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Journal articles on the topic 'Electron microscopy'

Author: Grafiati

Published: 4 June 2021

Last updated: 25 July 2025

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1

Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

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The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcomin

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Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.

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Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three l

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Ross, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.

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This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage el

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Martone, Maryann E. "Bridging the Resolution Gap: Correlated 3D Light and Electron Microscopic Analysis of Large Biological Structures." Microscopy and Microanalysis 5, S2 (1999): 526–27. http://dx.doi.org/10.1017/s1431927600015956.

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One class of biological structures that has always presented special difficulties to scientists interested in quantitative analysis is comprised of extended structures that possess fine structural features. Examples of these structures include neuronal spiny dendrites and organelles such as the Golgi apparatus and endoplasmic reticulum. Such structures may extend 10's or even 100's of microns, a size range best visualized with the light microscope, yet possess fine structural detail on the order of nanometers that require the electron microscope to resolve. Quantitative information, such as su

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Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments, While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar ca

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Tromp, Ruud M. "Low-Energy Electron Microscopy." MRS Bulletin 19, no. 6 (1994): 44–46. http://dx.doi.org/10.1557/s0883769400036757.

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For surface science, the 1980s were the decade in which the microscopes arrived. The scanning tunneling microscope (STM) was invented in 1982. Ultrahigh vacuum transmission electron microscopy (UHVTEM) played a key role in resolving the structure of the elusive Si(111)-7 × 7 surface. Scanning electron microscopy (SEM) as well as reflection electron microscopy (REM) were applied to the study of growth and islanding. And low-energy electron microscopy (LEEM), invented some 20 years earlier, made its appearance with the work of Telieps and Bauer.LEEM and TEM have many things in common. Unlike STM

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O'Keefe, Michael A., John H. Turner, John A. Musante, et al. "Laboratory Design for High-Performance Electron Microscopy." Microscopy Today 12, no. 3 (2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.

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Since publication of the classic text on the electron microscope laboratory by Anderson, the proliferation of microscopes with field emission guns, imaging filters and hardware spherical aberration correctors (giving higher spatial and energy resolution) has resulted in the need to construct special laboratories. As resolutions iinprovel transmission electron microscopes (TEMs) and scanning transmission electron microscopes (STEMs) become more sensitive to ambient conditions. State-of-the-art electron microscopes require state-of-the-art environments, and this means careful design and implemen

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8

Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.

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The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic poten

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J. H., Youngblom, Wilkinson J., and Youngblom J.J. "Telepresence Confocal Microscopy." Microscopy and Microanalysis 6, S2 (2000): 1164–65. http://dx.doi.org/10.1017/s1431927600038319.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments. While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar ca

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Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th

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McMorran, Benjamin J., Peter Ercius, Tyler R. Harvey, Martin Linck, Colin Ophus, and Jordan Pierce. "Electron Microscopy with Structured Electrons." Microscopy and Microanalysis 23, S1 (2017): 448–49. http://dx.doi.org/10.1017/s1431927617002926.

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12

Graef, M. De, N. T. Nuhfer, and N. J. Cleary. "Implementation Of A Digital Microscopy Teaching Environment." Microscopy and Microanalysis 5, S2 (1999): 4–5. http://dx.doi.org/10.1017/s1431927600013349.

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The steady evolution of computer controlled electron microscopes is dramatically changing the way we teach microscopy. For today’s microscopy student, an electron microscope may be just another program on the desktop of whatever computer platform he or she uses. This is reflected in the use of the term Desktop Microscopy. The SEM in particular has become a mouse and keyboard controlled machine, and running the microscope is not very different from using a drawing program or a word processor. Transmission electron microscopes are headed in the same direction.While one can debate whether or not

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Watson, John H. L. "In the beginning there were electrons." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1068–69. http://dx.doi.org/10.1017/s0424820100129978.

