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Journal articles on the topic 'Electronic Microscope and microscopy'

Author: Grafiati

Published: 26 July 2024

Last updated: 31 July 2025

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1

Chen, Xiaodong, Bin Zheng, and Hong Liu. "Optical and Digital Microscopic Imaging Techniques and Applications in Pathology." Analytical Cellular Pathology 34, no. 1-2 (2011): 5–18. http://dx.doi.org/10.1155/2011/150563.

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The conventional optical microscope has been the primary tool in assisting pathological examinations. The modern digital pathology combines the power of microscopy, electronic detection, and computerized analysis. It enables cellular-, molecular-, and genetic-imaging at high efficiency and accuracy to facilitate clinical screening and diagnosis. This paper first reviews the fundamental concepts of microscopic imaging and introduces the technical features and associated clinical applications of optical microscopes, electron microscopes, scanning tunnel microscopes, and fluorescence microscopes.

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Daberkow, I., and M. Schierjott. "Possibilities And Examples For Remote Microscopy Including Digital Image Acquisition, Transfer, and Archiving." Microscopy and Microanalysis 4, S2 (1998): 2–3. http://dx.doi.org/10.1017/s1431927600020134.

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Recent developments promise the possibility to externally control every aspect of microscopes through a computer interface. In combination with high-resolution cameras and feedback to the microscope, this can be leveraged to create highly automatic routines, e.g., to remotely correct astigmatism. Together with the development of fast computer networks this creates a new branch of microscopy, the so-called “telemicroscopy”. The goal of telemicroscopy is the control of a microscope over a large distance including the transfer of images with an acceptable repetition rate. A big advantage for elec

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Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing i

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Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.

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The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic poten

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Kondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi, and Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.

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Recent development of ultra-high vacuum electron microscopy (UHV-EM) is very rapid. This is due to the fact that it can be applied to variety of surface science fields.There are various types of surface imaging in UHV condition; low energy electron microscopy (LEEM) [1], transmission (TEM) and reflection electron microscopy (REM) [2] using conventional transmission electron microscopes (CTEM) (including scanning TEM and REM)), scanning electron microscopy, photoemission electron microscopy (PEEM) [3] and scanning tunneling microscopy (STM including related techniques such as scanning tunneling

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Vilà, Anna, Sergio Moreno, Joan Canals, and Angel Diéguez. "A Compact Raster Lensless Microscope Based on a Microdisplay." Sensors 21, no. 17 (2021): 5941. http://dx.doi.org/10.3390/s21175941.

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Lensless microscopy requires the simplest possible configuration, as it uses only a light source, the sample and an image sensor. The smallest practical microscope is demonstrated here. In contrast to standard lensless microscopy, the object is located near the lighting source. Raster optical microscopy is applied by using a single-pixel detector and a microdisplay. Maximum resolution relies on reduced LED size and the position of the sample respect the microdisplay. Contrarily to other sort of digital lensless holographic microscopes, light backpropagation is not required to reconstruct the i

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Katoh, Kazuo. "Software-Based Three-Dimensional Deconvolution Microscopy of Cytoskeletal Proteins in Cultured Fibroblast Using Open-Source Software and Open Hardware." Journal of Imaging 5, no. 12 (2019): 88. http://dx.doi.org/10.3390/jimaging5120088.

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As conventional fluorescence microscopy and confocal laser scanning microscopy generally produce images with blurring at the upper and lower planes along the z-axis due to non-focal plane image information, the observation of biological images requires “deconvolution.” Therefore, a microscope system’s individual blur function (point spread function) is determined theoretically or by actual measurement of microbeads and processed mathematically to reduce noise and eliminate blurring as much as possible. Here the author describes the use of open-source software and open hardware design to build

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Dantas de Oliveira, Allisson, Carles Rubio Maturana, Francesc Zarzuela Serrat, et al. "Development of a low-cost robotized 3D-prototype for automated optical microscopy diagnosis: An open-source system." PLOS ONE 19, no. 6 (2024): e0304085. http://dx.doi.org/10.1371/journal.pone.0304085.

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In a clinical context, conventional optical microscopy is commonly used for the visualization of biological samples for diagnosis. However, the availability of molecular techniques and rapid diagnostic tests are reducing the use of conventional microscopy, and consequently the number of experienced professionals starts to decrease. Moreover, the continuous visualization during long periods of time through an optical microscope could affect the final diagnosis results due to induced human errors and fatigue. Therefore, microscopy automation is a challenge to be achieved and address this problem

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Schwarzer, Robert. "Orientation Microscopy Using the Analytical Scanning Electron Microscope." Practical Metallography 51, no. 3 (2014): 160–79. http://dx.doi.org/10.3139/147.110280.

