Log in

Relevant bibliographies by topics / Electron microscope

Contents

Journal articles
Dissertations / Theses
Books
Book chapters
Conference papers
Reports

Academic literature on the topic 'Electron microscope'

Author: Grafiati

Published: 4 June 2021

Last updated: 25 July 2025

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Consult the lists of relevant articles, books, theses, conference reports, and other scholarly sources on the topic 'Electron microscope.'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Journal articles on the topic "Electron microscope"

1

Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.

Full text

Abstract:

The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th

APA, Harvard, Vancouver, ISO, and other styles

2

Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.

Full text

Abstract:

Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three l

APA, Harvard, Vancouver, ISO, and other styles

3

Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.

Full text

Abstract:

The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic poten

APA, Harvard, Vancouver, ISO, and other styles

4

Ross, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.

Full text

Abstract:

This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage el

APA, Harvard, Vancouver, ISO, and other styles

5

O'Keefe, Michael A., John H. Turner, John A. Musante, et al. "Laboratory Design for High-Performance Electron Microscopy." Microscopy Today 12, no. 3 (2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.

Full text

Abstract:

Since publication of the classic text on the electron microscope laboratory by Anderson, the proliferation of microscopes with field emission guns, imaging filters and hardware spherical aberration correctors (giving higher spatial and energy resolution) has resulted in the need to construct special laboratories. As resolutions iinprovel transmission electron microscopes (TEMs) and scanning transmission electron microscopes (STEMs) become more sensitive to ambient conditions. State-of-the-art electron microscopes require state-of-the-art environments, and this means careful design and implemen

APA, Harvard, Vancouver, ISO, and other styles

6

KONNO, Mitsuru, Toshie YAGUCHI, and Takahito HASHIMOTO. "Transmission Electron Microscop and Scanning Transmission Electron Microscope." Journal of the Japan Society of Colour Material 79, no. 4 (2006): 147–51. http://dx.doi.org/10.4011/shikizai1937.79.147.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

Watson, John H. L. "In the beginning there were electrons." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1068–69. http://dx.doi.org/10.1017/s0424820100129978.

Full text

Abstract:

Electrons have undoubtedly been around since the beginning of time, but not until the first quarter of the twentieth century, following the work of deBroglie on the dual nature of the electron, Busch's hypothesis that an electron beam could be focussed by an axially symmetric magnetic field, and Davisson & Germer's and Thomson's independent demonstrations of electron diffraction, did microscopists take seriously the possibility of a microscope utilizing electrons and magnetic fields. The first attempts at building electron microscopes were made in Europe but the resolution in the often blu

APA, Harvard, Vancouver, ISO, and other styles

8

Kersker, M., C. Nielsen, H. Otsuji, T. Miyokawa, and S. Nakagawa. "The JSM-890 ultra high resolution Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 88–89. http://dx.doi.org/10.1017/s0424820100152410.

Full text

Abstract:

Historically, ultra high spatial resolution electron microscopy has belonged to the transmission electron microscope. Today, however, ultra high resolution scanning electron microscopes are beginning to challenge the transmission microscope for the highest resolution.To accomplish high resolution surface imaging, not only is high resolution required. It is also necessary that the integrity of the specimen be preserved, i.e., that morphological changes to the specimen during observation are prevented. The two major artifacts introduced during observation are contamination and beam damage, both

APA, Harvard, Vancouver, ISO, and other styles

9

Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

Full text

Abstract:

The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcomin

APA, Harvard, Vancouver, ISO, and other styles

10

Graef, M. De, N. T. Nuhfer, and N. J. Cleary. "Implementation Of A Digital Microscopy Teaching Environment." Microscopy and Microanalysis 5, S2 (1999): 4–5. http://dx.doi.org/10.1017/s1431927600013349.

Full text

Abstract:

The steady evolution of computer controlled electron microscopes is dramatically changing the way we teach microscopy. For today’s microscopy student, an electron microscope may be just another program on the desktop of whatever computer platform he or she uses. This is reflected in the use of the term Desktop Microscopy. The SEM in particular has become a mouse and keyboard controlled machine, and running the microscope is not very different from using a drawing program or a word processor. Transmission electron microscopes are headed in the same direction.While one can debate whether or not

APA, Harvard, Vancouver, ISO, and other styles

More sources

Dissertations / Theses on the topic "Electron microscope"

1

Morgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /." Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.

Full text

APA, Harvard, Vancouver, ISO, and other styles

2

Martin, Geoffrey Clive. "Virtual Scanning Electron Microscope : a web-based teaching and training solution for the Scanning Electron Microscope." Thesis, University of Cambridge, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611878.