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Electrons have undoubtedly been around since the beginning of time, but not until the first quarter of the twentieth century, following the work of deBroglie on the dual nature of the electron, Busch's hypothesis that an electron beam could be focussed by an axially symmetric magnetic field, and Davisson & Germer's and Thomson's independent demonstrations of electron diffraction, did microscopists take seriously the possibility of a microscope utilizing electrons and magnetic fields. The first attempts at building electron microscopes were made in Europe but the resolution in the often blu

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Isoda, Seiji, Kimitsugu Saitoh, Sakumi Moriguchi, and Takashi Kobayashi. "Application of Imaging Plate to High-Voltage Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 168–69. http://dx.doi.org/10.1017/s0424820100179592.

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On the observation of structures by high resolution electron microscopy, recording materials with high sensitivity and high quality is awaited, especially for the study of radiation sensitive specimens. Such recording material should be easily combined with the minimum dose system and cryoprotection method. Recently a new recording material, imaging plate, comes to be widely used in X-ray radiography and also in electron microscopy, because of its high sensitivity, high quality and the easiness in handling the images with a computer. The properties of the imaging plate in 100 to 400 kV electro

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Chen, Xiaodong, Bin Zheng, and Hong Liu. "Optical and Digital Microscopic Imaging Techniques and Applications in Pathology." Analytical Cellular Pathology 34, no. 1-2 (2011): 5–18. http://dx.doi.org/10.1155/2011/150563.

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The conventional optical microscope has been the primary tool in assisting pathological examinations. The modern digital pathology combines the power of microscopy, electronic detection, and computerized analysis. It enables cellular-, molecular-, and genetic-imaging at high efficiency and accuracy to facilitate clinical screening and diagnosis. This paper first reviews the fundamental concepts of microscopic imaging and introduces the technical features and associated clinical applications of optical microscopes, electron microscopes, scanning tunnel microscopes, and fluorescence microscopes.

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Martone, Maryann E., Andrea Thor, Stephen J. Young, and Mark H. Ellisman. "Correlated 3D Light and Electron Microscopy of Large, Complex Structures: Analysis of Transverse Tubules in Heart Failure." Microscopy and Microanalysis 4, S2 (1998): 440–41. http://dx.doi.org/10.1017/s1431927600022327.

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Light microscopic imaging has experienced a renaissance in the past decade or so, as new techniques for high resolution 3D light microscopy have become readily available. Light microscopic (LM) analysis of cellular details is desirable in many cases because of the flexibility of staining protocols, the ease of specimen preparation and the relatively large sample size that can be obtained compared to electron microscopic (EM) analysis. Despite these advantages, many light microscopic investigations require additional analysis at the electron microscopic level to resolve fine structural features

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Nagata, Tetsuji. "Application of electron microscopic radioautography to clinical electron microscopy." Medical Electron Microscopy 27, no. 3-4 (1994): 191–212. http://dx.doi.org/10.1007/bf02349658.

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18

Kondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi, and Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.

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Recent development of ultra-high vacuum electron microscopy (UHV-EM) is very rapid. This is due to the fact that it can be applied to variety of surface science fields.There are various types of surface imaging in UHV condition; low energy electron microscopy (LEEM) [1], transmission (TEM) and reflection electron microscopy (REM) [2] using conventional transmission electron microscopes (CTEM) (including scanning TEM and REM)), scanning electron microscopy, photoemission electron microscopy (PEEM) [3] and scanning tunneling microscopy (STM including related techniques such as scanning tunneling

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19

Pan, M., K. Ishizuka, C. E. Meyer, O. L. Krivanek, J. Sasakit, and Y. Kimurat. "Progress in Computer Assisted Electron Microscopy." Microscopy and Microanalysis 3, S2 (1997): 1093–94. http://dx.doi.org/10.1017/s1431927600012356.

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All the lenses, deflectors and stigmators of contemporary electron microscopes are controlled digitally by an internal computer. Control through RS232 serial interface by an external computer has also become a standard feature. This external control has made so-called computer assisted electron microscopy (CAEM) possible and practical. We are developing a CAEM system with two objectives: (1) to free inexperienced microscopists from technical details of operating an electron microscope, especially transmission electron microscopes (TEM); (2) to assist experienced microscopists to operate their

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20

KOMOTO, Tadashi. "Electron Microscopy." Journal of the Japan Society of Colour Material 69, no. 3 (1996): 191–97. http://dx.doi.org/10.4011/shikizai1937.69.191.

