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Academic literature on the topic 'Electromigration in liquid metals'
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Journal articles on the topic "Electromigration in liquid metals"
Belashchenko, David K. "The Relationship between Electrical Conductivity and Electromigration in Liquid Metals." Dynamics 3, no. 3 (2023): 405–24. http://dx.doi.org/10.3390/dynamics3030022.
Full textKumar, Sumit, Praveen Kumar, and Rudra Pratap. "A model for electromigration induced flow in liquid metals." Journal of Physics D: Applied Physics 50, no. 39 (2017): 39LT02. http://dx.doi.org/10.1088/1361-6463/aa84a2.
Full textMao, Xin, Ruhua Zhang, and Xiaowu Hu. "Influence of Ni foam/Sn composite solder foil on IMC growth and mechanical properties of solder joints bonded with solid-liquid electromigration." Intermetallics 131 (April 2021): 107107. http://dx.doi.org/10.1016/j.intermet.2021.107107.
Full textHo, P. S., and T. Kwok. "Electromigration in metals." Reports on Progress in Physics 52, no. 3 (1989): 301–48. http://dx.doi.org/10.1088/0034-4885/52/3/002.
Full textRous, P. J., T. L. Einstein, and Ellen D. Williams. "Theory of surface electromigration on metals: application to self-electromigration on Cu(111)." Surface Science 315, no. 1-2 (1994): L995—L1002. http://dx.doi.org/10.1016/0039-6028(94)90532-0.
Full textEk, J. van, and A. Lodder. "Electromigration in transition metals. I. Computational method." Journal of Physics: Condensed Matter 3, no. 38 (1991): 7307–30. http://dx.doi.org/10.1088/0953-8984/3/38/007.
Full textMichaud, Hadrien O., and Stéphanie P. Lacour. "Liquid electromigration in gallium-based biphasic thin films." APL Materials 7, no. 3 (2019): 031504. http://dx.doi.org/10.1063/1.5059380.
Full textLi, C. H., Y. C. Chuang, and C. Y. Liu. "Fabrication of Mg-Based Intermetallic Compounds by Liquid Electromigration." Journal of Electronic Materials 36, no. 11 (2007): 1489–94. http://dx.doi.org/10.1007/s11664-007-0231-4.
Full textvan Ek, J., and A. Lodder. "Electromigration of Interstitial and Substitutional Impurities in Transition Metals." Defect and Diffusion Forum 95-98 (January 1993): 265–70. http://dx.doi.org/10.4028/www.scientific.net/ddf.95-98.265.
Full textKuge, Toshihiro, Masataka Yahagi, and Junichi Koike. "Electromigration characteristics of CuAl2." Journal of Alloys and Compounds 918 (October 2022): 165615. http://dx.doi.org/10.1016/j.jallcom.2022.165615.
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