Relevant bibliographies by topics / Dispersive energy of X-­rays

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Academic literature on the topic 'Dispersive energy of X-­rays'

Author: Grafiati
Published: 4 June 2021
Last updated: 17 February 2022

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Journal articles on the topic "Dispersive energy of X-­rays"

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McCarthy, J. J., and D. J. McMillan. "Application of X-Ray Optics to Energy Dispersive Spectroscopy." Microscopy and Microanalysis 4, S2 (July 1998): 178–79. http://dx.doi.org/10.1017/s1431927600021012.

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The application of x-ray optics for focusing x-rays into high intensity spots or for collimation of x-ray beams has been reported by several authors. Example applications for x-ray optics include microfluorescence, microdiffraction, tomography and lithography, and WDS. Kirkland et al. pointed out that the use of an optic, in a collimating configuration could provide enhanced detection sensitivity in wavelength dispersive spectroscopy. In these proceedings last year, Agnello et al. presented data from a new WDS device specifically designed to use a grazing incidence collimating x-ray optic that confirmed and extended the work of Kirkland.A few studies have appeared reporting the use X-ray optics in applications using EDS. Focusing x-ray optics have been used on both the excitation and detection side of EDS systems. In a series of papers, Carpenter and his collaborators describe an x-ray microprobe which uses capillary optics to provide an intense convergent beam of x-rays from a microfocus x-ray tube to excite the sample for x-ray microfluorescence studies. Wollman et al.
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Ottmar, H., H. Eberle, P. Matussek, and I. Michel-Piper. "Energy-Dispersive X-Ray Techniques for Accurate Heavy Element Assay." Advances in X-ray Analysis 30 (1986): 285–92. http://dx.doi.org/10.1154/s0376030800021406.

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Energy-dispersive X-ray techniques can be employed in two different ways for the accurate determination of element concentrations in specimens: (1) spectrometry of fluoresced characteristic X-rays as widely applied in the various modes of the traditional XRF analysis technique, and (2) spectrometry of the energy-differential transmittance of an X-ray continuum at the element-specific absorption-edge energies.
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McCarthy, Jon J., and David J. McMillan. "Application of X-ray Optics to Energy-Dispersive Spectroscopy." Microscopy and Microanalysis 4, no. 6 (December 1998): 632–41. http://dx.doi.org/10.1017/s1431927698980618.

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X-ray optics have been used in X-ray analytical instruments for several years. Applications of X-ray optics have been reported in X-ray diffraction, X-ray fluorescence, and wavelength dispersive spectroscopy. X-ray optics have been used to increase the X-ray flux incident on the sample or to direct and focus emitted X-rays from a sample. We report here the use of a grazing incidence optic (GIO) as a flux-enhancing collimator for use with an energy-dispersive (ED) detector used to perform electron beam microanalysis. We found that the GIO in combination with an ED spectrometer (EDS) provides substantial intensity gain for X-ray lines with energy below 1 keV. The GIO is also found to provide a modest focus effect, and introduces minimal spectral artifacts.
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Statham, Peter J. "Measuring Performance of Energy-Dispersive X-ray Systems." Microscopy and Microanalysis 4, no. 6 (December 1998): 605–15. http://dx.doi.org/10.1017/s1431927698980588.

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As Si(Li) detector technology has matured, many of the fundamental problems have been addressed in the competition among manufacturers and there is now an expectation, implied by many textbooks, that all energy-dispersive X-ray (EDX) detectors are made and will perform in the same way. Although there has been some convergence in Si(Li) systems and these are still the most common, manufacturing recipes still differ and there are many alternative EDX devices, such as microcalorimeters and room temperature detectors, that have both advantages and disadvantages over Si(Li). Rather than emphasizing differences in technologies, performance measures should reveal benefits relevant to the intended application. The instrument is inevitably going to be a “black box” of integrated components; this article reviews some of the methods that have been applied and introduces some new techniques that can be used to assess performance without resorting to complex software or sophisticated mathematical algorithms. Sensitivity, resolution, artefacts, and stability are discussed with particular application to compositional analysis using electron beam excitation of X-rays in the 100-eV to 10-keV energy region.
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Egan, Christopher K., Simon D. M. Jacques, Matthew D. Wilson, Matthew C. Veale, Paul Seller, Philip J. Withers, and Robert J. Cernik. "Full-field energy-dispersive powder diffraction imaging using laboratory X-rays." Journal of Applied Crystallography 48, no. 1 (January 30, 2015): 269–72. http://dx.doi.org/10.1107/s1600576715000801.

