Relevant bibliographies by topics / Diffraction X

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Diffraction X'

Author: Grafiati
Published: 4 June 2021
Last updated: 25 May 2024

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Journal articles on the topic "Diffraction X"

1

Iqra Zubair Awan, Iqra Zubair Awan. "X-Ray Diffraction – The Magic Wand." Journal of the chemical society of pakistan 42, no. 3 (2020): 317. http://dx.doi.org/10.52568/000646.

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This review paper covers one of the most important discoveries of the last century, viz. X-ray diffraction. It has made enormous contribution to chemistry, physics, engineering, materials science, crystallography and above all medical sciences. The review covers the history of X-rays detection and production, its uses/ applications. The scientific and medical community will forever be indebted to Rand#246;ntgen for this invaluable discovery and to those who perfected its application.
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Iqra Zubair Awan, Iqra Zubair Awan. "X-Ray Diffraction – The Magic Wand." Journal of the chemical society of pakistan 42, no. 3 (2020): 317. http://dx.doi.org/10.52568/000646/jcsp/42.03.2020.

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This review paper covers one of the most important discoveries of the last century, viz. X-ray diffraction. It has made enormous contribution to chemistry, physics, engineering, materials science, crystallography and above all medical sciences. The review covers the history of X-rays detection and production, its uses/ applications. The scientific and medical community will forever be indebted to Rand#246;ntgen for this invaluable discovery and to those who perfected its application.
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Irzhak, D. V., M. A. Knyasev, V. I. Punegov, and D. V. Roshchupkin. "X-ray diffraction by phase diffraction gratings." Journal of Applied Crystallography 48, no. 4 (2015): 1159–64. http://dx.doi.org/10.1107/s1600576715011607.

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The diffraction properties of phase gratings with the periodD= 1.6, 1.0 and 0.5 µm fabricated on an Si(111) crystal by e-beam lithography were studied by triple-axis X-ray diffraction. A 100 nm-thick tungsten layer was used as a phase-shift layer. It is shown that the presence of a grating as a phase-shift W layer on the surface of the Si(111) crystal causes the formation of a complicated two-dimensional diffraction pattern related to the diffraction of X-rays on the phase grating at the X-ray entrance and exit from the crystal. A model of X-ray diffraction on the W phase diffraction grating i
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Ba Ha, Truong, and I. Ya Dubovskaya. "Diffraction X-Ray Radiation under Multiwave Diffraction." physica status solidi (b) 155, no. 2 (1989): 685–95. http://dx.doi.org/10.1002/pssb.2221550240.

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KOBAYASHI, Shintaro. "Surface X-ray Diffraction." Journal of the Japan Society of Colour Material 87, no. 1 (2014): 31–35. http://dx.doi.org/10.4011/shikizai.87.31.

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Takahashi, Toshio. "X-ray surface diffraction." Bulletin of the Japan Institute of Metals 28, no. 3 (1989): 203–7. http://dx.doi.org/10.2320/materia1962.28.203.

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Robinson, I. K. "Surface X-ray diffraction." Acta Crystallographica Section A Foundations of Crystallography 43, a1 (1987): C205. http://dx.doi.org/10.1107/s0108767387080024.

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Wark, J. "Femtosecond X-ray diffraction." Acta Crystallographica Section A Foundations of Crystallography 62, a1 (2006): s2. http://dx.doi.org/10.1107/s010876730609996x.

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Afanas'ev, Alexander M., Rafik M. Imamov, and Enver Kh Mukhmedzhanov. "Asymmetric X-Ray Diffraction." Crystallography Reviews 3, no. 2 (1992): 157–226. http://dx.doi.org/10.1080/08893119208032970.

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Robinson, I. K., and D. J. Tweet. "Surface X-ray diffraction." Reports on Progress in Physics 55, no. 5 (1992): 599–651. http://dx.doi.org/10.1088/0034-4885/55/5/002.

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Dissertations / Theses on the topic "Diffraction X"

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Zora, J. A. "X-ray diffraction studies." Thesis, University of Sussex, 1986. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.374467.

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Hinrichsen, Bernd. "Two-dimensional X-ray powder diffraction." [S.l. : s.n.], 2007. http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-33946.

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Genetu, Teggen Linda. "Material identification using X-ray diffraction." Thesis, Mittuniversitetet, Institutionen för elektronikkonstruktion, 2019. http://urn.kb.se/resolve?urn=urn:nbn:se:miun:diva-37122.

