Relevant bibliographies by topics / EBSD - Electron BackScatter Diffraction

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  2. Dissertations / Theses
  3. Books
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Academic literature on the topic 'EBSD - Electron BackScatter Diffraction'

Author: Grafiati
Published: 4 June 2021
Last updated: 22 February 2023

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Journal articles on the topic "EBSD - Electron BackScatter Diffraction"

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SUZUKI, Seiichi. "Electron BackScatter Diffraction method." JOURNAL OF THE JAPAN WELDING SOCIETY 85, no. 8 (2016): 736–39. http://dx.doi.org/10.2207/jjws.85.736.

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Deal, Andrew. "Introduction: Electron Backscatter Diffraction Special Section." Microscopy and Microanalysis 19, no. 4 (June 24, 2013): 920. http://dx.doi.org/10.1017/s1431927613001955.

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Welcome to the second special section of Microscopy and Microanalysis focused on electron backscatter diffraction (EBSD), which follows the June 2011 issue. The content of the previous special section was provided by participants at EBSD 2010, the second Microanalysis Society (MAS) topical conference dedicated to EBSD in the United States. The present 2013 special section includes work from participants at both EBSD 2012, the third of such topical conferences (held June 19–21, 2012 at Carnegie Mellon University, Pittsburgh, PA), and EMAS 2012, the European Microanalysis Society's 10th Regional Workshop that included three EBSD sessions (held June 17–20 at the Institute for Geosciences and Earth Resources, Padua, Italy).
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Callahan, Patrick G., and Marc De Graef. "Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations." Microscopy and Microanalysis 19, no. 5 (June 26, 2013): 1255–65. http://dx.doi.org/10.1017/s1431927613001840.

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AbstractA new approach for the simulation of dynamic electron backscatter diffraction (EBSD) patterns is introduced. The computational approach merges deterministic dynamic electron-scattering computations based on Bloch waves with a stochastic Monte Carlo (MC) simulation of the energy, depth, and directional distributions of the backscattered electrons (BSEs). An efficient numerical scheme is introduced, based on a modified Lambert projection, for the computation of the scintillator electron count as a function of the position and orientation of the EBSD detector; the approach allows for the rapid computation of an individual EBSD pattern by bi-linear interpolation of a master EBSD pattern. The master pattern stores the BSE yield as a function of the electron exit direction and exit energy and is used along with weight factors extracted from the MC simulation to obtain energy-weighted simulated EBSD patterns. Example simulations for nickel yield realistic patterns and energy-dependent trends in pattern blurring versus filter window energies are in agreement with experimental energy-filtered EBSD observations reported in the literature.
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Stojakovic, Dejan. "Electron backscatter diffraction in materials characterization." Processing and Application of Ceramics 6, no. 1 (2012): 1–13. http://dx.doi.org/10.2298/pac1201001s.

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Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of materials. Key milestones related to technological developments of EBSD technique have been outlined along with possible applications using modern EBSD system. Principles of crystal diffraction with description of crystallographic orientation, orientation determination and phase identification have been described. Image quality, resolution and speed, and system calibration have also been discussed. Sample preparation methods were reviewed and EBSD application in conjunction with other characterization techniques on a variety of materials has been presented for several case studies. In summary, an outlook for EBSD technique was provided.
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Basinger, Jay, David Fullwood, Josh Kacher, and Brent Adams. "Pattern Center Determination in Electron Backscatter Diffraction Microscopy." Microscopy and Microanalysis 17, no. 3 (May 12, 2011): 330–40. http://dx.doi.org/10.1017/s1431927611000389.

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AbstractThe pattern center of an electron backscatter diffraction (EBSD) image indicates the relative position of the image with reference to the interaction volume of the sample. As interest grows in high-resolution EBSD techniques, accurate knowledge of this position is essential for precise interpretation of the EBSD features. In a typical EBSD framework, Kikuchi bands are recorded on a phosphor screen. If the flat phosphor were instead shaped as a sphere, with its center at the specimen's electron interaction volume, then the incident backscattered electrons would form Kikuchi bands on that sphere with parallel band edges centered on great circles. In this article, the authors present a method of pattern center (PC) refinement that maps bands from the planar phosphor onto a virtual spherical screen and measures the deviation of bands from a great circle and from possessing parallel edges. Potential sources of noise and error, as well as methods for reducing these, are discussed. Finally, results are presented on the application of the PC algorithm to two types of simulated EBSD patterns and two experimental setups, and the resolution of the method is discussed.
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Michael, J. R., M. E. Schlienger, and R. P. Goehner. "Electron Backscatter Diffraction In The Sem: Is Electron Diffraction In The Tem Obsolete?" Microscopy and Microanalysis 3, S2 (August 1997): 879–80. http://dx.doi.org/10.1017/s1431927600011284.

