Relevant bibliographies by topics / Elastic moduli of thin films

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Elastic moduli of thin films'

Author: Grafiati
Published: 4 June 2021
Last updated: 4 February 2022

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Journal articles on the topic "Elastic moduli of thin films"

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Cho, Ki-Hyun, and Youngman Kim. "Elastic modulus measurement of multilayer metallic thin films." Journal of Materials Research 14, no. 5 (1999): 1996–2001. http://dx.doi.org/10.1557/jmr.1999.0269.

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Two- and three-layer composite models were developed using a beam vibration theory, and the models were applied for measuring Young's moduli of thin metallic films. The Cr, Ni, and Co-coated Si wafer composites (two-layer composite) and (Cr/Ti/Si) composites (three-layer composite) were produced by radio-frequency (rf) magnetron sputtering and used to test the developed models. Young's moduli of (Cr) films obtained by the three-layer composite model agree well with those of (Cr) films obtained by the two-layer composite model, considering (Ti/Si) as the one layer and (Cr) as the other layer. T
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Wei, Zhongxin, Guoping Zhang, Hao Chen, Jian Luo, Ranran Liu, and Shengmin Guo. "A simple method for evaluating elastic modulus of thin films by nanoindentation." Journal of Materials Research 24, no. 3 (2009): 801–15. http://dx.doi.org/10.1557/jmr.2009.0126.

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A simple empirical method that extracts the elastic moduli of both thin films and the underlying substrates is proposed and validated by both new nanoindentation experiments and published data. Deconvolution of thin film’s elastic properties from the substrate is achieved by statistical estimation, where a simple function relating the elastic moduli of the thin film and substrate to the film-substrate composite modulus is used to fit the experimental data plotted against the logarithmic indentation depth normalized by film thickness. Experimental data from a wide range of soft and hard films o
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Martinschitz, K. J., R. Daniel, C. Mitterer, and J. Keckes. "Elastic constants of fibre-textured thin films determined by X-ray diffraction." Journal of Applied Crystallography 42, no. 3 (2009): 416–28. http://dx.doi.org/10.1107/s0021889809011807.

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A new methodology is presented that allows the rapid determination of elastic constants of cubic fibre-textured thin films by X-ray diffraction. The theoretical concept is developed and tested on calculated examples of Cu and CrN films. The mechanical elastic constants are extrapolated from X-ray elastic constants by taking into consideration crystal and macroscopic elastic anisotropy. The derived algorithm enables the determination of a reflection and the corresponding value of the X-ray anisotropic factor Γ for which the X-ray elastic constants are equal to their mechanical counterparts in t
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Hurley, D. C., R. H. Geiss, M. Kopycinska-Müller, et al. "Anisotropic elastic properties of nanocrystalline nickel thin films." Journal of Materials Research 20, no. 5 (2005): 1186–93. http://dx.doi.org/10.1557/jmr.2005.0146.

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The elastic properties of a nickel film approximately 800 nm thick were measured with nanoindentation, microtensile testing, atomic force acoustic microscopy (AFAM), and surface acoustic wave (SAW) spectroscopy. Values for the indentation modulus (220–223 GPa) and Young’s modulus (177–204 GPa) were lower than predicted for randomly oriented polycrystalline nickel. The observed behavior was attributed to grain-boundary effects in the nanocrystalline film. In addition, the different measurement results were not self-consistent when interpreted assuming elastic isotropy. Agreement was improved by
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Hong, S. H., K. S. Kim, Y. M. Kim, J. H. Hahn, C. S. Lee, and J. H. Park. "Characterization of elastic moduli of Cu thin films using nanoindentation technique." Composites Science and Technology 65, no. 9 (2005): 1401–8. http://dx.doi.org/10.1016/j.compscitech.2004.12.010.

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KALKHORAN, SALMON M., NUWONG CHOLLACOOP, and ANDREW GOULDSTONE. "EFFECTS OF PLASTIC ANISOTROPY AND HARDENING ON INDENTATION MODULUS OF THIN FILMS." International Journal of Modern Physics B 24, no. 01n02 (2010): 247–55. http://dx.doi.org/10.1142/s0217979210064186.

