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Journal articles on the topic 'Electron microscopy (SEM and TEM)'

Author: Grafiati
Published: 3 June 2025
Last updated: 31 July 2025

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1

Sun, Cheng, Erich Müller, Matthias Meffert, and Dagmar Gerthsen. "On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope." Microscopy and Microanalysis 24, no. 2 (2018): 99–106. http://dx.doi.org/10.1017/s1431927618000181.

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AbstractTransmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission ele
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2

Tromp, Ruud M. "Low-Energy Electron Microscopy." MRS Bulletin 19, no. 6 (1994): 44–46. http://dx.doi.org/10.1557/s0883769400036757.

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For surface science, the 1980s were the decade in which the microscopes arrived. The scanning tunneling microscope (STM) was invented in 1982. Ultrahigh vacuum transmission electron microscopy (UHVTEM) played a key role in resolving the structure of the elusive Si(111)-7 × 7 surface. Scanning electron microscopy (SEM) as well as reflection electron microscopy (REM) were applied to the study of growth and islanding. And low-energy electron microscopy (LEEM), invented some 20 years earlier, made its appearance with the work of Telieps and Bauer.LEEM and TEM have many things in common. Unlike STM
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Priya, Anjali, Abhishek Singh, and Nikhil Anand Srivastava. "ELECTRON MICROSCOPY – AN OVERVIEW." International Journal of Students' Research in Technology & Management 5, no. 4 (2017): 81–87. http://dx.doi.org/10.18510/ijsrtm.2017.5411.

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The electron microscope (EM) is one of the most widely used instruments in research laboratories and is central based to micro-structural analysis and therefore important to any investigation related to the processing. The SEM/TEM provides information relating to topographical features, morphology, phase distribution, compositional differences, crystal structure, crystal orientation, and the presence and location of various defects. The strength of the SEM lies in its inherent versatility due to the multiple signals generated, simple image formation process, wide magnification range, and excel
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4

Tsuji, Masaki. "Electron Microscopy of Polymers(TEM,SEM,STEM)." Kobunshi 40, no. 7 (1991): 478–82. http://dx.doi.org/10.1295/kobunshi.40.478.

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5

Agrawal, Manoj, VVSH Prasad, Ginni Nijhawan, Sarah Salah Jalal, B. Rajalakshmi, and Shashi Prakash Dwivedi. "A Comprehensive Review of Electron Microscopy in Materials Science: Technological Advances and Applications." E3S Web of Conferences 505 (2024): 01029. http://dx.doi.org/10.1051/e3sconf/202450501029.

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In nanomaterials and microstructural evolution, electron microscopy has had an important effect on materials investigation. Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), Energy-Dispersive X-ray Spectroscopy (EDS), Electron Diffraction, Operando Electron Microscopy, and Aberration-Corrected Electron Microscopy offer the investigation on understanding of nanoscale material properties and structure. The present research covers the basics, advantages and disadvantages, and material-related applications of various electron microscopy techniques. TEM is useful for inves
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6

Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th
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7

Gauvin, Raynald, and Paula Horny. "The Characterization of Nano Materials in the FE-SEM." Microscopy and Microanalysis 6, S2 (2000): 744–45. http://dx.doi.org/10.1017/s1431927600036217.

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The observation of nano materials or nano phases is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the last decade, a new generation of microscopes is available on the market. These are the Field Emission Scanning Electron Microscope (FE-SEM) with a virtual secondary electron detector. The FE-SEM have a higher brightness allowing probe diameter smaller than 2.5 nm with incident electron energy, E0, below 5 keV. Furthermore, what gives FE-SEM outstanding resolu
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8

Bocker, Christian, Michael Kracker, and Christian Rüssel. "Replica Extraction Method on Nanostructured Gold Coatings and Orientation Determination Combining SEM and TEM Techniques." Microscopy and Microanalysis 20, no. 6 (2014): 1654–61. http://dx.doi.org/10.1017/s1431927614013336.