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The technique of electron backscatter diffraction (EBSD) in the scanning electron microscope is currently finding a large number of important applications in materials science. The patterns formed through EBSD were first studied over 40 years ago. It has only been in the last 10 years that the technique has really begun to have an impact on the study of materials. The introduction of automatic pattern indexing software has enabled the technique to be used for mapping the orientation of a polycrystalline sample. The more exciting and universally interesting application of the technique has been the identification of micron and sub-micron sized crystalline phases based on their chemistry and crystallography determined by EBSD.EBSD is obtained by illuminating a highly tilted sample (>45° from horizontal) with a stationary electron beam. Electrons backscattered from the sample may satisfy the condition for channeling and will produce images that contain bands of increased and decreased intensity that are equivalent to electron channeling patterns.
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Kenik, Edward A. "Spatial Resolution of Electron Backscatter Diffraction in a FEG-SEM." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 348–49. http://dx.doi.org/10.1017/s0424820100164209.

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Crystallographic information can be determined for bulk specimens in a SEM by utilizing electron backscatter diffraction (EBSD), which is also referred to as backscatter electron Kikuchi diffraction. This technique provides similar information to that provided by selected area electron channeling (SAEC). However, the spatial resolutions of the two techniques are limited by different processes. In SAEC patterns, the spatial resolution is limited to ˜2 μm by the motion of the beam on the specimen, which results from the angular rocking of the beam and the aberration of the probe forming lens. Therefore, smaller incident probe sizes provide no improvement in spatial resolution of SAEC patterns. In contrast, the spatial resolution for EBSD, which uses a stationary beam and an area detector, is determined by 1) the incident probe size and 2) the size of the interaction volume from which significant backscattered electrons are produced in the direction of the EBSD detector. The second factor is influenced by the accelerating voltage, the specimen tilt, and the relative orientation of scattering direction and the specimen tilt axis.
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Wright, Stuart I., Matthew M. Nowell, and David P. Field. "A Review of Strain Analysis Using Electron Backscatter Diffraction." Microscopy and Microanalysis 17, no. 3 (March 22, 2011): 316–29. http://dx.doi.org/10.1017/s1431927611000055.

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AbstractSince the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials science and geology research laboratories around the world. The acceptance of the technique is primarily due to the capability of EBSD to aid the research scientist in understanding the crystallographic aspects of microstructure. There has been considerable interest in using EBSD to quantify strain at the submicron scale. To apply EBSD to the characterization of strain, it is important to understand what is practically possible and the underlying assumptions and limitations. This work reviews the current state of technology in terms of strain analysis using EBSD. First, the effects of both elastic and plastic strain on individual EBSD patterns will be considered. Second, the use of EBSD maps for characterizing plastic strain will be explored. Both the potential of the technique and its limitations will be discussed along with the sensitivity of various calculation and mapping parameters.
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Bunkholt, Sindre, Knut Marthinsen, and Erik Nes. "Subgrain Structures Characterized by Electron Backscatter Diffraction (EBSD)." Materials Science Forum 794-796 (June 2014): 3–8. http://dx.doi.org/10.4028/www.scientific.net/msf.794-796.3.