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A laboratory instrument with the ability to spatially resolve energy-dispersed X-ray powder diffraction patterns taken in a single snapshot has been developed. The experimental arrangement is based on a pinhole camera coupled with a pixelated spectral X-ray detector. Collimation of the diffracted beam is defined by the area of the footprint of a detector pixel and the diameter of the pinhole aperture. Each pixel in the image, therefore, contains an energy-dispersed powder diffraction pattern. This new X-ray imaging technique enables spatial mapping of crystallinity, crystalline texture or crystalline phases from within a sample. Validation of the method has been carried out with a back-to-back comparison with crystalline texture mapping local to a friction stir weld in an aluminium alloy taken using synchrotron radiation.
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Lund, Mark W. "More Than One Ever Wanted To Know About X-ray Detectors Part V: Wavelength - The "Other" Spectroscopy." Microscopy Today 3, no. 4 (May 1995): 8–9. http://dx.doi.org/10.1017/s1551929500063537.

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The use of x-ray spectrometry in electron microscopy has been a powerful market driver not only for electron microscopes but also for x-ray spectrometers. More x-ray spectrometers are sold with electron microscopes than in any other configuration. A general name for the combination is AEM, or analytical electron microscope, though in modern times AEM can include other instrumentation such as electron energy loss spectroscopy and visible light spectroscopy. In previous articies I have discussed energy dispersive spectrometers (EDS). These use semiconductor crystals to detect the x-rays and measure the energy deposited in the crystal. A second type of x-ray spectrometer measures the wavelength of the x-rays, and so is called "wavelength dispersive spectrometry" (WDS).
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Lavelle, Bruno, L. Vendier, and O. Auriol. "Stresses Evaluation by Transmission Energy Dispersive X-Ray Diffraction Using Industrial Radiography Equipment." Materials Science Forum 490-491 (July 2005): 149–52. http://dx.doi.org/10.4028/www.scientific.net/msf.490-491.149.

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X-rays transmission stress analysis was tested on a 2mm thick steel sheet using energy dispersive X-rays diffraction (EDXD) and an industrial radiography equipment as X-ray source. A complex state of residual stresses was created in the sheet before the test and modified during the experiment by the way of a in-situ tensile test. In the diffracted beam spectrum, the energy peak displacement was related to macroscopic stresses using the elementary Mohr’s circle formalism for plane stress analysis. The change in the stresses thus analyzed is compared with the applied stress.
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Ritchie, Nicholas W. M. "Using DTSA-II to Simulate and Interpret Energy Dispersive Spectra from Particles." Microscopy and Microanalysis 16, no. 3 (April 20, 2010): 248–58. http://dx.doi.org/10.1017/s1431927610000243.

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AbstractA high quality X-ray spectrum image of a 3.3 μm diameter sphere of K411 glass resting on a copper substrate was collected at 25 keV. The same sample configuration was modeled using the NISTMonte Monte Carlo simulation of electron and X-ray transport as is integrated into the quantitative X-ray microanalysis software package DTSA-II. The distribution of measured and simulated X-ray intensity compare favorably for all the major lines present in the spectra. The simulation is further examined to investigate the influence of angle-of-incidence, sample thickness, and sample diameter on the generated and measured X-ray intensity. The distribution of generated X-rays is seen to deviate significantly from a naive model which assumes that the distribution of generated X-rays is similar to bulk within the volume they share in common. It is demonstrated that the angle at which the electron beam strikes the sample has nonnegligible consequences. It is also demonstrated that within the volume that the bulk and particle share in common that electrons, which have exited and later reentered the particle volume, generate a significant fraction of the X-rays. Any general model of X-ray generation in particles must take into account the lateral spread of the scattered electron beam.
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Agnello, R., J. Howard, J. McCarthy, and D. OHara. "The Use of Collimating X-Ray Optics For Wavelength Dispersive Spectroscopy." Microscopy and Microanalysis 3, S2 (August 1997): 889–90. http://dx.doi.org/10.1017/s1431927600011338.

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There has been much interest in the last few years in the technique for focusing x-rays into high intensity spots using tapered glass capillaries or other forms of grazing incident x-ray reflectors. The resulting microbeams have been used in applications that include microfluorescence, microdiffraction, tomography and lithography. Instead of focusing x-rays to a spot, a collimating optic can be used to capture x-rays from a point source and turn them into a collimated parallel beam at the exit aperture to the optic. Kirkland et. al. have pointed out that the use of such an optic could provide enhanced detection sensitivity in wavelength dispersive spectroscopy.We have developed a grazing incidence collimating x-ray optic that can be coupled to a simple wavelength dispersive spectrometer (WDS). This combined instrument was designed to enhance the intensity of x-rays from a sample by an order of magnitude or more in the energy range of 0 to 1 keV compared to a conventional WDS.
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Portale, Giuseppe, Alessandro Longo, Lucio D'Ilario, Andrea Martinelli, Ruggero Caminiti, and Valerio Rossi Albertini. "Small-angle energy-dispersive X-ray scattering using a laboratory-based diffractometer with a conventional source." Journal of Applied Crystallography 40, no. 2 (March 12, 2007): 218–31. http://dx.doi.org/10.1107/s0021889806053295.