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21

HODSON, N. P., and J. A. WRIGHT. "Electron microscopy." Journal of Small Animal Practice 28, no. 5 (1987): 381–86. http://dx.doi.org/10.1111/j.1748-5827.1987.tb01430.x.

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22

Ruska, Ernst. "The development of the electron microscope and of electron microscopy." Reviews of Modern Physics 59, no. 3 (1987): 627–38. http://dx.doi.org/10.1103/revmodphys.59.627.

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Ruska, Ernst. "The development of the electron microscope and of electron microscopy." Bioscience Reports 7, no. 8 (1987): 607–29. http://dx.doi.org/10.1007/bf01127674.

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24

Frank, L., Š. Mikmeková, Z. Pokorná, and I. Müllerová. "Scanning Electron Microscopy With Slow Electrons." Microscopy and Microanalysis 19, S2 (2013): 372–73. http://dx.doi.org/10.1017/s1431927613003851.

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O’Keefe, M. A., J. Taylor, D. Owen, et al. "Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 384–85. http://dx.doi.org/10.1017/s0424820100164386.

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Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential tha

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Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing i

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Brama, Elisabeth, Christopher J. Peddie, Gary Wilkes, Yan Gu, Lucy M. Collinson, and Martin L. Jones. "ultraLM and miniLM: Locator tools for smart tracking of fluorescent cells in correlative light and electron microscopy." Wellcome Open Research 1 (December 13, 2016): 26. http://dx.doi.org/10.12688/wellcomeopenres.10299.1.

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In-resin fluorescence (IRF) protocols preserve fluorescent proteins in resin-embedded cells and tissues for correlative light and electron microscopy, aiding interpretation of macromolecular function within the complex cellular landscape. Dual-contrast IRF samples can be imaged in separate fluorescence and electron microscopes, or in dual-modality integrated microscopes for high resolution correlation of fluorophore to organelle. IRF samples also offer a unique opportunity to automate correlative imaging workflows. Here we present two new locator tools for finding and following fluorescent cel

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Lamvik, M. K. "The Role of Temperature in Limiting Radiation Damage to Organic Materials in Electron Microscopes." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 404–5. http://dx.doi.org/10.1017/s0424820100135629.

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The intensity of the electron beam in an electron microscope is at once the basis for progress as well as the ultimate limitation in electron microscopy of organic materials. Gabor noted that the highest intensity available for light optics comes from sunlight, which produces an energy density of 2,000 watts/cm2-steradian. The electron sources in early microscopes could produce a million times that amount, and modern sources even more. While the high intensity made good images possible (because numerical apertures used for electron microscopes are less than 1% of the size used in light microsc

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Prabhakar, Neeraj, Markus Peurla, Olga Shenderova, and Jessica M. Rosenholm. "Fluorescent and Electron-Dense Green Color Emitting Nanodiamonds for Single-Cell Correlative Microscopy." Molecules 25, no. 24 (2020): 5897. http://dx.doi.org/10.3390/molecules25245897.

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Correlative light and electron microscopy (CLEM) is revolutionizing how cell samples are studied. CLEM provides a combination of the molecular and ultrastructural information about a cell. For the execution of CLEM experiments, multimodal fiducial landmarks are applied to precisely overlay light and electron microscopy images. Currently applied fiducials such as quantum dots and organic dye-labeled nanoparticles can be irreversibly quenched by electron beam exposure during electron microscopy. Generally, the sample is therefore investigated with a light microscope first and later with an elect

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Sujata, K., and Hamlin M. Jennings. "Advances in Scanning Electron Microscopy." MRS Bulletin 16, no. 3 (1991): 41–45. http://dx.doi.org/10.1557/s0883769400057390.