Full text

APA, Harvard, Vancouver, ISO, and other styles

3

Duckett, Gordon Richard. "Electron microscope studies of organic pigments." Thesis, University of Glasgow, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.305588.

Full text

APA, Harvard, Vancouver, ISO, and other styles

4

Skoupý, Radim. "Quantitative Imaging in Scanning Electron Microscope." Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2020. http://www.nusl.cz/ntk/nusl-432610.

Full text

Abstract:

Tato práce se zabývá možnostmi kvantitativního zobrazování ve skenovacím (transmisním) elektronovém mikroskopu (S|T|EM) společně s jejich korelativní aplikací. Práce začíná popisem metody kvantitativního STEM (qSTEM), kde lze stanovenou lokální tloušťku vzorku dát do spojitosti s ozářenou dávkou, a vytvořit tak studii úbytku hmoty. Tato metoda byla použita při studiu ultratenkých řezů zalévací epoxidové pryskyřice za různých podmínek (stáří, teplota, kontrastování, čištění pomocí plazmy, pokrytí uhlíkem, proud ve svazku). V rámci této části jsou diskutovány a demonstrovány možnosti kalibračníh

APA, Harvard, Vancouver, ISO, and other styles

5

Löfgren, André. "Detection of electron vortex beams : Using a scanning transmission electron microscope." Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.

Full text

Abstract:

Electron vortex beams (EVBs) are electron beams with a doughnut-like intensity profile, carrying orbital angular momentum due to their helical phase shift distribution. When employed in an electron microscope, they are expected to be efficient for the detection of magnetic signals. In this report I have investigated high angle annular dark field (HAADF) images obtained using EVBs. This was done for 300 K and 5K. For 5 K, I also compared HAADF images from an ordinary electron beam with HAADF images from an electron vortex beam. What was found was that EVBs produced doughnuts around the atomic

APA, Harvard, Vancouver, ISO, and other styles

6

Chen, Li. "Fabrication of electron sources for a miniature scanning electron microscope." Thesis, University of York, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.313904.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

Johnson, Lars. "Nanoindentation in situ a Transmission Electron Microscope." Thesis, Linköping University, Department of Physics, Chemistry and Biology, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8333.

Full text

Abstract:

<p>The technique of Nanoindentation <em>in situ</em> Transmission Electron Microscope has been implemented on a Philips CM20. Indentations have been performed on Si and Sapphire (<em>α-Al</em><em>2</em><em>O</em><em>3</em>) cut from wafers; Cr/Sc multilayers and <em>Ti</em><em>3</em><em>SiC</em><em>2</em> thin films. Different sample geometries and preparation methods have been evaluated. Both conventional ion and Focused Ion Beam milling were used, with different ways of protecting the sample during milling. Observations were made of bending and fracture of samples, dislocation nucleation and

APA, Harvard, Vancouver, ISO, and other styles

8

Lyster, Martin. "Electron microscope studies of cadmium mercury telluride." Thesis, University of Oxford, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.238271.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

Dellith, Meike. "Electron microscope investigations of defects in DRAMs." Thesis, University of Oxford, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.334379.

Full text

APA, Harvard, Vancouver, ISO, and other styles

10

Christensen, K. N. "Electron microscope studies of oxygen implanted silicon." Thesis, University of Oxford, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292615.

Full text

APA, Harvard, Vancouver, ISO, and other styles

More sources

Books on the topic "Electron microscope"

1

Thomas, Mulvey, and Sheppard C. J. R, eds. Advances inoptical and electron microscopy. Academic, 1990.

Find full text

APA, Harvard, Vancouver, ISO, and other styles

2

Champness, P. E. Electron diffraction in the transmission electron microscope. BIOS Scientific Publishers, 2001.

Find full text

APA, Harvard, Vancouver, ISO, and other styles

3

Hayat, M. A. Basic techniques for transmission electron microscopy. Academic Press, 1985.

Find full text

APA, Harvard, Vancouver, ISO, and other styles

4

Reimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2nd ed. Springer, 1998.

Find full text

APA, Harvard, Vancouver, ISO, and other styles

5

J, Goodhew Peter, ed. Thin foil preparation for electron microscopy. Elsevier, 1985.

Find full text

APA, Harvard, Vancouver, ISO, and other styles

6

Tomb, Howard. Microaliens: Dazzling journeys with an electron microscope. Farrar, Straus and Giroux, 1993.

