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Journal articles on the topic 'Electrões de Auger'

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Published: 4 June 2021

Last updated: 1 February 2022

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1

Thurgate, S. M. "Auger Spectroscopy and Surface Analysis." Australian Journal of Physics 50, no. 4 (1997): 745. http://dx.doi.org/10.1071/p96075.

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Abstract In 1925 Pierre Auger reported on his observations of low energy electrons associated with core-ionised atoms in cloud chamber experiments. He was able to correctly identify the mechanism for their production, and such electrons are now known as Auger electrons. Typically Auger electrons have energies in the range 10 eV to 2 keV. The short distance that such low energy electrons travel in solids ensures that Auger electrons come from the surface layers. The data generated by the AES technique are complex. There are at least three electrons involved in the process, and there are many po

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2

ABDEL-RAOUF, M. A., S. Y. EL-BAKRY, and M. Y. EL-BAKRY. "TRIALS TO IMPROVE THE CONTINUUM WAVEFUNCTIONS OF AUGER ELECTRONS EMITTED FROM ALUMINIUM AND OXYGEN IONS USING A LEAST SQUARES VARIATIONAL TECHNIQUE." Modern Physics Letters B 14, no. 25n26 (2000): 877–82. http://dx.doi.org/10.1142/s021798490000118x.

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The least-squares variational method is employed in order to derive iterative improvements upon the wavefunctions of Auger electrons emitted by Aluminum and Oxygen ions. The Auger electrons are considered free electrons seen by the remaining target and not as in the conventional Hartree–Fock programmes through which the continuum wavefunction of the Auger electron was determined by assuming that it occurs in a relatively higher excited state of the related bound system and this proceeds towards the real physical picture. The core potential seen by the Auger electron is evaluated on the basis o

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3

Slaughter, J. M., W. Weber, Gernot Güntherodt, and Charles M. Falco. "Quantitative Auger and XPS Analysis of Thin Films." MRS Bulletin 17, no. 12 (1992): 39–45. http://dx.doi.org/10.1557/s0883769400046947.

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In 1925, P. Auger first observed the so-called Auger electrons in a Wilson cloud chamber. He explained this occurrence as being due to a radiationless transition in atoms excited by a primary x-ray photon source. In 1953, Lander first pointed out that Auger electrons arising from solid samples can be detected in the energy distribution curve of secondary electrons from surfaces subjected to electron bombardment. Moreover, low-energy Auger electrons (∼1 keV kinetic energy) can escape from only the first several atomic layers of a surface since they are strongly absorbed by even a monolayer of a

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4

Frank, Douglas G., Teresa Golden, Frank Lu, and Arthur T. Hubbard. "Direct Imaging of Epitaxial Layers by Auger Electrons." MRS Bulletin 15, no. 5 (1990): 19–22. http://dx.doi.org/10.1557/s0883769400059686.

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It has recently been demonstrated that the surface atomic structure of materials can be imaged by means of Auger electrons. Angular distribution Auger microscopy (ADAM) produces subatomic resolution images of atomic structure by measuring and displaying the complete angular distribution of Auger electrons emitted from atoms near the surface of a solid material or thin film. Auger angular distributions contain the “silhouettes” of surface atoms “backlit” by emission from atoms located deeper in the solid. The locations and shapes of these silhouettes directly reveal the relative positions of at

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5

Haynes, D. C., M. Wurzer, A. Schletter, et al. "Clocking Auger electrons." Nature Physics 17, no. 4 (2021): 512–18. http://dx.doi.org/10.1038/s41567-020-01111-0.

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6

CHASSÉ, A., L. NIEBERGALL, P. RENNERT, I. UHLIG, and T. CHASSÉ. "BREAKDOWN OF THE FORWARD SCATTERING MODEL IN MgO(001)." Surface Review and Letters 06, no. 06 (1999): 1207–14. http://dx.doi.org/10.1142/s0218625x99001359.

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Typically, enhanced intensities are observed along low-index crystallographic directions of the crystal when Auger or photoelectrons with a kinetic energy of several hundred eV or more are emitted from atoms in a solid. This effect is a result of strong forward scattering of emitted electrons by overlying lattice atoms. Contrary to this image, a strong dip along the [110] direction has been found in the angular distribution curve of O-KLL Auger electrons of the MgO(001) surface, even though the kinetic energy of O-KLL Auger electrons is about 500 eV. The angular dependence of Auger (O-KLL, Mg-

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7

Brodersen, Hans, Andreas Institut für Angewandte Physik der, Andreas Pickuth, and Werner Legier. "Probenpotentialmodulation zur Spektroskopie elektronenangeregter Auger-Elektronen mit einem Gegenfeldanalysator." Zeitschrift für Naturforschung A 42, no. 9 (1987): 935–42. http://dx.doi.org/10.1515/zna-1987-0905.

