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Journal articles on the topic 'Diffraction Vectors'

Author: Grafiati
Published: 28 May 2022
Last updated: 31 July 2025

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1

Urban, K., Z. Zhang, M. Wollgarten, and D. Gratias. "Diffraction contrast of dislocations in icosahedral quasicrystals." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (1990): 454–55. http://dx.doi.org/10.1017/s0424820100175405.

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Recently dislocations have been observed by electron microscopy in the icosahedral quasicrystalline (IQ) phase of Al65Cu20Fe15. These dislocations exhibit diffraction contrast similar to that known for dislocations in conventional crystals. The contrast becomes extinct for certain diffraction vectors g. In the following the basis of electron diffraction contrast of dislocations in the IQ phase is described. Taking account of the six-dimensional nature of the Burgers vector a “strong” and a “weak” extinction condition are found.Dislocations in quasicrystals canot be described on the basis of si
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2

Fogret, Éric, and Pierre Pellat-Finet. "A Light-Ray Approach to Fractional Fourier Optics." Fractal and Fractional 7, no. 7 (2023): 505. http://dx.doi.org/10.3390/fractalfract7070505.

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A light ray in space is characterized by two vectors: (i) a transverse spatial vector associated with the point where the ray intersects a given spherical cap; (ii) an angular-frequency vector which defines the ray direction of propagation. Given a light ray propagating from a spherical emitter to a spherical receiver, a linear equation is established that links its representative vectors on the emitter and on the receiver. The link is expressed by means of a matrix which is not homogeneous, since it involves both spatial and angular variables (having distinct physical dimensions). Indeed, the
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3

Li, D. Y., and C. W. MacKinnon. "Indexing of incommensurate satellite reflections in X-ray powder diffraction pattern of (Bi, Pb)2Sr2Ca2Cu3Ox (2223) phase." Powder Diffraction 12, no. 3 (1997): 141–44. http://dx.doi.org/10.1017/s088571560000960x.

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X-ray powder diffraction data and refined unit cell parameters for the (Bi, Pb)2Sr2Ca2Cu3Ox (2223) superconducting phase, indexed using incommensurate modulation principles, are reported. Comparison of the results obtained with one- and two-component modulation wave vectors showed that the two-component modulation wave vector is superior for indexing the satellite reflections. A two-component wave vector indexing result seems likely when only the powder diffraction data are considered.
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4

Suryanto. "Dislocation Generated by Electron Irradiation." Advanced Materials Research 418-420 (December 2011): 744–47. http://dx.doi.org/10.4028/www.scientific.net/amr.418-420.744.

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Dislocation loop was generated by electron irradiation in nickel aluminum alloy. It is important to know dislocation characteristics obtained from a high energetic electron irradiation. If b is the Burger vector of a dislocation loop and g is the diffraction vector, dislocation loop will appear larger, smaller or disappear for g.b>0, g.b<0 or g.b=0, respectively. Dislocation loop was determined as follows – first, the appearance of dislocation loops is arranged in observation table. Second, based on type of dislocation loop, Burger vector and diffraction vector, appearance of dislocation
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5

Shikata, Shinichi, and Naoya Akashi. "Dislocation Vector Analysis Method of Deep Dislocation Having C-Axis Segment in Diamond." Materials Science Forum 1004 (July 2020): 519–24. http://dx.doi.org/10.4028/www.scientific.net/msf.1004.519.

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X-ray topography is an effective tool to investigate dislocations in semiconductor crystals. Due to low X-ray absorption coefficients of diamond, X-rays can penetrate deep into the crystal. Thus, deep three-dimensional (3D) dislocations are projected on two-dimension (2D) film, which makes dislocation analysis particularly challenging. Dislocation vectors from the films obtained using a set of the same diffraction vectors were identified using topographical and geometrical analyses. The depth and position of the dislocations in a crystal that was projected on a film were determined using geome
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6

Miyazaki, Toshiyuki, and Toshihiko Sasaki. "A comparison of X-ray stress measurement methods based on the fundamental equation." Journal of Applied Crystallography 49, no. 2 (2016): 426–32. http://dx.doi.org/10.1107/s1600576716000492.

