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Journal articles on the topic 'Electron microscopy (TEM)'

Author: Grafiati

Published: 3 June 2025

Last updated: 31 July 2025

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1

Tromp, Ruud M. "Low-Energy Electron Microscopy." MRS Bulletin 19, no. 6 (1994): 44–46. http://dx.doi.org/10.1557/s0883769400036757.

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For surface science, the 1980s were the decade in which the microscopes arrived. The scanning tunneling microscope (STM) was invented in 1982. Ultrahigh vacuum transmission electron microscopy (UHVTEM) played a key role in resolving the structure of the elusive Si(111)-7 × 7 surface. Scanning electron microscopy (SEM) as well as reflection electron microscopy (REM) were applied to the study of growth and islanding. And low-energy electron microscopy (LEEM), invented some 20 years earlier, made its appearance with the work of Telieps and Bauer.LEEM and TEM have many things in common. Unlike STM

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Sun, Cheng, Erich Müller, Matthias Meffert, and Dagmar Gerthsen. "On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope." Microscopy and Microanalysis 24, no. 2 (2018): 99–106. http://dx.doi.org/10.1017/s1431927618000181.

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AbstractTransmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission ele

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Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th

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Kondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi, and Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.

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Recent development of ultra-high vacuum electron microscopy (UHV-EM) is very rapid. This is due to the fact that it can be applied to variety of surface science fields.There are various types of surface imaging in UHV condition; low energy electron microscopy (LEEM) [1], transmission (TEM) and reflection electron microscopy (REM) [2] using conventional transmission electron microscopes (CTEM) (including scanning TEM and REM)), scanning electron microscopy, photoemission electron microscopy (PEEM) [3] and scanning tunneling microscopy (STM including related techniques such as scanning tunneling

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van der Krift, Theo, Ulrike Ziese, Willie Geerts, and Bram Koster. "Computer-Controlled Transmission Electron Microscopy: Automated Tomography." Microscopy and Microanalysis 7, S2 (2001): 968–69. http://dx.doi.org/10.1017/s1431927600030919.

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The integration of computers and transmission electron microscopes (TEM) in combination with the availability of computer networks evolves in various fields of computer-controlled electron microscopy. Three layers can be discriminated: control of electron-optical elements in the column, automation of specific microscope operation procedures and display of user interfaces. The first layer of development concerns the computer-control of the optical elements of the transmission electron microscope (TEM). Most of the TEM manufacturers have transformed their optical instruments into computer-contro

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Kuokkala, V. T., and T. K. Lepistö. "TEMTUTOR - a Teaching Multimedia Program for TEM." Microscopy and Microanalysis 3, S2 (1997): 1161–62. http://dx.doi.org/10.1017/s1431927600012691.

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Teaching of transmission electron microscopy usually includes both lectures on the contrast theories, electron diffraction, etc., and practical hands-on operation of the microscope. The number of students attending the lectures is normally unlimited, but at the microscope, only a few persons can work at the same time. Since the microscopes are expensive, it would be of a great help if cheaper 'training' microscopes with basic imaging and diffraction capabilities were available. These functions, in fact, can quite easily be realized with fast personal computers and work stations, where the simu

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Winey, Mark, Janet B. Meehl, Eileen T. O'Toole, and Thomas H. Giddings. "Conventional transmission electron microscopy." Molecular Biology of the Cell 25, no. 3 (2014): 319–23. http://dx.doi.org/10.1091/mbc.e12-12-0863.

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Researchers have used transmission electron microscopy (TEM) to make contributions to cell biology for well over 50 years, and TEM continues to be an important technology in our field. We briefly present for the neophyte the components of a TEM-based study, beginning with sample preparation through imaging of the samples. We point out the limitations of TEM and issues to be considered during experimental design. Advanced electron microscopy techniques are listed as well. Finally, we point potential new users of TEM to resources to help launch their project.

