Log in

Relevant bibliographies by topics / Diffraction X / Journal articles

To see the other types of publications on this topic, follow the link: Diffraction X.

Journal articles on the topic 'Diffraction X'

Author: Grafiati

Published: 4 June 2021

Last updated: 25 May 2024

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Consult the top 50 journal articles for your research on the topic 'Diffraction X.'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Browse journal articles on a wide variety of disciplines and organise your bibliography correctly.

1

Iqra Zubair Awan, Iqra Zubair Awan. "X-Ray Diffraction – The Magic Wand." Journal of the chemical society of pakistan 42, no. 3 (2020): 317. http://dx.doi.org/10.52568/000646.

Full text

Abstract:

This review paper covers one of the most important discoveries of the last century, viz. X-ray diffraction. It has made enormous contribution to chemistry, physics, engineering, materials science, crystallography and above all medical sciences. The review covers the history of X-rays detection and production, its uses/ applications. The scientific and medical community will forever be indebted to Rand#246;ntgen for this invaluable discovery and to those who perfected its application.

APA, Harvard, Vancouver, ISO, and other styles

2

Iqra Zubair Awan, Iqra Zubair Awan. "X-Ray Diffraction – The Magic Wand." Journal of the chemical society of pakistan 42, no. 3 (2020): 317. http://dx.doi.org/10.52568/000646/jcsp/42.03.2020.

Full text

Abstract:

This review paper covers one of the most important discoveries of the last century, viz. X-ray diffraction. It has made enormous contribution to chemistry, physics, engineering, materials science, crystallography and above all medical sciences. The review covers the history of X-rays detection and production, its uses/ applications. The scientific and medical community will forever be indebted to Rand#246;ntgen for this invaluable discovery and to those who perfected its application.

APA, Harvard, Vancouver, ISO, and other styles

3

Irzhak, D. V., M. A. Knyasev, V. I. Punegov, and D. V. Roshchupkin. "X-ray diffraction by phase diffraction gratings." Journal of Applied Crystallography 48, no. 4 (2015): 1159–64. http://dx.doi.org/10.1107/s1600576715011607.

Full text

Abstract:

The diffraction properties of phase gratings with the periodD= 1.6, 1.0 and 0.5 µm fabricated on an Si(111) crystal by e-beam lithography were studied by triple-axis X-ray diffraction. A 100 nm-thick tungsten layer was used as a phase-shift layer. It is shown that the presence of a grating as a phase-shift W layer on the surface of the Si(111) crystal causes the formation of a complicated two-dimensional diffraction pattern related to the diffraction of X-rays on the phase grating at the X-ray entrance and exit from the crystal. A model of X-ray diffraction on the W phase diffraction grating is proposed.

APA, Harvard, Vancouver, ISO, and other styles

4

Ba Ha, Truong, and I. Ya Dubovskaya. "Diffraction X-Ray Radiation under Multiwave Diffraction." physica status solidi (b) 155, no. 2 (1989): 685–95. http://dx.doi.org/10.1002/pssb.2221550240.

Full text

APA, Harvard, Vancouver, ISO, and other styles

5

KOBAYASHI, Shintaro. "Surface X-ray Diffraction." Journal of the Japan Society of Colour Material 87, no. 1 (2014): 31–35. http://dx.doi.org/10.4011/shikizai.87.31.

Full text

APA, Harvard, Vancouver, ISO, and other styles

6

Takahashi, Toshio. "X-ray surface diffraction." Bulletin of the Japan Institute of Metals 28, no. 3 (1989): 203–7. http://dx.doi.org/10.2320/materia1962.28.203.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

Robinson, I. K. "Surface X-ray diffraction." Acta Crystallographica Section A Foundations of Crystallography 43, a1 (1987): C205. http://dx.doi.org/10.1107/s0108767387080024.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Wark, J. "Femtosecond X-ray diffraction." Acta Crystallographica Section A Foundations of Crystallography 62, a1 (2006): s2. http://dx.doi.org/10.1107/s010876730609996x.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

Afanas'ev, Alexander M., Rafik M. Imamov, and Enver Kh Mukhmedzhanov. "Asymmetric X-Ray Diffraction." Crystallography Reviews 3, no. 2 (1992): 157–226. http://dx.doi.org/10.1080/08893119208032970.