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Stress measurement methods using X-ray diffraction (XRD) methods are based on so-called fundamental equations. The fundamental equation is described in the coordinate system that best suits the measurement situation, and so making a comparison between different XRD methods is not straightforward. However, by using the diffraction vector representation, the fundamental equations of different methods become identical. Furthermore, the differences between the various XRD methods reside in the choice of diffraction vectors and the way of calculating the stress from the measured data. The stress ca
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7

Creuziger, Adam, Thien Phan, and Darren Pagan. "Refinements in phase fraction determination of textured alloys from transmission diffraction data." Journal of Applied Crystallography 54, no. 5 (2021): 1480–89. http://dx.doi.org/10.1107/s1600576721008712.

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The use of high-energy synchrotron X-ray diffraction sources has become increasingly common for high-quality phase fraction measurements and microstructural evolution experiments. While the high flux, large volume illuminated and large number of diffraction vectors should reduce common sources of uncertainty and bias, the distribution of the diffraction vectors may still cause bias in the phase fraction measurement. This hypothesis of bias was investigated with example experimental data and synthetic data. The authors found that there may be bias depending on the sample texture, the distributi
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8

Balić Žunić, Tonči, and Jesper Dohrup. "Use of an ellipsoid model for the determination of average crystallite shape and size in polycrystalline samples." Powder Diffraction 14, no. 3 (1999): 203–7. http://dx.doi.org/10.1017/s0885715600010538.

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A mathematical model for interpreting the anisotropical broadening of the powder diffraction lines by an average crystallite in the form of a triaxial ellipsoid is developed. The model covers satisfactorily a broad range of averaged crystallite shapes in polycrystalline samples of all crystal symmetries and provides simple formulas for use in powder pattern fitting routines. When ra, rb, rc are the principal ellipsoid radii, and ca, cb, cc direction cosines of diffraction vector related to the principal axes of ellipsoid, the average dimension of crystallites along the diffraction vector (Dhkl
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9

Chou, Chen-Chia, and C. Marvin Wayman. "Determination of displacement vector on 180° domain boundary and polarization arrangements in lead titanate crystals." Journal of Materials Research 12, no. 2 (1997): 457–66. http://dx.doi.org/10.1557/jmr.1997.0067.

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180° domain boundaries in flux-grown lead titanate single crystals show intriguing domain boundary extreme fringe contrast using transmission electron microscopy. Symmetrically distributed domain boundaries with alternate contrast have been observed, indicating that opposite displacement vectors exist one by one at boundaries. If appropriate reflection vectors were employed, an inclined domain boundary shows reversed fringe contrast. An analysis based upon the two-beam dynamical theory and a rule similar to stacking-fault contrast analysis was employed to predict the geometric configuration of
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10

Cherns, D., and I. K. Jordan. "CBED from imperfect crystals: Current achievements and future prospects." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 534–35. http://dx.doi.org/10.1017/s0424820100154640.

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CBED is usually applied to the study of perfect crystals. However, we have recently shown that CBED can be usefully applied to the study of a range of individual defects (dislocations and stacking faults) and to the study of composition profiles in a range of periodic and aperiodic semiconductor multilayers. In this paper the advantages of CBED for such studies over conventional imaging techniques will be explained and the scope for future work discussed.The application of CBED to the study of dislocations has already been discussed in a series of papers. The technique is to use the large angl
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11

Ångström, Jonas, Hong Chen, and Wei Wan. "Accurate lattice-parameter determination from electron diffraction tomography data using two-dimensional diffraction vectors." Journal of Applied Crystallography 51, no. 4 (2018): 982–89. http://dx.doi.org/10.1107/s1600576718006635.

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Electron diffraction tomography (EDT) has emerged as a successful tool for ab initio atomic structure determination of nanometre-sized crystals. However, lattice parameters obtained from EDT data are often of lower accuracy than those from powder X-ray data, owing to experimental errors and data-processing methods. This work describes a lattice-parameter refinement method for EDT data using two-dimensional diffraction vectors and shows that the accuracy of lattice-parameter determination can be improved significantly. It is also shown that the method is tolerant to sample displacement during d
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12

Möck, P. "In Situ Indexing of Two-beam Electron Diffraction Vectors." Crystal Research and Technology 26, no. 7 (1991): K157—K159. http://dx.doi.org/10.1002/crat.2170260731.

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13

Völkl, E., L. F. Allard, B. Frost, and T. A. Nolan. "Quanitative aspects of electron diffraction using electron holography." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 616–17. http://dx.doi.org/10.1017/s0424820100139457.