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Carmichael, Stephen W., and Jon Charlesworth. "Correlating Fluorescence Microscopy with Electron Microscopy." Microscopy Today 12, no. 1 (2004): 3–7. http://dx.doi.org/10.1017/s1551929500051749.

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The use of fluorescent probes is becoming more and more common in cell biology. It would be useful if we were able to correlate a fluorescent structure with an electron microscopic image. The ability to definitively identify a fluorescent organelle would be very valuable. Recently, Ying Ren, Michael Kruhlak, and David Bazett-Jones devised a clever technique to correlate a structure visualized in the light microscope, even a fluorescing cell, with transmission electron microscopy (TEM).Two keys to the technique of Ren et al are the use of grids (as used in the TEM) with widely spaced grid bars

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9

Fan, G. Y., and M. H. Ellisman. "Current State of the Art of Digital Imaging in TEM." Microscopy and Microanalysis 3, S2 (1997): 1087–88. http://dx.doi.org/10.1017/s1431927600012320.

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The increasingly wide use of digital computers, the world-wide-web and electronic publishing has had a fundamental impact on the way scientists conduct research in every discipline of science. Electron microscopy is no exception. A considerable amount of effort has been devoted to the development of digital imaging acquisition systems for transmission electron microscopy (TEM). Digital image acquisition systems for TEM, including complete systems, have been produced by several companies, including: Advanced Microscopy Techniques (Rowley, MA), JEOL (Peabody, MA), Gatan (Warrendale, PA), Princet

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10

Lee, M. R. "Transmission electron microscopy (TEM) of Earth and planetary materials: A review." Mineralogical Magazine 74, no. 1 (2010): 1–27. http://dx.doi.org/10.1180/minmag.2010.074.1.1.

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AbstractUsing high intensity beams of fast electrons, the transmission electron microscope (TEM) and scanning transmission electron microscope (STEM) enable comprehensive characterization of rocks and minerals at micrometre to sub-nanometre scales. This review outlines the ways in which samples of Earth and planetary materials can be rendered sufficiently thin for TEM and STEM work, and highlights the significant advances in site-specific preparation enabled by the focused ion beam (FIB) technique. Descriptions of the various modes of TEM and STEM imaging, electron diffraction and X-ray and el

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11

Probst, W., R. Bauer, G. Benner, and J. L. Lehman. "Koehler illumination advantages for imaging in TEM." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 1010–11. http://dx.doi.org/10.1017/s0424820100089366.

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The Koehler principle of correct illumination in the light microscope was described about 100 years ago by A. Koehler. It is used in most of todays upper class light microscopes in order to achieve optimal imaging conditiones. Basically, in light microscopy (LM) and electron microscopy (EM) the same optical principles are used in order to describe or design beam paths in the different types of instruments. Mainly due to technical reasons up to now it was, however, not possible to transfer all the advantageous optical experience from LM to EM. The EM 910 from Carl Zeiss is now the first TEM pro

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Priya, Anjali, Abhishek Singh, and Nikhil Anand Srivastava. "ELECTRON MICROSCOPY – AN OVERVIEW." International Journal of Students' Research in Technology & Management 5, no. 4 (2017): 81–87. http://dx.doi.org/10.18510/ijsrtm.2017.5411.

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The electron microscope (EM) is one of the most widely used instruments in research laboratories and is central based to micro-structural analysis and therefore important to any investigation related to the processing. The SEM/TEM provides information relating to topographical features, morphology, phase distribution, compositional differences, crystal structure, crystal orientation, and the presence and location of various defects. The strength of the SEM lies in its inherent versatility due to the multiple signals generated, simple image formation process, wide magnification range, and excel

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13

Smith, David J., M. Gajdardziska-Josifovska, and M. R. McCartney. "Surface studies with a UHV-TEM." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (1992): 326–27. http://dx.doi.org/10.1017/s0424820100122034.

