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Journal articles on the topic 'Electron backscattering'

Author: Grafiati

Published: 4 June 2021

Last updated: 19 February 2022

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1

Afanas'ev, V. P., S. D. Fedorovich, A. V. Lubenchenko, A. A. Ryjov, and M. S. Esimov. "Kilovolt electron backscattering." Zeitschrift f�r Physik B Condensed Matter 96, no. 2 (June 1994): 253–59. http://dx.doi.org/10.1007/bf01313291.

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2

Roick, Christoph, Heiko Saul, Hartmut Abele, and Bastian Märkisch. "Undetected electron backscattering in Perkeo III." EPJ Web of Conferences 219 (2019): 04005. http://dx.doi.org/10.1051/epjconf/201921904005.

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The beta asymmetry in neutron beta decay is used to determine the ratio of axial-vector coupling to vector coupling most precisely. In electron spectroscopy, backscattering of electrons from detectors can be a major source of systematic error. We present the determination of the correction for undetected backscattering for electron detection with the instrument Perkeo III. For the electron asymmetry, undetected backscattering leads to a fractional correction of 5 × 10−4, i.e. a change by 40% of the total systematic uncertainty.

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3

Chen, Shi-Hao, and Ziwei Chen. "Electron–photon backscattering lasers." Laser Physics 24, no. 4 (March 7, 2014): 045805. http://dx.doi.org/10.1088/1054-660x/24/4/045805.

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4

Nakhodkin, N. G., and P. V. Melnik. "Elastic electron backscattering spectroscopy." Journal of Electron Spectroscopy and Related Phenomena 68 (May 1994): 623–39. http://dx.doi.org/10.1016/0368-2048(94)80025-1.

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5

Dudarev, S. L., J. Ahmed, P. B. Hirsch, and A. J. Wilkinson. "Decoherence in electron backscattering by kinked dislocations." Acta Crystallographica Section A Foundations of Crystallography 55, no. 2 (March 1, 1999): 234–45. http://dx.doi.org/10.1107/s0108767398014810.

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A model is proposed that explains the origin of the bright contrast of dislocation walls consisting of edge dislocation dipoles in electron channelling contrast images (ECCI) of fatigued crystals, when the incident beam is parallel to the edge dislocations. The model is based on the assumption that the contrast arises from the dislocation segments terminating the dipoles. These are modelled as screw-type kinks which scatter electrons. Scattering by randomly distributed kinks leads to the randomization of phase of transmitted and diffracted beams and suppresses the anomalous transmission of electrons. The predicted behaviour of electron-channeling contrast images agrees well with experimental observations.

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6

Klevenhagen, S. C. "Implication of electron backscattering for electron dosimetry." Physics in Medicine and Biology 36, no. 7 (July 1, 1991): 1013–18. http://dx.doi.org/10.1088/0031-9155/36/7/009.

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7

Jablonski, A., J. Gryko, J. Kraaer, and S. Tougaard. "Elastic electron backscattering from surfaces." Physical Review B 39, no. 1 (January 1, 1989): 61–71. http://dx.doi.org/10.1103/physrevb.39.61.

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8

Jablonski, Aleksander. "Elastic electron backscattering from gold." Physical Review B 43, no. 10 (April 1, 1991): 7546–54. http://dx.doi.org/10.1103/physrevb.43.7546.

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9

Dondero, Paolo, Alfonso Mantero, Vladimir Ivanchencko, Simone Lotti, Teresa Mineo, and Valentina Fioretti. "Electron backscattering simulation in Geant4." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 425 (June 2018): 18–25. http://dx.doi.org/10.1016/j.nimb.2018.03.037.

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10

Antolak, A. J., and W. Williamson. "Electron backscattering from bulk materials." Journal of Applied Physics 58, no. 1 (July 1985): 526–34. http://dx.doi.org/10.1063/1.335657.

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11

Eades, Alwyn. "Choosing an Electron Backscattering System." Microscopy Today 8, no. 2 (March 2000): 22–25. http://dx.doi.org/10.1017/s1551929500057461.