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Off-axis electron holography has the well known ability to preserve the complex image wave within the final, recorded image. This final image described by I(x,y) = I(r) contains contributions from the image intensity of the elastically scattered electrons IeI (r) = |A(r) exp (iΦ(r)) |, the contributions from the inelastically scattered electrons IineI (r), and the complex image wave Ψ = A(r) exp(iΦ(r)) as:(1) I(r) = IeI (r) + Iinel (r) + μ A(r) cos(2π Δk r + Φ(r))where the constant μ describes the contrast of the interference fringes which are related to the spatial coherence of the electron b
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14

Eritsyan, H., A. Lalayan, A. Margaryan, and H. Arakelyan. "Diffraction of light by a slit in anisotropic media with closed and open wave vector surface." Journal of Instrumentation 19, no. 06 (2024): C06002. http://dx.doi.org/10.1088/1748-0221/19/06/c06002.

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Abstract Fraunhofer diffraction of an electromagnetic wave by a slit on an opaque screen located between vacuum and an anisotropic medium with closed and open wave vectors surface is considered. A formula for diffraction in a material medium is obtained, including the case of diffraction into a uniaxial anisotropic medium in the absence of absorption, and the formation of diffraction minima and maxima is studied.
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15

Karpov, A. "Bragg’s reflections of a multilayer grating." Proceedings of the Komi Science Centre of the Ural Division of the Russian Academy of Sciences, no. 4 (September 21, 2023): 91–95. http://dx.doi.org/10.19110/1994-5655-2023-4-91-95.

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The reciprocal space of multilayer grating in the non-coplanar
 geometry of diffraction is investigated. Direct and inverse relations
 between the angles of wave vectors and coordinates of
 reciprocal space are written out. The Bragg’s and diffraction
 reflection angles are written. By example, cones of diffraction
 and reciprocal space mapping are demonstrated.
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16

Yan, Yanfa, and Renhui Wang. "Transmission electron microscope observations of rectangular dislocation networks in an Al70Co15Ni15 decagonal quasicrystal." Journal of Materials Research 8, no. 2 (1993): 286–90. http://dx.doi.org/10.1557/jmr.1993.0286.

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The electron diffraction contrast of two types of rectangular dislocation networks in an Al70Co15Ni15 decagonal quasicrystal has been analyzed. One type of dislocation network consists of two dislocation sets whose Burgers vectors are parallel to the tenfold axis A10 and a twofold axis A2D. The other type of dislocation network consists of two dislocation sets whose Burgers vectors are parallel to the A10 and the other twofold axis of A2P. The characteristics of the diffraction contrast of the dislocation networks in the Al–Co–Ni decagonal phase are similar to those in conventional crystals.
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17

Zhang, Yu Dong, Shi Ying Wang, Claude Esling, Xiang Zhao, and Liang Zuo. "Determination of Crystallographic Elements (Dislocation and Surface Plane) from Automated TEM Orientation Determination." Materials Science Forum 702-703 (December 2011): 866–71. http://dx.doi.org/10.4028/www.scientific.net/msf.702-703.866.

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Abstract In the present work, we summarized two calculation methods to determine some specific crystallographic elements based on electron diffraction orientation measurements performed by TEM. The first one is to determine the type and the Burgers vector of dislocations for a known crystal structure. The method calculates the orientation of the projections of all the possible dislocation line vectors in the TEM screen coordinate system using the determined crystallographic orientation of the grain and then compares them with the observed ones to identify the observed dislocations. The second
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18

Morawiec, A. "Ind_X: program for indexing single-crystal diffraction patterns." Journal of Applied Crystallography 50, no. 2 (2017): 647–50. http://dx.doi.org/10.1107/s1600576717000516.

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Indexing is an essential step in analysis of diffraction patterns. Diffraction of monochromatic radiation by a single crystal provides approximate positions of some nodes of the reciprocal lattice of the crystal, and the indexing problem lies in determining a lattice matching these positions. Ind_X is a program for indexing diffraction data given in the form of several approximate reciprocal lattice nodes. The applied method relies on testing potential volumes of the primitive cell of the reciprocal lattice. A subset of reciprocal lattice vectors supporting a given test volume is used to obtai
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19

Shimoda, Koichi. "Exact Solutions of Field Vectors of Diffraction-Free Electromagnetic Waves." Journal of the Physical Society of Japan 60, no. 2 (1991): 450–54. http://dx.doi.org/10.1143/jpsj.60.450.