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The provision of ultrahigh vacuum capabilities, as well as in situ specimen treatment and annealing facilities, makes the transmission electron microscope into a potentially powerful instrument for the characterization of surfaces. Several operating modes are available, including surface profile imaging, reflection electron microscopy (REM), and reflection high energy electron diffraction (RHEED), as well as conventional transmission imaging and diffraction. All of these techniques have been utilized in our recent studies of surface structures and reactions for various metals, oxides and semic

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Dumančić, Ena, Lea Vojta, and Hrvoje Fulgosi. "Beginners guide to sample preparation techniques for transmission electron microscopy." Periodicum Biologorum 125, no. 1-2 (2023): 123–31. http://dx.doi.org/10.18054/pb.v125i1-2.25293.

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Background purpose: The revolution in microscopy came in 1930 with the invention of electron microscope. Since then, we can study specimens on ultrastructural and even atomic level. Besides transmission electron microscopy (TEM), for which specimen preparation techniques will be described in this article, there are also other types of electron microscopes that are not discussed in this review. Materials and methods: Here, we have described basic procedures for TEM sample preparation, which include tissue sample preparation, chemical fixation of tissue with fixatives, cryo-fixation performed by

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15

Ross, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.

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This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage el

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Agrawal, Manoj, VVSH Prasad, Ginni Nijhawan, Sarah Salah Jalal, B. Rajalakshmi, and Shashi Prakash Dwivedi. "A Comprehensive Review of Electron Microscopy in Materials Science: Technological Advances and Applications." E3S Web of Conferences 505 (2024): 01029. http://dx.doi.org/10.1051/e3sconf/202450501029.

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In nanomaterials and microstructural evolution, electron microscopy has had an important effect on materials investigation. Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), Energy-Dispersive X-ray Spectroscopy (EDS), Electron Diffraction, Operando Electron Microscopy, and Aberration-Corrected Electron Microscopy offer the investigation on understanding of nanoscale material properties and structure. The present research covers the basics, advantages and disadvantages, and material-related applications of various electron microscopy techniques. TEM is useful for inves

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Ferreira, P. J., K. Mitsuishi, and E. A. Stach. "In Situ Transmission Electron Microscopy." MRS Bulletin 33, no. 2 (2008): 83–90. http://dx.doi.org/10.1557/mrs2008.20.

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AbstractThe articles in this issue of MRS Bulletin provide a sample of what is novel and unique in the field of in situ transmission electron microscopy (TEM). The advent of improved cameras and continued developments in electron optics and stage designs have enabled scientists and engineers to enhance the capabilities of previous TEM analyses. Currently, novel in situ experiments observe and record the behavior of materials in various heating, cooling, straining, or growth environments. In situ TEM techniques are invaluable for understanding and characterizing dynamic microstructural changes.

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18

Mayer, J. "Electron spectroscopic imaging and diffraction: applications II materials science." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1198–99. http://dx.doi.org/10.1017/s0424820100130626.

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With imaging energy filters becoming commercially available in transmission electron microscopy many of the limitations of conventional TEM instruments can be overcome. Energy filtered images of diffraction patterns can now be recorded without scanning using efficient parallel (2-dimensional detection. We have evaluated a prototype of the Zeiss EM 912 Omega, the first commercially available electron microscope with integrated imaging Omega energy filter. Combining the capabilities of the imaging spectrometer with the principal operation modes of a TEM gives access to many new qualitative and q

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Probst, W., and V. E. Bayer. "The energy filtering TEM (EFTEM) in modern biological transmisson Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 668–69. http://dx.doi.org/10.1017/s0424820100139718.

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Modern biological electron microscopy can no longer be a static tool merely describing morphology. In addition to ultrastructural information, insights into the molecular and chemical composition of a sample are needed so that new findings stemming from molecular biological and biochemical analyses can be given meaning in an ultrastructural context. Biological electron microscopy will be an essential tool for future discoveries involving the ultrastructural localization of molecules and chemical elements, and it will provide a means to identify the ultrastructural basis for a variety of reacti

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20

Fraundorf, Phil. "Few Remarkable TEM Facts." Microscopy Today 4, no. 2 (1996): 10–11. http://dx.doi.org/10.1017/s155192950006750x.