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Electron excited Auger electrons are always superposed with primary electrons rescattered by the sample. A technique for separating the characteristic Auger spectrum from the total energy distribution is described. The method uses a retarding field analyser and modulation of the sample potential instead of the usual retarding grid modulation. Theoretical aspects of this method and illustrating experimental results with samples of amorphous carbon and KCl are discussed. The suppression of the spectrum of the scattered electrons allows recording of Auger spectra with excitation energies near thr

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8

Lee, B. Q., T. Kibédi, A. E. Stuchbery, and K. A. Robertson. "Atomic Radiations in the Decay of Medical Radioisotopes: A Physics Perspective." Computational and Mathematical Methods in Medicine 2012 (2012): 1–14. http://dx.doi.org/10.1155/2012/651475.

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Auger electrons emitted in nuclear decay offer a unique tool to treat cancer cells at the scale of a DNA molecule. Over the last forty years many aspects of this promising research goal have been explored, however it is still not in the phase of serious clinical trials. In this paper, we review the physical processes of Auger emission in nuclear decay and present a new model being developed to evaluate the energy spectrum of Auger electrons, and hence overcome the limitations of existing computations.

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9

Bantsar, Aliaksandr, and Stanislaw Pszona. "Nanodosimetry of125I Auger electrons." International Journal of Radiation Biology 88, no. 12 (2012): 895–98. http://dx.doi.org/10.3109/09553002.2012.722744.

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10

McLean, J. R. N., and Diana Wilkinson. "The radiation dose to cells in vitro from intracellular indium-111." Biochemistry and Cell Biology 67, no. 9 (1989): 661–65. http://dx.doi.org/10.1139/o89-098.

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Most of the radionuclides used in nuclear medicine emit low energy Auger electrons following radioactive decay. These emissions, if intracellular, could irreparably damage the radiosensitive structures of the cell. The resulting radiation dose, which is a measure of biological damage in the affected cell, could be many times the average radiation dose to the associated organ. In this series of experiments, the radiation dose to the nucleus of a chinese hamster V79 cell was determined for the intracellular radiopharmaceutical 111indium-oxine. Assuming the cell nucleus to be the radiosensitive v

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11

Tancic, A. R., M. Nikolic, and Z. Rakocevic. "The inner shell ionization of the atom by electrons." Facta universitatis - series: Physics, Chemistry and Technology 6, no. 1 (2008): 1–9. http://dx.doi.org/10.2298/fupct0801001t.

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In this paper, the resonant processes of inner-shell ionization of some atoms, followed by the Auger decay of the created vacancy was considered. The analytical expression for the line profiles in the Auger-electron spectra was analyzed. The line shift in the Auger spectra of the rare gas atom inner-shells was also considered.

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12

Venables, J. A., G. G. Hembree, and C. J. Harland. "Electron spectroscopy in SEM and STEM." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 378–79. http://dx.doi.org/10.1017/s0424820100135496.

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Low energy electrons, in the energy range 0-2 keV, are very useful in surface science. Both secondary (0-100 eV nominally) and Auger (50-2 keV) electrons can be used as analytic signals in ultra-high vacuum (UHV) scanning (SEM) and scanning transmission (STEM) electron microscopes. This paper briefly reviews some ongoing projects, which are aimed at improving the spatial resolution and information content of these signals.Both secondary electron imaging (SEI) and Auger electrons spectroscopy (AES) have a long history. Reviews of AES and its microscopic counterpart scanning Auger microscopy (SA

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13

MRÓZ, S. "DIRECTIONAL AUGER ELECTRON SPECTROSCOPY — PHYSICAL FOUNDATIONS AND APPLICATIONS." Surface Review and Letters 04, no. 01 (1997): 117–39. http://dx.doi.org/10.1142/s0218625x97000158.

