Academic literature on the topic 'Electron circuits'

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Journal articles on the topic "Electron circuits"

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Nicholls, David G. "Mitochondrial ion circuits." Essays in Biochemistry 47 (June 14, 2010): 25–35. http://dx.doi.org/10.1042/bse0470025.

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Proton circuits across the inner mitochondrial membrane link the primary energy generators, namely the complexes of the electron transport chain, to multiple energy utilizing processes, including the ATP synthase, inherent proton leak pathways, metabolite transport and linked circuits of sodium and calcium. These mitochondrial circuits can be monitored in both isolated preparations and intact cells and, for the primary proton circuit techniques, exist to follow both the proton current and proton electrochemical potential components of the circuit in parallel experiments, providing a quantitati
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TAMEE, KREANGSAK, and PREECHA P. YUPAPIN. "PSYCHIATRIC INVESTIGATION USING WGMs IN MICRORING CIRCUITS." Journal of Innovative Optical Health Sciences 06, no. 04 (2013): 1350044. http://dx.doi.org/10.1142/s1793545813500442.

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The use of an electrical probe is formed by whispering gallery modes (WGMs) of light within the coated microring circuits, in which the electrical signal is generated by trapped electron tunneling along the circular path of the coated microring circuit. The collection of electrons is formed within the WGMs, where in this study, a modified nonlinear microring resonator known as a PANDA ring resonator is coated by gold material and forms the mirroring circuit. The induced current (magnetic field) within the circuit occurs by the coupling effects between trapped electrons and coated ring, which c
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Ro¨sner, W., F. Hofmann, T. Vogelsang, and L. Risch. "Simulation of single electron circuits." Microelectronic Engineering 27, no. 1-4 (1995): 55–58. http://dx.doi.org/10.1016/0167-9317(94)00055-y.

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OYA, TAKAHIDE, IKUKO N. MOTOIKE, and TETSUYA ASAI. "SINGLE-ELECTRON CIRCUITS PERFORMING DENDRITIC PATTERN FORMATION WITH NATURE-INSPIRED CELLULAR AUTOMATA." International Journal of Bifurcation and Chaos 17, no. 10 (2007): 3651–55. http://dx.doi.org/10.1142/s0218127407019512.

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We propose a novel semiconductor device in which electronic-analogue dendritic trees grow on multilayer single-electron circuits. A simple cellular-automaton circuit was designed for generating dendritic patterns by utilizing the physical properties of single-electron devices, i.e. quantum and thermal effects in tunneling junctions. We demonstrate typical operations of the proposed circuit through extensive numerical simulations.
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Hrámcov, István, Timotei István Erdei, Roland Décsei, and Géza Husi. "Design of Electron Tube and Semiconductor-Based and Voltage Stabilised Amplifier Circuits." Műszaki Tudományos Közlemények 13, no. 1 (2020): 81–85. http://dx.doi.org/10.33894/mtk-2020.13.13.

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Abstract In this project, an electron tube circuit consisting of a voltage stabiliser, preamplifier, and final stage amplifier circuit was designed. One of the main aims was to reuse as many components and materials as possible, thereby decreasing the project’s ecological footprint. The result is a hybrid electron tube amplifier. The function of the circuits was subsequently measured and analysed using various tests.
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Snowden, Christopher M. "Modeling of Thermal Effects in Semiconductor Structures." VLSI Design 8, no. 1-4 (1998): 53–58. http://dx.doi.org/10.1155/1998/69743.

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A fully coupled electro-thermal hydrodynamic model is described which is suitable for modelling active devices. The model is applied to the non-isothermal simulation of pseudomorphic high electron mobility transistors (pHEMTs). A large-scale surface temperature model is described which allows thermal modelling of semiconductor devices and monolithic circuits. An example of the application of thermal modelling to monolithic circuit characterization is given.
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Zhou, You Jie, Chun Hua Xiong, and Chang Bo Lu. "A Novel Comparator Circuit of Single-Electron and MOS Transistors." Applied Mechanics and Materials 120 (October 2011): 516–19. http://dx.doi.org/10.4028/www.scientific.net/amm.120.516.

