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Relevant bibliographies by topics / Electrical Circuits

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Academic literature on the topic 'Electrical Circuits'

Author: Grafiati

Published: 4 June 2021

Last updated: 24 January 2023

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Journal articles on the topic "Electrical Circuits"

1

Hidayatulloh, Mukhlis. "DEVELOPING ELECTRICAL CIRCUITS FLIPBOOK USING FLIPBUILDER." International Journal of Innovation Education and Research 7, no. 2 (February 28, 2019): 124–34. http://dx.doi.org/10.31686/ijier.vol7.iss2.1331.

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The students learning outcome in electrical circuits topic are not satisfied. Then, researchers developed an interesting ebook using Flipbuilder that integrated with PhET Simulation software, called electric circuit flipbook. The objectives of this study are: (1) Describing the validity of flipbook based on three lecturers and three teachers; (2) Describing the practicality of flipbook from students respons questionnaire; and (3) Describing the effectiveness of the Electric Circuit Flipbook based on the improvement of student learning outcomes. The development of Electric Circuit Flipbook used ADDIE model. The instruments used are: material, media, and language validation sheet; questionnaire of student responses; and learning outcomes test. The results showed that: (1) The validity of the Electric Circuit Flipbook is very feasible; (2) The practicality of the flipbook is in very practical category; and (3) Flipbook effectiveness is in very effective category. Flipbook electrical circuits developed is eligible to use as a learning medium

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Reljin, Branimir, Slavica Ristić, and Milesa Srećković. "Analysis of Some Physical Phenomena and Processes by Equivalent Electrical Circuits." International Journal of Electrical Engineering & Education 33, no. 4 (October 1996): 353–72. http://dx.doi.org/10.1177/002072099603300407.

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Analysis of some physical phenomena and processes by equivalent electrical circuits Electric circuit analysis is a very powerful tool solving many complex problems. Consequently, most non-electrical problems can be efficiently resolved if they are modelled, first, by appropriate electric circuits. In this paper some physical phenomena (in thermodynamics, optics and dynamics of fluids) are chosen to illustrate the above statement. The modelling procedure exposed can also be extended to other problems in science.

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SKRYPNYK, S., and A. SHEINA. "Short circuits currents comparison of 6 (10) kV and 20 kV." Journal of Electrical and power engineering 14, no. 1 (February 27, 2020): 21–26. http://dx.doi.org/10.31474/2074-2630-2020-1-21-26.

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Most failures in electrical installations are caused by short circuits (short circuits), which occur as a result of a failure in the electrical strength of the insulation of the conductive parts. A short circuit is an electrical connection of two points of an electric circuit with different values of potential, which is not provided by the design of the device, which interferes with its normal operation. Short circuits may result from a failure of the insulation of the current-carrying elements or the mechanical contact of the non- insulated elements. Also called a short circuit is a condition where the load resistance is less than the internal resistance of the power source. The reasons for such violations are various: aging of insulation, breakages of wires of overhead transmission lines, mechanical damages of isolation of cable lines at ground works, lightning strikes in the transmission line and others. Most often, short-circuits occur through transient resistance, such as through the resistance of an electric arc that occurs at the point of damage to the insulation. Sometimes there are metallic short circuits in which the resistance of the electric arc is very small. The study of short circuits in the power grid is a major step in the design of modern electrical networks. The research is conducted using computer software, first by modeling the system and then simulating errors. A malfunction usually leads to an increase in the current flowing in the lines, and failure to provide reliable protection can result in damage to the power unit. Thus, short-circuit calculations are the primary consideration when designing, upgrading, or expanding a power system. The three-phase short circuit is the least likely. However, in many cases, the three-phase short circuit is associated with the most severe consequences, as it causes the highest power imbalances on the shafts of the generators. The study of transients begins with the mode of three-phase closure due to its relative simplicity in comparison with other types of asymmetry. In most cases, the analysis and calculation of the transient regime of the electrical system involves the preparation of a calculated scheme of substitution, in which the parameters of its elements are determined in named or relative units. The electrical substitution circuitry is used to further study the transients in the power system. The definition of electrical and electromagnetic quantities in relative units is widely used in the theory of electric machines. This is because it significantly simplifies the theoretical calculations and gives the results a generalized view in the practical calculations of currents and residual voltages at the short circuit. By the relative value of any value is understood as its relation to another value of the same name, taken as the base. So, before presenting any quantities in relative units, we need to choose the basic units. In the electrical system with increased voltages, the overall load capacity of the network increases, which in turn makes it possible to supply high-quality electrical energy over a greater distance. In the process of comparing the type of transmission lines, it should be noted that the advantages of the cable transmission line. According to the results of the calculation of short-circuit currents, it can be concluded that in networks with a larger line cross-section and a higher voltage, the short-circuit currents are larger. Thus, during the transition of the electric networks to the higher voltage class of 20 kV, the currents of the KZ increased by 43% compared to the 6 kV electric network. This analysis shows that the importance of reliable power supply in the power supply system for high voltage classes must be high and have equipment to prevent emergencies. In the future, it is planned to develop a systematic calculation of short-circuit currents for a number of transmission lines and to conduct mathematical modeling in the system of applications for the study of transient processes at short circuits.

