Relevant bibliographies by topics / Electron probe analysis

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  2. Dissertations / Theses
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Academic literature on the topic 'Electron probe analysis'

Author: Grafiati
Published: 4 June 2021
Last updated: 1 February 2022

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Journal articles on the topic "Electron probe analysis"

1

SOEZIMA, Hiroyoshi. "Electron probe micro analysis." Hyomen Kagaku 10, no. 10 (1989): 710–17. http://dx.doi.org/10.1380/jsssj.10.710.

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Lewis, R. A. "Gas analysis by electron probe." Micron and Microscopica Acta 16, no. 4 (1985): 271–75. http://dx.doi.org/10.1016/0739-6260(85)90051-6.

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KENNEDY, R. V., and J. E. ALLEN. "The floating potential of spherical probes and dust grains. Part 1. Radial motion theory." Journal of Plasma Physics 67, no. 4 (2002): 243–50. http://dx.doi.org/10.1017/s0022377802001691.

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A theoretical analysis of spherical probes in plasmas is presented. It is assumed that the probe is at floating potential, that ion motion with respect to the probe is radial and that the electrons are Maxwellian. The analysis shows that as probe radius divided by Debye length tends to zero, the ratio of floating potential to electron temperature also goes to zero.
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Keenan IV, James A., and William A. Lamberti. "Quantitative Electron Probe Analysis of Zeolites." Microscopy and Microanalysis 10, S02 (2004): 486–87. http://dx.doi.org/10.1017/s1431927604885854.

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Somlyo, A. P., and Avril V. Somlyo. "Electron Probe Analysis and Cell Physiology." Proceedings, annual meeting, Electron Microscopy Society of America 43 (August 1985): 2–5. http://dx.doi.org/10.1017/s0424820100117169.

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Electron probe x-ray microanalysis (EPMA) of rapidly frozen tissues is a uniquely powerful method for dealing with a large class of general problems in cell physiology, as it is suitable for measuring, under direct vision, the elemental composition of cells and cell organelles. EPMA can reach a spatial resolution of at least 10nm, and its practically attainable sensitivity (for Ca) is 0.3mmol Ca/kg dry wt. Therefore, the composition of mitochondria and of other organelles, as small as the endoplasmic reticulum (ER), can be quantitated with EPMA. The most extensive applications of EPMA to cell
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LECHENE, C. "Electron-Probe Analysis of Cultured Cells." Annals of the New York Academy of Sciences 483, no. 1 Recent Advanc (1986): 270–83. http://dx.doi.org/10.1111/j.1749-6632.1986.tb34532.x.

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MATSUMOTO, Keisaku, and Takao HIRAJIMA. "Modal analysis using scanning electron probe microanalyzer." Japanese Magazine of Mineralogical and Petrological Sciences 35, no. 2 (2006): 97–108. http://dx.doi.org/10.2465/gkk.35.97.

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Ul-Hamid, Anwar, Hani M. Tawancy, Abdul-Rashid I. Mohammed, Said S. Al-Jaroudi, and Nureddin M. Abbas. "Quantitative WDS analysis using electron probe microanalyzer." Materials Characterization 56, no. 3 (2006): 192–99. http://dx.doi.org/10.1016/j.matchar.2005.11.007.

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Jurek, Karel, and Ondrej Gedeon. "Analysis of alkali-silicate glasses by electron probe analysis." Spectrochimica Acta Part B: Atomic Spectroscopy 58, no. 4 (2003): 741–44. http://dx.doi.org/10.1016/s0584-8547(02)00288-4.

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Bell, David C., Anthony J. Garratt-Reed, and Linn W. Hobbs. "RDF Analysis of Radiation-Amorphized SiC using a field Emission Scanning Electron Microscope." Microscopy and Microanalysis 4, S2 (1998): 700–701. http://dx.doi.org/10.1017/s143192760002362x.

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AbstractFast electrons are a particularly useful chemical and structural probe for the small sample volumes associated with ion- or fast electron-irradiation-induced amorphization, because of their much stronger interaction with matter than for X-rays or neutrons, and also because they can be readily focused to small probes. Three derivative signals are particularly rich in information: the angular distribution of scattered electrons (which is utilized in both diffraction and imaging studies); the energy loss spectrum of scattered electrons (electron energy loss spectroscopy, or EELS); and the
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Dissertations / Theses on the topic "Electron probe analysis"

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Koo, Bon Jun. "The Development and Analysis of Model Systems to Probe Proton-Coupled Electron Transfer in Ribonucleotide Reductase Ia of E. Coli." Thesis, Harvard University, 2016. http://nrs.harvard.edu/urn-3:HUL.InstRepos:33493539.