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AbstractIn the field of electron microscopy the replica technique is known as an indirect method and also as an extraction method that is usually applied on metallurgical samples. This contribution describes a fast and simple transmission electron microscopic (TEM) sample preparation by complete removal of nanoparticles from a substrate surface that allows the study of growth mechanisms of nanostructured coatings. The comparison and combination of advanced diffraction techniques in the TEM and scanning electron microscopy (SEM) provide possibilities for operators with access to both facilities
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9

Le Bideau, Marion, Lea Robresco, Jean-Pierre Baudoin, and Bernard La Scola. "Concentration of SARS-CoV-2-Infected Cell Culture Supernatants for Detection of Virus-like Particles by Scanning Electron Microscopy." Viruses 14, no. 11 (2022): 2388. http://dx.doi.org/10.3390/v14112388.

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There is currently a need for new rapid viral diagnostic electron microscopy methods. Although the gold standard remains the transmission electron microscopy (TEM) negative staining method for electron microscopic examination of samples containing a virus, difficulties can arise when the virus particle content of the sample that has to be examined is poor. Such samples include supernatants of virus-infected cells that can be difficult to examine, as sometimes only a few virus particles are released in the culture medium upon infection. In addition to TEM, scanning electron microscopy (SEM) can
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10

Conti, Sara, Giuseppe Remuzzi, Ariela Benigni, and Susanna Tomasoni. "Imaging the Kidney with an Unconventional Scanning Electron Microscopy Technique: Analysis of the Subpodocyte Space in Diabetic Mice." International Journal of Molecular Sciences 23, no. 3 (2022): 1699. http://dx.doi.org/10.3390/ijms23031699.

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Transmission electron microscopy (TEM) remains the gold standard for renal histopathological diagnoses, given its higher resolving power, compared with light microscopy. However, it imposes several limitations on pathologists, including longer sample preparation time and a small observation area. To overcome these, we introduced a scanning electron microscopy (SEM) technique for imaging resin-embedded semi-thin sections of renal tissue. We developed a rapid tissue preparation protocol for experimental models and human biopsies which, alongside SEM digital imaging acquisition of secondary elect
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11

Brodusch, Nicolas, Salim V. Brahimi, Evelin Barbosa De Melo, et al. "Scanning Electron Microscopy versus Transmission Electron Microscopy for Material Characterization: A Comparative Study on High-Strength Steels." Scanning 2021 (May 4, 2021): 1–19. http://dx.doi.org/10.1155/2021/5511618.

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The microstructures of quenched and tempered steels have been traditionally explored by transmission electron microscopy (TEM) rather than scanning electron microscopy (SEM) since TEM offers the high resolution necessary to image the structural details that control the mechanical properties. However, scanning electron microscopes, apart from providing larger area coverage, are commonly available and cheaper to purchase and operate compared to TEM and have evolved considerably in terms of resolution. This work presents detailed comparison of the microstructure characterization of quenched and t
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12

Graef, M. De, N. T. Nuhfer, and N. J. Cleary. "Implementation Of A Digital Microscopy Teaching Environment." Microscopy and Microanalysis 5, S2 (1999): 4–5. http://dx.doi.org/10.1017/s1431927600013349.

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The steady evolution of computer controlled electron microscopes is dramatically changing the way we teach microscopy. For today’s microscopy student, an electron microscope may be just another program on the desktop of whatever computer platform he or she uses. This is reflected in the use of the term Desktop Microscopy. The SEM in particular has become a mouse and keyboard controlled machine, and running the microscope is not very different from using a drawing program or a word processor. Transmission electron microscopes are headed in the same direction.While one can debate whether or not
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Smith, Ronald W. "Microscopy of Rubber Products." Rubber Chemistry and Technology 75, no. 3 (2002): 511–26. http://dx.doi.org/10.5254/1.3547680.

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Abstract This paper is a review of published literature containing some aspects of rubber product analysis using microscopy techniques. This includes close-up photography, photomicrography, photomicrography obtained from light optical microscope (LOM), scanning electron microscope (SEM) and transmission electron microscopy (TEM). Products represented are tires, belts, hoses, seals, rubber bands, balloons and some miscellaneous products such as a submarine hydrophone boot, rubber mat, shoe soles, tire curing bladder, and roofing membrane.
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14

CHEN, H., X. K. LU, S. Q. ZHOU, X. H. HAO, and Z. X. WANG. "FABRICATION AND CHARACTERISTICS OF ALN NANOWIRES." Modern Physics Letters B 15, no. 30 (2001): 1455–58. http://dx.doi.org/10.1142/s0217984901003068.