Full text

APA, Harvard, Vancouver, ISO, and other styles

10

Robinson, I. K., and D. J. Tweet. "Surface X-ray diffraction." Reports on Progress in Physics 55, no. 5 (1992): 599–651. http://dx.doi.org/10.1088/0034-4885/55/5/002.

Full text

APA, Harvard, Vancouver, ISO, and other styles

11

CAVALLERI, ANDREA, CRAIG W. SIDERS, KLAUS SOKOLOWSKI-TINTEN, et al. "Femtosecond X-Ray Diffraction." Optics and Photonics News 12, no. 5 (2001): 28. http://dx.doi.org/10.1364/opn.12.5.000028.

Full text

APA, Harvard, Vancouver, ISO, and other styles

12

Grant, J. A., M. J. Morgan, J. R. Davis, D. R. Davies, and P. Wells. "X-ray diffraction microtomography." Measurement Science and Technology 4, no. 1 (1993): 83–87. http://dx.doi.org/10.1088/0957-0233/4/1/014.

Full text

APA, Harvard, Vancouver, ISO, and other styles

13

MacDowell, A. A., R. S. Celestre, N. Tamura, et al. "Submicron X-ray diffraction." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 467-468 (July 2001): 936–43. http://dx.doi.org/10.1016/s0168-9002(01)00530-7.

Full text

APA, Harvard, Vancouver, ISO, and other styles

14

JACOBY, MITCH. "FEMTOSECOND X-RAY DIFFRACTION." Chemical & Engineering News 75, no. 49 (1997): 5. http://dx.doi.org/10.1021/cen-v075n049.p005.

Full text

APA, Harvard, Vancouver, ISO, and other styles

15

Thibault, Pierre, and Veit Elser. "X-Ray Diffraction Microscopy." Annual Review of Condensed Matter Physics 1, no. 1 (2010): 237–55. http://dx.doi.org/10.1146/annurev-conmatphys-070909-104034.

Full text

APA, Harvard, Vancouver, ISO, and other styles

16

Wark, J. S., and H. He. "Subpicosecond X-ray diffraction." Laser and Particle Beams 12, no. 3 (1994): 507–13. http://dx.doi.org/10.1017/s0263034600008363.

Full text

Abstract:

With the advent of ultrashort (subpicosecond) high-power lasers it is now possible to create intense bursts of X-rays with subpicosecond durations. An analysis of the temporal response of diffraction of such X-rays by crystals in both the dynamical and kinematic regime is presented. It is also shown that under certain conditions the temporal resolution can be determined by the response of the crystal.

APA, Harvard, Vancouver, ISO, and other styles

17

Badawi, F., and P. Villain. "Stress and elastic-constant analysis by X-ray diffraction in thin films." Journal of Applied Crystallography 36, no. 3 (2003): 869–79. http://dx.doi.org/10.1107/s0021889803002486.

Full text

Abstract:

Residual stresses influence most physical properties of thin films and are closely related to their microstructure. Among the most widely used methods, X-ray diffraction is the only one allowing the determination of both the mechanical and microstructural state of each diffracting phase. Diffracting planes are used as a strain gauge to measure elastic strains in one or several directions of the diffraction vector. Important information on the thin-film microstructure may also be extracted from the width of the diffraction peaks: in particular, the deconvolution of these peaks allows values of coherently diffracting domain size and microdistortions to be obtained. The genesis of residual stresses in thin films results from multiple mechanisms. Stresses may be divided into three major types: epitaxic stresses, thermal stresses and intrinsic stresses. Diffraction methods require the knowledge of the thin-film elastic constants, which may differ from the bulk-material values as a result of the particular microstructure. Combining an X-ray diffractometer with a tensile tester, it is possible to determine X-ray elastic constants of each diffracting phase in a thin-film/substrate system, in particular the Poisson ratio and the Young modulus. It is important to notice that numerous difficulties relative to the application of diffraction methods may arise in the case of thin films.

APA, Harvard, Vancouver, ISO, and other styles

18

KOBAYASHI, MASAMICHI. "X-rey Diffraction: Dynamics Studied by Time-resolved Synchrotron X-ray Diffraction." Sen'i Gakkaishi 49, no. 4 (1993): P130—P134. http://dx.doi.org/10.2115/fiber.49.4_p130.

Full text

APA, Harvard, Vancouver, ISO, and other styles

19

Ilinca, Gheorghe, and Emil Makovicky. "X-ray powder diffraction properties of pavonite homologues." European Journal of Mineralogy 11, no. 4 (1999): 691–708. http://dx.doi.org/10.1127/ejm/11/4/0691.

