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Journal articles on the topic 'Directional emissivity'

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1

Taimarov, M. A., K. A. Rusev, and F. A. Garifullin. "Directional emissivity of structural materials." Journal of Engineering Physics 49, no. 2 (August 1985): 939–42. http://dx.doi.org/10.1007/bf00872646.

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2

SOBRINO, J., J. JIMENEZMUNOZ, and W. VERHOEF. "Canopy directional emissivity: Comparison between models." Remote Sensing of Environment 99, no. 3 (November 30, 2005): 304–14. http://dx.doi.org/10.1016/j.rse.2005.09.005.

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3

IUCHI, Tohru, Tomoyuki TSURUKAWAYA, and Akira TAZOE. "Emissivity Compensated Radiation Thermometry Using Directional Radiances." Transactions of the Society of Instrument and Control Engineers 34, no. 3 (1998): 175–81. http://dx.doi.org/10.9746/sicetr1965.34.175.

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4

Wald, Andrew E., and John W. Salisbury. "Thermal infrared directional emissivity of powdered quartz." Journal of Geophysical Research: Solid Earth 100, B12 (December 10, 1995): 24665–75. http://dx.doi.org/10.1029/95jb02400.

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5

Kowsary, F., and J. R. Mahan. "Radiative Characteristic of Spherical Cavities With Specular Reflectivity Component." Journal of Heat Transfer 128, no. 3 (July 28, 2005): 261–68. http://dx.doi.org/10.1115/1.2151196.

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An exact analytical method is presented for determination of emissive as well as absorptive performance of spherical cavities having diffuse-specular reflective walls. The method presented utilizes a novel coordinate transformation technique, which provides convenient means for setting up the governing radiant exchange integral equations. These equations are then solved by the usual iterative method devized for the Fredholm integral equation of the second kind. The suggested coordinate transformation is also utilized for determination of directional absorptivity of a fully specular spherical cavity when collimated radiation enters through its mouth from a specified direction. Results show that for a spherical cavity the dependence of the apparent emissivity on the degree of specularity is high when the emissivity of the cavity wall is low, but this dependence decreases as the emissivity of the cavity wall increases. Also there are situations, unlike cases of cylindrical and conical cavities, for which the purely diffuse spherical cavity is a more efficient emitter than the purely specular cavity having an identical geometry and wall emissivity. Moreover, it is shown that the apparent directional absorptivity of specular spherical cavities having small openings becomes highly fluctuating as the direction of the incident radiation changes
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6

Zhang, Li Yong, and Yu Kun Liang. "The Equipment on High Sensitive Test of Infrared Directional Emissivity of Materials." Advanced Materials Research 291-294 (July 2011): 1272–77. http://dx.doi.org/10.4028/www.scientific.net/amr.291-294.1272.

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This paper introduces an approach of novel principle to measure the directional emissivity of material surfaces direct. The value of the infrared directional emissivity is obtained by comparing the surface spectral emissivity of testing samples to a blackbody reference. Weak signals are measured with pyroelectric detector by optical modulation and phase-locked amplified technologies. Our experiment is implemented with stainless steel in circumstance of 20 - 300°C, the testing sample is 8µm- 14μm. Compare to the reference and the calibration value without a cooling process, combined uncertainty is less than 0.04, and the result is satisfied.
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7

Xu, Jin, Jyotirmoy Mandal, and Aaswath P. Raman. "Broadband directional control of thermal emission." Science 372, no. 6540 (April 22, 2021): 393–97. http://dx.doi.org/10.1126/science.abc5381.

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Controlling the directionality of emitted far-field thermal radiation is a fundamental challenge. Photonic strategies enable angular selectivity of thermal emission over narrow bandwidths, but thermal radiation is a broadband phenomenon. The ability to constrain emitted thermal radiation to fixed narrow angular ranges over broad bandwidths is an important, but lacking, capability. We introduce gradient epsilon-near-zero (ENZ) materials that enable broad-spectrum directional control of thermal emission. We demonstrate two emitters consisting of multiple oxides that exhibit high (>0.7, >0.6) directional emissivity (60° to 75°, 70° to 85°) in the p-polarization for a range of wavelengths (10.0 to 14.3 micrometers, 7.7 to 11.5 micrometers). This broadband directional emission enables meaningful radiative heat transfer primarily in the high emissivity directions. Decoupling the conventional limitations on angular and spectral response improves performance for applications such as thermal camouflaging, solar heating, radiative cooling, and waste heat recovery.
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8

Kononogova, Elena, Albert Adibekyan, Christian Monte, and Jörg Hollandt. "Characterization, calibration and validation of an industrial emissometer." Journal of Sensors and Sensor Systems 8, no. 1 (June 27, 2019): 233–42. http://dx.doi.org/10.5194/jsss-8-233-2019.

