Books on the topic 'Electron beam ion trap'

International Symposium on Electron Beam Ion Sources and Traps and their Applications (8th 2000 Upton, N.Y.). Electron beam ion sources and traps and their applications: 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000. Edited by Prelec Krsto. Melville, N.Y: American Institute of Physics, 2001.

Kaufman, Harold R. Operation of broad-beam sources. Alexandria, Va: Commonwealth Scientific Corp., 1987.

Gu, Wenqi. Dian zi shu bao guang wei na jia gong ji shu. Beijing: Beijing gong ye da xue chu ban she, 2004.

Córdoba Castillo, Rosa. Functional Nanostructures Fabricated by Focused Electron/Ion Beam Induced Deposition. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-02081-5.

Popov, V. K. Raschet i proektirovanie ustroĭstv ėlektronnoĭ i ionnoĭ litografii. Moskva: "Radio i svi͡a︡zʹ", 1985.

Dian zi shu sao miao pu guang ji shu. [Peking]: Yu hang chu ban she, 1985.

Ady, Hershcovitch, ed. International Symposium on Electron Beam Ion Sources and Their Applications: Upton, NY, 1988. New York: American Institute of Physics, 1989.

International Symposium on Electron, Ion, and Photon Beams (2nd 1984 Tarrytown, N.Y.). Proceedings of the 1984 International Symposium on Electron, Ion, and Photon Beams, 29 May-1 June, 1984, Westchester Marriott Hotel, Tarrytown, New York. Edited by Kelly J, American Vacuum Society, and American Institute of Physics. New York: Published for the American Vacuum Society by the American Institute of Physics, 1985.

The physics of submicron lithography. New York: Plenum Press, 1992.

Energy-beam processing of materials: Advanced manufacturing using various energy sources. Oxford: Clarendon Press, 1989.

Galloni, R. Investigation on ion implantation as a technique suitable to fabricate high efficiency silicon solar cells ion implanted, electron beam annealed cells. Luxembourg: Commission of the European Communities, 1986.

International Symposium on Electric Beam Ion sources and their Applications (6th 1994 Stockholm, Sweden). Proceedings of the 6th International Symposium on Electric Beam Ion Sources and their Applications: Stockholm, Sweden, June 20-23, 1994. Edited by Liljeby L and European Physical Society. Stockholm, Sweden: Royal Swedish Academy of Sciences, 1997.

S, Khokle W., ed. Patterning of material layers in submicron region. New York: J. Wiley, 1993.

Pfefferkorn Conference (8th 1989 Park City, Utah). Fundamental electron and ion beam interactions with solids for microscopy, microanalysis and microlithography: Proceedings of the 8th Pfefferkorn Conference, held May 7-12, 1989, at Park City, Utah. Edited by Johari Om, Kruit Pieter, Newbury Dale E, Schou Jørgen, and Sharma Ram A. AMF O'Hare, IL: Scanning Microscopy International, 1990.

Fernandez-Pacheco, Amalio. Studies of Nanoconstrictions, Nanowires and Fe₃O₄ Thin Films: Electrical Conduction and Magnetic Properties. Fabrication by Focused Electron/Ion Beam. Berlin, Heidelberg: Springer-Verlag Berlin Heidelberg, 2011.

International Symposium on Electron, Ion and Photon Beams (39th 1995 Scottsdale, Az). Papers from the 39th International Symposiumon Electron, Ion and Photon Beam Technology and Nanofabrication, 30 May-2 June 1995, ... Scottsdale, Arizona. Edited by Kern Dieter. New York: American Institute of Physics for the American Vacuum Society, 1995.

M, Copley S., Singh J, ASM International, and Minerals, Metals and Materials Society., eds. International Conference on Beam Processing of Advanced Materials: Proceedings of a symposium held at Materials Week '92 in Chicago, Illinois, November 2-5, 1992. Warrendale, Pa: Minerals, Metals & Materials Society, 1993.

Prima. Official Sega Genesis: Power Tips Book, Volume 3. Rocklin, CA: Prima Publishing, 1994.

Electron Beam Ion Sources And Traps And Their Applications: 8th International Symposium (AIP Conference Proceedings). Springer, 2001.

Castillo, Rosa Córdoba. Functional Nanostructures Fabricated by Focused Electron/Ion Beam Induced Deposition. Springer, 2013.

Castillo, Rosa Córdoba Córdoba. Functional Nanostructures Fabricated by Focused Electron/Ion Beam Induced Deposition. Springer, 2016.

Resnick, Douglas J. Electron-Beam, X-Ray, and Ion-Beam Technology: Submicrometer Lithographies IX (Spie Proceedings , Vol 1263). SPIE-International Society for Optical Engine, 1990.

D, Blais Phillip, and Society of Photo-optical Instrumentation Engineers., eds. Electron-beam, x-ray, and ion-beam lithographies VI: [proceedings] 5-6 March 1987, Santa Clara, California. Bellingham, Wash., USA: The Society, 1987.

W, Yanof Arnold, Society of Photo-optical Instrumentation Engineers., and SPIE Symposium on Microlithography (1989 : San Jose, Calif.), eds. Electron-beam, X-ray, and ion-beam technology: Submicrometer lithographies VIII : 1-3 March 1989, San Jose, California. Bellingham, Wash., USA: SPIE, 1989.

D, Blais Phillip, and Society of Photo-optical Instrumentation Engineers., eds. Electron-beam, x-ray & ion-beam techniques for submicrometer lithographies V: 11-12 March 1986, Santa Clara, California. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1986.

J, Resnick Douglas, and Society of Photo-optical Instrumentation Engineers., eds. Electron-beam, X-ray, and ion-beam technology: Submicrometer lithographies IX : 7-8 March 1990, San Jose, California. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1990.