Find full text

APA, Harvard, Vancouver, ISO, and other styles

7

Egerton, Ray F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-6887-2.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Egerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-5099-7.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

Egerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer US, 2011. http://dx.doi.org/10.1007/978-1-4419-9583-4.

Full text

APA, Harvard, Vancouver, ISO, and other styles

10

Egerton, R. F. Electron energy-loss spectroscopy in the electron microscope. 2nd ed. Plenum Press, 1996.

Find full text

APA, Harvard, Vancouver, ISO, and other styles

More sources

Book chapters on the topic "Electron microscope"

1

Gooch, Jan W. "Electron Microscope." In Encyclopedic Dictionary of Polymers. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_13623.

Full text

APA, Harvard, Vancouver, ISO, and other styles

2

Weik, Martin H. "electron microscope." In Computer Science and Communications Dictionary. Springer US, 2000. http://dx.doi.org/10.1007/1-4020-0613-6_6014.

Full text

APA, Harvard, Vancouver, ISO, and other styles

3

Schmitt, Robert. "Scanning Electron Microscope." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-642-35950-7_6595-4.

Full text

APA, Harvard, Vancouver, ISO, and other styles

4

Staufer, U., L. P. Muray, D. P. Kern, and T. H. P. Chang. "Miniaturized Electron Microscope." In Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications. Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1729-6_9.

Full text

APA, Harvard, Vancouver, ISO, and other styles

5

Dijkstra, Jeanne, and Cees P. de Jager. "Electron Microscope Serology." In Practical Plant Virology. Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-642-72030-7_59.

Full text

APA, Harvard, Vancouver, ISO, and other styles

6

Schmitt, Robert. "Scanning Electron Microscope." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2019. http://dx.doi.org/10.1007/978-3-662-53120-4_6595.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

Gooch, Jan W. "Scanning Electron Microscope." In Encyclopedic Dictionary of Polymers. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_10317.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Mitome, Masanori. "Transmission Electron Microscope." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_124.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

Kinoshita, Toyohiko. "Photoemission Electron Microscope." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_76.

Full text

APA, Harvard, Vancouver, ISO, and other styles

10

Schmitt, Robert. "Scanning Electron Microscope." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-20617-7_6595.

Full text

APA, Harvard, Vancouver, ISO, and other styles

Conference papers on the topic "Electron microscope"

1

Arend, Germaine, Armin Feist, Guanhao Huang, et al. "Coupling Free Electrons and Cavity Photons in a Transmission Electron Microscope." In CLEO: Applications and Technology. Optica Publishing Group, 2024. http://dx.doi.org/10.1364/cleo_at.2024.jth4n.4.

Full text

Abstract:

We couple free electrons to the optical modes of a photonic microring resonator. Inelastic electron scattering leads to the generation of cavity photons, correlated to the electrons in time and energy loss.

APA, Harvard, Vancouver, ISO, and other styles

2

Milner, R., and M. W. Phaneuf. "Comparative Carburization of Heat Resistant Alloys." In CORROSION 1998. NACE International, 1998. https://doi.org/10.5006/c1998-98431.

Full text

Abstract:

Abstract Two high strength, centrifugally cast heat resistant materials were examined under near identical pack carburizing conditions. The first material represented an alloy class which is becoming the most popular for replacement coils in ethylene pyrolysis furnaces due to its large improvement in carburization resistance over HP based alloys. The second material represented the next generation of alloys to be used for this purpose. Additionally, several investigative techniques were employed to illustrate some of the strengths and weaknesses of each technique. A recent advance in microscop

APA, Harvard, Vancouver, ISO, and other styles

3

Kuzyk, Casimir, Alexander Dimitrakopoulos, R. Fabian Pease, and Alireza Nojeh. "Compact and Low-Cost Scanning Electron Microscope." In 2024 37th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2024. http://dx.doi.org/10.1109/ivnc63480.2024.10652416.

Full text

APA, Harvard, Vancouver, ISO, and other styles

4

Little, Brenda J., Robert K. Pope, Tyrone L. Daulton, and Richard I. Ray. "Application of Environmental Cell Transmission Electron Microscopy to Microbiologically Influenced Corrosion." In CORROSION 2001. NACE International, 2001. https://doi.org/10.5006/c2001-01266.

Full text

Abstract:

Abstract The spatial/chemical relationship between bacteria, their biofilms, and metal substrata was examined in an environmental cell transmission electron microscope equipped with an energy loss spectrometer. The advantage of environmental cell transmission electron microscopy is that unfixed, hydrated specimens can be examined, in more or less their natural state, with high spatial resolution.

