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Books on the topic 'Electron scanninig microscopy'

Author: Grafiati

Published: 4 June 2021

Last updated: 1 February 2022

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1

Reimer, Ludwig. Scanning Electron Microscopy. Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-540-38967-5.

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2

Reimer, Ludwig. Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4.

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3

William, Heckman John, and Klomparens Karen L, eds. Scanning and transmission electron microscopy: An introduction. Oxford University Press, 1995.

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4

William, Heckman John, and Klomparens Karen L, eds. Scanning and transmission electron microscopy: An introduction. W.H. Freeman, 1993.

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5

Pennycook, Stephen J., and Peter D. Nellist, eds. Scanning Transmission Electron Microscopy. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-7200-2.

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6

Brodusch, Nicolas, Hendrix Demers, and Raynald Gauvin. Field Emission Scanning Electron Microscopy. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-4433-5.

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7

Chescoe, Dawn. The operation of transmission and scanning electron microscopes. Oxford University Press, 1990.

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8

Lyman, Charles E., Joseph I. Goldstein, Alton D. Romig, et al. Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy. Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1.

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9

1923-, James A. M., and ACOL, eds. Scanning electron microscopy and x-ray microanalysis. published on behalf of ACOL by Wiley, 1987.

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10

Lawes, Grahame. Scanning electron microscopy and x-ray microanalysis. Edited by James Arthur M and ACOL. Published on behalf of ACOL by Wiley, 1987.

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11

European Congress on Optics (1st 1988 Hamburg, Germany). Scanning imaging: ECO1, 21-23 September 1988, Hamburg, Federal Republic of Germany. Edited by Wilson Tony, Association nationale de la recherche technique., European Federation for Applied Optics., European Physical Society, Society of Photo-optical Instrumentation Engineers., and International Congress on Optical Science and Engineering (1988 : Hamburg, Germany). SPIE--The International Society for Optical Engineering, 1989.

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12

Castejón, Orlando J. Scanning electron microscopy of cerebellar cortex. Kluwer Academic / Plenum Publishers, 2004.

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13

Lothar, Engel, ed. Scanning electron microscopy of plastics failure. Hanser Publishers, 2010.

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14

Castejón, Orlando J. Scanning Electron Microscopy of Cerebellar Cortex. Springer US, 2003. http://dx.doi.org/10.1007/978-1-4615-0159-6.

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15

Fleck, Roland A., and Bruno M. Humbel. Biological Field Emission Scanning Electron Microscopy. John Wiley & Sons, Ltd, 2019. http://dx.doi.org/10.1002/9781118663233.

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16

Schatten, Heide, and James B. Pawley, eds. Biological Low-Voltage Scanning Electron Microscopy. Springer New York, 2008. http://dx.doi.org/10.1007/978-0-387-72972-5.

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17

Castejón, Orlando J. Scanning electron microscopy of cerebellar cortex. Kluwer Academic / Plenum Publishers, 2003.

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18

Johari, Om. Scanning electron microscopy/1986: An international journal of scanning electron microscopy, related techniques, and applications. Edited by Becker Robert P, Levenson L. L, Roomans Godfried M, and Scanning Electron Microscopy Inc. Scanning Electron Microscopy, 1986.

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19

Roomans, Godfried M. Scanning electron microscopy, 1985: An international journal of scanning electron microscopy, related techniques, and applications. Scanning Electron Microscopy, 1985.

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20

Johari, Om. Scanning electron microscopy/1985: An international journal of scanning electron microscopy, related techniques, and applications. Edited by Becker Robert P, Roomans Godfried M, Levenson L. L, and Scanning Electron Microscopy Inc. Scanning Electron Microscopy, 1985.

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21

Roomans, G. M., R. P. Becker, and L. L. Levenson. Scanning electron microscopy / 1986: An international journal of scanning electron microscopy, related techniques, and applications. Edited by Scanning Electron Microscopy Inc. Scanning Electron Microscopy, 1986.

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22

Schatten, Heide. Scanning electron microscopy for the life sciences. Cambridge University Press, 2012.

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23

Scanning electron microscopy and x-ray microanalysis. PTR Prentice Hall, 1993.

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24

Scanning electrochemical microscopy. 2nd ed. CRC Press, 2012.

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25

Kassing, R. Scanning Microscopy: Symposium Proceedings. Springer Berlin Heidelberg, 1992.

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26

Shimizu, Kenichi. New horizons of applied scanning electron microscopy. Springer-Verlag, 2010.

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27

Electron microprobe analysis and scanning electron microscopy in geology. Cambridge University Press, 1996.

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28

Electron microprobe analysis and scanning electron microscopy in geology. 2nd ed. Cambridge University Press, 2005.

