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Journal articles on the topic 'Dispersive energy of X-rays'

Author: Grafiati

Published: 4 June 2021

Last updated: 17 February 2022

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1

McCarthy, J. J., and D. J. McMillan. "Application of X-Ray Optics to Energy Dispersive Spectroscopy." Microscopy and Microanalysis 4, S2 (July 1998): 178–79. http://dx.doi.org/10.1017/s1431927600021012.

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The application of x-ray optics for focusing x-rays into high intensity spots or for collimation of x-ray beams has been reported by several authors. Example applications for x-ray optics include microfluorescence, microdiffraction, tomography and lithography, and WDS. Kirkland et al. pointed out that the use of an optic, in a collimating configuration could provide enhanced detection sensitivity in wavelength dispersive spectroscopy. In these proceedings last year, Agnello et al. presented data from a new WDS device specifically designed to use a grazing incidence collimating x-ray optic that confirmed and extended the work of Kirkland.A few studies have appeared reporting the use X-ray optics in applications using EDS. Focusing x-ray optics have been used on both the excitation and detection side of EDS systems. In a series of papers, Carpenter and his collaborators describe an x-ray microprobe which uses capillary optics to provide an intense convergent beam of x-rays from a microfocus x-ray tube to excite the sample for x-ray microfluorescence studies. Wollman et al.

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2

Ottmar, H., H. Eberle, P. Matussek, and I. Michel-Piper. "Energy-Dispersive X-Ray Techniques for Accurate Heavy Element Assay." Advances in X-ray Analysis 30 (1986): 285–92. http://dx.doi.org/10.1154/s0376030800021406.

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Energy-dispersive X-ray techniques can be employed in two different ways for the accurate determination of element concentrations in specimens: (1) spectrometry of fluoresced characteristic X-rays as widely applied in the various modes of the traditional XRF analysis technique, and (2) spectrometry of the energy-differential transmittance of an X-ray continuum at the element-specific absorption-edge energies.

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3

McCarthy, Jon J., and David J. McMillan. "Application of X-ray Optics to Energy-Dispersive Spectroscopy." Microscopy and Microanalysis 4, no. 6 (December 1998): 632–41. http://dx.doi.org/10.1017/s1431927698980618.

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X-ray optics have been used in X-ray analytical instruments for several years. Applications of X-ray optics have been reported in X-ray diffraction, X-ray fluorescence, and wavelength dispersive spectroscopy. X-ray optics have been used to increase the X-ray flux incident on the sample or to direct and focus emitted X-rays from a sample. We report here the use of a grazing incidence optic (GIO) as a flux-enhancing collimator for use with an energy-dispersive (ED) detector used to perform electron beam microanalysis. We found that the GIO in combination with an ED spectrometer (EDS) provides substantial intensity gain for X-ray lines with energy below 1 keV. The GIO is also found to provide a modest focus effect, and introduces minimal spectral artifacts.

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4

Statham, Peter J. "Measuring Performance of Energy-Dispersive X-ray Systems." Microscopy and Microanalysis 4, no. 6 (December 1998): 605–15. http://dx.doi.org/10.1017/s1431927698980588.

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As Si(Li) detector technology has matured, many of the fundamental problems have been addressed in the competition among manufacturers and there is now an expectation, implied by many textbooks, that all energy-dispersive X-ray (EDX) detectors are made and will perform in the same way. Although there has been some convergence in Si(Li) systems and these are still the most common, manufacturing recipes still differ and there are many alternative EDX devices, such as microcalorimeters and room temperature detectors, that have both advantages and disadvantages over Si(Li). Rather than emphasizing differences in technologies, performance measures should reveal benefits relevant to the intended application. The instrument is inevitably going to be a “black box” of integrated components; this article reviews some of the methods that have been applied and introduces some new techniques that can be used to assess performance without resorting to complex software or sophisticated mathematical algorithms. Sensitivity, resolution, artefacts, and stability are discussed with particular application to compositional analysis using electron beam excitation of X-rays in the 100-eV to 10-keV energy region.

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5

Egan, Christopher K., Simon D. M. Jacques, Matthew D. Wilson, Matthew C. Veale, Paul Seller, Philip J. Withers, and Robert J. Cernik. "Full-field energy-dispersive powder diffraction imaging using laboratory X-rays." Journal of Applied Crystallography 48, no. 1 (January 30, 2015): 269–72. http://dx.doi.org/10.1107/s1600576715000801.

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A laboratory instrument with the ability to spatially resolve energy-dispersed X-ray powder diffraction patterns taken in a single snapshot has been developed. The experimental arrangement is based on a pinhole camera coupled with a pixelated spectral X-ray detector. Collimation of the diffracted beam is defined by the area of the footprint of a detector pixel and the diameter of the pinhole aperture. Each pixel in the image, therefore, contains an energy-dispersed powder diffraction pattern. This new X-ray imaging technique enables spatial mapping of crystallinity, crystalline texture or crystalline phases from within a sample. Validation of the method has been carried out with a back-to-back comparison with crystalline texture mapping local to a friction stir weld in an aluminium alloy taken using synchrotron radiation.

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6

Lund, Mark W. "More Than One Ever Wanted To Know About X-ray Detectors Part V: Wavelength - The "Other" Spectroscopy." Microscopy Today 3, no. 4 (May 1995): 8–9. http://dx.doi.org/10.1017/s1551929500063537.