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Kaczorek, Tadeusz. "Singular fractional linear systems and electrical circuits." International Journal of Applied Mathematics and Computer Science 21, no. 2 (June 1, 2011): 379–84. http://dx.doi.org/10.2478/v10006-011-0028-8.

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Singular fractional linear systems and electrical circuitsA new class of singular fractional linear systems and electrical circuits is introduced. Using the Caputo definition of the fractional derivative, the Weierstrass regular pencil decomposition and the Laplace transformation, the solution to the state equation of singular fractional linear systems is derived. It is shown that every electrical circuit is a singular fractional system if it contains at least one mesh consisting of branches only with an ideal supercapacitor and voltage sources or at least one node with branches with supercoils.

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Matveenko, Valerii, Maksim Iurlov, Dmitrii Oshmarin, Nataliya Sevodina, and Nataliia Iurlova. "Modelling of vibrational processes in systems with piezoelements and external electric circuits on the basis of their electrical analogue." Journal of Intelligent Material Systems and Structures 29, no. 16 (June 11, 2018): 3254–65. http://dx.doi.org/10.1177/1045389x18781025.

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The dissipative properties of electromechanical systems based on structure with elements made of piezomaterial can be controlled by attaching external electric circuits to the piezoelements. One can change electric circuit parameters in such a way as to ensure the greatest possible energy dissipation on an external electric circuit and, thereby, the best damping of the system’s specified oscillation frequency. Since the external electric circuits are a collection of elements with lumped parameters attached to a system with distributed parameters, the solution for such a system of electro-viscoelasticity problems in the complete formulation by the finite element method leads to a large solving system of algebraic equations. The solution of this system requires considerable time and computational resources. There are known approaches in mechanics that make it possible to represent mechanical systems with distributed parameters in the form of discrete systems with lumped parameters, such as a spring–mass–damper. In this article, it is proposed to model electromechanical systems with external electric circuits based on their electrical analogue in the form of equivalent electric substitution circuits, which are discrete electrical systems with lumped parameters. These discrete systems are analogues of the initial electromechanical systems in terms of frequency characteristics and the electrical processes that take place in them. The equivalent substitution circuit is based on the Van Dyke model and allows one to obtain the required number of complex eigenfrequencies of the electromechanical system under consideration.

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Lebedev, Ivan, Nikolay Savelov, and Sergey Basan. "A New Approach to the Formation of Test Mathematical Models of Complex Electrical Circuits." Известия высших учебных заведений. Электромеханика 64, no. 6 (2021): 5–11. http://dx.doi.org/10.17213/0136-3360-2021-6-5-11.

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When developing new methods for analyzing electrical circuits and comparing various already developed methods, one of the actual problems is the creation of tests for evaluating the effectiveness of algorithms. For such tests, it is advisable to use schemes of complex circuits. However, with an increase in the number of circuit elements, the development of a circuit diagram, preparation of initial data for mathematical modeling and vis-ual presentation of the circuit become more and more difficult. To solve these problems, it is proposed to use pre-ordered electrical circuits. An algorithm for the formation of mathematical models of circuits with an almost unlimited number of elements is proposed. Experiments on the formation and application of mathematical models of electrical circuits containing more than five hundred elements have been carried out. The generated mathematical models are used to evaluate a specific algorithm for analyzing electrical circuits.

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Curti, Sebastian, Federico Davoine, and Antonella Dapino. "Function and Plasticity of Electrical Synapses in the Mammalian Brain: Role of Non-Junctional Mechanisms." Biology 11, no. 1 (January 5, 2022): 81. http://dx.doi.org/10.3390/biology11010081.