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A novel combination of single-electron transistors (SET) with MOS transistors is advanced to create inverter, which, compared with the pure SET circuit, is considerably augmented in its voltage gain and drive capability. Then a close analysis was conducted of the inverter, on the basis of which other logic gates were presented, thus achieving a circuit of two-bit digital comparator. The accuracy of the circuit is verified through the test on SPICE. This hybrid circuit shares the merits with both SET circuit and MOS circuit. Compared with the traditional circuits, this one uses fewer electronic
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Desplats, R., P. Perdu, B. Benteo, and A. Grang. "Electron Beam Testing of FPGA Circuits." Microelectronics Reliability 39, no. 6-7 (1999): 963–68. http://dx.doi.org/10.1016/s0026-2714(99)00131-6.

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Kuwamura, Nobuhiro, Kenji Taniguchi, and Chihiro Hamaguchi. "Simulation of single-electron logic circuits." Electronics and Communications in Japan (Part II: Electronics) 77, no. 9 (1994): 65–73. http://dx.doi.org/10.1002/ecjb.4420770908.

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Ancona, M. G. "Single-phase single-electron digital circuits." Journal of Applied Physics 81, no. 7 (1997): 3311–15. http://dx.doi.org/10.1063/1.364316.

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Dissertations / Theses on the topic "Electron circuits"

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Wasshuber, Christoph. "About single-electron devices and circuits /." Wien : Österr. Kunst- und Kulturverl, 1998. http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=008183172&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA.

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Stone, Nicholas Jim. "Single electron memory and logic circuits." Thesis, University of Cambridge, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.621922.

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Garth, S. C. J. "Electron beam testing of operating integrated circuits." Thesis, University of Cambridge, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.304338.

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Fakolujo, Olasebikan Aladeo. "Inorganic electron-beam resists for integrated circuits." Thesis, Imperial College London, 1988. http://hdl.handle.net/10044/1/47055.

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Franca, Ecio Jose. "ESTRUTURA ELETRONICA DE IMPUREZAS ISOLADAS DE BORO E DOS PARES DE IMPUREZAS BORO-SILICIO E METAL DE TRANSICAO-VACANCIA EM CRISTAL DE GaAs." Universidade de São Paulo, 1996. http://www.teses.usp.br/teses/disponiveis/43/43133/tde-06062017-150805/.

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Apresentamos aqui resultados de propriedades eletrônicas relacionadas à defeitos complexos em GaAs. Os cálculos autoconsistentes da estrutura eletrônica foram feitos usando o método do espalhamento múltiplo X a junto com o modelo do aglomerado molecular e com os orbitais de superfície saturados com a esfera de Watson.<br>We repor! resu/ts for e/ectronic properties related to complex defects in GaAs. The self-consistent-fie/d electronic structure ca/culations were performed by using the multiplescattering X a method within framework of Watson-sphere-terminated molecular cluster model. We have s
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Jalil, Mansoor Abdul. "Theory and simulation of single electron tunnelling circuits." Thesis, University of Cambridge, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.624258.

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Dellith, Meike. "Electron microscope investigations of defects in DRAMs." Thesis, University of Oxford, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.334379.

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Önel, Hakan. "Electron acceleration in a flare plasma via coronal circuits." Phd thesis, Universität Potsdam, 2008. http://opus.kobv.de/ubp/volltexte/2009/2903/.

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The Sun is a star, which due to its proximity has a tremendous influence on Earth. Since its very first days mankind tried to "understand the Sun", and especially in the 20th century science has uncovered many of the Sun's secrets by using high resolution observations and describing the Sun by means of models. As an active star the Sun's activity, as expressed in its magnetic cycle, is closely related to the sunspot numbers. Flares play a special role, because they release large energies on very short time scales. They are correlated with enhanced electromagnetic emissions all over the spect
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Bulnes, Cuetara Gregory. "Fluctuation theorem for quantum electron transport in mesoscopic circuits." Doctoral thesis, Universite Libre de Bruxelles, 2013. http://hdl.handle.net/2013/ULB-DIPOT:oai:dipot.ulb.ac.be:2013/209435.

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Dans cette thèse nous étudions les propriétés statistique des courants dans des systèmes à l'échelle mésoscopique. Nous utilisons le formalisme de la statistique de comptage afin de caractériser les fluctuations de courant importantes à cette échelle. Celle-ci est obtenue en partant du Hamiltonien microscopique décrivant la dynamique des électrons sur le circuit considéré dans le régime quantique.<p>Nous considérons deux modèles particuliers de circuits à deux canaux, chacun comportant deux électrodes. Le premier modèle étudié est constitué de deux plots quantiques en couplage capacitif, et ch
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Blanco, Sonia García. "Electron-beam modification of silica for integrated optics." Thesis, University of Glasgow, 2003. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.272890.