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Abstract. We report on the radiometric characterization and calibration of the TIR 100-2 (INGLAS Produktions GmbH, 2019) industrial emissometer. This instrument is used for handheld, on-site directional total emissivity measurements in industrial applications, e.g., the measurement of the emissivity of highly reflective thermal insulation materials. The diameter of the measurement field is determined by two different methods. The emissometer is calibrated with three different sets of low- and high-emissivity reference samples. Each calibration is validated by comparing the results of the TIR 100-2 to directional total emissivity results of the Emissivity Measurement in Air Facility (EMAF) at the Physikalisch-Technische Bundesanstalt (PTB), Berlin. Finally, the hemispherical total emissivity of highly reflective thermal insulation materials is determined using the TIR 100-2 according to the European Standard EN 12898, and, again, the results are validated with results obtained at the EMAF.
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9

Zhao Wanmeng, 赵晚梦, 李龙飞 Li Longfei, 原泽野 Yuan Zeye, 王刚圈 Wang Gangquan, 刘玉芳 Liu Yufang, and 于坤 Yu Kun. "Directional Spectral Emissivity of Ti-6Al-4V Alloy." Acta Optica Sinica 40, no. 8 (2020): 0830002. http://dx.doi.org/10.3788/aos202040.0830002.

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10

Niu, Chun-Yang, Hong Qi, Ya-Tao Ren, and Li-Ming Ruan. "Apparent directional spectral emissivity determination of semitransparent materials." Chinese Physics B 25, no. 4 (April 2016): 047801. http://dx.doi.org/10.1088/1674-1056/25/4/047801.

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11

Burckel, D. Bruce, Paul S. Davids, Patrick S. Finnegan, Pedro N. Figueiredo, and James C. Ginn. "Directional emissivity from two-dimensional infrared waveguide arrays." Applied Physics Letters 107, no. 12 (September 21, 2015): 121902. http://dx.doi.org/10.1063/1.4931124.

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12

Pérez-Planells, Lluís, Enric Valor, Raquel Niclòs, César Coll, Jesús Puchades, and Manuel Campos-Taberner. "Evaluation of Six Directional Canopy Emissivity Models in the Thermal Infrared Using Emissivity Measurements." Remote Sensing 11, no. 24 (December 14, 2019): 3011. http://dx.doi.org/10.3390/rs11243011.

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Land surface temperature (LST) is a fundamental physical quantity in a range of different studies, for example in climatological analyses and surface–atmosphere heat flux assessments, especially in heterogeneous and complex surfaces such as vegetated canopies. To obtain accurate LST values, it is important to measure accurately the land surface emissivity (LSE) in the thermal infrared spectrum. In the past decades, different directional emissivity canopy models have been proposed. This paper evaluates six radiative transfer models (FR97, Mod3, Rmod3, 4SAIL, REN15, and CE-P models) through a comparison with in situ emissivity measurements performed using the temperature-emissivity separation (TES) method. The evaluation is done using a single set of rose plants over two different soils with very different spectral behavior. First, using an organic soil, the measurements were done for seven different observation angles, from 0° to 60° in steps of 10°, and for six different values of leaf area index (LAI). Taking into account all LAIs, the bias (and root mean square error, RMSE) obtained were 0.003 (±0.006), −0.004 (±0.005), −0.009 (±0.011), 0.005 (±0.007), 0.004 (±0.007), and 0.005 (±0.007) for FR97, Mod3, Rmod3, 4SAIL, REN 15, and CE-P models, respectively. Second, using an inorganic soil, the measurements were done for six different LAIs but for two different observation angles: 0° and 55°. The bias (and RMSE) obtained were 0.012 (±0.014), 0.004 (±0.007), −0.020 (±0.035), 0.016 (±0.017), 0.013 (±0.015), 0.013 (±0.015) and for FR97, Mod3, Rmod3, 4SAIL, REN15, and CE-P models, respectively. Overall, the Mod3 model appears as the best model in comparison to the TES emissivity reference measurements.
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13

Malone, C. G., B. I. Choi, M. I. Flik, and E. G. Cravalho. "Spectral Emissivity of Optically Anisotropic Solid Media." Journal of Heat Transfer 115, no. 4 (November 1, 1993): 1021–28. http://dx.doi.org/10.1115/1.2911356.