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In this study we have modeled the Berkovich indentation response of elastic-plastic thin films on elastic-plastic substrates, the modulus of film and substrate being equivalent, using FEM. The stimulus for this investigation was experimental indentation data of rapidly quenched nickel thin films on stainless steel substrates, for which depth-dependent, significantly low (>50% decrease) moduli were extracted via the Oliver-Pharr method. This was notable because both film and substrate had the same elastic modulus. Previous studies showed that differences in plastic behavior could elicit such
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Cammarata, R. C., and K. Sieradzki. "Effects of surface stress on the elastic moduli of thin films and superlattices." Physical Review Letters 62, no. 17 (1989): 2005–8. http://dx.doi.org/10.1103/physrevlett.62.2005.

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Hahm, Si-Woo, and Dahl-Young Khang. "Crystallization and microstructure-dependent elastic moduli of ferroelectric P(VDF–TrFE) thin films." Soft Matter 6, no. 22 (2010): 5802. http://dx.doi.org/10.1039/c0sm00350f.

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Stafford, Christopher M., Christopher Harrison, Kathryn L. Beers, et al. "A buckling-based metrology for measuring the elastic moduli of polymeric thin films." Nature Materials 3, no. 8 (2004): 545–50. http://dx.doi.org/10.1038/nmat1175.

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Jayaraman, S., R. L. Edwards, and K. J. Hemker. "Relating mechanical testing and microstructural features of polysilicon thin films." Journal of Materials Research 14, no. 3 (1999): 688–97. http://dx.doi.org/10.1557/jmr.1999.0094.

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Polycrystalline silicon thin films (polysilicon) have been deposited on single crystalline silicon substrates, and square and rectangular windows have been etched into these substrates using standard micromachining techniques. Pressure-displacement curves of the resulting polysilicon membranes have been obtained for these geometries, and this data has been used to determine the elastic constants E and v. The microstructural features of the films have been investigated by transmission electron microscopy (TEM) and x-ray diffraction. The grains were observed to be columnar and were found to have
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Dissertations / Theses on the topic "Elastic moduli of thin films"

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Ingale, Himanshu A. "Fabrication and Characterization of a Wrinkled Polydimethylsiloxane Thin Film Bilayer System." University of Cincinnati / OhioLINK, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1511799079390201.

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Vaz, Alfredo Rodrigues. "Medidas do módulo elástico de filmes finos metálicos." Universidade de São Paulo, 2004. http://www.teses.usp.br/teses/disponiveis/43/43134/tde-24022014-150716/.

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Neste trabalho determinamos o módulo elástico de filmes finos metálicos nanoestruturados. Os metais estudados, platina, ouro e paládio foram depositados utilizando a técnica de Metal Plasma Immersion Ion Implantation and Deposition. Um novo método foi utilizado para as medidas de módulo elástico, no qual cantiléveres de microscopia de força atômica são uniformemente recobertos com os filmes finos metálicos. Medidas das frequências de ressonância dos cantiléveres foram realizadas antes e depois dos recobrimentos com os filmes. Usando a teoria de vibração de barras, determinamos os valores dos m
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Mege, Fabrice. "AFM à contact résonant : développement et modélisation." Phd thesis, Université de Grenoble, 2011. http://tel.archives-ouvertes.fr/tel-00618676.

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Avec l'intégration de circuits intégrés de plus en plus denses, le besoin d'outils de caractérisation adaptés à ces échelles se fait ressentir. Identifier et analyser les problèmes de fiabilité survenant dans ces structures à des dimensions inférieures à 100 nm demande la mise au point d'instruments innovants. Ce travail de thèse a consisté dans un premier temps à développer un appareil à champs proches sensible aux propriétés mécaniques de surface, et dans un second temps à analyser les résultats expérimentaux en s'appuyant sur des approches analytiques et/ou numériques. Désigné sous le nom d
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ZANONI, RAYMOND. "BRILLOUIN SPECTROSCOPY OF LANGMUIR-BLODGETT FILMS (THIN FILMS, ELASTIC CONSTANTS)." Diss., The University of Arizona, 1986. http://hdl.handle.net/10150/183852.