Full text

APA, Harvard, Vancouver, ISO, and other styles

20

Lyman, Charles. "Diffraction." Microscopy Today 20, no. 2 (2012): 7. http://dx.doi.org/10.1017/s1551929512000107.

Full text

Abstract:

This year marks the 100th anniversary of the discovery of X-ray diffraction and the 85th anniversary of electron diffraction (see Microscopy Pioneers). For most of the time since their introduction, microscopists have known these two techniques as the primary phase identification methods used in conjunction with various microscopies. However, these two diffraction methods also have played enormous roles in understanding the structure of matter, as well as the nature of both X rays and electrons.

APA, Harvard, Vancouver, ISO, and other styles

21

A.M. Nastas, M.S. Iovu, A.M. Prisacar, et al. "Influence of the corona discharge on the formation of the diffractive holographic gratings in the As-=SUB=-40-=/SUB=-S-=SUB=-60-x-=/SUB=-Se-=SUB=-x-=/SUB=- films." Technical Physics 68, no. 5 (2023): 651. http://dx.doi.org/10.21883/tp.2023.05.56072.285-22.

Full text

Abstract:

The influence of the corona discharge on the holographic recording and the subsequence chemical etching of the recording holographic gratings in the Cr/As40S60-xSex thin film structures was investigated. It was established that applied of the positive corona discharge leads to the increase of the holographic sensitivity during the recording in the As-S-Se films, as well as to the amplification of the diffraction efficiency of the recording gratings and of the relief-phase diffractive gratings obtaining in the result of the consecutive chemical etching. Among the investigated films of the As40S60-xSex system, the best results on the application of the Argon laser irradiation (488 nm) was obtaining for the composition As40S39Se21. Applied of the corona discharge bring to the increase of the holographic sensitivity more than up two order, and of the diffraction efficiency about three order in the respect of the of the ordinary recording. Reciprocally was reached a amplification of the diffraction efficiency of the relief diffraction gratings formed in the result of the sequent chemical etching up to 30%. Keywords: chalcogenide vitreous semiconductors, holographic diffractive grating, corona discharge, diffraction efficiency, selective etching.

APA, Harvard, Vancouver, ISO, and other styles

22

Koker, M. K. A., U. Welzel, and E. J. Mittemeijer. "Measurement of X-ray diffraction-line broadening induced by elastic mechanical grain interaction." Journal of Applied Crystallography 47, no. 1 (2014): 391–401. http://dx.doi.org/10.1107/s1600576713032202.

Full text

Abstract:

Various grain-interaction models have been proposed in the literature to describe the stress and strain behavior of individual grains within a massive aggregate. Diffraction lines exhibit a response to the occurrence of a strain distribution in the diffracting crystallites, selected by the direction of the diffraction vector with respect to the specimen frame of reference, by correspondingly induced diffraction-line broadening. This work provides a report of synchrotron diffraction investigations dedicated to the measurement of the experimentally observable diffraction-line broadening induced by external elastic loading of various polycrystalline specimens. The experimentally obtained broadening data have been compared with those calculated adopting various grain-interaction models. Although such grain-interaction models have been proven to accurately predict the average (X-ray) diffraction measured lattice strain, as derived from the diffraction-peak position, the present results have demonstrated that the extent of the diffraction-line broadening due to grain interactions, as calculated by employing these grain-interaction models, is much smaller than the experimentally determined broadening. The obtained results have vast implications for diffraction-line broadening analysis and the understanding of the elastic behavior of massive polycrystals.

APA, Harvard, Vancouver, ISO, and other styles

23

Popović, Stanko, and Željko Skoko. "X-ray diffraction broadening analysis." Macedonian Journal of Chemistry and Chemical Engineering 34, no. 1 (2015): 39. http://dx.doi.org/10.20450/mjcce.2015.642.