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Scanning electron microscopes offer several unique advantages and they have evolved into complex integrated instruments that often incorporate several important accessories. Their principle advantage stems from the method of constructing an image from a highly focused electron beam that scans across the surface of a specimen. The beam generates backscattered electrons and excites secondary electrons and x-rays in a highly localized “spot.” These signals can be detected, and the results of the analysis are displayed as a specific intensity on a screen at a position that represents the position

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Sun, Cheng, Erich Müller, Matthias Meffert, and Dagmar Gerthsen. "On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope." Microscopy and Microanalysis 24, no. 2 (2018): 99–106. http://dx.doi.org/10.1017/s1431927618000181.

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AbstractTransmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission ele

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Thomas, G. "Electron Microscopy of inorganic materials." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 558–59. http://dx.doi.org/10.1017/s0424820100170529.

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Over the past two decades tremendous progress has been made in the use of advanced transmission electron microscopy techniques to solve complex materials problems. This is especially true in the case of inorganic materials, such as multicomponent metal oxides. The inherent complexity of the crystal structure and microstructure of these ceramic materials as well as the interdependence of the final properties on microstructure and processing mean that detailed characterization of the effect of processing variables on the structure and microstructure is imperative. Electron microscopy has become

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Perkins, J. M., D. A. Blom, D. W. McComb, and L. F. Allard. "Functional Collaborative Remote Microscopy: Inter-Continental Atomic Resolution Imaging." Microscopy Today 16, no. 3 (2008): 46–49. http://dx.doi.org/10.1017/s1551929500059277.

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In recent years the development of remote microscopy, specifically in electron microscopes, has begun to emerge as a useful research tool rather than simply an educational or teaching aid. Scientists have long been able to work collaboratively at a distance; however, it is often in terms of receiving data or sending some instructions where there may be a delay in receipt of the information. When defining remote control it is important to note that electron microscopy requires instantaneous control and receipt of the feedback (in most cases via images on a screen). Without realtime control it i

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Peters, Jonathan J. P., Bryan W. Reed, Yu Jimbo, et al. "Event-responsive scanning transmission electron microscopy." Science 385, no. 6708 (2024): 549–53. http://dx.doi.org/10.1126/science.ado8579.

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An ever-present limitation of transmission electron microscopy is the damage caused by high-energy electrons interacting with any sample. By reconsidering the fundamentals of imaging, we demonstrate an event-responsive approach to electron microscopy that delivers more information about the sample for a given beam current. Measuring the time to achieve an electron count threshold rather than waiting a predefined constant time improves the information obtained per electron. The microscope was made to respond to these events by blanking the beam, thus reducing the overall dose required. This app

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van der Krift, Theo, Ulrike Ziese, Willie Geerts, and Bram Koster. "Computer-Controlled Transmission Electron Microscopy: Automated Tomography." Microscopy and Microanalysis 7, S2 (2001): 968–69. http://dx.doi.org/10.1017/s1431927600030919.

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The integration of computers and transmission electron microscopes (TEM) in combination with the availability of computer networks evolves in various fields of computer-controlled electron microscopy. Three layers can be discriminated: control of electron-optical elements in the column, automation of specific microscope operation procedures and display of user interfaces. The first layer of development concerns the computer-control of the optical elements of the transmission electron microscope (TEM). Most of the TEM manufacturers have transformed their optical instruments into computer-contro

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Tivol, Bill. "Automated Functions in Electron Microscopy." Microscopy Today 12, no. 6 (2004): 14–19. http://dx.doi.org/10.1017/s1551929500065913.

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The newest generation of computer-controlled electron microscopes incorporates the ability to perform adjustments to microscopy conditions by comparing pairs of images and altering the conditions accordingly. Automation of electron microscope adjustments offers the advantages of accuracy, precision, efficiency, the ability to incorporate the adjustments into other automated procedures, and, for radiation-sensitive specimens, minimal exposure to the beam.At present, automated functions include determination of eucentric height, focus, astigmatism, orientation and location of the stage tilt axis

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Henken, Deborah B., and Garry Chernenko. "Light Microscopic Autoradiography Followed by Electron Microscopy." Stain Technology 61, no. 5 (1986): 319–21. http://dx.doi.org/10.3109/10520298609109960.

