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Journal articles on the topic 'Electron scanninig microscopy'

Author: Grafiati

Published: 4 June 2021

Last updated: 1 February 2022

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1

Kamel, Barakat A. F. "SYNTHESIS OF NANO-ALUMINUM OXIDE VIA BIOLOGICAL AND ELECTROCHEMICAL METHODS." Al-Mustansiriyah Journal of Science 29, no. 4 (2019): 67. http://dx.doi.org/10.23851/mjs.v29i4.386.

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In this research work, the nanoparticles of aluminum oxide were synthesized by two ways. The first way is the biological by using (Pseudomonas aeruginosa) bacteria with a rate diameter (102.35) nm. The second way is the electrochemical with a rate diameter (62) nm. These nanoparticles were characterized by Atomic Force Microscopy (AFM), X-Ray diffraction technique (XRD), Transmission Electron Microscopy (TEM) and Scanninig Electron Microscopy (SEM). Alumina nanoparticles are thermodynamically stable particles over a wide temperature range . The biological activity of these nanoparticles toward

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Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

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The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcomin

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Dvorachek, Michael, Amnon Rosenfeld, and Avraham Honigstein. "Contaminations of geological samples in scanning electron microscopy." Neues Jahrbuch für Geologie und Paläontologie - Monatshefte 1990, no. 12 (1991): 707–16. http://dx.doi.org/10.1127/njgpm/1990/1991/707.

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4

Ueno, Masaki. "Excellent methods for processing crustacean larvae for scanning electron microscopy." Crustacean Research 38 (2009): 12–20. http://dx.doi.org/10.18353/crustacea.38.0_12.

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Neronov, A., P. Giurov, M. Cholakova, M. Dimitrova, and E. Nikolova. "Cryoprotection of porcine cornea: a scanning electron microscopy study ." Veterinární Medicína 50, No. 5 (2012): 219–24. http://dx.doi.org/10.17221/5618-vetmed.

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Porcine corneas were frozen with Me<sub>2</sub>SO, glycerol, 1,2-propanediol and PEG-400. The effects of the range of concentrations (5% and 10%) and temperature regimen (1&ordm;C/min and 5&ordm;C/min) were investigated. The integrity of corneal endothelial cells was evaluated by scanning electron microscopy and trypan blue staining. The presence of 5&ndash;10% PEG-400 in the protective medium was the most effective in minimizing changes in the integrity of the corneal endothelium during freezing-thawing procedures.

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Polak, Jaroslav. "OS05W0314 Atomic force microscopy and high resolution scanning electron microscopy evidence concerning fatigue crack nucleation." Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics 2003.2 (2003): _OS05W0314. http://dx.doi.org/10.1299/jsmeatem.2003.2._os05w0314.

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Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th

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Vertsanova, O. V. "Solving Research Tasks Using Phenom Prox Desktop Scanning Electron Microscope." Science and innovation 10, no. 2 (2014): 55–57. http://dx.doi.org/10.15407/scine10.02.055.

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Kishimoto, Satoshi, and Yoshihisa Tanaka. "OS01F067 Two-Dimensional Electron Moire Method Using Digital Thermal Field Emission Scanning Electron Microscope." Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics 2011.10 (2011): _OS01F067——_OS01F067—. http://dx.doi.org/10.1299/jsmeatem.2011.10._os01f067-.

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10

Battistella, Florent, Steven Berger, and Andrew Mackintosh. "Scanning Optical Microscopy via a Scanning Electron Microscope." Journal of Electron Microscopy Technique 6, no. 4 (1987): 377–84. http://dx.doi.org/10.1002/jemt.1060060408.

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Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.

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Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three l

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12

Chen, Xiaodong, Bin Zheng, and Hong Liu. "Optical and Digital Microscopic Imaging Techniques and Applications in Pathology." Analytical Cellular Pathology 34, no. 1-2 (2011): 5–18. http://dx.doi.org/10.1155/2011/150563.

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The conventional optical microscope has been the primary tool in assisting pathological examinations. The modern digital pathology combines the power of microscopy, electronic detection, and computerized analysis. It enables cellular-, molecular-, and genetic-imaging at high efficiency and accuracy to facilitate clinical screening and diagnosis. This paper first reviews the fundamental concepts of microscopic imaging and introduces the technical features and associated clinical applications of optical microscopes, electron microscopes, scanning tunnel microscopes, and fluorescence microscopes.

