Academic literature on the topic 'Electrical measurements C-V and G-V'
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Journal articles on the topic "Electrical measurements C-V and G-V"
Özden, Şadan, Ömer Güllü, and Osman Pakma. "Room temperature I–V and C–V characteristics of Au/mTPP/p-Si organic MIS devices." European Physical Journal Applied Physics 82, no. 2 (2018): 20101. http://dx.doi.org/10.1051/epjap/2018180004.
Full textPadma, R., and V. Rajagopal Reddy. "Electrical properties and the determination of interface state density from I-V, C-f and G-f measurements in Ir/Ru/n-InGaN Schottky barrier diode." Физика и техника полупроводников 51, no. 12 (2017): 1698. http://dx.doi.org/10.21883/ftp.2017.12.45189.8340.
Full textFaraz, Sadia Muniza, Wakeel Shah, Naveed Ul Hassan Alvi, Omer Nur, and Qamar Ul Wahab. "Electrical Characterization of Si/ZnO Nanorod PN Heterojunction Diode." Advances in Condensed Matter Physics 2020 (April 13, 2020): 1–9. http://dx.doi.org/10.1155/2020/6410573.
Full textAltındal, Şemsettin, Ali Barkhordari, Gholamreza Pirgholi-Givi, et al. "Comparison of the electrical and impedance properties of Au/(ZnOMn:PVP)/n-Si (MPS) type Schottky-diodes (SDs) before and after gamma-irradiation." Physica Scripta 96, no. 12 (2021): 125881. http://dx.doi.org/10.1088/1402-4896/ac43d7.
Full textPadovani, Andrea, Ben Kaczer, Milan Pesic, et al. "A Sensitivity Map-Based Approach to Profile Defects in MIM Capacitors From ${I}$ – ${V}$ , ${C}$ – ${V}$ , and ${G}$ – ${V}$ Measurements." IEEE Transactions on Electron Devices 66, no. 4 (2019): 1892–98. http://dx.doi.org/10.1109/ted.2019.2900030.
Full textKoliakoudakis, C., J. Dontas, S. Karakalos, et al. "Fabrication and Characterization of Cr-Based Schottky Diode on n-Type 4H-SiC." Materials Science Forum 615-617 (March 2009): 651–54. http://dx.doi.org/10.4028/www.scientific.net/msf.615-617.651.
Full textPananakakis, G., and G. Kamarinos. "Complete determination of the electrical interfacial parameters in Al-SiO2 (30 Å)-Si tunnel diodes using I–V, C–V, G–V measurements." Surface Science Letters 168, no. 1-3 (1986): A137. http://dx.doi.org/10.1016/0167-2584(86)90487-1.
Full textPananakakis, G., and G. Kamarinos. "Complete determination of the electrical interfacial parameters in Al-SiO2 (30 Å)-Si tunnel diodes using I–V, C–V, G–V measurements." Surface Science 168, no. 1-3 (1986): 657–64. http://dx.doi.org/10.1016/0039-6028(86)90897-6.
Full textAfandiyeva, İ. M., İ. Dökme, Ş. Altındal, L. K. Abdullayeva та Sh G. Askerov. "The frequency and voltage dependent electrical characteristics of Al–TiW–Pd2Si/n-Si structure using I–V, C–V and G/ω–V measurements". Microelectronic Engineering 85, № 2 (2008): 365–70. http://dx.doi.org/10.1016/j.mee.2007.07.010.
Full textGiannazzo, Filippo, Stefan Hertel, Andreas Albert, et al. "Electrical Nanocharacterization of Epitaxial Graphene/Silicon Carbide Schottky Contacts." Materials Science Forum 778-780 (February 2014): 1142–45. http://dx.doi.org/10.4028/www.scientific.net/msf.778-780.1142.
Full textDissertations / Theses on the topic "Electrical measurements C-V and G-V"
Mohamad, Blend. "Electrical characterization of fully depleted SOI devices based on C-V measurements." Thesis, Université Grenoble Alpes (ComUE), 2017. http://www.theses.fr/2017GREAT001/document.
Full textBeji, Hiba. "Étude de la nitruration de surface de silicium par plasma N2 et de son impact sur l'interface avec une couche antireflet de type SiN(O)." Electronic Thesis or Diss., Université Clermont Auvergne (2021-...), 2024. http://www.theses.fr/2024UCFA0037.
Full textDřímalková, Lucie. "Elektrické charakteristiky diafragmového výboje v roztocích elektrolytů." Master's thesis, Vysoké učení technické v Brně. Fakulta chemická, 2011. http://www.nusl.cz/ntk/nusl-216707.
Full textHaratek, Jiří. "Výpočet rozložení teplotního pole v elektrickém stroji." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2017. http://www.nusl.cz/ntk/nusl-318865.
Full textHorák, Luděk. "Analýza elektrických vlastností epoxidových pryskyřic s různými plnivy v teplotní a kmitočtové závislosti." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2018. http://www.nusl.cz/ntk/nusl-376991.