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Recent advances in cameras and computers have made it possible to build electron backscattering diffraction (EBSD) cameras which can give crystallographic information from specimens in the scanning electron microscope (SEM) on a routine basis. There are a few hundred such systems world wide and the number is growing fast. In the case of crystalline samples (nearly all applications of SEM outside the biomedical field), it will surely soon be considered essential to fit an SEM with an EBSD system, just as it is now considered essential to have the SEM equipped with an energy-dispersive x-ray spectroscopy (EDS) system. There are at feast four commercial manufacturers of EBSD systems.

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12

Berger, Dirk, and Heinz Niedrig. "Energy distribution of electron backscattering from crystals and relation to electron backscattering patterns and electron channeling patterns." Scanning 24, no. 2 (December 6, 2006): 70–74. http://dx.doi.org/10.1002/sca.4950240204.

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13

Zupanič, F. "Extracting electron backscattering coefficients from backscattered electron micrographs." Materials Characterization 61, no. 12 (December 2010): 1335–41. http://dx.doi.org/10.1016/j.matchar.2010.09.004.

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14

DI BONA, A., P. LUCHES, A. BORGHI, F. ROSSI, and S. VALERI. "BACKSCATTERING EFFECTS IN MODULATED ELECTRON EMISSION FROM ULTRATHIN OVERLAYERS." Surface Review and Letters 06, no. 05 (October 1999): 599–604. http://dx.doi.org/10.1142/s0218625x9900055x.

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The intensity of the Auger emission from ultrathin (<2 monolayers) overlayers excited by energetic (1–5 keV) electron beams, shows an unusually large anisotropy as a function of the incidence angle. We proposed a multistep mechanism which accounts for this anisotropy, based on the electron focusing and backscattering of the beam electrons from the bulk atoms. The intensity and anisotropy of the backscattered electrons has been measured in a large energy interval and its relationship with the structure and the Auger emission from the surface layer is discussed.

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15

Dingley, D. J., A. J. Wilkinson, and G. P. Burns. "Strain measurements using electron backscattering diffraction patterns." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (August 1990): 402–3. http://dx.doi.org/10.1017/s0424820100175144.

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The Electron Backscatter Diffraction (EBSP) technique, first applied to the Scanning Electron Microscope by Venables and Harland and later by Dingley et al., is now widely used, particularly for crystal orientation determination , and for the determination of crystal symmetry,. Methods have also been sought to apply it for measurement of internal strain and this paper reviews and reports the findings. Plastic strain measurements from diffraction patterns obtained using the related selected area channelling technique have been widley reported and are reviewed in reference.Elastic and plastic strain in crystals causes a shift in the diffraction line positions, line broadening, and a decrease in diffracted intensity. Measurement of these changes in EBSP is hindered by several problems peculiar to the method. As the patterns are formed by Bragg scattering of initially ine1 astica11y scattered electrons, there is a natural line broadening arising from an energy spread in the diffracted electrons amounting to 1% of the incident beam energy. This is compounded by the fact that the Bragg angle for diffraction is generally less than 2° and that dynamical diffraction effects result in the diffraction profiles being highly assymetric with long tails. Consequently there is considerable overlapp of profiles. Other problems arise from the gnomonic projection of the pattern producing a distortion which increase towards the edges of the pattern and from the need to tilt the specimen towards the recording film which produces further asymmetry in the line profile. Finally, surface contamination is observed to degrade the diffraction pattern reducing line intensity in much the same way as plastic strain.

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16

Nagao, Akie, and Sumio Hosaka. "Monte Carlo Simulation of Electron Trajectory in Solid for Electron Beam Lithography." Key Engineering Materials 596 (December 2013): 101–6. http://dx.doi.org/10.4028/www.scientific.net/kem.596.101.

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We have developed a GUI(Graphical User Interface)-based Monte Carlo simulation tool for electron beam lithography. Simulation was executed by changing initial energy, thickness of resist, and target material. We focused on penetration range, backscattering coefficient and spatial distribution of lost energy. Comparison with other theory indicates that our simulation is reliable in the 10-50keV range of the energy of the electron. It seems that backscattering coefficient is strongly affected by the kind of atoms in the target, not initial energy.

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17

BENTABET, A. "MONTE CARLO CALCULATION OF SLOW ELECTRON BEAM TRANSPORT IN SOLIDS: REFLECTION COEFFICIENT THEORY IMPLICATIONS." Modern Physics Letters B 26, no. 04 (February 10, 2012): 1150022. http://dx.doi.org/10.1142/s0217984911500229.