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Proton-coupled electron transfer (PCET) combines proton transfer with electron transfer to bypass high-energy intermediates. The ribonucleotide reductase (RNR) family of enzymes catalyzes the conversion of ribonucleotides to deoxynucleotides using amino acid radicals. The enzyme contains an efficient PCET pathway that transfers an electron and proton over a 35 Å distance across two subunits, the longest PCET pathway known in biology. The enzyme func-tions with very high fidelity, performing >105 turnovers before radical loss. This thesis explores PCET in model systems to understand the radic
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Kenyon, Michael. "The effect of chromium on the evolution of dispersoids in Al-Mg-Si alloys." Thesis, University of Manchester, 2018. https://www.research.manchester.ac.uk/portal/en/theses/the-effect-of-chromium-on-the-evolution-of-dispersoids-in-almgsi-alloys(d1494e0d-83bb-4e98-9dea-2fda6d858ff0).html.

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Aluminium is increasingly being used in the automotive industry to reduce the weight of vehicles. It is the additions of transition elements such as Mn and Cr that can be picked up during recycling, that can form dispersoid particles during homogenisation. Dispersoids play a significant role in the recrystallization and texture development for wrought Al-Mg-Si alloys by inhibiting grain boundary motion. It is therefore important to understand the precipitation kinetics of such particles. The Mn+Cr dispersoid phases are currently thought to nucleate on β'-Mg1.8Si particles via an intermediate s
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Hatani, Takeshi. "Nano-structural Analysis of Engrafted Human Induced Pluripotent Stem Cell-derived Cardiomyocytes in Mouse Hearts Using a Genetic-probe APEX2." Kyoto University, 2019. http://hdl.handle.net/2433/236616.

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Galiano, Kevin. "Scanning Probe Microscopy Measurements and Simulations of Traps and Schottky Barrier Heights of Gallium Nitride and Gallium Oxide." The Ohio State University, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=osu1576715425331868.

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Luchese, Cláudia Leites. "Avaliação da influência da temperatura e da concentração da solução de sacarose na desidratação osmótica de Physalis (Physalis peruviana L.)." reponame:Biblioteca Digital de Teses e Dissertações da UFRGS, 2013. http://hdl.handle.net/10183/96491.

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A Physalis peruviana Linnaeus é uma fruta considerada exótica que possui elevado custo de comercialização, principalmente nos mercados internacionais. Suas propriedades nutracêuticas e o aumento da sua produtividade no Estado do Rio Grande do Sul, associados à sua elevada perecibilidade definiram o objetivo deste trabalho: estudar o processo de transferência de massa durante a desidratação osmótica de physalis. Diversos trabalhos que avaliam as propriedades dos compostos bioativos da physalis através de ensaios in vitro e in vivo estão disponíveis na literatura, no entanto, há uma carência de
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White, R. P. "Spectroscopic probes for electron transfer phenomena." Thesis, University of East Anglia, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.382862.

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Caraher, Sally Kate 1974. "Clustering and precipitation processes in age-hardened Al-Zn-Mg-(Ag, Cu) alloys." Monash University, School of Physics and Materials Engineering, 2002. http://arrow.monash.edu.au/hdl/1959.1/7803.

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Boyce, Geraldine. "Electron crystallography of organic pigments." Thesis, University of Glasgow, 1997. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.340747.

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Mutas, Sergej [Verfasser]. "Analysis of high-k materials with Local Electrode Atom Probe / Sergej Mutas." Aachen : Shaker, 2012. http://d-nb.info/1066198276/34.

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Remmert, Jessica Lynn. "Nano Thermal and Contact Potential Analysis with Heated Probe Tips." Thesis, Georgia Institute of Technology, 2007. http://hdl.handle.net/1853/14585.

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This work describes two closed-loop atomic force microscopy methods that utilize the heated silicon probe to interrogate surfaces. The first method identifies the softening temperatures of a selected polymer and organic substrate as a function of contact force and surface hardness. Motivation partly stems from nanosampling, which requires knowledge of phase-specific transitions to identify and extract mass from multicomponent systems for chemical analysis. In the second method, the cantilever is implemented as a Kelvin probe to study the effect of temperature on the measured contact potenti
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Books on the topic "Electron probe analysis"

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Electron microprobe analysis and scanning electron microscopy in geology. Cambridge University Press, 1996.

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Electron microprobe analysis and scanning electron microscopy in geology. 2nd ed. Cambridge University Press, 2005.

