Journal articles: 'EBSD - Electron BackScatter Diffraction'

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SUZUKI, Seiichi. "Electron BackScatter Diffraction method." JOURNAL OF THE JAPAN WELDING SOCIETY 85, no. 8 (2016): 736–39. http://dx.doi.org/10.2207/jjws.85.736.

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Deal, Andrew. "Introduction: Electron Backscatter Diffraction Special Section." Microscopy and Microanalysis 19, no. 4 (June 24, 2013): 920. http://dx.doi.org/10.1017/s1431927613001955.

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Welcome to the second special section of Microscopy and Microanalysis focused on electron backscatter diffraction (EBSD), which follows the June 2011 issue. The content of the previous special section was provided by participants at EBSD 2010, the second Microanalysis Society (MAS) topical conference dedicated to EBSD in the United States. The present 2013 special section includes work from participants at both EBSD 2012, the third of such topical conferences (held June 19–21, 2012 at Carnegie Mellon University, Pittsburgh, PA), and EMAS 2012, the European Microanalysis Society's 10th Regional Workshop that included three EBSD sessions (held June 17–20 at the Institute for Geosciences and Earth Resources, Padua, Italy).

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Callahan, Patrick G., and Marc De Graef. "Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations." Microscopy and Microanalysis 19, no. 5 (June 26, 2013): 1255–65. http://dx.doi.org/10.1017/s1431927613001840.

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AbstractA new approach for the simulation of dynamic electron backscatter diffraction (EBSD) patterns is introduced. The computational approach merges deterministic dynamic electron-scattering computations based on Bloch waves with a stochastic Monte Carlo (MC) simulation of the energy, depth, and directional distributions of the backscattered electrons (BSEs). An efficient numerical scheme is introduced, based on a modified Lambert projection, for the computation of the scintillator electron count as a function of the position and orientation of the EBSD detector; the approach allows for the rapid computation of an individual EBSD pattern by bi-linear interpolation of a master EBSD pattern. The master pattern stores the BSE yield as a function of the electron exit direction and exit energy and is used along with weight factors extracted from the MC simulation to obtain energy-weighted simulated EBSD patterns. Example simulations for nickel yield realistic patterns and energy-dependent trends in pattern blurring versus filter window energies are in agreement with experimental energy-filtered EBSD observations reported in the literature.

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Stojakovic, Dejan. "Electron backscatter diffraction in materials characterization." Processing and Application of Ceramics 6, no. 1 (2012): 1–13. http://dx.doi.org/10.2298/pac1201001s.

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Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of materials. Key milestones related to technological developments of EBSD technique have been outlined along with possible applications using modern EBSD system. Principles of crystal diffraction with description of crystallographic orientation, orientation determination and phase identification have been described. Image quality, resolution and speed, and system calibration have also been discussed. Sample preparation methods were reviewed and EBSD application in conjunction with other characterization techniques on a variety of materials has been presented for several case studies. In summary, an outlook for EBSD technique was provided.

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Basinger, Jay, David Fullwood, Josh Kacher, and Brent Adams. "Pattern Center Determination in Electron Backscatter Diffraction Microscopy." Microscopy and Microanalysis 17, no. 3 (May 12, 2011): 330–40. http://dx.doi.org/10.1017/s1431927611000389.

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AbstractThe pattern center of an electron backscatter diffraction (EBSD) image indicates the relative position of the image with reference to the interaction volume of the sample. As interest grows in high-resolution EBSD techniques, accurate knowledge of this position is essential for precise interpretation of the EBSD features. In a typical EBSD framework, Kikuchi bands are recorded on a phosphor screen. If the flat phosphor were instead shaped as a sphere, with its center at the specimen's electron interaction volume, then the incident backscattered electrons would form Kikuchi bands on that sphere with parallel band edges centered on great circles. In this article, the authors present a method of pattern center (PC) refinement that maps bands from the planar phosphor onto a virtual spherical screen and measures the deviation of bands from a great circle and from possessing parallel edges. Potential sources of noise and error, as well as methods for reducing these, are discussed. Finally, results are presented on the application of the PC algorithm to two types of simulated EBSD patterns and two experimental setups, and the resolution of the method is discussed.

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Michael, J. R., M. E. Schlienger, and R. P. Goehner. "Electron Backscatter Diffraction In The Sem: Is Electron Diffraction In The Tem Obsolete?" Microscopy and Microanalysis 3, S2 (August 1997): 879–80. http://dx.doi.org/10.1017/s1431927600011284.

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The technique of electron backscatter diffraction (EBSD) in the scanning electron microscope is currently finding a large number of important applications in materials science. The patterns formed through EBSD were first studied over 40 years ago. It has only been in the last 10 years that the technique has really begun to have an impact on the study of materials. The introduction of automatic pattern indexing software has enabled the technique to be used for mapping the orientation of a polycrystalline sample. The more exciting and universally interesting application of the technique has been the identification of micron and sub-micron sized crystalline phases based on their chemistry and crystallography determined by EBSD.EBSD is obtained by illuminating a highly tilted sample (>45° from horizontal) with a stationary electron beam. Electrons backscattered from the sample may satisfy the condition for channeling and will produce images that contain bands of increased and decreased intensity that are equivalent to electron channeling patterns.

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Kenik, Edward A. "Spatial Resolution of Electron Backscatter Diffraction in a FEG-SEM." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 348–49. http://dx.doi.org/10.1017/s0424820100164209.

