Journal articles: 'Diffraction X sous incidence'

1

Treheux, D., and H. Jaffrezic. "Quinze ans d’expérience en diffraction X sous incidence rasante." Matériaux & Techniques 88, no. 3-4 (2000): 61–67. http://dx.doi.org/10.1051/mattech/200088030061.

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2

Hélary, Doriane, Evelyne Darque-Ceretti, Anne Bouquillon, Marc Aucouturier, and Gabriel Monge. "Contribution de la diffraction de rayons X sous incidence rasante à l'étude de céramiques lustrées." Revue d'Archéométrie 27, no. 1 (2003): 115–22. http://dx.doi.org/10.3406/arsci.2003.1047.

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3

Houpert, C., L. Bourdeau, and O. Valfort. "Apport de la diffraction X sous incidence rasante pour l’étude microstructurale d’un acier 316L implanté à l’azote." Revue de Métallurgie 90, no. 9 (September 1993): 1106. http://dx.doi.org/10.1051/metal/199390091106.

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4

Guinebretière, R., O. Masson, M. C. Silva, A. Fillion, J. P. Surmont, and A. Dauger. "Diffraction des rayons X en réflexion sous incidence fixe. Mise en œuvre d'un détecteur courbe à localisation (CPS 120 Inel)." Le Journal de Physique IV 06, no. C4 (July 1996): C4–111—C4–121. http://dx.doi.org/10.1051/jp4:1996411.

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5

Muşat, Viorica, Elena Emanuela Herbei, Elena Maria Anghel, Michael P. M. Jank, Susanne Oertel, Daniel Timpu, and Laurenţiu Frangu. "Low-Temperature and UV Irradiation Effect on Transformation of Zirconia -MPS nBBs-Based Gels into Hybrid Transparent Dielectric Thin Films." Gels 8, no. 2 (January 20, 2022): 68. http://dx.doi.org/10.3390/gels8020068.

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Bottom-up approaches in solutions enable the low-temperature preparation of hybrid thin films suitable for printable transparent and flexible electronic devices. We report the obtainment of new transparent PMMA/ZrO2 nanostructured -building blocks (nBBs) hybrid thin films (61–75 nm) by a modified sol-gel method using zirconium ethoxide, Zr(OEt)4, and 3-methacryloxypropyl trimethoxysilane (MPS) as a coupling agent and methylmethacrylate monomer (MMA). The effect of low-temperature and UV irradiation on the nBBs gel films is discussed. The thermal behaviors of the hybrid sols and as-deposed gel films were investigated by modulated thermogravimetric (mTG) and differential scanning calorimetry (DSC) analysis. The chemical structure of the resulted films was elucidated by X-ray photoelectron (XPS), infrared (IR) and Raman spectroscopies. Their morphology and crystalline structure were observed by scanning electron microscopy (SEM), high-resolution transmission electron microscopy (HR-TEM), and grazing incidence X-ray diffraction. The cured films show zirconia nanocrystallites of 2–4 nm in the hybrid matrix and different self-assembled structures for 160 °C or UV treatment; excellent dielectric behavior, with dielectric constant values within 6.7–17.9, depending on the Zr(OEt)4:MMA molar ratio, were obtained.

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6

Gubanova, Nadezhda, Vasilii Matveev, Elena Grebenshchikova, Demid Kirilenko, Yana Sazonova, and Olga Shilova. "Pt and Pd Nanoparticle Crystallization in the Sol-Gel-Derived Thin SiO2 Films." Physchem 3, no. 2 (June 15, 2023): 259–69. http://dx.doi.org/10.3390/physchem3020018.