Full textMittner, Ondřej. "Určování velikosti plochy a rozměrů vybraných objektů v obraze." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2010. http://www.nusl.cz/ntk/nusl-218637.
Full textKolacia, Tomáš. "Měření elektrických veličin v distribučních sítích 22 kV a 0,4 kV s disperzními zdroji." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2015. http://www.nusl.cz/ntk/nusl-221196.
Full textSpradlin, Joshua K. "A Study on the Nature of Anomalous Current Conduction in Gallium Nitride." VCU Scholars Compass, 2005. http://scholarscompass.vcu.edu/etd/709.
Full textHalfar, Lukáš. "Automatizované měření asynchronního motoru pomocí LabVIEW." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2016. http://www.nusl.cz/ntk/nusl-242151.
Full textDřímalková, Lucie. "Diagnostika diafragmového výboje ve vodných roztocích a jeho aplikace pro povrchovou úpravu nanomateriálů." Doctoral thesis, Vysoké učení technické v Brně. Fakulta chemická, 2019. http://www.nusl.cz/ntk/nusl-402110.
Full textBooks on the topic "Electrical measurements C-V and G-V"
Mezent͡sev, A. N. (Andreĭ Nikolaevich), ed. Ėlektrorazvedka v poli͡arizui͡ushchikhsi͡a sredakh. UrO AN SSSR, 1989.
Find full textZimin, E. F. Izmerenie parametrov ėlektricheskikh i magnitnykh poleĭ v provodi͡a︡shchikh sredakh. Ėnergoatomizdat, 1985.
Find full textNauchno-prakticheskai︠a︡ konferent︠s︡ii︠a︡ Metrologii︠a︡ ėlektricheskikh izmereniĭ v ėlektroėnergetike (10th 2007 Moscow, Russia). Metrologii︠a︡ ėlektricheskikh izmereniĭ v ėlektroėnergetike: Doklady seminara, normativno-pravovai︠a︡ baza metrologii, informat︠s︡ii︠a︡ o kompanii︠a︡kh. DialogĖlektro, 2007.
Find full textSegalʹ, A. M. Poverkhnostnyĭ ėffekt v tokoprovodakh i ėlementakh ėlektricheskikh apparatov. Ėnergoatomizdat, Sankt-Peterburgskoe otd-nie, 1992.
Find full textProtasevich, E. T. Novye i︠a︡vlenii︠a︡ v fizike gazovogo razri︠a︡da i radiofizike. Izd-vo Tomsk. politekhn. universiteta, 2002.
Find full textUniversity, Tomsk Polytechnic, ed. Novye i︠a︡vlenii︠a︡ v fizike gazovogo razri︠a︡da i radiofizike. Izd-vo Tomsk. politekhn. universiteta, 2002.
Find full textSobolev, Valentin Viktorovich. Metody vychislitelʹnoĭ fiziki v teorii tverdogo tela: Ėlektronnai͡a︡ struktura poluprovodnikov. Nauk. dumka, 1988.
Find full textSobolev, Valentin Viktorovich. Metody vychislitelʹnoĭ fiziki v teorii tverdogo tela: Ėlektronnai͡a︡ struktura dikhalʹkogenidov redkikh metallov. Nauk. dumka, 1990.
Find full textVLSI and Post-CMOS Electronics: Devices, Circuits and Interconnects. Institution of Engineering & Technology, 2019.
Find full textDhiman, Rohit, and Rajeevan Chandel. VLSI and Post-CMOS Electronics: Devices, Circuits and Interconnects, Volume 2. Institution of Engineering & Technology, 2019.
Find full textBook chapters on the topic "Electrical measurements C-V and G-V"
Azarov, Alexander, Anders Hallén, and Henry H. Radamson. "Electrical Characterization of Semiconductors: I–V, C–V and Hall Measurements." In Analytical Methods and Instruments for Micro- and Nanomaterials. Springer International Publishing, 2023. http://dx.doi.org/10.1007/978-3-031-26434-4_7.
Full textDavies, Richard J., Mary K. Brumfield, and Maribeth Pierce. "Noninvasive Measurement of the Electrical Properties of Breast Epithelium During the Menstrual Cycle: A Potential Biomarker for Breast Cancer Risk." In Hormonal Carcinogenesis V. Springer New York, 2008. http://dx.doi.org/10.1007/978-0-387-69080-3_27.
Full textRen, Bingyan, Bei Guo, Yan Zhang, Bing Zhang, Hongyuan Li, and Xudong Li. "Electrical Characterization and Measurements of Sin Thin Films On Crystalline Silicon Substrates By Pecvd." In Proceedings of ISES World Congress 2007 (Vol. I – Vol. V). Springer Berlin Heidelberg, 2008. http://dx.doi.org/10.1007/978-3-540-75997-3_231.
Full textSrivastava, Ajay Kumar. "Analysis and TCAD Simulation for C/V, and G/V Electrical Characteristics of Gated Controlled Diodes for the AGIPD of the EuXFEL." In Si Detectors and Characterization for HEP and Photon Science Experiment. Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-19531-1_10.