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This study reviews the theoretical and experimental aspects of the X-ray diffraction (XRD) technique and evaluates its use in identifying toxic elements or compounds in waste that has been incinerated. Many industries incinerate materials that contain large significant amounts of toxic elements, and these elements should be identified and re-moved to reduce environmental pollution. The aim of this project is to identify the elemental content of an incinerated ash sample, and to recommend a proper identification method when using XRD. Here, we test two ash samples (raw ash without any treatment
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R, N. C. Maia Filipe. "Ultrafast Coherent X-ray Diffractive Nanoimaging." Doctoral thesis, Uppsala universitet, Molekylär biofysik, 2010. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-122002.

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X-ray lasers are creating unprecedented research opportunities in physics,chemistry and biology. The peak brightness of these lasers exceeds presentsynchrotrons by 1010, the coherence degeneracy parameters exceedsynchrotrons by 109, and the time resolution is 105 times better. In theduration of a single flash, the beam focused to a micron-sized spot has the samepower density as all the sunlight hitting the Earth, focused to a millimetresquare. Ultrafast coherent X-ray diffractive imaging (CXDI) with X-ray lasers exploitsthese unique properties of X-ray lasers to obtain high-resolution structur
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Dicken, A. "Diffraction enhanced kinetic depth X-ray imaging." Thesis, Department of Engineering and Applied Science, 2013. http://dspace.lib.cranfield.ac.uk/handle/1826/8046.

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An increasing number of fields would benefit from a single analytical probe that can characterise bulk objects that vary in morphology and/or material composition. These fields include security screening, medicine and material science. In this study the X-ray region is shown to be an effective probe for the characterisation of materials. The most prominent analytical techniques that utilise X-radiation are reviewed. The study then focuses on methods of amalgamating the three dimensional power of kinetic depth X-ray (KDFX) imaging with the materials discrimination of angular dispersive X-ray di
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Northey, Thomas. "Ab initio molecular diffraction." Thesis, University of Edinburgh, 2017. http://hdl.handle.net/1842/28772.

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In 1915, Debye derived his well-known equation for the X-ray scattering from a sample of randomly orientated gas-phase molecules. He approximated the molecular scattering by adding the contributions of isolated atomic constituents. This is known as the Independent Atom Model (IAM). However, it omits the redistribution of valence electrons due to bonding, and is limited to the electronic ground state. The main proposition of this thesis is that it is worthwhile going beyond the IAM when interpreting X-ray scattering data. In part, this is motivated by the arrival of new X-ray sources called X-r
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Kegel, Ingo. "X-ray diffraction from semiconductor quantum dots." Diss., [S.l.] : [s.n.], 2000. http://edoc.ub.uni-muenchen.de/archive/00000330.

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Escudero, Adán Eduardo Carmelo. "High resolution X-ray single crystal diffraction." Doctoral thesis, Universitat Rovira i Virgili, 2018. http://hdl.handle.net/10803/586278.

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Aquesta tesi doctoral descriu l'ús de dades d'alta resolució de difracció de raigs X de monocristall per a la obtenció de mapes experimentals detallats de distribució de densitat de càrrega. Aquests mapes serveixen per evidenciar experimentalment l'existència d'interaccions intra- i inter-moleculars febles dins de l'estructura del vidre. Els mapes de densitat de càrrega s'obtenen mitjançant un refinament multipolar de l'estructura cristal·lina. En concret, aquest treball se centra en evidenciar experimentalment les interaccions atractives no covalent recentment descrites teòricament i que
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Anderoglu, Osman. "Residual stress measurement using X-ray diffraction." Texas A&M University, 2004. http://hdl.handle.net/1969.1/1507.

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This paper briefly describes the theory and methods of x-ray residual stress measurements. Residual stresses can be defined as the stresses which remain in a material in the absence of any external forces. There are many stress determination methods. Some of those methods are destructive and some are nondestructive. X-ray residual stress measurement is considered as a nondestructive method. X-ray diffraction together with the other diffraction techniques of residual stress measurement uses the distance between crystallographic planes as a strain gage. The deformations cause changes in the spac
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Falch, Thomas Løfsgaard. "3D Visualization of X-ray Diffraction Data." Thesis, Norges teknisk-naturvitenskapelige universitet, Institutt for datateknikk og informasjonsvitenskap, 2012. http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-18903.