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Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments, While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar ca

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14

Niemova, S. V. "Sample Preparation for Translucent and Scanning Electron Microscopy: New Leica Microsystems Coaters." Science and innovation 10, no. 2 (2014): 50–54. http://dx.doi.org/10.15407/scine10.02.050.

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15

Laforsch, Christian, and Ralph Tollrian. "A new preparation technique of daphnids for Scanning Electron Microscopy using hexamethyldisilazane." Fundamental and Applied Limnology 149, no. 4 (2000): 587–96. http://dx.doi.org/10.1127/archiv-hydrobiol/149/2000/587.

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Kishimoto, Satoshi, and Yoshihisa Tanaka. "OS01-3-3 Development of Two-Dimensional Electron Moire Method Using Digital Scanning Electron Microscope." Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics 2011.10 (2011): _OS01–3–3—. http://dx.doi.org/10.1299/jsmeatem.2011.10._os01-3-3-.

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17

Baba-Kishi, K. Z. "Scanning reflection electron microscopy of surface topography by diffusely scattered electrons in the scanning electron microscope." Scanning 18, no. 4 (2006): 315–21. http://dx.doi.org/10.1002/sca.1996.4950180408.

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18

Kristály, Ferenc, and László A. Gömze. "Remnants of organic pore-forming additives in conventional clay brickmaterials: Optical Microscopy and Scanning Electron Microscopy study." Epitoanyag - Journal of Silicate Based and Composite Materials 60, no. 2 (2008): 34–38. http://dx.doi.org/10.14382/epitoanyag-jsbcm.2008.7.

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19

Sun, Cheng, Erich Müller, Matthias Meffert, and Dagmar Gerthsen. "On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope." Microscopy and Microanalysis 24, no. 2 (2018): 99–106. http://dx.doi.org/10.1017/s1431927618000181.

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AbstractTransmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission ele

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J. H., Youngblom, Wilkinson J., and Youngblom J.J. "Telepresence Confocal Microscopy." Microscopy and Microanalysis 6, S2 (2000): 1164–65. http://dx.doi.org/10.1017/s1431927600038319.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments. While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar ca

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21

Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing i

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22

Ross, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.

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This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage el

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23

KONNO, Mitsuru, Toshie YAGUCHI, and Takahito HASHIMOTO. "Transmission Electron Microscop and Scanning Transmission Electron Microscope." Journal of the Japan Society of Colour Material 79, no. 4 (2006): 147–51. http://dx.doi.org/10.4011/shikizai1937.79.147.

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Sládek, Z., and D. Ryšánek. "Apoptosis of neutrophilic granulocytes of bovine virgin mammary gland in scanning electron microscopy." Veterinární Medicína 46, No. 7–8 (2001): 185–89. http://dx.doi.org/10.17221/7881-vetmed.

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The objective of this work was the morphologic analysis of apoptosis of neutrophilic granulocytes (hereinafter referred to as neutrophils) in scanning electron microscopy (SEM) in comparison with morphological features distinguishable by light microscopy. This study was performed on 12 bovine virgin mammary glands washed with physiological buffered solution (PBS) prior to the induction of cell influx by PBS. Twenty-four hours after influx induction the cell suspension was obtained by the lavage of mammary glands with PBS. The particular lavages were cytologicaly and bacteriologicaly examined.

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Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Confocal Laser Scanning Microscopy By Remote Access." Microscopy Today 7, no. 7 (1999): 32–33. http://dx.doi.org/10.1017/s1551929500064798.

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In recent years there have been a growing number of facilities interested in developing remote access capabilities to a variety of microscopy systems. While certain types of microscopes, such as electron microscopes and scanning probe microscopes have been well established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal microscope.At California State University, home to the CSUPERB (California State University Program for Education and Research in Biotechnology) Confocal Microscope Core Facility, we have established a remote acce

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26

Frank, L., Š. Mikmeková, Z. Pokorná, and I. Müllerová. "Scanning Electron Microscopy With Slow Electrons." Microscopy and Microanalysis 19, S2 (2013): 372–73. http://dx.doi.org/10.1017/s1431927613003851.