Full text

Abstract:

The microstructure is very important in research aimed to the development of new materials. The microstructural parameters, crystallite size, crystallite size distribution, crystallite strain, dislocation density and stacking fault probability, play a major role in physical and chemical properties of the material. These parameters can be determined by a proper analysis of X-ray diffraction line profile broadening. The observed XRD line profile of the studied sample, <em>h</em>(<em>ε</em>), is the convolution of the instrumental profile, <em>g</em>(<em>ε</em>), inherent in diffraction, and pure diffraction profile, <em>f</em>(<em>ε</em>), caused by small crystallite (coherent domain) sizes, by faultings in the sequence of the crystal lattice planes, and by the strains in the crystallites. That is, <em>f</em>(<em>ε</em>) is the convolution of the crystallite size/faulting profile, <em>p</em>(<em>ε</em>), and the strain profile, <em>s</em>(<em>ε</em>). The derivation of <em>f</em>(<em>ε</em>) can be performed from the measured <em>h</em>(<em>ε</em>) and <em>g</em>(<em>ε</em>) by the Fourier transform method, usually referred to as the Stokes method. That method does not require assumptions in the mathematical description of <em>h</em>(<em>ε</em>) and <em>g</em>(<em>ε</em>). The analysis of <em>f</em>(<em>ε</em>) can be done by the Warren-Averbach method, which is applied to the Fourier coefficients obtained by the deconvolution. On the other hand, simplified methods (which may bypass the deconvolution) based on integral widths may be used, especially in studies where a good relative accuracy suffices. In order to obtain the relation among integral widths of <em>f</em>(<em>ε</em>), <em>p</em>(<em>ε</em>) and <em>s</em>(<em>ε</em>), one assumes bell-shaped functions for <em>p</em>(<em>ε</em>) and <em>s</em>(<em>ε</em>). These functions are routinely used in the profile fitting of the XRD pattern and in the Rietveld refinement of the crystal structure. The derived crystallite size and strain parameters depend on the assumptions for the profiles <em>p</em>(<em>ε</em>) and <em>s</em>(<em>ε</em>). Integral width methods overestimate both strain and crystallite size parameters in comparison to the Warren-Averbach-Stokes method. Also, the crystallite size parameter is more dependent on the accuracy, with which the profile tails are measured and how they are truncated, than it is the strain parameter. The integral width also depends on the background level error of the pure diffraction profile. The steps and precautions, which are necessary in order to minimize the errors, are suggested through simple examples. The values of the crystallite size and strain parameters, obtained from integral widths derived by the Stokes deconvolution, are compared with those which followed from the Warren-Averbach treatment of broadening. Recent approaches in derivation of microstructure are also mentioned in short.

APA, Harvard, Vancouver, ISO, and other styles

24

LEE, Hyeon Jun, and Ji Young JO. "Time-Resolved X-ray Diffraction." Physics and High Technology 24, no. 9 (2015): 6. http://dx.doi.org/10.3938/phit.24.042.

Full text

APA, Harvard, Vancouver, ISO, and other styles

25

Cox, D. E. "Synchrotron X-Ray Powder Diffraction." MRS Bulletin 12, no. 1 (1987): 16–20. http://dx.doi.org/10.1557/s088376940006869x.

Full text

Abstract:

X-ray powder diffraction is one of the most widely used techniques by scientists engaged in the synthesis, analysis, and characterization of solids. It is estimated that there are now about 25,000 users throughout the world, of which about one third are in the United States. Any single-phase polycrystalline material gives an x-ray pattern which can be regarded as a unique “fingerprint,” and modern automated search-and-match techniques used in conjunction with the Powder Diffraction File (maintained by the International Center for Diffraction Data, Swarthmore, PA) allow routine analysis of samples in minutes. From an x-ray pattern of good quality it is possible to determine unit cell parameters with high accuracy and impurity concentrations of 1-5%, so that powder techniques are extremely valuable in phase equilibrium studies and residual stress measurements, for example. In addition, a detailed analysis of line shapes gives information about physical properties such as the size and shape of the individual crystallites, microscopic strain, and stacking disorder.In the early days of crystallography many simple (and some not-so-simple) structures were solved from x-ray powder diffraction patterns, but the obvious limitations to the number of individual reflection intensities which can be estimated and the increasing sophistication of single-crystal techniques resulted in a decline in the importance of this application in the 1950s and 1960s.

APA, Harvard, Vancouver, ISO, and other styles

26

Chen, Haydn. "Surface/Interface X-Ray Diffraction." Materials Science Forum 189-190 (July 1995): 95–106. http://dx.doi.org/10.4028/www.scientific.net/msf.189-190.95.

Full text

APA, Harvard, Vancouver, ISO, and other styles

27

Garlick, George Donald. "Reflections on X-Ray Diffraction." Journal of Geoscience Education 45, no. 4 (1997): 317–21. http://dx.doi.org/10.5408/1089-9995-45.4.317.

