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Academic literature on the topic 'Electrical properties of porous silicon'
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Dissertations / Theses on the topic "Electrical properties of porous silicon"
Ünal, Bayram. "Optical, electrical and structural properties of nanostructured silicon and silicon-germanium alloys." Thesis, De Montfort University, 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.391480.
Full textGreen, Stephen. "Effect of oxygen and hydrogen on the optical and electrical characteristics of porous silicon : towards sensor applications." Thesis, London South Bank University, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.299908.
Full textMenard, Samuel. "Périphérie triac à base de silicum poreux." Thesis, Tours, 2014. http://www.theses.fr/2014TOUR4022/document.
Full textToquet, Fabien. "Study of the combined roles of the Silica/Oil/UHMWPE formulation and process parameters on morphological and electrical properties of battery Separators." Thesis, Lyon, 2017. http://www.theses.fr/2017LYSE1014/document.
Full textChang, Wai-Kit. "Porous silicon surface passivation and optical properties." Thesis, Massachusetts Institute of Technology, 1996. http://hdl.handle.net/1721.1/41426.
Full textTsuboi, Takashi. "Structure and Properties of Porous Silicon Surface." Kyoto University, 1999. http://hdl.handle.net/2433/181681.
Full textNgan, Mei Lun. "Photoluminescence excitation of porous silicon." HKBU Institutional Repository, 1998. http://repository.hkbu.edu.hk/etd_ra/139.
Full textAndrews, Gordon Todd. "Elastic and structural properties of supported porous silicon layers." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1999. http://www.collectionscanada.ca/obj/s4/f2/dsk1/tape9/PQDD_0004/NQ42470.pdf.
Full textRiley, David Washington. "Porous silicon thin films : a study of their optical properties and growth mechanism." Thesis, Georgia Institute of Technology, 1998. http://hdl.handle.net/1853/19627.
Full textBurr, Tracey Alexandra 1967. "Electrical properties of silicon surfaces and interfaces." Thesis, Massachusetts Institute of Technology, 1998. http://hdl.handle.net/1721.1/9689.
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