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The reflection coefficient theory developed by Vicanek and Urbassek showed that the backscattering coefficient of light ions impinging on semi-infinite solid targets is strongly related to the range and the first transport cross-section as well. In this work and in the electron case, we show that not only the backscattering coefficient is, but also most of electron transport quantities (such as the mean penetration depth, the diffusion polar angles, the final backscattering energy, etc.), are strongly correlated to both these quantities (i.e. the range and the first transport cross-section). In addition, most of the electron transport quantities are weakly correlated to the distribution of the scattering angle and the total elastic cross-section as well. To make our study as straightforward and clear as possible, we have projected different input data of elastic cross-sections and ranges in our Monte Carlo code to study the mean penetration depth and the backscattering coefficient of slow electrons impinging on semi-infinite aluminum and gold in the energy range up to 10 keV. The possibility of extending the present study to other materials and other transport quantities using the same models is a valid process.

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18

Dudarev, S. L., P. Rez, and M. J. Whelan. "Theory of electron backscattering from crystals." Physical Review B 51, no. 6 (February 1, 1995): 3397–412. http://dx.doi.org/10.1103/physrevb.51.3397.

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19

Williamson, W., A. J. Antolak, and R. J. Meredith. "An energy‐dependent electron backscattering coefficient." Journal of Applied Physics 61, no. 9 (May 1987): 4612–18. http://dx.doi.org/10.1063/1.338371.

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20

Massoumi, G. R., N. Hozhabri, K. O. Jensen, W. N. Lennard, M. S. Lorenzo, P. J. Schultz, and A. B. Walker. "Positron and electron backscattering from solids." Physical Review Letters 68, no. 26 (June 29, 1992): 3873–76. http://dx.doi.org/10.1103/physrevlett.68.3873.

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21

Tanuma, S. "Backscattering Correction for Auger Electron Spectroscopy." Journal of Surface Analysis 14, no. 1 (2007): 9–19. http://dx.doi.org/10.1384/jsa.14.9.

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22

Kellogg, T., and A. K. Ray. "A computational model for electron backscattering in electron dosimetry." Medical Physics 22, no. 1 (January 1995): 25–30. http://dx.doi.org/10.1118/1.597595.

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23

Vodinas, N. P., D. W. Higinbotham, C. W. De Jager, N. H. Papadakis, and I. Passchier. "A Compton Backscattering Polarimeter for Electron Beams below 1 GeV." HNPS Proceedings 7 (December 5, 2019): 130. http://dx.doi.org/10.12681/hnps.2409.

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A recently installed polarized electron source will allow internal target experiments to be performed with polarized electrons at the NIKHEF Internal Target Hall, lb measure the longitudinal component of the polarization vector of the stored electron beam, a Polarimeter based on spin-dependent Compton scattering has been developed and successfully commissioned

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24

Gauvin, Raynald, Dominique Drouin, and Pierre Hovington. "Energy Filtered Electron Backscattering Images of 10-nm NbC and AIN Precipitates in Steels Computed by Monte Carlo Simulations." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 150–51. http://dx.doi.org/10.1017/s0424820100163216.

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In modern materials science, it is important to improve the resolution of the Scanning Electron Microscope (SEM) because small phases play a crutial role in the properties of materials. The Transmission Electron Microscope (TEM) is the tool of choice for imaging small phases embedded in a given matrix. However, this technique is expensive and also is slow owing to specimen preparation. In this context, it is important to improve spatial resolution of the SEM.In electron backscattering images, it is well know that the backscattered electrons have an energetic distribution when they escape the specimen.The electrons having loss less energy are those which have travelled less in the specimen and thus escape closer to the electron beam. So, in filtering the energy of the backscattering electron and keeping those which have loss only a small amount of energy to create the image, a significant improvement of the resolution of such images is expected. New detectors are now under development to take advantage of this technique of imaging.

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25

Joy, D. C. "Channeling in and channeling out: The origins of electron backscattering and electron channeling contrast." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 592–93. http://dx.doi.org/10.1017/s0424820100170694.