Full textPiotto, M., A. N. Longhitano, P. Bruschi, M. Buiat, G. Sacchi, and D. Stanzial. "Design and Fabrication of a Compact p–v Probe for Acoustic Impedance Measurement." In Lecture Notes in Electrical Engineering. Springer International Publishing, 2013. http://dx.doi.org/10.1007/978-3-319-00684-0_10.
Full textWang, Jun, Hua Zhang, and Zhulong Yan. "Research and Analysis of the Green Vision Rate of Street Space Based on Information Visualization Technology." In Lecture Notes in Electrical Engineering. Springer Nature Singapore, 2025. https://doi.org/10.1007/978-981-96-2409-6_26.
Full textWatcharinporn, Orrathai, Surachai Dechkunakorn, Niwat Anuwongnukroh, et al. "Assessment of the Accuracy and Reliability of Cephsmile v.2 in Cephalograms and Model Measurements." In Lecture Notes in Electrical Engineering. Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-27323-0_52.
Full textGhivela, Girish Chandra, Prince Kumar, and Joydeep Sengupta. "Numerical Measurement of Oscillating Parameters of IMPATT Using Group IV and Group III–V Materials." In Lecture Notes in Electrical Engineering. Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-32-9775-3_37.
Full textStanzial, D., M. Buiat, G. Sacchi, P. Bruschi, and M. Piotto. "Functional Comparison of Acoustic Admittance Measurements with a CMOS-Compatible p–v Microprobe and a Reference One." In Lecture Notes in Electrical Engineering. Springer International Publishing, 2013. http://dx.doi.org/10.1007/978-3-319-00684-0_11.
Full textOnnes, H. Kamerlingh. "Further Experiments with Liquid Helium. D. On the Change of the Electrical Resistance of Pure Metals at very low Temperatures, etc. V. The Disappearance of the resistance of mercury." In Through Measurement to Knowledge. Springer Netherlands, 1991. http://dx.doi.org/10.1007/978-94-009-2079-8_16.
Full textConference papers on the topic "Electrical measurements C-V and G-V"
Brenna, Andrea, Luciano Lazzari, and Marco Ormellese. "Effects of Intermittent DC Stray Current on Carbon Steel under Cathodic Protection." In CORROSION 2015. NACE International, 2015. https://doi.org/10.5006/c2015-05721.
Full textTominaga, Yoriko, Fumitaro Ishikawa, Noriaki Ikenaga, and Osamu Ueda. "Low-temperature-grown dilute bismide III-V compound semiconductors towards fabrication of photoconductive antenna for terahertz-wave emission and detection." In JSAP-Optica Joint Symposia. Optica Publishing Group, 2024. https://doi.org/10.1364/jsapo.2024.18p_b2_10.
Full textLiang, Yi, Yanxia Du, Xun Yuan, and Le Chen. "Case Study of AC-Induced Corrosion on Buried Pipeline: Field Test and Mitigation Design." In CORROSION 2021. AMPP, 2021. https://doi.org/10.5006/c2021-16374.
Full textAcevedo, Paola Daza, Guy Dos Santos, Antoine Lefebvre, and Sylvain Fontaine. "Level Reduction of Induced AC Interferences on a Gas Pipeline by Permutation of «phases» of the HVAC Power Line." In CONFERENCE 2025. AMPP, 2025. https://doi.org/10.5006/c2025-00381.
Full textHauser, J. R., and K. Ahmed. "Characterization of ultra-thin oxides using electrical C-V and I-V measurements." In CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY. ASCE, 1998. http://dx.doi.org/10.1063/1.56801.
Full textRichardson, W. H., and Y. Yamamoto. "Quantum Correlation Between the Junction Voltage Fluctuation and the Photon Number Fluctuation in a Semiconductor Laser." In OSA Annual Meeting. Optica Publishing Group, 1990. http://dx.doi.org/10.1364/oam.1990.pdp15.
Full textLai, LiLung, Nan Li, Qi Zhang, Tim Bao, and Robert Newton. "Nanoprobing Applications with Capacitance-Voltage and Pulsed Current-Voltage Measurements for Device Failure Analysis." In ISTFA 2015. ASM International, 2015. http://dx.doi.org/10.31399/asm.cp.istfa2015p0401.
Full textIyer, D., A. Messinger, R. Crowder, et al. "Measurement of Dielectric Constant and Doping Concentration of a Cross-Sectioned Device by Quantitative Scanning Microwave Impedance Microscopy." In ISTFA 2017. ASM International, 2017. http://dx.doi.org/10.31399/asm.cp.istfa2017p0613.
Full textBaviere, R., and F. Ayela. "First Local Pressure Drops Measurements in Microchannels With Integrated Micromachined Strain Gauges." In ASME 2004 2nd International Conference on Microchannels and Minichannels. ASMEDC, 2004. http://dx.doi.org/10.1115/icmm2004-2406.
Full textCroitoru, N., M. Zafrir, S. Amirhaghi, and Z. Harzion. "Schottky-type photovoltaic junctions with transparent conductor films." In OSA Annual Meeting. Optica Publishing Group, 1985. http://dx.doi.org/10.1364/oam.1985.fr6.
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