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Subgrain structures are frequently characterized by the electron backscatter diffraction (EBSD) method, which is both accurate and provides good statistics. This is essential to better understand the subgrain growth mechanisms and e.g. establish the driving forces and motilities for comparison with physically based models. However, there is no commercially available software which can provide adequate subgrain boundary maps necessary for e.g. size and misorientation analysis. Here, a method that produces such maps utilizing only commercially available software is presented. The clue is to provide the EBSD-software with a parameter that can be used to identify all subgrains. By combining various maps exported from the EBSD-software into photo editing software, a new map is made in which all subgrain boundaries are identified. Missing and incomplete boundaries are traced manually before a reconstructed subgrain map is generated and imported back into the EBSD-software. With this method, the built-in algorithms in the EBSD-software can be readily used to e.g. characterize subgrain growth in aluminium with respect to orientation, size and misorientation.
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Michael, J. R. "Characterization of Ceramics Using Electron Backscatter Diffraction in the SEM." Microscopy and Microanalysis 5, S2 (August 1999): 794–95. http://dx.doi.org/10.1017/s1431927600017293.

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The technique of electron backscatter diffraction (EBSD) in the scanning electron microscope is becoming a standard technique for the characterization of materials. EBSD has evolved into a tool that can determine the orientation of a crystalline area of interest or the technique can be used for the identification of unknown phases from their composition and crystallography. The application of the technique to ceramic materials has demonstrated the many advantages of this technique over classical x-ray diffraction techniques or electron diffraction in the TEM.EBSD patterns are obtained by illuminating a highly tilted sample (>45° from horizontal) with a stationary electron beam. Electrons that are backscattered from the sample may satisfy the condition for channeling (or diffraction) and produce images that contain bands of increased and decreased intensity that are equivalent to channeling patterns. The patterns are imaged by placing a phosphor screen near the sample and imaging the screen with either TV rate or a slow scan CCD camera.
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Dissertations / Theses on the topic "EBSD - Electron BackScatter Diffraction"

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Hansen, Landon Thomas. "Characterization of Dislocation - Grain Boundary Interactions Through Electron Backscatter Diffraction." BYU ScholarsArchive, 2019. https://scholarsarchive.byu.edu/etd/7536.

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Further understanding of dislocation-GB interactions is critical to increasing the performance of polycrystalline metals. The research contained within this dissertation aims to further dislocation-GB interaction understanding through three research studies. First, the effect of noise in EBSPs on GND calculations was evaluated in order to improve dislocation characterization via HR-EBSD. Second, the evolution of GNDs and their effects on back stress was studied through experimental and computational methods applied to tantalum oligo specimens. Third, statistical analysis was used to evaluate grain parameters and current GB transmission parameters on their correlation with dislocation accumulation.
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Basinger, John A. "Detail Extraction from Electron Backscatter Diffraction Patterns." BYU ScholarsArchive, 2011. https://scholarsarchive.byu.edu/etd/2689.

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Cross-correlation based analysis of electron backscatter diffraction (EBSD) patterns and the use of simulated reference patterns has opened up entirely new avenues of insight into local lattice properties within EBSD scans. The benefits of accessing new levels of orientation resolution and multiple types of previously inaccessible data measures are accompanied with new challenges in characterizing microscope geometry and other error previously ignored in EBSD systems. The foremost of these challenges, when using simulated patterns in high resolution EBSD (HR-EBSD), is the determination of pattern center (the location on the sample from which the EBSD pattern originated) with sufficient accuracy to avoid the introduction of phantom lattice rotations and elastic strain into these highly sensitive measures. This dissertation demonstrates how to greatly improve pattern center determination. It also presents a method for the extraction of grain boundary plane information from single two-dimensional surface scans. These are accomplished through the use of previously un-accessed detail within EBSD images, coupled with physical models of the backscattering phenomena. A software algorithm is detailed and applied for the determination of pattern center with an accuracy of ~0.03% of the phosphor screen width, or ~10µm. This resolution makes it possible to apply a simulated pattern method (developed at BYU) in HR-EBSD, with several important benefits over the original HR-EBSD approach developed by Angus Wilkinson. Experimental work is done on epitaxially-grown silicon and germanium in order to gauge the precision of HR-EBSD with simulated reference patterns using the new pattern center calibration approach. It is found that strain resolution with a calibrated pattern center and simulated reference patterns can be as low as 7x10-4. Finally, Monte Carlo-based models of the electron interaction volume are used in conjunction with pattern-mixing-strength curves of line scans crossing grain boundaries in order to recover 3D grain boundary plane information. Validation of the approach is done using 3D serial scan data and coherent twin boundaries in tantalum and copper. The proposed method for recovery of grain boundary plane orientation exhibits an average error of 3 degrees.
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Wu, Chun-Hsien. "Microstructure of Flash processed Steel Characterized by Electron Backscatter Diffraction." Thesis, Virginia Tech, 2009. http://hdl.handle.net/10919/36377.