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Crystallographic information can be determined for bulk specimens in a SEM by utilizing electron backscatter diffraction (EBSD), which is also referred to as backscatter electron Kikuchi diffraction. This technique provides similar information to that provided by selected area electron channeling (SAEC). However, the spatial resolutions of the two techniques are limited by different processes. In SAEC patterns, the spatial resolution is limited to ˜2 μm by the motion of the beam on the specimen, which results from the angular rocking of the beam and the aberration of the probe forming lens. Therefore, smaller incident probe sizes provide no improvement in spatial resolution of SAEC patterns. In contrast, the spatial resolution for EBSD, which uses a stationary beam and an area detector, is determined by 1) the incident probe size and 2) the size of the interaction volume from which significant backscattered electrons are produced in the direction of the EBSD detector. The second factor is influenced by the accelerating voltage, the specimen tilt, and the relative orientation of scattering direction and the specimen tilt axis.

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Wright, Stuart I., Matthew M. Nowell, and David P. Field. "A Review of Strain Analysis Using Electron Backscatter Diffraction." Microscopy and Microanalysis 17, no. 3 (March 22, 2011): 316–29. http://dx.doi.org/10.1017/s1431927611000055.

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AbstractSince the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials science and geology research laboratories around the world. The acceptance of the technique is primarily due to the capability of EBSD to aid the research scientist in understanding the crystallographic aspects of microstructure. There has been considerable interest in using EBSD to quantify strain at the submicron scale. To apply EBSD to the characterization of strain, it is important to understand what is practically possible and the underlying assumptions and limitations. This work reviews the current state of technology in terms of strain analysis using EBSD. First, the effects of both elastic and plastic strain on individual EBSD patterns will be considered. Second, the use of EBSD maps for characterizing plastic strain will be explored. Both the potential of the technique and its limitations will be discussed along with the sensitivity of various calculation and mapping parameters.

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Bunkholt, Sindre, Knut Marthinsen, and Erik Nes. "Subgrain Structures Characterized by Electron Backscatter Diffraction (EBSD)." Materials Science Forum 794-796 (June 2014): 3–8. http://dx.doi.org/10.4028/www.scientific.net/msf.794-796.3.

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Subgrain structures are frequently characterized by the electron backscatter diffraction (EBSD) method, which is both accurate and provides good statistics. This is essential to better understand the subgrain growth mechanisms and e.g. establish the driving forces and motilities for comparison with physically based models. However, there is no commercially available software which can provide adequate subgrain boundary maps necessary for e.g. size and misorientation analysis. Here, a method that produces such maps utilizing only commercially available software is presented. The clue is to provide the EBSD-software with a parameter that can be used to identify all subgrains. By combining various maps exported from the EBSD-software into photo editing software, a new map is made in which all subgrain boundaries are identified. Missing and incomplete boundaries are traced manually before a reconstructed subgrain map is generated and imported back into the EBSD-software. With this method, the built-in algorithms in the EBSD-software can be readily used to e.g. characterize subgrain growth in aluminium with respect to orientation, size and misorientation.

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Michael, J. R. "Characterization of Ceramics Using Electron Backscatter Diffraction in the SEM." Microscopy and Microanalysis 5, S2 (August 1999): 794–95. http://dx.doi.org/10.1017/s1431927600017293.

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The technique of electron backscatter diffraction (EBSD) in the scanning electron microscope is becoming a standard technique for the characterization of materials. EBSD has evolved into a tool that can determine the orientation of a crystalline area of interest or the technique can be used for the identification of unknown phases from their composition and crystallography. The application of the technique to ceramic materials has demonstrated the many advantages of this technique over classical x-ray diffraction techniques or electron diffraction in the TEM.EBSD patterns are obtained by illuminating a highly tilted sample (>45° from horizontal) with a stationary electron beam. Electrons that are backscattered from the sample may satisfy the condition for channeling (or diffraction) and produce images that contain bands of increased and decreased intensity that are equivalent to channeling patterns. The patterns are imaged by placing a phosphor screen near the sample and imaging the screen with either TV rate or a slow scan CCD camera.

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Randle, Valerie. "Application of Electron Backscatter Diffraction to Grain Boundaries." Solid State Phenomena 160 (February 2010): 39–46. http://dx.doi.org/10.4028/www.scientific.net/ssp.160.39.

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The technique of electron backscatter diffraction (EBSD) is ideal for the characterisation of grain boundary networks in polycrystalline materials. In recent years the experimental methodology has evolved to meet the needs of the research community. For example, the capabilities of EBSD have been instrumental in driving forward the topic of ‘grain boundary engineering’. In this paper the current capabilities of EBSD for grain boundary characterisation will be reviewed and illustrated by examples. Topics are measurement strategies based on misorientation statistics, determination of grain boundary plane distributions and grain boundary network characteristics.

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Payton, E. J., and G. Nolze. "The Backscatter Electron Signal as an Additional Tool for Phase Segmentation in Electron Backscatter Diffraction." Microscopy and Microanalysis 19, no. 4 (April 10, 2013): 929–41. http://dx.doi.org/10.1017/s1431927613000305.

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AbstractThe advent of simultaneous energy dispersive X-ray spectroscopy (EDS) data collection has vastly improved the phase separation capabilities for electron backscatter diffraction (EBSD) mapping. A major problem remains, however, in distinguishing between multiple cubic phases in a specimen, especially when the compositions of the phases are similar or their particle sizes are small, because the EDS interaction volume is much larger than that of EBSD and the EDS spectra collected during spatial mapping are generally noisy due to time limitations and the need to minimize sample drift. The backscatter electron (BSE) signal is very sensitive to the local composition due to its atomic number (Z) dependence. BSE imaging is investigated as a complimentary tool to EDS to assist phase segmentation and identification in EBSD through examination of specimens of meteorite, Cu dross, and steel oxidation layers. The results demonstrate that the simultaneous acquisition of EBSD patterns, EDS spectra, and the BSE signal can provide new potential for advancing multiphase material characterization in the scanning electron microscope.

