Academic literature on the topic 'Electron circuits'
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Journal articles on the topic "Electron circuits"
Nicholls, David G. "Mitochondrial ion circuits." Essays in Biochemistry 47 (June 14, 2010): 25–35. http://dx.doi.org/10.1042/bse0470025.
Full textTAMEE, KREANGSAK, and PREECHA P. YUPAPIN. "PSYCHIATRIC INVESTIGATION USING WGMs IN MICRORING CIRCUITS." Journal of Innovative Optical Health Sciences 06, no. 04 (2013): 1350044. http://dx.doi.org/10.1142/s1793545813500442.
Full textRo¨sner, W., F. Hofmann, T. Vogelsang, and L. Risch. "Simulation of single electron circuits." Microelectronic Engineering 27, no. 1-4 (1995): 55–58. http://dx.doi.org/10.1016/0167-9317(94)00055-y.
Full textOYA, TAKAHIDE, IKUKO N. MOTOIKE, and TETSUYA ASAI. "SINGLE-ELECTRON CIRCUITS PERFORMING DENDRITIC PATTERN FORMATION WITH NATURE-INSPIRED CELLULAR AUTOMATA." International Journal of Bifurcation and Chaos 17, no. 10 (2007): 3651–55. http://dx.doi.org/10.1142/s0218127407019512.
Full textHrámcov, István, Timotei István Erdei, Roland Décsei, and Géza Husi. "Design of Electron Tube and Semiconductor-Based and Voltage Stabilised Amplifier Circuits." Műszaki Tudományos Közlemények 13, no. 1 (2020): 81–85. http://dx.doi.org/10.33894/mtk-2020.13.13.
Full textSnowden, Christopher M. "Modeling of Thermal Effects in Semiconductor Structures." VLSI Design 8, no. 1-4 (1998): 53–58. http://dx.doi.org/10.1155/1998/69743.
Full textZhou, You Jie, Chun Hua Xiong, and Chang Bo Lu. "A Novel Comparator Circuit of Single-Electron and MOS Transistors." Applied Mechanics and Materials 120 (October 2011): 516–19. http://dx.doi.org/10.4028/www.scientific.net/amm.120.516.
Full textDesplats, R., P. Perdu, B. Benteo, and A. Grang. "Electron Beam Testing of FPGA Circuits." Microelectronics Reliability 39, no. 6-7 (1999): 963–68. http://dx.doi.org/10.1016/s0026-2714(99)00131-6.
Full textKuwamura, Nobuhiro, Kenji Taniguchi, and Chihiro Hamaguchi. "Simulation of single-electron logic circuits." Electronics and Communications in Japan (Part II: Electronics) 77, no. 9 (1994): 65–73. http://dx.doi.org/10.1002/ecjb.4420770908.
Full textAncona, M. G. "Single-phase single-electron digital circuits." Journal of Applied Physics 81, no. 7 (1997): 3311–15. http://dx.doi.org/10.1063/1.364316.
Full textDissertations / Theses on the topic "Electron circuits"
Wasshuber, Christoph. "About single-electron devices and circuits /." Wien : Österr. Kunst- und Kulturverl, 1998. http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=008183172&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA.
Full textStone, Nicholas Jim. "Single electron memory and logic circuits." Thesis, University of Cambridge, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.621922.
Full textGarth, S. C. J. "Electron beam testing of operating integrated circuits." Thesis, University of Cambridge, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.304338.
Full textFakolujo, Olasebikan Aladeo. "Inorganic electron-beam resists for integrated circuits." Thesis, Imperial College London, 1988. http://hdl.handle.net/10044/1/47055.
Full textFranca, Ecio Jose. "ESTRUTURA ELETRONICA DE IMPUREZAS ISOLADAS DE BORO E DOS PARES DE IMPUREZAS BORO-SILICIO E METAL DE TRANSICAO-VACANCIA EM CRISTAL DE GaAs." Universidade de São Paulo, 1996. http://www.teses.usp.br/teses/disponiveis/43/43133/tde-06062017-150805/.
Full textJalil, Mansoor Abdul. "Theory and simulation of single electron tunnelling circuits." Thesis, University of Cambridge, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.624258.
Full textDellith, Meike. "Electron microscope investigations of defects in DRAMs." Thesis, University of Oxford, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.334379.
Full textÖnel, Hakan. "Electron acceleration in a flare plasma via coronal circuits." Phd thesis, Universität Potsdam, 2008. http://opus.kobv.de/ubp/volltexte/2009/2903/.