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Single phase AlN nanowires are fabricated by a sublimation method. They were characterized by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), typical selected area electron diffraction (SAED) and high-resolution transmission electron microscopy (HRTEM). The SEM and TEM images show that most of the nanowires have diameters of about 10–60 nm. The crystal structure of AlN nanowires revealed by XRD, SAED and HRTEM shows the AlN nanowires have a wurtzite structure.
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15

Zagal, José H., Sophie Griveau, Mireya Santander-Nelli, Silvia Gutierrez Granados, and Fethi Bedioui. "Carbon nanotubes and metalloporphyrins and metallophthalocyanines-based materials for electroanalysis." Journal of Porphyrins and Phthalocyanines 16, no. 07n08 (2012): 713–40. http://dx.doi.org/10.1142/s1088424612300054.

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We discuss here the state of the art on hybrid materials made from single (SWCNT) or multi (MWCNT) walled carbon nanotubes and MN4complexes such as metalloporphyrins and metallophthalocyanines. The hybrid materials have been characterized by several methods such as cyclic voltammetry (CV), scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and scanning electrochemical microscropy (SECM). The materials are employed for electrocatalysis of reactions such as oxygen and hydrogen peroxide reduction, nitri
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16

Drouin, D., P. Hovington, R. Gauvin, and J. Beauvais. "How to get the most of a SEM using the CASINO monte carlo program." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 148–49. http://dx.doi.org/10.1017/s0424820100163204.

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High resolution scanning electron microscopy (SEM) has become more and more popular for several reason. First, the new field emission (FE) source of electron is now able to produce a high current density electron probe even at very low energies. It is possible to perform analysis with spatial resolution comparable to one obtain in conventional transmission electron microscope (TEM). The major inconvenient of TEM analysis are related to sample preparation. Fabrication of electron transparency film is generally a complex and time consuming process.To fully exploit a SEM, microscope users must ha
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17

Walther, Paul. "Cryo-SEM and TEM of High Pressure Frozen Cells - Some Technical Contributions." Microscopy and Microanalysis 7, S2 (2001): 728–29. http://dx.doi.org/10.1017/s1431927600029718.

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Imaging of fast frozen samples is the most direct approach for electron microscopy of biological specimen in a defined physiological state. It prevents chemical fixation and drying artifacts. High pressure freezing allows for ice-crystal-free cryo-fixation of tissue pieces up to a thickness of 200 urn and a diameter of 2 mm without prefixation. Such a frozen disc, however, is not directly amenable to electron microscopic observation: The structures of interest have to be made amenable to the electron beam, and the structures of interest must produce enough contrast to be recognized in the elec
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18

Mansfield, John F. "Digital imaging: When should one take the plunge?" Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 602–3. http://dx.doi.org/10.1017/s0424820100165471.

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The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quaity positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and ext
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19

Stadtländer, Christian T. K. H. "Dehydration and Rehydration Issues in Biological Tissue Processing for Electron Microscopy." Microscopy Today 13, no. 1 (2005): 32–35. http://dx.doi.org/10.1017/s1551929500050847.

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Electron microscopy (EM) is an indispensable tool for the study of ultrastructures of biological specimens. Every electron microscopist would like to process biological specimens for either scanning electron microscopy (SEM) or transmission electron microscopy (TEM) in a way that the specimens viewed under the electron microscope resemble those seen in vivo or in vitro under the light microscope. This is, however, often easier said than done because biological tissue processing for EM requires careful attention of the investigator with regard to the numerous processing steps involved in specim
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20

Hembram, K. P. S. S., and G. Mohan Rao. "Microwave Synthesis of Zirconia Nanoparticles." Journal of Nanoscience and Nanotechnology 8, no. 8 (2008): 4159–62. http://dx.doi.org/10.1166/jnn.2008.an03.