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20

Morawiec, Adam. "Indexing of diffraction patterns for determination of crystal orientations." Acta Crystallographica Section A Foundations and Advances 76, no. 6 (2020): 719–34. http://dx.doi.org/10.1107/s2053273320012802.

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The task of determining the orientations of crystals is usually performed by indexing reflections detected on diffraction patterns. The well known underlying principle of indexing methods is universal: they are based on matching experimental scattering vectors to some vectors of the reciprocal lattice. Despite this, the standard attitude has been to devise algorithms applicable to patterns of a particular type. This paper provides a broader perspective. A general approach to indexing of diffraction patterns of various types is presented. References are made to formally similar problems in othe
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21

Schönleber, Andreas, Mathias Meyer, and Gervais Chapuis. "NADA– a computer program for the simultaneous refinement of orientation matrix and modulation vector(s)." Journal of Applied Crystallography 34, no. 6 (2001): 777–79. http://dx.doi.org/10.1107/s0021889801014182.

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NADAis a computer program for the simultaneous refinement of the components of the orientation matrix and the components of up to three modulation vectors by the method of least squares. Using the spatial peak positions and the orientation matrix of the main reflections from a single-crystal diffraction experiment and rough estimates of the modulation vector(s) components,NADAre-indexes the peaks (main and satellite reflections) with integers in higher dimensions (hklm1,hklm1m2orhklm1m2m3, respectively) and refines the orientation matrix and modulation vector(s) components from the observed pe
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22

Onda, Shoichi, Takeshi Okamoto, Hideyuki Uehigashi, Hiroyuki Kondo, and Hiroyasu Saka. "Characterization of Threading Screw Dislocations of Burgers Vectors with A-Components in 4H-SiC." Materials Science Forum 858 (May 2016): 401–4. http://dx.doi.org/10.4028/www.scientific.net/msf.858.401.

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We characterized threading screw dislocations to investigate the influence on device performance. The Burgers vectors of the threading screw dislocations (a total of 28dislocations) in 4H-SiC were determined by large-angle convergent-beam electron diffraction. A new type of TSD, b=c+2a dislocation was identified. And all of the four types of TSD predicted were identified. The frequency of their occurrence observed experimentally is in good agreement with theoretical prediction. In addition, we investigated relations of Burgers vector and the dislocation line direction. It has been confirmed th
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23

Abba, Ezra, Zaccheus Shehu, and Rabiu Muhammad Haruna. "Green Synthesis and Characterization of CuO@SiO2 Nanocomposite using Gum Arabic (Acacia senegalensis) (L) against Malaria Vectors." Trends in Sciences 18, no. 19 (2021): 28. http://dx.doi.org/10.48048/tis.2021.28.

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The nanocomposite CuO@SiO2 was synthesized through green pathway using Gum Arabic. The green synthesized nanocomposite was characterized using Scanning Electron Microscopy (SEM), Energy Diffraction X-Ray (EDX), Ultra-Violet/Visible spectroscopy, and Fourier Transform Infra-Red (FTIR). These techniques confirmed the formation of CuO@SiO2 nanocomposite. The toxicity studies were conducted for 24 h on 1st, 2nd, 3rd, and 4th instars of malaria vectors at various concentrations of 10, 20, and 25 Mg/L. The LC50 for the 1st, 2nd, 3rd, and 4th instars were found to be 7.525, 7.980, 8.026 and 9.741 Mg/
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24

Seale, D. J., and S. S. Sheinin. "Diffraction Contrast Measurements of Body Translation Vectors in Pseudo-Symmetric Crystals." Materials Science Forum 207-209 (February 1996): 341–44. http://dx.doi.org/10.4028/www.scientific.net/msf.207-209.341.

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25

MA Bo-qin, 马博琴, 史建华 SHI Jian-hua, and 田少华 TIAN Shao-hua. "Distribution of Reciprocal Vectors Based on Diffraction Patterns of Superlattice Structures." ACTA PHOTONICA SINICA 44, no. 5 (2015): 506001. http://dx.doi.org/10.3788/gzxb20154405.0506001.

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26

Steiner, Thomas, and Sax A. Mason. "Short N+—H...Ph hydrogen bonds in ammonium tetraphenylborate characterized by neutron diffraction." Acta Crystallographica Section B Structural Science 56, no. 2 (2000): 254–60. http://dx.doi.org/10.1107/s0108768199012318.

