Books on the topic 'Electrical characterization'
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Look, D. C. Electrical characterization of gaAs materials and devices. Wiley, 1989.
Find full textUnited States. National Aeronautics and Space Administration., ed. Electrical characterization of 6H crystalline silicon carbide. National Aeronautics and Space Administration, 1994.
Find full textArscott, S. Electrical characterization of delta doped gallium arsenide. UMIST, 1994.
Find full textUnited States. National Aeronautics and Space Administration., ed. Electrical characterization of 6H crystalline silicon carbide. National Aeronautics and Space Administration, 1994.
Find full textStallinga, Peter. Electrical characterization of organic electronic materials and devices. John Wiley & Sons, 2009.
Find full textStallinga, Peter. Electrical characterization of organic electronic materials and devices. John Wiley & Sons, 2009.
Find full textStallinga, Peter. Electrical characterization of organic electronic materials and devices. John Wiley & Sons, 2009.
Find full textCristoloveanu, Sorin, and Sheng S. Li. Electrical Characterization of Silicon-on-Insulator Materials and Devices. Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-2245-4.
Full textCristoloveanu, Sorin. Electrical characterization of silicon-on-insulator materials and devices. Kluwer Academic, 1995.
Find full textAnholt, Robert. Electrical and thermal characterization of MESFETs, HEMTs, and HBTs. Artech House, 1995.
Find full textPunkka, Eero. Electrical characterization of conducting polymers and polymeric semiconductor devices. Finnish Academy of Technology, 1991.
Find full textOrton, J. W. The electrical characterization of semiconductors: Measurement of minority carrier properties. Academic Press, 1990.
Find full textBaumann, E. D. Electrical characterization of a Mapham inverter using pulse testing techniques. National Aeronautics and Space Administration, 1990.
Find full textUnited States. National Aeronautics and Space Administration., ed. Electrical characterization of a Space Station Freedom alpha Utility Transfer Assembly. National Aeronautics and Space Administration, 1994.
Find full textN, Hammoud Ahmad, and United States. National Aeronautics and Space Administration., eds. Electrical characterization of glass, teflon, and tantalum capacitators at high temperatures. National Aeronautics and Space Administration, 1991.
Find full textMcLaughlin, Betty-Ann. Grain boundary characterization and electrical resistivity studies of high purity copper. National Library of Canada, 1993.
Find full text1927-, Tamir Theodor, Griffel Giora, Bertoni Henry L, and Weber Research Institute International Symposium on Guided-Wave Optoelectronics: Device Characterization, Analysis, and Design (4th : 1994 : Brooklyn, N.Y.), eds. Guided-wave optoelectronics: Device characterization, analysis, and design. Plenum Press, 1995.
Find full textservice), SpringerLink (Online, ed. Advanced Computing in Electron Microscopy. Springer Science+Business Media, LLC, 2010.
Find full textE, Anspaugh B., and Jet Propulsion Laboratory (U.S.), eds. Characterization of terrestrial solar cells for space applications: Electrical characteristics of thin Westinghouse dendritic web cells as a function of solar intensity, temperature, and incidence angle. National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology, 1985.
Find full textS, Martellucci, Chester A. N, and Course of the International School of Quantum Electronics on Diffractive Optics and Optical Microsystems (1996 : Erice, Italy), eds. Diffractive optics and optical microsystems. Plenum Press, 1997.
Find full textUlrich, Gösele, ed. Wafer Bonding: Applications and Technology. Springer Berlin Heidelberg, 2004.
Find full textservice), SpringerLink (Online, ed. High-Temperature Cuprate Superconductors: Experiment, Theory, and Applications. Springer-Verlag Berlin Heidelberg, 2010.
Find full textYale, Strausser, ed. Characterization in silicon processing. Butterworth-Heinemann, 1993.