D, Blais Phillip, and International Society for Hybrid Microelectronics., eds. Electron-beam, X-ray, & ion-beam techniques for submicrometer lithographies V: 11-12 March, 1986, Santa Clara, California. Bellinham, Wash., USA: SPIE--the International Society for Optical Engineering, 1986.

W, Yanof Arnold, and Society of Photo-optical Instrumentation Engineers., eds. Electron-beam, X-ray, and ion-beam technology: Submicrometer lithographies VII : 2-4 March 1988, Santa Clara, California. Bellingham, Wash., USA: The Society, 1988.

1946-, Peckerar Martin Charles, and Society of Photo-optical Instrumentation Engineers., eds. Electon-beam, X-ray, and ion-beam submicrometer lithographies for manufacturing: 6-7 March 1991, San Jose, California. Bellingham, Wash: SPIE, 1991.

D, Blais Phillip, and International Society for Hybrid Microelectronics., eds. Electron-beam, X-ray, and ion-beam techniques for submicrometer lithographies IV: March 14-15, 1985, Santa Clara, California. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1985.

Yanof, Arnold W. Electron-Beam, X Ray, and Ion-Beam Technology; Submicrometer Lithographics VII (Proceedings of SPIE--the International Society for Optical Engineering). Society of Photo Optical, 1988.

O, Patterson David, and Society of Photo-optical Instrumentation Engineers., eds. Electron-beam, X-ray, and ion-beam submicrometer lithographies for manufacturing III: 1-2 March 1993, San Jose, California. Bellingham, Wash: The Society, 1993.

1946-, Peckerar Martin Charles, and Society of Photo-optical Instrumentation Engineers., eds. Electron-beam, X-ray, and ion-beam submicrometer lithographies for manufacturing II: 8-9 March 1992, San Jose, California. Bellingham, Wash: SPIE, 1992.

M, Warlaumont John, Society of Photo-optical Instrumentation Engineers., and Semiconductor Equipment and Materials International., eds. Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing V: 20-21 February 1995, Santa Clara, California. Bellingham, Wash., USA: SPIE, 1995.

E, Seeger David, Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International., and SEMATECH (Organization), eds. Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing VI: 11-13 March 1996, Santa Clara, California. Bellingham, Wash: SPIE, 1996.

Kleintop, Brent Lamar. Development and application of particle beam LC/MS on the quadrupole ion trap mass spectrometer. 1993.

O, Patterson David, Society of Photo-optical Instrumentation Engineers., and Semiconductor Equipment and Materials International., eds. Electron-beam, X-ray, and ion-beam submicrometer lithographies for manufacturing IV: 28 February-1 March 1994, San Jose, California. Bellingham, Wash: SPIE, 1994.

James, A. W. Controlled Removal by Ion Beam Etching of Surface Contaminant Layers on Transmission Electron Microscope Specimens. AEA Technology Plc, 1986.

V, Mjakin Sergey, Sychov Maxim M, and Vasiljeva Inna V, eds. Electron beam modification of solids: Mechanisms, common features, and promising applications. Hauppauge, NY, USA: Nova Science Publishers, 2009.

James, Bondur, Reinberg Alan R, and Society of Photo-optical Instrumentation Engineers., eds. Dry processing for submicrometer lithography: 12-13 October 1989, Santa Clara, California. Bellingham, Wash., USA: The Society, 1990.

Berberich, David Wayne. Fundamental studies of chemical ionization and charge exchange ionization for quadrupole ion trap mass spectrometry. 1988.

Knapp, James A., Peter Børgesen, and Raymond A. Zuhr. Beam-Solid Interactions : : Volume 157: Physical Phenomena. University of Cambridge ESOL Examinations, 2014.

M, Spivak V., ed. Sistemy upravlenii͡a︡ luchevykh tekhnologicheskikh ustanovok. Kiev: "Tekhnika", 1988.

Ann, MacDonald Carolyn, and Society of Photo-optical Instrumentation Engineers., eds. EUV, X-ray, and neutron optics and sources: 21-23 July 1999, Denver, Colorado. Bellingham, Wash., USA: SPIE, 1999.

Fernandez-Pacheco, Amalio. Studies of Nanoconstrictions, Nanowires and Fe3O4 Thin Films: Electrical Conduction and Magnetic Properties. Fabrication by Focused Electron/Ion Beam. Springer, 2011.

Fernandez-Pacheco, Amalio. Studies of Nanoconstrictions, Nanowires and Fe3O4 Thin Films: Electrical Conduction and Magnetic Properties. Fabrication by Focused Electron/Ion Beam. Springer, 2013.

Hershcovitch, Ady. International Symposium on Electron Beam Ion Sources and their Applications: Upton, NY 1988 (AIP Conference Proceedings / Particles and Fields Series). American Institute of Physics, 1998.

Fernández-Pacheco Chicón, Amalio. Electrical conduction and magnetic properties of nanoconstrictions and nanowires created by focused electron/ion beam and of Fe3O4 thin films. Prensas Universitarias de Zaragoza, 2009. http://dx.doi.org/10.26754/uz.978-84-92774-52-4.

Peter, Sigmund, and Kongelige Danske videnskabernes selskab, eds. Ion beam science: Solved and unsolved problems : invited lectures presented at a symposium arranged by the Royal Danish Academy of Sciences and Letters, Copenhagen, 1-5 May 2006. Copenhagen: Det Kongelige Danske Videnskabernes Selskab, 2006.

C, Jacobson Dale, ed. Beam-solid interactions for materials synthesis and characterization: Symposium held November 28-December 2, 1994, Boston, Massachusetts, U.S.A. Pittsburgh, Pa: Materials Research Society, 1995.