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Two techniques are now in common use for obtaining crystallographic information from crystals in the scanning electron microscope (SEM) - electron channeling patterns (ECP) in which variations in the angle of incidence of the beam with respect to crystal produce variations in the backscattering yield; and electron backscattering patterns (EBSP) in which a stationary electron beam impinges on the crystal and anisotropies in the angular distribution of the backscattering profile are viewed on a screen. The ECP and EBSP techniques seem superficially to be very different, but they are in fact closely related through the principle of reciprocity and the concept of Bloch waves. A plane electron wave incident on a crystal can be decomposed into Bloch waves ψi which are the solutions of the Schroedinger equation for waves in a periodic potential. In the simplest case (figure 1) just two waves are present. The maxima in the probability distributions I ψi. ψi*| of these Bloch waves (i.e the chance of finding an electron) are periodic with a repeat distance equal to the lattice spacing, but for wave I these maxima occur half-way between the planes while for wave II the maxima occur on the lattice planes.

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26

Afanas’ev, V. P., and D. Naujoks. "Inelastic High-Energy Electron Spectrafrom Plane-Parallel Layer-Nonhomogeneous Surfaces." Zeitschrift für Naturforschung A 46, no. 10 (October 1, 1991): 851–57. http://dx.doi.org/10.1515/zna-1991-1003.

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AbstractWe consider inelastic backscattering of electrons with initial energy of tens and hundreds of keV by plane-parallel homogeneous and sandwiched targets. Basing on the invariance principle, we find expressions that describe the dynamics of the changes in the energy spectra of electrons reflected into a given solid angle that occur with increase of the thickness of films of different materials on substrates of finite and infinite thickness. We substantiate a procedure of linearizing the equations for the reflection function obtained by the method of invariant imbedding. We obtain an analytical solution of linearized equations in the form of a series in Legendre polynomials. A comparison with experimental data shows that the theory developed gives an adequate description of the process of electron backscattering.

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27

Vos, Maarten. "Detection of hydrogen by electron Rutherford backscattering." Ultramicroscopy 92, no. 3-4 (August 2002): 143–49. http://dx.doi.org/10.1016/s0304-3991(02)00127-4.

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28

Tao, Xiaodong, and Alwyn Eades. "Monte Carlo Simulation for Electron Backscattering Diffraction." Microscopy and Microanalysis 10, S02 (August 2004): 940–41. http://dx.doi.org/10.1017/s143192760488245x.

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29

Hooghan, T. K., Philippe Staib, and Alwyn Eades. "An Energy Filter for Electron Backscattering Diffraction." Microscopy and Microanalysis 10, S02 (August 2004): 938–39. http://dx.doi.org/10.1017/s143192760488512x.

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30

Eades, Alwyn. "Choosing an Electron Backscattering Pattern (EBSP) System." Microscopy and Microanalysis 5, S2 (August 1999): 250–51. http://dx.doi.org/10.1017/s1431927600014574.

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Recent advances in cameras and computers have made it possible to build electron backscattering pattern (EBSP) cameras which can give crystallographic information from diffraction patterns in the scanning electron microscope (SEM) on a routine basis.[1] There are a few hundred such systems world wide and the number is growing fast. In the case of crystalline samples (nearly all applications of SEM outside the biomedical field), it will surely soon be considered essential to fit an SEM with an EBSP system, just as it is now considered essential to have the SEM equipped with an energy-dispersive x-ray spectroscopy (EDS) system. There are at least four commercial manufacturers of EBSP systems. In the next few years, then, I anticipate that many owners of existing SEMs as well as buyers of new instruments will be faced with the problem of selecting an EBSP system. This paper presents some of the issues involved in making such a choice.As in many technical decisions, different people will have different needs and put different priorities on the specifications to be met. An instrument which is to be used to do repeated analyses of aluminum for beer cans will have different needs from a system used mostly to teach crystallography, and those will be different in turn from the needs of a system used to determine which phases are present in geological samples.

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31

Shpenik, O. B., T. Yu Popik, and O. R. Ortikov. "Low-energy electron backscattering by Ta surface." Journal of Physics: Conference Series 194, no. 13 (November 1, 2009): 132007. http://dx.doi.org/10.1088/1742-6596/194/13/132007.

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32

Basaglia, Tullio, Min Cheol Han, Gabriela Hoff, Chan Hyeong Kim, Sung Hun Kim, Maria Grazia Pia, and Paolo Saracco. "Investigation of Geant4 Simulation of Electron Backscattering." IEEE Transactions on Nuclear Science 62, no. 4 (August 2015): 1805–12. http://dx.doi.org/10.1109/tns.2015.2442292.