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This work determines the spectral emissivity of a semi-infinite uniaxial medium in vacuum. If the optic axis is normal to the surface, then, for many materials and wavelengths, such as rutile between 10 and 25 μm, the directional and hemispherical spectral emissivities of the medium can be approximated, with an error of less than 10 percent, as those of an isotropic medium possessing the ordinary optical constants. In contrast, if the optic axis is parallel to the surface, the directional and hemispherical spectral emissivities can be predicted only by accounting for the optical anisotropy of the medium. Measurements of the directional emissivities of rutile crystals conform to the theoretical predictions.
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14

Dimenna, R. A., and R. O. Buckius. "Electromagnetic Theory Predictions of the Directional Scattering From Triangular Surfaces." Journal of Heat Transfer 116, no. 3 (August 1, 1994): 639–45. http://dx.doi.org/10.1115/1.2910917.

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Angular predictions of directional scattering distributions for metal and dielectric surfaces with length scales of the order of the wavelength are made from rigorous electromagnetic scattering theory. The theoretical and numerical formulation of the electromagnetic scattering solution based on the extinction theorem is presented. One-dimensional triangular surface profiles are generated using a Fourier series representation for various correlation lengths, deviations, and surface peak positions. Bidirectional reflection functions and directional emissivities are calculated for the surface geometry parameters above and various optical properties. Angular enhancements in bidirectional reflection and emissivity are quantified. Angular scattering and emissivity predictions have been extended beyond those previously reported to include surfaces with equivalent correlation length and deviation.
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15

Kornilov, Andrey Borisovich. "EXPERIMENTAL MEASURING OF THE INFRARED DIRECTIONAL EMISSIVITY OF MATERIALS." TsAGI Science Journal 46, no. 1 (2015): 55–62. http://dx.doi.org/10.1615/tsagiscij.2015013672.

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16

King, Jonathan L., Hangjin Jo, Sudarshan K. Loyalka, Robert V. Tompson, and Kumar Sridharan. "Computation of total hemispherical emissivity from directional spectral models." International Journal of Heat and Mass Transfer 109 (June 2017): 894–906. http://dx.doi.org/10.1016/j.ijheatmasstransfer.2017.01.120.

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17

Xu, Xiru, Liangfu Chen, and Jiali Zhuang. "The passive measurements of object’s directional emissivity in laboratory." Science in China Series E: Technological Sciences 43, S1 (December 2000): 55–61. http://dx.doi.org/10.1007/bf02916579.

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18

Petitcolin, F., F. Nerry, and M. P. Stoll. "Mapping temperature independent spectral indice of emissivity and directional emissivity in AVHRR channels 4 and 5." International Journal of Remote Sensing 23, no. 17 (January 2002): 3473–91. http://dx.doi.org/10.1080/01431160110075578.

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19

Hu, Jianrui, Zhanqiang Liu, Jinfu Zhao, Bing Wang, and Qinghua Song. "Theoretical Modeling and Analysis of Directional Spectrum Emissivity and Its Pattern for Random Rough Surfaces with a Matrix Method." Symmetry 13, no. 9 (September 18, 2021): 1733. http://dx.doi.org/10.3390/sym13091733.

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The emissivity is an important surface property parameter in many fields, including infrared temperature measurement. In this research, a symmetry theoretical model of directional spectral emissivity prediction is proposed based on Gaussian random rough surface theory. A numerical solution based on a matrix method is determined based on its symmetrical characteristics. Influences of the index of refraction n and the root mean square (RMS) roughness σrms on the directional spectrum emissivity ε are analyzed and discussed. The results indicate that surfaces with higher n and lower σrms tend to have a peak in high viewing angles. On the contrary, surfaces with lower n and higher σrms tend to have a peak in low viewing angles. Experimental verifications based on infrared (IR) temperature measurement of Inconel 718 sandblasted surfaces were carried out. This model would contribute to understand random rough surfaces and their emitting properties in fields including machining, process controlling, remote sensing, etc.
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20

Xiaowen Li, A. H. Strahler, and M. A. Friedl. "A conceptual model for effective directional emissivity from nonisothermal surfaces." IEEE Transactions on Geoscience and Remote Sensing 37, no. 5 (1999): 2508–17. http://dx.doi.org/10.1109/36.789646.