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Flash processing is a new heat treatment process being developed to produce steel with relatively high strength and ductility. It involves rapidly heating steel sheet or strip to a temperature in the austenite range and quenching; the entire thermal cycle takes place within 15 seconds. The resulting microstructure is fine and difficult to resolve using standard metallographic techniques. In this investigation, electron backscatter diffraction was used to measure the grain size, grain orientations, and phase fractions in AISI 8620 samples flash processed to a series of different maximum temperatures. The combination of high strength with moderate ductility obtained by flash processing arises from a refined martensitic microstructure. The morphology of the microstructure depends upon the maximum processing temperature; a lower maximum temperature appears to produce a finer prior austenite grain size and an equiaxed martensite structure whereas a higher maximum processing temperature yields a more conventional lath martensite morphology.
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Friedbaum, Samuel Searle. "Studies of Dislocation Density Quantification Via Cross-Correlation EBSD." BYU ScholarsArchive, 2019. https://scholarsarchive.byu.edu/etd/8115.

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One conventional method for studying dislocations uses the Transmission Electron Microscope (TEM), a complex and expensive piece of equipment which requires extensive specimen preparation in order to thin the specimens to electron transparent thickness. Newer High Resolution Electron Backscatter Diffraction (HREBSD) methods of determining geometrically necessary dislocation content via cross-correlation promise to be able to produce estimates of the dislocation density of the sample over a larger area with considerably less preparation time and using a much more accessible instrument. However, the accuracy of the new EBSD technique needs more experimental verification, including consideration of possible changes in the specimen dislocation density due to the different preparation methods. By comparing EBSD and TEM dislocation measurements of Electron Transparent platinum specimens prepared using the Focused Ion Beam (FIB), along with EBSD dislocations measurements of specimens prepared by both FIB and mechanical polishing techniques, this paper seeks to verify the accuracy of the new method and identify any changes in the specimens’ apparent dislocation density caused by the different preparation processes.
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Jiang, Jun. "A high resolution electron backscatter diffraction study of heterogeneous deformation in polycrystal copper." Thesis, University of Oxford, 2013. http://ora.ox.ac.uk/objects/uuid:31926294-d734-42f1-8b26-cbbb56438219.

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Understanding the plastic deformation mechanisms in polycrystals is a long-standing fundamental problem and its improvement has significant potential impact on the increase in materials resistance to typical failure modes such as fatigue cracking and stress corrosion cracking and hence the increase in the materials strength. However many deformation models are yet to be validated as quantitative experimental results at mesoscale to correlate dislocations and microstructure features are limited. This thesis furthers the High Resolution EBSD (HR-EBSD) technique in Geometrically Necessary Dislocation (GND) density measurement from qualitative analysis with a typical map size of 100 μm x100 μm to quantitative analysis with a map of 500 μm x500 μm by determining the optimised scanning step size (0.5 μm) and detector binning level (4x4 binning). This allows a statistically large number of grains to be sampled. Combining with obtained crystallographical information from a conventional EBSD system, systematic studies on GNDs behaviours with respect to a range of microstructure features such as grain boundaries and triple junctions were conducted on monotonically deformed polycrystal copper samples under tension. Relatively high GND density points were found near triple junctions and some grain boundaries whereas the low GND density points tend to appear near the grains’ interiors. These tendencies are particularly profound in low and moderately deformed samples. Hence more detailed analyses were performed to investigate the relations of GND density and the properties of grain boundaries and triple junctions. These quantitative analyses were complemented with direct visual assessment. The visual inspection provides interesting findings such as the strong GND structure dependence on grain orientations and GND structure development through increasing deformation; grain-grain interaction influences on GND structure development and GND structures near triple junctions. These GND density studies provide experimental results to validate some of the existing plastic deformation models for instance Ashby’s model of hardening and Hall-Petch relation. However, some of the new observations on GND structures at mesoscale cannot be fully rationalised by existing proposed mechanisms. Hence new models have been proposed that these GND structures might be generated from the intersections of different slip systems which occurred in various parts of a grain, or by the dislocation piling-up at some microstructural features e.g. triple junctions and twin boundaries.
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Khosravani, Ali. "Application of High Resolution Electron Backscatter Diffraction(HR-EBSD) Techniques to Twinning Deformation Mechanism in AZ31 Magnesium Alloy." BYU ScholarsArchive, 2012. https://scholarsarchive.byu.edu/etd/3432.