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X-ray diffraction experiments are used extensively in the sciences to study the structure, chemicalcomposition and physical properties of materials. The output of such experiments are samples of thediffraction pattern, which essentially constitutes a 3D unstructured dataset. In this thesis, wedevelop a method for visualizing such datasets.Our visualization method is based on volume ray casting, but operates directly on the unstructuredsamples, rather than resampling them to form voxels. We estimate the intensity of the X-raydiffraction pattern at points along the rays by interpolation using ne
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Books on the topic "Diffraction X"

1

X-ray diffraction. Dover Publications, 1990.

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Suryanarayana, C., and M. Grant Norton. X-Ray Diffraction. Springer US, 1998. http://dx.doi.org/10.1007/978-1-4899-0148-4.

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Erko, A. I. Diffraction X-ray optics. Institute of Physics Pub., 1996.

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L, Bish David, and Post Jeffrey Edward, eds. Modern powder diffraction. Mineralogical Society of America, 1989.

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Greenberg, Joel, and Krzysztof Iniewski, eds. X-Ray Diffraction Imaging. CRC Press, 2018. http://dx.doi.org/10.1201/9780429196492.

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Waseda, Yoshio, Eiichiro Matsubara, and Kozo Shinoda. X-Ray Diffraction Crystallography. Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-16635-8.

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Two-dimensional X-ray diffraction. Wiley, 2009.

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R, Helliwell John, and Rentzepis Peter M. 1934-, eds. Time-resolved diffraction. Clarendon Press, 1997.

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Authier, André. Dynamical theory of x-ray diffraction. Oxford University Press, 2004.

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Turley, June W. X-ray diffraction patterns of polymers. International Centre for Diffraction Data (12 Campus Blvd., Newtown Square, 19073-3273), 1994.

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Book chapters on the topic "Diffraction X"

1

Michette, Alan G. "Diffractive Optics I Diffraction Gratings." In Optical Systems for Soft X Rays. Springer US, 1986. http://dx.doi.org/10.1007/978-1-4613-2223-8_6.

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Suryanarayana, C., and M. Grant Norton. "X-Rays and Diffraction." In X-Ray Diffraction. Springer US, 1998. http://dx.doi.org/10.1007/978-1-4899-0148-4_1.

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Suryanarayana, C., and M. Grant Norton. "Quantitative Analysis of Powder Mixtures." In X-Ray Diffraction. Springer US, 1998. http://dx.doi.org/10.1007/978-1-4899-0148-4_10.

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Suryanarayana, C., and M. Grant Norton. "Identification of an Unknown Specimen." In X-Ray Diffraction. Springer US, 1998. http://dx.doi.org/10.1007/978-1-4899-0148-4_11.

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Suryanarayana, C., and M. Grant Norton. "Lattices and Crystal Structures." In X-Ray Diffraction. Springer US, 1998. http://dx.doi.org/10.1007/978-1-4899-0148-4_2.

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Suryanarayana, C., and M. Grant Norton. "Practical Aspects of X-Ray Diffraction." In X-Ray Diffraction. Springer US, 1998. http://dx.doi.org/10.1007/978-1-4899-0148-4_3.

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Suryanarayana, C., and M. Grant Norton. "Crystal Structure Determination. I: Cubic Structures." In X-Ray Diffraction. Springer US, 1998. http://dx.doi.org/10.1007/978-1-4899-0148-4_4.

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Suryanarayana, C., and M. Grant Norton. "Crystal Structure Determination. II: Hexagonal Structures." In X-Ray Diffraction. Springer US, 1998. http://dx.doi.org/10.1007/978-1-4899-0148-4_5.

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Suryanarayana, C., and M. Grant Norton. "Precise Lattice Parameter Measurements." In X-Ray Diffraction. Springer US, 1998. http://dx.doi.org/10.1007/978-1-4899-0148-4_6.

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Suryanarayana, C., and M. Grant Norton. "Phase Diagram Determination." In X-Ray Diffraction. Springer US, 1998. http://dx.doi.org/10.1007/978-1-4899-0148-4_7.

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Conference papers on the topic "Diffraction X"

1

Jamet, Francis. "La Diffraction X Instantanee Flash X-Ray Diffraction." In 16th International Congress on High Speed Photography and Photonics, edited by Michel L. Andre and Manfred Hugenschmidt. SPIE, 1985. http://dx.doi.org/10.1117/12.967901.