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21

Cao, Biao, Mingzhu Guo, Wenjie Fan, Xiru Xu, Jingjing Peng, Huazhong Ren, Yongming Du, et al. "A New Directional Canopy Emissivity Model Based on Spectral Invariants." IEEE Transactions on Geoscience and Remote Sensing 56, no. 12 (December 2018): 6911–26. http://dx.doi.org/10.1109/tgrs.2018.2845678.

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22

Petitcolin, F., F. Nerry, and M. P. Stoll. "Mapping directional emissivity at 3.7 μ m using a simple model of bi-directional reflectivity." International Journal of Remote Sensing 23, no. 17 (January 2002): 3443–72. http://dx.doi.org/10.1080/01431160110075569.

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23

Tsao, Jen Chieh, and Chiung Chieh Su. "A Monte Carlo Model for Analyzing the Effects on Radiometric Temperature Measurement in Rapid Thermal Processor." Materials Science Forum 505-507 (January 2006): 325–30. http://dx.doi.org/10.4028/www.scientific.net/msf.505-507.325.

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The radiometric temperature measurement is often applied to the in-situ and real-time monitor for rapid thermal processing of semiconductor wafer. To obtain good accuracy, the effective emissivity of measured spot is determined simultaneously as well. However, the effective emissivity strongly depends on the characteristics of wafer, processing chamber, and sensors. This paper presents a Monte Carlo model with bi-directional reflection distribution function to estimate the related effective emissivity of wafer. The ends of radiation thermometer considered are located either on the inner surface of processing chamber or at the proximity of wafer. The results are checked and compared with those of the previous work. Finally the primary effects on radiometric temperature measurement are analyzed and discussed.
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24

Kribus, Abraham, Irna Vishnevetsky, Eyal Rotenberg, and Dan Yakir. "Systematic errors in the measurement of emissivity caused by directional effects." Applied Optics 42, no. 10 (April 1, 2003): 1839. http://dx.doi.org/10.1364/ao.42.001839.

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25

Cárdenas-García, D., and C. Monte. "Bilateral Intercomparison of Spectral Directional Emissivity Measurement Between CENAM and PTB." International Journal of Thermophysics 35, no. 6-7 (July 2014): 1299–309. http://dx.doi.org/10.1007/s10765-014-1686-1.

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26

Fuente, Raquel, Telmo Echániz, Iñigo González de Arrieta, Irene Urcelay-Olabarria, Manuel J. Tello, and Gabriel A. López. "c-Si PV cells emissivity characterization at low operating temperatures for efficiency management." MATEC Web of Conferences 307 (2020): 01044. http://dx.doi.org/10.1051/matecconf/202030701044.

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Efficiency is a critical parameter for a solar cell to be successful and is closely related to the working temperature of the cell. In turn, the temperature can be related to the infrared emissivity, the parameter that governs the thermal radiative properties of a body. In particular, the importance of infrared emissivity in a solar cell is essential in passive cooling applications, where controlled radiative thermal losses could let the cell operate at lower temperatures, the range where they present higher efficiency. In this presentation, the emissivity of c-Si solar cells in the low temperature range (around 50 ºC) is discussed. Traditionally, it has been determined by indirect reflectivity measurements at ambient temperature and extrapolated to working temperatures, but here, a direct measurement is proposed. For an accurate value the measurements are performed in the high accuracy radiometer of the University of the Basque Country, which allows spectral directional emissivity measurements as a function of temperature.
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27

Arduini, Mariacarla, Jochen Manara, Thomas Stark, Hans-Peter Ebert, and Jürgen Hartmann. "Development and Evaluation of an Improved Apparatus for Measuring the Emissivity at High Temperatures." Sensors 21, no. 18 (September 17, 2021): 6252. http://dx.doi.org/10.3390/s21186252.

