Relevant bibliographies by topics / Electron scanninig microscopy

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Electron scanninig microscopy'

Author: Grafiati
Published: 4 June 2021
Last updated: 1 February 2022

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Journal articles on the topic "Electron scanninig microscopy"

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Kamel, Barakat A. F. "SYNTHESIS OF NANO-ALUMINUM OXIDE VIA BIOLOGICAL AND ELECTROCHEMICAL METHODS." Al-Mustansiriyah Journal of Science 29, no. 4 (2019): 67. http://dx.doi.org/10.23851/mjs.v29i4.386.

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In this research work, the nanoparticles of aluminum oxide were synthesized by two ways. The first way is the biological by using (Pseudomonas aeruginosa) bacteria with a rate diameter (102.35) nm. The second way is the electrochemical with a rate diameter (62) nm. These nanoparticles were characterized by Atomic Force Microscopy (AFM), X-Ray diffraction technique (XRD), Transmission Electron Microscopy (TEM) and Scanninig Electron Microscopy (SEM). Alumina nanoparticles are thermodynamically stable particles over a wide temperature range . The biological activity of these nanoparticles toward
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Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

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The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcomin
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Dvorachek, Michael, Amnon Rosenfeld, and Avraham Honigstein. "Contaminations of geological samples in scanning electron microscopy." Neues Jahrbuch für Geologie und Paläontologie - Monatshefte 1990, no. 12 (1991): 707–16. http://dx.doi.org/10.1127/njgpm/1990/1991/707.

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Ueno, Masaki. "Excellent methods for processing crustacean larvae for scanning electron microscopy." Crustacean Research 38 (2009): 12–20. http://dx.doi.org/10.18353/crustacea.38.0_12.

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Neronov, A., P. Giurov, M. Cholakova, M. Dimitrova, and E. Nikolova. "Cryoprotection of porcine cornea: a scanning electron microscopy study ." Veterinární Medicína 50, No. 5 (2012): 219–24. http://dx.doi.org/10.17221/5618-vetmed.

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Porcine corneas were frozen with Me<sub>2</sub>SO, glycerol, 1,2-propanediol and PEG-400. The effects of the range of concentrations (5% and 10%) and temperature regimen (1ºC/min and 5ºC/min) were investigated. The integrity of corneal endothelial cells was evaluated by scanning electron microscopy and trypan blue staining. The presence of 5–10% PEG-400 in the protective medium was the most effective in minimizing changes in the integrity of the corneal endothelium during freezing-thawing procedures.
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Polak, Jaroslav. "OS05W0314 Atomic force microscopy and high resolution scanning electron microscopy evidence concerning fatigue crack nucleation." Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics 2003.2 (2003): _OS05W0314. http://dx.doi.org/10.1299/jsmeatem.2003.2._os05w0314.

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Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th
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Vertsanova, O. V. "Solving Research Tasks Using Phenom Prox Desktop Scanning Electron Microscope." Science and innovation 10, no. 2 (2014): 55–57. http://dx.doi.org/10.15407/scine10.02.055.

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Kishimoto, Satoshi, and Yoshihisa Tanaka. "OS01F067 Two-Dimensional Electron Moire Method Using Digital Thermal Field Emission Scanning Electron Microscope." Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics 2011.10 (2011): _OS01F067——_OS01F067—. http://dx.doi.org/10.1299/jsmeatem.2011.10._os01f067-.

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Battistella, Florent, Steven Berger, and Andrew Mackintosh. "Scanning Optical Microscopy via a Scanning Electron Microscope." Journal of Electron Microscopy Technique 6, no. 4 (1987): 377–84. http://dx.doi.org/10.1002/jemt.1060060408.

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Dissertations / Theses on the topic "Electron scanninig microscopy"

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Harland, C. J. "Detector and electronic developments for scanning electron microscopy." Thesis, University of Sussex, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370435.

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Morgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /." Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.

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Davies, D. G. "Scanning electron acoustic microscopy." Thesis, University of Cambridge, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.304042.

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Snella, Michael T. "Drift correction for scanning-electron microscopy." Thesis, Massachusetts Institute of Technology, 2010. http://hdl.handle.net/1721.1/62605.

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Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2010.<br>This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.<br>Cataloged from student submitted PDF version of thesis.<br>Includes bibliographical references (p. 91-92).<br>Scanning electron micrographs at high magnification (100,000x and up) are distorted by motion of the sample during image acquisition, a phenomenon called drift. We propose a method for correcting drift distortion in imag
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McKeown, Karen. "Using scanning electron microscopy (SEM) and transmission electron nncroscopy." Thesis, Queen's University Belfast, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.492019.