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Electrical transmission between neurons is largely mediated by gap junctions. These junctions allow the direct flow of electric current between neurons, and in mammals, they are mostly composed of the protein connexin36. Circuits of electrically coupled neurons are widespread in these animals. Plus, experimental and theoretical evidence supports the notion that, beyond synchronicity, these circuits are able to perform sophisticated operations such as lateral excitation and inhibition, noise reduction, as well as the ability to selectively respond upon coincident excitatory inputs. Although once considered stereotyped and unmodifiable, we now know that electrical synapses are subject to modulation and, by reconfiguring neural circuits, these modulations can alter relevant operations. The strength of electrical synapses depends on the gap junction resistance, as well as on its functional interaction with the electrophysiological properties of coupled neurons. In particular, voltage and ligand gated channels of the non-synaptic membrane critically determine the efficacy of transmission at these contacts. Consistently, modulatory actions on these channels have been shown to represent relevant mechanisms of plasticity of electrical synaptic transmission. Here, we review recent evidence on the regulation of electrical synapses of mammals, the underlying molecular mechanisms, and the possible ways in which they affect circuit function.

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Kaczorek, Tadeusz. "Positive electrical circuits and their reachability." Archives of Electrical Engineering 60, no. 3 (September 1, 2011): 283–301. http://dx.doi.org/10.2478/v10171-011-0026-3.

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Positive electrical circuits and their reachabilityConditions for the positivity of linear electrical circuits composed of resistances, coils, capacitors and voltage (current) sources are established. It is shown that: 1) the electrical circuit composed of resistors, coils and voltage source is positive for any values of their resistances, inductances and source voltages if and only if the number of coils is less or equal to the number of its linearly independent meshes, 2) the electrical circuit is not positive for any values of its resistances, capacitances and source voltages if each its branch contains resistor, capacitor and voltage source, 3) the positiven-meshes electrical circuit with only one inductance in each linearly independent mesh is reachable if all resistances of branches belonging to two linearly independent meshes are zero.

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Modes, Christina, Melanie Bawohl, Jochen Langer, Jessica Reitz, Anja Eisert, Mark Challingsworth, Virginia Garcia, and Sarah Groman. "Thick Film Pastes for Power Applications." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2013, CICMT (September 1, 2013): 000155–61. http://dx.doi.org/10.4071/cicmt-wp24.

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Electronic circuits made by thick film technology are commonly used today in electronic circuitry for automotive applications. Densely packed multi-layer hybrid circuits are very well established for motor and transmission management in standard gasoline fuelled vehicles. As automotive technology shifts from mechanical systems to electrical systems and toward more electrically driven vehicles, such as hybrid electric vehicles and full electric vehicles, thick film systems need to be adapted to fit the challenges and needs of these new applications. The following is a description of a new set of thick film pastes, both precious and base metal, which have attributes and performance suitable for power electronics in automotive applications. The materials provide a means to use common thick film technology to build power circuits to meet the new needs, such as high current carrying capacity and thermal dissipation.

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BERKOVICH, YEFIM, ARIEH SHENKMAN, and SAAD TAPUCHI. "GENERALIZED ANALYSIS OF ELECTRICAL CIRCUITS BY USING HYPERNION MATRICES." Journal of Circuits, Systems and Computers 18, no. 07 (November 2009): 1205–25. http://dx.doi.org/10.1142/s0218126609005629.

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In this paper a novel method for circuit analysis is proposed. It is based on using symbolic analysis in matrix form, which is especially appropriate for repetitive similar calculations of the same circuit. This method, which applies hyper-complex numbers (hypernions), was first developed by the authors for analyzing the non-sinusoidal operation of electrical circuits. Now, the method has been extended to the analysis of electronic/switching circuits in which the sources and/or the parameters are step-wisely changed as a result of switching. Such circuits are common in different kinds of DC-DC converters (such as Buck, Boost, Cuk, etc.). The proposed method gives a new approach to the analysis of the above circuits by opening the possibility of treating them in a general-analytical form, just like in regular electrical circuits having a constant configuration and constant parameters. The computation of such kinds of circuits by using the proposed method becomes very simple, since the circuit does not have to be analyzed many times, each time for a different configuration, but all at once by performing a parallel computation. The theoretical presentation is accompanied by numerical examples.

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Dissertations / Theses on the topic "Electrical Circuits"

1

Senthinathan, Ramesh 1961. "ELECTRICAL CHARACTERISTICS OF INTEGRATED CIRCUIT PACKAGES." Thesis, The University of Arizona, 1987. http://hdl.handle.net/10150/276425.

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Madhyastha, Sadhana. "Design of circuit breakers for large area CMOS VLSI circuits." Thesis, McGill University, 1989. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=59551.