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The goal of this dissertation has been to develop techniques in order to use Brillouin spectroscopy as a tool for studying the elastic properties of thin films on a scale of ≃100 Å. In order to develop that capability we have built a tandem multi-pass Fabry-Perot interferometer, and that interferometer was used to study the elastic properties of Langmuir-Blodgett films. These films were chosen because they can be deposited one molecular layer at a time. As a result of these investigations we have measured the density and elastic constants of the Langmuir-Blodgett film cadmium arachidate. Sampl
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Kumar, Atul. "Diffraction stress analysis of thin films; investigating elastic grain interaction." Stuttgart Max-Planck-Inst. für Metallforschung, 2005. http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-24805.

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Choi, Jaehwan. "Statistical approach to the elastic property extraction and planar elastic response of polycrystalline thin-films." Connect to this title online, 2004. http://rave.ohiolink.edu/etdc/view?acc%5Fnum=osu1092851082.

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Thesis (Ph. D.)--Ohio State University, 2004.<br>Title from first page of PDF file. Document formatted into pages; contains xvi, 156 p.; also includes graphics (some col.). Includes bibliographical references (p. 150-156). Available online via OhioLINK's ETD Center
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Atherton, Timothy James. "Frustration phenomena due to elastic anisotropy in thin liquid crystal films." Thesis, University of Exeter, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.436421.

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Kim, Han Sung. "Prediction Of Elastic Properties Of Micro- And Nano-Scale Thin Films." The Ohio State University, 2008. http://rave.ohiolink.edu/etdc/view?acc_num=osu1211905997.

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Andrade, Silva Ignacio Javier. "Wrinkling and folding induced pattern formation in elastic thin sheets." Thesis, Lyon, 2019. http://www.theses.fr/2019LYSEN065.

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Cette thèse explore deux mécanismes de formation de motifs dans des feuilles minces élastiques : la formation de rides et des plis. La première partie de la thèse aborde le rôle des conditions aux limites dans l’analyse des instabilités de rides dans des films minces tendus. Les instabilités de rides ont été largement étudiés dans des géométries simples, où la direction des rides est connue à priori. Par exemple, le problème de Lamé, consistant en une feuille annulaire radialement étirée, a servi de modèle pour le formation de rides en traction dans des géométries axiales. Nous étudions les ef
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Xu, Haoyun. "Derivation of a continuum model for the long-ranged elastic interaction on a stepped surface /." View abstract or full-text, 2007. http://library.ust.hk/cgi/db/thesis.pl?MATH%202007%20XU.

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Books on the topic "Elastic moduli of thin films"

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Damman, P. Instability of thin films. Oxford University Press, 2017. http://dx.doi.org/10.1093/oso/9780198789352.003.0008.

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We will first discuss the stability of liquid films deposited on solid surfaces with an emphasis on the nature of intermolecular forces and thermal fluctuations that conspire to generate complex morphologies. We will see how the global dewetting dynamics is driven by the solid–fluid interface and that dewetting can be a powerful tool to study the nanorheology of complex fluids, such as polymer melts in ultra thin films. In the second part, we will consider thin elastic sheets constrained by mechanical forces. The canonical example of such a system is given by a simple paper ball. We will see h
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Book chapters on the topic "Elastic moduli of thin films"

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White, B. E., and R. O. Pohl. "Elastic Properties of Amorphous Thin Films." In Springer Series in Solid-State Sciences. Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-642-84888-9_106.

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Roytburd, Alexander L. "Elastic Domains in Ferroelectric Epitaxial Films." In Thin Film Ferroelectric Materials and Devices. Springer US, 1997. http://dx.doi.org/10.1007/978-1-4615-6185-9_3.

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Wredenberg, F., and P. L. Larsson. "On Scratching of Elastic-Plastic Thin Films on Elastic Substrates." In Friction, Wear and Wear Protection. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527628513.ch39.

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Chima-Okereke, C., W. L. Roberts, A. J. Bushby, and M. J. Reece. "The Elastic Properties of Ferroelectric Thin Films Measured Using Nanoindentation." In Multifunctional Polycrystalline Ferroelectric Materials. Springer Netherlands, 2011. http://dx.doi.org/10.1007/978-90-481-2875-4_11.

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Huang, Rui. "A Kinetics Approach to Surface Wrinkling of Elastic Thin Films." In Mechanical Self-Assembly. Springer New York, 2012. http://dx.doi.org/10.1007/978-1-4614-4562-3_5.

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Wald, M. J., J. M. Considine, and K. T. Turner. "Measuring the Elastic Modulus of Soft Thin Films on Substrates." In Experimental and Applied Mechanics, Volume 6. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-9792-0_105.