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29

Pennycook, Stephen J. Scanning Transmission Electron Microscopy: Imaging and Analysis. Springer Science+Business Media, LLC, 2011.

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30

Lawes, Graham. Scanning electron microscopy and x-ray microanalysis. Edited by James A. M. 1923- and ACOL (Project). Published on behalf of ACOL, Thames Polytecnic, London, by Wiley, 1987.

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31

Ul-Hamid, Anwar. A Beginners' Guide to Scanning Electron Microscopy. Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-98482-7.

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32

Goldstein, Joseph I., Dale E. Newbury, Patrick Echlin, et al. Scanning Electron Microscopy and X-ray Microanalysis. Springer US, 2003. http://dx.doi.org/10.1007/978-1-4615-0215-9.

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33

Goldstein, Joseph I., Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, and David C. Joy. Scanning Electron Microscopy and X-Ray Microanalysis. Springer New York, 2018. http://dx.doi.org/10.1007/978-1-4939-6676-9.

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34

Shimizu, Kenichi, and Tomoaki Mitani. New Horizons of Applied Scanning Electron Microscopy. Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-03160-1.

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35

Goldstein, Joseph I., Dale E. Newbury, Patrick Echlin, et al. Scanning Electron Microscopy and X-Ray Microanalysis. Springer US, 1992. http://dx.doi.org/10.1007/978-1-4613-0491-3.

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36

Aharinejad, S. H., and A. Lametschwandtner. Microvascular Corrosion Casting in Scanning Electron Microscopy. Springer Vienna, 1992. http://dx.doi.org/10.1007/978-3-7091-9230-6.

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37

Schatten, Heide, ed. Scanning Electron Microscopy for the Life Sciences. Cambridge University Press, 2012. http://dx.doi.org/10.1017/cbo9781139018173.

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38

Lyman, Charles E. Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook. Springer US, 1990.

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39

Barthlott, Wilhelm. Orchid seed diversity: A scanning electron microscopy survey. Botanic Garden and Botanical Museum Berlin-Dahlem, 2014.

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40

Image formation in low-voltage scanning electron microscopy. SPIE Optical Engineering Press, 1993.

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41

Newbury, Dale E., David C. Joy, Patrick Echlin, Charles E. Fiori, and Joseph I. Goldstein. Advanced Scanning Electron Microscopy and X-Ray Microanalysis. Springer US, 1986. http://dx.doi.org/10.1007/978-1-4757-9027-6.

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42

Vaughan, David. 2. Studying minerals. Oxford University Press, 2014. http://dx.doi.org/10.1093/actrade/9780199682843.003.0002.

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The study of minerals begins with their characterization, identification, and classification determined from their chemical compositions and crystallographic properties. ‘Studying minerals’ shows that historically this was based on properties observable in hand specimens, but the development of wide-ranging techniques has allowed the study of all aspects of minerals: their structures, chemistries, surface chemistries, and reactivities. Techniques described include transmitted light and reflected light microscopy using thin and polished sections; X-ray crystallography based on Bragg’s Law; tech

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43

Scanning Electron Microscopy. NY RESEARCH PRESS, 2015.

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44

Kazmiruk, Viacheslav, ed. Scanning Electron Microscopy. InTech, 2012. http://dx.doi.org/10.5772/1973.

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45

Pennycook, S. J., M. Varela, M. F. Chisholm, et al. Scanning transmission electron microscopy of nanostructures. Edited by A. V. Narlikar and Y. Y. Fu. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199533053.013.6.

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This article investigates nanostructures by means of scanning transmission electron microscopy. The electron microscope is uniquely suited to the study of individual nanostructures, allowing differentiation of different structures and properties that is difficult or impossible to do with techniques that provide a spatial average. The present generation of aberration correctors, which correct all aberrations up to third order, makes it possible to obtain sufficient sensitivity to image and spectroscopically analyze single atoms. This article begins with a brief overview of the correction of len

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46

Prutton, Martin, and Mohamed M. El Gomati. Scanning Auger Electron Microscopy. Wiley & Sons, Incorporated, John, 2006.

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47

M, Prutton, and El Gomati Mohamed M, eds. Scanning Auger electron microscopy. Wiley, 2006.

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48

Prutton, Martin, and Mohamed M. El Gomati. Scanning Auger Electron Microscopy. Wiley & Sons, Incorporated, John, 2007.

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49

Prutton, Martin, and Mohamed M. El Gomati, eds. Scanning Auger Electron Microscopy. Wiley, 2005. http://dx.doi.org/10.1002/9780470866795.

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50

Marshall, D. J., L. Balk, and G. Remond. Luminescence Vol. 9: Scanning Microscopy Supplement (Scanning Microscopy Supplement,). Scanning Microscopy International, 1998.

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