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Experimental data about the dependence of the Auger signal from crystalline samples on the primary beam direction are presented and discussed. It is shown that, for Auger electrons and elastically and inelastically backscattered electrons, maxima of the signal in its dependence on the polar and azimuth angles of the primary beam (in polar and azimuth profiles, respectively) appear when the primary beam is parallel either to one of the close-packed rows of atoms or to one of the densely packed atomic planes in the sample. This indicates that the diffraction of the primary electron beam is respo

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14

VALERI, SERGIO, and ALESSANDRO di BONA. "MODULATED ELECTRON EMISSION BY SCATTERING-INTERFERENCE OF PRIMARY ELECTRONS." Surface Review and Letters 04, no. 01 (1997): 141–60. http://dx.doi.org/10.1142/s0218625x9700016x.

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We review the effects of scattering-interference of the primary, exciting beam on the electron emission from ordered atomic arrays. The yield of elastically and inelastically backscattered electrons, Auger electrons and secondary electrons shows a marked dependence on the incidence angle of primary electrons. Both the similarity and the relative importance of processes experienced by incident and excident electrons are discussed. We also present recent studies of electron focusing and defocusing along atomic chains. The interplay between these two processes determines the in-depth profile of t

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15

Liu, J., G. G. Hembree, G. E. Spinnler, and J. A. Venables. "Imaging small metal particles with Auger electrons." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (1992): 308–9. http://dx.doi.org/10.1017/s0424820100121946.

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High spatial resolution Auger electron spectroscopy (AES) and scanning Auger microscopy (SAM) have been developed in a UHV scanning transmission electron microscopy (STEM) instrument. A resolution < 3 nm has been achieved in SAM images. The application of high resolution AES and SAM to the study of supported catalysts has proved very powerful for extracting chemical information of the surface species. In this paper we report further study of supported metal particles by using high resolution AES and SAM. These experiments were conducted in a VG HB-501S UHV STEM codenamed “MIDAS”. Auger elec

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16

Isomura, Noritake, Daigo Kikuta, Naoko Takahashi, Satoru Kosaka, and Keita Kataoka. "Local atomic structure analysis of GaN surfaces via X-ray absorption spectroscopy by detecting Auger electrons with low energies." Journal of Synchrotron Radiation 26, no. 6 (2019): 1951–55. http://dx.doi.org/10.1107/s1600577519012827.

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GaN is a promising material for power semiconductor devices used in next-generation vehicles. Its electrical properties such as carrier mobility and threshold voltage are affected by the interface between the oxide and the semiconductor, and identifying the interface states is important to improve these properties. A surface-sensitive measurement of Ga K-edge extended X-ray absorption fine structure (EXAFS) by detecting Ga LMM Auger electrons that originate from Ga K-shell absorption is proposed for GaN. LMM Auger electrons with low energies were detected and the EXAFS oscillation was confirme

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17

Schiwietz, G., G. Xiao, E. Luderer, and P. L. Grande. "Auger electrons from ion tracks." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 164-165 (April 2000): 353–64. http://dx.doi.org/10.1016/s0168-583x(99)01064-2.

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18

Prutton, Martin. "Microanalytical Imaging with Auger Electrons." Microscopy Microanalysis Microstructures 6, no. 3 (1995): 289–320. http://dx.doi.org/10.1051/mmm:1995121.

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19

Hembree, Gary G. "Auger electron spectroscopy at nanometer resolution." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1476–77. http://dx.doi.org/10.1017/s0424820100132017.

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Auger electron spectroscopy (AES) is a surface sensitive microanalytical technique. Auger electrons are only detected from the top few atomic layers due to their very small inelastic mean free paths. The lateral spatial resolution of AES of thin samples is dominated by the excitation beam profile. Thin samples are defined as having a thickness which is much smaller than the back-scattered electron range at the incident beam energy. Utilizing high current density nanometer-sized probes available in field emission gun STEMs, AES signals extracted from sample regions as small as a few atoms shoul

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20

Akman, Ferdi. "K to L shell vacancy transfer probabilities and Auger electron emission ratios for elements in the atomic range 30 ≤ Z ≤ 58." Canadian Journal of Physics 94, no. 7 (2016): 679–86. http://dx.doi.org/10.1139/cjp-2016-0097.