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Electron impact excitation collisions are important processes for spectral line formation of plasmas. The work undertaken in this thesis focuses on such collisions involving Li-like ions, important in both astrophysical and magnetically confined plasmas. By having reliable atomic and collisional data, such as energy levels, radiative rates and excitation rate coefficients, it is possible to generate models to describe such plasmas. The atomic data were calculated using the General-Purpose Relativistic Structure Program (GRASP; Dyall et al 1989), for several Li-like ions, namely S XIV, Ar XVI,
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Löfgren, André. "Detection of electron vortex beams : Using a scanning transmission electron microscope." Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.

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Electron vortex beams (EVBs) are electron beams with a doughnut-like intensity profile, carrying orbital angular momentum due to their helical phase shift distribution. When employed in an electron microscope, they are expected to be efficient for the detection of magnetic signals. In this report I have investigated high angle annular dark field (HAADF) images obtained using EVBs. This was done for 300 K and 5K. For 5 K,  I also compared HAADF images from an ordinary electron beam with HAADF images from an electron vortex beam. What was found was that EVBs produced doughnuts around the atomic
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William, Gerald Martin. "The study of electronic materials for light emitting devices using scanning cathodoluminescence electron microscopy." Thesis, University of Birmingham, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.289377.

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Martin, Geoffrey Clive. "Virtual Scanning Electron Microscope : a web-based teaching and training solution for the Scanning Electron Microscope." Thesis, University of Cambridge, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611878.

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Skoupý, Radim. "Quantitative Imaging in Scanning Electron Microscope." Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2020. http://www.nusl.cz/ntk/nusl-432610.

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Tato práce se zabývá možnostmi kvantitativního zobrazování ve skenovacím (transmisním) elektronovém mikroskopu (S|T|EM) společně s jejich korelativní aplikací. Práce začíná popisem metody kvantitativního STEM (qSTEM), kde lze stanovenou lokální tloušťku vzorku dát do spojitosti s ozářenou dávkou, a vytvořit tak studii úbytku hmoty. Tato metoda byla použita při studiu ultratenkých řezů zalévací epoxidové pryskyřice za různých podmínek (stáří, teplota, kontrastování, čištění pomocí plazmy, pokrytí uhlíkem, proud ve svazku). V rámci této části jsou diskutovány a demonstrovány možnosti kalibračníh
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Findlay, Scott David. "Theoretical aspects of scanning transmission electron microscopy /." Connect to thesis, 2005. http://eprints.unimelb.edu.au/archive/00001057.

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Books on the topic "Electron scanninig microscopy"

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Reimer, Ludwig. Scanning Electron Microscopy. Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-540-38967-5.

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Reimer, Ludwig. Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4.

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William, Heckman John, and Klomparens Karen L, eds. Scanning and transmission electron microscopy: An introduction. Oxford University Press, 1995.

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William, Heckman John, and Klomparens Karen L, eds. Scanning and transmission electron microscopy: An introduction. W.H. Freeman, 1993.

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Pennycook, Stephen J., and Peter D. Nellist, eds. Scanning Transmission Electron Microscopy. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-7200-2.

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Brodusch, Nicolas, Hendrix Demers, and Raynald Gauvin. Field Emission Scanning Electron Microscopy. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-4433-5.

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Chescoe, Dawn. The operation of transmission and scanning electron microscopes. Oxford University Press, 1990.

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Lyman, Charles E., Joseph I. Goldstein, Alton D. Romig, et al. Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy. Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1.

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1923-, James A. M., and ACOL, eds. Scanning electron microscopy and x-ray microanalysis. published on behalf of ACOL by Wiley, 1987.

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Lawes, Grahame. Scanning electron microscopy and x-ray microanalysis. Edited by James Arthur M and ACOL. Published on behalf of ACOL by Wiley, 1987.

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Book chapters on the topic "Electron scanninig microscopy"

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Reimer, Ludwig. "Electron Optics of a Scanning Electron Microscope." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_2.

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Reimer, Ludwig. "Introduction." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_1.

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Reimer, Ludwig. "Electron Scattering and Diffusion." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_3.

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Reimer, Ludwig. "Emission of Electrons and X-Ray Quanta." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_4.

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Reimer, Ludwig. "Detectors and Signal Processing." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_5.