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What follows is a list of some physical perspectives on the electrons used routinely for transmission electron microscopy. Without knowing it, you may on a daily basis be putting to practical use things, like the wave nature of electrons, that were inconceivable in the early part of this century. In fact, some of the properties of these electrons may be only marginally conceivable today!

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Mansfield, John F. "Digital imaging: When should one take the plunge?" Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 602–3. http://dx.doi.org/10.1017/s0424820100165471.

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The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quaity positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and ext

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Martis, Joel, Ze Zhang, Hao-Kun Li, Ann Marshall, Roy Kim, and Arun Majumdar. "Design and Construction of an Optical TEM Specimen Holder." Microscopy Today 29, no. 5 (2021): 40–44. http://dx.doi.org/10.1017/s1551929521001103.

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Abstract:Electron microscopy has enabled atomic resolution imaging of matter. However, unlike optical spectroscopic imaging, traditional electron microscopes provide limited spectroscopic information in terms of their energy resolution. Only recently, owing to advances in monochromated STEM-EELS, have transmission electron microscopes (TEMs) been able to attain a high energy resolution. We recently proposed combining spectrally selective photoexcitation with HRTEM to achieve sub-nanometer scale optical imaging, a technique we called photoabsorption microscopy using electron analysis (PAMELA).

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Graef, M. De, N. T. Nuhfer, and N. J. Cleary. "Implementation Of A Digital Microscopy Teaching Environment." Microscopy and Microanalysis 5, S2 (1999): 4–5. http://dx.doi.org/10.1017/s1431927600013349.

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The steady evolution of computer controlled electron microscopes is dramatically changing the way we teach microscopy. For today’s microscopy student, an electron microscope may be just another program on the desktop of whatever computer platform he or she uses. This is reflected in the use of the term Desktop Microscopy. The SEM in particular has become a mouse and keyboard controlled machine, and running the microscope is not very different from using a drawing program or a word processor. Transmission electron microscopes are headed in the same direction.While one can debate whether or not

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Lewis, J. C., N. L. Jones, and N. S. Allen. "Correlative Video-Enhanced Light Microscopy High-Resolution TEM." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 124–25. http://dx.doi.org/10.1017/s0424820100102705.

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Allen video-enhanced contrast, differential interference-contrast microscopy (AVEC-DIC) combines high resolution differential interference contrast microscopy of the Zeiss IM35 microscope with a Hamamatsu video camera to obtain images with increased magnification, resolution, contrast and visibility. Through this combination and by capitalizing on light diffraction phenomena, it is possible to visualize subcellular organelles, particles, and structures which are an order of magnitude smaller (0.01 μm) than the normal limits of resolution with light microscopy (0.2 μm). The use of gold “finder”

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Xin, Ren Long, Yang Leng, and Ning Wang. "TEM Examinations of OCP/HA Transformation." Key Engineering Materials 309-311 (May 2006): 191–94. http://dx.doi.org/10.4028/www.scientific.net/kem.309-311.191.

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We have directly observed the transformation from octacalcium phosphate (OCP) to hydroxyapatite (HA) in transmission electron microscope (TEM). The phase transformation was induced by electron beam irradiation in TEM. Several TEM techniques were employed to examine the crystal structure change, including bright field images, electron diffraction, high resolution microscopy (HRTEM) and fast Fourier transformation pattern of HRTEM images. The examinations indicate possible hydrolysis reaction in solid state transformation and crystallographic orientation of OCP (010)//HA (010) and OCP (001)//HA

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Gerrity, Ross G., and George W. Forbes. "Microwave Processing in Diagnostic Electron Microscopy." Microscopy Today 11, no. 6 (2003): 38–41. http://dx.doi.org/10.1017/s155192950005344x.

