Relevant bibliographies by topics / Electron ptychography

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Book chapters
  4. Conference papers

Academic literature on the topic 'Electron ptychography'

Author: Grafiati
Published: 7 June 2025
Last updated: 2 August 2025

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Journal articles on the topic "Electron ptychography"

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Nguyen, Kayla X., Yi Jiang, Chia-Hao Lee, et al. "Achieving sub-0.5-angstrom–resolution ptychography in an uncorrected electron microscope." Science 383, no. 6685 (2024): 865–70. http://dx.doi.org/10.1126/science.adl2029.

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Subangstrom resolution has long been limited to aberration-corrected electron microscopy, where it is a powerful tool for understanding the atomic structure and properties of matter. Here, we demonstrate electron ptychography in an uncorrected scanning transmission electron microscope (STEM) with deep subangstrom spatial resolution down to 0.44 angstroms, exceeding the conventional resolution of aberration-corrected tools and rivaling their highest ptychographic resolutions​. Our approach, which we demonstrate on twisted two-dimensional materials in a widely available commercial microscope, fa
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Lei, Yu, Biying Song, Zhiyuan Ding, et al. "Multidimensional Electron Ptychography." BIO Web of Conferences 129 (2024): 05021. http://dx.doi.org/10.1051/bioconf/202412905021.

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Gao, Si, Zhiyuan Ding, Xiaoqing Pan, Angus I. Kirkland, and Peng Wang. "3D Electron Ptychography." Microscopy and Microanalysis 25, S2 (2019): 1802–3. http://dx.doi.org/10.1017/s1431927619009747.

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Gao, C., C. Hofer, D. Jannis, A. Béché, J. Verbeeck, and T. J. Pennycook. "Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science." Applied Physics Letters 121, no. 8 (2022): 081906. http://dx.doi.org/10.1063/5.0101895.

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Ptychography provides highly efficient imaging in scanning transmission electron microscopy (STEM), but questions have remained over its applicability to strongly scattering samples such as those most commonly seen in materials science. Although contrast reversals can appear in ptychographic phase images as the projected potentials of the sample increase, we show here how these can be easily overcome by a small amount of defocus. The amount of defocus is small enough that it not only can exist naturally when focusing using the annular dark field (ADF) signal but can also be adjusted post acqui
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Zhao, Meng, Anton Gladyshev, and Christoph Koch. "Alternating-probe electron ptychography." BIO Web of Conferences 129 (2024): 04002. http://dx.doi.org/10.1051/bioconf/202412904002.

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Gladyshev, Anton, Johannes Müller, Benedikt Haas, and Christoph Koch. "Vibration-Corrected Electron Ptychography." BIO Web of Conferences 129 (2024): 04001. http://dx.doi.org/10.1051/bioconf/202412904001.

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Holler, Mirko, Manuel Guizar-Sicairos, and Jörg Raabe. "State-of-the-Art High-Resolution 3D X-ray Microscopy for Imaging of Integrated Circuits." EDFA Technical Articles 23, no. 2 (2021): 13–19. http://dx.doi.org/10.31399/asm.edfa.2021-2.p013.

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Abstract X-ray ptychography, as recent studies show, has the potential to bridge the gap that currently exists between conventional X-ray imaging and electron microscopy. This article covers the evolution of the technology from basic 2D imaging to computed tomography to 3D ptychographic X-ray laminography (PyXL) with zoom. To demonstrate the capabilities of PyXL, a 16-nm FinFET logic IC was mechanically polished to a thickness of 20 µm and several regions were imaged at various levels of resolution.
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Song, Biying, Zhiyuan Ding, Christopher Allen, et al. "Electron ptychography using an ultrafast direct electron detector." Microscopy and Microanalysis 25, S2 (2019): 20–21. http://dx.doi.org/10.1017/s1431927619000837.

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Sarahan, M. C., B. Kraus, M. J. Humphry, A. M. Maiden, and J. M. Rodenburg. "Electron Ptychography: Applications Of The Electron Wave Phase." Microscopy and Microanalysis 18, S2 (2012): 502–3. http://dx.doi.org/10.1017/s1431927612004369.

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Kirkland, AI, J. S. Kim, C. S. Allen, et al. "Applications of Low Dose Electron Ptychography." Microscopy and Microanalysis 28, S1 (2022): 352–54. http://dx.doi.org/10.1017/s1431927622002161.

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Dissertations / Theses on the topic "Electron ptychography"

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Cao, Shaohong. "Large field of view electron ptychography." Thesis, University of Sheffield, 2017. http://etheses.whiterose.ac.uk/19405/.

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Electron ptychography can overcome the limits of the conventional electron microscopy in terms of both resolution and phase quantitative measurements. There are two ways to implement ptychography with electrons. One employs a focused probe and the other uses a large probe. The advantage of focused probe electron ptychography is allowing to analyse spectrum while collecting the data. The biggest advantage of large probe electron ptychography is much larger field of view with the same scanning positions. In this thesis, we investigate the applications of the large probe ptychography in three mod
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Pelz, Philipp M. [Verfasser], and R. J. Dwayne [Akademischer Betreuer] Miller. "Low-dose computational phase contrast transmission electron microscopy via electron ptychography / Philipp M. Pelz ; Betreuer: R.J. Dwayne Miller." Hamburg : Staats- und Universitätsbibliothek Hamburg, 2018. http://d-nb.info/1173899243/34.