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The use of x-ray spectrometry in electron microscopy has been a powerful market driver not only for electron microscopes but also for x-ray spectrometers. More x-ray spectrometers are sold with electron microscopes than in any other configuration. A general name for the combination is AEM, or analytical electron microscope, though in modern times AEM can include other instrumentation such as electron energy loss spectroscopy and visible light spectroscopy. In previous articies I have discussed energy dispersive spectrometers (EDS). These use semiconductor crystals to detect the x-rays and measure the energy deposited in the crystal. A second type of x-ray spectrometer measures the wavelength of the x-rays, and so is called "wavelength dispersive spectrometry" (WDS).

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7

Lavelle, Bruno, L. Vendier, and O. Auriol. "Stresses Evaluation by Transmission Energy Dispersive X-Ray Diffraction Using Industrial Radiography Equipment." Materials Science Forum 490-491 (July 2005): 149–52. http://dx.doi.org/10.4028/www.scientific.net/msf.490-491.149.

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X-rays transmission stress analysis was tested on a 2mm thick steel sheet using energy dispersive X-rays diffraction (EDXD) and an industrial radiography equipment as X-ray source. A complex state of residual stresses was created in the sheet before the test and modified during the experiment by the way of a in-situ tensile test. In the diffracted beam spectrum, the energy peak displacement was related to macroscopic stresses using the elementary Mohr’s circle formalism for plane stress analysis. The change in the stresses thus analyzed is compared with the applied stress.

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8

Ritchie, Nicholas W. M. "Using DTSA-II to Simulate and Interpret Energy Dispersive Spectra from Particles." Microscopy and Microanalysis 16, no. 3 (April 20, 2010): 248–58. http://dx.doi.org/10.1017/s1431927610000243.

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AbstractA high quality X-ray spectrum image of a 3.3 μm diameter sphere of K411 glass resting on a copper substrate was collected at 25 keV. The same sample configuration was modeled using the NISTMonte Monte Carlo simulation of electron and X-ray transport as is integrated into the quantitative X-ray microanalysis software package DTSA-II. The distribution of measured and simulated X-ray intensity compare favorably for all the major lines present in the spectra. The simulation is further examined to investigate the influence of angle-of-incidence, sample thickness, and sample diameter on the generated and measured X-ray intensity. The distribution of generated X-rays is seen to deviate significantly from a naive model which assumes that the distribution of generated X-rays is similar to bulk within the volume they share in common. It is demonstrated that the angle at which the electron beam strikes the sample has nonnegligible consequences. It is also demonstrated that within the volume that the bulk and particle share in common that electrons, which have exited and later reentered the particle volume, generate a significant fraction of the X-rays. Any general model of X-ray generation in particles must take into account the lateral spread of the scattered electron beam.

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9

Agnello, R., J. Howard, J. McCarthy, and D. OHara. "The Use of Collimating X-Ray Optics For Wavelength Dispersive Spectroscopy." Microscopy and Microanalysis 3, S2 (August 1997): 889–90. http://dx.doi.org/10.1017/s1431927600011338.

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There has been much interest in the last few years in the technique for focusing x-rays into high intensity spots using tapered glass capillaries or other forms of grazing incident x-ray reflectors. The resulting microbeams have been used in applications that include microfluorescence, microdiffraction, tomography and lithography. Instead of focusing x-rays to a spot, a collimating optic can be used to capture x-rays from a point source and turn them into a collimated parallel beam at the exit aperture to the optic. Kirkland et. al. have pointed out that the use of such an optic could provide enhanced detection sensitivity in wavelength dispersive spectroscopy.We have developed a grazing incidence collimating x-ray optic that can be coupled to a simple wavelength dispersive spectrometer (WDS). This combined instrument was designed to enhance the intensity of x-rays from a sample by an order of magnitude or more in the energy range of 0 to 1 keV compared to a conventional WDS.

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10

Portale, Giuseppe, Alessandro Longo, Lucio D'Ilario, Andrea Martinelli, Ruggero Caminiti, and Valerio Rossi Albertini. "Small-angle energy-dispersive X-ray scattering using a laboratory-based diffractometer with a conventional source." Journal of Applied Crystallography 40, no. 2 (March 12, 2007): 218–31. http://dx.doi.org/10.1107/s0021889806053295.

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The use of polychromaticBremsstrahlungX-rays generated by commercial tubes for energy-dispersive small-angle scattering measurements has not been extensively discussed in the literature, mainly because of some difficulties associated with it. If a suitable experimental setup is chosen and concomitant phenomena are taken into account for correcting the observed X-ray patterns, energy-dispersive small-angle X-ray scattering (SAXS) may become an interesting alternative to conventional measurements based on monochromatic beams. Energy-dispersive SAXS experiments carried out on protein solutions, micelles, semicrystalline polymers and catalytic systems are discussed to illustrate the new opportunities offered by this technique as well as its limitations.

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11

Lane, David W., Antony Nyombi, and James Shackel. "Energy-dispersive X-ray diffraction mapping on a benchtop X-ray fluorescence system." Journal of Applied Crystallography 47, no. 2 (February 22, 2014): 488–94. http://dx.doi.org/10.1107/s1600576714000314.

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A method for energy-dispersive X-ray diffraction mapping is presented, using a conventional low-power benchtop X-ray fluorescence spectrometer, the Seiko Instruments SEA6000VX. Hyper spectral X-ray maps with a 10 µm step size were collected from polished metal surfaces, sectioned Bi, Pb and steel shot gun pellets. Candidate diffraction lines were identified by eliminating those that matched a characteristic line for an element and those predicted for escape peaks, sum peaks, and Rayleigh and Compton scattered primary X-rays. The maps showed that the crystallites in the Bi pellet were larger than those observed in the Pb and steel pellets. The application of benchtop spectrometers to energy-dispersive X-ray diffraction mapping is discussed, and the capability for lower atomic number and lower-symmetry materials is briefly explored using multi-crystalline Si and polycrystalline sucrose.