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Large-area ICs require adequate defect-tolerance to achieve a reasonable yield. One concern is that the power distribution network is shared by a number of modules, and any single short between the supply (V$ sb{dd}$) and ground can disable all these modules. The object of this thesis is to evaluate the feasibility of incorporating circuit breakers in large area ICs, which provide protection against such defects by disconnecting the defective modules from the array. A critical analysis and comparison of MOS transistors and parasitic bipolar transistors as circuit breakers are carried out. It is shown that MOS transistors offer a better and a more practical solution than their bipolar counterparts. Several rules applicable to a MOS circuit breaker in a bulk CMOS process are defined and discussed. These rules, if strictly adhered to, are predicted to result in a design which is defect-tolerant, latch-up free and optimal in size. The design of a large MOS transistor, based on the Manhattan style of "waffle-iron" design is described. Results of two test chips provide the experimental validation of this design. The peak instantaneous current through the modules has to be known in order to realize a circuit breaker of optimal size. A preliminary analysis of a possible technique to estimate the magnitude of this worst case peak current for a CMOS combinational block is carried out. Finally a short discussion on the defect sensitivity of the power switch is presented.

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Qazi, Masood. "Circuit design for embedded memory in low-power integrated circuits." Thesis, Massachusetts Institute of Technology, 2012. http://hdl.handle.net/1721.1/75645.

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Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2012.
Cataloged from PDF version of thesis.
Includes bibliographical references (p. 141-152).
This thesis explores the challenges for integrating embedded static random access memory (SRAM) and non-volatile memory-based on ferroelectric capacitor technology-into lowpower integrated circuits. First considered is the impact of process variation in deep-submicron technologies on SRAM, which must exhibit higher density and performance at increased levels of integration with every new semiconductor generation. Techniques to speed up the statistical analysis of physical memory designs by a factor of 100 to 10,000 relative to the conventional Monte Carlo Method are developed. The proposed methods build upon the Importance Sampling simulation algorithm and efficiently explore the sample space of transistor parameter fluctuation. Process variation in SRAM at low-voltage is further investigated experimentally with a 512kb 8T SRAM test chip in 45nm SOI CMOS technology. For active operation, an AC coupled sense amplifier and regenerative global bitline scheme are designed to operate at the limit of on current and off current separation on a single-ended SRAM bitline. The SRAM operates from 1.2 V down to 0.57 V with access times from 400ps to 3.4ns. For standby power, a data retention voltage sensor predicts the mismatch-limited minimum supply voltage without corrupting the contents of the memory. The leakage power of SRAM forces the chip designer to seek non-volatile memory in applications such as portable electronics that retain significant quantities of data over long durations. In this scenario, the energy cost of accessing data must be minimized. This thesis presents a ferroelectric random access memory (FRAM) prototype that addresses the challenges of sensing diminishingly small charge under conditions favorable to low access energy with a time-to-digital sensing scheme. The 1 Mb IT1C FRAM fabricated in 130 nm CMOS operates from 1.5 V to 1.0 V with corresponding access energy from 19.2 pJ to 9.8 pJ per bit. Finally, the computational state of sequential elements interspersed in CMOS logic, also restricts the ability to power gate. To enable simple and fast turn-on, ferroelectric capacitors are integrated into the design of a standard cell register, whose non-volatile operation is made compatible with the digital design flow. A test-case circuit containing ferroelectric registers exhibits non-volatile operation and consumes less than 1.3 pJ per bit of state information and less than 10 clock cycles to save or restore with no minimum standby power requirement in-between active periods.
by Masood Qazi.
Ph.D.

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Kapur, Kishen Narain. "Mechanical and electrical characterization of IC leads during fatigue cycling." Diss., Online access via UMI:, 2009.

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Thesis (Ph. D.)--State University of New York at Binghamton, Thomas J. Watson School of Engineering and Applied Science, Department of Electrical and Computer Engineering, 2009.
Includes bibliographical references.

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Ghazizadeh, Ali. "Optimum mounting of electronic circuit boards for components and circuits survivability." Thesis, University of Ottawa (Canada), 1994. http://hdl.handle.net/10393/6936.

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Electronic circuit boards are employed in demanding environments (e.g. satellite, aerospace, marine, automobile, etc.) where the board and mounted components are exposed to vibration of varying amplitude and frequencies. Optimum mounting and component placement to reduce the effect of vibration on the equipment may prolong the service life of the system and reduce costly down time. Electronic boards are often mounted on four rigid support legs. Their vibration is a function of the location of the support legs, and board physical specifications such as length, width, weight, and placement of the components mounted on them. In this study, plate vibration analysis is employed to find the board's free vibration. With the help of nonlinear optimization methods, optimum mounting of circuit boards are investigated. Square board has a better performance than any other board shape. A table of suitable support points will be introduced outlining optimum support points for eight rectangular shapes. For each of these shapes a graph of unsuitable regions is provided to help the designer to avoid placing delicate components over those regions of the plate. Furthermore, the tabulated results can eliminate the need for optimization in non-critical circuit boards or determine a good starting point for optimization. (Abstract shortened by UMI.)