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27

Jester, J. V., H. D. Cavanagh, and M. A. Lemp. "In vivo confocal imaging of the eye using tandem scanning confocal microscopy (TSCM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 56–57. http://dx.doi.org/10.1017/s0424820100102365.

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New developments in optical microscopy involving confocal imaging are now becoming available which dramatically increase resolution, contrast and depth of focus by optically sectioning through structures. The transparency of the anterior ocular structures, cornea and lens, make microscopic visualization and optical sectioning of the living intact eye an interesting possibility. Of the confocal microscopes available, the Tandem Scanning Reflected Light Microscope (referred to here as the Tandem Scanning Confocal Microscope), developed by Professors Petran and Hadravsky at Charles University in

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Kersker, M., C. Nielsen, H. Otsuji, T. Miyokawa, and S. Nakagawa. "The JSM-890 ultra high resolution Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 88–89. http://dx.doi.org/10.1017/s0424820100152410.

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Historically, ultra high spatial resolution electron microscopy has belonged to the transmission electron microscope. Today, however, ultra high resolution scanning electron microscopes are beginning to challenge the transmission microscope for the highest resolution.To accomplish high resolution surface imaging, not only is high resolution required. It is also necessary that the integrity of the specimen be preserved, i.e., that morphological changes to the specimen during observation are prevented. The two major artifacts introduced during observation are contamination and beam damage, both

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Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.

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The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic poten

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Prutton, M., M. M. El Gomati, J. C. Greenwood, P. G. Kennyr, I. R. Barkshire, and J. C. Dee. "Multispectral Surface Analytical Microscopy: A Third-Generation Scanning Auger Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 384–85. http://dx.doi.org/10.1017/s0424820100135526.

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The quantitative interpretation of scanning Auger electron microscope (SAM) images has been shown to require the use of multi-spectral imaging of the surface under study. In a multi-spectral analytical microscope (MULSAM) a set of maps (bands) is acquired from the same area of a sample using scattered electrons with different kinetic energies as well as other signals from the sample such as current flowing to ground, the conventional SEM signal and characteristic x-rays. The resulting set of bands is a multi-spectral image which can be processed using models of the electron scattering in the s

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Gauvin, Raynald, and Paula Horny. "The Characterization of Nano Materials in the FE-SEM." Microscopy and Microanalysis 6, S2 (2000): 744–45. http://dx.doi.org/10.1017/s1431927600036217.

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The observation of nano materials or nano phases is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the last decade, a new generation of microscopes is available on the market. These are the Field Emission Scanning Electron Microscope (FE-SEM) with a virtual secondary electron detector. The FE-SEM have a higher brightness allowing probe diameter smaller than 2.5 nm with incident electron energy, E0, below 5 keV. Furthermore, what gives FE-SEM outstanding resolu

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You, Yun-Wen, Hsun-Yun Chang, Hua-Yang Liao, et al. "Electron Tomography of HEK293T Cells Using Scanning Electron Microscope–Based Scanning Transmission Electron Microscopy." Microscopy and Microanalysis 18, no. 5 (2012): 1037–42. http://dx.doi.org/10.1017/s1431927612001158.

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AbstractBased on a scanning electron microscope operated at 30 kV with a homemade specimen holder and a multiangle solid-state detector behind the sample, low-kV scanning transmission electron microscopy (STEM) is presented with subsequent electron tomography for three-dimensional (3D) volume structure. Because of the low acceleration voltage, the stronger electron-atom scattering leads to a stronger contrast in the resulting image than standard TEM, especially for light elements. Furthermore, the low-kV STEM yields less radiation damage to the specimen, hence the structure can be preserved. I

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Schwarzer, Robert. "Orientation Microscopy Using the Analytical Scanning Electron Microscope." Practical Metallography 51, no. 3 (2014): 160–79. http://dx.doi.org/10.3139/147.110280.

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34

Hetherington, Craig L., Connor G. Bischak, Claire E. Stachelrodt, et al. "Superresolution Fluorescence Microscopy within a Scanning Electron Microscope." Biophysical Journal 108, no. 2 (2015): 190a—191a. http://dx.doi.org/10.1016/j.bpj.2014.11.1054.