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Osborn, William A., Mark J. McLean, and Brian Bush. "Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds." Microscopy and Microanalysis 25, no. 1 (February 2019): 77–79. http://dx.doi.org/10.1017/s1431927618016173.

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AbstractApplying high-resolution electron backscatter diffraction (HR-EBSD) to materials without regions that are amenable to the acquisition of backgrounds for static flat fielding (background subtraction) can cause analysis problems. To address this difficulty, the efficacy of electron beam induced deposition (EBID) of material as a source for an amorphous background signal is assessed and found to be practical. Using EBID material for EBSD backgrounds allows single crystal and large-grained samples to be analyzed using HR-EBSD for strain and small angle rotation measurement.

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Voos, Patrick. "Metallographic Preparation for Electron Backscattered Diffraction." Materials Science Forum 702-703 (December 2011): 578–81. http://dx.doi.org/10.4028/www.scientific.net/msf.702-703.578.

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Electron Backscatter Diffraction measurement can provide much analytical information, such as the phase orientation or material identification. The “Quality” rating of the backscatter diffraction depends on the success rate of indexing. To achieve this, a deformation-free preparation is essential. In recent years most preparation methods have been optimized to contain on average only three to four sample preparation steps. The sample quality is excellent when reflected light microscopy is used. Due to the low information depth of the EBSD measurement (20-100nm), the standard method must be modified. The preparation method must remove the scratches and the underlying damage in order to obtain a high quality EBSD pattern. The optimization can be done by chemo-mechanical polishing, electrolytic polishing or vibratory polishing. Examples are used to show where the limits of the technologies are and to give helpful ‘Hints’ for EBSD sample preparation.

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Michael, J. R. "All You Need to Know About Electron Backscatter Diffraction: Orientation is Only the Tip of the Iceberg." Microscopy and Microanalysis 3, S2 (August 1997): 387–88. http://dx.doi.org/10.1017/s1431927600008825.

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This tutorial will describe the technique of electron backscattered diffraction (EBSD) in the scanning electron microscope (SEM). To properly exploit EBSD in the SEM it is important to understand how these patterns are formed. This discussion will be followed by a description of the hardware required for the collection of electron backscatter patterns (EBSP). We will then discuss the methods used to extract the appropriate crystallographic information from the patterns for orientation determination and phase identification and how these operations can be automated. Following this, a number of applications of the technique for both orientation studies and phase identification will be discussed.EBSD in the SEM is a phenomenon that has been known for many years. EBSD in the SEM is a technique that permits the crystallography of sub-micron sized regions to be studied from a bulk specimen. These patterns were first observed over 40 years ago, before the development of the SEM and were recorded using a special chamber and photographic film.

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Small, J., and J. Michael. "Electron Backscatter Diffraction (EBSD) of Sub 500 Nm Particles." Microscopy and Microanalysis 7, S2 (August 2001): 378–79. http://dx.doi.org/10.1017/s1431927600027963.

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In our initial studies of the phase identification analysis of individual particles by EBSD, we observed that the quality of the EBSD patterns obtained from particles less than 1 micrometer in size decreased with decreasing particle size, density, and atomic number. This effect is shown in FIG. 1 by comparison of an EBSD pattern from a 12 um Al2O3 particle (FIG. la) and a 200 nm Al2O3 particle FIG. lb. Both particles were mounted on 2 mm thick carbon substrates. The Kikuchi bands from the larger particle are clearly visible while the bands from the smaller particle are not. This decrease in image quality is believed to be the result of a combination of 2 factors related to the electron scattering associated with these very small particles. First, as particle size decreases below about 1 micrometer, an increasing number of electrons are transmitted through the bottom of the particles.

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Brewer, L. N., and J. R. Michael. "Risks of “Cleaning” Electron Backscatter Diffraction Data." Microscopy Today 18, no. 2 (March 2010): 10–15. http://dx.doi.org/10.1017/s1551929510000040.

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Collecting good data is an important task, but handling the data correctly is important also. How to handle data largely depends on what the analyst is going to do with it. Electron backscatter diffraction (EBSD) is no exception.

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Li, Lili, Sheng Ouyang, Yanqing Yang, and Ming Han. "EBSDL: a computer program for determining an unknown Bravais lattice using a single electron backscatter diffraction pattern." Journal of Applied Crystallography 47, no. 4 (July 19, 2014): 1466–68. http://dx.doi.org/10.1107/s160057671401382x.

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Electron backscatter diffraction (EBSD) patterns provide a wealth of crystallographic information but disappointingly low accuracy. Adopting a strategy of compensating the poor accuracy by the large amount of information, a computer program, EBSDL, has been successfully developed to determine the unknown Bravais lattice of bulk crystalline materials using a single EBSD pattern. Unlike programs that perform phase identification, the new application is completely independent of chemical information.

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Wright, Stuart I., Jay A. Basinger, and Matthew M. Nowell. "Angular Precision of Automated Electron Backscatter Diffraction Measurements." Materials Science Forum 702-703 (December 2011): 548–53. http://dx.doi.org/10.4028/www.scientific.net/msf.702-703.548.

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Electron backscatter diffraction (EBSD) has become the preferred technique for characterizing the crystallographic orientation of individual grains in polycrystalline microstructures due to its ability to rapidly measure orientations at specific points in the microstructure at resolutions of approximately 20-50nm depending on the capabilities of the scanning electron microscope (SEM) and on the material being characterized. Various authors have studied the angular resolution of the orientations measured using automated EBSD. These studies have stated values ranging from approximately 0.1° to 2° [1-6]. Various factors influence the angular resolution achievable. The two primary factors are the accuracy of the detection of the bands in the EBSD patterns and the accuracy of the pattern center (PC) calibration. The band detection is commonly done using the Hough transform. The effect of varying the Hough transform parameters in order to optimize speed has been explored in a previous work [6]. The present work builds upon the earlier work but with the focus towards achieving the best angular resolution possible regardless of speed. This work first details the methodology used to characterize the angular precision then reports on various approaches to optimizing parameters to improve precision.