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The K to L shell vacancy transfer probabilities for some elements in the atomic range 30 ≤ Z ≤ 58 were determined using the semi-empirical values of K shell fluorescence yield and the experimental values of Kβ/Kα X-ray intensity ratio. Furthermore, the KLX/KLL and KXY/KLL Auger electrons emission ratios for the same elements were obtained using the experimental values of Kβ/Kα X-ray intensity ratio. The experiments were performed using a 241Am annular radioisotope source and a high-resolution Si(Li) semiconductor detector. The experimental values of K to L shell vacancy transfer probabilities,

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21

DI BONA, A., P. LUCHES, A. BORGHI, F. ROSSI, and S. VALERI. "BACKSCATTERING EFFECTS IN MODULATED ELECTRON EMISSION FROM ULTRATHIN OVERLAYERS." Surface Review and Letters 06, no. 05 (1999): 599–604. http://dx.doi.org/10.1142/s0218625x9900055x.

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The intensity of the Auger emission from ultrathin (<2 monolayers) overlayers excited by energetic (1–5 keV) electron beams, shows an unusually large anisotropy as a function of the incidence angle. We proposed a multistep mechanism which accounts for this anisotropy, based on the electron focusing and backscattering of the beam electrons from the bulk atoms. The intensity and anisotropy of the backscattered electrons has been measured in a large energy interval and its relationship with the structure and the Auger emission from the surface layer is discussed.

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22

Eberhardt, W., EW Plummer, In Whan Lyo, et al. "Auger Electron?Ion Coincidence Studies to Determine the Pathways in Soft X-ray Induced Fragmentation of Isolated Molecules." Australian Journal of Physics 39, no. 5 (1986): 633. http://dx.doi.org/10.1071/ph860633.

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We report a coincidence .experiment between energy selected Auger electrons and the ions produced in the events following the absorption of a soft X-ray photon by a CO molecule. This study allows us to correlate specific double hole final state configurations of the Auger decay of a core hole in this molecule with the production of fragment ions, thus giving new experimental insight into the potential energy curves of the doubly charged molecular ion and the involvement of individual valence electrons into the molecular bond in general.

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23

Lohmann, B. "Recent developments in the theory of angular distribution and spin polarization of Auger electrons." Canadian Journal of Physics 74, no. 11-12 (1996): 962–69. http://dx.doi.org/10.1139/p96-815.

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The general theory of angular distribution and spin polarization of Auger electrons is reviewed. The angular distribution of open-shell atoms is investigated in more detail. Whereas the KLL Auger lines have to be isotropic for closed-shell atoms, this is no longer valid for open-shell systems. The angular distribution of the KLL spectra of sodium and laser-excited sodium is discussed. Large anisotropy parameters are predicted for the unresolved initial- and final-state multiplets of the laser-excited sodium KLL spectrum. An outlook is given for the angular distribution of Auger electrons emitt

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24

Kudryavtsev, V. N., T. V. Maltsev, and L. I. Shekhtman. "Study of the spatial resolution of low-material GEM tracking detectors." EPJ Web of Conferences 174 (2018): 06005. http://dx.doi.org/10.1051/epjconf/201817406005.

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The spatial resolution of GEM based tracking detectors has been simulated and measured. The simulation includes the GEANT4 based transport of high energy electrons with careful accounting for atomic relaxation processes including emission of fluorescent photons and Auger electrons and custom post-processing, including accounting for diffusion, gas amplification fluctuations, the distribution of signals on readout electrodes, electronics noise and a particular algorithm of the final coordinate calculation (center of gravity). The simulation demonstrates that a minimum of the spatial resolution

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25

Obata, Honoka, Atsushi B. Tsuji, Hitomi Sudo, et al. "In Vitro Evaluation of No-Carrier-Added Radiolabeled Cisplatin ([189, 191Pt]cisplatin) Emitting Auger Electrons." International Journal of Molecular Sciences 22, no. 9 (2021): 4622. http://dx.doi.org/10.3390/ijms22094622.

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Due to their short-range (2–500 nm), Auger electrons (Auger e−) have the potential to induce nano-scale physiochemical damage to biomolecules. Although DNA is the primary target of Auger e−, it remains challenging to maximize the interaction between Auger e− and DNA. To assess the DNA-damaging effect of Auger e− released as close as possible to DNA without chemical damage, we radio-synthesized no-carrier-added (n.c.a.) [189, 191Pt]cisplatin and evaluated both its in vitro properties and DNA-damaging effect. Cellular uptake, intracellular distribution, and DNA binding were investigated, and DNA

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26

LIU, JINGYUE. "Nanometer-resolution Auger electron spectroscopy and microscopy of small particles." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 720–21. http://dx.doi.org/10.1017/s042482010014943x.