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The use of polychromaticBremsstrahlungX-rays generated by commercial tubes for energy-dispersive small-angle scattering measurements has not been extensively discussed in the literature, mainly because of some difficulties associated with it. If a suitable experimental setup is chosen and concomitant phenomena are taken into account for correcting the observed X-ray patterns, energy-dispersive small-angle X-ray scattering (SAXS) may become an interesting alternative to conventional measurements based on monochromatic beams. Energy-dispersive SAXS experiments carried out on protein solutions, micelles, semicrystalline polymers and catalytic systems are discussed to illustrate the new opportunities offered by this technique as well as its limitations.
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Dissertations / Theses on the topic "Dispersive energy of X-­rays"

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Demers, Hendrix. "Two facets of the x-ray microanalysis at low voltage: the secondary fluorescence x-rays emission and the microcalorimeter energy-dispersive spectrometer." Thesis, McGill University, 2008. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=21993.

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The best spatial resolution, for a microanalysis with a scanning electron microscope (SEM), is achieved by using a low voltage electron beam. But the x-ray microanalysis was developed for high electron beam energy (greater than 10 keV). Also, the specimen will often contain light and medium elements and the analyst will have to use a mixture of K, L, and sometime M x-ray peaks for the x-ray microanalysis. With a mixture of family lines, it will be common to have secondary fluorescence x-rays emission by K-L and L-K interactions. The accuracy of the fluorescence correction models presently used by the analyst are not well known for these interactions. This work shows that the modified secondary fluorescence x-rays emission correction models can improve the accuracy of the microanalysis for K-L and L-K interactions. The general equation derived in this work allows the identification of three factors which influence the secondary fluorescence x-rays emission. The fluorescence production factor can be used to predict the importance of the secondary fluorescence x-rays emission. A large value of the fluorescence production factor indicates that a fluorescence correction is needed. Another disadvantage of using a low voltage is that there are more frequent occurrences of x-ray peaks overlap. A new microanalysis instruments that combines the high-spatial resolution and high-energy resolution for x-ray detection is needed. The microcalorimeter energy-dispersive spectrometer (uEDS) should improve the low voltage microanalysis, but the maturity of this technology has to be evaluated first. One of the first commercial uEDS for x-ray microanalysis in a SEM is studied and analyzed in this work. This commercial uEDS has an excellent energy resolution (15 eV) and can detect x-rays of low energy. This x-ray detector can be used as a high-spatial resolution and high-energy resolution microanalysis instrument. There are still hurdles that this technology must overcome before i
Pour la microanalyse par rayons X avec un microscope électronique à balayage (MEB), la meilleure résolution spatiale est obtenue à bas voltage. Cependant, la microanalyse par rayons X a été développée pour des grandes énergies du faisceau d'électrons (plus grandes que 10 keV). De plus, les échantillons analysés contiennent souvent des éléments légers et moyens. L'analyste va devoir utiliser un mélange de pics de rayons X K, L et parfois M pour la microanalyse par rayons X. Avec un aussi grand nombre de pics, l'émission de fluorescence secondaire de rayons X par des interactions K-L et L-K est inévitable. La précision des modèles de correction de la fluorescence utilisés présentement n'est pas bien quantifiée pour ces types d'interactions. Les modifications apportées, dans le cadre de ce travail, aux modèles de correction de la fluorescence améliorent la précision des résultats de la microanalyse pour les interactions K-L et L-K. L'équation générale dérivée dans ce travail permet l'identification de trois facteurs qui influencent l'émission de fluorescence secondaire de rayons X. Le facteur de production de fluorescence est utilisé pour prédire l'importance de l'émission de fluorescence de rayons X. Une grande valeur de ce facteur indique que la correction de fluorescence est nécessaire. Un autre désavantage d'utiliser une basse tension est le chevauchement des pics de rayons X qui se produit plus fréquemment. Un nouvel instrument de microanalyse qui combine une grande résolution spatiale et une grande résolution en énergie pour la détection des rayons X est nécessaire. Un spectromètre microcalorimétrique à dispersion d'énergie des rayons X (uEDS) devrait améliorer la microanalyse à basse tension, mais la maturité de cette technologie doit être évaluée. L'un des premiers spectromètre uEDS commercial pour la microanalyse par rayons X dans un MEB est étudié et analysé dans ce travail. Cet uEDS commercial$
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Fairbrother, P. J. "Thermal diffuse scattering in energy-dispersive x-ray spectroscopy." Thesis, University of Exeter, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.232967.