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Reddy, S. M., C. Clark, N. E. Timms, and B. M. Eglington. "Electron backscatter diffraction analysis and orientation mapping of monazite." Mineralogical Magazine 74, no. 3 (June 2010): 493–506. http://dx.doi.org/10.1180/minmag.2010.074.3.493.

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AbstractElectron backscatter diffraction (EBSD) analysis of monazite requires a comparison of empirically collected electron backscatter patterns (EBSPs) with theoretical diffraction data, or ‘match units’, derived from known crystallographic parameters. Published crystallographic data derived from compositionally varying natural and synthetic monazite are used to calculate ten different match units for monazite. These match units are used to systematically index EBSPs obtained from four natural monazite samples with different compositions. Analyses of EBSD data, derived from the indexing of five and six diffraction bands using each of the ten match units for 10,000 EBSPs from each of the four samples, indicate a large variation in the ability of the different match units to correctly index the different natural samples. However, the use of match units derived from either synthetic Gd or Eu monazite crystallographic data yield good results for three of the four analysed monazites. Comparison of sample composition with published monazite compositions indicates that these match units are likely to yield good results for the EBSD analysis of metamorphic monazite. The results provide a clear strategy for optimizing the acquisition and analysis of EBSD data from monazite but also indicate the need for the collection of new crystallographic structure data and the subsequent generation of more appropriate match units for natural monazite.

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Bassani, Paola. "Application of Electron Backscatter Diffraction to Shape Memory Alloys." Key Engineering Materials 521 (August 2012): 255–68. http://dx.doi.org/10.4028/www.scientific.net/kem.521.255.

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This overview highlights very recent application of electron backscatter diffraction (EBSD) to shape memory alloys, as main investigation technique but also as ancillary technique for other characterization methods. Over the last two decades EBSD in the scanning electron microscope has become a powerful tool for the characterization of many materials and transformation. In the mean time, shape memory alloys (SMA) are continuously studied: from a theoretical point of view, in order to clarify unsolved fundamentals of their phase transformations and characterize or develop new SMA systems, and from an engineering point of view, to solve design and processing problems related to the continuously growing examples of applications. Application of EBSD to SMA, even if hindered by limitations generally found also in other metallic system when phase transformation and martensitic phases are involved, provided useful information for both research areas.

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Dingley, David J., and Stuart I. Wright. "Determination of crystal phase from an electron backscatter diffraction pattern." Journal of Applied Crystallography 42, no. 2 (January 24, 2009): 234–41. http://dx.doi.org/10.1107/s0021889809001654.

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Electron backscatter diffraction (EBSD) is a scanning electron microscope-based technique principally used for the determination and mapping of crystal orientation. This work describes an adaptation of the EBSD technique into a potential tool for crystal phase determination. The process can be distilled into three steps: (1) extracting a triclinic cell from a single EBSD pattern, (2) identifying the crystal symmetry from an examination of the triclinic cell, and (3) determining the lattice parameters. The triclinic cell is determined by finding the bands passing through two zone axes in the pattern including a band connecting the two. A three-dimensional triclinic unit cell is constructed based on the identified bands. The EBSD pattern is indexed in terms of the triclinic cell thus formed and the crystal orientation calculated. The pattern indexing results in independent multiple orientations due to the symmetry the crystal actually possesses. By examining the relationships between these multiple orientations, the crystal system is established. By comparing simulated Kikuchi bands with the pattern the lattice parameters can be determined. Details of the method are given for a test case of EBSD patterns obtained from the hexagonal phase of titanium.

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Wright, Stuart I., Matthew M. Nowell, René de Kloe, and Lisa Chan. "Orientation Precision of Electron Backscatter Diffraction Measurements Near Grain Boundaries." Microscopy and Microanalysis 20, no. 3 (February 28, 2014): 852–63. http://dx.doi.org/10.1017/s143192761400035x.

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AbstractElectron backscatter diffraction (EBSD) has become a common technique for measuring crystallographic orientations at spatial resolutions on the order of tens of nanometers and at angular resolutions <0.1°. In a recent search of EBSD papers using Google Scholar™, 60% were found to address some aspect of deformation. Generally, deformation manifests itself in EBSD measurements by small local misorientations. An increase in the local misorientation is often observed near grain boundaries in deformed microstructures. This may be indicative of dislocation pile-up at the boundaries but could also be due to a loss of orientation precision in the EBSD measurements. When the electron beam is positioned at or near a grain boundary, the diffraction volume contains the crystal lattices from the two grains separated by the boundary. Thus, the resulting pattern will contain contributions from both lattices. Such mixed patterns can pose some challenge to the EBSD pattern band detection and indexing algorithms. Through analysis of experimental local misorientation data and simulated pattern mixing, this work shows that some of the rise in local misorientation is an artifact due to the mixed patterns at the boundary but that the rise due to physical phenomena is also observed.

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Pinard, Philippe T., Marin Lagacé, Pierre Hovington, Denis Thibault, and Raynald Gauvin. "An Open-Source Engine for the Processing of Electron Backscatter Patterns: EBSD-Image." Microscopy and Microanalysis 17, no. 3 (May 6, 2011): 374–85. http://dx.doi.org/10.1017/s1431927611000456.