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The crystallization and distribution the features of Pt, Pd and Pt/Pd nanoparticles in spin-on glass SiO2 films were studied within a wide range of the dopant concentrations in silica sol (from 10 to 80 mol.% Pt, Pd or Pt/Pd per 100 mol.% Si). The grazing incidence X-ray diffraction (GIXRD) characterization revealed that the formation of 4–8 nm sized crystalline Pt, Pd and Pt/Pd nanoparticles in SiO2 films began at the dopant concentrations of at least 10 mol.% Pt and/or Pd per 100 mol.% Si. The nanoparticles obtained from sols with the lower Pt, Pd or Pt/Pd concentrations were characterized by an amorphous structure. The dopants distribution over the film thickness (~21–47 nm) was studied using X-ray reflectometry. The effect of the dopant concentration, spin-coating modes and heat treatment temperature on the film thickness was characterized. When only one of the dopants (Pt or Pd) was introduced into the silica sol, the resulting nanoparticles were preferentially localized close to the film surface. When dopants were used together, the Pt/Pd nanoparticles were distributed more evenly.

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7

Imamov, R. M., and D. V. Novikov. "Grazing Incidence Diffraction X-Ray Topography." Solid State Phenomena 19-20 (January 1991): 467–70. http://dx.doi.org/10.4028/www.scientific.net/ssp.19-20.467.

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8

Imamov, R. M., A. A. Lomov, and D. V. Novikov. "Grazing incidence diffraction X-ray topography." Physica Status Solidi (a) 115, no. 2 (October 16, 1989): K133—K134. http://dx.doi.org/10.1002/pssa.2211150232.

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9

Durbin, S. M., and T. Gog. "Grazing-incidence Bragg–Laue X-ray diffraction." Acta Crystallographica Section A Foundations of Crystallography 45, no. 1 (January 1, 1989): 132–41. http://dx.doi.org/10.1107/s0108767388010657.

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10

Basu, Jaydeep K. "Grazing incidence X-ray scattering and diffraction." Resonance 19, no. 12 (December 2014): 1158–76. http://dx.doi.org/10.1007/s12045-014-0140-9.

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11

Harvey, James E. "Diffraction Effects in Grazing Incidence X-Ray Telescopes." Journal of X-Ray Science and Technology 3, no. 1 (1991): 68–76. http://dx.doi.org/10.3233/xst-1991-3106.

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12

Sakata, O., H. Hashizume, and I. Minato. "Dynamical diffraction of X-rays at grazing incidence." Acta Crystallographica Section A Foundations of Crystallography 43, a1 (August 12, 1987): C222. http://dx.doi.org/10.1107/s010876738707956x.

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13

Imamov, R. "Photoelectron yield in x-ray grazing-incidence diffraction." Applied Surface Science 22-23 (May 1985): 259–66. http://dx.doi.org/10.1016/0169-4332(85)90058-3.

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14

Harvey, J. "Diffraction effects in grazing incidence X-ray telescopes." Journal of X-Ray Science and Technology 3, no. 1 (October 1991): 68–76. http://dx.doi.org/10.1016/0895-3996(91)90012-u.

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15

Simbrunner, Josef, Roland Resel, and Ingo Salzmann. "Indexation of grazing-incidence X-ray diffraction patterns." Acta Crystallographica Section A Foundations and Advances 73, a2 (December 1, 2017): C942. http://dx.doi.org/10.1107/s2053273317086326.

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16

Imamov, R. M., E. Kh Mukhamedzhanov, A. V. Maslov, E. M. Pashaev, and A. M. Afanas'ev. "Photoelectron yield in x-ray grazing-incidence diffraction." Applications of Surface Science 22-23 (May 1985): 259–66. http://dx.doi.org/10.1016/0378-5963(85)90058-3.

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17

Gosset, D., D. Siméone, and D. Quirion. "Endommagement du carbure de bore sous irradiation neutronique : évaluation en diffraction X." Le Journal de Physique IV 10, PR10 (September 2000): Pr10–55—Pr10–63. http://dx.doi.org/10.1051/jp4:20001007.