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12

Barè, Simona, Jeremy K. Cockcroft, Sally L. Colston, Andrew C. Jupe, and Adrian R. Rennie. "X-ray study of the orientational order of a concentrated dispersion of kaolinite under flow." Journal of Applied Crystallography 34, no. 5 (September 25, 2001): 573–79. http://dx.doi.org/10.1107/s0021889801009530.

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Diffraction with high-energy X-rays is used to determine the orientational alignment of kaolinite particles dispersed in water as they flow down a pipe. Angle-dispersive and energy-dispersive diffraction methods are compared. Detailed studies of samples as thick as 1 cm were possible using energy-dispersive diffraction. A tomographic technique with the sample scanned and rotated in the beam allows maps of the alignment to be determined. The alignment across a pipe of rectangular section was determined. A strong effect caused by the walls was observed, the plate-like particles tending to lie parallel to the wall near the boundary of the pipe.

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13

Witherspoon, Kenny C., Brian J. Cross, and Mandi D. Hellested. "Combined Electron Excitation and X-Ray Excitation for Spectrometry in the SEM." Microscopy Today 21, no. 4 (July 2013): 24–28. http://dx.doi.org/10.1017/s1551929513000709.

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Energy-dispersive X-ray spectrometry (EDS) is an analytical technique used to determine elemental composition. It is a powerful, easy-to-use, non-destructive technique that can be employed for a wide variety of materials. In this technique the electron beam of the scanning electron microscope (SEM) impinges on the sample and excites atomic electrons causing the production of characteristic X rays. These characteristic X rays have energies specific to elements in the sample. The EDS detector collects these X rays as a signal and produces a spectrum. Samples also can be excited by X rays. Collimated and focused X rays from an X-ray source produce characteristic X rays that can be detected by the same EDS detector. When X rays are used as the source of excitation, the method is then called X-ray fluorescence (XRF) or micro-XRF.

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14

Peeters, Marc H., and Max T. Otten. "PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 56–57. http://dx.doi.org/10.1017/s0424820100152252.

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Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

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15

Michel-Hart, N., and W. T. Elam. "Low-energy shelf response in thin energy-dispersive X-ray detectors from Compton scattering of hard X-rays." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 863 (August 2017): 1–6. http://dx.doi.org/10.1016/j.nima.2017.04.039.

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16

Nockolds, C. E. "The limitations of quantitative EDS analysis at low voltage." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 476–77. http://dx.doi.org/10.1017/s0424820100164842.

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There are several reasons for carrying out x-ray microanalysis at low beam energies. In conventional electron probe microanalysis with wavelength dispersive spectrometers (WDS) there has been a considerable effort in recent years to improve the accuracy of quantitative analysis of the “light” elements B, C, N and O. The shapes of the low energy K x-rays and the L x-rays of the first transition series metals are also being studied with the aim of determining the chemical environments of the atoms in a sample. In most materials these soft x-rays suffer from very high absorption, and reducing the depth of the interaction volume by lowering the beam voltage to 5kV or below leads to a much reduced absorption correction. In scanning electron microscopy the introduction of thin window energy dispersive spectrometers (EDS) has made it possible to look at low energy x-rays and here the main interest in working at low voltages is in the improvement of the resolution of analysis.In this paper the limitations of SEM/EDS low voltage analysis will be examined, and possible solutions to some of the problems explored. It will be assumed that the aims are to achieve quantitative analysis at the best possible spatial resolution.

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17

Carbone, Marilena, Paolo Ballirano, and Ruggero Caminiti. "Kinetics of gypsum dehydration at reduced pressure: an energy dispersive X-ray diffraction study." European Journal of Mineralogy 20, no. 4 (August 29, 2008): 621–27. http://dx.doi.org/10.1127/0935-1221/2008/0020-1826.

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18

Wollman, D. A., Dale E. Newbury, G. C. Hilton, K. D. Irwin, D. A. Rudman, L. L. Dulcie, N. F. Bergren, and John M. Martinis. "Microcalorimeter Energy Dispersive Spectrometry for Low Voltage SEM." Microscopy and Microanalysis 5, S2 (August 1999): 304–5. http://dx.doi.org/10.1017/s1431927600014847.

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Microanalysis performed at low electron beam energies (≤ 5 keV) is limited by the physics of x-ray generation and the performance of existing semiconductor energy dispersive spectrometry (EDS) and wavelength dispersive spectrometry (WDS). Low beam energy restricts the atomic shells that can be excited for elements of intermediate and high atomic number, forcing the analyst to consider using unconventional M- and N-shells for elements such as Sn and Au. Unfortunately, these shells have very low fluorescent yield, which results in inherently low spectral peak-to-background ratios. The modest energy resolution of semiconductor EDS leads to poor limits of detection for these weakly emitted photons. The situation is further complicated by the inevitable interferences with the much more strongly excited K-shell x-rays of the light elements, particularly carbon and oxygen. WDS has the spectral resolution to overcome the resolution limitations of semiconductor EDS. However, WDS has a low geometric efficiency, and because of its narrow instantaneous spectral transmission, spectral scanning is required to detect and analyze x-ray peaks. Moreover, the high resolution field-emission-gun scanning electron microscope (FEG-SEM) provides only a few nanoamperes of beam current.

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19

Andrä, Marie, Jiaguo Zhang, Anna Bergamaschi, Rebecca Barten, Camelia Borca, Giacomo Borghi, Maurizio Boscardin, et al. "Development of low-energy X-ray detectors using LGAD sensors." Journal of Synchrotron Radiation 26, no. 4 (June 18, 2019): 1226–37. http://dx.doi.org/10.1107/s1600577519005393.