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Zirconia nanoparticles were prepared by microwave synthesis from zirconium acetate hydroxide. The samples were characterized by various techniques like X-ray diffraction (XRD), Scanning Electron microscopy (SEM), Transmission Electron microscopy (TEM), Raman Spectroscopy (RS). By XRD the average crystallite size is obtained around 10 nm and which is comparable to observation by SEM and TEM.
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21

Wright, S. I., D. J. Dingley, and P. R. Mainwaring. "New Capabilities for the TEM: Automatic Orientation Measurement and Nanocrystal Grain Maps." Microscopy Today 7, no. 6 (1999): 12–15. http://dx.doi.org/10.1017/s1551929500064592.

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Orientation Imaging Microscopy (OIM) is a rapid and spatially specific technique for automatically measuring individual crystallographic orientations in a polycrystalline sample. The technique is based on electron backscatter diffraction in the scanning electron microscope (SEM). While the OIM technique has seen many applications to the investigation of structure/ property relationships in polycrystalline materials, with grain sizes ranging from millimeters to submicron, it is not easily applied to the characterization of microstructures at the nanometer scale due to the inherent resolution li
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22

Pilasuta, Panida, Pennapa Muthitamongkol, Chanchana Thanachayanont, and Tosawat Seetawan. "Characterization of Zn0.96Al0.02Ga0.02O Thermoelectric Material." Advanced Materials Research 802 (September 2013): 227–31. http://dx.doi.org/10.4028/www.scientific.net/amr.802.227.

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Crystal structure of Zn0.96Al0.02Ga0.02O was analyzed by X-Ray diffraction (XRD) technique and the microstructure was observed by scanning electron microscopy (SEM), and transmission electron microscopy (TEM). The XRD results showed single phase and hexagonal structure a = b = 3.24982 Å, and c = 5.20661 Å. The SEM and TEM results showed the grain size of material arrangement changed after sintering and TEM diffraction pattern confirmed hexagonal crystal structure of Zn0.96Al0.02Ga0.02O after sintering.
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23

Mansfield, John F. "Digital Imaging: When Should One Take The Plunge?" Microscopy Today 5, no. 4 (1997): 14–15. http://dx.doi.org/10.1017/s1551929500061393.

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The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quality positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and ex
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24

Müller, M., and R. Hermann. "High-Resolution Scanning Electron Microscopy of Biological Specimens." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 186–87. http://dx.doi.org/10.1017/s0424820100103012.

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Three major factors must be concomitantly assessed in order to extract relevant structural information from the surface of biological material at high resolution (2-3nm).Procedures based on chemical fixation and dehydration in graded solvent series seem inappropriate when aiming for TEM-like resolution. Cells inevitably shrink up to 30-70% of their initial volume during gehydration; important surface components e.g. glycoproteins may be lost. These problems may be circumvented by preparation techniques based on cryofixation. Freezedrying and freeze-substitution followed by critical point dryin
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25

Shi, Zhen Xue, Jia Rong Li, Shi Zhong Liu, and Jin Qian Zhao. "Microstructures of Low Angle Boundaries of the Second Generation Single Crystal Superalloy DD6." Advanced Materials Research 284-286 (July 2011): 1584–87. http://dx.doi.org/10.4028/www.scientific.net/amr.284-286.1584.

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The specimens of low angle boundaries were machined from the second generation single crystal superalloy DD6 blades. The microstructures of low angle boundaries (LAB) were investigated from three scales of dendrite, γ′ phase and atom with optical microscopy (OM), scanning electron microscope (SEM), transition electron microscope (TEM) and high resolution transmission electrion microscopy (HREM). The results showed that on the dendrite scale LAB is interdendrite district formed by three dimensional curved face between the adjacent dendrites. On the γ′ phase scale LAB is composed by a thin layer
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26

WANG, JIAN-DONG, CHONG-XIAO LUO, JIN-KU LIU, YI LU, and GUANG-MING LI. "SYNTHESIS OF YTTRIA-STABILIZED CUBIC ZIRCONIA NANOCRYSTALS BY ULTRASONIC–MICROWAVE ROUTE." Nano 05, no. 05 (2010): 271–77. http://dx.doi.org/10.1142/s1793292010002177.