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Urchulutegui, M. "Scanning Electron-Acoustic Microscopy: Do You Know Its Capabilities?" MRS Bulletin 21, no. 10 (1996): 42–46. http://dx.doi.org/10.1557/s0883769400031638.

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Characterization of materials usually requires microscopy techniques. Some of the most useful are based on a scanning microscope and involve scanning the sample surface with a focused beam (e.g., photons, electrons, ions, etc.). For example, photoacoustic microscopy uses a laser beam, acoustic microscopy uses an ultrasound beam, and scanning electron microscopy uses an electron beam. The interaction between the material and the beam produces a signal that can be used to generate a two-dimensional image.In scanning photoacoustic microscopy (SPAM), an intensity-modulated light beam is used to pr

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Carmichael, Stephen W., and Jon Charlesworth. "Correlating Fluorescence Microscopy with Electron Microscopy." Microscopy Today 12, no. 1 (2004): 3–7. http://dx.doi.org/10.1017/s1551929500051749.

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The use of fluorescent probes is becoming more and more common in cell biology. It would be useful if we were able to correlate a fluorescent structure with an electron microscopic image. The ability to definitively identify a fluorescent organelle would be very valuable. Recently, Ying Ren, Michael Kruhlak, and David Bazett-Jones devised a clever technique to correlate a structure visualized in the light microscope, even a fluorescing cell, with transmission electron microscopy (TEM).Two keys to the technique of Ren et al are the use of grids (as used in the TEM) with widely spaced grid bars

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Kersker, Michael M. "A History of ESEM in 2.5 Chapters." Microscopy and Microanalysis 7, S2 (2001): 774–75. http://dx.doi.org/10.1017/s1431927600029949.

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Microscopy has always been concerned with the observation of samples in their natural states. The earliest instruments, optical microscopes, did not interfere with the samples which were under observation due to the pervasive presence of visible light in the normal evolution of these entities. Man and science persisted in this direction until Ruska in 1933 invented the electron microscope and the real world changed forever (see MSA Rudenberg for an enlightening description of the early days of man's understanding of the electron and the subsequent invention of the electron microscope). The ear

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Tinti, G., H. Marchetto, C. A. F. Vaz, et al. "The EIGER detector for low-energy electron microscopy and photoemission electron microscopy." Journal of Synchrotron Radiation 24, no. 5 (2017): 963–74. http://dx.doi.org/10.1107/s1600577517009109.

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EIGER is a single-photon-counting hybrid pixel detector developed at the Paul Scherrer Institut, Switzerland. It is designed for applications at synchrotron light sources with photon energies above 5 keV. Features of EIGER include a small pixel size (75 µm × 75 µm), a high frame rate (up to 23 kHz), a small dead-time between frames (down to 3 µs) and a dynamic range up to 32-bit. In this article, the use of EIGER as a detector for electrons in low-energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) is reported. It is demonstrated that, with only a minimal modificatio

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Dahmen, Ulrich, Rolf Erni, Velimir Radmilovic, Christian Ksielowski, Marta-Dacil Rossell, and Peter Denes. "Background, status and future of the Transmission Electron Aberration-corrected Microscope project." Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 367, no. 1903 (2009): 3795–808. http://dx.doi.org/10.1098/rsta.2009.0094.

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The strong interaction of electrons with small volumes of matter make them an ideal probe for nanomaterials, but our ability to fully use this signal in electron microscopes remains limited by lens aberrations. To bring this unique advantage to bear on materials research requires a sample space for electron scattering experiments in a tunable electron-optical environment. This is the vision for the Transmission Electron Aberration-corrected Microscope (TEAM) project, which was initiated as a collaborative effort to re-design the electron microscope around aberration-correcting optics. The resu

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Hassander, H. "Electron microscopy methods for studying polymer blends—comparison of scanning electron microscopy and transmission electron microscopy." Polymer Testing 5, no. 1 (1985): 27–36. http://dx.doi.org/10.1016/0142-9418(85)90029-7.