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Books on the topic "Electron circuits"

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Paynter, Robert T. Introductory electric circuits: Electron flow version. Prentice Hall, 1999.

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Floyd, Thomas L. Principles of electric circuits: Electron flow version. 6th ed. Prentice Hall, 2003.

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Floyd, Thomas L. Principles of electric circuits: Electron flow version. 2nd ed. Merrill Pub. Co., 1990.

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Principles of electric circuits: Electron flow version. 9th ed. Prentice Hall, 2009.

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Floyd, Thomas L. Principles of electric circuits: Electron-flow version. 5th ed. Prentice Hall, 2000.

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Floyd, Thomas L. Principles of electric circuits: Electron flow version. 8th ed. Pearson Prentice Hall, 2007.

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Floyd, Thomas L. Principles of electric circuits: Electron flow version. 4th ed. Prentice Hall, 1997.

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Paynter, Robert T. Electronic technology fundamentals: Electron flow version. 3rd ed. Pearson Prentice Hall, 2008.

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Paynter, Robert T. Introductory electronic devices and circuits: Electron flow version. 6th ed. Prentice Hall, 2003.

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Paynter, Robert T. Introductory electronic devices and circuits: Electron flow version. 2nd ed. Prentice Hall, 1991.

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Book chapters on the topic "Electron circuits"

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Shur, Michael. "Transferred Electron Oscillators." In GaAs Devices and Circuits. Springer US, 1987. http://dx.doi.org/10.1007/978-1-4899-1989-2_5.

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Lowry, Robert K. "Auger Electron Spectroscopy." In Failure Analysis of Integrated Circuits. Springer US, 1999. http://dx.doi.org/10.1007/978-1-4615-4919-2_13.

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Ralph, J. F., R. Whiteman, J. Diggins, et al. "Quantum Electrodynamics in Superconducting Circuits." In Electron Theory and Quantum Electrodynamics. Springer US, 1997. http://dx.doi.org/10.1007/978-1-4899-0081-4_8.

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Banerjee, Kaustav, and Shuji Ikeda. "VLSI Technology and Circuits." In Guide to State-of-the-Art Electron Devices. John Wiley & Sons, Ltd, 2013. http://dx.doi.org/10.1002/9781118517543.ch11.

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Shur, Michael. "Transferred Electron Amplifiers and Logic and Functional Devices." In GaAs Devices and Circuits. Springer US, 1987. http://dx.doi.org/10.1007/978-1-4899-1989-2_6.

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Park, Ji-Yong. "Band Structure and Electron Transport Physics of One-Dimensional SWNTs." In Integrated Circuits and Systems. Springer US, 2008. http://dx.doi.org/10.1007/978-0-387-69285-2_1.

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Oates, Anthony S., Richard C. Blish, Gennadi Bersuker, and Lu Kasprzak. "Reliability of Electron Devices, Interconnects and Circuits." In Guide to State-of-the-Art Electron Devices. John Wiley & Sons, Ltd, 2013. http://dx.doi.org/10.1002/9781118517543.ch9.

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Capasso, F., S. Sen, F. Beltram, and A. Y. Cho. "Resonant Tunnelling and Superlattice Devices: Physics and Circuits." In Physics of Quantum Electron Devices. Springer Berlin Heidelberg, 1990. http://dx.doi.org/10.1007/978-3-642-74751-9_7.

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Zhao, Bin, and James A. Hutchby. "Mixed-Signal Technologies and Integrated Circuits." In Guide to State-of-the-Art Electron Devices. John Wiley & Sons, Ltd, 2013. http://dx.doi.org/10.1002/9781118517543.ch12.

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Cole, Edward I., and Daniel L. Barton. "Failure Site Isolation: Photon Emission Microscopy Optical/Electron Beam Techniques." In Failure Analysis of Integrated Circuits. Springer US, 1999. http://dx.doi.org/10.1007/978-1-4615-4919-2_6.

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Conference papers on the topic "Electron circuits"

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Wooley, B., and T. Iizuka. "Session 10 Integrated circuits: Advanced circuit technologies." In 1985 International Electron Devices Meeting. IRE, 1985. http://dx.doi.org/10.1109/iedm.1985.190945.

