Academic literature on the topic 'Electronic circuits Analog electronic systems'
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Journal articles on the topic "Electronic circuits Analog electronic systems"
ITOH, MAKOTO. "SYNTHESIS OF ELECTRONIC CIRCUITS FOR SIMULATING NONLINEAR DYNAMICS." International Journal of Bifurcation and Chaos 11, no. 03 (March 2001): 605–53. http://dx.doi.org/10.1142/s0218127401002341.
Full textDieste-Velasco, M. Isabel. "Application of a Fuzzy Inference System for Optimization of an Amplifier Design." Mathematics 9, no. 17 (September 5, 2021): 2168. http://dx.doi.org/10.3390/math9172168.
Full textWaqas, Maria, Muhammad Khurram, and S. M. Razaul Hasan. "Analog Electronic Circuits to Model Cooperativity in Hill Process." Mehran University Research Journal of Engineering and Technology 39, no. 4 (October 1, 2020): 678–85. http://dx.doi.org/10.22581/muet1982.2004.01.
Full textFRITZ, KARL E., BARBARA A. RANDALL, GREGG J. FOKKEN, MICHAEL J. DEGERSTROM, MICHAEL J. LORSUNG, JASON F. PRAIRIE, ERIC L. H. AMUNDSEN, et al. "HIGH-SPEED, LOW-POWER DIGITAL AND ANALOG CIRCUITS IMPLEMENTED IN IBM SiGe BiCMOS TECHNOLOGY." International Journal of High Speed Electronics and Systems 13, no. 01 (March 2003): 221–37. http://dx.doi.org/10.1142/s0129156403001582.
Full textWANG, SHIU-PING, SENG-KIN LAO, HSIEN-KENG CHEN, JUHN-HORNG CHEN, and SHIH-YAO CHEN. "IMPLEMENTATION OF THE FRACTIONAL-ORDER CHEN–LEE SYSTEM BY ELECTRONIC CIRCUIT." International Journal of Bifurcation and Chaos 23, no. 02 (February 2013): 1350030. http://dx.doi.org/10.1142/s0218127413500302.
Full textMattiussi, Claudio, Daniel Marbach, Peter Dürr, and Dario Floreano. "The Age of Analog Networks." AI Magazine 29, no. 3 (September 6, 2008): 63. http://dx.doi.org/10.1609/aimag.v29i3.2156.
Full textCzaja, Z. "A self-testing method of large analog circuits in electronic embedded systems." Journal of Physics: Conference Series 238 (July 1, 2010): 012013. http://dx.doi.org/10.1088/1742-6596/238/1/012013.
Full textLópez, Alberto, Francisco Ferrero, José Ramón Villar, and Octavian Postolache. "High-Performance Analog Front-End (AFE) for EOG Systems." Electronics 9, no. 6 (June 11, 2020): 970. http://dx.doi.org/10.3390/electronics9060970.
Full textWANG, KEH-CHUNG, RANDALL B. NUBLING, KEN PEDROTTI, NENG-HAUNG SHENG, PETER M. ASBECK, KEN POULTON, JOHN CORCORAN, KNUD KNUDSEN, HAN-TZONG YUAN, and CHRISTOPHER CHANG. "AlGaAs/GaAs HBTs FOR ANALOG AND DIGITAL APPLICATIONS." International Journal of High Speed Electronics and Systems 05, no. 03 (September 1994): 213–52. http://dx.doi.org/10.1142/s0129156494000127.
Full textLi, Zhong Qun, Xu Fei Wang, Shu Nong Zhang, and Jia Ming Liu. "A Method of Test Point Optimization Selection for Analog Circuits." Applied Mechanics and Materials 568-570 (June 2014): 3–7. http://dx.doi.org/10.4028/www.scientific.net/amm.568-570.3.
Full textDissertations / Theses on the topic "Electronic circuits Analog electronic systems"
Sabzavari, Abbas Mostafavi. "Fault simulation and diagnosis in analog electronic systems." Thesis, University of Exeter, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.328233.
Full textKnight, Clinton D. "WWW-based testing of analog circuits." Diss., Georgia Institute of Technology, 1999. http://hdl.handle.net/1853/14863.
Full textYoon, Heebyung. "Fault detection and identification techniques for embedded analog circuits." Diss., Georgia Institute of Technology, 1998. http://hdl.handle.net/1853/13041.