Full text

APA, Harvard, Vancouver, ISO, and other styles

28

Matsuo, Munetsugu, and Masayuki Okamoto. "Energy dispersive X-ray diffraction." Bulletin of the Japan Institute of Metals 28, no. 3 (1989): 208–12. http://dx.doi.org/10.2320/materia1962.28.208.

Full text

APA, Harvard, Vancouver, ISO, and other styles

29

Chapman, D., W. Thomlinson, R. E. Johnston, et al. "Diffraction enhanced x-ray imaging." Physics in Medicine and Biology 42, no. 11 (1997): 2015–25. http://dx.doi.org/10.1088/0031-9155/42/11/001.

Full text

APA, Harvard, Vancouver, ISO, and other styles

30

Höche, H. R., O. Brümmer, and J. Nieber. "Extremely skew X-ray diffraction." Acta Crystallographica Section A Foundations of Crystallography 42, no. 6 (1986): 585–87. http://dx.doi.org/10.1107/s0108767386098707.

Full text

APA, Harvard, Vancouver, ISO, and other styles

31

Cao, Jianshu, and Kent R. Wilson. "Ultrafast X-ray Diffraction Theory." Journal of Physical Chemistry A 102, no. 47 (1998): 9523–30. http://dx.doi.org/10.1021/jp982054p.

Full text

APA, Harvard, Vancouver, ISO, and other styles

32

Miao, Jianwei, Richard L. Sandberg, and Changyong Song. "Coherent X-Ray Diffraction Imaging." IEEE Journal of Selected Topics in Quantum Electronics 18, no. 1 (2012): 399–410. http://dx.doi.org/10.1109/jstqe.2011.2157306.

Full text

APA, Harvard, Vancouver, ISO, and other styles

33

Yamane, H., T. Sakamoto, S. I. Kubota, and M. Shimada. "Gd3GaO6by X-ray powder diffraction." Acta Crystallographica Section C Crystal Structure Communications 55, no. 4 (1999): 479–81. http://dx.doi.org/10.1107/s0108270198016096.

Full text

APA, Harvard, Vancouver, ISO, and other styles

34

HONDO, TAKEO. "X-ray diffraction in glaciology." Journal of the Japanese Society of Snow and Ice 51, no. 3 (1989): 184–94. http://dx.doi.org/10.5331/seppyo.51.184.

Full text

APA, Harvard, Vancouver, ISO, and other styles

35

Palancher, H., S. Bos, J. F. Bérar, I. Margiolaki, and J. L. Hodeau. "X-ray resonant powder diffraction." European Physical Journal Special Topics 208, no. 1 (2012): 275–89. http://dx.doi.org/10.1140/epjst/e2012-01624-1.

Full text

APA, Harvard, Vancouver, ISO, and other styles

36

Woerner, Michael. "Femtosecond X-ray powder diffraction." Acta Crystallographica Section A Foundations and Advances 71, a1 (2015): s150. http://dx.doi.org/10.1107/s205327331509779x.

Full text

APA, Harvard, Vancouver, ISO, and other styles

37

Wark, Justin. "Time-resolved X-ray diffraction." Contemporary Physics 37, no. 3 (1996): 205–18. http://dx.doi.org/10.1080/00107519608217528.

Full text

APA, Harvard, Vancouver, ISO, and other styles

38

Hansford, G. M. "Phase-targeted X-ray diffraction." Journal of Applied Crystallography 49, no. 5 (2016): 1561–71. http://dx.doi.org/10.1107/s1600576716011936.

Full text

Abstract:

A powder X-ray diffraction (XRD) method to enhance the signal of a specific crystalline phase within a mixture is presented for the first time. Specificity to the targeted phase relies on finding coincidences in the ratios of crystal d spacings and the ratios of elemental characteristic X-ray energies. Such coincidences can be exploited so that the two crystal planes diffract through the same scattering angle at two different X-ray energies. An energy-resolving detector placed at the appropriate scattering angle will detect a significantly enhanced signal at these energies if the target mineral or phase is present in the sample. When implemented using high scattering angles, for example 2θ > 150°, the method is tolerant to sample morphology and distance on the scale of ∼2 mm. The principle of the method is demonstrated experimentally using Pd Lα1 and Pd Lβ1 emission lines to enhance the diffraction signal of quartz. Both a pure quartz powder pellet and an unprepared mudstone rock specimen are used to test and develop the phase-targeted method. The technique is further demonstrated in the sensitive detection of retained austenite in steel samples using a combination of In Lβ1 and Ti Kβ emission lines. For both these examples it is also shown how the use of an attenuating foil, with an absorption edge close to and above the higher-energy characteristic X-ray line, can serve to isolate to some degree the coincidence signals from other fluorescence and diffraction peaks in the detected spectrum. The phase-targeted XRD technique is suitable for implementation using low-cost off-the-shelf components in a handheld or in-line instrument format.