Full textBulnes, Cuetara Gregory. "Fluctuation theorem for quantum electron transport in mesoscopic circuits." Doctoral thesis, Universite Libre de Bruxelles, 2013. http://hdl.handle.net/2013/ULB-DIPOT:oai:dipot.ulb.ac.be:2013/209435.
Full textBlanco, Sonia GarciÌa. "Electron-beam modification of silica for integrated optics." Thesis, University of Glasgow, 2003. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.272890.
Full textBooks on the topic "Electron circuits"
Paynter, Robert T. Introductory electric circuits: Electron flow version. Prentice Hall, 1999.
Find full textFloyd, Thomas L. Principles of electric circuits: Electron flow version. 6th ed. Prentice Hall, 2003.
Find full textFloyd, Thomas L. Principles of electric circuits: Electron flow version. 2nd ed. Merrill Pub. Co., 1990.
Find full textPrinciples of electric circuits: Electron flow version. 9th ed. Prentice Hall, 2009.
Find full textFloyd, Thomas L. Principles of electric circuits: Electron-flow version. 5th ed. Prentice Hall, 2000.
Find full textFloyd, Thomas L. Principles of electric circuits: Electron flow version. 8th ed. Pearson Prentice Hall, 2007.
Find full textFloyd, Thomas L. Principles of electric circuits: Electron flow version. 4th ed. Prentice Hall, 1997.
Find full textPaynter, Robert T. Electronic technology fundamentals: Electron flow version. 3rd ed. Pearson Prentice Hall, 2008.
Find full textPaynter, Robert T. Introductory electronic devices and circuits: Electron flow version. 6th ed. Prentice Hall, 2003.
Find full textPaynter, Robert T. Introductory electronic devices and circuits: Electron flow version. 2nd ed. Prentice Hall, 1991.
Find full textBook chapters on the topic "Electron circuits"
Shur, Michael. "Transferred Electron Oscillators." In GaAs Devices and Circuits. Springer US, 1987. http://dx.doi.org/10.1007/978-1-4899-1989-2_5.
Full textLowry, Robert K. "Auger Electron Spectroscopy." In Failure Analysis of Integrated Circuits. Springer US, 1999. http://dx.doi.org/10.1007/978-1-4615-4919-2_13.
Full textRalph, J. F., R. Whiteman, J. Diggins, et al. "Quantum Electrodynamics in Superconducting Circuits." In Electron Theory and Quantum Electrodynamics. Springer US, 1997. http://dx.doi.org/10.1007/978-1-4899-0081-4_8.
Full textBanerjee, Kaustav, and Shuji Ikeda. "VLSI Technology and Circuits." In Guide to State-of-the-Art Electron Devices. John Wiley & Sons, Ltd, 2013. http://dx.doi.org/10.1002/9781118517543.ch11.
Full textShur, Michael. "Transferred Electron Amplifiers and Logic and Functional Devices." In GaAs Devices and Circuits. Springer US, 1987. http://dx.doi.org/10.1007/978-1-4899-1989-2_6.
Full textPark, Ji-Yong. "Band Structure and Electron Transport Physics of One-Dimensional SWNTs." In Integrated Circuits and Systems. Springer US, 2008. http://dx.doi.org/10.1007/978-0-387-69285-2_1.
Full textOates, Anthony S., Richard C. Blish, Gennadi Bersuker, and Lu Kasprzak. "Reliability of Electron Devices, Interconnects and Circuits." In Guide to State-of-the-Art Electron Devices. John Wiley & Sons, Ltd, 2013. http://dx.doi.org/10.1002/9781118517543.ch9.
Full textCapasso, F., S. Sen, F. Beltram, and A. Y. Cho. "Resonant Tunnelling and Superlattice Devices: Physics and Circuits." In Physics of Quantum Electron Devices. Springer Berlin Heidelberg, 1990. http://dx.doi.org/10.1007/978-3-642-74751-9_7.
Full textZhao, Bin, and James A. Hutchby. "Mixed-Signal Technologies and Integrated Circuits." In Guide to State-of-the-Art Electron Devices. John Wiley & Sons, Ltd, 2013. http://dx.doi.org/10.1002/9781118517543.ch12.
Full textCole, Edward I., and Daniel L. Barton. "Failure Site Isolation: Photon Emission Microscopy Optical/Electron Beam Techniques." In Failure Analysis of Integrated Circuits. Springer US, 1999. http://dx.doi.org/10.1007/978-1-4615-4919-2_6.
Full textConference papers on the topic "Electron circuits"
Wooley, B., and T. Iizuka. "Session 10 Integrated circuits: Advanced circuit technologies." In 1985 International Electron Devices Meeting. IRE, 1985. http://dx.doi.org/10.1109/iedm.1985.190945.