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The crystal structures of ammonium tetraphenylborate, NH4 +·BPh4 −, are determined by neutron diffraction at 20 and 293 K. At both temperatures, all four N—H vectors of the ammonium ion are time-average-oriented at the midpoints of the phenyl rings of neighboring anions. The N—H...Ph distances, H...M 2.067 and N...M 3.023 Å, are exceptionally short (M = aromatic midpoint). Even at 20 K the ammonium ion performs large amplitude motions which allow the N—H vectors to sample the entire face of the aromatic system.
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27

Wheeler, John, Elisabetta Mariani, Sandra Piazolo, David J. Prior, P. J. Trimby, and M. R. Drury. "The Weighted Burgers Vector: A Quantity for Constraining Dislocation Densities and Types Using Electron Backscatter Diffraction on 2D Sections through Crystalline Materials." Materials Science Forum 715-716 (April 2012): 732–36. http://dx.doi.org/10.4028/www.scientific.net/msf.715-716.732.

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The Weighted Burgers Vector (WBV) is defined as the sum, over all types of dislocations, of [(density of intersections of dislocation lines with a map) x (Burgers vector)]. It can be calculated, for any crystal system, solely from orientation gradients in a map view, unlike the full dislocation density tensor, which requires gradients in the third dimension. No assumption is made about gradients in the third dimension and they may be non-zero. The only assumption involved is that elastic strains are small so the lattice distortion is entirely due to dislocations. Orientation gradients can be e
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28

Li, Song, Yudong Zhang, Claude Esling, et al. "Determination of surface crystallography of faceted nanoparticles using transmission electron microscopy imaging and diffraction modes." Journal of Applied Crystallography 42, no. 3 (2009): 519–24. http://dx.doi.org/10.1107/s0021889809013107.

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A general calculation method is proposed to characterize the crystalline planes and directions of a faceted nanoparticle using transmission electron microscopy (TEM) imaging and diffraction modes. With the determination of the edge vectors and then the plane normal vectors in the screen coordinate system of TEM, their Miller indices in the crystal coordinate system can be calculated through coordinate transformation. The method is helpful for related studies of the determination of the surface structure of nanoparticles.
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29

Ni, Kun, Hanyu Wang, Qianying Guo, Zumin Wang, Wenxi Liu, and Yuan Huang. "The Construction of a Lattice Image and Dislocation Analysis in High-Resolution Characterizations Based on Diffraction Extinctions." Materials 17, no. 3 (2024): 555. http://dx.doi.org/10.3390/ma17030555.

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This paper introduces a method for high-resolution lattice image reconstruction and dislocation analysis based on diffraction extinction. The approach primarily involves locating extinction spots in the Fourier transform spectrum (reciprocal space) and constructing corresponding diffraction wave functions. By the coherent combination of diffraction and transmission waves, the lattice image of the extinction planes is reconstructed. This lattice image is then used for dislocation localization, enabling the observation and analysis of crystal planes that exhibit electron diffraction extinction e
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30

Fournier, Bertrand, and Philip Coppens. "On the assessment of time-resolved diffraction results." Acta Crystallographica Section A Foundations and Advances 70, a1 (2014): C771. http://dx.doi.org/10.1107/s2053273314092286.

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Dynamic-structure crystallography, and in particular photocrystallography, is a field of great interest because of its numerous applications. The field covers the studies of reactions in crystals including non-reversible reactions, phase transitions and the structure change on excitation leading to short-lifetime species. Data collected during dynamic-structure crystallography experiments require appropriate tools to perform data analysis. The relative scaling of different sets of data recurs in time-resolved pump-probe data collection in which crystals often disintegrate before a full set of
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31

Arrott, A. S., and T. L. Templeton. "Generalization of the parallel position in diffraction using elastically curved crystals." Journal of Applied Crystallography 18, no. 6 (1985): 388–95. http://dx.doi.org/10.1107/s0021889885010603.

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A theoretical and experimental study of double-crystal rocking curves with elastically deformed silicon wafers yields the result that rotating one of the crystals through 180° can change the peak intensity by a large factor, limited only by the sharpness of the intrinsic mosaic spread. The conventional double-crystal rocking curve with equivalent scattering vectors in what is called the parallel position has its counterpart for two crystals with different scattering vectors if each crystal is bent to its proper radius of curvature. Like the parallel-position case, the collimation does not ente
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32

Sitpathom, N., T. Muangnapoh, P. Kumnorkaew, S. Suwanna, A. Sinsarp, and T. Osotchan. "Angle-dependent spectrum measurement of polystyrene opal-like structure described by Bragg-Snell diffraction and perturbed photonic band structure." Journal of Physics: Conference Series 2145, no. 1 (2021): 012040. http://dx.doi.org/10.1088/1742-6596/2145/1/012040.