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The application of high resolution electron backscatter diffraction (HR-EBSD) techniques has been used in order to study the evolution of geometrically necessary dislocation (GND). The tested materials were taken from AZ31 magnesium sheet which had strong basal texture. Because of low symmetry of the magnesium crystal lattice, the von Mises criteria cannot be satisfied by the three independent, easily activated, basal slips. The strain along the c-axis of the crystal must be accommodated by either twinning and/or slip systems. HR-EBSD data was taken in order to investigate these phenomena. The HR-EBSD results were post processed in order to resolve total GND density onto the observed possible slip systems. The first chapter of the investigation focused on the correlation between resolved GNDs with tensile twin nucleation, and the subsequent propagation path in the microstructure. For this purpose, 2.5 % strain was applied in a uniaxial compression test along the transverse direction (TD). Several fine scan were done at the boundaries where twin formed. The results show that in order for a twin to nucleate spontaneously at the grain boundaries, two criteria should generally be met: high angle grain boundaries (35-45°) and pile ups of basal slip system in neighboring grain at the other side of the boundary. Furthermore, once nucleation has initiated, twin propagation can occur through low angle grain boundaries (15-25°); if a twin reaches a high angle boundary, it will generally terminate at the boundary at low strain levels. A twin may pass through high angle boundaries with further deformation. In the second chapter, deformation of the AZ31 magnesium alloy was study for different strain paths. For this purpose, compression and tension in-situ tests were done and the texture and GND evolutions were investigated. The results show that the load paths, compression and tension, evolve the microstructure in different ways. Massive twin fractions were formed in compression, and higher GND contents were observed in tension tests. It was observed that at higher strain levels GND contents are roughly independent of the initial texture but the activation of slip systems at low strain strongly depends on initial structure. If the samples were loaded along RD, GND density increased sharply at low strain. In contrast, for the samples loaded along TD, GND increased moderately. A small amount of repetition is apparent in the two parts of the thesis due to them being formatted for individual publication as journal papers.
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Bastos, da Silva Fanta Alice. "Characterization of the microstructure, grain boundaries and texture of nanostructured electrodeposited CoNi by use of electron backscatter diffraction (EBSD)." Göttingen Cuvillier, 2007. http://d-nb.info/991032845/04.

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Bastos, da Silva Fanta Alice. "Characterization of the microstructure, grain boundaries and texture of nanostructured electrodeposited CoNi by use of Electron Backscatter Diffraction (EBSD) /." Göttingen : Cuvillier, 2008. http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=017078787&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA.

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Wisniewski, Wolfgang [Verfasser], Christian [Akademischer Betreuer] Rüssel, Thomas [Akademischer Betreuer] Höche, and Joachim [Akademischer Betreuer] Deubener. "Crystal orientations in glass-ceramics determined using electron backscatter diffraction (EBSD) / Wolfgang Wisniewski. Gutachter: Christian Rüssel ; Thomas Höche ; Joachim Deubener." Jena : Thüringer Universitäts- und Landesbibliothek Jena, 2011. http://d-nb.info/1016555318/34.

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Amalaraj, Akash Savio. "5D Grain Boundary Characterization from EBSD Microscopy." BYU ScholarsArchive, 2018. https://scholarsarchive.byu.edu/etd/8816.