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Doroshenko, Olga V., Mikhail V. Golub, Oksana Yu Kremneva, et al. "Automated Assessment of Wheat Leaf Disease Spore Concentration Using a Smart Microscopy Scanning System." Agronomy 14, no. 9 (2024): 1945. http://dx.doi.org/10.3390/agronomy14091945.

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An advanced approach to the automated assessment of a microscopic slide containing spores is presented. The objective is to develop an intelligent system for the rapid and precise estimation of phytopathogenic spore concentration on microscopic slides, thereby enabling automated processing. The smart microscopy scanning system comprises an electronic microscope, a coordinate table, and software for the control of the coordinate table and image processing. The developed smart microscopy scanning system processes the entire microscope slide with multiple exposed strips, which are automatically d

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Bornhorst, Julia, Eike Nustede, and Sebastian Fudickar. "Mass Surveilance of C. elegans—Smartphone-Based DIY Microscope and Machine-Learning-Based Approach for Worm Detection." Sensors 19, no. 6 (2019): 1468. http://dx.doi.org/10.3390/s19061468.

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The nematode Caenorhabditis elegans (C. elegans) is often used as an alternative animal model due to several advantages such as morphological changes that can be seen directly under a microscope. Limitations of the model include the usage of expensive and cumbersome microscopes, and restrictions of the comprehensive use of C. elegans for toxicological trials. With the general applicability of the detection of C. elegans from microscope images via machine learning, as well as of smartphone-based microscopes, this article investigates the suitability of smartphone-based microscopy to detect C. e

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Faruqi, A. R., and Sriram Subramaniam. "CCD detectors in high-resolution biological electron microscopy." Quarterly Reviews of Biophysics 33, no. 1 (2000): 1–27. http://dx.doi.org/10.1017/s0033583500003577.

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1. Introduction 11.1 The ‘band gap’ in silicon 22. Principles of CCD detector operation 32.1 Direct detection 32.2 Electron energy conversion into light 42.3 Optical coupling: lens or fibre optics? 62.4 Readout speed and comparison with film 83. Practical considerations for electron microscopic applications 93.1 Sources of noise 93.1.1 Dark current noise 93.1.2 Readout noise 93.1.3 Spurious events due to X-rays or cosmic rays 103.2 Efficiency of detection 113.3 Spatial resolution and modulation transfer function 123.4 Interface to electron microscope 143.5 Electron diffraction applications 154

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Paci, G., E. Haas, L. Kornau, et al. "Microscope in Action: An Interdisciplinary Fluorescence Microscopy Hands-on Resource for Schools." Biophysicist 2, no. 3 (2021): 55–73. http://dx.doi.org/10.35459/tbp.2020.000171.

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ABSTRACT Fluorescence microscopy is a ubiquitous technique in the life sciences that uses fluorescent molecules to visualize specific components of biological specimens. This powerful tool has revolutionized biology, and it represents a perfect example of the advancements enabled by biophysical research and technology development. However, despite its central role in contemporary research, fluorescence is hardly covered in typical secondary school curricula, with few hands-on “entry-level” materials available for secondary school teachers to introduce this important method to their students. F

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Inoué, Shinya. "Digitally Enhanced, Polarization-Based Microscopy: Reality and Dreams." Microscopy and Microanalysis 7, S2 (2001): 2–3. http://dx.doi.org/10.1017/s1431927600026088.

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Polarized light microscopy is used to identify and image optically anisotropic regions of the specimen; to determine their optical character; and to explore the arrangement of the molecules, fine structure, or atomic lattices that are responsible for the anisotropy. These studies can be carried out non-destructively in real time, and reveal events or structures that lie far below the resolution limit of the light microscope, or indeed at times even the electron microscope.In biology, to study the dynamically changing, minute and weakly anisotropic domains within living cells, the polarizing mi

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Abe, Eiji. "Electron Microscopy for Atomic/Electronic Structure of Quasicrystals." Acta Crystallographica Section A Foundations and Advances 70, a1 (2014): C1193. http://dx.doi.org/10.1107/s2053273314088068.

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As stated with special emphasis in the Noble Lecture by Dr. Shechtman, the quasicrystal discovery is definitely the victory of electron microscopy – the first icosahedral stereogram was constructed by a series of electron diffraction patterns from a tiny quasicrystalline grain, and the following high-resolution electron microscope images indeed confirmed a unique aperiodic order that can never be consistent with twinning of normal crystals. Almost thirty years after these early electron microscopy studies, we are now in the era of aberration-corrected electron microscopy which realizes a remar

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Itoh, J., R. Y. Osamura, and K. Watanabe. "Subcellular visualization of light microscopic specimens by laser scanning microscopy and computer analysis: a new application of image analysis." Journal of Histochemistry & Cytochemistry 40, no. 7 (1992): 955–67. http://dx.doi.org/10.1177/40.7.1607644.