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Bakir, Muhannad S. "Sea of Leads electrical-optical polymer pillar chip I/O interconnections for gigascale integration." Diss., Available online, Georgia Institute of Technology, 2004:, 2003. http://etd.gatech.edu/theses/available/etd-04082004-180010/unrestricted/bakir%5Fmuhannad%5Fs%5F200312%5Fphd.pdf.

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Yazghi, Najlae. "Interactive E-learning and Problem for Electrical Circuits." Honors in the Major Thesis, University of Central Florida, 2006. http://digital.library.ucf.edu/cdm/ref/collection/ETH/id/1015.

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This item is only available in print in the UCF Libraries. If this is your Honors Thesis, you can help us make it available online for use by researchers around the world by following the instructions on the distribution consent form at http://library.ucf.edu/Systems/DigitalInitiatives/DigitalCollections/InternetDistributionConsentAgreementForm.pdf You may also contact the project coordinator, Kerri Bottorff, at kerri.bottorff@ucf.edu for more information.
Bachelors
Engineering and Computer Science
Electrical Engineering

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Tronko, V. D., M. O. Chuzha, В. Д. Тронько, and М. О. Чужа. "Measuring current in electrical circuits using a polarimeter." Thesis, National aviation university, 2021. https://er.nau.edu.ua/handle/NAU/50502.

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In the presented work, an optical device for measuring current is proposed. It consists of a polarimeter, indicator and input device. Its work is based on the functional dependence of changes in the parameters of polarized light in the polarimeter from the current values that are being measured. The proposed current meter allows to reduce the dimensions and weight of the structure, as well as to increase the measurement accuracy.
В представленій роботі запропоновано оптичний пристрій для вимірювання струму. Він складається з поляриметра, індикатора та вхідного пристрою. В основу його роботи покладено функціональна залежність зміни параметрів поляризованого світла в поляриметрі від значень струму, що вимірюються. Запропонований вимірювач струму дає можливість зменшити габарити та масу конструкції, а також підвищити точність вимірювань.

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Soong, Chia-Wei. "ELECTRICAL CHARACTERIZATION OF SiC JFET-BASED INTEGRATED CIRCUITS." Case Western Reserve University School of Graduate Studies / OhioLINK, 2014. http://rave.ohiolink.edu/etdc/view?acc_num=case1386674317.

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Wong, Calvin J. H. "Neural circuits controlling electrical communication in gymnotiform fish /." Diss., Connect to a 24 p. preview or request complete full text in PDF format. Access restricted to UC campuses, 1997. http://wwwlib.umi.com/cr/ucsd/fullcit?p9735272.

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Books on the topic "Electrical Circuits"

1

Infinite electrical networks. Cambridge: Cambridge University Press, 1991.

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Morgan, Sally. Electricity and electrical circuits. Chicago, Ill: Heinemann Library, 2008.

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Electrical circuits and currents. Chicago, Ill: Raintree, 2008.

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Electrical circuits and currents. Oxford: Heinemann Library, 2008.

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Electricity and electrical circuits. Oxford: Heinemann Library, 2008.

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What are electrical circuits? New York: Crabtree Pub., 2012.

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Computer circuits electrical design. Englewood Cliffs, N.J: Prentice Hall, 1995.

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E, Alley R., ed. Electrical circuits: An introduction. Cambridge [England]: Cambridge University Press, 1992.

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Lynette, Rachel. Electrical experiments: Electricity and circuits. Chicago, Ill: Heinemann Library, 2008.

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Keskin, Ali Ümit. Electrical Circuits in Biomedical Engineering. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-55101-2.

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Book chapters on the topic "Electrical Circuits"

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Dugdale, David. "Electrical circuits." In Essentials of electromagnetism, 210–30. London: Macmillan Education UK, 1993. http://dx.doi.org/10.1007/978-1-349-22780-8_9.

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Eriksson, Kenneth, Donald Estep, and Claes Johnson. "Electrical Circuits*." In Applied Mathematics: Body and Soul, 729–33. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-05798-8_24.

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Iffländer, Reinhard. "Electrical Circuits." In Springer Series in Optical Sciences, 199–208. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-540-46585-0_8.

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Warnes, Lionel. "Electrical circuits." In Analogue and Digital Electronics, 1–49. London: Macmillan Education UK, 1998. http://dx.doi.org/10.1007/978-1-349-14037-4_1.