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Canli, Sedat. "Thickness Analysis Of Thin Films By Energy Dispersive X-ray Spectroscopy." Master's thesis, METU, 2010. http://etd.lib.metu.edu.tr/upload/12612822/index.pdf.

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EDS is a tool for quantitative and qualitative analysis of the materials. In electron microscopy, the energy of the electrons determines the depth of the region where the X-rays come from. By varying the energy of the electrons, the depth of the region where the X-rays come from can be changed. If a thin film is used as a specimen, different quantitative ratios of the elements for different electron energies can be obtained. Unique thickness of a specific film on a specific substrate gives unique energy-ratio diagram so the thickness of a thin film can be calculated by analyzing the fingerprints of the energy-ratio diagram of the EDS data obtained from the film.
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Kasemodel, Carlos A. "Quantitative energy dispersive x-ray spectrometry using an Emispec Vision system." Thesis, Monterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service, 1999. http://handle.dtic.mil/100.2/ADA374498.

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Thesis (M.S. in Applied Physics) Naval Postgraduate School, December 1999.
"December 1999". Thesis advisor(s): Alan G. Fox, James Luscombe. Includes bibliographical references (p. 69-70). Also available online.
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Geraki, Kalotina. "Differentiating normal and diseased breast tissue using X-ray fluorescence and energy dispersive X-ray diffraction." Thesis, City University London, 2003. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.274458.

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Slater, Thomas Jack Alfred. "Three dimensional chemical analysis of nanoparticles using energy dispersive X-ray spectroscopy." Thesis, University of Manchester, 2015. https://www.research.manchester.ac.uk/portal/en/theses/three-dimensional-chemical-analysis-of-nanoparticles-using-energy-dispersive-xray-spectroscopy(3eb607a2-eb03-4d45-b9eb-71b0ca45c2db).html.

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The aim of this thesis is to investigate the methodology of three dimensional chemical imaging of nanoparticles through the use of scanning transmission electron microscope (STEM) – energy dispersive X-ray (EDX) spectroscopy. In this thesis, an absorption correction factor is derived for spherical nanoparticles that can correct X-ray absorption effects. Quantification of EDX spectra of nanoparticles usually neglects X-ray absorption within the nanoparticle but may lead to erroneous results, thus an absorption correction is important for accurate compositional quantification. The absorption correction presented is verified through comparison with experimental data of Au X-ray peaks in spherical Au nanoparticles and is found to agree excellently. This absorption correction allows accurate compositional quantification of large ( > 100 nm) particles with STEM-EDX.Three dimensional chemical mapping is achievable through the use of EDX spectroscopy with electron tomography. Here, the methodology of STEM-EDX tomography is fully explored, with a focus on how to avoid artefacts introduced through detector shadowing and low counts per pixel. A varied-time acquisition scheme is proposed to correct for detector shadowing that is shown to provide a more constant intensity over a series of projections, allowing a higher fidelity reconstruction. The STEM-EDX tomography methodology presented is applied to the study of AgAu nanoparticles synthesized by the galvanic replacement reaction. The elemental distribution as a function of the composition of the as-synthesized nanoparticles is characterised and a reversal in the element segregated to the surface of the nanoparticles is found. The composition at which the reversal takes place is shown to correlate with a peak in the catalytic yield of a three component coupling reaction. It is hypothesized that a continuous Au surface results in the optimum catalytic conditions for the reaction studied, which guides the use of galvanically prepared AgAu nanoparticles as catalysts.
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Gullayanon, Rutchanee. "A calibration methodology for energy dispersive X-ray fluorescence measurements based upon synthetically generated reference spectra." Diss., Georgia Institute of Technology, 2011. http://hdl.handle.net/1853/42771.

