Relevant bibliographies by topics / Electronic microscope

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Electronic microscope'

Author: Grafiati
Published: 28 May 2022
Last updated: 31 July 2025

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Journal articles on the topic "Electronic microscope"

1

Chen, Xiaodong, Bin Zheng, and Hong Liu. "Optical and Digital Microscopic Imaging Techniques and Applications in Pathology." Analytical Cellular Pathology 34, no. 1-2 (2011): 5–18. http://dx.doi.org/10.1155/2011/150563.

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The conventional optical microscope has been the primary tool in assisting pathological examinations. The modern digital pathology combines the power of microscopy, electronic detection, and computerized analysis. It enables cellular-, molecular-, and genetic-imaging at high efficiency and accuracy to facilitate clinical screening and diagnosis. This paper first reviews the fundamental concepts of microscopic imaging and introduces the technical features and associated clinical applications of optical microscopes, electron microscopes, scanning tunnel microscopes, and fluorescence microscopes.
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Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.

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The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic poten
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Daberkow, I., and M. Schierjott. "Possibilities And Examples For Remote Microscopy Including Digital Image Acquisition, Transfer, and Archiving." Microscopy and Microanalysis 4, S2 (1998): 2–3. http://dx.doi.org/10.1017/s1431927600020134.

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Recent developments promise the possibility to externally control every aspect of microscopes through a computer interface. In combination with high-resolution cameras and feedback to the microscope, this can be leveraged to create highly automatic routines, e.g., to remotely correct astigmatism. Together with the development of fast computer networks this creates a new branch of microscopy, the so-called “telemicroscopy”. The goal of telemicroscopy is the control of a microscope over a large distance including the transfer of images with an acceptable repetition rate. A big advantage for elec
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Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing i
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BIRCH, SARAH, PAUL COCKSHOTT, and KAREN RENAUD. "Putting Electronic Voting under the Microscope." Political Quarterly 85, no. 2 (2014): 187–94. http://dx.doi.org/10.1111/1467-923x.12071.

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Mickols, William, Ignacio Tinoco, Joseph E. Katz, Marcos F. Maestre, and Carlos Bustamante. "Imaging differential polarization microscope with electronic readout." Review of Scientific Instruments 56, no. 12 (1985): 2228–36. http://dx.doi.org/10.1063/1.1138354.

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Kondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi, and Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.

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Recent development of ultra-high vacuum electron microscopy (UHV-EM) is very rapid. This is due to the fact that it can be applied to variety of surface science fields.There are various types of surface imaging in UHV condition; low energy electron microscopy (LEEM) [1], transmission (TEM) and reflection electron microscopy (REM) [2] using conventional transmission electron microscopes (CTEM) (including scanning TEM and REM)), scanning electron microscopy, photoemission electron microscopy (PEEM) [3] and scanning tunneling microscopy (STM including related techniques such as scanning tunneling
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Abe, Eiji. "Electron Microscopy for Atomic/Electronic Structure of Quasicrystals." Acta Crystallographica Section A Foundations and Advances 70, a1 (2014): C1193. http://dx.doi.org/10.1107/s2053273314088068.

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As stated with special emphasis in the Noble Lecture by Dr. Shechtman, the quasicrystal discovery is definitely the victory of electron microscopy – the first icosahedral stereogram was constructed by a series of electron diffraction patterns from a tiny quasicrystalline grain, and the following high-resolution electron microscope images indeed confirmed a unique aperiodic order that can never be consistent with twinning of normal crystals. Almost thirty years after these early electron microscopy studies, we are now in the era of aberration-corrected electron microscopy which realizes a remar
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Dantas de Oliveira, Allisson, Carles Rubio Maturana, Francesc Zarzuela Serrat, et al. "Development of a low-cost robotized 3D-prototype for automated optical microscopy diagnosis: An open-source system." PLOS ONE 19, no. 6 (2024): e0304085. http://dx.doi.org/10.1371/journal.pone.0304085.