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Chen, Zhangwei, Finn Giuliani, and Alan Atkinson. "Determination of Elastic Moduli for Porous Sofc Cathode Films Using Nanoindentation and Fem." In Advances in Bioceramics and Porous Ceramics VII. John Wiley & Sons, Inc., 2015. http://dx.doi.org/10.1002/9781119040392.ch10.

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Xiang, Dao Hui, Ming Chen, Y. P. Ma, and Fang Hong Sun. "Measurement of Elastic Modulus and Residual Stress of Diamond Thin Films." In Advances in Abrasive Technology IX. Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-416-2.545.

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Ballantine, David S., and Hank Wohltjen. "Elastic Properties of Thin Polymer Films Investigated with Surface Acoustic Wave Devices." In ACS Symposium Series. American Chemical Society, 1989. http://dx.doi.org/10.1021/bk-1989-0403.ch015.

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Zheng, Ya-Xiong, Li-Sha Niu, Ting-Ting Dai, and Hui-Ji Shi. "Elastic and Plastic Creep Mechanism in Thin Metal Films using FEM Method." In Particle and Continuum Aspects of Mesomechanics. ISTE, 2010. http://dx.doi.org/10.1002/9780470610794.ch48.

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Conference papers on the topic "Elastic moduli of thin films"

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Andia, Pedro C., Francesco Costanzo, and Gary L. Gray. "Estimation of intrinsic stresses and elastic moduli in thin films." In International Symposium on Optical Science and Technology, edited by Akhlesh Lakhtakia, Werner S. Weiglhofer, and Russell F. Messier. SPIE, 2000. http://dx.doi.org/10.1117/12.390587.

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Shan, Zhaohui, and Suresh K. Sitaraman. "Characterization of Mechanical Properties of Thin Films by Nanoindentation Technique and Finite Element Simulation." In ASME 2002 International Mechanical Engineering Congress and Exposition. ASMEDC, 2002. http://dx.doi.org/10.1115/imece2002-39668.

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Titanium thin films have been widely used in microelectronics due to their good adhesion to substrates, such as Silicon wafer and Quartz. However, mechanical behavior of Titanium thin films has not been well characterized. This paper presents a methodology that combines the nanoindentation technique and finite element modeling to characterize the mechanical (elastic and plastic) properties of thin film with its application on Titanium thin film deposited on silicon substrate. The results show that the elastic properties (Young’s modulus) of the Titanium thin film does not change much from the
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Tarumi, R. "Measurement of Elastic Moduli of a Fe-Si-B Amorphous Alloy Thin Film by EMAR and RUS." In REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION. AIP, 2005. http://dx.doi.org/10.1063/1.1916818.

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Khan, Hanif Muhammad, and Sung-Gaun Kim. "High Strain Rate Induced Phenomenon in Thin Nickel Films." In ASME 2010 8th International Conference on Nanochannels, Microchannels, and Minichannels collocated with 3rd Joint US-European Fluids Engineering Summer Meeting. ASMEDC, 2010. http://dx.doi.org/10.1115/fedsm-icnmm2010-30631.

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Molecular dynamics study has been performed to investigate the effect of extreme dynamic loading condition on thin Nickel films. Due to the novel aspects of thin films, it has attracted attention over the years for Nano-electro-mechanical systems design. This would be helpful for the analysis of ultra short pulse laser induced fabrication or machining of thin films. Uniaxial high tensile strain namely 109 and 1010 s−1 has been used on a Nickel thin film. The Embedded-atom method (EAM) potential function for Nickel has been used for the interaction of the atoms. We have observed ductile failure
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Karanjgaokar, Nikhil, and Ioannis Chasiotis. "Nanocrystalline FCC Thin Films Are More Prone to RT Creep Than What We Think." In ASME 2009 International Mechanical Engineering Congress and Exposition. ASMEDC, 2009. http://dx.doi.org/10.1115/imece2009-10578.