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AbstractAn open source software package dedicated to processing stored electron backscatter patterns is presented. The package gives users full control over the type and order of operations that are performed on electron backscatter diffraction (EBSD) patterns as well as the results obtained. The current version of EBSD-Image (www.ebsd-image.org) offers a flexible and structured interface to calculate various quality metrics over large datasets. It includes unique features such as practical file formats for storing diffraction patterns and analysis results, stitching of mappings with automatic reorganization of their diffraction patterns, and routines for processing data on a distributed computer grid. Implementations of the algorithms used in the software are described and benchmarked using simulated diffraction patterns. Using those simulated EBSD patterns, the detection of Kikuchi bands in EBSD-Image was found to be comparable to commercially available EBSD systems. In addition, 24 quality metrics were evaluated based on the ability to assess the level of deformation in two samples (copper and iron) deformed using 220 grit SiC grinding paper. Fourteen metrics were able to properly measure the deformation gradient of the samples.

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Callahan, Patrick G., McLean P. Echlin, Tresa M. Pollock, and Marc De Graef. "Reconstruction of Laser-Induced Surface Topography from Electron Backscatter Diffraction Patterns." Microscopy and Microanalysis 23, no. 4 (August 2017): 730–40. http://dx.doi.org/10.1017/s1431927617012326.

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AbstractWe demonstrate that the surface topography of a sample can be reconstructed from electron backscatter diffraction (EBSD) patterns collected with a commercial EBSD system. This technique combines the location of the maximum background intensity with a correction from Monte Carlo simulations to determine the local surface normals at each point in an EBSD scan. A surface height map is then reconstructed from the local surface normals. In this study, a Ni sample was machined with a femtosecond laser, which causes the formation of a laser-induced periodic surface structure (LIPSS). The topography of the LIPSS was analyzed using atomic force microscopy (AFM) and reconstructions from EBSD patterns collected at 5 and 20 kV. The LIPSS consisted of a combination of low frequency waviness due to curtaining and high frequency ridges. The morphology of the reconstructed low frequency waviness and high frequency ridges matched the AFM data. The reconstruction technique does not require any modification to existing EBSD systems and so can be particularly useful for measuring topography and its evolution during in situ experiments.

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Deal, Andrew. "Introduction to a Special Issue on Electron Backscatter Diffraction." Microscopy and Microanalysis 17, no. 3 (May 23, 2011): 315. http://dx.doi.org/10.1017/s1431927611000614.

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Arguably one of the most significant microscopy techniques of the past decade, electron backscatter diffraction (EBSD) has provided scientists and engineers with tremendous insight into the structure of crystalline materials. What started with basic observations of electron diffraction in the middle of the 20th century has grown into a mature technology that bridges the gap between the macro and micro length scales. EBSD has found a home in both the materials science and geological communities characterizing crystallographic texture and preferred orientations, residual strain, grain boundary character and networks, and identifying constituent phases. Advancements in computational power, camera technology, indexing algorithms, sample preparation, and dynamical simulations have made this possible.

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Schwartz, A. J., M. Kumar, P. J. Bedrossian, and W. E. King. "Coupling Automated Electron Backscatter Diffraction with Transmission Electron and Atomic Force Microscopies." Microscopy and Microanalysis 6, S2 (August 2000): 940–41. http://dx.doi.org/10.1017/s1431927600037193.

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Grain boundary network engineering is an emerging field that encompasses the concept that modifications to conventional thermomechanical processing can result in improved properties through the disruption of the random grain boundary network. Various researchers have reported a correlation between the grain boundary character distribution (defined as the fractions of “special” and “random” grain boundaries) and dramatic improvements in properties such as corrosion and stress corrosion cracking, creep, etc. While much early work in the field emphasized property improvements, the opportunity now exists to elucidate the underlying materials science of grain boundary network engineering. Recent investigations at LLNL have coupled automated electron backscatter diffraction (EBSD) with transmission electron microscopy (TEM)5 and atomic force microscopy (AFM) to elucidate these fundamental mechanisms.An example of the coupling of TEM and EBSD is given in Figures 1-3. The EBSD image in Figure 1 reveals “segmentation” of boundaries from special to random and random to special and low angle grain boundaries in some grains, but not others, resulting from the 15% compression of an Inconel 600 polycrystal.

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Pérez-Huerta, Alberto, and Maggie Cusack. "Optimizing Electron Backscatter Diffraction of Carbonate Biominerals—Resin Type and Carbon Coating." Microscopy and Microanalysis 15, no. 3 (May 22, 2009): 197–203. http://dx.doi.org/10.1017/s1431927609090370.

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AbstractElectron backscatter diffraction (EBSD) is becoming a widely used technique to determine crystallographic orientation in biogenic carbonates. Despite this use, there is little information available on preparation for the analysis of biogenic carbonates. EBSD data are compared for biogenic aragonite and calcite in the common blue mussel, Mytilus edulis, using different types of resin and thicknesses of carbon coating. Results indicate that carbonate biomineral samples provide better EBSD results if they are embedded in resin, particularly epoxy resin. A uniform layer of carbon of 2.5 nm thickness provides sufficient conductivity for EBSD analyses of such insulators to avoid charging without masking the diffracted signal. Diffraction intensity decreases with carbon coating thickness of 5 nm or more. This study demonstrates the importance of optimizing sample preparation for EBSD analyses of insulators such as carbonate biominerals.

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Pérez-Huerta, Alberto, Jennifer England, and Maggie Cusack. "Crystallography of craniid brachiopods by electron backscatter diffraction (EBSD)." Earth and Environmental Science Transactions of the Royal Society of Edinburgh 98, no. 3-4 (September 2007): 437–42. http://dx.doi.org/10.1017/s1755691007079832.

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ABSTRACTElectron backscatter diffraction (EBSD) is used to determine the detailed crystallographic orientation of calcite crystals of craniid brachiopods in the context of shell ultrastructure. Sections of shells of two Recent species, Novocrania anomala and Novocrania huttoni, are analysed to provide 3D crystallographic patterns at high spatial resolution. The c-axis of semi-nacre calcite crystals is oriented parallel to the laminae that define the ultrastructure of the secondary layer. This orientation differs from that of rhynchonelliform calcitic brachiopods where the c-axis is perpendicular to the length of morphological fibres and to the shell exterior.