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Nakano, T., and R. Roop. "Session 18 Integrated circuits&#8212;Advanced circuit technologies." In 1986 International Electron Devices Meeting. IRE, 1986. http://dx.doi.org/10.1109/iedm.1986.191221.

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Greene, R., H. Gray, and G. Campisi. "Vacuum integrated circuits." In 1985 International Electron Devices Meeting. IRE, 1985. http://dx.doi.org/10.1109/iedm.1985.190922.

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Noble, W., and E. Cohen. "Session 18 Integrated circuits&#8212;Modeling and analysis of MOS circuits." In 1985 International Electron Devices Meeting. IRE, 1985. http://dx.doi.org/10.1109/iedm.1985.191009.

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Akazawa, Masamichi. "Quantum Hopfield Network Using Single-Electron Circuits." In 1997 International Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 1997. http://dx.doi.org/10.7567/ssdm.1997.b-8-3.

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"Subcommittee on Integrated Circuits and Manufacturing." In 2006 International Electron Devices Meeting. IEEE, 2006. http://dx.doi.org/10.1109/iedm.2006.346751.

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Homma, N. "Designing Secure Cryptographic Circuits." In 2019 IEEE International Electron Devices Meeting (IEDM). IEEE, 2019. http://dx.doi.org/10.1109/iedm19573.2019.8993646.

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Steinhauser, M., C. Korbs, and R. Bauer. "Electron beam welding of micro-housings with dissimilar metals for electronic circuits." In 2012 35th International Spring Seminar on Electronics Technology (ISSE). IEEE, 2012. http://dx.doi.org/10.1109/isse.2012.6273128.

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Cole, Edward I. "Laser-Based Defect Localization on Integrated Circuits." In 2006 International Electron Devices Meeting. IEEE, 2006. http://dx.doi.org/10.1109/iedm.2006.346968.

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Varadarajan, Vidya, Yuri Yasuda, Sriram Balasubramanian, and Tsu-Jae King Liu. "WireFET Technology for 3-D Integrated Circuits." In 2006 International Electron Devices Meeting. IEEE, 2006. http://dx.doi.org/10.1109/iedm.2006.346982.

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Reports on the topic "Electron circuits"

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Averin, D. V. Semiconductor Single-Electron Digital Devices and Circuits. Defense Technical Information Center, 1993. http://dx.doi.org/10.21236/ada278338.

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Potma, Eric O. Ultrafast electron transport across nano gaps in nanowire circuits. Office of Scientific and Technical Information (OSTI), 2015. http://dx.doi.org/10.2172/1206544.

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Wu, Judy, and Siyuan Han. Low Temperature Scanning Electron Microscope for Fabrication and Characterization of High-Tc Josephson Junctions and Circuits. Defense Technical Information Center, 2000. http://dx.doi.org/10.21236/ada383240.

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Loescher, Douglas H. Predicting the reliability of electronic circuits. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/919204.

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Martin, Alain J., Mika Nystroem, and Catherine G. Wong. Design Tools for Integrated Asynchronous Electronic Circuits. Defense Technical Information Center, 2003. http://dx.doi.org/10.21236/ada417138.

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Nyquist, Dennis P. Electromagnetic Interactions in High-Speed Integrated Electronic Circuits. Defense Technical Information Center, 1989. http://dx.doi.org/10.21236/ada206882.

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Wheat, Jr., Robert M. Chaos in Electronic Circuits: Nonlinear Time Series Analysis. Office of Scientific and Technical Information (OSTI), 2003. http://dx.doi.org/10.2172/821547.

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Johnson, Mark, and Raymond Scanlon. Machine Intelligence, a Foreword: The Brain as Electronic Circuitry; Electronic Circuitry as a Brain. Defense Technical Information Center, 1992. http://dx.doi.org/10.21236/ada255283.

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Nicklaw, Christopher, Mark Maurer, Chuck Tabbert, and Randall Milanowski. Hierarchical CAD Tools for Radiation Hardened Mixed Signal Electronic Circuits. Defense Technical Information Center, 2005. http://dx.doi.org/10.21236/ada429971.

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Sedykh, P. A. Global Electric Circuit: Solar Wind, Magnetosphere, Ionosphere, Atmosphere. Balkan, Black sea and Caspian sea Regional Network for Space Weather Studies, 2019. http://dx.doi.org/10.31401/sungeo.2019.01.09.

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