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Although nanocrystalline (Nc) metallic thin films are excellent candidate materials for Microelectromechanical Systems (MEMS) and microelectronics due to their outstanding yield strength, serious reliability concerns arise from their increased room temperature creep rates. A comprehensive experimental investigation was carried out to extract the strain-rate dependent mechanical behavior of Au (38 nm grain size) and Ni (20 nm grain size) micron-thin films conducted for the very first time at strain rates in the broad range of 10−6 – 10 /s which spans time scales from ms to hours. Nc-Au films de
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Waters, Cindy, Stephen Ajinola, Dhannajay Kumar, Kwadwo-mensah Darkwa, and Ahmadreza Sedighi. "Creation and Characterization of Doped Hydroxyapatite With Strontium Carbonate Thin Film Coating on Titanium Substrates Using Pulse Laser Deposition for Biological Applications." In ASME 2013 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2013. http://dx.doi.org/10.1115/imece2013-64924.

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The main purpose of this paper is to investigate mechanical properties of thin films of strontium carbonate (Sr2CO3) doped with hydroxyapatite (HA) on titanium substrates using nanoindentation techniques. The variation in the weight percentages of strontium carbonate of 0 wt %, 2.5 wt % and 100 wt % of Sr2CO3 in hydroxyapatite on a titanium substrate were used to investigate the effect of strontium carbonate on the surface modification for biological application. The hope is to use these results to improve the surface hardness of dentures and boost cavity prevention, and to improve menopause b
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Li, W., S. Qu, T. Siegmund, and Y. Huang. "A Study on Length Scale Effects on Indentation Delamination of Thin Films." In ASME 2004 International Mechanical Engineering Congress and Exposition. ASMEDC, 2004. http://dx.doi.org/10.1115/imece2004-61160.

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Simulations of indentation delamination of ductile films on elastic substrates are performed. A cohesive zone model accounts for initiation and growth of interface delaminations and a strain gradient plasticity framework for the length scale dependence of plastic deformation. With the cohesive zone model and the strain gradient formulation two length scales are introduced in to the analysis.
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Bulusu, A., and D. G. Walker. "Modeling of Electron Transport in Thin Films With Quantum and Scattering Effects." In ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/ipack2005-73212.

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With device dimensions shrinking to nanoscales, quantum effects such as confinement and tunneling become significant in electron transport. In addition, thermal transport in devices is directly coupled to charge transport even in highly scaled devices. While electron-phonon scattering usually helps restore thermodynamic equilibrium, shrinking device dimensions may not ensure enough scattering to restore equilibrium. The simultaneous consideration of scattering effects, which is usually described as particle behavior, and quantum effects, which are wave in nature, is extremely difficult and com
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Pardoen, Thomas, Asmahan Safi, Michae¨l Coulombier, Pierre Carbonnelle, Jean-Pierre Raskin, and Se´bastien Gravier. "A New on Chip Nanomechanical Testing Concept Applied to Brittle and Ductile Thin Films Materials." In 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems. ASMEDC, 2008. http://dx.doi.org/10.1115/micronano2008-70232.

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A novel, versatile concept of micromachines has been developed to measure the mechanical response of films, beams or tubes, with thickness ranging between 10 to 1000 nm. Its capacity to study large strains and fracture is one of its key advantages. This new technique has been used to characterize the elastic modulus and fracture stress of two types of brittle films: polysilicon and silicon nitride. The Young’s modulus agrees with the literature data. The fracture stress of polysilicon is shown to increase with decreasing specimen surface size, in agreement with the recent literature. In additi
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Yang, Zhaochun, Qing-Ming Wang, Patrick Smolinski, and Hongbo Yang. "Static Analysis of Thin Film Piezoelectric Micro-Accelerometer Using Analytical and Finite Element Modeling." In ASME 2003 International Mechanical Engineering Congress and Exposition. ASMEDC, 2003. http://dx.doi.org/10.1115/imece2003-41387.

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On-chip microaccelerometers using piezoelectric thin films has attracted much interest due to their simple structure and potentially high sensitivity. However, the relationships between the structure of the microaccelerometer and its performance still need to be further developed in more details. In this paper we present a theoretical model for a microaccelerometer with four suspended flexural PZT/silicon beams and a central proof mass configuration. The model takes into account the effect of device geometry and elastic properties of the piezoelectric film, and is supported by the finite eleme
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Reports on the topic "Elastic moduli of thin films"

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Bourcier, R. J., J. J. Sniegowski, and V. L. Porter. A novel method to characterize the elastic/plastic deformation response of thin films. Office of Scientific and Technical Information (OSTI), 1996. http://dx.doi.org/10.2172/399701.

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