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Müller, M., D. Britz, and F. Mücklich. "Scale-bridging Microstructural Analysis – A Correlative Approach to Microstructure Quantification Combining Microscopic Images and EBSD Data." Practical Metallography 58, no. 7 (July 1, 2021): 408–26. http://dx.doi.org/10.1515/pm-2021-0032.

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Abstract A comprehensive description of complex material structures may require characterization using different methods and observations across several scales. This work will present a correlative approach including light optical microscopy, scanning electron microscopy and electron backscatter diffraction, enabling microstructure quantification which combines microscopic images and electron backscatter diffraction data. The parameters obtained from electron backscatter diffraction such as misorientation parameters or grain and phase boundary data are an ideal source of information, complementing microscopic images. Two case studies performed on bainitic microstructures will be presented to demonstrate practical applications of this approach.

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Small, J., and J. Michael. "Phase Identification of Individual Particles by Electron Backscatter Diffraction (EBSD)." Microscopy and Microanalysis 5, S2 (August 1999): 226–27. http://dx.doi.org/10.1017/s1431927600014458.

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Backscattered electron Kikuchi patterns (BEKP) were first observed by Alam et al. in 1954. J.A. Venables and C.J. Harland made the initial observation of BEKP and in the scanning electron microscope in 1973. In 1996, Goehner and Michael developed an electron backscatter diffraction (EBSD) system that uses a 1024 × 1024 pixel CCD camera coupled to a thin scintillator rather than photographic film. In their system, the quality of the raw patterns is improved by the use of “flat fielding” which normalizes the raw image to a “flat field” reference image that contains the image artifacts, including background, but not the crystallographic information. Automated pattern analysis is carried out using a Hough transform to locate bands and band edges in the pattern. The resulting crystallographic information is coupled with the elemental information from energy or wavelength dispersive x-ray spectrometry and the phase is identified is made through a link to a database such as the Powder Diffraction Files published by ICDD. An indexed pattern of the suspected phase is then synthesized for comparison to the unknown. This system is marketed commercially by Noran Instruments and offers the first practical method for rapid identification of unknown crystallographic phases in the SEM.

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Thomas, Grant, John Speer, David Matlock, and Joseph Michael. "Application of Electron Backscatter Diffraction Techniques to Quenched and Partitioned Steels." Microscopy and Microanalysis 17, no. 3 (January 31, 2011): 368–73. http://dx.doi.org/10.1017/s1431927610094432.

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AbstractElectron backscatter diffraction (EBSD) techniques were used to characterize “hot-rolled” quenched and partitioned microstructures produced via Gleeble thermal simulations representing a hot-strip cooling practice for steel. In particular, EBSD was utilized to positively identify the morphology and location of retained austenite, to qualitatively distinguish martensite from ferrite, and in an attempt to identify transition carbides. Large pools of retained austenite and some thin films were accurately indexed; however, there was some disparity between austenite volume fractions measured by EBSD and those measured by X-ray diffraction. Due to similarities between the crystal structures of martensite and ferrite (body centered tetragonal versus body centered cubic, respectively), martensite could not be distinguished from ferrite by indexing of diffraction patterns; however, martensite could qualitatively be distinguished from ferrite by regions of low image quality based on the very high dislocation density of martensite.

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Picard, Yoosuf N., Ranga Kamaladasa, Marc De Graef, Noel T. Nuhfer, William J. Mershon, Tony Owens, Libor Sedlacek, and Filip Lopour. "Future Prospects for Defect and Strain Analysis in the SEM via Electron Channeling." Microscopy Today 20, no. 2 (February 28, 2012): 12–16. http://dx.doi.org/10.1017/s1551929512000077.

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Electron diffraction in both SEM and TEM provides a contrast mechanism for imaging defects as well as a means for quantifying elastic strain. Electron backscatter diffraction (EBSD) is the commercially established method for SEM-based diffraction analysis. In EBSD, Kikuchi patterns are acquired by a charge-coupled device (CCD) camera and indexed using commercial software. Phase and crystallographic orientation information can be extracted from these Kikuchi patterns, and researchers have developed cross-correlation methods to measure strain as well.

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Kaufmann, Kevin, Chaoyi Zhu, Alexander S. Rosengarten, Daniel Maryanovsky, Tyler J. Harrington, Eduardo Marin, and Kenneth S. Vecchio. "Crystal symmetry determination in electron diffraction using machine learning." Science 367, no. 6477 (January 30, 2020): 564–68. http://dx.doi.org/10.1126/science.aay3062.

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Electron backscatter diffraction (EBSD) is one of the primary tools for crystal structure determination. However, this method requires human input to select potential phases for Hough-based or dictionary pattern matching and is not well suited for phase identification. Automated phase identification is the first step in making EBSD into a high-throughput technique. We used a machine learning–based approach and developed a general methodology for rapid and autonomous identification of the crystal symmetry from EBSD patterns. We evaluated our algorithm with diffraction patterns from materials outside the training set. The neural network assigned importance to the same symmetry features that a crystallographer would use for structure identification.

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Morawiec, Adam. "A remark on ab initio indexing of electron backscatter diffraction patterns." Journal of Applied Crystallography 54, no. 6 (October 27, 2021): 1844–46. http://dx.doi.org/10.1107/s1600576721009304.

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There is a growing interest in ab initio indexing of electron backscatter diffraction (EBSD) patterns. The methods of solving the problem are presented as innovative. The purpose of this note is to point out that ab initio EBSD indexing belongs to the field of indexing single-crystal diffraction data, and it is solved on the same principles as indexing of patterns of other types. It is shown that reasonably accurate EBSD-based data can be indexed by programs designed for X-ray data.