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The yttria-stabilized zirconia (YSZ) nanocrystals with uniform size, high purity, and high degree of crystallinity, were prepared by ultrasonic–microwave-assisted method. The structure, optical properties and morphologies of YSZ nanocrystals were characterized by X-ray powder diffraction (XRD), Raman spectroscopy, UV–vis absorption, scanning electron microscope (SEM) and transmission electron microscopy (TEM). The SEM and TEM images of the YSZ nanocrystals indicate that the product is a mono-dispersion structure with an average particle size of about 25 nm.
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27

Yolanda, Yustika Desti, and Asep Bayu Dani Nandiyanto. "How to Read and Calculate Diameter Size from Electron Microscopy Images." ASEAN Journal of Science and Engineering Education 2, no. 1 (2021): 11–36. http://dx.doi.org/10.17509/ajsee.v2i1.35203.

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Scanning electron microscopy (SEM) and Transmission Electron Microscopy (TEM) is a chemical instrument that can be used to evaluate the characteristics of material. Techniques can be used to determine the morphology and diameter size of material. However, until now there has been no publications that describes in detail to read and interpret the electron microscopy images of both SEM and TEM. The purpose of this paper is to demonstrate the steps how to read and calculate the electron microscopy images based on the level of difficulties: (1) simple shape, (2) fairly complex shape, (3) very comp
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28

Cornelissen, A., M. G. Burnett, R. D. McCall, and D. T. Goddard. "The structure of hydrous flocs prepared by batch and continuous flow water treatment systems and obtained by optical, electron and atomic force microscopy." Water Science and Technology 36, no. 4 (1997): 41–48. http://dx.doi.org/10.2166/wst.1997.0082.

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This paper concerns the imaging of hydrous floc particles by Light Microscopy (LM), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM). The use of a microscope technique means that visual structural information is obtained, in contrast with other techniques measuring particle characteristics. It was found that when a preparation technique was used that involves cryogenic freezing of the sample, before observation in the SEM, larger (1-100 μm) floc particles could be imaged without the loss of structural information normally caused by dr
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Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing i
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30

Rauch, Edgar F., Muriel Véron, Stavros Nicolopoulos, and Daniel Bultreys. "Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM Like): Applications to Materials Science." Solid State Phenomena 186 (March 2012): 13–15. http://dx.doi.org/10.4028/www.scientific.net/ssp.186.13.

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EBSD is a well known technique that allows orientation and phase mapping using an SEM. Although the technique is very powerful, has serious limitations related with a) special resolution limited to 50 nm (SEM-FEG) and b) specimen preparation issues as is not possible to obtain EBSD signal from rough surfaces or strained materials , nanoparticles etc.. To address those difficulties , a novel technique has been developed recently (EBSD-TEM like) allowing automatic orientation and phase mapping using template matching analysis of acquired diffraction patterns in TEM. Electron beam is scanned thro
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Gauvin, Raynald, and Pierre Hovington. "On the Microanalysis of Small Precipitates at Low Voltage with a FE-SEM." Microscopy and Microanalysis 5, S2 (1999): 308–9. http://dx.doi.org/10.1017/s1431927600014860.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th
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32

Gai, Ying, Feng Wang, Jian Xing Shen, and Lan Lan Yang. "Preparation of Porous Hydroxylapatite Using Polystyrene Microspheres as Pore Former." Key Engineering Materials 633 (November 2014): 112–16. http://dx.doi.org/10.4028/www.scientific.net/kem.633.112.

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Polystyrene (PS) microspheres were prepared by dispersion polymerization method and using PS microspheres as pore former porous hydroxylapatite (HA) was prepared by Liquid phase precipitation method. The phase constituent was analyzed by X-ray diffraction(XRD) and by Fourier transform infrared(FTIR) and the microstructure was observed under scanning electron microscopy (SEM), field emission scanning electron microscope (FE-SEM) and transmission electron microscopy (TEM). The results showed that the prepared porous HA was of high purity and their pores were evenly distributed, with pore about 2
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Ollivier, Maelig, Laurence Latu-Romain, Edwige Bano, Arnaud Mantoux, and Thierry Baron. "Conversion of Si Nanowires into SiC Nanotubes." Materials Science Forum 717-720 (May 2012): 1275–78. http://dx.doi.org/10.4028/www.scientific.net/msf.717-720.1275.