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Keighley, John, and Stephen Doyle. "Electrical circuits." In Physics GCSE, 132–46. London: Macmillan Education UK, 1998. http://dx.doi.org/10.1007/978-1-349-14325-2_12.

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Günther, Michael. "Electrical Circuits." In Encyclopedia of Applied and Computational Mathematics, 411–17. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-540-70529-1_110.

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Polzin, Kurt A., Ashley K. Hallock, Kamesh Sankaran, and Justin M. Little. "Electrical Circuits." In Circuit Modeling of Inductively-Coupled Pulsed Accelerators, 17–36. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9780429351976-3.

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Keighley, John. "Electrical Circuits." In Work Out Physics GCSE, 111–25. London: Macmillan Education UK, 1990. http://dx.doi.org/10.1007/978-1-349-11839-7_10.

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Bermúdez, Alfredo, Dolores Gómez, and Pilar Salgado. "Linear electrical circuits." In UNITEXT, 33–49. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-02949-8_3.

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N. Makarov, Sergey, Reinhold Ludwig, and Stephen J. Bitar. "Switching Circuits." In Practical Electrical Engineering, 641–88. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-21173-2_13.

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Conference papers on the topic "Electrical Circuits"

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Budko, А. А., and L. A. Khvostchinskaya. "THE APPLICATION OF COMPLEX NUMBERS IN ELECTRICAL CIRCUIT CALCULATION." In SAKHAROV READINGS 2021: ENVIRONMENTAL PROBLEMS OF THE XXI CENTURY. International Sakharov Environmental Institute, 2021. http://dx.doi.org/10.46646/sakh-2021-1-108-110.

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In this article, one of the methods for calculating alternating electric current circuits is considered. The method is based on the use of complex forms of records of sinusoidal current and circuit resistances. Examples of calculating electrical circuits using complex numbers are given.

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Silva, Tarcísio M. P., Vagner Candido de Sousa, Marcel A. Clementino, and Carlos De Marqui. "Novel Equivalent Electrical Circuits for Linear and Nonlinear Electromechanically Coupled Systems." In ASME 2017 Conference on Smart Materials, Adaptive Structures and Intelligent Systems. American Society of Mechanical Engineers, 2017. http://dx.doi.org/10.1115/smasis2017-3914.

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In the last years, researchers have presented concentrated and distributed parameter models of electromechanically coupled systems, leading to appropriate estimation of their electroelastic behavior. Equivalent electrical circuits have also been investigated and provide useful simulation tools to investigate the system behavior as well as to developed new energy harvesting or control circuits. In general, RLC (resistor, inductor and capacitor) circuits represent, respectively, the mass, damping and stiffness of single or multi-degree-of-freedom electromechanically coupled systems. In practice, however, the equivalent electrical representation of high-quality-factor systems demand equivalent circuits with extremely low internal resistance values. Furthermore, the assumption of an ideal transformer cannot be obtained in practice. This work presents a novel equivalent electrical circuit for linear and nonlinear electromechanically coupled systems. The effects of inductance, capacitance and electromechanical coupling are represented through operational-amplifier based sub-circuits of extremely low internal resistance. First, the linear behavior of a mass-spring-damping system is verified. Later, the behavior of a nonlinear electromechanically coupled system is investigated. In both cases, numerical results (Matlab-Simulink simulations) and experimental results (from breadboard implementations) will be verified against experimental results presented in the literature.

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Kaczorek, Tadeusz. "Positive fractional linear electrical circuits." In Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2013, edited by Ryszard S. Romaniuk. SPIE, 2013. http://dx.doi.org/10.1117/12.2034370.

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Dorai, Arvind, Kumaraswamy Ponnambalam, and Arnold W. Heemink. "Yield optimization of electrical circuits." In 2009 3rd International Conference on Signals, Circuits and Systems (SCS 2009). IEEE, 2009. http://dx.doi.org/10.1109/icscs.2009.5412285.

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Woodard, Stanley E., Qamar A. Shams, Donald M. Oglesby, and Bryant D. Taylor. "Chemical detection using electrically open circuits having no electrical connections." In 2008 IEEE Sensors. IEEE, 2008. http://dx.doi.org/10.1109/icsens.2008.4716370.

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Sun, Jiashu, Saumitra K. Vajandar, Dongyan Xu, Yuejun Kang, Dongqing Li, Deyu Li, and Guoqing Hu. "Electrical Leakage Through Thin PDMS Microchannel Walls and its Applications." In ASME 2008 International Mechanical Engineering Congress and Exposition. ASMEDC, 2008. http://dx.doi.org/10.1115/imece2008-68079.