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Ren, Lingqi, Lan Yu, and Liangwei Chen. "Theoretical Diffraction Pattern Characteristics of Cubic Twin Crystal." Science of Advanced Materials 14, no. 8 (August 1, 2022): 1383–87. http://dx.doi.org/10.1166/sam.2022.4345.

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Twin crystal is a common lattice arrangement of crystal structure. The commonly used characterization methods for crystal structure include transmission electron diffraction (TED) pattern and electron backscatter diffraction (EBSD) pattern, but there is currently no specific reference standard for twin crystal. In this research, the mathematical relationship between crystal structure and TED and EBSD patterns of twin was calculated. The characteristics of twin electron diffraction spectrum, as well as the calibration of TED and EBSD patterns, were discussed and analyzed towards the examples of face-centered cubic crystal and body-centered cubic crystal. Overall, our results establish a theoretical calculation standard of diffraction spectrum, which provides a reference for further explorations to characterization of twin crystal structures.

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Syha, Melanie, Andreas Trenkle, Barbara Lödermann, Andreas Graff, Wolfgang Ludwig, Daniel Weygand, and Peter Gumbsch. "Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization." Journal of Applied Crystallography 46, no. 4 (July 18, 2013): 1145–50. http://dx.doi.org/10.1107/s002188981301580x.

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Microstructure reconstructions resulting from diffraction contrast tomography data of polycrystalline bulk strontium titanate were reinvestigated by means of electron backscatter diffraction (EBSD) characterization. Corresponding two-dimensional grain maps from the two characterization methods were aligned and compared, focusing on the spatial resolution at the internal interfaces. The compared grain boundary networks show a remarkably good agreement both morphologically and in crystallographic orientation. Deviations are critically assessed and discussed in the context of diffraction data reconstruction and EBSD data collection techniques.

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Nowell, Matthew M., Ronald A. Witt, and Brian W. True. "EBSD Sample Preparation: Techniques, Tips, and Tricks." Microscopy Today 13, no. 4 (July 2005): 44–49. http://dx.doi.org/10.1017/s1551929500053669.

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Automated analysis of Electron Backscatter Diffraction (EBSD) patterns for orientation imaging and phase identification in materials and earth sciences has become a widely accepted microstructural analysis tool. To briefly review, EBSD is a scanning electron microscope (SEM) based technique where the sample is tilted approximately 70 degrees and the electron beam is positioned in an analytical spot-mode within a selected grain. An EBSD pattern is formed due to the diffraction of the electron beam by select crystallographic planes within the material. The EBSD pattern is representative of both the phase and crystallographic orientation of the selected area. The pattern is imaged by a phosphor screen and recorded with a digital CCD camera and then analyzed.

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Rutter, Ernest, David Wallis, and Kamil Kosiorek. "Application of Electron Backscatter Diffraction to Calcite-Twinning Paleopiezometry." Geosciences 12, no. 6 (May 25, 2022): 222. http://dx.doi.org/10.3390/geosciences12060222.

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Electron backscatter diffraction (EBSD) was used to determine the orientation of mechanically twinned grains in Carrara marble experimentally deformed to a small strain (≤4%) at room temperature and at a moderate confining pressure (225 MPa). The thicknesses of deformation twins were mostly too small to permit determination of their orientation by EBSD but it proved possible to measure their orientations by calculating possible twin orientations from host grain orientation, then comparing calculated traces to the observed twin traces. The validity of the Turner & Weiss method for principal stress orientations was confirmed, particularly when based on calculation of resolved shear stress. Methods of paleopiezometry based on twinned volume fraction were rejected but a practical approach is explored based on twin density. However, although twin density correlates positively with resolved shear stress, there is intrinsic variability due to unconstrained variables such as non-uniform availability of twin nucleation sites around grain boundaries that imposes a limit on the achievable accuracy of this approach.

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40

Katrakova, Danka, and Frank Mücklich. "Probenpräparation für die Rückstreuelektronen-Kikuchi-Beugung (Electron Backscatter Diffraction, EBSD) - Teil Il: Keramiken / Specimen Preparation for Electron Backscatter Diffraction (EBSD) - Part Il: Ceramics." Practical Metallography 39, no. 12 (December 1, 2002): 644–62. http://dx.doi.org/10.1515/pm-2002-391205.

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Michael, Joseph R., Bonnie B. McKenzie, and Donald F. Susan. "Application of Electron Backscatter Diffraction for Crystallographic Characterization of Tin Whiskers." Microscopy and Microanalysis 18, no. 4 (July 26, 2012): 876–84. http://dx.doi.org/10.1017/s143192761200044x.

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AbstractUnderstanding the growth of whiskers or high aspect ratio features on substrates can be aided when the crystallography of the feature is known. This study has evaluated three methods that utilize electron backscatter diffraction (EBSD) for the determination of the crystallographic growth direction of an individual whisker. EBSD has traditionally been a technique applied to planar, polished samples, and thus the use of EBSD for out-of-surface features is somewhat more difficult and requires additional steps. One of the methods requires the whiskers to be removed from the substrate resulting in the loss of valuable physical growth relationships between the whisker and the substrate. The other two techniques do not suffer this disadvantage and provide the physical growth information as well as the crystallographic growth directions. The final choice of method depends on the information required. The accuracy and the advantages and disadvantages of each method are discussed.

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Li, Lili, and Ming Han. "Determining the Bravais lattice using a single electron backscatter diffraction pattern." Journal of Applied Crystallography 48, no. 1 (January 30, 2015): 107–15. http://dx.doi.org/10.1107/s1600576714025989.