Full textHu, Yichuan. "Analog non-linear coding for improved performance in compressed sensing." Access to citation, abstract and download form provided by ProQuest Information and Learning Company; downloadable PDF file, 76 p, 2009. http://proquest.umi.com/pqdweb?did=1885755731&sid=5&Fmt=2&clientId=8331&RQT=309&VName=PQD.
Full textEl-Gamal, Mohamed A. "Fault location and parameter identification in analog circuits." Ohio : Ohio University, 1990. http://www.ohiolink.edu/etd/view.cgi?ohiou1172776742.
Full textPeng, Sheng-Yu. "Charge-based analog circuits for reconfigurable smart sensory systems." Diss., Atlanta, Ga. : Georgia Institute of Technology, 2008. http://hdl.handle.net/1853/29655.
Full textCommittee Chair: Hasler, Paul; Committee Member: Anderson, David; Committee Member: Degertekin, F.; Committee Member: Ghovanloo, Maysam; Committee Member: Minch, Bradley. Part of the SMARTech Electronic Thesis and Dissertation Collection.
Killens, Jacob. "Utilizing standard CMOS process floating gate devices for analog design." Master's thesis, Mississippi State : Mississippi State University, 2001. http://library.msstate.edu/etd/show.asp?etd=etd-04092001-110957.
Full textChawla, Ravi. "Power-efficient analog systems to perform signal-processing using floating-gate MOS device for portable applications." Available online, Georgia Institute of Technology, 2005, 2004. http://etd.gatech.edu/theses/available/etd-01052005-144937/unrestricted/chawla%5Fravi%5F200505%5Fphd.pdf.
Full textPaul Hasler, Committee Member ; Joy Laskar, Committee Chair ; Phil Allen, Committee Member ; Dave Anderson, Committee Member ; Mark T. Smith, Committee Member. Includes bibliographical references.
Hall, Tyson Stuart. "Field-Programmable Analog Arrays: A Floating-Gate Approach." Diss., Available online, Georgia Institute of Technology, 2004:, 2004. http://etd.gatech.edu/theses/available/etd-07122004-124607/unrestricted/hall%5Ftyson%5Fs%5F200407%5Fphd.pdf.
Full textPrvulovic, Milos, Committee Member ; Citrin, David, Committee Member ; Lanterman, Aaron, Committee Member ; Yalamanchili, Sudhakar, Committee Member ; Hasler, Paul, Committee Member ; Anderson, David, Committee Chair. Includes bibliographical references.
Coimbra, Ricardo Pureza. "Geração de tensão de referencia e sinal de sensoriamento termico usando transistores MOS em forte inversão." [s.n.], 2009. http://repositorio.unicamp.br/jspui/handle/REPOSIP/262029.
Full textDissertação (mestrado) - Universidade Estadual de Campinas, Faculdade de Engenharia Eletrica e de Computação
Made available in DSpace on 2018-08-14T00:43:32Z (GMT). No. of bitstreams: 1 Coimbra_RicardoPureza_M.pdf: 4991793 bytes, checksum: 2b5fb9293ae9abe4c248964485ff74e3 (MD5) Previous issue date: 2009
Resumo: Fontes de referência de tensão e sensores de temperatura são blocos extensivamente utilizados em sistemas microeletrônicos. Como alternativa à aplicação de estruturas consolidadas, mas protegidas por acordos de propriedade intelectual, é permanente a demanda pelo desenvolvimento de novas técnicas e estruturas originais destes circuitos. Também se destaca o crescente interesse por soluções de baixa tensão, baixo consumo e compatíveis com processos convencionais de fabricação. Este trabalho descreve o desenvolvimento de um circuito que atende a estas exigências, fornecendo uma tensão de referência e um sinal de sensoriamento térmico, obtidos a partir de um arranjo adequado de transistores MOS, que operam em regime de forte inversão. O princípio de operação do circuito desenvolvido foi inspirado no conceito de que é possível empilhar n transistores MOS, polarizados com corrente adequada, de tal forma que a queda de tensão sobre a pilha de transistores, com amplitude nVGS, apresente a mesma taxa de variação térmica que a tensão VGS produzida por um único transistor. Nesta condição, a diferença entre as duas tensões é constante em temperatura, constituindo-se em uma referência de tensão. No entanto, o empilhamento de dois ou mais transistores impossibilita a operação do circuito sob baixa tensão. Isto motivou a adaptação da técnica, obtendo a tensão nVGS com o auxílio de um arranjo de resistores, sem o empilhamento de transistores. Desta forma, o potencial limitante da tensão mínima de alimentação tornou-se a própria tensão de referência, cuja amplitude é próxima de um único VGS. A estrutura desenvolvida fornece também um sinal de tensão com dependência aproximadamente linear com a temperatura absoluta, que pode ser aplicado para sensoriamento térmico. Foram fabricados protótipos correspondentes a diversas versões de dimensionamento do circuito para comprovação experimental de seu princípio de operação. O melhor desempenho verificado corresponde à geração de uma tensão de referência com coeficiente térmico de 8,7ppm/ºC, no intervalo de -40ºC a 120ºC, operando com tensão de 1V. Embora o estado da arte seja representado por índices tão baixos quanto 1ppm/ºC, para a mesma faixa de temperatura, a característica compacta do circuito e seu potencial de aplicação sob as condições de baixa tensão e baixo consumo lhe conferem valor como contribuição para este campo de pesquisa e desenvolvimento.