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This research developed an on-line measurement systemfor determining the amount of fluorochemicals on carpet fibers using energy-dispersive X-ray fluorescence (EDXRF).This system is designed as a complementary tool to an existingchemical burn test certified by the American Association ofTextile Chemists and Colorists (AATCC), which is performed off-line on randomly selected carpet samples and time consuming.This research reviewed XRF principles and determined parameters that affect XRF spectra such as measurement time, measurement number, X-ray tube voltage, X-ray tube current, primary beam filter, and carpet characteristics. For this application, XRF calibrations must be performed for carpets of all styles and types. However, preparing actual carpet calibration samples is expensive. This research introduced a methodology to synthetically generate reference spectra using XRF spectra from standard fluorochemical stock solution samples and from base carpet samples for each carpet type to be tested. Thus, actual, physical standards are not required for each carpet type or style. This study showed that the synthetically generated XRF spectra alone were not always sufficient to guarantee the confidence interval required by the certified AATCC test. Thus, it is recommended that for on-line implementation, burn test results should be used to create a historical data base for each carpet type to reduce margin of error for calibrations generated from the synthetic spectra.
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Kumari, Maini S. M. "Development of a breast tissue diffraction analysis system using energy dispersive X-ray diffraction." Thesis, University College London (University of London), 2012. http://discovery.ucl.ac.uk/1370578/.

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Research groups have shown that diffraction techniques could be applied for characterising materials. In particular, Energy Dispersive X-ray Diffraction (EDXRD) technique has been successfully used in characterising materials such as plastics, drugs and biological tissues. The size of breast tissues used for characterisation so far has been small, in the range of mm. In order to exploit the fullness of the EDXRD technique in characterising breast tissues and hence enable early and precise breast tumour detection, the presented research work takes the existing research work a step forward by developing a breast tissue diffraction analysis system wherein breast-sized tissue-equivalent materials have been studied for tumour detection and an optimised EDXRD system for breast tissue analysis has been presented. For the development of this breast tissue analysis diffraction system, a ray-tracing model of the EDXRD system has been developed. The model has been used to predict diffraction spectra. These model predictions have been further used to optimize system parameters for an EDXRD system so it could be used for breastsized samples. Materials like plastics, pharmaceutical drugs and tissues have been characterised on this optimized system. The diffraction spectra collected have been used to build a diffraction spectrum database which has been further used to generate diffraction images for detection of tumour of size as small as 0.5 cm. Following this abstract, in the thesis, Chapter 1 introduces how X-rays interact with matter and what research groups have achieved so far in breast tissue diffraction. Ray-tracing model of EDXRD system forms Chapter 2 wherein the system parameters along with the corrections used in the model and model predictions have been presented. The characterisation of materials using optimized EDXRD system has been detailed in Chapter 3. Chapter 4 elaborates the generation of diffraction images. Chapter 5 presents the conclusions and suggests future work. The thesis ends with a list of references.
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Cook, Emily Jane. "Analysis of energy dispersive x-ray diffraction profiles for material identification, imaging and system control." Thesis, University College London (University of London), 2008. http://discovery.ucl.ac.uk/1446057/.

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This thesis presents the analysis of low angle X-ray scatter measurements taken with an energy dispersive system for substance identification, imaging and system control. Diffraction measurements were made on illicit drugs, which have pseudo- crystalline structures and thus produce diffraction patterns comprising a se ries of sharp peaks. Though the diffraction profiles of each drug are visually characteristic, automated detection systems require a substance identification algorithm, and multivariate analysis was selected as suitable. The software was trained with measured diffraction data from 60 samples covering 7 illicit drugs and 5 common cutting agents, collected with a range of statistical qual ities and used to predict the content of 7 unknown samples. In all cases the constituents were identified correctly and the contents predicted to within 15%. Soft tissues exhibit broad peaks in their diffraction patterns. Diffraction data were collected from formalin fixed breast tissue samples and used to gen erate images. Maximum contrast between healthy and suspicious regions was achieved using momentum transfer windows 1.04-1.10 and 1.84-1.90 nm_1. The resulting images had an average contrast of 24.6% and 38.9% compared to the corresponding transmission X-ray images (18.3%). The data was used to simulate the feedback for an adaptive imaging system and the ratio of the aforementioned momentum transfer regions found to be an excellent pa rameter. Investigation into the effects of formalin fixation on human breast tissue and animal tissue equivalents indicated that fixation in standard 10% buffered formalin does not alter the diffraction profiles of tissue in the mo mentum transfer regions examined, though 100% unbuffered formalin affects the profile of porcine muscle tissue (a substitute for glandular and tumourous tissue), though fat is unaffected.
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Menendez-Alonso, Elena. "Trace metal and speciation analysis using ion-exchange and energy dispersive X-ray fluorescence spectrometry." Thesis, University of Plymouth, 2000. http://hdl.handle.net/10026.1/896.