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Recent advances in segmented low-gain avalanche detectors (LGADs) make them promising for the position-sensitive detection of low-energy X-ray photons thanks to their internal gain. LGAD microstrip sensors fabricated by Fondazione Bruno Kessler have been investigated using X-rays with both charge-integrating and single-photon-counting readout chips developed at the Paul Scherrer Institut. In this work it is shown that the charge multiplication occurring in the sensor allows the detection of X-rays with improved signal-to-noise ratio in comparison with standard silicon sensors. The application in the tender X-ray energy range is demonstrated by the detection of the sulfur K α and K β lines (2.3 and 2.46 keV) in an energy-dispersive fluorescence spectrometer at the Swiss Light Source. Although further improvements in the segmentation and in the quantum efficiency at low energy are still necessary, this work paves the way for the development of single-photon-counting detectors in the soft X-ray energy range.

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20

O’Hara, David, Greg Brown, and Eric Lochner. "Improving EDS For Low Energy X-Rays Under 1000eV Using an Attachable Detector Optic." Microscopy Today 16, no. 2 (March 2008): 6–9. http://dx.doi.org/10.1017/s155192950005584x.

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Although considerable advances have been made in Energy Dispersive Detectors for microanalysis, low energy analysis under 1000eV is still relatively poor due to detector response and inefficient production of low energy x-rays. X-ray optics fabrication methods by O’Hara and measurements by McCarthy et. al. indicated that it should be possible to fabricate x-ray optics that could be used to significantly increase the low energy x-ray flux seen by an EDS detector without increasing the beam current. Such an optic would be useful to increase low energy counts without moving the detector closer, which would simply increase the high energy counts and dead time.

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21

Friedrich, S., C. A. Mears, B. Nideröst, L. J. Hiller, M. Frank, S. E. Labov, A. T. Barfknecht, and S. P. Cramer. "Superconducting Tunnel Junction Array Development for High-Resolution Energy-Dispersive X-ray Spectroscopy." Microscopy and Microanalysis 4, no. 6 (December 1998): 616–21. http://dx.doi.org/10.1017/s143192769898059x.

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Cryogenic energy-dispersive X-ray detectors are being developed because of their superior energy resolution (10 eV FWHM for keV X-rays) compared to that achieved in semiconductor energy-dispersive spectrometry (EDS) systems. So far, their range of application is limited because of their comparably small size and low count rate. We present data on the development of superconducting tunnel junction (STJ) detector arrays to address both of these issues. A single STJ detector has a resolution of around 10 eV below 1 keV and can be operated at count rates of the order 10,000 counts/sec. We show that the simultaneous operation of several STJ detectors does not dimish their energy resolution significantly, and it increases the detector area and the maximum count rate by a factor given by the total number of independent channels.

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22

Pizzini, S., M. Bonfim, F. Baudelet, H. Tolentino, A. San Miguel, K. Mackay, C. Malgrange, M. Hagelstein, and A. Fontaine. "Quarter-Wave Plates and X-ray Magnetic Circular Dichroism on ID24 at the ESRF." Journal of Synchrotron Radiation 5, no. 5 (September 1, 1998): 1298–303. http://dx.doi.org/10.1107/s0909049598004154.

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The first XMCD measurements carried out on the ID24 energy-dispersive XAS beamline at the ESRF are reported. Circular-polarized X-rays are obtained using perfect diamond crystals as quarter-wave plates. The very small source divergence allows circular polarizations close to unity to be obtained.

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23

Simabuco, S. M., and V. F. Nascimento Filho. "Quantitative analysis by energy dispersive X-ray fluorescence by the transmission method applied to geological samples." Scientia Agricola 51, no. 2 (August 1994): 197–206. http://dx.doi.org/10.1590/s0103-90161994000200001.

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Three certified samples of different matrices (Soil-5, SL-1/IAEA and SARM-4/SABS) were quantitatively analysed by energy dispersive X-ray fluorescence with radioisotopic excitation. The observed errors were about 10-20% for the majority of the elements and less than 10% for Fe and Zn in the Soil-5, Mn in SL-1, and Ti, Fe and Zn in SARM-4 samples. Annular radioactive sources of Fe-55 and Cd-109 were utilized for the excitation of elements while a Si(Li) semiconductor detector coupled to a multichannel emulation card inserted in a microcomputer was used for the detection of the characteristic X-rays. The fundamental parameters method was used for the determination of elemental sensitivities and the irradiator or transmission method for the correction of the absorption effect of characteristic X-rays of elements on the range of atomic number 22 to 42 (Ti to Mo) and excitation with Cd-109. For elements in the range of atomic number 13 to 23 (Al to V) the irradiator method cannot be applied since samples are not transparent for the incident and emergent X-rays. In order to perform the absorption correction for this range of atomic number excited with Fe-55 source, another method was developed based on the experimental value of the absorption coefficients, associated with absorption edges of the elements.

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24

Miculescu, Florin, Ion Pencea, Marian Miculescu, Iulian Antoniac, Lucian Toma Ciocan, and Adrian Ernuteanu. "Energy Dispersive Techniques Using X-Ray Fluorescence with Primary X-Rays for Human Hard Tissues Analysis." Key Engineering Materials 583 (September 2013): 129–33. http://dx.doi.org/10.4028/www.scientific.net/kem.583.129.

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Among others, biomedical research is conducted for the systematic collection and analysis of data from which general conclusions can be drawn and which can increase the life quality of the patients. Given these issues, the aim of the research presented in this paper is to analyze the concentration of heavy elements from the human body, using complementary analysis methods, based on the energy dispersion spectrometry (EDS) technique.