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Knowledge of the full 5-degree Grain Boundary Character Distribution (GBCD) is vital to understanding properties, such as gas diffusivity, that are dominated by grain boundary character. Surface characterization techniques, such as Electron Backscattered diffraction (EBSD), can provide only 4 of the 5 GB characteristics (the rotation between the neighboring grains, and the trace of the GB on the surface). The inclination of the GB in the direction normal to the surface is not known. A previous study indicated that the GB inclination could be recovered by correlating the Electron Backscattered patterns (EBSPs) of sample points near the GB with EBSPs taken from the centers of the neighboring grains. The resultant transition curve could be compared with theoretical curves obtained from MonteCarlo simulations of electron yield from the two grains. However, a practical method based upon this study was never implemented. Here, a few microscopy and image filters have been applied to the EBSPs to improve the image quality. Also, several experiments have been conducted to verify and validate the interaction volume of the materials used to produce theoretical transition curves, in order to receive more accurate results. In this work, it is hypothesized that transition curves obtained from considering individual band intensities from the EBSPs will give more informative transition curves. The filtered EBSPs from the band intensities coupled with the accurate interaction volume values, should give us more reliable and repeatable transition curves, and that a more detailed comparison of the experimental and simulated transition curves will give higher fidelity results, in terms of GB inclination determination.
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Books on the topic "EBSD - Electron BackScatter Diffraction"

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Schwartz, Adam J. Electron Backscatter Diffraction in Materials Science. Boston, MA: Springer Science+Business Media, LLC, 2009.

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Schwartz, Adam J., Mukul Kumar, and Brent L. Adams, eds. Electron Backscatter Diffraction in Materials Science. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4.

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Schwartz, Adam J., Mukul Kumar, Brent L. Adams, and David P. Field, eds. Electron Backscatter Diffraction in Materials Science. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-88136-2.

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Terhune, Shannon Derek. An electron backscatter diffraction analysis of the microstructure of pure aluminum processed by equal-channel angular pressing. Monterey, Calif: Naval Postgraduate School, 1998.

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(Editor), Adam J. Schwartz, Mukul Kumar (Editor), and Brent L. Adams (Editor), eds. Electron Backscatter Diffraction in Materials Science. Springer, 2000.

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Schwartz, Adam J. Electron Backscatter Diffraction in Materials Science. 2000.

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J, Schwartz Adam, Kumar Mukul, and Adams B. L, eds. Electron backscatter diffraction in materials science. New York: Kluwer Academic, 2000.

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Schwartz, Adam J. Electron Backscatter Diffraction in Materials Science. Springer, 2014.

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John, Wheeler, David J. Prior, and Elisabetta Mariani. Electron Backscatter Diffraction in the Earth Sciences. Wiley & Sons, Incorporated, John, 2024.

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Reimold, Wolf Uwe, and Christian Koeberl, eds. Large Meteorite Impacts and Planetary Evolution VI. Geological Society of America, 2021. http://dx.doi.org/10.1130/spe550.

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This volume represents the proceedings of the homonymous international conference on all aspects of impact cratering and planetary science, which was held in October 2019 in Brasília, Brazil. This volume contains a sizable suite of contributions dealing with regional impact records (Australia, Sweden), impact craters and impactites, early Archean impacts and geophysical characteristics of impact structures, shock metamorphic investigations, post-impact hydrothermalism, and structural geology and morphometry of impact structures—on Earth and Mars. These contributions are authored by many of the foremost impact cratering researchers. Many contributions report results from state-of-the-art investigations, for example, several that are based on electron backscatter diffraction studies, and deal with new potential chronometers and shock barometers (e.g., apatite). Established impact cratering workers and newcomers to this field will both appreciate this multifaceted, multidisciplinary collection of impact cratering studies.
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Book chapters on the topic "EBSD - Electron BackScatter Diffraction"

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Eades, Alwyn. "EBSD: Buying a System." In Electron Backscatter Diffraction in Materials Science, 123–26. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4_10.

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Farrer, Jeffrey K., Joseph R. Michael, and C. Barry Carter. "EBSD of Ceramic Materials." In Electron Backscatter Diffraction in Materials Science, 299–318. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4_24.

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Wright, Stuart I. "Fundamentals of Automated EBSD." In Electron Backscatter Diffraction in Materials Science, 51–64. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4_5.

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Eades, Alwyn, Andrew Deal, Abhishek Bhattacharyya, and Tejpal Hooghan. "Energy Filtering in EBSD." In Electron Backscatter Diffraction in Materials Science, 53–63. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-88136-2_4.

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King, Wayne E., James S. Stölken, Mukul Kumar, and Adam J. Schwartz. "Strategies for Analyzing EBSD Datasets." In Electron Backscatter Diffraction in Materials Science, 153–70. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4_14.