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18

Chen, Liu Ran, Xi Chen, Ji Cai Liang, and Ji Dong Zhang. "Analysis the Actual Nanostructure of α Phase Polyoctylfluorene Thin Film via Synchrotron Grazing-Incidence X-Ray Diffraction." Applied Mechanics and Materials 333-335 (July 2013): 1832–35. http://dx.doi.org/10.4028/www.scientific.net/amm.333-335.1832.

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The nanostructure of α phase polyoctylfluorene thin film was characterized using normal X-ray diffraction, one-dimensional out-of-plane grazing incidence X-ray diffraction and two-dimensional grazing incidence X-ray diffraction with lab diffractometer and synchrotron diffractometer. The results show that using grazing incidence X-ray diffraction the weak diffraction signal of thin film can be observed after the elimination of background signals. Incorrect (h10) diffraction signals can be collected by lab diffractometer due to its low collimation and resolution, which can be overcome by using synchrotron diffractometer with high collimation and resolution that reveal the actual microstructure of polyoctylfluorene thin film.

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19

Naudon, A., P. Goudeau, and T. Slimani. "Diffusion centrale des rayons X sous incidence rasante. Faisabilité et applications." Journal de Physique I 2, no. 6 (June 1992): 1083–96. http://dx.doi.org/10.1051/jp1:1992198.

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20

Koivisto, M., and V. P. Lehto. "Grazing incidence X-ray diffraction studies of pharmaceutical tablets." Acta Crystallographica Section A Foundations of Crystallography 61, a1 (August 23, 2005): c409—c410. http://dx.doi.org/10.1107/s0108767305082693.

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21

Dosch, H., B. W. Batterman, and D. C. Wack. "Depth-Controlled Grazing-Incidence Diffraction of Synchrotron X Radiation." Physical Review Letters 56, no. 11 (March 17, 1986): 1144–47. http://dx.doi.org/10.1103/physrevlett.56.1144.

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22

Yoshimura, Hirofumi, Shigeki Yamada, Akihiko Yoshimura, Ichiro Hirosawa, Kenichi Kojima, and Masaru Tachibana. "Grazing incidence X-ray diffraction study on carbon nanowalls." Chemical Physics Letters 482, no. 1-3 (November 2009): 125–28. http://dx.doi.org/10.1016/j.cplett.2009.09.104.

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23

Takayama, Toru, and Shigeharu Hinotani. "Grazing Incidence X-ray Diffraction Method and the Applications." Bulletin of the Japan Institute of Metals 31, no. 8 (1992): 687–95. http://dx.doi.org/10.2320/materia1962.31.687.

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24

Cui, S. F., Z. H. Mai, L. S. Wu, C. Y. Wang, and D. Y. Dai. "A new scheme for x‐ray grazing incidence diffraction." Review of Scientific Instruments 62, no. 10 (October 1991): 2419–23. http://dx.doi.org/10.1063/1.1142257.

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25

Rugel, S., G. Wallner, H. Metzger, and J. Peisl. "Grazing-incidence X-ray diffraction on ion-implanted silicon." Journal of Applied Crystallography 26, no. 1 (February 1, 1993): 34–40. http://dx.doi.org/10.1107/s0021889892007799.

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26

Akimoto, K., J. Mizuki, I. Hirosawa, and J. Matsui. "Interfacial superstructures studied by grazing incidence x-ray diffraction." Applied Surface Science 41-42 (January 1990): 317–22. http://dx.doi.org/10.1016/0169-4332(89)90078-0.

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27

Faure, Ph, N. Rambert, S. Ragot, A. Gueugnot, C. Genestier, B. Sitaud, and J. P. Itié. "Caractérisation structurale sous haute pression et en température par diffraction des rayons X." Le Journal de Physique IV 08, PR5 (October 1998): Pr5–481—Pr5–487. http://dx.doi.org/10.1051/jp4:1998561.