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Carburization of silicon nanowires (NWs), with diameters of about 800 nm and lengths of about 10 µm, under methane at high temperature in order to obtain silicon carbide (SiC) nanostructures is reported here. The produced SiC nanostructures display a tubular shape and are polycrystalline. The as-prepared silicon carbide nanotubes (NTs) were characterized and studied by scanning electron microscopy (SEM), dual focused ion beam – scanning electron microscope (FIB-SEM), transmission electron microscopy (TEM) and Raman spectroscopy. The formation of nanotubes can be explained by the out-diffusion
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Chien, Yung-Ching, Alfonso Mucci, Jeanne Paquette, S. Kelly Sears, and Hojatollah Vali. "Comparative Study of Nanoscale Surface Structures of Calcite Microcrystals Using FE-SEM, AFM, and TEM." Microscopy and Microanalysis 12, no. 4 (2006): 302–10. http://dx.doi.org/10.1017/s1431927606060247.

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The bulk morphology and surface features that developed upon precipitation on micrometer-size calcite powders and millimeter-size cleavage fragments were imaged by three different microscopic techniques: field-emission scanning electron microscopy (FE-SEM), transmission electron microscopy (TEM) of Pt-C replicas, and atomic force microscopy (AFM). Each technique can resolve some nanoscale surface features, but they offer different ranges of magnification and dimensional resolutions. Because sample preparation and imaging is not constrained by crystal orientation, FE-SEM and TEM of Pt-C replica
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Venables, J. A., C. J. Harland, P. A. Bennett, and T. E. A. Zerrouk. "Electron diffraction in UHV SEM, REM, and TEM." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 594–95. http://dx.doi.org/10.1017/s0424820100170700.

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Electron diffraction techniques are widely used in Surface Science, with the main aim of determining atomic positions in surface reconstructions and the location of adsorbed atoms. These techniques require an Ultra-high vacuum (UHV) environment. The use of a focussed beam in UHV electron microscopes in principle allows such techniques to be applied on a microscopic scale. Most obviously this has been achieved in the Low Energy Electron Microscope (LEEM), where the corresponding diffraction technique, LEED, can now be used to investigate local areas with different surface structures, and to fol
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Kamino, T., M. Konno, T. Yaguchi, T. Hashimoto, H. Tanaka, and K. Nakamura. "Recent Developments in Failure Analysis in an Ultra thin Film Evaluation System." Microscopy and Microanalysis 6, S2 (2000): 136–37. http://dx.doi.org/10.1017/s1431927600033171.

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The increased demand in the microelectronics industry for higher spatial resolution in the analysis of device defects has focused attention on the use of transmission electron microscopy(TEM). However, in contrast to scanning electron microscopes(SEM), the number of TEM units in the microelectronics industry is still limited. This is because TEM operation and TEM specimen preparation are rather complicated and the results dependent upon operator experience.A innovative solution using a dedicated ultra thin film evaluation system(HD-2000) based upon a 200kV cold field emission scanning transmis
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Posthill, J. B., T. George, D. P. Malta, et al. "Electron microscopy of natural and epitaxial diamond." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 1196–97. http://dx.doi.org/10.1017/s0424820100151817.

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Semiconducting diamond films have the potential for use as a material in which to build active electronic devices capable of operating at high temperatures or in high radiation environments. Ultimately, it is preferable to use low-defect-density single crystal diamond for device fabrication. We have previously investigated polycrystalline diamond films with transmission electron microscopy (TEM) and scanning electron microscopy (SEM)e.g.1 and homoepitaxial films with SEM-based techniquese.g.2. This contribution describes some of our most recent observations of the microstructure of natural dia
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38

Kaaman, T., and B. Forslind. "Ultrastructural studies on experimental hair infections in vitro caused by Trichophyton mentagrophytes and Trichophyton rubrum." Acta Dermato-Venereologica 65, no. 6 (1985): 536–39. http://dx.doi.org/10.2340/0001555565536539.