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Wright, Stuart I., David P. Field, and David J. Dingley. "Advanced Software Capabilities for Automated EBSD." In Electron Backscatter Diffraction in Materials Science, 141–52. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4_13.

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Rolland, Pierre, and Keith G. Dicks. "An Automated EBSD Acquisition and Processing System." In Electron Backscatter Diffraction in Materials Science, 135–40. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4_12.

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Brewer, Luke N., David P. Field, and Colin C. Merriman. "Mapping and Assessing Plastic Deformation Using EBSD." In Electron Backscatter Diffraction in Materials Science, 251–62. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-88136-2_18.

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Wright, Stuart I., and Matthew M. Nowell. "A Review of In Situ EBSD Studies." In Electron Backscatter Diffraction in Materials Science, 329–37. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-88136-2_24.

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Adams, Brent L., Ben Henrie, Larry Howell, and Richard Balling. "Structure-Properties Relations: EBSD-Based Material-Sensitive Design." In Electron Backscatter Diffraction in Materials Science, 171–80. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4_15.

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Conference papers on the topic "EBSD - Electron BackScatter Diffraction"

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Hewett, Kelsey, Breauna Murray, and Sarah J. Brownlee. "CHARACTERIZATION OF DEFORMATION FABRICS IN CHESTER GNEISS DOME USING ELECTRON BACKSCATTER DIFFRACTION (EBSD)." In GSA Annual Meeting in Phoenix, Arizona, USA - 2019. Geological Society of America, 2019. http://dx.doi.org/10.1130/abs/2019am-337124.

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Koblischka-Veneva, A. D., M. R. Koblischka, F. Muecklich, S. Murphy, Y. Zhou, and I. V. Shvets. "Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD)." In INTERMAG 2006 - IEEE International Magnetics Conference. IEEE, 2006. http://dx.doi.org/10.1109/intmag.2006.375455.

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Postolnyi, Bogdan, Oleksandr Bondar, Marek Opielak, Przemysław Rogalski, and João Pedro Araújo. "Structural analysis of multilayer metal nitride films CrN/MoN using electron backscatter diffraction (EBSD)." In Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies 2016, edited by Marian Vladescu, Razvan Tamas, and Ionica Cristea. SPIE, 2016. http://dx.doi.org/10.1117/12.2243279.

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Postolnyi, B. O., and J. P. Araujo. "Structural analysis of Arc-PVD multilayer metal nitride coatings CrN/MoN using electron backscatter diffraction (EBSD)." In 2016 International Conference on Nanomaterials: Application & Properties (NAP). IEEE, 2016. http://dx.doi.org/10.1109/nap.2016.7757249.

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O'Neill, William, Matt Gill, Walter Perrie, Peter Fox, and D. Prior. "Analysis of femtosecond (775nm) and nanosecond (355nm) micromachined Ni surfaces using electron backscatter diffraction (EBSD) (Invited Paper)." In Lasers and Applications in Science and Engineering, edited by Jim Fieret, Peter R. Herman, Tatsuo Okada, Craig B. Arnold, Friedrich G. Bachmann, Willem Hoving, Kunihiko Washio, et al. SPIE, 2005. http://dx.doi.org/10.1117/12.598484.

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Burnett, T. L., T. P. Comyn, E. Merson, and A. J. Bell. "Electron-Backscattered Diffraction (EBSD) as a domain analysis technique in BiFeO3-PbTiO3." In 2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics. IEEE, 2007. http://dx.doi.org/10.1109/isaf.2007.4393276.

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Birnbaum, Andrew J., John G. Michopoulos, John C. Steuben, and Athanasios P. Iliopoulos. "Electron Backscatter Diffraction-Enabled Anisotropic Thermo-Elastic Analysis of Additively Manufactured Single Tracks." In ASME 2019 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. American Society of Mechanical Engineers, 2019. http://dx.doi.org/10.1115/detc2019-98351.