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Studies have been carried out on specific ion-exchange (Dowex 50W-X8 and Dowex 1-X8) and chelation (Chelex-100) resins, in order to determine their physical and chemical characteristics, to understand and explain their limits of function and to optimise their use as substrates in trace metal and speciation measurement by EDXRF. Structural information was obtained by scanning electron microscopy and x-ray microanalysis showing a homogeneous distribution of functional groups and retained ions on both sectioned and whole resins. Particle size experiments performed on Dowex 50W-X8 (38 - 840 µm) showed that this parameter has no effect on the relationship between intensity of fluorescence and concentration or mass of resin. Inter-element effects were not observed in the analysis of multielemental specimens prepared on ion-exchange / chelation media by EDXRF. This indicates that the proposed method has a significant advantage when compared with other methodologies. A theoretical ‘model’, based on the formation of thin films on the surface of the resin beads, has been proposed in order to link and explain the effects observed in these experiments. The use of a batch retention system has shown distinct advantages over using columns in terms of linearity, accuracy, precision, rapidity and simplicity. Parameters such as pH and ionic strength of the solution, concentration of competing ions and volume of the sample have been proven to be critical. The maximum retention capacity has been determined as 3.2, 1.1 and 0.67 mEq/g for Dowex 50W-X8, Dowex 1-X8 and Chelex-100 respectively. The optimum mass of resin for XRF analysis was found to be 0.5 g, for all resins tested. The linear range covered 4 to 5 orders of magnitude. These findings show the potential of the investigated media to overcome instrumental and sample limitations. Based on the physico-chemical information found, methodologies for three different applications of the resins to EDXRF determinations have been developed and their analytical possibilities explored. The multi-elemental determination of metals in sewage sludge digests was achieved by retaining the metals on Dowex 50W-X8 at pH 2 and Chelex-100 at pH 4. Chelex-100 allows quantitative recoveries for Cu and Zn. A wider range of elements was determined on Dowex 50W-X8, although with poorer recoveries (60 - 90%). The limits of detection were 10 - 21 µg when Dowex 50W-X8 was used and 8 - 49 µg for Chelex-100. The method was validated by the analysis of a certified material. The determination of Kβ/Kα intensity ratios for Cr and Mn species and its potential as a tool for direct elemental speciation has also been studied. A difference in Kβ/Kα between the oxidation states of the analytes was only observed during the analysis of solutions of the metal species by EDXRF at the 98% level of confidence. Finally, the speciation and preconcentration of Cr(III) and Cr(VI) in waters has been performed by retention on Dowex 50W-X8 and Dowex 1-X8 followed by EDXRF determination. Efficient recoveries and preconcentration factors of up to 500 were achieved, leading to limits of detection of 30 µg/L for Cr(VI) and 40 µg/L for Cr(III). This method is simple, fast and inexpensive, allowing quantitative recoveries in the speciation of chromium in waste waters.
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Books on the topic "Dispersive energy of X-­rays"

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Garratt-Reed, A. J. Energy-dispersive X-ray analysis in the electron microscope. Oxford: BIOS, 2003.

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Energy dispersive x-ray fluorescence analysis. Warszawa: PWN, 1989.

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C, Jackson John. A method of quantitative analysis of trace elements in silicate rocks by energy-dispersive X-ray fluorescence spectroscopy. [Denver, Colo.?]: U.S. Dept. of the Interior, Geological Survey, 1988.

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Italy) European Conference on Energy Dispersive X-Ray Spectrometry (1998 Bologna. Proceedings of the European Conference on Energy Dispersive X-Ray Spectrometry 1998: EDXRS-98 : San Giovanni in Monte, Bologna, Italy, 7-12 June 1998. Bologna: Compositori, 1999.

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Jackson, John C. A method of quantitative analysis of trace elements in silicate rocks by energy-dispersive X-ray fluorescence spectroscopy. [Denver, Colo.?]: U.S. Dept. of the Interior, Geological Survey, 1988.

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Budd, P. M. Light-element analysis in the transmission electron microscope, WEDX and EELS. Oxford: Oxford University Press, 1988.

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1943-, Goodhew Peter J., and Royal Microscopical Society, eds. Light-element analysis in the transmission electron microscope. Oxford: Oxford University Press (for) Royal Microscopical Society, 1988.

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Buras, Bronislaw. X-ray energy dispersive diffraction: Lecture Notes. Roskilde: Riso Library, 1988.

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Lienert, Ulrich. Sc attering of high energy X-rays. Manchester: University of Manchester, 1994.

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Kasemodel, Carlos A. Quantitative energy dispersive x-ray spectrometry using an Emispec Vision system. Monterey, Calif: Naval Postgraduate School, 1999.

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Book chapters on the topic "Dispersive energy of X-­rays"

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Rickerby, David G. "Barriers to Energy Dispersive Spectrometry with Low Energy X-Rays." In Microbeam and Nanobeam Analysis, 493–500. Vienna: Springer Vienna, 1996. http://dx.doi.org/10.1007/978-3-7091-6555-3_43.