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Theab initioderivation of the Bravais lattice from the Kikuchi bands detected from a single electron backscatter diffraction (EBSD) pattern is successfully performed. The as-measured band widths and azimuths always suffer from gnomonic distortions which need to be corrected. A primitive reciprocal cell is first reconstructed by means of the corrected data and the cell parameters are then refined by least-squares analysis of hugely over-determined equations. This allows one to further derive a Niggli reduced cell from the primitive cell. The algorithm presented is not related to any crystal symmetry information and is therefore applicable to all crystal systems. The feasibility of the determination of the Bravais lattice type and parameters from a single EBSD pattern is demonstrated using a mineral sample without anya prioriinformation about its crystal structure. The novel application developed in the present work opens the way to the determination of the Bravais lattice of crystalline materials using scanning electron microscopy combined with the EBSD technique.

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Michael, J. R., and R. P. Goehner. "Reduced Unit Cell Determination From Unindexed EBSD Patterns." Microscopy and Microanalysis 6, S2 (August 2000): 946–47. http://dx.doi.org/10.1017/s1431927600037223.

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Electron backscatter diffraction (EBSD) is a technique that can provide identification of unknown crystalline phases while exploiting the excellent imaging capabilities of the scanning electron microscope (SEM). Phase identification using EBSD has now progressed to the point that it is commercially available. Phase identification in the SEM requires high quality EBSD patterns that can only be collected using either film or charge coupled device (CCD)-based cameras. High quality EBSD patterns obtained in this manner show many diffraction features that are useful in the determination of the unit cell of the sample.’ This paper will discuss the features in the EBSD patterns and the procedure used to determine the reduced unit cell of the sample.One of the major advantages of EBSD over electron diffraction in the transmission electron microscope is the remarkable field of view that is routinely attained. The large angular view of the diffraction pattern permits many zone axes and their associated symmetries to be viewed in a single pattern or at most a few patterns.

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Winkelmann, Aimo, Gert Nolze, Grzegorz Cios, Tomasz Tokarski, and Piotr Bała. "Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps." Materials 13, no. 12 (June 23, 2020): 2816. http://dx.doi.org/10.3390/ma13122816.

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For the precise determination of orientations in polycrystalline materials, electron backscatter diffraction (EBSD) requires a consistent calibration of the diffraction geometry in the scanning electron microscope (SEM). In the present paper, the variation of the projection center for the Kikuchi diffraction patterns which are measured by EBSD is calibrated using a projective transformation model for the SEM beam scan positions on the sample. Based on a full pattern matching approach between simulated and experimental Kikuchi patterns, individual projection center estimates are determined on a subgrid of the EBSD map, from which least-square fits to affine and projective transformations can be obtained. Reference measurements on single-crystalline silicon are used to quantify the orientation errors which result from different calibration models for the variation of the projection center.

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Ashton, M. J., and John F. Humphreys. "Inhomogeneous Deformation and Microstructural Evolution during the Hot Deformation of Al-4.98%Mg." Materials Science Forum 467-470 (October 2004): 117–22. http://dx.doi.org/10.4028/www.scientific.net/msf.467-470.117.

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Plane strain channel die compression (PSC) deformation has been carried out on Al-Mg alloys with Mg contents of 0.1 to 5 % at 350°C, and the deformed microstructures characterised by channelling contrast backscattered electron imaging (BSE), secondary electron imaging (SE) and high resolution electron backscatter diffraction (EBSD). Measurements of orientation spread and misorientation gradient obtained from EBSD maps have been used to quantify the microstructural inhomogeneity developing in the 4.98 % Mg alloy. The results are consistent with inhomogeneous plasticity with more deformation occurring in the grain boundary regions. In-situ FEGSEM hot deformation experiments on the Al-4.98 % Mg alloy have provided evidence of stress driven boundary migration at low strains.

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46

Kunze, Karsten. "Crystal orientation measurements using SEM–EBSD under unconventional conditions." Powder Diffraction 30, no. 2 (May 12, 2015): 104–8. http://dx.doi.org/10.1017/s0885715615000263.

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Electron backscatter diffraction (EBSD) is a micro-analytical technique typically attached to a scanning electron microscope (SEM). The vast majority of EBSD measurements is applied to planar and polished surfaces of polycrystalline bulk specimen. In this paper, we present examples of using EBSD and energy-dispersive X-ray spectroscopy (EDX) to analyze specimens that are not flat, not planar, or not bulk – but pillars, needles, and rods. The benefits of low vacuum SEM operation to reduced drift problems are displayed. It is further demonstrated that small and thin specimens enhance the attainable spatial resolution for orientation mapping (by EBSD or transmission Kikuchi diffraction) as well as for element mapping (by EDX).

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Koblischka-Veneva, A., M. R. Koblischka, X. L. Zeng, J. Schmauch, and U. Hartmann. "TEM and electron backscatter diffraction analysis (EBSD) on superconducting nanowires." Journal of Physics: Conference Series 1054 (July 2018): 012005. http://dx.doi.org/10.1088/1742-6596/1054/1/012005.

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McCabe, R. J., A. M. Kelly, A. J. Clarke, and R. Wenk. "Electron Backscatter Diffraction (EBSD) Characterization of Uranium and Uranium Alloys." Microscopy and Microanalysis 18, S2 (July 2012): 432–33. http://dx.doi.org/10.1017/s1431927612004011.

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White, Ryan M., and Robert R. Keller. "Restoration of firearm serial numbers with electron backscatter diffraction (EBSD)." Forensic Science International 249 (April 2015): 266–70. http://dx.doi.org/10.1016/j.forsciint.2015.02.003.

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Humphreys, F. J. "Characterisation of fine-scale microstructures by electron backscatter diffraction (EBSD)." Scripta Materialia 51, no. 8 (October 2004): 771–76. http://dx.doi.org/10.1016/j.scriptamat.2004.05.016.

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Journal articles on the topic 'EBSD - Electron BackScatter Diffraction'

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