Find full textN, Peters P., and George C. Marshall Space Flight Center., eds. Characterizations of electrical properties of high Tc superconducting materials: Center director's discretionary fund final report. National Aeronautics and Space Administration, George C. Marshall Space Flight Center, 1989.
Find full textCharacterization of the Electrical Environment. University of Toronto Press, 2014.
Find full textBodle, David, Axel Ghazi, Moninuddin Syed, and Ralph Woodside. Characterization of the Electrical Environment. University of Toronto Press, 2019.
Find full textAmin, Mohammad Nurul. Electrical characterization of flux/substrate interface. 1997.
Find full textStallinga, Peter. Electrical Characterization of Organic Electronic Materials and Devices. Wiley & Sons, Incorporated, John, 2009.
Find full textKim, Seung-bae. Electrical characterization of n-type aluminum gallium arsenide. 1991.
Find full textAvila, Alba. Atomic Force Microscopy-Based Electrical Characterization of Materials. Taylor & Francis Group, 2019.
Find full textSze, Wing-Il. Electrical characterization of silicon and silicon dioxide materials. 1988.
Find full textElectrical Characterization of Ion-Implanted 4H-Silicon Carbide. Storming Media, 1999.
Find full textAvila, Alba. Atomic Force Microscopy-Based Electrical Characterization of Materials. Taylor & Francis Group, 2021.
Find full textStallinga, Peter. Electrical Characterization of Organic Electronic Materials and Devices. Wiley & Sons, Limited, John, 2009.
Find full textISE, Freiburg Fraunhofer, and Markus Mundus. Ultrashort Laser Pulses for Electrical Characterization of Solar Cells. Fraunhofer IRB Verlag, 2016.
Find full textLi, Sheng, and Sorin Cristoloveanu. Electrical Characterization of Silicon-On-Insulator Materials and Devices. Springer London, Limited, 2013.
Find full textChoi, Sung Yeun. Periodic mesostructured nanocrystalline titania: Synthesis, characterization and electrical properties. 2005.
Find full textLi, Sheng, and Sorin Cristoloveanu. Electrical Characterization of Silicon-on-Insulator Materials and Devices. Springer, 2014.
Find full textLi, Sheng, and Sorin Cristoloveanu. Electrical Characterization of Silicon-on-Insulator Materials and Devices. Springer, 2011.
Find full textMeasurement and characterization of magnetic materials. Elsevier Academic Press, 2004.
Find full textElectrical Characterization of Intrinsic and Induced Deep Level Defects in Hexagonal SiC. Storming Media, 1996.
Find full textWalters, Simon David. Characterization and analysis of Kettering-type ignition systems and electrical spark profiles. 1998.
Find full textSimpson, Logan Lloyd. The design and characterization of electrochromic molecular probes of transmembrane electrical potential. 1985.
Find full textElectrical Characterization of GaAs Materials and Devices (Designand Measurement in Electronic Engineering). John Wiley & Sons Inc, 1992.
Find full textShirsath, Sagar. Preparation, Characterization and Investigations of Electrical and Magnetic Properties of Some Ferrites. GRIN Verlag GmbH, 2013.
Find full textMoiz, Syed Abdul, and K. S. Karimov. Electrical Characterization of Novel Organic Semiconductor: Materials and Devices for Sensor Technology. VDM Verlag Dr. Müller, 2010.
Find full textPalmisano, Giuseppe, Egidio Ragonese, Angelo Scuderi, and Tonio Biondi. Integrated Inductors and Transformers: Characterization, Design and Modeling for RF and MM-Wave Applications. Auerbach Publishers, Incorporated, 2010.
Find full textPalmisano, Giuseppe, Egidio Ragonese, Angelo Scuderi, and Tonio Biondi. Integrated Inductors and Transformers: Characterization, Design and Modeling for RF and MM-Wave Applications. Auerbach Publishers, Incorporated, 2010.
Find full textIntegrated inductors and transformers: Characterization, design, and modeling for RF and MM-wave applications. Auerbach Publications, 2010.
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