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In a clinical context, conventional optical microscopy is commonly used for the visualization of biological samples for diagnosis. However, the availability of molecular techniques and rapid diagnostic tests are reducing the use of conventional microscopy, and consequently the number of experienced professionals starts to decrease. Moreover, the continuous visualization during long periods of time through an optical microscope could affect the final diagnosis results due to induced human errors and fatigue. Therefore, microscopy automation is a challenge to be achieved and address this problem
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Vilà, Anna, Sergio Moreno, Joan Canals, and Angel Diéguez. "A Compact Raster Lensless Microscope Based on a Microdisplay." Sensors 21, no. 17 (2021): 5941. http://dx.doi.org/10.3390/s21175941.

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Lensless microscopy requires the simplest possible configuration, as it uses only a light source, the sample and an image sensor. The smallest practical microscope is demonstrated here. In contrast to standard lensless microscopy, the object is located near the lighting source. Raster optical microscopy is applied by using a single-pixel detector and a microdisplay. Maximum resolution relies on reduced LED size and the position of the sample respect the microdisplay. Contrarily to other sort of digital lensless holographic microscopes, light backpropagation is not required to reconstruct the i
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Dissertations / Theses on the topic "Electronic microscope"

1

Burger, Willem Adriaan. "The design and analysis of a DC SQUID for a SQUID microscope." Thesis, Stellenbosch : Stellenbosch University, 2008. http://hdl.handle.net/10019.1/2239.

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Thesis (MScEng (Electrical and Electronic Engineering))--Stellenbosch University, 2008.<br>This thesis relates to the analysis and design of a SQUID microscope. Superconductor theory is discussed in depth to provide a thorough understanding of Josephson junctions and of dc SQUID magnetometers. The behaviour and suitability of different types of single-layer dc SQUIDs are looked at. The quality of the superconducting material patterned onto a substrate and the Josephson junction design used affect the behaviour of a practical dc SQUID. Noise and cooling play an integral part in the design a
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Atia-Tul-Noor. "Reaction microscope studies of small molecules in strong laser fields." Thesis, Griffith University, 2017. http://hdl.handle.net/10072/371910.

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The dynamics of molecules and molecular reactions that generate chemistry such as bond breaking, bond formation or bond rearrangement occur on the femtosecond (10􀀀15 s) time scale. Real-time observations and investigations of these reactions are fundamental to understanding these dynamics. Ultra-fast laser pulses with intensities around 1014 W=cm2, impact on the electronic and nuclear motion on femtosecond timescale. In order to understand the region of transition states between the initial and nal state of a reaction, that determines the fate of the products, detailed experimental investigat
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Ziegler, Martin [Verfasser]. "Exploring structural, electronic, magnetic, and vibrational properties of nanostructures with a scanning tunneling microscope / Martin Ziegler." Kiel : Universitätsbibliothek Kiel, 2009. http://d-nb.info/1019869844/34.

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Clark, Kendal W. "STM Study of Molecular and Biomolecular Electronic Systems." Ohio University / OhioLINK, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1282363151.

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Shin, Heungjoo. "Fabrication of atomic force microscope probes integrated with microelectrodes for micro four-point probe and SECM-AFM." Available online, Georgia Institute of Technology, 2006, 2006. http://etd.gatech.edu/theses/available/etd-01042006-123329/.

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Thesis (Ph. D.)--Mechanical Engineering, Georgia Institute of Technology, 2006.<br>Levent Degertekin, Committee Member ; William P. King, Committee Member ; Boris Mizaikoff, Committee Member ; Mark G. Allen, Committee Member ; Peter J. Hesketh, Committee Chair.
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Chee, Kuan Way Augustus. "Novel investigations of contrast in the Scanning Electron Microscope towards a new generation of doping profiling techniques engineered for semiconductor (opto)electronic device technology." Thesis, University of Cambridge, 2009. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611845.

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Krull, Cornelius. "Electronic structure of metal phthalocyanines on Ag (100)." Doctoral thesis, Universitat Autònoma de Barcelona, 2012. http://hdl.handle.net/10803/286177.