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PDMS is usually considered as a dielectric material and PDMS microchannel walls can be treated as an electrically insulated boundary. However, in certain layouts of microfluidic networks, electrical leakage through PDMS walls could significantly alter the electrical field in the microfluidic circuits, which must be carefully considered in microfluidic circuit design. We report on our experimental characterization of electrical leakage through PDMS microfluidic channel walls. Numerical modeling clearly disclosed the alteration of electrical field and electroosmotic velocity in the microfluidic channels because of the electrical leakage through the thin PDMS wall. In addition, we demonstrate that the electrical leakage through the PDMS channel wall can be used to realize trapping of individual particles at different locations inside the mcirofluidic channel by balancing the electroosmotic flow and electrophoretic migration of the particle.

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Tzou, H. S., and J. H. Ding. "Equivalent Active Circuits of Distributed Control Systems." In ASME 2000 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2000. http://dx.doi.org/10.1115/imece2000-1782.

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Abstract Modeling distributed parameter systems (DPS) by electronic circuits and fabricating the complicated equivalent circuits to evaluate the system characteristics always poses many challenging research issues for years. Modeling and analysis of distributed sensing/control of smart structures and distributed structronic systems are even scarce. This paper is to present a technique to model distributed structronic systems with electronic circuits and to evaluate control behaviors with the fabricated equivalent circuits. Electrical analogies and analysis of distributed structronic systems is proposed and dynamics and control of beam/sensor/actuator systems are investigated. To determine the equivalent circuits and system parameters, higher order partial derivatives are simplified using the finite difference method; partial differential equations (PDE) are transformed to finite difference equations and further represented by electronic components and circuits. To provide better signal management and stability, active electronic circuit systems are designed and fabricated. Electric signals from the distributed system circuits (i.e., soft and hard) are compared with results obtained by classical theoretical and other (e.g., the finite element, and experimental) techniques.

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Paulu, Filip, and Jiri Hospodka. "GEEC: Graphic editor of electrical circuits." In 2017 International Conference on Applied Electronics (AE). IEEE, 2017. http://dx.doi.org/10.23919/ae.2017.8053604.

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Bertini, G. J. "Diagnostic testing of stochastic circuits." In 2007 Electrical Insulation Conference and Electrical Manufacturing Expo (EIC/EME). IEEE, 2007. http://dx.doi.org/10.1109/eeic.2007.4562585.

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Petrov, Nikolay, Kremena Dimitrova, and Svilen Ratchev. "Determination of the Optimal Circuit-Engineering Solution of Electronic Circuits." In 2020 21st International Symposium on Electrical Apparatus & Technologies (SIELA). IEEE, 2020. http://dx.doi.org/10.1109/siela49118.2020.9167135.

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Reports on the topic "Electrical Circuits"

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Shoemaker, Jordan. Damage Detection and Electrical Performance Impact of Flat-Flexible Circuits. Office of Scientific and Technical Information (OSTI), May 2022. http://dx.doi.org/10.2172/1870617.

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Weinschenk, Craig, Daniel Madrzykowski, and Paul Courtney. Impact of Flashover Fire Conditions on Exposed Energized Electrical Cords and Cables. UL Firefighter Safety Research Institute, October 2019. http://dx.doi.org/10.54206/102376/hdmn5904.

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A set of experiments was conducted to expose different types of energized electrical cords for lamps, office equipment, and appliances to a developing room fire exposure. All of the cords were positioned on the floor and arranged in a manner to receive a similar thermal exposure. Six types of cords commonly used as power supply cords, extension cords, and as part of residential electrical wiring systems were chosen for the experiments. The non-metallic sheathed cables (NMB) typically found in residential electrical branch wiring were included to provide a link to previous research. The basic test design was to expose the six different types of cords, on the floor of a compartment to a growing fire to determine the conditions under which the cord would trip the circuit breaker and/or undergo an arc fault. All of the cords would be energized and installed on a non-combustible surface. Six cord types (18-2 SPT1, 16-3 SJTW, 12-2 NM-B, 12-3 NM-B, 18-3 SVT, 18-2 NISPT-2) and three types of circuit protection (Molded case circuit breaker (MCCB), combination Arc-fault circuit interrupter (AFCI), Ground-fault circuit interrupter (GFCI)) were exposed to six room-scale fires. The circuit protection was remote from the thermal exposure. The six room fires consisted of three replicate fires with two sofas as the main fuel source, two replicate fires with one sofa as the main fuel source and one fire with two sofas and MDF paneling on three walls in the room. Each fuel package was sufficient to support flashover conditions in the room and as a result, the impact on the cords and circuit protection was not significantly different. The average peak heat release rate of the sofa fueled compartment fires with gypsum board ceiling and walls was 6.8 MW. The addition of vinyl covered MDF wall paneling on three of the compartment walls increased the peak heat release rate to 12 MW, although most of the increased energy release occurred outside of the compartment opening. In each experiment during post flashover exposure, the insulation on the cords ignited and burned through, exposing bare conductor. During this period the circuits faulted. The circuit protection devices are not designed to provide thermal protection, and, thus, were installed remote from the fire. The devices operated as designed in all experiments. All of the circuit faults resulted in either a magnetic trip of the conventional circuit breaker or a ground-fault trip in the GFCI or AFCI capable circuit protection devices. Though not required by UL 1699, Standard for Safety for Arc-Fault Circuit-Interrupters as the solution for detection methodology, the AFCIs used had differential current detection. Examination of signal data showed that the only cord types that tripped with a fault to ground were the insulated conductors in non-metallic sheathed cables (12-2 NM-B and 12-3 NM-B). This was expected due to the bare grounding conductor present. Assessments of both the thermal exposure and physical damage to the cords did not reveal any correlation between the thermal exposure, cord damage, and trip type.