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Abstract Optical diffraction of opal structure, a colloidal photonic crystal, can be predicted by Bragg-Snell diffraction and photonic band structure. Theoretical prediction and optical measurement are frequently slightly different due to distance variation of particle packing. In this research, opal of 310 nm polystyrene beads was fabricated by self-assembly process and optically investigated in transmission spectra at varied angles. The measured spectra had less agreement to the Bragg-Snell prediction at large angle of detection. To explore influence of packing distance on optical response,
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33

Sugawara, Yoshihiro, Y. Yao, Yukari Ishikawa, et al. "Characterization of Dislocation Structures in Hexagonal SiC by Transmission Electron Microscopy." Materials Science Forum 725 (July 2012): 11–14. http://dx.doi.org/10.4028/www.scientific.net/msf.725.11.

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We developed the transmission electron microscopy (TEM) sample preparation technique for the low dislocation density of 4H-SiC by combining the KOH+Na2O2 (KN) etching and the focused ion beam (FIB) microsampling technique. The dislocation under sea-shell pit was then characterized by large-angle convergent-beam electron diffraction (LACBED). It is demonstrated that this method is powerful for evaluating Burgers vectors of dislocations. Burgers vector of the measured basal plane dislocation (BPD) is determined to be b=1/3[-12-10]. Two-beam bright-field (TBBF) imaging identified the rotating dir
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34

Antipov, Y. A. "A Symmetric Riemann-Hilbert Problem for Order-4 Vectors in Diffraction Theory." Quarterly Journal of Mechanics and Applied Mathematics 63, no. 3 (2010): 349–74. http://dx.doi.org/10.1093/qjmam/hbq019.

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35

Bunge, H. J. "Influence of Texture on Powder Diffraction." Textures and Microstructures 29, no. 1-2 (1997): 1–26. http://dx.doi.org/10.1155/tsm.29.1.

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Classical Powder Diffraction usually assumes samples with completely random orientation distribution of the crystallites. It can be generalized to non-random orientation distribution (texture) by introducing a texture factor which enters the expression of the integral intensity directly and serves as a weight function in expressions of peak shift or peak broadening. Hence, all methods of powder diffraction, for instance, phase analysis, crystal structure analysis, stress analysis, particles size analysis, can also be carried out with textured samples.Textured polycrystalline samples may be con
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36

Dunn, Kathleen A., Susan E. Babcock, Donald S. Stone, Richard J. Matyi, Ling Zhang, and Thomas F. Kuech. "Dislocation Arrangement in a Thick LEO GaN Film on Sapphire." MRS Internet Journal of Nitride Semiconductor Research 5, S1 (2000): 97–103. http://dx.doi.org/10.1557/s1092578300004130.

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Diffraction-contrast TEM, focused probe electron diffraction, and high-resolution X-ray diffraction were used to characterize the dislocation arrangements in a 16µm thick coalesced GaN film grown by MOVPE LEO. As is commonly observed, the threading dislocations that are duplicated from the template above the window bend toward (0001). At the coalescence plane they bend back to lie along [0001] and thread to the surface. In addition, three other sets of dislocations were observed. The first set consists of a wall of parallel dislocations lying in the coalescence plane and nearly parallel to the
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37

Miloslavsky, V. K., L. A. Ageev, and A. Nahal. "Peculiarities of spontaneous-grating formation in light-sensitive films under elliptically polarized laser radiation." Canadian Journal of Physics 76, no. 1 (1998): 77–85. http://dx.doi.org/10.1139/p97-042.

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The formation of spontaneous gratings in thin waveguide AgCl–Ag photosensitive films was studied under elliptically polarized laser radiation. New peculiarities of the gratings growth were found (i) a deviation in angular position of the wave vectors of the most probable microgratings from π / 2 about the major axis of the polarization ellipse; and (ii) an asymmetry, which depends on the ellipticity sign, in the diffraction and small-angle scattering patterns. The experimental results are explained within the framework of a model that shows the scattering of incident light by small prolate abs
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38

Oshima, Kanji, Yasunobu Sugimoto, and Katsuzo Wakabayashi. "Deduction of the single-myosin-filament transforms from partially sampled layer lines in the X-ray diffraction pattern from vertebrate striated muscle." Journal of Applied Crystallography 44, no. 2 (2011): 398–408. http://dx.doi.org/10.1107/s0021889811006455.