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Send, Sebastian, Ali Abboud, Nadja Wiesner, Mohammad Shokr, Manuela Klaus, Christoph Genzel, Tuba Conka-Nurdan, et al. "Application of a pnCCD for energy-dispersive Laue diffraction with ultra-hard X-rays." Journal of Applied Crystallography 49, no. 1 (February 1, 2016): 222–33. http://dx.doi.org/10.1107/s1600576715023997.

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In this work the spectroscopic performance of a pnCCD detector in the ultra-hard energy range between 40 and 140 keV is tested by means of an energy-dispersive Laue diffraction experiment on a GaAs crystal. About 100 Bragg peaks were collected in a single-shot exposure of the arbitrarily oriented sample to white synchrotron radiation provided by a wiggler at BESSY II and resolved in a large reciprocal-space volume. The positions and energies of individual Laue spots could be determined with a spatial accuracy of less than one pixel and a relative energy resolution better than 1%. In this way the unit-cell parameters of GaAs were extracted with an accuracy of 0.5%, allowing for a complete indexing of the recorded Laue pattern. Despite the low quantum efficiency of the pnCCD (below 7%), experimental structure factors could be obtained from the three-dimensional data sets, taking into account photoelectric absorption as well as Compton scattering processes inside the detector. The agreement between measured and theoretical kinematical structure factors calculated from the known crystal structure is of the order of 10%. The results of this experiment demonstrate the potential of pnCCD detectors for applications in X-ray structure analysis using the complete energy spectrum of synchrotron radiation.

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26

Araüjo, F., F. He, P. Van Espen, and R. Van Grieken. "Absorption Corrections via Backscattered Radiation in Polychromatic Excitation Energy-Dispersive X-ray Fluorescence Spectrometry." Advances in X-ray Analysis 33 (1989): 515–20. http://dx.doi.org/10.1154/s0376030800019959.

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The incoherently and coherently scattered X-ray intensities with the corresponding scatter factors have been used previously define in a sample matrix the light elements (Z<12) constituents which can not be a s sessed via their fluorescent radiation in conventional XRF. Recently, a more complete sample definition has been achieved based on the backscattered X-rays, by using two excitation modes. However, all quantitative EDXRF methods, based on the scattered radiation from the sample relied hitherto uniquely on the use of monochromatic excitation radiation.

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Skelton, E. F., A. R. Drews, M. S. Osofsky, S. B. Qadri, J. Z. Hu, T. A. Vanderah, J. L. Peng, and R. L. Greene. "Direct Observation of Microscopic Inhomogeneities with Energy-Dispersive Diffraction of Synchrotron-Produced X-rays." Science 263, no. 5152 (March 11, 1994): 1416–18. http://dx.doi.org/10.1126/science.263.5152.1416.

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28

Send, Sebastian, Ali Abboud, Nadja Wiesner, Mohammad Shokr, Tuba Conka-Nurdan, Manuela Klaus, Christoph Genzel, et al. "Application of a pnCCD for energy-dispersive Laue diffraction with ultra-hard X-rays." Acta Crystallographica Section A Foundations and Advances 71, a1 (August 23, 2015): s500—s501. http://dx.doi.org/10.1107/s2053273315092608.

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29

Mohammadzai, Imdad Ullah, Ziarat Shah, and Hamayun Khan. "Elemental Composition of Date Palm (Phoenix dactylifera L.) Using Energy Dispersive X-Rays Spectrometry." Pakistan Journal of Scientific & Industrial Research Series A: Physical Sciences 54, no. 3 (October 24, 2011): 149–51. http://dx.doi.org/10.52763/pjsir.phys.sci.54.3.2011.149.151.

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30

Akça, Burcu, and Salih Erzeneoğlu. "The determination of molecular scattering differential cross sections for compounds of some essential elements at 3.38 Å−1 photon momentum transfer." Canadian Journal of Physics 94, no. 5 (May 2016): 497–500. http://dx.doi.org/10.1139/cjp-2015-0763.

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Molecular scattering differential cross sections of 59.5 keV γ-rays have been measured for some compounds of Na, Mg, Al, Ca, and Fe elements at 90°. The γ-rays of Am-241 were counted using a Si(Li) detector of EDXRF (energy dispersive X-ray fluorescence) system. The experimental results have been compared with non-relativistic and relativistic theoretical values.

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31

Morales-Nin, Beatriz, José Manuel Fortuño, Sílvia Pérez-Mayol, and Amalia Grau. "The use of energy dispersive X-ray spectroscopy to detect strontium marks in fish otoliths." Scientia Marina 76, no. 1 (December 19, 2011): 173–76. http://dx.doi.org/10.3989/scimar.03399.16b.

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32

Tada, Y., Y. Sako, K. Iwamoto, S. Gonsui, and T. Arai. "Instrumentation and Applications for Total Reflection X-Ray Fluorescence Spectrometry." Advances in X-ray Analysis 32 (1988): 131–39. http://dx.doi.org/10.1154/s0376030800020395.

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X-ray fluorescence spectrometry has been used in a broad spectrum of applications. These include elemental analysis, both qualitative and quantitative, based on wavelength dispersive (WDXRF) or energy dispersive (EDXRF) methods. In these methods the detection limit of analyte elements is mainly in the one to ten ppm range in solid samples. Therefore, improvement of these limits is desirable for many useful applications. In this context it is essential to remember that the excitation efficiency for fluorescent X-rays is very low when compared with electron or proton excitation. In the case of WDXRF, the dominant factor is the low reflectivity from the analyzing crystal.

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33

De Celis, Benito. "X-ray Fluorescence Analysis of Gold Ore." Applied Spectroscopy 50, no. 5 (May 1996): 572–75. http://dx.doi.org/10.1366/0003702963905853.