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To identify subcellular organelles or to observe their pathological changes in sections prepared for light microscopy, immuno- and/or enzyme histochemical staining for the marker substances or enzymes of those subcellular organelles are frequently employed. With conventional light microscopes (CLM), however, it is hardly possible to determine whether or not the target organelles are properly stained and to confirm their fine structure. In the present study, the laser scanning microscope (LSM) was employed to obtain highly contrasted images of histochemically stained subcellular organelles at t

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Erickson, A., D. Adderton, T. Day, and R. Alvis. "Imaging free Carriers in Electronic Material using a Scanning Probe Microscope: Scanning Capacitance Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 956–57. http://dx.doi.org/10.1017/s042482010016724x.

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The development of methods to measure electrical properties, which are suitable to directly yield the desired carrier distributions on a nanometer scale has greatly benefited from the development of scanning probe technology over the last decade. Scanning Probe Microscopes (SPMs) offer inherent two-dimensionality and have been shown to have applications ranging from Magnet force to electro-chemistry. We have used an SPM in contact mode to simultaneously measure topography (and therefore physical structure) and capacitance variations (due to an applied bias) of various electronic materials such

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Hansen, Douglas. "The Scanning Electron Microscope As A Precision Instrument." Microscopy Today 4, no. 6 (1996): 30–34. http://dx.doi.org/10.1017/s1551929500060909.

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I began using scanning electron microscopes to solve problems encountered in the fabrication of x-ray diffraction gratings. Since these diffraction gratings consist of very regular lines and spaces, and produce high contrast images from the SEM. my microscopy work often points out problems with the microscope.One time, for example, I went to the university SEM lab I often use, and was advised that the microscope was down that day due to major field problems. This lab often had problems with stray fields for reasons no one could explain. Usually I was the only one to complain about stray field

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Suzuki, T., M. Kudo, Y. Sakai, and T. Ichinokawa. "Material Contrast of Scanning Electron and Ion Microscope Images of Metals." Microscopy Today 16, no. 1 (2008): 6–11. http://dx.doi.org/10.1017/s1551929500054250.

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The rapid technical development of FIM (Focused Ion Beam) technology has spawned an increase in spatial resolution capability in scanning ion microscopy (SIM) technology. Furthermore, FIM has been used for preparation of thin specimens in transmission electron microscopy and micro-fabrication of electronic devices in the semiconductor industry. Recently, a scanning ion microscope with a helium field ion source has been developed. Thus, the contrast formation of emission electron images in scanning ion microscopy has been the object of study for analyzing images of materials specimens, similar

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Jones, Arthur V. "Novel Approaches to Low-Voltage Scanning Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 366–67. http://dx.doi.org/10.1017/s0424820100180586.

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In comparison with the developers of other forms of instrumentation, scanning electron microscope manufacturers are among the most conservative of people. New concepts usually must wait many years before being exploited commercially. The field emission gun, developed by Albert Crewe and his coworkers in 1968 is only now becoming widely available in commercial instruments, while the innovative lens designs of Mulvey are still waiting to be commercially exploited. The associated electronics is still in general based on operating procedures which have changed little since the original microscopes

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Canals, Joan, Nil Franch, Victor Moro, et al. "A Novel Approach for a Chip-Sized Scanning Optical Microscope." Micromachines 12, no. 5 (2021): 527. http://dx.doi.org/10.3390/mi12050527.

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The recent advances in chip-size microscopy based on optical scanning with spatially resolved nano-illumination light sources are presented. This new straightforward technique takes advantage of the currently achieved miniaturization of LEDs in fully addressable arrays. These nano-LEDs are used to scan the sample with a resolution comparable to the LED sizes, giving rise to chip-sized scanning optical microscopes without mechanical parts or optical accessories. The operation principle and the potential of this new kind of microscope are analyzed through three different implementations of decre

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Moreno, Sergio, Joan Canals, Victor Moro, et al. "Pursuing the Diffraction Limit with Nano-LED Scanning Transmission Optical Microscopy." Sensors 21, no. 10 (2021): 3305. http://dx.doi.org/10.3390/s21103305.

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Recent research into miniaturized illumination sources has prompted the development of alternative microscopy techniques. Although they are still being explored, emerging nano-light-emitting-diode (nano-LED) technologies show promise in approaching the optical resolution limit in a more feasible manner. This work presents the exploration of their capabilities with two different prototypes. In the first version, a resolution of less than 1 µm was shown thanks to a prototype based on an optically downscaled LED using an LED scanning transmission optical microscopy (STOM) technique. This research

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Novikov, Yu A. "Modern Scanning Electron Microscopy. 1. Secondary Electron Emission." Поверхность. Рентгеновские, синхротронные и нейтронные исследования, no. 5 (May 1, 2023): 80–94. http://dx.doi.org/10.31857/s102809602305014x.