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A novel method to correct a partial sampling effect, due to the hexagonal filament array of a statistical superlattice form, on the thick (myosin)-filament-based layer lines in X-ray diffraction patterns from higher-vertebrate striated muscle has been developed using the cylindrically averaged difference Patterson function [ΔQ(r, z)]. The method involves cutting off the inter-filament vector peaks that appear in the radial region beyond ∼32 nm on the ΔQ(r, z) map calculated from the observed layer-line intensities, and then deducing the single-myosin-filament transforms by inverse Fourier tran
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Karitans, Varis, Maris Ozolinsh, and Sergejs Fomins. "Phase Retrieval of One-Dimensional Objects by the Multiple-Plane Gerchberg–Saxton Algorithm Implemented into a Digital Signal Processor." Optics 5, no. 4 (2024): 514–22. http://dx.doi.org/10.3390/opt5040038.

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In the current study, we address the phase retrieval of one-dimensional phase objects from near-field diffraction patterns using the multiple-plane Gerchberg–Saxton algorithm, which is still widely used for phase retrieval. The algorithm was implemented in a low-cost digital signal processor capable of fast Fourier transform using Q15 arithmetic, which is used by the previously mentioned algorithm. We demonstrate similarity between one-dimensional phase objects, i.e., vectors cut out of a phase map of the tertiary spherical aberration retrieved by the multiple-plane Gerchberg–Saxton algorithm,
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40

Mildner, D. F. R., J. G. Barker, and S. R. Kline. "The effect of gravity on the resolution of small-angle neutron diffraction peaks." Journal of Applied Crystallography 44, no. 5 (2011): 1127–29. http://dx.doi.org/10.1107/s0021889811033322.

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The resolution ellipses for neutron diffraction peaks at small scattering vectors lie along lines that point to a position vertically above the beam center on the small-angle scattering detector. This gravity effect is only noticeable for neutron beams at long wavelengths and with large wavelength spreads.
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41

Gorfman, Semën. "Algorithms for target transformations of lattice basis vectors." Acta Crystallographica Section A Foundations and Advances 76, no. 6 (2020): 713–18. http://dx.doi.org/10.1107/s2053273320012668.

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Simple algorithms are proposed for the transformation of lattice basis vectors to a specific target. In the first case, one of the new basis vectors is aligned to a predefined lattice direction, while in the second case, two of the new basis vectors are brought to a lattice plane with predefined Miller indices. The multi-dimensional generalization of the algorithm is available in the supporting materials. The algorithms are useful for such crystallographic operations as simulation of zone planes (i.e. geometry of electron diffraction patterns) or transformation of a unit cell for surface or cl
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42

Bright, David S., Alline F. Myers, Shirley Turner, and Eric B. Steel. "Spot Measurement Tool for Diffraction Pattern Analysis." Microscopy and Microanalysis 4, S2 (1998): 60–61. http://dx.doi.org/10.1017/s1431927600020420.

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Accurate characterization of electron diffraction patterns can be tedious, which encourages development of computer assisted tools and methods. We developed a spot measurement tool to characterize rapidly arrays of diffraction spots that are characteristic of a single crystal, and to measure precisely the d-spacing values for individual spots. The spot tool determines these vectors for averaged measurements from many spots in a digital image of the diffraction pattern. Previously we developed automated methods for spot pattern analysis. Why make an operator-assisted tool? This tool is faster t
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43

Wang, R., J. Feng, Y. Yan, and M. Dai. "Convergent-Beam Electron Diffraction Determination of the Burgers Vectors of Dislocations in Quasicrystals." Materials Science Forum 150-151 (January 1994): 323–34. http://dx.doi.org/10.4028/www.scientific.net/msf.150-151.323.

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44

Levanyuk, A. P., and J. Lajzerowicz. "Higher order satellite diffraction at large scattering vectors: Study of incommensurations and defects." Ferroelectrics 125, no. 1 (1992): 251–55. http://dx.doi.org/10.1080/00150199208017076.