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Akin, Meriem B., and Ana C. Arias. A Comprehensive Surface Mount Technology Solution for Integrated Circuits onto Flexible Screen Printed Electrical Interconnects. Fort Belvoir, VA: Defense Technical Information Center, May 2014. http://dx.doi.org/10.21236/ada602487.

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Rourk, C. J. Regulatory Analysis for the resolution of Generic Issue 142: Leakage through electrical isolators in instrumentation circuits. Office of Scientific and Technical Information (OSTI), September 1993. http://dx.doi.org/10.2172/10187197.

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Kiv, Arnold E., Vladyslav V. Bilous, Dmytro M. Bodnenko, Dmytro V. Horbatovskyi, Oksana S. Lytvyn, and Volodymyr V. Proshkin. The development and use of mobile app AR Physics in physics teaching at the university. [б. в.], July 2021. http://dx.doi.org/10.31812/123456789/4629.

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This paper outlines the importance of using Augmented Reality (AR) in physics education at the university as a valuable tool for visualization and increasing the attention and motivation of students to study, solving educational problems related to future professional activities, improving the interaction of teachers and students. Provided an analysis of the types of AR technology and software for developing AR apps. The sequences of actions for developing the mobile application AR Physics in the study of topics: “Direct electronic current”, “Fundamentals of the theory of electronic circuits”. The software tools for mobile application development (Android Studio, SDK, NDK, Google Sceneform, 3Ds MAX, Core Animation, Asset Media Recorder, Ashampoo Music Studio, Google Translate Plugin) are described. The bank of 3D models of elements of electrical circuits (sources of current, consumers, measuring devices, conductors) is created. Because of the students’ and teachers’ surveys, the advantages and disadvantages of using AR in the teaching process are discussed. Mann-Whitney U-test proved the effectiveness of the use of AR for laboratory works in physics by students majoring in “Mathematics”, “Computer Science”, and “Cybersecurity”.

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Heimlich, Michael, Karu Esselle, and L. Matekovits. 2D Electrically Tuneable EBG Integrated Circuits. Fort Belvoir, VA: Defense Technical Information Center, April 2014. http://dx.doi.org/10.21236/ada605325.

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Sedykh, P. A. Global Electric Circuit: Solar Wind, Magnetosphere, Ionosphere, Atmosphere. Balkan, Black sea and Caspian sea Regional Network for Space Weather Studies, October 2019. http://dx.doi.org/10.31401/sungeo.2019.01.09.

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BRAITHWAITE, JEFFREY W., NEIL R. SORENSEN, DAVID G. ROBINSON, KEN S. CHEN, and CAROLYN W. BOGDAN. A Modeling Approach for Predicting the Effect of Corrosion on Electrical-Circuit Reliability. Office of Scientific and Technical Information (OSTI), February 2003. http://dx.doi.org/10.2172/809100.

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Bernal Heredia, Willy, Dylan Cutler, and Jesse Dean. Case Study: Field Evaluation of a Low-Cost Circuit-Level Electrical Submetering System. Office of Scientific and Technical Information (OSTI), January 2021. http://dx.doi.org/10.2172/1762442.

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Cutler, Dylan S., Willy G. Bernal Heredia, and Jesse D. Dean. Case Study: Laboratory and Field Evaluation of Circuit-Level Electrical Submetering with Wireless Current Transformers. Office of Scientific and Technical Information (OSTI), June 2019. http://dx.doi.org/10.2172/1530174.

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