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A method to obtain high sensitivity and accuracy for nondestructive analysis of gold ore is proposed. The applied technique is energy-dispersive X-ray fluorescence, using a Co-57 radioisotope source to excite gold K X-rays in the sample, and a high-purity Ge (HPGe) detector with a range of energies from 1 keV to 4 MeV. The use of radioisotope sources and K X-rays gives some advantages in comparison with other analytical techniques and the usual tube excitation L X-ray analysis: the high sensitivity to concentrations of 1 ppm, the absence of interferences from other elements present in the matrix, and the possibility of performing fast and economical nondestructive analyses of large samples.

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34

Limkitjaroenporn, Pruittipol, Suparat Tuscharoen, and Jakrapong Kaewkhao. "The Mass Attenuation Coefficients and Effective Atomic Numbers of Ruby from Vietnam at Different Photon Energies." Advanced Materials Research 770 (September 2013): 287–90. http://dx.doi.org/10.4028/www.scientific.net/amr.770.287.

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The mass attenuation coefficients and effective atomic numbers of ruby from Vietnam were measured at the different energy of γ-rays using the Compton scattering technique. The compositions of ruby were analyzed by energy dispersive x-rays fluorescence spectrometer and showed the Al2O3 is major composition. The results of the experimental values of mass attenuation coefficients and effective atomic numbers showed the good agreement with the theoretical values. The mass attenuation coefficients decreased with the increasing in gamma rays energies, due to the higher photon interaction probability of ruby at lower energy. The effective atomic numbers found to be constant around 10.0 electrons/atom.

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35

Markert, T. H. "Dispersive Spectroscopy on AXAF." International Astronomical Union Colloquium 115 (1990): 339–45. http://dx.doi.org/10.1017/s0252921100012550.

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AbstractThere are two transmission grating spectrometers and one Bragg crystal spectrometer being developed for the Advanced X-ray Astrophysics Facility (MIT is building the crystal spectrometer and one of the grating spectrometers; the Laboratory for Space Research in Utrecht is responsible for the other grating spectrometer). The gratings divide the AXAF energy band (80 eV – 10 keV) into three regions (the MIT instrument contains gratings with two different periods) and attain resolving powers for point sources between 100 and 1800. The gratings are composed of arrays of small facets mounted on plates which can be inserted immediately behind the AXAF telescope. The dispersed spectra from the grating arrays are read out by one of the AXAF imaging instruments.The Bragg Crystal Spectrometer (BCS) is a focal plane instrument. One of eight selectable curved diffractors intercepts the AXAF X-ray beam as it diverges beyond the focal point X-rays that satisfy Bragg’s law are reflected from the crystal which, because of its curvature, re-focuses the beam onto an imaging detector. Narrow spectral regions are scanned by rocking the crystal over a range ~0.1 to 1°. Nearly the entire AXAF energy range can be studied by selecting the appropriate crystal and rotating it to the proper Bragg angle. The BCS achieves the highest spectral resolutions of the AXAF spectrometers: for 500 eV < E < 1600 eV, the FWHM of a narrow line (ΔE) is ≲ 1 eV.

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36

Pistorius, Petrus Christiaan, and Neerav Verma. "Matrix Effects in the Energy Dispersive X-Ray Analysis of CaO-Al2O3-MgO Inclusions in Steel." Microscopy and Microanalysis 17, no. 6 (November 4, 2011): 963–71. http://dx.doi.org/10.1017/s1431927611012268.

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AbstractEnergy dispersive X-ray microanalysis of micron-sized inclusions in steel is of considerable industrial importance. Measured spectra and Monte Carlo simulations show a significant effect of the steel matrix on analysis of CaO-Al2O3-MgO inclusions: the steel matrix filters the softer (Al and Mg) characteristic X-rays, increasing the relative height of the Ca peak. Bulk matrix correction methods would not result in correct inclusion compositions, but operating at a lower acceleration voltage shifts the effect to smaller inclusion sizes.

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37

Takeda, Kazuki, Hideyuki Miyatake, Sam-Yong Park, Masahide Kawamoto, Nobuo Kamiya, and Kunio Miki. "Multi-wavelength anomalous diffraction method for I and Xe atoms using ultra-high-energy X-rays from SPring-8." Journal of Applied Crystallography 37, no. 6 (November 11, 2004): 925–33. http://dx.doi.org/10.1107/s0021889804023076.

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The first successful multi-wavelength anomalous diffraction (MAD) experiments using ultra-high-energy X-rays (∼35 keV) were performed for iodine and xenon derivatives of hen egg-white lysozyme crystals. The beamline BL41XU of SPring-8 enabled the collection of high-quality MAD data, which led to the calculation of anomalous or dispersive difference Patterson maps that determined the positions of iodine and xenon atoms. The electron density maps obtained by the density modification method for both cases proved to be of sufficient quality for building molecular models. I-MAD and Xe-MAD phasing are now available at SPring-8, and the utilization of ultra-high-energy X-rays will make a significant contribution to the solution of the phase problem in protein crystallography.

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38

Schwenke, H., W. Berneike, J. Knoth, and U. Weisbrod. "How to Use the Features of Total Reflection of X-Rays for Energy Dispersive XRF." Advances in X-ray Analysis 32 (1988): 105–14. http://dx.doi.org/10.1154/s037603080002036x.