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Small metal particles have peculiar physical and chemical properties and they are especially important in catalysis. A detailed understanding of catalytic processes requires knowledge of both the microstructure and the microchemistry of the catalyst system. Although nanometer scale surface topography of supported catalysts can be studied with secondary electron (SE) signals, a chemically specific and surface sensitive signal such as Auger electrons must be used to extract compositional information about the surface species. Auger electron (AE) spectroscopy (AES) and scanning Auger microscopy (

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27

Snell, G., M. Drescher, N. Müller, et al. "Spin Polarized Auger Electrons: The XeM4,5N4,5N4,5Case." Physical Review Letters 76, no. 21 (1996): 3923–26. http://dx.doi.org/10.1103/physrevlett.76.3923.

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28

Kassis, Amin I. "The Amazing World of Auger Electrons." International Journal of Radiation Biology 80, no. 11-12 (2004): 789–803. http://dx.doi.org/10.1080/09553000400017663.

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29

Bonhoff, K., S. Nahrup, B. Lohmann, and K. Blum. "Angular distribution of molecular Auger electrons." Journal of Chemical Physics 104, no. 20 (1996): 7921–26. http://dx.doi.org/10.1063/1.471508.

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30

Abe, S., H. Nakayama, T. Nishino, and S. Iida. "Auger valence electron spectra in Ca-silicides." Journal of Materials Research 12, no. 2 (1997): 407–11. http://dx.doi.org/10.1557/jmr.1997.0059.

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CaSi2 and CaSi have been investigated by Auger Valence Electron Spectroscopy (AVES). Some drastic differences of the Auger peak due to 3s states in the Si atoms were observed in the Si[2s, 2p, V] Auger spectra. The peak that arised from valence electron states in the Ca atoms was observed in the Ca[2p, 3p, V] Auger spectra for both Ca-silicides. This result suggests that the Ca–Si bonds are partially ionic. However, the number of the valence electrons in Ca atoms for CaSi was larger than that for CaSi2. This result implies that the part of homopolar bonds between the Si and Ca atoms in CaSi is

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31

Hembree, Gary G., Frank C. H. Luo, and John A. Venables. "Auger electron spectroscopy and microscopy in STEM." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 464–65. http://dx.doi.org/10.1017/s0424820100086623.

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Spatial resolution in Auger electron spectroscopy (AES) is primarily a function of the excitation beam current distribution. For highest resolution the question of how to produce such a small probe of electrons is coupled with how to extract the secondary electrons efficiently from the sample. Kniit and Venables have shown the optimum configuration for highest resolution AES is a combination of a magnetic immersion lens, additional solenoids (“parallelizers“) to shape the weak magnetic field in the low energy electron transport region and a concentric hemispherical analyzer (CHA) to disperse a

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32

Wendisch, M., R. Freudenberg, J. Drechsel, R. Runge, G. Wunderlich, and J. Kotzerke. "99mTc reduziert nach intrazellulärer Aufnahme in NIS-positiven Zellen in vitro das klonogene Überleben stärker als 131I." Nuklearmedizin 49, no. 04 (2010): 154–60. http://dx.doi.org/10.3413/nukmed-0300.

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Summary Aim: In addition to gamma radiation of 140 keV 99mTc emits during the transition to 99Tc electrons of low energy and tiny path-lengths. These Auger electrons cannot be utilized in diagnostic procedures. However, they were discussed frequently for therapeutic application. Hitherto proof of effect of the Auger electrons from 99mTc is missing which is supplied now in an in vitro-system in comparison to beta-emitter 131I. Methods: The thyroid cell line PC Cl3 (sodium iodide symporter (NIS)-positive) was incubated with 131I-sodium iodide (131I) or 99mTc-pertechnetate (99mTc) in presence or

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33

Bleeker, A. J., and P. Kruit. "Design of a UHV STEM for Through-The-Lens Electron Spectroscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 380–81. http://dx.doi.org/10.1017/s0424820100135502.

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Combining of the high spatial resolution of a Scanning Transmission Electron Microscope and the wealth of information from the secondary electrons and Auger spectra opens up new possibilities for materials research. In a prototype instrument at the Delft University of Technology we have shown that it is possible from the optical point of view to combine STEM and Auger spectroscopy [1]. With an Electron Energy Loss Spectrometer attached to the microscope it also became possible to perform coincidence measurements between the secondary electron signal and the EELS signal. We measured Auger spect

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34

Blum, K., B. Lohmann, and E. Taute. "Angular distribution and polarisation of Auger electrons." Journal of Physics B: Atomic and Molecular Physics 19, no. 22 (1986): 3815–25. http://dx.doi.org/10.1088/0022-3700/19/22/022.