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El uso de moléculas orgánicas en dispositivos tecnológicos ofrece una serie de ventajas: su tamaño (~nm), su capacidad de auto ensamblan dando lugar a la formación de estructuras funcionales, y la posibilidad de adaptar sus propiedades electrónicas y magnéticas a través de los métodos de síntesis molecular. Sin embargo, la implementación de dispositivos orgánicos depende fundamentalmente de la comprensión entre la interacción de las moléculas y los electrodos de metal, así como las interacciones molécula-molécula. Esta tesis estudia las propiedades estructurales, electrónicas y magnéticas de
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Temirov, Ruslan [Verfasser]. "Studying complex metal-molecule interface with low temperature scanning tunneling microscope : from electronic structure to charge transport / Ruslan Temirov." Bremen : IRC-Library, Information Resource Center der Jacobs University Bremen, 2008. http://d-nb.info/1034984187/34.

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Shin, Heungjoo. "Fabrication of Atomic Force Microscope Probes Integrated with Microelectrodes for Micro Four-Point Porbe and SECM-AFM." Diss., Georgia Institute of Technology, 2006. http://hdl.handle.net/1853/10428.

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This research is dedicated to develop novel batch fabrication procedures for two distinct AFM (Atomic Force Microscope) probes integrated with electrodes enabling electrical sample characterization and electrochemical sample surface profiling respectively. These AFM probes allow for highly accurate control of the probe positioning, low contact force and sample surface imaging with high lateral resolution. As an electrical characterization tool, a nickel micro four-point probe integrated with solid nickel tips was developed. Low electrical resistance of the probe and contact resistance were ac
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Burema, Shiri. "Inelastic Electron Tunneling Spectroscopy with the Scanning Tunneling Microscope : a combined theory-experiment approach." Thesis, Lyon, École normale supérieure, 2013. http://www.theses.fr/2013ENSL0821.

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La Spectroscopie par Effet Tunnel Inélastique (IETS) avec un Microscope à Effet Tunnel (STM) est une nouvelle technique de spectroscopie vibrationnelle, qui permet de caractériser des propriétés très fines de molécules adsorbées sur des surfaces métalliques. Des règles de selection d’excitation vibrationnelle basées sur la symétrie ont été proposées, cependant, elles ne semblent pas exhaustives pour expliquer la totalité du mécanisme et des facteurs en jeu; elles ne sont pas directement transposables pour les propriétés d'un adsorbat et sont lourdes d'utilisation. Le but de cette thèse est don
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Books on the topic "Electronic microscope"

1

Goodhew, Peter J. Electron microscopy and analysis. 2nd ed. Taylor & Francis, 1988.

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Breger, Dee. Through the electronic looking glass: 3-D images from a scanning electron microscope. Cygnus Graphic, 1995.

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Slayter, Elizabeth M. Light and electron microscopy. Cambridge University Press, 1992.

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Sugimoto, Cassidy R., and Blaise Cronin. Scholarly metrics under the microscope: From citation analysis to academic auditing. Published on behalf of the Association for Information Science and Technology by Information Today, Inc., 2015.

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Thomas, Mulvey, and Sheppard C. J. R, eds. Advances in optical and electron microscopy. Academic Press, 1994.

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Reimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2nd ed. Springer, 1998.

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Doane, Frances W. Canadian contributions to microscopy: An historical account of the development of the first electron microscope in North America and the first 20 years of the Microscopical Society of Canada/Société de microscopie du Canada. Microscopical Society of Canada, 1993.

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W, Doane F., Simon G. T, and Watson J. H. L, eds. Canadian contributions to microscopy: An historical account of the development of the first electron microscope in North America and the first 20 years of the Microscopical Society of Canada / Société de Microscopie du Canada. Microscopial Society of Canada, 1993.

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R, Beanland, and Humphreys F. J, eds. Electron microscopy and analysis. 3rd ed. Taylor & Francis, 2001.

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B, Williams David. Transmission electron microscopy: A textbook for materials science. Plenum, 1996.