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AbstractThe total reflection of X-rays is mainly determined by three parameters , that is the orltical angle, the reflectivity and the penetration depth. For X-ray fluorescence analysis the respective characteristic features can be exploited in two rather different fields of application. In the analysis of trace elements in samples placed as thin films on optical flats, detection limits as low as 2 pg or 0.05 ppb, respectively, have been obtained. In addition, a penetration depth in the nanometer regime renders Total Reflection XRF an inherently sensitive method for the elemental analysis of surfaces. This paper outlines the main physical and constructional parameters for instrumental design and quantitation in both branches of TXRF.

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39

Sasaki, Y. C., Y. Suzuki, H. Yamanashi, A. Arai, and M. Yanagihara. "Time-resolved fluorescent X-ray interference." Journal of Synchrotron Radiation 5, no. 3 (May 1, 1998): 1075–78. http://dx.doi.org/10.1107/s0909049598002787.

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A fluorescent X-ray interference method can effectively measure nanometer-level conformational changes for non-crystallized molecules and proteins in aqueous conditions. The time-resolved technique can be used to obtain information about the dynamics of molecules and proteins. Instrumentation for time-resolved fluorescent X-ray interference has been designed. A typical interference-fringe pattern was observed with approximately 3 s of X-ray exposure time from K-fluorescent X-rays emitted from a Zn monoatomic layer on an Rh substrate. The primary X-ray beam was polychromed with a mirror for total external reflection of X-rays and was tuned to an energy level at which only Zn K radiation became optimally excited. The glancing angle of the primary X-ray beam was fixed at a glancing angle at which the total intensity of K-fluorescent X-rays emitted from Zn atoms corresponded to the maximum value. The fluorescent X-ray interference fringes were monitored with an imaging plate (IP) as a non-energy-dispersive two-dimensional detector. The exposed interference fringes on the IP were integrated along the direction of the fringes. The integrated fringes were in close agreement with a theoretical estimate based on the interference among transmitted and reflected waves at interfaces in the sample.

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40

Hovington, P., V. Timoshevskii, S. Bessette, S. Burgess, P. Statham, H. Demers, R. Gauvin, and K. Zaghib. "On the Detection Limits of Li K X-rays Using Windowless Energy Dispersive Spectrometer (EDS)." Microscopy and Microanalysis 23, S1 (July 2017): 2024–25. http://dx.doi.org/10.1017/s1431927617010789.

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41

Gasgnier, M., P. Tremblay, R. Suryanarayanan, H. Pankowska, M. Rateau, and O. Gorochov. "PbSrYCaCuO : a new class of superconducting materials. Chemical analyses refined by Energy Dispersive X-rays." Revue de Physique Appliquée 25, no. 1 (1990): 39–44. http://dx.doi.org/10.1051/rphysap:0199000250103900.

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42

Rao, K. V., G. C. Pandey, S. F. Xavier, and Y. N. Sharma. "Studies on the distribution of reinforcement in composites by energy dispersive analysis of X-rays." Polymer Composites 12, no. 6 (December 1991): 447–51. http://dx.doi.org/10.1002/pc.750120610.

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43

Baumer, Christian, Gerhard Martens, Bernd Menser, Ewald Roessl, Jens-Peter Schlomka, Roger Steadman, and GÜnter Zeitler. "Testing an Energy-Dispersive Counting-Mode Detector With Hard X-Rays From a Synchrotron Source." IEEE Transactions on Nuclear Science 55, no. 3 (June 2008): 1785–90. http://dx.doi.org/10.1109/tns.2008.924083.

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44

JOSEPH, DAISY, A. SAXENA, S. K. GUPTA, and S. KAILAS. "PIXE STUDIES ON GOLD STANDARDS BY PROTONS OF ENERGY 3.3 MeV." International Journal of PIXE 14, no. 03n04 (January 2004): 141–46. http://dx.doi.org/10.1142/s0129083504000203.

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Proton Induced X-ray Emission Technique (PIXE) has been used in analyzing Gold standards of 22, 20, 18, and 14 karats with a proton beam of Energy 3.3 MeV at the newly commissioned Folded Tandem Ion Accelerator (FOTIA) at B.A.R.C, Trombay. Well resolved Au and Ag X-rays were detected at a current of 3 nA . Percentage values of gold and silver were calculated and were checked with those obtained by Energy Dispersive X-ray Fluorescence (EDXRF) Method and were found to be in agreement with the certified values as well as those obtained by XRF.

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45

Streli, Christina, V. Bauer, and P. Wobrauschek. "Recent Developments in Txrf of Light Elements." Advances in X-ray Analysis 39 (1995): 771–79. http://dx.doi.org/10.1154/s0376030800023235.

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Total Reflection X-ray Fluorescence Analysis (TXRF) has been proved to be well suited for the energy dispersive analysis of light elements, as B, C, N, O, F, Na, Mg,.,. using a special spectrometer. It is equipped with a Ge(HP) detector offering a sufficient detection efficiency from 180 eV upwards. The obtainable detection limits especially of the light elements are mainly influenced by the excitation source, which should provide a large number of photons with an energy near the K-absorption edge of these elements (from 200 eV upwards). Commercially available X-ray tubes do not offer characteristic X-rays in that range. In former experiments a windowless X-ray tube was built to prevent the low energy X-rays from being attenuated in the Be window. Experiments have been performed using Cu as anode material.

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46

Newbury, Dale E. "Basic literacy in electron-excited x-ray microanalysis." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 502–3. http://dx.doi.org/10.1017/s0424820100148344.