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An improved apparatus for measuring the spectral directional emissivity in the wavelength range between 1 µm and 20 µm at temperatures up to 2400 K is presented in this paper. As a heating unit an inductor is used to warm up the specimen, as well as the blackbody reference to the specified temperatures. The heating unit is placed in a double-walled vacuum vessel. A defined temperature, as well as a homogenous temperature distribution of the whole surrounding is ensured by a heat transfer fluid flowing through the gap of the double-walled vessel. Additionally, the surrounding is coated with a high-emitting paint and serves as blackbody-like surrounding to ensure defined boundary conditions. For measuring the spectral directional emissivity at different emission angles, a movable mirror is installed in front of the specimen, which can be adjusted by a rotatable arrangement guiding the emitted radiation into the attached FTIR-spectrometer. The setup of the emissivity measurement apparatus (EMMA) and the measurement procedure are introduced, and the derived measurement results are presented. For evaluating the apparatus, measurements were performed on different materials. The determined emissivities agree well with values published in literature within the derived relative uncertainties below 4% for most wavelengths.
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28

Yang, Yongqing, and Richard O. Buckius. "Surface length scale contributions to the directional and hemispherical emissivity and reflectivity." Journal of Thermophysics and Heat Transfer 9, no. 4 (October 1995): 653–59. http://dx.doi.org/10.2514/3.720.

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29

Peeters, J., B. Ribbens, J. J. J. Dirckx, and G. Steenackers. "Determining directional emissivity: Numerical estimation and experimental validation by using infrared thermography." Infrared Physics & Technology 77 (July 2016): 344–50. http://dx.doi.org/10.1016/j.infrared.2016.06.016.

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30

Wu, Xiaohu, Ceji Fu, and Zhuomin M. Zhang. "Effect of orientation on the directional and hemispherical emissivity of hyperbolic metamaterials." International Journal of Heat and Mass Transfer 135 (June 2019): 1207–17. http://dx.doi.org/10.1016/j.ijheatmasstransfer.2019.02.066.

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31

Hameury, J., B. Hay, and J. R. Filtz. "Measurement of Infrared Spectral Directional Hemispherical Reflectance and Emissivity at BNM-LNE." International Journal of Thermophysics 26, no. 6 (November 2005): 1973–83. http://dx.doi.org/10.1007/s10765-005-8609-0.

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32

Li, B. X., X. J. Yu, and L. H. Liu. "Backward Monte Carlo simulation for apparent directional emissivity of non-isothermal semitransparent slab." Journal of Quantitative Spectroscopy and Radiative Transfer 91, no. 2 (March 2005): 173–79. http://dx.doi.org/10.1016/j.jqsrt.2004.05.055.

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33

del Campo, Leire, Raúl B. Pérez-Sáez, Xabier Esquisabel, Ignacio Fernández, and Manuel J. Tello. "New experimental device for infrared spectral directional emissivity measurements in a controlled environment." Review of Scientific Instruments 77, no. 11 (November 2006): 113111. http://dx.doi.org/10.1063/1.2393157.

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34

Li, Yang, Xin-Lin Xia, Chuang Sun, Qing Ai, Bo Liu, and He-Ping Tan. "Tomography-based analysis of apparent directional spectral emissivity of high-porosity nickel foams." International Journal of Heat and Mass Transfer 118 (March 2018): 402–15. http://dx.doi.org/10.1016/j.ijheatmasstransfer.2017.11.005.

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35

Kotov, D. V., and S. T. Surzhikov. "Local estimation of directional emissivity of light-scattering volumes using the Monte-Carlo method." High Temperature 45, no. 6 (December 2007): 807–17. http://dx.doi.org/10.1134/s0018151x07060120.

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36

Markham, J. R., W. W. Smith, J. R. Haigis, M. D. Carangelo, J. E. Cosgrove, K. Kinsella, P. R. Solomon, et al. "FT-IR Measurements of Emissivity and Temperature During High Flux Solar Processing." Journal of Solar Energy Engineering 118, no. 1 (February 1, 1996): 20–29. http://dx.doi.org/10.1115/1.2847904.