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Reimer, Ludwig. "Electron-Beam-Induced Current, Cathodoluminescence and Special Techniques." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_7.

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Reimer, Ludwig. "Crystal Structure Analysis by Diffraction." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_8.

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Reimer, Ludwig. "Elemental Analysis and Imaging with X-Rays." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_9.

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Reimer, Ludwig. "Imaging with Secondary and Backscattered Electrons." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_6.

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Seaborn, David W., and Jennifer L. Wolny. "Scanning Electron Microscopy." In Methods in Plant Electron Microscopy and Cytochemistry. Humana Press, 2000. http://dx.doi.org/10.1007/978-1-59259-232-6_13.

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Conference papers on the topic "Electron scanninig microscopy"

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Galand, R., L. Clément, P. Waltz, and Y. Wouters. "Microstructure and texture analysis of advanced copper using electron backscattered diffraction and scanning transmission electron microscopy." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.852908.

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Campo, E. M., H. Campanella, Y. Y. Huang, et al. "Electron microscopy of polymer-carbon nanotubes composites." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.867718.

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Burnett, Bryan R. "An electro-conductive organic coating for scanning electron microscopy (déjà vu)." In SPIE Scanning Microscopies, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and Tim K. Maugel. SPIE, 2014. http://dx.doi.org/10.1117/12.2065553.

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Babin, S., S. Borisov, and A. Ivanchikov. "Modeling of charge and discharge in scanning electron microscopy." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.828575.

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Young, Richard, Sander Henstra, Jarda Chmelik, et al. "XHR SEM: enabling extreme high resolution scanning electron microscopy." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.824749.

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Postek, Michael T., András E. Vladár, William Keery, Michael Bishop, Benjamin Bunday, and John Allgair. "NEW scanning electron microscope magnification calibration reference material (RM) 8820." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.859118.

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Pfeiffer, Hans C. "New prospects for electron beams as tools for semiconductor lithography." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.822771.

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Ghosh, Nabarun, Amiyanghshu Chatterjee, and Don W. Smith. "Scanning electron microscopy in characterizing seeds of some leguminous trees." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.821814.

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Roussel, Laurent Y., Debbie J. Stokes, Ingo Gestmann, Mark Darus, and Richard J. Young. "Extreme high resolution scanning electron microscopy (XHR SEM) and beyond." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.821826.

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Campo, E. M., A. Meléndez, K. Morales, J. Poplawsky, J. J. Santiago-Avilés, and I. Ramos. "Electron microscopy and cathodoluminescence in electrospun nanodimensional structures: challenges and opportunities." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.866761.

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Reports on the topic "Electron scanninig microscopy"

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Weber, Peter M. Time-Resolved Scanning Electron Microscopy. Defense Technical Information Center, 2006. http://dx.doi.org/10.21236/ada455461.

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Hadjipansyis, George C. DURIP 00 Scanning Electron Microscope (SEM). Defense Technical Information Center, 2001. http://dx.doi.org/10.21236/ada388472.

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Pennycook, S. J., and A. R. Lupini. Image Resolution in Scanning Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), 2008. http://dx.doi.org/10.2172/939888.

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Marder, A., K. Barmak, and D. Williams. Environmental scanning electron microscope (ESEM). Final report. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/676882.

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Collins, Kimberlee Chiyoko, Albert Alec Talin, David W. Chandler, and Joseph R. Michael. Development of Scanning Ultrafast Electron Microscope Capability. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1331925.

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Ruggiero, S. T. Single-electron tunneling. [Microwave scanning tunneling microscope]. Office of Scientific and Technical Information (OSTI), 1993. http://dx.doi.org/10.2172/6854553.

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Bertness, K. A. Dimensional measurement of nanostructures with scanning electron microscopy. National Institute of Standards and Technology, 2017. http://dx.doi.org/10.6028/nist.sp.250-96.

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Nakakura, Craig Y., and Kimberlee Chiyoko Celio. Novel Applications of Scanning Ultrafast Electron Microscopy (SUEM). Office of Scientific and Technical Information (OSTI), 2019. http://dx.doi.org/10.2172/1564040.

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Stirling, J. A. R., and G. J. Pringle. Tools of investigation: the electron microprobe and scanning electron microscope. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1996. http://dx.doi.org/10.4095/210959.

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Mikula, R. J. Application of scanning electron microscopy to tar sands emulsions. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1986. http://dx.doi.org/10.4095/304896.

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