Abstract: Voltage references and temperature sensors are blocks extensively used in microelectronic systems. As an alternative to the use of consolidated structures that are protected by intellectual property agreements, there is a permanent demand for the development of new techniques and structures for these circuits. It can be also highlighted the growing interest for low-voltage and low-power solutions, implemented in conventional IC technologies. This work describes the development of a circuit that meets these requirements by providing a voltage reference and temperature sensing signal obtained from a suitable arrangement of MOS transistors biased in strong inversion. The operation principle of the circuit developed is based on the concept that it is possible for a stack of n MOS transistors, biased by an appropriate current, to show a voltage drop, equal to nVGS, with the same thermal variation rate as a VGS voltage produced by a single transistor. Hence, the difference between the two voltage signals is temperature independent, characterizing a voltage reference. However, the stacking of two or more transistors prevents the operation of the circuit under low voltage. This fact motivated to adapt the technique by obtaining the voltage nVGS with the aid of an array of resistors and no stacked transistors. The minimum supply voltage becomes limited only by the reference voltage itself, whose amplitude is close to a single VGS. The circuit developed also provides a voltage signal almost linearly dependent with the absolute temperature, which can be applied for thermal sensing. Prototypes corresponding to various dimensional versions of the circuit were produced to experimentally verify the principle of operation. The best performance corresponds to the generation of a voltage reference signal with 8.7ppm/ºC thermal coefficient, from -40ºC to 120ºC, under a 1V supply voltage. Although the state of the art is represented by values as low as 1ppm/ºC, at the same temperature range, the circuit's compact aspect together with the possibility to attend low-voltage and low-power requirements grants it value as contribution to this field of research and development
Mestrado
Eletrônica, Microeletrônica e Optoeletrônica
Mestre em Engenharia Elétrica
Books on the topic "Electronic circuits Analog electronic systems"
Analogue electronic circuits and systems. Cambridge [England]: Cambridge University Press, 1991.
Find full textJeffrey, Lang, ed. Foundations of analog & digital electronic circuits. Amsterdam: Elsevier : Morgan Kaufman Publishers, 2005.
Find full textBook chapters on the topic "Electronic circuits Analog electronic systems"
Huang, Qiu, and Ruey-wen Liu. "Fault Diagnosis of Nonlinear Electronic Circuits." In Testing and Diagnosis of Analog Circuits and Systems, 85–115. Boston, MA: Springer US, 1991. http://dx.doi.org/10.1007/978-1-4615-9747-6_4.
Full textSteinhorst, Sebastian, and Lars Hedrich. "Formal Methods for Verification of Analog Circuits." In Simulation and Verification of Electronic and Biological Systems, 173–92. Dordrecht: Springer Netherlands, 2011. http://dx.doi.org/10.1007/978-94-007-0149-6_9.
Full textKawaguchi, Masashi, Takashi Jimbo, and Naohiro Ishii. "Dynamic Learning of Neural Network by Analog Electronic Circuits." In Knowledge-Based and Intelligent Information and Engineering Systems, 73–79. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-23866-6_8.
Full textHashizume, Masaki, Yoshihiro Iwata, and Takeomi Tamesada. "Performance Evaluation for Fault Detection of Analog Electronic Circuits." In Fuzzy Logic and its Applications to Engineering, Information Sciences, and Intelligent Systems, 255–64. Dordrecht: Springer Netherlands, 1995. http://dx.doi.org/10.1007/978-94-009-0125-4_25.