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Potts, P. J. "Energy dispersive x-ray spectrometry." In A Handbook of Silicate Rock Analysis, 286–325. Boston, MA: Springer US, 1987. http://dx.doi.org/10.1007/978-1-4615-3270-5_9.

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Heslop-Harrison, J. S. "Energy Dispersive X-Ray Analysis." In Modern Methods of Plant Analysis, 244–77. Berlin, Heidelberg: Springer Berlin Heidelberg, 1990. http://dx.doi.org/10.1007/978-3-642-83611-4_9.

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Lyman, Charles E., Joseph I. Goldstein, Alton D. Romig, Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, et al. "Energy-Dispersive X-Ray Spectrometry." In Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy, 207–12. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1_34.

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Lyman, Charles E., Joseph I. Goldstein, Alton D. Romig, Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, et al. "Energy-Dispersive X-Ray Microanalysis." In Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy, 213–18. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1_35.

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Lyman, Charles E., Joseph I. Goldstein, Alton D. Romig, Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, et al. "Energy-Dispersive X-Ray Spectrometry." In Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy, 27–32. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1_5.

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Lyman, Charles E., Joseph I. Goldstein, Alton D. Romig, Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, et al. "Energy-Dispersive X-Ray Microanalysis." In Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy, 33–41. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1_6.

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Shindo, Daisuke, and Tetsuo Oikawa. "Energy Dispersive X-ray Spectroscopy." In Analytical Electron Microscopy for Materials Science, 81–102. Tokyo: Springer Japan, 2002. http://dx.doi.org/10.1007/978-4-431-66988-3_4.

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Potts, P. J. "Energy dispersive x-ray spectrometry." In A Handbook of Silicate Rock Analysis, 286–325. Dordrecht: Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-015-3988-3_9.

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Gooch, Jan W. "Energy Dispersive X-Ray Analysis (EDXRA)." In Encyclopedic Dictionary of Polymers, 268. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_4416.

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Conference papers on the topic "Dispersive energy of X-­rays"

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Stock, Stuart R., John S. Okasinski, Jonathan D. Almer, Russel Woods, Antonino Miceli, David P. Siddons, J. Baldwin, et al. "Tomography with energy dispersive diffraction." In Developments in X-Ray Tomography XI, edited by Bert Müller and Ge Wang. SPIE, 2017. http://dx.doi.org/10.1117/12.2274567.

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Kämpfe, B., R. Arnhold, and B. Michel. "ENERGY - DISPERSIVE X-RAY DIFFRACTION." In Proceedings of the XIX Conference. WORLD SCIENTIFIC, 2004. http://dx.doi.org/10.1142/9789812702913_0005.

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Demarest, James, Chris Deeb, Thomas Murray, and Hong-Ying Zhai. "Energy-Dispersive X-ray Spectrometry Performance on Multiple Transmission Electron Microscope Platforms." In ISTFA 2010. ASM International, 2010. http://dx.doi.org/10.31399/asm.cp.istfa2010p0301.

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Abstract:
Abstract Energy-dispersive X-ray spectrometry (EDS) is a key analytical tool aiding root cause determination in the failure analysis (FA) process. This paper looks at a number of analytical TEM microscopes currently in use in various facilities: microscope A, a STEM operated at 200kV; microscope B, a 300kV TEM; and microscopes C and D, both 200kV TEMs. EDS counts per unit time from multiple microscope platforms were examined. Microscope D demonstrated two orders of magnitude higher counts per unit time than the other three microscopes. Microscope D represents the state-of-the-art EDS analytical TEM configuration and has achieved this through a novel windowless EDS configuration which significantly increases the detector area (by about a factor of three) that receives X-rays generated from the sample.
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Carpenter, Joshua H., Dean Hazineh, Michael E. Gehm, and Joel A. Greenberg. "Quantifying crystalline texture with a tabletop energy and angle dispersive diffractometer for material identification (Conference Presentation)." In Anomaly Detection and Imaging with X-Rays (ADIX) V, edited by Amit Ashok, Michael E. Gehm, and Joel A. Greenberg. SPIE, 2020. http://dx.doi.org/10.1117/12.2560077.

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Stock, Stuart R., P. E. Morse, M. K. Stock, K. C. James, L. J. Natanson, H. Chen, P. V. Shevchenko, Evan Maxey, Olga Antipova, and J. S. Park. "3D tomography of shark vertebrae via energy dispersive diffraction." In Developments in X-Ray Tomography XIII, edited by Bert Müller and Ge Wang. SPIE, 2021. http://dx.doi.org/10.1117/12.2595040.