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Abstract Despite extensive efforts directed toward elucidating the connections between process, microstructure and performance of additively manufactured structures and components, a significant number of meaningful questions remain unanswered. Specifically, a large body of work has demonstrated that microstructural/sub-structural features in selectively laser melted (SLM) components give rise to a significant enhancement in strength. Furthermore, the change in associated ductility is comparable to that seen in post-processed, wrought annealed material. However, the origin and mechanism by which these features arise have remained elusive. This work is an initial step in leveraging computational capabilities for validating experiment-based theories that explain the basis for the above-mentioned phenomena. The present work describes a computational approach for utilizing spatially resolved crystal-lographic descriptions obtained via electron backscatter diffraction (EBSD) to define the domain geometry and material properties of an anisotropic thermo-elastic simulation. The resulting solution is used to ascertain the elastic strain energy state, and slip-system resolved shear stresses on a per-grain basis. This analysis is performed, in part, as a means for validating a hypothesis linking these characteristics with the development of sub-structural features, which are in turn, correlated with improvements in material performance. The results suggest that both strain energy density and grain boundary character play an important role in the formation of substructure in additively manufactured 316L stainless steels.
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El-Dasher, Bassem S., and Sharon G. Torres. "Second Phase Precipitation in As-Welded and Solution Annealed Alloy 22 Welds." In ASME 2005 Pressure Vessels and Piping Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/pvp2005-71665.

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The precipitation characteristics of tetrahedrally close-packed (TCP) phases during the welding and the subsequent solution annealing process of Alloy 22 1 1/2” thick plate double-U prototypical welds are investigated. Electron backscatter diffraction (EBSD) was used to provide large scale microstructural observation of the weld cross section, and scanning electron microscopy (SEM) was used to map the location of the TCP phases. Analysis shows that TCP precipitation occurs congruent to the weld passes, with the solution annealing reducing the sizes of coarser precipitates.
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Zhang, Bin, Yooseob Song, George Voyiadjis, Kristian Juul, Shuai Shao, and Wen Jin Meng. "Texture Development and Mechanical Response in Microscale Reverse Extrusion of Copper." In ASME 2018 13th International Manufacturing Science and Engineering Conference. American Society of Mechanical Engineers, 2018. http://dx.doi.org/10.1115/msec2018-6472.

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Axisymmetric reverse extrusion experiments were conducted on annealed Cu rod specimens to form cup-shaped structures with sidewall thicknesses ranging from ∼400 μm down to ∼25 μm. Scanning electron microscopy (SEM) and electron backscatter diffraction (EBSD) were used to examine the changes in Cu grain morphology and texture as a result of the forming operation. Pole figure (PF) and orientation distribution function (ODF) analysis of EBSD data showed the presence of the same texture components in the present small scale metal forming experiments as those observed previously in macroscale sheet metal rolling. Extrusion force – punch displacement curves were measured as a function of extruded cup sidewall thickness. The present work illustrates materials characteristics in small scale metal forming, and suggests directions of future work for bringing improved correspondence between experimentation and modeling for metal micro forming.
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Altmann, Frank, Jens Beyersdorfer, Jan Schischka, Michael Krause, German Franz, and Laurens Kwakman. "Cross Section Analysis of Cu Filled TSVs Based on High Throughput Plasma-FIB Milling." In ISTFA 2012. ASM International, 2012. http://dx.doi.org/10.31399/asm.cp.istfa2012p0039.

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Abstract In this paper the new Vion™ Plasma-FIB system, developed by FEI, is evaluated for cross sectioning of Cu filled Through Silicon Via (TSV) interconnects. The aim of the study presented in this paper is to evaluate and optimise different Plasma-FIB (P-FIB) milling strategies in terms of performance and cross section surface quality. The sufficient preservation of microstructures within cross sections is crucial for subsequent Electron Backscatter Diffraction (EBSD) grain structure analyses and a high resolution interface characterisation by TEM.
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Reports on the topic "EBSD - Electron BackScatter Diffraction"

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Messing, Gary L. DURIP 00 Electron Backscatter Diffraction (EBSD) System for Crystallographic Imaging in a SEM. Fort Belvoir, VA: Defense Technical Information Center, August 2001. http://dx.doi.org/10.21236/ada388575.

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John Kay and Kurt Eylands. Advanced Characterization of Slags and Refractory Bricks Using Electron Backscatter Diffraction. Office of Scientific and Technical Information (OSTI), September 2007. http://dx.doi.org/10.2172/984654.

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Goudy, Secana. Assessment of Cluster Chondrite Accretion Temperature Using Electron Backscatter Diffraction and Implications for Chondrule Formation Models. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.7141.

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