Full textvan Petegem, W., B. Geeraerts, and W. Sansen. "Electrothermal Simulation of Analogue Integrated Circuits With Ets." In Thermal Management of Electronic Systems II, 83–92. Dordrecht: Springer Netherlands, 1997. http://dx.doi.org/10.1007/978-94-011-5506-9_8.
Full textKawaguchi, Masashi, Shoji Suzuki, Takashi Jimbo, and Naohiro Ishii. "Speed Flexibility Biomedical Vision Model Using Analog Electronic Circuits and VLSI Layout Design." In Knowledge-Based and Intelligent Information and Engineering Systems, 697–704. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-04592-9_86.
Full textTietze, Ulrich, Christoph Schenk, and Eberhard Gamm. "Digital-Analog and Analog-Digital Converters." In Electronic Circuits, 945–86. Berlin, Heidelberg: Springer Berlin Heidelberg, 2008. http://dx.doi.org/10.1007/978-3-540-78655-9_18.
Full textPous, Carles, Joan Colomer, and Joaquim Melendez. "Extending a Fault Dictionary Towards a Case Based Reasoning System for Linear Electronic Analog Circuits Diagnosis." In Lecture Notes in Computer Science, 748–62. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-540-28631-8_54.
Full textTietze, Ulrich, Christoph Schenk, and Eberhard Gamm. "Analog Switches and Sample-and-Hold Circuits." In Electronic Circuits, 929–44. Berlin, Heidelberg: Springer Berlin Heidelberg, 2008. http://dx.doi.org/10.1007/978-3-540-78655-9_17.
Full textDimopoulos, Hercules G. "Second Order Functions and Circuits." In Analog Electronic Filters, 389–439. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-94-007-2190-6_10.
Full textConference papers on the topic "Electronic circuits Analog electronic systems"
Billmeyer, Ryan, Minghui Lu, Brian Johnson, and Sairaj Dhople. "Modeling and Simulation of Power-Electronic Inverters in Analog Electronic Circuit Simulators." In 2021 IEEE International Symposium on Circuits and Systems (ISCAS). IEEE, 2021. http://dx.doi.org/10.1109/iscas51556.2021.9401268.
Full textKyziol, Piotr, Jerzy Rutkowski, and Damian Grzechca. "Testing analog electronic circuits using N-terminal network." In 2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). IEEE, 2010. http://dx.doi.org/10.1109/ddecs.2010.5491790.
Full textChruszczyk, L., J. Rutkowski, and D. Grzechca. "Optimal Excitation in Fault Diagnosis of Analog Electronic Circuits." In 2007 14th International Conference on Mixed Design of Integrated Circuits and Systems. IEEE, 2007. http://dx.doi.org/10.1109/mixdes.2007.4286218.
Full textChruszczyk, L., and J. Rutkowski. "Excitation optimization in fault diagnosis of analog electronic circuits." In 2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS). IEEE, 2008. http://dx.doi.org/10.1109/ddecs.2008.4538802.
Full textCooren, Yann, Patrick Siarry, and Mourad Fakhfakh. "Application of MO-TRIBES to the design of analog electronic circuits." In 2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009). IEEE, 2009. http://dx.doi.org/10.1109/icecs.2009.5410986.
Full textDutta, J. C., and T. Ahmed. "A simple electronic analog of the postsynaptic membrane: The NEUROBIOFET." In 2012 International Conference on Devices, Circuits and Systems (ICDCS 2012). IEEE, 2012. http://dx.doi.org/10.1109/icdcsyst.2012.6188656.
Full textChruszczyk, L., and J. Rutkowski. "Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits." In 2008 15th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2008). IEEE, 2008. http://dx.doi.org/10.1109/icecs.2008.4674836.
Full textGolonek, Tomasz. "Analog circuits specifications testing by means of fast fourier transformation." In 2016 International Conference on Signals and Electronic Systems (ICSES). IEEE, 2016. http://dx.doi.org/10.1109/icses.2016.7593811.
Full textHalgas, Stanislaw, and Michal Tadeusiewicz. "Multiple soft fault diagnosis of analogue electronic circuits." In 2008 International Conference on Signals and Electronic Systems. IEEE, 2008. http://dx.doi.org/10.1109/icses.2008.4673490.
Full textGielen, Georges. "Design tools and circuit solutions for degradation-resilient analog circuits in nanometer CMOS." In 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. IEEE, 2009. http://dx.doi.org/10.1109/ddecs.2009.5012084.
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