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Transmission electron microscopy (TEM) continues to play an important role in diagnostic surgical pathology, particularly in such areas as kidney pathology and tumor diagnosis, among others. Diagnostic TEM is subject to unique time constraints, quality control regulations, and other problems not seen in other TEM applications. The diagnostic TEM laboratory must produce high-quality electron microscopy on small samples which frequently are suboptirnal in fixation and tissue quality due to the pathology involved and time factors associated with biopsy and surgery.

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Tsuji, Masaki. "Electron Microscopy of Polymers(TEM,SEM,STEM)." Kobunshi 40, no. 7 (1991): 478–82. http://dx.doi.org/10.1295/kobunshi.40.478.

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Hulskamp, M., B. Schwab, P. Grini, and H. Schwarz. "Transmission Electron Microscopy (TEM) of Plant Tissues." Cold Spring Harbor Protocols 2010, no. 7 (2010): pdb.prot4958. http://dx.doi.org/10.1101/pdb.prot4958.

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Martinez, L., J. M. Briceño-Valero, S. A. López-Rivera, K. Moore, and J. T. Thorthon. "Micropattern analysis of ZnIn2S4 using AFM and TEM." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 476–77. http://dx.doi.org/10.1017/s0424820100138750.

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Semiconductor ZnIn2S4 is the only member of the II-III2-IV4 family with layer structure. The crystal structure of this semiconductor reported by Lappe et. al. is based upon closed packing of sulfur atoms with octahedral and tetrahedral indium atoms and tetrahedral zinc atoms. Previous studies on this material with high resolution transmission electron microscopy and Ramman spectroscopy demonstrate the existence of challenging problems to be resolved related to its intrinsic nature. There is great interest in this material for possible non-linear optical applications. In the present study Atomi

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TAKAYANAGI, KUNIO, YOSHITAKA NAITOH, YOSHIFUMI OSHIMA, and MASANORI MITOME. "SURFACE TRANSMISSION ELECTRON MICROSCOPY ON STRUCTURES WITH TRUNCATION." Surface Review and Letters 04, no. 04 (1997): 687–94. http://dx.doi.org/10.1142/s0218625x97000687.

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Surface transmission electron microscopy (TEM) has been used to reveal surface steps and structures by bright and dark field imaging, and high resolution plan view and/or profile view imaging. Dynamic processes on surfaces, such as step motion, surface phase transitions and film growths, are visualized by a TV system attached to the electron microscope. Atom positions can precisely be detected by convergent beam illumination (CBI) of high resolution surface TEM. Imaging of the atomic positions of surfaces with truncation is briefly reviewed in this paper, with recent development of a TEM–STM (

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Geiger, Dorin, Hannes Lichte, Martin Linck, and Michael Lehmann. "Electron Holography with aCs-Corrected Transmission Electron Microscope." Microscopy and Microanalysis 14, no. 1 (2007): 68–81. http://dx.doi.org/10.1017/s143192760808001x.

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Cscorrectors have revolutionized transmission electron microscopy (TEM) in that they substantially improve point resolution and information limit. The object information is found sharply localized within 0.1 nm, and the intensity image can therefore be interpreted reliably on an atomic scale. However, for a conventional intensity image, the object exit wave can still not be detected completely in that the phase, and hence indispensable object information is missing. Therefore, for example, atomic electric-field distributions or magnetic domain structures cannot be accessed. Off-axis electron h

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Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing i

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Heng, Yew M. "Thickness measurement in quantitative Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 482–83. http://dx.doi.org/10.1017/s0424820100148241.

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Quantitative electron microscopy generally implies the measurement of elemental content and/or structures in a given specimen or the 3D reconstruction of a structure. When a feature in a specimenis being quantified in a transmission electron microscope (TEM), the specimen thickness has to bedetermined for at least two reasons. Firstly, thickness is a required parameter in the calculation, for example, of volume and secondly, it is required for the calibration of instrumental conditions ortheoretical parameters such that correction for thickness effects due to conditions such as radiation damag

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Engqvist, Hakan, Tobias Jarmar, Fredrik Svahn, Leif Hermansson, and Peter Thomsen. "Characterization of the Tissue-Bioceramic Interface In Vivo Using New Preparation and Analytical Tools." Advances in Science and Technology 49 (October 2006): 275–81. http://dx.doi.org/10.4028/www.scientific.net/ast.49.275.