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Conference, Microbeam Analysis Society. Microbeam analysis 1995: Proceedings of the 29th annual conference of the Microbeam Analysis Society, Breckenridge, Colorado, August 6-11, 1995. VCH Publishers, 1995.

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D, Aliev A., Rubt͡s︡ov A. E, and Zakharov A. P, eds. Ėlektronno-zondovyĭ mikroanaliz v issledovanii polimerov. "Nauka", 1990.

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1949-, Williams David B., and Shimizu R. 1937-, eds. Microbeam analysis 2000: Proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000. Institute of Physics Publishing, 2000.

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Scottish, Universities Summer School in Physics (40th 1992 Dundee Scotland). Quantitative microbeam analysis: Proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992. The School, 1993.

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Huebner, J. S. Chemical compositions and critical evaluation of microprobe standards available in the Reston microprobe facility. U.S. Geological Survey, 1985.

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Huebner, J. S. Chemical compositions and critical evaluation of microprobe standards available in the Reston microprobe facility. U.S. Geological Survey, 1985.

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9

Scott, V. D. Quantitative electron-probe microanalysis. 2nd ed. Ellis Horwood, 1995.

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Conant, Roger. Engineering circuit analysis with PSpice and Probe. McGraw-Hill, 1993.

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Book chapters on the topic "Electron probe analysis"

1

Potts, P. J. "Electron probe microanalysis." In A Handbook of Silicate Rock Analysis. Springer US, 1987. http://dx.doi.org/10.1007/978-1-4615-3270-5_10.

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Sakamae, Hiroshi. "Electron Probe Microanalysis." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_24.

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Potts, P. J. "Electron probe microanalysis." In A Handbook of Silicate Rock Analysis. Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-015-3988-3_10.

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Castaing, R. "Early Times of Electron Microprobe Analysis." In Electron Probe Quantitation. Springer US, 1991. http://dx.doi.org/10.1007/978-1-4899-2617-3_1.

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Brown, J. D. "φ(ρz) Equations for Quantitative Analysis." In Electron Probe Quantitation. Springer US, 1991. http://dx.doi.org/10.1007/978-1-4899-2617-3_5.

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Saubermann, Albert J. "X-Ray Microanalysis of Cryosections Using Image Analysis." In Electron Probe Microanalysis. Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-642-74477-8_6.

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Lechene, C. "Electron Probe Analysis of Transport Properties of Cultured Cells." In Electron Probe Microanalysis. Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-642-74477-8_18.

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Shelburne, John D., Victor L. Roggli, Peter Ingram, J. Allan Tucker, and Richard W. Linton. "Microprobe Analysis in Medicine — Present Practice and Future Trends." In Electron Probe Microanalysis. Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-642-74477-8_23.

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Armstrong, John T. "Quantitative Elemental Analysis of Individual Microparticles with Electron Beam Instruments." In Electron Probe Quantitation. Springer US, 1991. http://dx.doi.org/10.1007/978-1-4899-2617-3_15.

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Pouchou, Jean-Louis, and Françoise Pichoir. "Quantitative Analysis of Homogeneous or Stratified Microvolumes Applying the Model “PAP”." In Electron Probe Quantitation. Springer US, 1991. http://dx.doi.org/10.1007/978-1-4899-2617-3_4.

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Conference papers on the topic "Electron probe analysis"

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Sun-Jong Lim and Chan-Hong Lee. "Analysis of probe current in scanning electron microscopy." In 2008 International Conference on Control, Automation and Systems (ICCAS). IEEE, 2008. http://dx.doi.org/10.1109/iccas.2008.4694330.

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Lawrence, D. F., R. M. Ulfig, D. J. Larson, et al. "Routine Device-Level Atom Probe Analysis." In ISTFA 2014. ASM International, 2014. http://dx.doi.org/10.31399/asm.cp.istfa2014p0019.

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Abstract Continuing advances in Atom Probe Tomography and Focused Ion Beam Scanning Electron Microscope technologies along with the development of new specimen preparation approaches have resulted in reliable methods for acquiring 3D subnanometer compositional data from device structures. The routine procedure is demonstrated here by the analysis of the silicon-germanium source-drain region of a field effect transistor from a de-packaged off-the-shelf 28 nm design rule graphics chip. The center of the silicon-germanium sourcedrain region was found to have approximately 180 ppm of boron and the
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Donovan, John J., and David C. Johnson. "A Transmission Electron Probe Nano Analyzer for improved high accuracy elemental analysis." In 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO). IEEE, 2011. http://dx.doi.org/10.1109/nano.2011.6144551.