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Kremer, James R., Paul S. Furcinitti, Eileen O’Toole, and J. Richard McIntosh. "Analysis of photographic emulsions for High-Voltage Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 452–53. http://dx.doi.org/10.1017/s0424820100148095.

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Characteristics of electron microscope film emulsions, such as the speed, the modulation transfer function, and the exposure dependence of the noise power spectrum, have been studied for electron energies (80-100keV) used in conventional transmission microscopy. However, limited information is available for electron energies in the intermediate to high voltage range, 300-1000keV. Furthermore, emulsion characteristics, such as optical density versus exposure, for new or improved emulsions are usually only quoted by film manufacturers for 80keV electrons. The need for further film emulsion studi

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Gauvin, Raynald, and Paula Horny. "The Characterization of Nano Materials in the FE-SEM." Microscopy and Microanalysis 6, S2 (2000): 744–45. http://dx.doi.org/10.1017/s1431927600036217.

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The observation of nano materials or nano phases is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the last decade, a new generation of microscopes is available on the market. These are the Field Emission Scanning Electron Microscope (FE-SEM) with a virtual secondary electron detector. The FE-SEM have a higher brightness allowing probe diameter smaller than 2.5 nm with incident electron energy, E0, below 5 keV. Furthermore, what gives FE-SEM outstanding resolu

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Dumančić, Ena, Lea Vojta, and Hrvoje Fulgosi. "Beginners guide to sample preparation techniques for transmission electron microscopy." Periodicum Biologorum 125, no. 1-2 (2023): 123–31. http://dx.doi.org/10.18054/pb.v125i1-2.25293.

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Background purpose: The revolution in microscopy came in 1930 with the invention of electron microscope. Since then, we can study specimens on ultrastructural and even atomic level. Besides transmission electron microscopy (TEM), for which specimen preparation techniques will be described in this article, there are also other types of electron microscopes that are not discussed in this review. Materials and methods: Here, we have described basic procedures for TEM sample preparation, which include tissue sample preparation, chemical fixation of tissue with fixatives, cryo-fixation performed by

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Dvorachek, Michael, Amnon Rosenfeld, and Avraham Honigstein. "Contaminations of geological samples in scanning electron microscopy." Neues Jahrbuch für Geologie und Paläontologie - Monatshefte 1990, no. 12 (1991): 707–16. http://dx.doi.org/10.1127/njgpm/1990/1991/707.

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Prutton, M., M. M. El Gomati, J. C. Greenwood, P. G. Kennyr, I. R. Barkshire, and J. C. Dee. "Multispectral Surface Analytical Microscopy: A Third-Generation Scanning Auger Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 384–85. http://dx.doi.org/10.1017/s0424820100135526.

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The quantitative interpretation of scanning Auger electron microscope (SAM) images has been shown to require the use of multi-spectral imaging of the surface under study. In a multi-spectral analytical microscope (MULSAM) a set of maps (bands) is acquired from the same area of a sample using scattered electrons with different kinetic energies as well as other signals from the sample such as current flowing to ground, the conventional SEM signal and characteristic x-rays. The resulting set of bands is a multi-spectral image which can be processed using models of the electron scattering in the s

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Baba-Kishi, K. Z. "Scanning reflection electron microscopy of surface topography by diffusely scattered electrons in the scanning electron microscope." Scanning 18, no. 4 (2006): 315–21. http://dx.doi.org/10.1002/sca.1996.4950180408.

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Wortmann, F. J., and G. Wortmann. "Quantitative Fiber Mixture Analysis by Scanning Electron Microscopy." Textile Research Journal 62, no. 7 (1992): 423–31. http://dx.doi.org/10.1177/004051759206200710.

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Labeling textile blends requires identification and quantification of their fibrous components. Blends of specialty animal fibers with sheep's wool are of special, practical importance; for these the light microscope is the traditional tool of analysis. To investigate the actual applicability of light microscopy for analyzing such blends as an alternative to the scanning electron microscope (SEM), we analyzed in detail the results of round trials conducted in the seventies. The results confirm that light microscopy, in general, is neither an objective nor a reproducible method for analyzing wo

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