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28

Marciszko, Marianna, Andrzej Baczmański, Mirosław Wróbel, Wilfrid Seiler, Chedly Braham, and Krzysztof Wierzbanowski. "New Developments of Multireflection Grazing Incidence Diffraction." Advanced Materials Research 996 (August 2014): 147–54. http://dx.doi.org/10.4028/www.scientific.net/amr.996.147.

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The multireflection grazing incident X-ray diffraction (MGIXD) is used to determine a stress gradient in thin surface layers (about 1-20 μm for metals). In this work two theoretical developments of this method are presented. The first procedure enables determination of c/a parameter in hexagonal polycrystalline materials exhibiting residual stresses. In the second method, the influence of stacking faults on the experimental data is considered. The results of both procedures were verified using X-rays diffraction.

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29

Bowen, D. K., and M. Wormington. "Grazing Incidence X-Ray Characterization of Materials." Advances in X-ray Analysis 36 (1992): 171–84. http://dx.doi.org/10.1154/s0376030800018772.

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AbstractA review of the methods of characterization of materials using X-rays incident at grazing angles is presented. The rationale of all such methods is the need to obtain information from near-surface regions. The methods include grazing incidence diffraction, reflectivity, diffuse scatter and fluorescence. The experimental techniques are outlined, and the information obtainable and the methods of interpretation are discussed.

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30

Shen, Chen, René Kirchhof, and Florian Bertram. "A grazing incidence diffraction setup for Langmuir trough experiments at the high-resolution diffraction beamline P08 at PETRA III." Journal of Physics: Conference Series 2380, no. 1 (December 1, 2022): 012047. http://dx.doi.org/10.1088/1742-6596/2380/1/012047.

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Abstract The Langmuir Grazing Incidence Diffraction setup at the high-resolution diffraction beamline P08 of PETRA III is a dedicated setup for grazing incidence X-ray scattering measurements on Langmuir troughs. The instrument is optimized for low background grazing incidence X-ray diffraction measurements at vapour-water interfaces, while offering rapid layer structure assessment by grazing incidence X-ray off-specular scattering, and interfacial element analysis by total reflection X-ray fluorescence spectroscopy. Its control system is intuitive and standardized to provide easy access for non-expert users, and permits automated operation except for sample exchange.

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31

Huang, T. C. "Grazing-incidence X-Ray Analysis of Surfaces and Thin Films." Advances in X-ray Analysis 35, A (1991): 143–50. http://dx.doi.org/10.1154/s0376030800008776.

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AbstractGrazing-incidence X-ray analysis techniques which are commonly used for the nondestructive characterization of surfaces and thin films are reviewed. The X-ray reflectivity technicue is used to study surface uniformity and oxidation, layer thickness and density, interface roughness and diffusion, etc. The grazing-incidence in-plane diffraction technique is used to determine in-plane crystallography of epitaxial films. The grazing-incidence asymmetric-Bragg diffraction is used for surface phase identification and structural depth profiling determination of polycrystalline films. Typical examples to illustrate the types of information that can be obtained by the techniques are presented.

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32

Bouroushian, Mirtat, and Tatjana Kosanovic. "Characterization of Thin Films by Low Incidence X-Ray Diffraction." Crystal Structure Theory and Applications 01, no. 03 (2012): 35–39. http://dx.doi.org/10.4236/csta.2012.13007.

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33

Narvaez-Monroy, J., E. Villalobos-Portillo, L. Fuentes-Cobas, and L. Fuentes-Montero. "Polycrystal x-ray diffraction modelling: grazing incidence versus Bragg-Brentano." Journal of Physics: Conference Series 1723, no. 1 (January 1, 2021): 012047. http://dx.doi.org/10.1088/1742-6596/1723/1/012047.

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34

Van der Sluis, P. "Grazing Incidence Diffraction with a Sealed Tube X-Ray Source." Materials Science Forum 166-169 (July 1994): 141–46. http://dx.doi.org/10.4028/www.scientific.net/msf.166-169.141.