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A key feature in the understanding of the mechanisms of integration of implant materials is a deepened in-sight of the elemental and molecular composition of the interface zone between the implant and tissue. To analyze the interface at the ultrastructural level, transmission electron microscopy (TEM) is needed. However, techniques to fabricate thin foils for TEM are difficult and time consuming. By using focused ion beam microscopy (FIB) for site-specific preparation of TEM-samples, intact interfaces between bioceramics and calcified tissue can be prepared. The site-specific accuracy of the t

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Han, Karen F., John W. Sedat, and David A. Agard. "Image reconstruction using a focus series on thick biological specimens: TEM CTF correction." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 558–59. http://dx.doi.org/10.1017/s0424820100148629.

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The primary project of our laboratory is the investigation of chromatin structure by three dimensional electron microscope tomography. Three dimensional tomography involves the reconstruction of an object by combining multiple projection views of the object at different tilt angles. There are two complications that give rise to an inaccurate representation in the image of the projected object mass density: 1) electron-specimen interactions, and 2) electron microscope lens aberrations. In our abstract, “Analysis of Electron-specimen Interactions of Thick Biological Specimens in Transmission Ele

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KIM, Gyeung-Ho. "Overview of Transmission Electron Microscopy and Analytical Techniques." Physics and High Technology 32, no. 7/8 (2023): 18–23. http://dx.doi.org/10.3938/phit.32.019.

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Transmission electron microscopy (TEM) and related analytical techniques play crucial role in advancing nanotechnology by providing atomic scale images with simultaneous structural and chemical information originating from multitude of interactions between high energy electrons and atoms of interest. In this short review, various aspects of TEM are explained, from instrumentation, operating principles, typical application examples to recent developments in resolution improvements and performances.

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Pan, M., K. Ishizuka, C. E. Meyer, O. L. Krivanek, J. Sasakit, and Y. Kimurat. "Progress in Computer Assisted Electron Microscopy." Microscopy and Microanalysis 3, S2 (1997): 1093–94. http://dx.doi.org/10.1017/s1431927600012356.

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All the lenses, deflectors and stigmators of contemporary electron microscopes are controlled digitally by an internal computer. Control through RS232 serial interface by an external computer has also become a standard feature. This external control has made so-called computer assisted electron microscopy (CAEM) possible and practical. We are developing a CAEM system with two objectives: (1) to free inexperienced microscopists from technical details of operating an electron microscope, especially transmission electron microscopes (TEM); (2) to assist experienced microscopists to operate their

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Vukovié, Jovan. "The First Experience with new Small-Sized Commercial Tem (TEM -100) and Biological Specimens." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 611. http://dx.doi.org/10.1017/s0424820100181828.

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Conventional electron microscope TEM -100 (Made by “ELECTRON”, Sumy, USSR; Fig. 1) was presented at the XI Int. Congress on Electron Microscopy (Kyoto) by I.S. Lyalko et al. (1,2). The purpose of the microscope constructors were to design a small-sized general conventional TEM for various application fields. The microscope have mini lenses, which winding is placed in closed casing and soaked in working liquid (low boiling temperature) but upper part of the casing being water cooled.In this communication we gave our first experience and impression as a customer, beginning from the montage, the

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LIU, JINGYUE. "Energy-filtered reflection electron microscopy and reflection high-energy electron diffraction on Zeiss 912 TEM." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 580–81. http://dx.doi.org/10.1017/s0424820100148733.