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Vickers, James, Seema Somani, Blake Freeman, et al. "Failure Analysis of FinFET Circuitry at GHz Speeds Using Voltage-Contrast and Stroboscopic Techniques on a Scanning Electron Microscope." In ISTFA 2019. ASM International, 2019. http://dx.doi.org/10.31399/asm.cp.istfa2019p0197.

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Abstract We report on using the voltage-contrast mechanism of a scanning electron microscope to probe electrical waveforms on FinFET transistors that are located within active integrated circuits. The FinFET devices are accessed from the backside of the integrated circuit, enabling electrical activity on any transistor within a working device to be probed. We demonstrate gigahertz-bandwidth probing at 10-nm resolution using a stroboscopic pulsed electron source.
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Toh, Suey Li, and Rong Ji. "Maximizing the Electron Microscopy Contrasts for Analysis." In ISTFA 2017. ASM International, 2017. http://dx.doi.org/10.31399/asm.cp.istfa2017p0345.

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Abstract To characterize materials or devices in the next generation cutting-edge technologies, it is becoming more essential to carry out comprehensive characterization of the samples with a system that can provide a wealth of various contrast information. By analyzing the different signals detected at different angular scattering distribution, it can reveal tremendous information from the samples. Coupled with the superior detection capability, we have demonstrated the capability to enhance the fault isolation methodology of memory devices or media grain size analysis by optimizing various p
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Schamp, C. T., Y. Suzuki, J. Fuse, et al. "EBIC and EBAC Analysis of Site Specific STEM Samples." In ISTFA 2017. ASM International, 2017. http://dx.doi.org/10.31399/asm.cp.istfa2017p0366.

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Abstract In transmission electron microscopy (TEM), one typically considers bright-field or dark-field imaging signals, which utilize the transmitted and scattered electrons, respectively. Analytical signals such as characteristic X-Rays or primary electron beam energy losses from inelastic scattering events give rise to the energy dispersive X-Ray spectroscopy and electron energy loss spectroscopy techniques, respectively. In this paper, the detection of the electron beam absorbed current (EBAC) and electron beam induced current (EBIC) signals is reported using a specially designed scanning T
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Mulder, Randal, Sam Subramanian, and Tony Chrastecky. "Atomic Force Probe Analysis of Nonvisible Defects in Sub-100nm CMOS Technologies." In ISTFA 2006. ASM International, 2006. http://dx.doi.org/10.31399/asm.cp.istfa2006p0503.

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Abstract Traditional micro-probing and electrical characterization at the transistor level for sub-100nm technologies has become very difficult if not virtually impossible. Scanning probe microscopy technology specifically atomic force probing was developed in response to these issues with traditional micro-probing. The case studies presented in this paper demonstrate how atomic force probing was used to characterize failing sub-100nm transistors, identify possible failure mechanisms, and allow device/process engineers to make adjustments to the wafer fabrication process to correct the problem
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Okada, Masaru, and Nobuhiko Hayashi. "Analysis of Magnetic Field-Angle Dependent Electronic Raman Scattering to Probe the Superconducting Gap." In Proceedings of the International Conference on Strongly Correlated Electron Systems (SCES2013). Journal of the Physical Society of Japan, 2014. http://dx.doi.org/10.7566/jpscp.3.015045.

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Chung, Koo-Hyun, and Dae-Eun Kim. "Wear Characteristics of Atomic Force Microscope Probe Tips." In World Tribology Congress III. ASMEDC, 2005. http://dx.doi.org/10.1115/wtc2005-63783.

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In the field of nanotechnology, Atomic Force Microscope (AFM) which is based on the interactions between an extremely sharp probe tip and specimen, has been widely utilized. In the AFM and AFM-based applications, the probe tip wear problem should be carefully considered. In this work, the wear characteristics of silicon, silicon nitride, and diamond coated probe tip under light loads were investigated. In order to identify the structure of the AFM probe tips as well as the nature of wear, High-Resolution Transmission Electron Microscope (HRTEM) and Field Emission Scanning Electron Microscope (
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Bonino, Olivier. "Contribution of the surface contamination of uranium materials on the quantitative analysis results by electron probe microbeam analysis." In Plutonium futures-The science (Topical conference on Plutonium and actinides). AIP, 2000. http://dx.doi.org/10.1063/1.1292201.

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Reports on the topic "Electron probe analysis"

1

Hsu, Julia. Surface structure and analysis with scanning probe microscopy and electron tunneling spectroscopy. Final report. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/758935.

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