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45

Wang, Renhui. "Defocus convergent beam electron diffraction determination of Burgers vectors of dislocations in quasicrystals." Micron 31, no. 5 (2000): 475–86. http://dx.doi.org/10.1016/s0968-4328(99)00127-4.

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46

Qian, W., and J. C. H. Spence. "Theory of transmission low-energy electron diffraction." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 696–97. http://dx.doi.org/10.1017/s0424820100149313.

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Interpretation of the images from a point source electron microscope requires a detailed analysis of transmission low energy electron diffraction. Here we present a general approach for solutions to the mixed Bragg-Laue case in transmission LEED (100-1000eV), based on the dynamical diffraction theory of Bethe. However, the validity of the dynamical diffraction theory to low energy electrons can be justified by its connection to the band theory for low energy crystal electrons.Assume that the incident beam forms a plane wave and the crystal is a thin slab. According to Bethe, the total electron
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47

Huang, Y., and J. M. Cowley. "The long-period structure on ordering alloy surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 816–17. http://dx.doi.org/10.1017/s042482010017181x.

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The long-period structure (LPS) has long been known to exist in bulk ordering alloys such as CuAu and Cu3Au. in the structure the ordered lattice shifts back and forth by a vector every M unit cells and forms a super cell 2M unit cells long. The planes where the lattice shifts are usually called antiphase boundaries (APBs) and the LPS can be regarded as periodically arranged antiphase domains. This superstructure can be detected by the splitting (∝1/M) of some superlattice spots in the diffraction panern. One may ask whether the LPS also occurs on the surface; if so, what is its effect onthe d
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48

Guo, Jian Qiu, Yu Yang, Fang Zhen Wu, et al. "Using Ray Tracing Simulations for Direct Determination of Burgers Vectors of Threading Mixed Dislocations in 4H-SiC c-Plane Wafers Grown by PVT Method." Materials Science Forum 858 (May 2016): 15–18. http://dx.doi.org/10.4028/www.scientific.net/msf.858.15.

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The presence of threading mixed dislocations (TMDs) (with both edge and screw component) in 4H-SiC crystals grown by PVT method has been reported both from axial slices (wafers cut parallel to the growth axis) and commercial offcut wafers (cut almost perpendicular to the growth axis). In this paper, a systematic method is developed and demonstrated to unambiguously determine the Burgers vectors of TMDs in 4H-SiC commercial offcut wafers using both Synchrotron Monochromatic X-ray Topography (SMBXT) and Ray Tracing Simulations. The principle of this method is that the contrast of dislocations on
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Jin, Shiyun, Huifang Xu, Xiaoping Wang, Ryan Jacobs, and Dane Morgan. "The incommensurately modulated structures of low-temperature labradorite feldspars: a single-crystal X-ray and neutron diffraction study." Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials 76, no. 1 (2020): 93–107. http://dx.doi.org/10.1107/s2052520619017128.

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Labradorite feldspars of the plagioclase solid solution series have been known for their complicated subsolidus phase relations and enigmatic incommensurately modulated structures. Characterized by the irrationally indexed e-reflections in the diffraction pattern, e-labradorite shows the largest variation in the incommensurate ordering states among the e-plagioclase structures. The strongly ordered low-temperature e-labradorite is one of the last missing pieces of the e-plagioclase puzzle. Nine plutonic and metamorphic labradorite feldspar samples from Canada, Ukraine, Minnesota (USA), Tanzani
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50

Yao, Yongzhao, Yoshiyuki Tsusaka, Kohei Sasaki, Akito Kuramata, Yoshihiro Sugawara та Yukari Ishikawa. "Large-area total-thickness imaging and Burgers vector analysis of dislocations in β-Ga2O3 using bright-field x-ray topography based on anomalous transmission". Applied Physics Letters 121, № 1 (2022): 012105. http://dx.doi.org/10.1063/5.0098942.

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Using bright-field x-ray topography based on anomalous transmission (AT), we have demonstrated the first large-area total-thickness imaging of dislocations in β-Ga2O3 at the substrate scale. The dislocation images were acquired from the entire 10 mm × 15 mm × 680 μm (001)-oriented substrate prepared by edge-defined film-fed growth (EFG) by stitching together hundreds of topographic images, each recorded with the forward-diffracted beam in the Laue geometry for g = 020, 0–20, 022, and 400, under the conditions in which AT occurred. Dislocations distributed over the entire crystal volume were im
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