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Electron beam x-ray microanalysis with energy dispersive x-ray spectrometry (EDS), as performed in electron probe microanalyzers (EPMA)/scanning electron microscopes (SEM) for thick specimens and analytical electron microscopes (AEM) for thin sections, is a powerful technique with wide applicability in the physical and biological sciences and technology communities. The operation of an EDS x-ray microanalysis system has been automated to the point that many users now consider EDS to be a routine tool where the results reported by the automation system are always correct Unfortunately, there are numerous pitfalls awaiting the unwary analyst. All EDS users require a basic level of literacy in x-ray microanalysis to properly interpret spectra and develop a sensible analysis strategy for their problems. This “basic literacy” includes knowledge of the factors controlling the efficiency of production of characteristic and continuum x-rays, the characteristic energies and structure of x-ray families that provide the basis for qualitative analysis, the operational characteristics of energy dispersive x-ray spectrometers, including artifacts, and the systematic procedures for qualitative and quantitative analysis.

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47

Khatami, Mehrdad, Mina Sarani, Faride Mosazadeh, Mohammadreza Rajabalipour, Alireza Izadi, Meghdad Abdollahpour-Alitappeh, Marcos Augusto Lima Nobre, and Fariba Borhani. "Nickel-Doped Cerium Oxide Nanoparticles: Green Synthesis Using Stevia and Protective Effect against Harmful Ultraviolet Rays." Molecules 24, no. 24 (December 4, 2019): 4424. http://dx.doi.org/10.3390/molecules24244424.

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Nanoparticles of cerium oxide CeO2 are important nanomaterials with remarkable properties for use in both industrial and non-industrial fields. In a general way, doping of oxide nanometric with transition metals improves the properties of nanoparticles. In this study, nickel- doped cerium oxide nanoparticles were synthesized from Stevia rebaudiana extract. Both doped and non-doped nanoparticles were characterized by X-ray diffraction, Field Emission Scanning Electron Microscopy, Energy Dispersive X-ray, Raman spectroscopy, and Vibrating-Sample Magnetometry analysis. According to X-ray diffraction, Raman and Energy Dispersive X-ray crystalline and single phase of CeO2 and Ni doped CeO2 nanoparticles exhibiting fluorite structure with F2g mode were synthesized. Field Emission Scanning Electron Microscopy shows that CeO2 and Ni doped nanoparticles have spherical shape and sizes ranging of 8 to 10 nm. Ni doping of CeO2 results in an increasing of magnetic properties. The enhancement of ultraviolet protector character via Ni doping of CeO2 is also discussed.

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48

Cengiz, Erhan, Muhammet Dogan, Zekeriya Biyiklioglu, Dilek Cakir, Engin Tirasoglu, and Gökhan Apaydin. "K X-ray fluorescence parameters of peripherally and non-peripherally tetra-substituted zinc (II) phthalocyanines." Canadian Journal of Physics 95, no. 2 (February 2017): 125–29. http://dx.doi.org/10.1139/cjp-2016-0226.

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The K shell production cross-sections and Kβ to Kα X-ray intensity ratios of peripherally and non-peripherally tetra-substituted zinc (II) phthalocyanine complexes were determined using energy dispersive X-ray fluorescence spectrometry (EDXRF). The effect of substituent position on these parameters was also investigated. The complexes were excited by 59.5 keV γ-rays from an 241Am annular radioactive source and K X-rays emitted by the complexes were counted by an Ultra-LEGe detector with a resolution of 150 eV at 5.9 keV. The experimental results of the zinc phthalocyanines having the same ligand substituted peripheral and non-peripheral were compared with each other, theoretical, and experimental values of pure zinc.

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49

Patra, N., U. G. P. S. Sachan, S. SundarRajan, Sanjay Malhotra, Vijay Harad, Ankur Agarwal, Ashutosh Divedi, S. N. Jha, and D. Bhattacharyya. "First results from the XMCD facility at the Energy-Dispersive EXAFS beamline of the Indus-2 synchrotron source." Journal of Synchrotron Radiation 26, no. 2 (February 12, 2019): 445–49. http://dx.doi.org/10.1107/s1600577519000602.

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Setting up of the X-ray Magnetic Circular Dichroism (XMCD) measurement facility with hard X-rays at the Energy-Dispersive EXAFS beamline (BL-08) at the Indus-2 synchrotron source is reported. This includes the design and development of a water-cooled electromagnet having a highest magnetic field of 2 T in a good field volume of 125 mm3 and having a 10 mm hole throughout for passage of the synchrotron beam. This also includes the development of an (X–Z–θ) motion stage for the heavy electromagnet for aligning its axis and the beam hole along the synchrotron beam direction. Along with the above developments, also reported is the first XMCD signal measured on a thick Gd film in the above set-up which shows good agreement with the reported results. This is the first facility to carry out XMCD measurement with hard X-rays in India.

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50

Bell, David C., Anthony J. Garratt-Reed, and Linn W. Hobbs. "RDF Analysis of Radiation-Amorphized SiC using a field Emission Scanning Electron Microscope." Microscopy and Microanalysis 4, S2 (July 1998): 700–701. http://dx.doi.org/10.1017/s143192760002362x.

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AbstractFast electrons are a particularly useful chemical and structural probe for the small sample volumes associated with ion- or fast electron-irradiation-induced amorphization, because of their much stronger interaction with matter than for X-rays or neutrons, and also because they can be readily focused to small probes. Three derivative signals are particularly rich in information: the angular distribution of scattered electrons (which is utilized in both diffraction and imaging studies); the energy loss spectrum of scattered electrons (electron energy loss spectroscopy, or EELS); and the emission spectrum of characteristic X-rays resulting from ionization energy losses (energy dispersive X-ray spectroscopy, or EDXS). We have applied the first two to the study of three amorphized compounds (AIPO4, SiO2, SiC) using MIT's Vacuum Generators HB603 field-emission (FEG) scanning transmission electron microscope (STEM), operating at 250 kV and equipped with a Gatan digital parallel-detection electron energy-loss spectrometer (digiPEELS).

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