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Sujata, K., and Hamlin M. Jennings. "Advances in Scanning Electron Microscopy." MRS Bulletin 16, no. 3 (1991): 41–45. http://dx.doi.org/10.1557/s0883769400057390.

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Scanning electron microscopes offer several unique advantages and they have evolved into complex integrated instruments that often incorporate several important accessories. Their principle advantage stems from the method of constructing an image from a highly focused electron beam that scans across the surface of a specimen. The beam generates backscattered electrons and excites secondary electrons and x-rays in a highly localized “spot.” These signals can be detected, and the results of the analysis are displayed as a specific intensity on a screen at a position that represents the position

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Gauvin, Raynald, and Pierre Hovington. "On the Microanalysis of Small Precipitates at Low Voltage with a FE-SEM." Microscopy and Microanalysis 5, S2 (1999): 308–9. http://dx.doi.org/10.1017/s1431927600014860.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th

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37

O'Keefe, Michael A., John H. Turner, John A. Musante, et al. "Laboratory Design for High-Performance Electron Microscopy." Microscopy Today 12, no. 3 (2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.

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Since publication of the classic text on the electron microscope laboratory by Anderson, the proliferation of microscopes with field emission guns, imaging filters and hardware spherical aberration correctors (giving higher spatial and energy resolution) has resulted in the need to construct special laboratories. As resolutions iinprovel transmission electron microscopes (TEMs) and scanning transmission electron microscopes (STEMs) become more sensitive to ambient conditions. State-of-the-art electron microscopes require state-of-the-art environments, and this means careful design and implemen

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38

Wortmann, F. J., and G. Wortmann. "Quantitative Fiber Mixture Analysis by Scanning Electron Microscopy." Textile Research Journal 62, no. 7 (1992): 423–31. http://dx.doi.org/10.1177/004051759206200710.

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Labeling textile blends requires identification and quantification of their fibrous components. Blends of specialty animal fibers with sheep's wool are of special, practical importance; for these the light microscope is the traditional tool of analysis. To investigate the actual applicability of light microscopy for analyzing such blends as an alternative to the scanning electron microscope (SEM), we analyzed in detail the results of round trials conducted in the seventies. The results confirm that light microscopy, in general, is neither an objective nor a reproducible method for analyzing wo

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Urchulutegui, M. "Scanning Electron-Acoustic Microscopy: Do You Know Its Capabilities?" MRS Bulletin 21, no. 10 (1996): 42–46. http://dx.doi.org/10.1557/s0883769400031638.

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Characterization of materials usually requires microscopy techniques. Some of the most useful are based on a scanning microscope and involve scanning the sample surface with a focused beam (e.g., photons, electrons, ions, etc.). For example, photoacoustic microscopy uses a laser beam, acoustic microscopy uses an ultrasound beam, and scanning electron microscopy uses an electron beam. The interaction between the material and the beam produces a signal that can be used to generate a two-dimensional image.In scanning photoacoustic microscopy (SPAM), an intensity-modulated light beam is used to pr

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Koyama, Atsuhiro, and Yoji Shibutani. "OS02F037 Non-destructive Observations of Internal Micro-defects using Scanning Electron-induced Acoustic Microscope." Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics 2011.10 (2011): _OS02F037——_OS02F037—. http://dx.doi.org/10.1299/jsmeatem.2011.10._os02f037-.

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Kondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi, and Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.

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Recent development of ultra-high vacuum electron microscopy (UHV-EM) is very rapid. This is due to the fact that it can be applied to variety of surface science fields.There are various types of surface imaging in UHV condition; low energy electron microscopy (LEEM) [1], transmission (TEM) and reflection electron microscopy (REM) [2] using conventional transmission electron microscopes (CTEM) (including scanning TEM and REM)), scanning electron microscopy, photoemission electron microscopy (PEEM) [3] and scanning tunneling microscopy (STM including related techniques such as scanning tunneling

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42

Venables, J. A., G. G. Hembree, and C. J. Harland. "Electron spectroscopy in SEM and STEM." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 378–79. http://dx.doi.org/10.1017/s0424820100135496.

