotron X-ray diffraction in atypical macular dystrophy." Eye 7, no. 6 (1993): 779–84. http://dx.doi.org/10.1038/eye.1993.183.

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43

Katsumata, Koichi, Akiko Kikkawa, Yoshikazu Tanaka, Susumu Shimomura, Shuji Ebisu та Shoichi Nagata. "Synchrotron X-ray Diffraction Studies of α-Gd2S3". Journal of the Physical Society of Japan 74, № 5 (2005): 1598–601. http://dx.doi.org/10.1143/jpsj.74.1598.

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44

Antonio, Selma Gutierrez, Fernanda Ribeiro Benini, Fabio Furlan Ferreira, Paulo César Pires Rosa, and Carlos de Oliveira Paiva-Santos. "Synchrotron X-ray powder diffraction data of atorvastatin." Powder Diffraction 23, no. 4 (2008): 350–55. http://dx.doi.org/10.1154/1.2996511.

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X-ray powder diffraction data collected in transmission and high-throughput geometries were used to analyze form I of atorvastatin. The X-ray wavelength of the synchrotron radiation used in this study was determined to be λ=1.3771 Å. Form I of atorvastatin was found to be triclinic with space group P1 and unit cell parameters a=5.4568(2) Å, b=9.8887(4) Å, c=30.3091(9) Å, α=76.801(3)°, β=99.177(5)°, γ=105.318(5)°, V=1527.1(1) Å3, Z=1, and M=1209.41 g mol−1 Alternatively, another unit cell dimension can be used to describe the same P1 crystal with a=5.4564(2) Å, b=9.8883(4) Å, c=29.6555(8) Å, α=

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45

Kingma, Kathleen J., Ho-Kwang Mao, and Russell J. Hemley. "Synchrotron X-ray diffraction of SiO2to multimegabar pressures." High Pressure Research 14, no. 4-6 (1996): 363–74. http://dx.doi.org/10.1080/08957959608201422.

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46

Rieck, Wolfgang, Heinz Schulz, and Monika Siedel. "X-Ray diffraction on microcrystals with synchrotron radiation." Journal of Physics and Chemistry of Solids 52, no. 10 (1991): 1289–91. http://dx.doi.org/10.1016/0022-3697(91)90205-e.

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47

West, D. Vincent, and Peter K. Davies. "Triclinic and monoclinic structures of SrLaCuNbO6and SrLaCuTaO6double perovskites." Journal of Applied Crystallography 44, no. 3 (2011): 595–602. http://dx.doi.org/10.1107/s0021889811012131.

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SrLaCuNbO6and SrLaCuTaO6are Jahn–Teller distorted double perovskites with completeB-site ordering. The crystal structure of SrLaCuTaO6has been solved by refinement of neutron powder diffraction data at 323 (triclinic), 573 (monoclinic) and 923 K (body-centered monoclinic). Synchrotron X-ray and electron diffraction reveal local-scale features similar to those seen in ferroelectric perovskites, and also inA-site ordered perovskites exhibiting nanoscale periodicities. The crystal structure of SrLaCuNbO6was solved by refinement of synchrotron X-ray powder diffraction data at 673 and 1273 K. Becau

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48

Humphries, Terry D., Joshua W. Makepeace, Satoshi Hino, William I. F. David, and Bjørn C. Hauback. "Regeneration of sodium alanate studied by powder in situ neutron and synchrotron X-ray diffraction." J. Mater. Chem. A 2, no. 39 (2014): 16594–600. http://dx.doi.org/10.1039/c4ta02886d.

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49

Tanaka, M. "Development of a new methodology for site distribution determination by powder diffraction with anomalous scattering using focused beam and flat shape sample geometry." Journal of Physics: Conference Series 2380, no. 1 (2022): 012133. http://dx.doi.org/10.1088/1742-6596/2380/1/012133.

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Abstract A new methodology of synchrotron powder diffraction with anomalous scattering for site occupancy determination has been examined. We have been developing a new Synchrotron powder diffraction geometry with focused X-ray beam, flat shape sample and area detectors. As an application of the geometry, a new methodology for site occupancy determination has been tried. The diffraction intensity ratio change against X-ray energy near an absorption edge was observed and was compared with the calculation obtained from various site distribution crystal structure models. The methodology has been

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50

Newsam, J. M., H. E. King, and K. S. Liang. "X-Ray Diffraction Using Synchrotron Radiation - A Catalysis Perspective." Advances in X-ray Analysis 32 (1988): 9–20. http://dx.doi.org/10.1154/s0376030800020231.

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AbstractSynchrotron X-radiation provides unique opportunities for diffraction experiments and, therefore, for extending our understanding of the structure - property interplay in catalyst systems. The present status of opportunities and applications of synchrotron X-ray diffraction techniques in the structural chemistry and catalysis science areas is overviewed, and illustrated by selected recent results.

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