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Ulrich, Ralf, and CMS Collaboration. "Low-x physics results from CMS." In DIFFRACTION 2012: International Workshop on Diffraction in High Energy Physics. AIP, 2013. http://dx.doi.org/10.1063/1.4802174.

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Sabio Vera, Agustin. "Angular dependences in the small x region." In Diffraction 06, International Workshop on Diffraction in High-Energy Physics. Sissa Medialab, 2007. http://dx.doi.org/10.22323/1.035.0028.

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Greco, Mario. "DIS Polarized Structure Functions at small x." In Diffraction 06, International Workshop on Diffraction in High-Energy Physics. Sissa Medialab, 2007. http://dx.doi.org/10.22323/1.035.0036.

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Song, Seungri, Jeongsoo Kim, Taegyun Moon, et al. "Polarization-sensitive intensity diffraction tomography." In Quantitative Phase Imaging X, edited by YongKeun Park and Yang Liu. SPIE, 2024. http://dx.doi.org/10.1117/12.3002031.

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Zoller, Vladimir. "Left and Right in small-x neutrino DIS." In Diffraction 06, International Workshop on Diffraction in High-Energy Physics. Sissa Medialab, 2007. http://dx.doi.org/10.22323/1.035.0042.

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Gonçalves, V. P., M. V. T. Machado, A. R. Meneses, et al. "Small-x physics in coherent pp interactions at LHC." In DIFFRACTION 2008: International Workshop on Diffraction in High Energy Physics. AIP, 2009. http://dx.doi.org/10.1063/1.3122176.

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Kowalski, H., D. A. Ross, and O. Schulz. "Fitting the discrete BFKL Pomeron to low-x HERA data." In DIFFRACTION 2016: International Workshop on Diffraction in High-Energy Physics. Author(s), 2017. http://dx.doi.org/10.1063/1.4977124.

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Kämpfe, B., R. Arnhold, and B. Michel. "ENERGY - DISPERSIVE X-RAY DIFFRACTION." In Proceedings of the XIX Conference. WORLD SCIENTIFIC, 2004. http://dx.doi.org/10.1142/9789812702913_0005.

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Freund, Andreas K. "High-energy x-ray diffraction." In San Diego '90, 8-13 July, edited by James P. Knauer and Gopal K. Shenoy. SPIE, 1991. http://dx.doi.org/10.1117/12.23325.

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Reports on the topic "Diffraction X"

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Thomlinson, W., Z. Zhong, D. Chapman, R. E. Johnston, and D. Sayers. Diffraction enhanced x-ray imaging. Office of Scientific and Technical Information (OSTI), 1997. http://dx.doi.org/10.2172/548746.

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Morris, Marlene C., Howard F. McMurdie, Eloise H. Evans, et al. Standard x-ray diffraction powder patterns :. National Bureau of Standards, 1985. http://dx.doi.org/10.6028/nbs.mono.25-21.

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Phillips, Ian. Data Report: X-Ray Powder Diffraction. Office of Scientific and Technical Information (OSTI), 2019. http://dx.doi.org/10.2172/1648320.

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Schwartz, Daniel S. INFL GUIDELINE ON X-RAY DIFFRACTION (XRD). Office of Scientific and Technical Information (OSTI), 2013. http://dx.doi.org/10.2172/1095199.

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Coppens, P. (X-ray diffraction experiments with condenser matter). Office of Scientific and Technical Information (OSTI), 1990. http://dx.doi.org/10.2172/5187190.

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Selig, W. S., G. S. Smith, K. K. Harding, and L. J. Summers. X-ray diffraction patterns of metal aurocyanides. Office of Scientific and Technical Information (OSTI), 1989. http://dx.doi.org/10.2172/5777169.

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Roof, R. X-ray diffraction data for plutonium compounds. Office of Scientific and Technical Information (OSTI), 1989. http://dx.doi.org/10.2172/7257520.

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Roof, R. X-ray diffraction data for plutonium compounds. Office of Scientific and Technical Information (OSTI), 1989. http://dx.doi.org/10.2172/7151158.

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Lyman, Paul F., and Dilano K. Saldin. A Bayesian Approach to Surface X-ray Diffraction. Office of Scientific and Technical Information (OSTI), 2006. http://dx.doi.org/10.2172/895207.

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Eggert, J. X-ray diffraction studies of dynamically compressed diamond. Office of Scientific and Technical Information (OSTI), 2010. http://dx.doi.org/10.2172/1117990.

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