Full textNakano, T., and R. Roop. "Session 18 Integrated circuits—Advanced circuit technologies." In 1986 International Electron Devices Meeting. IRE, 1986. http://dx.doi.org/10.1109/iedm.1986.191221.
Full textGreene, R., H. Gray, and G. Campisi. "Vacuum integrated circuits." In 1985 International Electron Devices Meeting. IRE, 1985. http://dx.doi.org/10.1109/iedm.1985.190922.
Full textNoble, W., and E. Cohen. "Session 18 Integrated circuits—Modeling and analysis of MOS circuits." In 1985 International Electron Devices Meeting. IRE, 1985. http://dx.doi.org/10.1109/iedm.1985.191009.
Full textAkazawa, Masamichi. "Quantum Hopfield Network Using Single-Electron Circuits." In 1997 International Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 1997. http://dx.doi.org/10.7567/ssdm.1997.b-8-3.
Full text"Subcommittee on Integrated Circuits and Manufacturing." In 2006 International Electron Devices Meeting. IEEE, 2006. http://dx.doi.org/10.1109/iedm.2006.346751.
Full textHomma, N. "Designing Secure Cryptographic Circuits." In 2019 IEEE International Electron Devices Meeting (IEDM). IEEE, 2019. http://dx.doi.org/10.1109/iedm19573.2019.8993646.
Full textSteinhauser, M., C. Korbs, and R. Bauer. "Electron beam welding of micro-housings with dissimilar metals for electronic circuits." In 2012 35th International Spring Seminar on Electronics Technology (ISSE). IEEE, 2012. http://dx.doi.org/10.1109/isse.2012.6273128.
Full textCole, Edward I. "Laser-Based Defect Localization on Integrated Circuits." In 2006 International Electron Devices Meeting. IEEE, 2006. http://dx.doi.org/10.1109/iedm.2006.346968.
Full textVaradarajan, Vidya, Yuri Yasuda, Sriram Balasubramanian, and Tsu-Jae King Liu. "WireFET Technology for 3-D Integrated Circuits." In 2006 International Electron Devices Meeting. IEEE, 2006. http://dx.doi.org/10.1109/iedm.2006.346982.
Full textReports on the topic "Electron circuits"
Averin, D. V. Semiconductor Single-Electron Digital Devices and Circuits. Defense Technical Information Center, 1993. http://dx.doi.org/10.21236/ada278338.
Full textPotma, Eric O. Ultrafast electron transport across nano gaps in nanowire circuits. Office of Scientific and Technical Information (OSTI), 2015. http://dx.doi.org/10.2172/1206544.
Full textWu, Judy, and Siyuan Han. Low Temperature Scanning Electron Microscope for Fabrication and Characterization of High-Tc Josephson Junctions and Circuits. Defense Technical Information Center, 2000. http://dx.doi.org/10.21236/ada383240.
Full textLoescher, Douglas H. Predicting the reliability of electronic circuits. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/919204.
Full textMartin, Alain J., Mika Nystroem, and Catherine G. Wong. Design Tools for Integrated Asynchronous Electronic Circuits. Defense Technical Information Center, 2003. http://dx.doi.org/10.21236/ada417138.
Full textNyquist, Dennis P. Electromagnetic Interactions in High-Speed Integrated Electronic Circuits. Defense Technical Information Center, 1989. http://dx.doi.org/10.21236/ada206882.
Full textWheat, Jr., Robert M. Chaos in Electronic Circuits: Nonlinear Time Series Analysis. Office of Scientific and Technical Information (OSTI), 2003. http://dx.doi.org/10.2172/821547.
Full textJohnson, Mark, and Raymond Scanlon. Machine Intelligence, a Foreword: The Brain as Electronic Circuitry; Electronic Circuitry as a Brain. Defense Technical Information Center, 1992. http://dx.doi.org/10.21236/ada255283.
Full textNicklaw, Christopher, Mark Maurer, Chuck Tabbert, and Randall Milanowski. Hierarchical CAD Tools for Radiation Hardened Mixed Signal Electronic Circuits. Defense Technical Information Center, 2005. http://dx.doi.org/10.21236/ada429971.
Full textSedykh, P. A. Global Electric Circuit: Solar Wind, Magnetosphere, Ionosphere, Atmosphere. Balkan, Black sea and Caspian sea Regional Network for Space Weather Studies, 2019. http://dx.doi.org/10.31401/sungeo.2019.01.09.
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