APA, Harvard, Vancouver, ISO, and other styles

5

Yatagai, Toyohiko, Katsuyuki Ohmura, and Shigeo Iwasaki. "Phase sensitive analysis of electron holograms." In Holography. Optica Publishing Group, 1986. http://dx.doi.org/10.1364/holography.1986.wb3.

Full text

Abstract:

Holography has been used in electron microscopy since the field emission electron microscope was developed.[1] Tonomura et al described the interference microscope based on the electron holography to evaluate microscopic distribution of the magnetic field. [2] To gain high sensitivity the use of the optical phase multiplication technique was discussed so as to obtain 10 time magnification of the reconstructed phase. [3] Recently Takeda et al applied the FFT method of the subfringe analysis for electron holographic fringes.[4] They mentioned phase variations much smaller than 2 π could be detec

APA, Harvard, Vancouver, ISO, and other styles

6

Larionov, Yu V., and Yu A. Novikov. "Virtual scanning electron microscope." In International Conference on Micro-and Nano-Electronics 2012, edited by Alexander A. Orlikovsky. SPIE, 2013. http://dx.doi.org/10.1117/12.2016977.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

Postek, Michael T. "Scanning electron microscope metrology." In Critical Review Collection. SPIE, 1994. http://dx.doi.org/10.1117/12.187461.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Mačák, Martin. "Electrohydrodynamic Model Of Electron Microscope." In STUDENT EEICT 2021. Fakulta elektrotechniky a komunikacnich technologii VUT v Brne, 2021. http://dx.doi.org/10.13164/eeict.2021.209.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

Krysztof, Michał, Marcin Białas, and Tomasz Grzebyk. "Imaging Using Mems Electron Microscope." In 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2023. http://dx.doi.org/10.1109/ivnc57695.2023.10188948.

Full text

APA, Harvard, Vancouver, ISO, and other styles

10

Krysztof, Michal, Tomasz Grzebyk, Piotr Szyszka, Karolina Laszczyk, Anna Gorccka-Drzazza, and Jan Dziuban. "Electron Transparent Anode for MEMS Transmission Electron Microscope." In 2018 XV International Scientific Conference on Optoelectronic and Electronic Sensors (COE). IEEE, 2018. http://dx.doi.org/10.1109/coe.2018.8435173.

Full text

APA, Harvard, Vancouver, ISO, and other styles

Reports on the topic "Electron microscope"

1

Crewe, A. V., and O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), 1991. http://dx.doi.org/10.2172/6000131.

Full text

APA, Harvard, Vancouver, ISO, and other styles

2

Crewe, A. V., and O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), 1992. http://dx.doi.org/10.2172/7015892.

Full text

APA, Harvard, Vancouver, ISO, and other styles

3

Kenik, E. (Intermediate voltage electron microscope). Office of Scientific and Technical Information (OSTI), 1989. http://dx.doi.org/10.2172/5356814.

Full text

APA, Harvard, Vancouver, ISO, and other styles

4

Ren, Z. F. Purchase of Transmission Electron Microscope. Defense Technical Information Center, 2001. http://dx.doi.org/10.21236/ada392051.

Full text

APA, Harvard, Vancouver, ISO, and other styles

5

Hadjipansyis, George C. DURIP 00 Scanning Electron Microscope (SEM). Defense Technical Information Center, 2001. http://dx.doi.org/10.21236/ada388472.

Full text

APA, Harvard, Vancouver, ISO, and other styles

6

Stirling, J. A. R., and G. J. Pringle. Tools of investigation: the electron microprobe and scanning electron microscope. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1996. http://dx.doi.org/10.4095/210959.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

Marder, A., K. Barmak, and D. Williams. Environmental scanning electron microscope (ESEM). Final report. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/676882.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Collins, Kimberlee Chiyoko, Albert Alec Talin, David W. Chandler, and Joseph R. Michael. Development of Scanning Ultrafast Electron Microscope Capability. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1331925.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

Fraser, Hamish L. Request for an Analytical Transmission Electron Microscope. Defense Technical Information Center, 1987. http://dx.doi.org/10.21236/ada189111.

Full text

APA, Harvard, Vancouver, ISO, and other styles

10

Ruggiero, S. T. Single-electron tunneling. [Microwave scanning tunneling microscope]. Office of Scientific and Technical Information (OSTI), 1993. http://dx.doi.org/10.2172/6854553.

Full text

APA, Harvard, Vancouver, ISO, and other styles

We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!