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In reflection electron microscopy (REM) and reflection high energy electron diffraction (RHEED) the average path length of the elastically scattered electrons in the crystal ranges from 10 -100 nm and a significant portion of the electrons in the RHEED pattern spots used for imaging is inelastically scattered. The excitations of surface plasmons, bulk plasmons and valence electrons involves energy losses of 10 ∽30 eV. Thus the image contrast and resolution in REM are degraded due to chromatic aberration of the objective lens. The use of energy filters in a TEM should offer significant improvem

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Smith, Ronald W. "Microscopy of Rubber Products." Rubber Chemistry and Technology 75, no. 3 (2002): 511–26. http://dx.doi.org/10.5254/1.3547680.

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Abstract This paper is a review of published literature containing some aspects of rubber product analysis using microscopy techniques. This includes close-up photography, photomicrography, photomicrography obtained from light optical microscope (LOM), scanning electron microscope (SEM) and transmission electron microscopy (TEM). Products represented are tires, belts, hoses, seals, rubber bands, balloons and some miscellaneous products such as a submarine hydrophone boot, rubber mat, shoe soles, tire curing bladder, and roofing membrane.

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Thomas, Edwin L. "Transmission electron microscopy of polymers." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 422–25. http://dx.doi.org/10.1017/s0424820100126901.

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Transmission electron microscopy continues to play a major role in micro-structural characterization of polymers. Additionally, as evidenced by the special symposium on electron crystallography at this EMSA meeting, electron diffraction, as applied to polymer crystals, is also a vigorous area of research. Because many of the interesting morphological features of polymer systems are at and below the micron scale, TEM is a most fruitful technique. Applications range from simple assessment of dispersed phase particle size in blends to HREM molecular imaging of defects in crystals. Thus polymer sc

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Sajjad, Muhammad, and Peter Feng. "Electron microscopic characterization of multi-layer boron nitride nanosheets." MRS Proceedings 1549 (2013): 85–90. http://dx.doi.org/10.1557/opl.2013.859.

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AbstractWe report on the direct synthesis of multi-layer boron nitride nanosheets (BNNSs) and their electron microscopic characterization. The synthesis process is carried out by irradiating hexagonal boron nitride (h-BN) target using short laser pulses. Scanning electron microscopy showed large area (≈50×50 μm2) flat layers of BNNSs transparent to the electron beam. Low magnification transmission electron microscope (TEM) is used to characterize different areas of nanosheets. TEM revealed that each individual nanosheet is composed of several layers. High resolution TEM (HRTEM) measurements co

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Mekhantseva, Tamara, Oleg Voitenko, Ilya Smirnov, et al. "TEM and STEM Electron Tomography Analysis of Amorphous Alloys CoP-CoNiP System." Advanced Materials Research 590 (November 2012): 9–12. http://dx.doi.org/10.4028/www.scientific.net/amr.590.9.

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This paper covers the analysis of amorphous alloys CoP-CoNiP system by means of high-resolution transmission electron microscopy (HRTEM), scanning transmission electron microscopy and electron tomography. The last years have seen a sufficient progress in the analysis of nanomaterials structure with the help of high resolution tomography. This progress was motivated by the development of microscopes equipped with aberration correctors and specialized sample holders which allow reaching the tilts angles up to ±80°. The opportunities delivered by the method of electron tomography sufficiently gro

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Stadtländer, Christian T. K. H. "Dehydration and Rehydration Issues in Biological Tissue Processing for Electron Microscopy." Microscopy Today 13, no. 1 (2005): 32–35. http://dx.doi.org/10.1017/s1551929500050847.

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Electron microscopy (EM) is an indispensable tool for the study of ultrastructures of biological specimens. Every electron microscopist would like to process biological specimens for either scanning electron microscopy (SEM) or transmission electron microscopy (TEM) in a way that the specimens viewed under the electron microscope resemble those seen in vivo or in vitro under the light microscope. This is, however, often easier said than done because biological tissue processing for EM requires careful attention of the investigator with regard to the numerous processing steps involved in specim

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Voyles, Paul M. "The Electron Microscopy Database: an Online Resource for Teaching and Learning Quantitative Transmission Electron Microscopy." Microscopy Today 17, no. 1 (2009): 26–27. http://dx.doi.org/10.1017/s1551929500054973.