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35

Demekhin, Ph V., S. Scheit, and L. S. Cederbaum. "Recoil by Auger electrons: Theory and application." Journal of Chemical Physics 131, no. 16 (2009): 164301. http://dx.doi.org/10.1063/1.3250348.

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36

Mitchell, D. L., R. P. Lin, H. Rème, et al. "Oxygen auger electrons observed in Mars' ionosphere." Geophysical Research Letters 27, no. 13 (2000): 1871–74. http://dx.doi.org/10.1029/1999gl010754.

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37

Schmidt, Volker. "Angular distribution of Auger electrons following photoionization." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 87, no. 1-4 (1994): 241–46. http://dx.doi.org/10.1016/0168-583x(94)95267-1.

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38

Liu, J., G. G. Hembree, G. E. Spinnler, and J. A. Venables. "Nanometer-resolution surface analysis with Auger electrons." Ultramicroscopy 52, no. 3-4 (1993): 369–76. http://dx.doi.org/10.1016/0304-3991(93)90048-3.

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39

Landolt, M., R. Allenspach, and M. Taborelli. "Spin-polarized Auger electrons from magnetic surfaces." Surface Science Letters 178, no. 1-3 (1986): A650. http://dx.doi.org/10.1016/0167-2584(86)90155-6.

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40

Landolt, M., R. Allenspach, and M. Taborelli. "Spin-polarized Auger electrons from magnetic surfaces." Surface Science 178, no. 1-3 (1986): 311–26. http://dx.doi.org/10.1016/0039-6028(86)90307-9.

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41

Tang, Ching-Yen, Richard T. Haasch, and Shen J. Dillon. "In situ X-ray photoelectron and Auger electron spectroscopic characterization of reaction mechanisms during Li-ion cycling." Chemical Communications 52, no. 90 (2016): 13257–60. http://dx.doi.org/10.1039/c6cc08176b.

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We demonstrate a novel design for in situ X-ray photoelectron spectroscopy and in situ Auger electron spectroscopy, and we applied this technique to characterize the evolution of bonding and chemistry during cycling of nanoparticle electrodes.

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42

Figueiredo, Diogo, Célia Fernandes, Francisco Silva, et al. "Synthesis and Biological Evaluation of 99mTc(I) Tricarbonyl Complexes Dual-Targeted at Tumoral Mitochondria." Molecules 26, no. 2 (2021): 441. http://dx.doi.org/10.3390/molecules26020441.

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For effective Auger therapy of cancer, the Auger-electron emitters must be delivered to the tumor cells in close proximity to a radiosensitive cellular target. Nuclear DNA is considered the most relevant target of Auger electrons to have augmented radiotoxic effects and significant cell death. However, there is a growing body of evidence that other targets, such as the mitochondria, could be relevant subcellular targets in Auger therapy. Thus, we developed dual-targeted 99mTc(I) tricarbonyl complexes containing a triphenylphosphonium (TPP) moiety to promote accumulation of 99mTc in the mitocho

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43

RÜHL, E., A. KNOP, A. P. HITCHCOCK, P. A. DOWBEN, and D. N. MCILROY. "CORE EXCITATION IN FREE CLUSTERS: IONIZATION, RELAXATION, AND FRAGMENTATION." Surface Review and Letters 03, no. 01 (1996): 557–65. http://dx.doi.org/10.1142/s0218625x96001017.

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Cluster-size-dependent spectroscopic changes are reported for the Ar(2p) core ionization, electronic relaxation via Auger decay, and subsequent fragmentation of free argon clusters with sizes up to 700 atoms. Excitation spectra recorded using zero kinetic energy (ZEKE) photoelectrons, Auger electrons, as well as multicoincidence ion mass spectra, are reported. It is found that core ionization energies decrease as the cluster size increases from the atom to the condensed phase. Evidence for thermalization of photoelectrons via intracluster scattering is found, indicating that ZEKE photoelectron

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44

Wang, J. Y., and E. J. Mittemeijer. "A new method for the determination of the diffusion-induced concentration profile and the interdiffusion coefficient for thin film systems by Auger electron spectroscopical sputter depth profiling." Journal of Materials Research 19, no. 11 (2004): 3389–97. http://dx.doi.org/10.1557/jmr.2004.0430.