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Low energy electrons, in the energy range 0-2 keV, are very useful in surface science. Both secondary (0-100 eV nominally) and Auger (50-2 keV) electrons can be used as analytic signals in ultra-high vacuum (UHV) scanning (SEM) and scanning transmission (STEM) electron microscopes. This paper briefly reviews some ongoing projects, which are aimed at improving the spatial resolution and information content of these signals.Both secondary electron imaging (SEI) and Auger electrons spectroscopy (AES) have a long history. Reviews of AES and its microscopic counterpart scanning Auger microscopy (SA

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Cudby, Paul E. F., and Barry A. Gilbey. "Scanning Transmission Imaging of Elastomer Blends Using an Unmodified Conventional Scanning Electron Microscope." Rubber Chemistry and Technology 68, no. 2 (1995): 342–50. http://dx.doi.org/10.5254/1.3538747.

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Abstract A novel method for carrying out scanning transmission electron microscopy on a standard scanning electron microscope is described. This method involves the addition of a specially fabricated mount and is accomplished without carrying out any form of modification on the microscope. The method is compared to more conventional microscopy techniques and examples are given showing the advantages of this system.

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Takayanagi, K., Y. Ohshima, K. Mohri, et al. "In-situ UHV-Electron Microscopy with Scanning Tunneling Microscope." Microscopy and Microanalysis 8, S02 (2002): 414–15. http://dx.doi.org/10.1017/s1431927602100511.

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Rigler, Mark, and William Longo. "High Voltage Scanning Electron Microscopy Theory and Applications." Microscopy Today 2, no. 5 (1994): 12–13. http://dx.doi.org/10.1017/s1551929500066256.

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A variety of energy emissions occur as a result of primary beam interaction with the specimen surface. Secondary electrons, x-rays, visible photons, near IR photons, and Auger electrons are emitted during inelastic scattering of electrons. Backscattered electrons (BSE) are emitted during elastic scattering of primary electrons. Backscattered electrons are those electrons which pass through the electron cloud of an atom and change direction without much energy loss. BSEs may diffuse into the sample or may escape from the sample surface. In practice, the primary electron beam penetrates deeply i

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46

Jones, Arthur V. "Novel Approaches to Low-Voltage Scanning Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 366–67. http://dx.doi.org/10.1017/s0424820100180586.

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In comparison with the developers of other forms of instrumentation, scanning electron microscope manufacturers are among the most conservative of people. New concepts usually must wait many years before being exploited commercially. The field emission gun, developed by Albert Crewe and his coworkers in 1968 is only now becoming widely available in commercial instruments, while the innovative lens designs of Mulvey are still waiting to be commercially exploited. The associated electronics is still in general based on operating procedures which have changed little since the original microscopes

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Galiy, P., T. Nenchuk, A. Ciszewski, P. Mazur, S. Zuber, and I. Yarovets’. "Scanning Tunneling Microscopy/Spectroscopy and Low-Energy Electron Diffraction Investigations of GaTe Layered Crystal Cleavage Surface." METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 37, no. 6 (2016): 789–801. http://dx.doi.org/10.15407/mfint.37.06.0789.

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Saini, Komal, Rajshree Rathore, Ravinder Kaur, Tarun Sharma, and Shabnam P. Kaur. "Establishing Sequence of Inkjet Printer, Laser Printer and Writing Ink Strokes using Scanning Electron Microscopy (SEM)." Arab Journal of Forensic Sciences & Forensic Medicine 1, no. 10 (2019): 1367–72. http://dx.doi.org/10.26735/16586794.2019.026.

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Hansen, Douglas. "The Scanning Electron Microscope As A Precision Instrument." Microscopy Today 4, no. 6 (1996): 30–34. http://dx.doi.org/10.1017/s1551929500060909.

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Abstract:

I began using scanning electron microscopes to solve problems encountered in the fabrication of x-ray diffraction gratings. Since these diffraction gratings consist of very regular lines and spaces, and produce high contrast images from the SEM. my microscopy work often points out problems with the microscope.One time, for example, I went to the university SEM lab I often use, and was advised that the microscope was down that day due to major field problems. This lab often had problems with stray fields for reasons no one could explain. Usually I was the only one to complain about stray field

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Mil'shteinand, S., and D. C. Joy. "Microanalysis using secondary electrons in scanning electron microscopy." Scanning 23, no. 5 (2006): 295–97. http://dx.doi.org/10.1002/sca.4950230501.

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