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The experimental capability to generate and utilize concentrated solar flux has been demonstrated at a number of facilities in the United States. To advance this research area, the National Renewable Energy Laboratory (NREL) has designed and constructed a versatile High Flux Solar Furnace (HFSF). Research is ongoing in areas of material processing, high temperature and UV enhanced detoxification, chemical synthesis, high flux optics, solar pumped lasers, and high heating rate processes. Surface modifications via concentrated solar flux, however, are currently performed without the means to accurately monitor the temperature of the surface of interest. Thermoelectric and pyrometric devices are not accurate due to limitations in surface contact and knowledge of surface emissivity, respectively, as well as interference contributed by the solar flux. In this article, we present a noncontact optical technique that simultaneously measures the directional spectral emissivity, and temperature of the surface during solar processing. A Fourier Transform Infrared (FT-IR) spectrometer is coupled to a processing chamber at NREL’s HFSF with a fiber-optic radiation transfer assembly. The system measures directional emission and hemispherical-directional reflectance in a spectral region that lacks contribution from solar flux. From these radiative property measurements during solar processing, the spectral emittance and temperature at the measurement point can be obtained. The methodology, validation measurements, and in-situ measurements during solar processing of materials are presented. Knowledge of surface temperature during solar processing is an important parameter for process control. Based on validation measurements for spectral emittance, the temperature error associated with the novel instrument is less than ±5 percent for surfaces of mid-range emittance. The error decreases for surfaces of higher emittance. This is far better than optical methods which are “lost” in terms of knowing the appropriate emittance for conversion of measured radiant intensity to temperature.
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37

Francois, C., C. Ottle, and L. Prevot. "Analytical parameterization of canopy directional emissivity and directional radiance in the thermal infrared. Application on the retrieval of soil and foliage temperatures using two directional measurements." International Journal of Remote Sensing 18, no. 12 (August 1997): 2587–621. http://dx.doi.org/10.1080/014311697217495.

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38

Fuente, Raquel, Telmo Echániz, Iñigo González de Arrieta, Irene Urcelay-Olabarria, Josu M. Igartua, Manuel J. Tello, and Gabriel A. López. "High accuracy infrared emissivity between 50 and 1000 ᵒC for solar materials characterization." MATEC Web of Conferences 307 (2020): 01043. http://dx.doi.org/10.1051/matecconf/202030701043.

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The total hemispherical emissivity of materials used in the solar energy industry is a critical parameter in the calculation of the radiative thermal losses and material efficiency, especially in solar thermal collector absorbing surfaces. This is because the radiative heat losses have a significant economic impact on the final cost of the electricity produced in solar plants. Our laboratory, HAIRL, in the University of the Basque Country (UPV/EHU) in Spain [1] is the first to have published infrared spectral emissivity measurements in Solar Absorber Surfaces (SAS) at working temperature [2]. The laboratory allows measuring between 50 and 1000 ºC in the 0.83-25 μm range and is also capable of doing directional measurements at different angles between 0 and 80 degrees. Therefore, it is suitable for measuring solar selective coatings, for studying high temperature stability and for characterizing thermal energy harvesting materials. In this presentation, we show the specifications of our laboratory, the results of spectral emissivity measurements in air-resistant solar selective coatings and in eutectic alloys for thermal storage and we demonstrate the necessity of measuring at working temperature in order to possess reliable data.
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39

Kanani, Keyvan, Laurent Poutier, Françoise Nerry, and Marc-Philippe Stoll. "Directional effects consideration to improve out-doors emissivity retrieval in the 3-13 μm domain." Optics Express 15, no. 19 (2007): 12464. http://dx.doi.org/10.1364/oe.15.012464.

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40

Vitkovskii, V. V., V. G. Gorshenev, and Yu F. Potapov. "Measurement of spectral directional emissivity of materials and coatings in the infrared region of spectrum." Thermal Engineering 56, no. 3 (March 2009): 245–48. http://dx.doi.org/10.1134/s0040601509030100.

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41

Ren, Huazhong, Rongyuan Liu, Guangjian Yan, Zhao-Liang Li, Qiming Qin, Qiang Liu, and Françoise Nerry. "Performance evaluation of four directional emissivity analytical models with thermal SAIL model and airborne images." Optics Express 23, no. 7 (March 17, 2015): A346. http://dx.doi.org/10.1364/oe.23.00a346.

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42

Li, Zhao-Liang, Bohui Tang, and Yuyun Bi. "Estimation of land surface directional emissivity in mid-infrared channel around 40 µm from MODIS data." Optics Express 17, no. 5 (February 17, 2009): 3173. http://dx.doi.org/10.1364/oe.17.003173.