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A new Auger electron spectroscopical sputter depth profiling method was developed to determine the interdiffusion coefficient for the initial stage of diffusion annealing of thin films. The method is based on (i) adoption of an interdiffusion model appropriate for the specimen investigated and (ii) convolution of an accordingly calculated diffusion-induced concentration profile with the smearing effects due to atomic mixing, surface/interface roughness, escape depth of the Auger electrons, and preferential sputtering. The diffusion-induced concentration profile and the interdiffusion coefficie

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45

Ai, R. "Design of a TEM/STEM Auger Detector." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 98–99. http://dx.doi.org/10.1017/s042482010015246x.

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In order to perform surface studies in an electron microscope, one has to be able to detect atoms adsorbed on the surface. The standard approach in surface science is to attach an Auger spectrometer using a CMA or CHA, but such an instrument is intrinsically incompatible with the performance of a TEM/STEM. In this note we describe a design which uses a far smaller analyzer which should be compatible with almost all microscopes.One important aspect of the design is to recognize that due to the strong magnetic lenses, low energy electrons are refocussed along the optic axis of the microscope, ba

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46

Thurgate, SM. "Auger Photoelectron Coincidence Spectroscopy." Australian Journal of Physics 43, no. 5 (1990): 443. http://dx.doi.org/10.1071/ph900443.

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Auger photoelectron coincidence spectroscopy (APECS) involves measuring an Auger line in coincidence with the corresponding photoelectron line of an X ray excited spectrum. Such spectra are free of many of the complicating features of conventional data and display the correlations that exist between the lines. APECS has been used to study a number of fundamental aspects of Auger spectroscopy, such as the removal of complicating effects due to Coster-Kronig transitions in the LZ.3 VV spectra of Cu. We have been able to show similar behaviour in the Auger spectra of Co. In principle, APECS can a

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Kim, J. H., T. K. Yang, C. Y. Lee, and B. C. Lee. "Simulation of Energy Resolution of Time of Flight System for Measuring Positron-annihilation induced Auger Electrons." Journal of the Korean Vacuum Society 17, no. 4 (2008): 311–16. http://dx.doi.org/10.5757/jkvs.2008.17.4.311.

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Lohmann, Birgit. "Electron - Auger Electron Coincidence Experiments: Current Status and Future Prospects." Australian Journal of Physics 49, no. 2 (1996): 365. http://dx.doi.org/10.1071/ph960365.

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Approximately ten years ago the first experiments were performed in which the Auger electrons produced after inner-shell ionisation of atoms by electron impact were detected in coincidence with the scattered electrons. Only a limited number of such experiments have been performed since that time, mainly due to the very low count rates characteristic of these measurements. Recent developments in the field are discussed and the future prospects for such measurements are considered.

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Drucker, J. S., M. Krishnamurthy, G. G. Hembree, Luo Chuan Hong, and J. A. Venables. "High-spatial-resolution secondary and Auger imaging in a STEM." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 208–9. http://dx.doi.org/10.1017/s0424820100153014.

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Secondary electrons form the main signal in a standard SEM, and machines incorporating Auger electron spectroscopy and imaging have become widely commercialized. However, these approaches to low energy (0-2000eV) electron spectroscopy and imaging do not work at the highest spatial resolution, since there are geometrical and electromagnetic conflicts as the focal length of the probe forming lens is reduced. As discussed elsewhere in more detail, the solution is to make the magnetic probe forming lens of the SEM/STEM also function as the first stage of the electron collection and analysis system

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Liu, J., G. G. Hembree, G. E. Spinnler, and J. A. Venables. "High-resolution Auger Electron Microscopy and spectroscopy of supported metal particles." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 690–91. http://dx.doi.org/10.1017/s0424820100087768.

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A detailed understanding of catalytic processes requires structural knowledge of the catalyst system. The surface properties of small metal particles which are highly dispersed on insulating supports must play a dominant role in determining this system's catalytic behavior. Therefore characterization of surface topography and composition of heterogeneous catalysts is important. Surface topography of the carrier materials can be obtained by high resolution secondary electron imaging (SEI) in a STEM. The small metal particles can also be located and their topographic relationship with the suppor

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