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33

August, H. J., and J. Wernisch. "Analytical Expressions for the Electron Backscattering Coefficient." Physica Status Solidi (a) 114, no. 2 (August 16, 1989): 629–33. http://dx.doi.org/10.1002/pssa.2211140225.

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34

Jablonski, A., J. Zemek, and P. Jiricek. "Elastic electron backscattering from overlayer/substrate systems." Surface and Interface Analysis 31, no. 9 (2001): 825–34. http://dx.doi.org/10.1002/sia.1111.

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35

Jablonski, A., H. S. Hansen, C. Jansson, and S. Tougaard. "Elastic electron backscattering from surfaces with overlayers." Physical Review B 45, no. 7 (February 15, 1992): 3694–702. http://dx.doi.org/10.1103/physrevb.45.3694.

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36

Frujinoiu, C., and R. R. Brey. "A Monte Carlo Investigation of Electron Backscattering." Radiation Protection Dosimetry 97, no. 3 (November 1, 2001): 223–29. http://dx.doi.org/10.1093/oxfordjournals.rpd.a006667.

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37

Mkrtchyan, M. M., and R. C. Farrow. "Modeling of electron backscattering from topographic marks." Journal of Applied Physics 80, no. 12 (December 15, 1996): 7108–17. http://dx.doi.org/10.1063/1.363723.

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38

Frank, L. "Experimental study of electron backscattering at interfaces." Surface Science 269-270 (May 1992): 763–71. http://dx.doi.org/10.1016/0039-6028(92)91346-d.

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39

Jablonski, A., and C. J. Powell. "Effects of Electron Backscattering in Auger Electron Spectroscopy: Recent Developments." Journal of Surface Analysis 15, no. 2 (2008): 139–49. http://dx.doi.org/10.1384/jsa.15.139.

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40

Sei, Norihiro, Hiroshi Ogawa, and QiKa Jia. "Multiple-Collision Free-Electron Laser Compton Backscattering for a High-Yield Gamma-Ray Source." Applied Sciences 10, no. 4 (February 20, 2020): 1418. http://dx.doi.org/10.3390/app10041418.

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We observed multiple-collision free-electron laser (FEL)-Compton backscattering in which a multi-bunch electron beam makes head-on collisions with multi-pulse FELs in an optical cavity, using an infrared FEL system in the storage ring NIJI-IV. It was demonstrated that the measured spectrum of the multiple-collision FEL-Compton backscattering gamma rays was the summation of the spectra of the gamma rays generated at each collision point. Moreover, it was demonstrated that the spatial distribution of the multiple-collision FEL-Compton backscattering gamma rays was the summation of those of the gamma rays generated at each collision point. Our experimental results proved quantitatively that the multiple collisions in the FEL-Compton backscattering process are effective in increasing the yield of the gamma rays. By applying the multiple-collision FEL-Compton backscattering to high-repetition FEL devices such as energy recovery linac FELs, an unprecedented high-yield gamma-ray source with quasi-monochromaticity and wavelength tunability will be realized.

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41

KASHIWAGI, SHIGERU, and RYUNOSUKE KURODA. "STUDY OF COMPTON BACKSCATTERING BETWEEN RELATIVISTIC ELECTRON BEAM AND SASE LIGHT." International Journal of Modern Physics B 21, no. 03n04 (February 10, 2007): 481–87. http://dx.doi.org/10.1142/s0217979207042276.

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Study of Compton backscattering with relativistic high-intense electron beam and single-pass free electron laser (FEL) is carried out to produce high-brightness short X-ray pulse. The single-pass FEL such as SASE is high power coherent light source and the wavelength of the FEL can be tuned changing magnetic field strength of wiggler or undulator continuously. In our study, the relativistic electron beam is generated using a linear accelerator, which is a driver for the FEL. The electron beam is used for both the Compton backscattering and the generation of SASE light. The preliminary experiment of X-ray generation based on Compton backscattering with high-intensity electron beam and infrared SASE light is planed using the L-band linear accelerator at the Institute of Scientific and Industrial Research (ISIR), Osaka University. We will describe the preliminary experiment and the result of numerical studies.