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Book chapters on the topic "Electronic microscope"

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Liu, Xuepeng, and Dongmei Zhao. "A 3-d Slices Stereo Microscope Based on Electronic Image." In Advances in Mechanical and Electronic Engineering. Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-31528-2_61.

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Hara, M., and K. Kudo. "Characterization of Molecular Films by a Scanning Probe Microscope." In Optical and Electronic Process of Nano-Matters. Springer Netherlands, 2001. http://dx.doi.org/10.1007/978-94-017-2482-1_11.

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Kinoshita, K., T. Matsumura, Y. Inagaki, et al. "The Electronic Zooming TV Readout System for an X-Ray Microscope." In X-Ray Microscopy III. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-540-46887-5_75.

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Pezzotti, Giuseppe, and Andrea Leto. "Quantitative Characterization of Nano-Scale Residual Stresses in Crystalline and Glassy Electronic Devices Performed into the Scanning Electron Microscope." In Advances in Glass and Optical Materials II. John Wiley & Sons, Inc., 2011. http://dx.doi.org/10.1002/9781118144138.ch19.

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Eades, J. A. "Reflection Electron Microscopy and Reflection Electron Diffraction in the Electron Microscope." In Springer Proceedings in Physics. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-76376-2_13.

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Gooch, Jan W. "Electron Microscope." In Encyclopedic Dictionary of Polymers. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_13623.

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Weik, Martin H. "electron microscope." In Computer Science and Communications Dictionary. Springer US, 2000. http://dx.doi.org/10.1007/1-4020-0613-6_6014.

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Weiss, Dieter G., Willi Maile, Robert A. Wick, and Walter Steffen. "Video microscopy." In Light Microscopy in Biology. Oxford University PressOxford, 1999. http://dx.doi.org/10.1093/oso/9780199636709.003.0003.

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Abstract A new quality of microscopy, called video microscopy, emerges, if one observes the specimen, instead of with the human eye, with a video camera connected to video processing equipment working at real time. Video microscopy is, there fore, much more than just adding a camera and monitor to the microscope to share the images with a larger audience. More recently, electronic devices other than video cameras, such as high sensitivity charge coupled device (CCD) cameras and scanning light detector systems for confocal microscopy have been added to microscopes. The three fields (i) video-en
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"References – Electronic Media." In The Ore Minerals Under the Microscope. Elsevier, 2014. http://dx.doi.org/10.1016/b978-0-444-62725-4.50045-4.

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Brugal Gérard. "IMPACT: Integrating Microscopy for Pathology Activities and Computer Technology." In Studies in Health Technology and Informatics. IOS Press, 1995. https://doi.org/10.3233/978-1-60750-868-7-304.

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Integrating microscopy for pathology activities and computer technology was achieved through the development of a new hardware interface between microscope and computer taking advantage of recent video - optics technologies and man - machine communication strategies. The computer monitor is built in the microscope and its image projected onto the optical conventional image. The user-friendly computer &amp;ldquo;mouse&amp;rdquo; and iconic interface thus become accessible in the microscope observation field. Owing to this opto-electronic hardware the microscope is turned into microscope worksta
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Conference papers on the topic "Electronic microscope"

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Hubbard, William A., and B. C. Regan. "Imaging Nanoscale Electronic Changes in a Biased GaN HEMT." In ISTFA 2024. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.istfa2024p0317.

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Abstract The transmission electron microscope (TEM) is the standard high-resolution technique for imaging microelectronics. But TEM primarily generates contrast related to the physical structure and composition of samples, giving little insight into their electronic properties. Samples must also be electron transparent, typically requiring cross-sectioning of components to nanometers-thin foils prior to imaging, which can compromise their electronic integrity. These cross section samples are also notoriously difficult to electrically connect to without surface leakage dominating transport. As
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Chen, Lin, and Raymundo Case. "The Susceptibility of Nanostructured Steel to Sulfide Stress Corrosion Cracking as a Function of H2S Concentration, pH and Heat Treatment." In CORROSION 2021. AMPP, 2021. https://doi.org/10.5006/c2021-16365.