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35

Dröge, Stefan, Manea S. Al Khalifah, Mary O’Neill, Huw E. Thomas, Henje S. Simmonds, J. Emyr Macdonald, Matthew P. Aldred, et al. "Grazing Incidence X-ray Diffraction of a Photoaligned Nematic Semiconductor." Journal of Physical Chemistry B 113, no. 1 (January 8, 2009): 49–53. http://dx.doi.org/10.1021/jp803379a.

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36

Brunel, M., and F. de Bergevin. "Diffraction d'un faisceau de rayons X en incidence très rasante." Acta Crystallographica Section A Foundations of Crystallography 42, no. 5 (September 1, 1986): 299–303. http://dx.doi.org/10.1107/s010876738609921x.

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37

Bezirganyan, H. P., S. E. Bezirganyan, P. H. Bezirganyan, and H. H. Bezirganyan. "Wave field enhancement during grazing incidence X-ray backscattering diffraction." Acta Crystallographica Section A Foundations of Crystallography 63, a1 (August 22, 2007): s253. http://dx.doi.org/10.1107/s0108767307094275.

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38

Matsui, J., and J. Mizuki. "Studies of Semiconductor Interfaces by Grazing Incidence X-Ray Diffraction." Annual Review of Materials Science 23, no. 1 (August 1993): 295–320. http://dx.doi.org/10.1146/annurev.ms.23.080193.001455.

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39

Peterson, I. R., G. Brezesinski, B. Struth, and E. Scalas. "Grazing-Incidence X-ray Diffraction Study of Octadecanoic Acid Monolayers." Journal of Physical Chemistry B 102, no. 47 (November 1998): 9437–42. http://dx.doi.org/10.1021/jp981941p.

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40

Tseng, T. P., and S. L. Chang. "Phase effects in three-beam grazing-incidence X-ray diffraction." Acta Crystallographica Section A Foundations of Crystallography 46, no. 7 (July 1, 1990): 567–76. http://dx.doi.org/10.1107/s0108767390003166.

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41

Garbauskas, Mary F., Donald G. LeGrand, and Raymond P. Goehner. "Application of Grazing Incidence X-Ray Diffraction to Polymer Blends." Advances in X-ray Analysis 36 (1992): 373–77. http://dx.doi.org/10.1154/s037603080001898x.

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AbstractThe physical properties of polymer blends consisting of one or more crystallizable components are affected by the microstructure of these materials. In particular, the degree of crystallinity can be influenced by processing parameters, and the crystallinity, as well as the phase distribution, may vary as a function of depth through an injection molded part. Conventional x-ray diffraction techniques can provide information regarding both phase composition and degree of crystallinity, but, because of the relative transparency of these materials to wavelengths generally available in the laboratory, these techniques provide information representative of only the bulk. By employing parallel beam optics at varying grazing incidence angles, the x-ray sampling depth can be varied without loss of resolution, This technique can be used to vary the effective analysis depth from the top several hundred angstroms for low grazing incidence to centimeters for transmission diffraction patterns, Grazing incidence techniques have found initial application in the characterization of thin metallic and ceramic films. This paper demonstrates the feasibility of using parallel beam optics to depth profile low atomic number materials. The specific application of this technique to the characterization of injection molded polymers, including a blend of bisphenol-A polycarbonate (PC) and polybutylene terephthalate (PBT), will be presented.

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42

Sripukdee, M., C. Songsiriritthigul, N. Mothong, K. Seawsakul, T. Saisopa, M. Horprathum, and P. Songsiriritthigul. "Grazing Incidence X-Ray Diffraction using Synchrotron Light at SLRI." Journal of Physics: Conference Series 1144 (December 2018): 012052. http://dx.doi.org/10.1088/1742-6596/1144/1/012052.

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43

HASHIZUME, H., and O. SAKATA. "DYNAMICAL X-RAY DIFFRACTION FROM CRYSTALS UNDER GRAZING-INCIDENCE CONDITIONS." Le Journal de Physique Colloques 50, no. C7 (October 1989): C7–225—C7–229. http://dx.doi.org/10.1051/jphyscol:1989724.