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Experimental infections with Trichophyton mentagrophytes and Trichophyton rubrum were performed on human hair in vitro and studied by conventional light microscopy, scanning (SEM) and transmission (TEM) electron microscopy. The penetrations visible by light microscopy in hair infected with T. mentagrophytes appeared at SEM as disrupted surface areas with perforating holes. T. rubrum-infected hair displayed minute perforations and less conspicuous cuticular damages seen at SEM and TEM. In both organisms multiple tiny perforating holes were observed at SEM previously unnoticed in experimental ha
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39

Tang, Si-Lu, Ya-Lin Liu, Xu-Ming Li, et al. "A Novel Core–Shell Structure TiO2 Nanolayer Sphere Preparation and Electrocatalytic Degradation Study." Science of Advanced Materials 14, no. 3 (2022): 576–80. http://dx.doi.org/10.1166/sam.2022.4238.

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The core–shell TiO2 nano-layer spheres were synthesized by hydrothermal method without surfactant, using tetraisopropyl titanate, diethylenetriamine and water as the capping agents. The structure of the products was characterized with X-ray diffraction (XRD), transmission electron microscope (TEM) and scanning electron microscopy (SEM). The possible formation mechanism and electrocatalytic degradation characters of the products were also discussed.
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40

Slouf, Miroslav, Radim Skoupy, Ewa Pavlova, and Vladislav Krzyzanek. "Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure." Nanomaterials 11, no. 4 (2021): 962. http://dx.doi.org/10.3390/nano11040962.

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We introduce a novel scanning electron microscopy (SEM) method which yields powder electron diffraction patterns. The only requirement is that the SEM microscope must be equipped with a pixelated detector of transmitted electrons. The pixelated detectors for SEM have been commercialized recently. They can be used routinely to collect a high number of electron diffraction patterns from individual nanocrystals and/or locations (this is called four-dimensional scanning transmission electron microscopy (4D-STEM), as we obtain two-dimensional (2D) information for each pixel of the 2D scanning array
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Liu, Jingyue. "High Spatial Resolution Surface Analysis of Zeolite Catalysts in the Low-Voltage FE-SEM." Microscopy and Microanalysis 6, S2 (2000): 30–31. http://dx.doi.org/10.1017/s1431927600032645.

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High spatial resolution chemical microanalysis of heterogeneous catalysts is traditionally done in transmission electron microscopy or scanning transmission electron microscopy (TEM/STEM) instruments. A major limitation of TEM/STEM techniques is, however, the stringent requirement of samples that can be examined: useful information can be extracted from only very thin areas of a sample. The preparation of suitable TEM samples may also pose a major problem for observing certain types of commercial catalysts, for example, beads, powders, or cylinders that are frequently used in catalytic reactio
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Bieda, Magdalena. "Investigations of Fine Grained Metallic Materials by Means of Orientation Maps in Transmission Electron Microscope." Solid State Phenomena 186 (March 2012): 53–57. http://dx.doi.org/10.4028/www.scientific.net/ssp.186.53.

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New subdivision of microscopic investigation called Orientation Microscopy (OM) is already well known in scanning electron microscope (SEM). Needs for investigation in nanoscale contribute to development of an appropriate method for transmission electron microscope (TEM). Automated acquisition and indexing of diffraction patterns, necessary for creation of orientation maps in TEM, cause more difficulties then in SEM. Nevertheless, the techniques of OM are also being developed in the Transmission Electron Microscope (TEM). Microdiffraction has been successfully introduced for creating such maps
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Roy, Stéphane, Isabelle Babic, Alley E. Watada, and William P. Wergin. "Advantages of Low Temperature SEM for Bacterial Studies." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 1070–71. http://dx.doi.org/10.1017/s042482010014172x.

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The application of transmission electron microscopy (TEM) has greatly increased our understanding of structure-function relationships in bacteriology. However, to achieve further advancements investigators are seeking preparation procedures that would avoid the artifacts associated with conventional chemical fixation, dehydration and critical point drying or embedding. In our laboratory a field emission scanning electron microscope (SEM) was recently equipped with a cold stage. This combination of techniques, referred to as low temperature (LT) SEM, allowed us to examine frozen, fully hydrated
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Vanderlinde, William. "Breaking the Resolution Barrier in the Scanning Electron Microscope." Microscopy Today 16, no. 6 (2008): 28–35. http://dx.doi.org/10.1017/s1551929500062350.