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Every spring, I teach a one-semester, graduate-level course on materials transmission electron microscopy (TEM). Thanks to the explosion of interest in nanotechnology, what was once a course primarily for metallurgists on imaging crystallographic defects and x-ray microanalysis now attracts a much broader audience. I have had students in the course from almost all the engineering departments at UW Madison (materials, chemical, mechanical, electrical, civil), from the basic sciences (physics, chemistry, geology), and from other departments (including one from Food Science!). The enrollment in t

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Bocker, Christian, Michael Kracker, and Christian Rüssel. "Replica Extraction Method on Nanostructured Gold Coatings and Orientation Determination Combining SEM and TEM Techniques." Microscopy and Microanalysis 20, no. 6 (2014): 1654–61. http://dx.doi.org/10.1017/s1431927614013336.

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AbstractIn the field of electron microscopy the replica technique is known as an indirect method and also as an extraction method that is usually applied on metallurgical samples. This contribution describes a fast and simple transmission electron microscopic (TEM) sample preparation by complete removal of nanoparticles from a substrate surface that allows the study of growth mechanisms of nanostructured coatings. The comparison and combination of advanced diffraction techniques in the TEM and scanning electron microscopy (SEM) provide possibilities for operators with access to both facilities

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Saka, Hiroyasu, Takeo Kamino, Shigeo Ara, and Katsuhiro Sasaki. "In Situ Heating Transmission Electron Microscopy." MRS Bulletin 33, no. 2 (2008): 93–100. http://dx.doi.org/10.1557/mrs2008.21.

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AbstractTemperature is one of the most important factors affecting the state and behavior of materials. In situ heating transmission electron microscopy (TEM) is a powerful tool for understanding such temperature effects, and recently in situ heating TEM has made significant progress in terms of temperature available and resolution attained. This article briefly describes newly developed specimen-heating holders, which are useful in carrying out in situ heating TEM experiments. It then focuses on three main applications of these specimen holders: solid–solid reactions, solid–liquid reactions (

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Mansfield, John F. "Digital Imaging: When Should One Take The Plunge?" Microscopy Today 5, no. 4 (1997): 14–15. http://dx.doi.org/10.1017/s1551929500061393.

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The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quality positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and ex

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Shi, Zhen Xue, Jia Rong Li, Shi Zhong Liu, and Jin Qian Zhao. "Microstructures of Low Angle Boundaries of the Second Generation Single Crystal Superalloy DD6." Advanced Materials Research 284-286 (July 2011): 1584–87. http://dx.doi.org/10.4028/www.scientific.net/amr.284-286.1584.

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The specimens of low angle boundaries were machined from the second generation single crystal superalloy DD6 blades. The microstructures of low angle boundaries (LAB) were investigated from three scales of dendrite, γ′ phase and atom with optical microscopy (OM), scanning electron microscope (SEM), transition electron microscope (TEM) and high resolution transmission electrion microscopy (HREM). The results showed that on the dendrite scale LAB is interdendrite district formed by three dimensional curved face between the adjacent dendrites. On the γ′ phase scale LAB is composed by a thin layer

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O'Keefe, Michael A. "The NCEM One-Angstrom Microscope Project Reaches 0.89Å Resolution." Microscopy and Microanalysis 6, S2 (2000): 1192–93. http://dx.doi.org/10.1017/s1431927600038459.

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Transmission electron microscopy to a resolution of 0.89Å has been achieved at the National Center for Electron Microscopy and is available to electron microscopists who have a requirement for this level of resolution. Development of this capability commenced in 1993, when the National Center for Electron Microscopy agreed to fund a proposal for a unique facility, a one- Ångstrom microscope (OÅM).2 The OÅM project provides materials scientists with transmission electron microscopy at a resolution better than one Angstrom by exploiting the significantly higher information limit of a FEG-TEM ove

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