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44

Segmüller, Armin. "Characterization of epitaxial films by grazing-incidence X-ray diffraction." Thin Solid Films 154, no. 1-2 (November 1987): 33–42. http://dx.doi.org/10.1016/0040-6090(87)90349-x.

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45

Vaia, Richard A., Maura S. Weathers, and William A. Bassett. "Anomalous peaks in grazing incidence thin film X-ray diffraction." Powder Diffraction 9, no. 1 (March 1994): 44–49. http://dx.doi.org/10.1017/s0885715600019679.

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Numerous spurious X-ray peaks were encountered during grazing incidence angle diffractometer scans of ceramic and polymeric thin films on crystalline and amorphous substrate materials. At least three possible sources of spurious peaks are identified. (1) At (2θ) values greater than ∼ 10°, Laue reflections from characteristic and Bremsstrahlung continuum radiation produce spurious peaks with a (2θ) dependence on X-ray incident angle and sample orientation. At (2θ) values less than 10°, (2) specular X-ray reflection from a boundary between two media of different indices of refraction and (3) diffuse surface scattering produces spurious peaks with a dependence on X-ray incident angle and sample surface topography. From an understanding of the spurious peaks, improved experimental techniques may be developed. Because these peaks can interfere significantly with grazing incidence diffractometer scans, it is particularly important to those making studies of thin films by this asymmetric diffraction geometry to be aware of the existence and origins of these spurious peaks.

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46

Akimoto, K., J. Mizuki, I. Hirosawa, and J. Matsui. "MBE apparatus for in situ grazing incidence x‐ray diffraction." Review of Scientific Instruments 60, no. 7 (July 1989): 2362–64. http://dx.doi.org/10.1063/1.1140772.

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47

Carino, Stephen R., Royale S. Underhill, Holger S. Tostmann, Andrew M. Skolnik, Jennifer L. Logan, Mark R. Davidson, Jeffrey T. Culp, and Randolph S. Duran. "Grazing Incidence Synchrotron X-ray Diffraction of Polymerizing Langmuir Monolayers." Langmuir 19, no. 25 (December 2003): 10514–22. http://dx.doi.org/10.1021/la034444v.

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48

Simbrunner, Josef, Sebastian Hofer, Benedikt Schrode, Ingo Salzmann, and Roland Resel. "Indexing grazing-incidence X-ray diffraction patterns of thin films." Acta Crystallographica Section A Foundations and Advances 75, a2 (August 18, 2019): e715-e715. http://dx.doi.org/10.1107/s2053273319088417.

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49

Tanner, B. K., T. P. A. Hase, T. A. Lafford, and M. S. Goorsky. "Grazing incidence in-plane X-ray diffraction in the laboratory." Powder Diffraction 19, no. 1 (March 2004): 45–48. http://dx.doi.org/10.1154/1.1649319.

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The laboratory implementation of grazing incidence in-plane X-ray diffraction, using an unmodified commercial diffractometer, is described. Low resolution, high intensity measurements are illustrated in the study of the in-plane lattice parameters and texture of a thin polycrystalline ZnO film on glass, the in-plane order in Cd arachidate Langmuir–Blodgett films, and the depth dependence of the lattice parameter in graded Si–Ge epilayers. Use of an asymmetrically cut Ge crystal to compress and monochromate the beam provides a high resolution setting, appropriate to measurement of the in-plane mosaic of mismatched epilayers such as GaN on sapphire.

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50

Krčmář, J., V. Holý, and I. Vávra. "Standing-wave-grazing-incidence x-ray diffraction from polycrystalline multilayers." Applied Physics Letters 94, no. 10 (March 9, 2009): 101909. http://dx.doi.org/10.1063/1.3095496.

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Journal articles on the topic 'Diffraction X sous incidence'

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