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Abstract The present work evaluates the sulfide corrosion cracking susceptibility of nanostructured bainitic steel with a dual-phase structure of bainite and retained austenite. Notch Tensile Slow Strain Rate Testing (NTSSRT) method was employed to assess the threshold stress intensity values (KISSCC). Microscopic morphology and analysis of fracture surface were carried out by scanning electronic microscope (SEM). Hydrogen sulfide (H2S) concentration with the range from 0.02 mole% to 35 mole% and pH value of 3.5 and 5.5 were controlled in 1% sodium chloride (NaCl) solution using sodium acetate
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Lei, Yao, Lin Tang, Hao He, Biyun Tong, Xiaotong Guo, and Chuan Yang. "Defect Assessment Methodology of Plastic Encapsulated Devices Based on Scanning Acoustic Microscope Inspection." In 2024 25th International Conference on Electronic Packaging Technology (ICEPT). IEEE, 2024. http://dx.doi.org/10.1109/icept63120.2024.10668728.

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Bonifacio, C. S., R. Li, M. L. Ray, P. E. Fischione, and William Hubbard. "Enhanced TEM Specimen Preparation for STEM-EBIC Analysis Using a Ga FIB system Followed by Post-FIB Ar Ion Beam Milling." In ISTFA 2024. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.istfa2024p0191.

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Abstract Electrical characterization is a critical step in the failure analysis workflow, a sequence that often ends in high-resolution imaging in the transmission electron microscope (TEM). Scanning TEM electron beam-induced current (STEM EBIC) is a technique that effectively combines these methods by performing electrical characterization at each imaging pixel, with the electron beam acting as a local current source. This work highlights the specimen preparation technique using the Ga FIB system followed by post-FIB Ar ion milling for STEM EBIC analysis. We present STEM EBIC as a technique t
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Monachon, C., M. S. Zielinski, D. Gachet, et al. "Failure Analysis and Defect Inspection of Electronic Devices by High-Resolution Cathodoluminescence." In ISTFA 2017. ASM International, 2017. http://dx.doi.org/10.31399/asm.cp.istfa2017p0349.

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Abstract Quantitative cathodoluminescence (CL) microscopy is a new optical spectroscopy technique that measures electron beam-induced optical emission over large field of view with a spatial resolution close to that of a scanning electron microscope (SEM). Correlation of surface morphology (SE contrast) with spectrally resolved and highly material composition sensitive CL emission opens a new pathway in non-destructive failure and defect analysis at the nanometer scale. Here we present application of a modern CL microscope in defect and homogeneity metrology, as well as failure analysis in sem
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Dickensheets, David L., and Gordon S. Kino. "Micromachined confocal optical microscope." In Electronic Imaging: Science & Technology, edited by Carol J. Cogswell, Gordon S. Kino, and Tony Wilson. SPIE, 1996. http://dx.doi.org/10.1117/12.237462.

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Mammone, Richard J., and Xiaoyu Zhang. "High-numerical-aperture reflecting microscope." In Electronic Imaging: Science & Technology, edited by Carol J. Cogswell, Gordon S. Kino, and Tony Wilson. SPIE, 1996. http://dx.doi.org/10.1117/12.237472.

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Haddad, Waleed S., David Cullen, Johndale C. Solem, et al. "Fourier-transform holographic microscope." In Electronic Imaging '91, San Jose,CA, edited by Winchyi Chang and James R. Milch. SPIE, 1991. http://dx.doi.org/10.1117/12.45347.

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Davidson, Mark. "Trends in optical metrology in the nineties." In OSA Annual Meeting. Optica Publishing Group, 1991. http://dx.doi.org/10.1364/oam.1991.fy1.