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Patoux, Adelin. "Conception, fabrication et étude de métasurfaces optiques." Thesis, Toulouse 3, 2022. http://www.theses.fr/2022TOU30079.

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Les métasurfaces optiques sont des composants optiques composées d'un ensemble de nanostructures qui interagissent fortement avec la lumière, modifiant ainsi considérablement ses propriétés sur une épaisseur sub-longueur d'onde. Elles permettent de créer des optiques planes, légères et pouvant combiner plusieurs fonctionnalités (modulation du front d'onde et contrôle de la polarisation par exemple). Nous décrivons ici les travaux concernant la conception, la fabrication et la caractérisation de métasurfaces optiques. Dans le premier chapitre, après une introduction sur l'historique des métasur
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Spangenberg, Dirk-Mathys. "Time domain ptychography." Thesis, Stellenbosch : Stellenbosch University, 2015. http://hdl.handle.net/10019.1/96735.

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Thesis (PhD)--Stellenbosch University, 2015.<br>ENGLISH ABSTRACT: In this work we investigate a new method to measure the electric field of ultrafast laser pulses by extending a known measurement technique, ptychography, in the spatial domain to the time domain which we call time domain ptychography. The technique requires the measurement of intensity spectra at different time delays of an unknown temporal object and a known probe pulse. We show for the first time by measurement and calculation that this technique can be applied with excellent results to recover both the amplitude and ph
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Book chapters on the topic "Electron ptychography"

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Mao, Wei, Liqi Zhou, Si Gao, and Peng Wang. "Electron ptychography." In Reference Module in Materials Science and Materials Engineering. Elsevier, 2023. http://dx.doi.org/10.1016/b978-0-323-90800-9.00245-6.

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Rodenburg, J. M. "Ptychography and Related Diffractive Imaging Methods." In Advances in Imaging and Electron Physics. Elsevier, 2008. http://dx.doi.org/10.1016/s1076-5670(07)00003-1.

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Rothhardt, J., and L. Loetgering. "Ultrafast Nanoscale Imaging with High Harmonic Sources." In Structural Dynamics with X-ray and Electron Scattering. Royal Society of Chemistry, 2023. http://dx.doi.org/10.1039/bk9781837671564-00233.

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The principle of high harmonic generation (HHG) is the basis of a new era of compact, high-flux radiation sources, which deliver short wavelengths at ultrafast timescales. Various metrology techniques reported so far, such as pump–probe spectroscopy and microscopy, are either time-, frequency-, or space-resolved, but relatively few combined approaches exist. Recent advances in both source and algorithm development have enabled multimodal acquisition and data analysis schemes that bridge the gap between these separate domains. Here, we describe emerging techniques in ultrafast lensless imaging,
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Conference papers on the topic "Electron ptychography"

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Moshtaghpour, Amirafshar, and Angus I. Kirkland. "On Overlap Ratio in Defocused Electron Ptychography." In ICASSP 2025 - 2025 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP). IEEE, 2025. https://doi.org/10.1109/icassp49660.2025.10890606.

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Yue, Han, Yun Xie, Xin Lou, Jun Cheng, Yu-Xuan Ren, and Feng Shu. "Noise-Resilient Ptychographic Imaging with Deep Learning." In 2024 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR). IEEE, 2024. http://dx.doi.org/10.1109/cleo-pr60912.2024.10676456.

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Hao, Jingzi, Bohan Xu, Tengyue Yan, et al. "Structural reconstruction of automotive sensors based on Fourier ptychographic microscopy." In 4th International Conference on Advanced Manufacturing Technology and Electronic Information (AMTEI 2024), edited by Wenfeng Hu, Wennian Yu, and Aniruddha Bhattacharjya. SPIE, 2025. https://doi.org/10.1117/12.3054416.

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Danaie, Mohsen. "Design of electron ptychography experiments through simulations." In Microscience Microscopy Congress 2021 incorporating EMAG 2021. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.mmc2021.338.

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"Detective quantum efficiency of electron ptychography techniques." In Microscience Microscopy Congress 2023 incorporating EMAG 2023. Royal Microscopical Society, 2023. http://dx.doi.org/10.22443/rms.mmc2023.428.

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Allars, Frederick. "Near-field Electron Ptychography using a Silicon Nitride diffuser." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.66.

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"Magnetic phase imaging using Lorentz near-field electron ptychography." In Microscience Microscopy Congress 2023 incorporating EMAG 2023. Royal Microscopical Society, 2023. http://dx.doi.org/10.22443/rms.mmc2023.175.

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Tamaki, Hirokazu, and Koh Saitoh. "Full-Field Illumination Ptychography Using a Structured Electron Beam." In 13th Asia Pacific Microscopy Congress 2025. ScienceOpen, 2025. https://doi.org/10.14293/apmc13-2025-0251.

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Chen, Zhen, Zehao Dong, Pengcheng Li, and Huaicheng Yuan. "Imaging Point Defects in Bulk Crystals Using Multislice Electron Ptychography." In 13th Asia Pacific Microscopy Congress 2025. ScienceOpen, 2025. https://doi.org/10.14293/apmc13-2025-0044.

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Liberti, Emanuela. "Quantification of light elements in STEM and 4-D STEM electron ptychography." In Microscience Microscopy Congress 2021 incorporating EMAG 2021. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.mmc2021.119.

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You might also be interested in the extended bibliographies on the topic 'Electron ptychography' for particular source types:
Journal articles
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