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43

Fu, Tairan, Minghao Duan, Jiaqi Tang, and Congling Shi. "Measurements of the directional spectral emissivity based on a radiation heating source with alternating spectral distributions." International Journal of Heat and Mass Transfer 90 (November 2015): 1207–13. http://dx.doi.org/10.1016/j.ijheatmasstransfer.2015.07.064.

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44

Ane, J. M., and M. Huetz-Aubert. "Stratified media theory interpretation of measurements of the spectral polarized directional emissivity of some oxidized metals." International Journal of Thermophysics 7, no. 6 (November 1986): 1191–208. http://dx.doi.org/10.1007/bf00503975.

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45

Li, Longfei, Kun Yu, Kaihua Zhang, Yanlei Liu, Feng Zhang, and Yufang Liu. "Accuracy improvement for directional polarized spectral emissivity measurement in the wavelength range of 4–20 μm." Experimental Thermal and Fluid Science 125 (July 2021): 110379. http://dx.doi.org/10.1016/j.expthermflusci.2021.110379.

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46

Hori, Masahiro, Teruo Aoki, Tomonori Tanikawa, Hiroki Motoyoshi, Akihiro Hachikubo, Konosuke Sugiura, Teppei J. Yasunari, et al. "In-situ measured spectral directional emissivity of snow and ice in the 8–14 μm atmospheric window." Remote Sensing of Environment 100, no. 4 (February 2006): 486–502. http://dx.doi.org/10.1016/j.rse.2005.11.001.

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47

Marquier, F., M. Laroche, R. Carminati, and J. J. Greffet. "Anisotropic Polarized Emission of a Doped Silicon Lamellar Grating." Journal of Heat Transfer 129, no. 1 (June 21, 2006): 11–16. http://dx.doi.org/10.1115/1.2360594.

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Abstract:
Thermal emission of a doped silicon grating has been studied in the plane perpendicular to the grooves. We show how the excitation of surface plasmons produce a resonant emission weakly depending on the polarization and azimuthal angle. We analyze in detail the polarization and angular dependence of the emission out of the plane perpendicular to the grooves. Two kinds of thermal sources, directional and quasi-isotropic, are studied. They have been designed in a previous paper. We also compute the total hemispherical emissivity of these gratings. In addition we show that in applications such as radiative cooling, these sources are less efficient than other structures.
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48

Madura, Henryk, Mariusz Kastek, Tomasz Sosnowski, and Tomasz Orżanowski. "Pyrometric Method of Temperature Measurement with Compensation for Solar Radiation." Metrology and Measurement Systems 17, no. 1 (January 1, 2010): 77–86. http://dx.doi.org/10.2478/v10178-010-0008-6.

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Pyrometric Method of Temperature Measurement with Compensation for Solar RadiationOutdoor remote temperature measurements in the infrared range can be very inaccurate because of the influence of solar radiation reflected from a measured object. In case of strong directional reflection towards a measuring device, the error rate can easily reach hundreds per cent as the reflected signal adds to the thermal emission of an object. As a result, the measured temperature is much higher than the real one. Error rate depends mainly on the emissivity of an object and intensity of solar radiation. The position of the measuring device with reference to an object and the Sun is also important. The method of compensation of such undesirable influence of solar radiation will be presented. It is based on simultaneous measurements in two different spectral bands, shor-twavelength and long-wavelength ones. The temperature of an object is derived from long-wavelength data only, whereas the short-wavelength band, the corrective one, is used to estimate the solar radiation level. Both bands were selected to achieve proportional changes of the output signal due to solar radiation. Knowing the relation between emissivity and solar radiation levels in both spectral bands, it is possible to reduce the measurement error several times.
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Hu, Tian, Luigi J. Renzullo, Biao Cao, Albert I. J. M. van Dijk, Yongming Du, Hua Li, Jie Cheng, Zhihong Xu, Jun Zhou, and Qinhuo Liu. "Directional variation in surface emissivity inferred from the MYD21 product and its influence on estimated surface upwelling longwave radiation." Remote Sensing of Environment 228 (July 2019): 45–60. http://dx.doi.org/10.1016/j.rse.2019.04.012.

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50

Warren, T. J., N. E. Bowles, K. Donaldson Hanna, and I. R. Thomas. "The Oxford space environment goniometer: A new experimental setup for making directional emissivity measurements under a simulated space environment." Review of Scientific Instruments 88, no. 12 (December 2017): 124502. http://dx.doi.org/10.1063/1.4986657.

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