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42

Chen, Ziwei, and Shi-Hao Chen. "A discussion on electron–photon backscattering lasers and the electron–photon backscattering laser in a laser standing wave cavity." Laser Physics 25, no. 4 (March 10, 2015): 045803. http://dx.doi.org/10.1088/1054-660x/25/4/045803.

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43

HERNÁNDEZ, M. P., J. L. PEÑA, C. F. ALONSO, P. BARTOLO-PÉREZ, and M. H. FARÍAS. "AlGe ALLOY COMPOSITION CALCULATED BY AUGER ELECTRON SPECTROSCOPY." Surface Review and Letters 09, no. 05n06 (October 2002): 1709–13. http://dx.doi.org/10.1142/s0218625x02004268.

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The Al and Ge molar fraction of a few surface atomic layers in AlGe binary alloys was calculated using Auger electron spectroscopy (AES) and the evaluation of the Auger electron matrix factor or the matrix correction. The electron backscattering correction factor (R) and the inelastic mean path (IMFP) were taken into account to calculate the matrix correction. The IMFP was obtained from experimental optical data and elastic peak electron spectroscopy (EPES) measurements. The electron backscattering correction factor was calculated using Monte Carlo simulations. The main sources of the uncertainty of the Al and Ge molar fraction of a few surface atomic layers in AlGe binary alloys is the uncertainty of Al IMFP.

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44

PISANI, FRANCESCA, THIÉRY PIERRE, and DIMITRI BATANI. "Microwave coherent backscattering from acoustic or electronic waves in a magnetized plasma." Journal of Plasma Physics 59, no. 1 (January 1998): 69–82. http://dx.doi.org/10.1017/s0022377897006260.

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A microwave coherent backscattering experiment has been carried out on Mirabelle, a weakly ionized plasma device, with the objective of measuring the electron-density fluctuation level. The experiment is a preliminary step in order to prepare the detection system for a microwave stimulated-backscattering experiment. The incident electromagnetic wave is focused in front of a plane grid, which excites ion acoustic or electron Bernstein waves and induces fluctuations in the plasma. The backscattering signal is collected by the launching circuit and detected by homodyne mixing. The typical ratio of the scattered power to the incident power is about 10−12 and the relative density fluctuations is of the order of δne/ne ≈10−3 against a background electron density ne=(1–5)×109 cm−3. The backscattering measurement is also compared with Langmuir-probe measurements, and gives good agreement with the relative density fluctuations. The spectral width of the backscattered signal has also been studied, by taking into account effects due to the incident-wave focusing and plasma-wave damping.

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45

Ортіков, Р. О., and Т. Ю. Попик. "OPTIMIZATION OF PARAMETERS OF HYPOCYCLOIDAL BACKSCATTERING ELECTRON SPECTROMETER." Scientific Herald of Uzhhorod University.Series Physics 21 (August 5, 2007): 151–53. http://dx.doi.org/10.24144/2415-8038.2007.21.151-153.

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46

Kirihara, Y., Y. Namito, H. Iwase, and H. Hirayama. "Monte Carlo simulation of Tabata’s electron backscattering experiments." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 268, no. 15 (August 2010): 2384–90. http://dx.doi.org/10.1016/j.nimb.2009.12.014.

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47

Jablonski, A. "Analytical applications of elastic electron backscattering from surfaces." Progress in Surface Science 74, no. 1-8 (December 2003): 357–74. http://dx.doi.org/10.1016/j.progsurf.2003.08.028.

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48

Zemek, J., P. Jiricek, B. Lesiak, and A. Jablonski. "Surface excitations in electron backscattering from silicon surfaces." Surface Science 562, no. 1-3 (August 2004): 92–100. http://dx.doi.org/10.1016/j.susc.2004.05.093.

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49

Zommer, L., B. Lesiak, and A. Jablonski. "Energy dependence of elastic electron backscattering from solids." Physical Review B 47, no. 20 (May 15, 1993): 13759–62. http://dx.doi.org/10.1103/physrevb.47.13759.

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50

Went, M. R., and M. Vos. "Investigation of binary compounds using electron Rutherford backscattering." Applied Physics Letters 90, no. 7 (February 12, 2007): 072104. http://dx.doi.org/10.1063/1.2535986.

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