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Everyone always wants better resolution from his or her microscopes. With semiconductor manufacturers now shipping product with sub-100 nm gates, measuring features and defects has become a challenge, even for the scanning electron microscope (SEM). For metrology below 100 nm, some manufacturers have begun routinely using TEM (transmission electron microscopy) which is tedious and expensive. As a microscopist, I find this quite disappointing since, in principle, the SEM should be capable of providing more than enough resolution well below 100 nm. Why is it that SEMs with 1 nm spot size can’t p
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Isabell, Thomas C., Paul E. Fischione, Catherine O'Keefe, Murat U. Guruz, and Vinayak P. Dravid. "Plasma Cleaning and Its Applications for Electron Microscopy." Microscopy and Microanalysis 5, no. 2 (1999): 126–35. http://dx.doi.org/10.1017/s1431927699000094.

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The effectiveness of applying a high-frequency, low-energy, reactive gas plasma for the removal of hydrocarbon contamination from specimens and components for electron microscopy has been investigated with a variety of analytical techniques. Transmission electron microscopy (TEM) analysis of specimens that have been plasma cleaned shows an elimination of the carbonaceous contamination from the specimen. With extended cleaning times the removal of existing carbon contamination debris due to previously conducted microanalysis is shown. Following plasma cleaning, specimens may be examined in the
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Ross, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.

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This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage el
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47

Paul, H., J. Morgiel, T. Baudin, F. Brisset, M. Prażmowski, and M. Miszczyk. "Characterization of Explosive Weld Joints by TEM and SEM/EBSD." Archives of Metallurgy and Materials 59, no. 3 (2014): 1129–36. http://dx.doi.org/10.2478/amm-2014-0197.

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Abstract The layers near the interface of explosively welded plates were investigated by means of microscopic observations with the use of transmission electron microscopy (TEM) equipped with energy dispersive spectrometry and scanning electron microscopy equipped with electron backscattered diffraction facility (SEM/EBSD). The metal compositions based on carbon or stainless steels (base plate) and Ti, Zr and Ta (flyer plate) were analyzed. The study was focused on the possible interdiffusion across the interface and the changes in the dislocation structure of bonded plates in the layers near-
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48

Vezie, Deborah L. "High-resolution scanning electron microscopy of carbon fiber." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 704–5. http://dx.doi.org/10.1017/s0424820100155499.

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As part of an extensive study of polyacrylonitrile (PAN) and mesophase pitch-based carbon fibers, high resolution scanning electron microscopy (HRSEM) is shown to provide additional insight into understanding and modelling microstructural origins of mechanical properties of carbon fiber. Although carbon fiber has been studied extensively, no sufficiently clear relationship between structure and mechanical properties such as elastic modulus and compressive strength has yet been developed from quantitative TEM and WAXS investigations.In this study, HRSEM data of selected carbon fibers is used to
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Ma, Yue, J. Liang, Y. Zheng, S. L. Erlandsen, L. E. Scriven, and H. T. Davis. "Direct Imaging of Sodium Stearate Crystals Dispersed in Waterpropylene Glycol Mixtures by Cryo-Electron Microscopy." Microscopy and Microanalysis 7, S2 (2001): 734–35. http://dx.doi.org/10.1017/s1431927600029743.

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Cryo-scanning electron microscopy (cryo-SEM) and cryo-transmission electron microscopy (cryo- TEM), in conjunctions with rheological measurements, light and confocal microscopy, x-ray scattering, and solid state NMR, are used to characterize sodium stearate (NaSt) crystals dispersed in waterpropylene glycol (PG) mixtures at macroscopic, microscopic, molecular, and atomic levels. NaSt is a surface-active, structural agent in household and personal cleaning products, including deodorant sticks and soap bars. A better structural characterization of NaSt/PG/water systems has practical importance i
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Chen, R. T., and M. G. Jamieson. "Advances in microscopy of polymers: A FESEM and STM study." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 1042–43. http://dx.doi.org/10.1017/s0424820100089524.

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Microscopy has played a major role in establishing structure-process-property relationships in the research and development of polymeric materials. With advances in electron microscopy instrumentation (e.g., field emission SEM - FESEM) and the invention of new scanning probe microscopes (e.g., scanning tunneling microscope - STM), resolution of structures or morphologies down to the nanometer scale can be achieved with ease. This paper will focus on the application of FESEM and STM in order to understand the structure of commercial polymeric materials. Characterization of polymers using other
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