APA, Harvard, Vancouver, ISO, and other styles

39

Palmer, D. Jason. "X-ray diffraction strikes gold." Materials Today 10, no. 12 (2007): 9. http://dx.doi.org/10.1016/s1369-7021(07)70293-6.

Full text

APA, Harvard, Vancouver, ISO, and other styles

40

Sadeghi, Mohammad-Ali, George V. Chilingarian, and Teh Fu Yen. "X-Ray Diffraction of Asphaltenes." Energy Sources 8, no. 2-3 (1986): 99–123. http://dx.doi.org/10.1080/00908318608946045.

Full text

APA, Harvard, Vancouver, ISO, and other styles

41

Stanjek, H., and W. Häusler. "Basics of X-ray Diffraction." Hyperfine Interactions 154, no. 1-4 (2004): 107–19. http://dx.doi.org/10.1023/b:hype.0000032028.60546.38.

Full text

APA, Harvard, Vancouver, ISO, and other styles

42

Ono, Yasuhiro, Kazuya Takayama, and Tsuyoshi Kajitani. "X-Ray Diffraction Study ofLaBSiO5." Journal of the Physical Society of Japan 65, no. 10 (1996): 3224–28. http://dx.doi.org/10.1143/jpsj.65.3224.

Full text

APA, Harvard, Vancouver, ISO, and other styles

43

Hajdu, Janos. "Single-molecule X-ray diffraction." Current Opinion in Structural Biology 10, no. 5 (2000): 569–73. http://dx.doi.org/10.1016/s0959-440x(00)00133-0.

Full text

APA, Harvard, Vancouver, ISO, and other styles

44

Stepanov, S. A., E. A. Kondrashkina, and D. V. Novikov. "X-ray surface back diffraction." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 301, no. 2 (1991): 350–57. http://dx.doi.org/10.1016/0168-9002(91)90478-9.

Full text

APA, Harvard, Vancouver, ISO, and other styles

45

Lovesey, Stephen W. "X-ray diffraction by CeB6." Journal of Physics: Condensed Matter 14, no. 17 (2002): 4415–23. http://dx.doi.org/10.1088/0953-8984/14/17/314.

Full text

APA, Harvard, Vancouver, ISO, and other styles

46

Balyan, Minas K. "X-ray nonlinear Bragg diffraction." Journal of Nanophotonics 11, no. 1 (2017): 016003. http://dx.doi.org/10.1117/1.jnp.11.016003.

Full text

APA, Harvard, Vancouver, ISO, and other styles

47

Grant, J. A., M. J. Morgan, J. R. Davis, D. R. Davies, and P. Wells. "51726 X-ray diffraction microtomography." NDT & E International 27, no. 2 (1994): 104. http://dx.doi.org/10.1016/0963-8695(94)90351-4.

Full text

APA, Harvard, Vancouver, ISO, and other styles

48

Attfield, J. P. "Resonant Powder X-Ray Diffraction." Materials Science Forum 228-231 (July 1996): 201–6. http://dx.doi.org/10.4028/www.scientific.net/msf.228-231.201.

Full text

APA, Harvard, Vancouver, ISO, and other styles

49

MORISHIGE, Kunimitsu. "X-ray diffraction of surfaces." Hyomen Kagaku 7, no. 1 (1986): 52–60. http://dx.doi.org/10.1380/jsssj.7.52.

Full text

APA, Harvard, Vancouver, ISO, and other styles

50

Allais, C., G. Keller, P. Lesieur, M. Ollivon, and F. Artzner. "X-ray diffraction/Calorimetry coupling." Journal of Thermal Analysis and Calorimetry 74, no. 3 (2003): 723–28. http://dx.doi.org/10.1023/b:jtan.0000011004.45180.0a.

Full text

APA, Harvard, Vancouver, ISO, and other styles

We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!