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Borisov, G. I., R. I. Kondratenko, V. A. Mikhin, B. V. Odinov, and A. V. Pukhov. "Energy dispersive x-ray fluorescence analyzer with several x-ray tubes." In SPIE Proceedings, edited by Muradin A. Kumakhov and Richard B. Hoover. SPIE, 2005. http://dx.doi.org/10.1117/12.638014.

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Tarnovskyi, Mykola H., Gennadii D. Doroshchenkov, Grigorii Pustovit, and Krzysztof Skorupski. "Improved x-ray fluorescent wavelength dispersive spectrometer." In Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019, edited by Ryszard S. Romaniuk and Maciej Linczuk. SPIE, 2019. http://dx.doi.org/10.1117/12.2536609.

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Cook, E. J., J. A. Griffiths, M. Koutalonis, C. Gent, S. Pani, J. A. Horrocks, L. George, S. Hardwick, and R. Speller. "Illicit drug detection using energy dispersive x-ray diffraction." In SPIE Defense, Security, and Sensing, edited by Brandon W. Blackburn. SPIE, 2009. http://dx.doi.org/10.1117/12.819132.

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Harris, William. "Energy dispersive x-ray analysis using a microcalorimeter detector." In The 2000 international conference on characterization and metrology for ULSI technology. AIP, 2001. http://dx.doi.org/10.1063/1.1354434.

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Marticke, F., C. Paulus, G. Montemont, O. Michel, J. I. Mars, and L. Verger. "Multi-angle reconstruction of energy dispersive X-ray diffraction spectra." In 2014 6th Workshop on Hyperspectral Image and Signal Processing: Evolution in Remote Sensing (WHISPERS). IEEE, 2014. http://dx.doi.org/10.1109/whispers.2014.8077640.

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Reports on the topic "Dispersive energy of X-­rays"

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Windover, D., T. M. Lu, S. L. Lee, W. Lee, and A. Kumar. Energy-Dispersive, X-Ray Reflectivity Density Measurements of Porous SiO2 Xeorgels. Fort Belvoir, VA: Defense Technical Information Center, March 2000. http://dx.doi.org/10.21236/ada376111.

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Friedrich, S., T. Niedermayr, O. Drury, T. Funk, M. Frank, S. E. Labov, and S. Cramer. Superconducting Detector System for High-Resolution Energy-Dispersive Soft X-Ray Spectroscopy. Office of Scientific and Technical Information (OSTI), February 2001. http://dx.doi.org/10.2172/15013583.

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Drummond, J. L., A. D. Steinberg, and A. R. Krauss. X-ray photo-emission and energy dispersive spectroscopy of HA coated titanium. Office of Scientific and Technical Information (OSTI), August 1997. http://dx.doi.org/10.2172/510589.

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Ting, Jason. Quantitative evaluation of material composition of composites using x-ray energy-dispersive NDE technique. Office of Scientific and Technical Information (OSTI), September 1993. http://dx.doi.org/10.2172/10184977.

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Veloso, J. F. C. A., J. M. F. dos Santos, C. A. N. Conde, and R. E. Morgado. The application of a microstrip gas counter to energy-dispersive x-ray fluorescence analysis. Office of Scientific and Technical Information (OSTI), July 1996. http://dx.doi.org/10.2172/266749.

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Webb, P. C., P. J. Potts, and J. S. Watson. A versatile method for analysis of oxide ore samples by energy dispersive X-ray fluorescence (ED-XRF). Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1993. http://dx.doi.org/10.4095/193298.

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Goldstein, S. J. Development of energy-dispersive X-ray fluorescence as a mobile analysis method for hazardous metals in transuranic waste. Office of Scientific and Technical Information (OSTI), September 1998. http://dx.doi.org/10.2172/674571.

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Windover, D., and S. L. Lee. Thin-Film Density Determination of Tantalum, Tantalum Oxides, and Xerogels by Multiple Radiation Energy Dispersive X-Ray Reflectivity. Fort Belvoir, VA: Defense Technical Information Center, May 1999. http://dx.doi.org/10.21236/ada364133.

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Pringle, G. J. Eddi: a Fortran Computer Program To Produce Corrected Microprobe Analyses of minerals using An Energy Dispersive X-ray Spectrometer. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1989. http://dx.doi.org/10.4095/130786.

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Zuccarelli, N., C. M. Lesher, M. G. Houlé, and S. J. Barnes. Variations in the textural facies of sulphide minerals in the Eagle's Nest Ni-Cu-(PGE) deposit, McFaulds Lake greenstone belt, Superior Province, Ontario: insights from microbeam scanning energy-dispersive X-ray fluorescence spectrometry. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 2020. http://dx.doi.org/10.4095/326895.

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