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A number of new types of optical or optical/electronic instrument are being utilized in an attempt to meet the metrology requirements for semiconductor manufacturing. These technologies include: Linnik interference microscopes in the coherence probe mode of operation; white light confocal microscopes; laser scanning confocal microscopes; Mireau interference microscopes in the correlation mode of operation; sophisticated direct and inverse scattering simulations of microscope images complementing and enhancing optical instruments; deep ultraviolet classical and confocal microscopes; darkfield l
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Jaggi, Bruno, Steven S. S. Poon, Brian D. Pontifex, John J. Fengler, Jacques Marquis, and Branko Palcic. "Quantitative microscope for image cytometry." In Electronic Imaging '91, San Jose,CA, edited by Winchyi Chang and James R. Milch. SPIE, 1991. http://dx.doi.org/10.1117/12.45348.

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Reports on the topic "Electronic microscope"

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De Lozanne, Alejandro. Nanofabrication of Electronic Devices With the Scanning Tunneling Microscope. Defense Technical Information Center, 1994. http://dx.doi.org/10.21236/ada292463.

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Wolf, E. L. Control of the Residual Sub-Electronic Charge on a Mesoscopic Conductor by Means of a Scanning Tunneling Microscope Tip. Defense Technical Information Center, 1994. http://dx.doi.org/10.21236/ada277290.

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Crewe, A. V., and O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), 1991. http://dx.doi.org/10.2172/6000131.

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Crewe, A. V., and O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), 1992. http://dx.doi.org/10.2172/7015892.

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Kenik, E. (Intermediate voltage electron microscope). Office of Scientific and Technical Information (OSTI), 1989. http://dx.doi.org/10.2172/5356814.

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รุจิรวนิช, รัตนา. การศึกษาผลการเติมพอลิไวนิลแอลกอฮอล์ พอลิแลคติก แอซิดและพอลิคาโพรแลคโทนที่มีต่อการปรับปรุงสมบัติทางกลและความสามารถในการต้านทานความชื้นของคอมพอสิตโฟมที่มีแป้งมันสำปะหลังเป็นส่วนประกอบหลัก : รายงานผลการวิจัย. จุฬาลงกรณ์มหาวิทยาลัย, 2004. https://doi.org/10.58837/chula.res.2004.95.

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งานวิจัยนี้เป็นการเตรียมคอมพอสิตโฟมโดยวิธีการอบจากแป้งมันสำปะหลังและพอลิเมอร์สังเคราะห์ที่ย่อยสลายได้แก่ พอลิไวนิลแอลกอฮอล์ พอลิแลคติก แอซิด และพอลิคาโพรแลคโทน จากการศึกษาโดยใช้กล้องสแกนนิ่งอิเล็กตรอนไมโครสโคป (Scanning electron microscope) พบว่าขอบบนและล่างของโฟมจะมีความหนาแน่นสูงในขณะที่ส่วนกลางของโฟมจะมีความหนาแน่นต่ำ ในงานวิจัยนี้ได้ศึกษาผลกระทบของความชื้นสัมพัทธ์เวลาในการเก็บโฟม การเติมพอลิเมอร์สังเคราะห์ที่ย่อยสลายได้และการเติมพลาสติไซเซอร์ที่มีผลต่อสมบัติเชิงกล ผลการศึกษาสมบัติเชิงกลพบว่า ค่าการทนต่อแรงดึงและค่าการทนต่อแรงโค้งงอจะให้ค่าสูงที่สุดที่สภาวะความชื้นสัมพัทธ์ 42 เปอร์เซ็นต์นาน
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7

Ren, Z. F. Purchase of Transmission Electron Microscope. Defense Technical Information Center, 2001. http://dx.doi.org/10.21236/ada392051.

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8

Bentley, J. (Future of electron microscopy). Office of Scientific and Technical Information (OSTI), 1989. http://dx.doi.org/10.2172/5651701.

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Hadjipansyis, George C. DURIP 00 Scanning Electron Microscope (SEM). Defense Technical Information Center, 2001. http://dx.doi.org/10.21236/ada388472.

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Weber, Peter M. Time-Resolved Scanning Electron Microscopy. Defense Technical Information Center, 2006. http://dx.doi.org/10.21236/ada455461.

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