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The development of modern technologies, including nanotechnology, is based on application of diagnostic methods of objects used in technologies processes. For this purpose most perspective are methods realized in a scanning electron microscope. Thus one of basic methods is the measurement of linear sizes of relief structures of micrometer and nanometer ranges used in micro- and nanoelectronic. In a basis of a scanning electron microscope job the secondary electronic issue of firm body lays. However, practically all researches were spent on surfaces, which relief was neglected. The review of th

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WOOLARD, DWIGHT, PEIJI ZHAO, CHRISTOPHER RUTHERGLEN, et al. "NANOSCALE IMAGING TECHNOLOGY FOR THz-FREQUENCY TRANSMISSION MICROSCOPY." International Journal of High Speed Electronics and Systems 18, no. 01 (2008): 205–22. http://dx.doi.org/10.1142/s012915640800528x.

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A novel nanoscale-engineering methodology is presented that has potential for the first-time development of a microscope-system capable of collecting terahertz (THz) frequency spectroscopic signatures from microscopic biological (bio) structures. This unique THz transmission microscopy approach is motivated by prior studies on bio-materials and bio-agents (e.g., DNA, RNA and bacterial spores) that have produced spectral features within the THz frequency regime (i.e., ~ 300 GHz to 1000 GHz) that appear to be representative of the internal structure and characteristics of the constituent bio-mol

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Gómez-Rodríguez, J. M., and Baró A.M. "The use of Scanning Tunneling Microscopy in combination with Scanning Electron Microscopy in the fabrication and imaging of microstructures." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (1990): 752–53. http://dx.doi.org/10.1017/s0424820100176897.

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In the last few years, Scanning Tunneling Microscopy (STM), has proven to be a powerful and versatile technique to investigate the topographic and electronic structure of metals and semiconductors with an unprecedent vertical (0.01 nm) and lateral (0.2 nm) resolution. In this paper we are interested in the use of STM to study surfaces having microfabricated structures in the nanometer range, particularly those produced by the STM tip itself.In order to study these samples we have used an STM integrated into a commercial Scanning Electron Microscope (SEM). This allows to address two problems wh

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Fan, G. Y., and M. H. Ellisman. "Current State of the Art of Digital Imaging in TEM." Microscopy and Microanalysis 3, S2 (1997): 1087–88. http://dx.doi.org/10.1017/s1431927600012320.

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The increasingly wide use of digital computers, the world-wide-web and electronic publishing has had a fundamental impact on the way scientists conduct research in every discipline of science. Electron microscopy is no exception. A considerable amount of effort has been devoted to the development of digital imaging acquisition systems for transmission electron microscopy (TEM). Digital image acquisition systems for TEM, including complete systems, have been produced by several companies, including: Advanced Microscopy Techniques (Rowley, MA), JEOL (Peabody, MA), Gatan (Warrendale, PA), Princet

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Laurion, Tristan A., and Richard L. Dolson. "Rotating specimen stage for angle-indexed videotape microscopy of automotive water-pump seals and ring-shaped specimens." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 458–59. http://dx.doi.org/10.1017/s0424820100170025.

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Videocameras and electronic image storage devices have given new vigor and potential to optical microscopy and parts inspection, as well as a powerful means of recording microscopic motion in live-time biological studies. Video and electronic techniques permit fast exploratory examinations simultaneous with extensive archiving, and allow the option of deferring hard copy printing to the time when reports may be needed. These capabilities aid in improving the quality of scanning electron microscopy (SEM) and other analyses that may follow and have great value in communicating with the customer.

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Lee, Dongwoo, Jihye Kim, Eunjoo Song, et al. "Micromirror-Embedded Coverslip Assembly for Bidirectional Microscopic Imaging." Micromachines 11, no. 6 (2020): 582. http://dx.doi.org/10.3390/mi11060582.

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3D imaging of a biological sample provides information about cellular and subcellular structures that are important in cell biology and related diseases. However, most 3D imaging systems, such as confocal and tomographic microscopy systems, are complex and expensive. Here, we developed a quasi-3D imaging tool that is compatible with most conventional microscopes by integrating micromirrors and microchannel structures on coverslips to provide bidirectional imaging. Microfabricated micromirrors had a precisely 45° reflection angle and optically clean reflective surfaces with high reflectance ove

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Llavador, Anabel, Gabriele Scrofani, Genaro Saavedra, and Manuel Martinez-Corral. "Large Depth-of-Field Integral Microscopy by Use of a Liquid Lens." Sensors 18, no. 10 (2018): 3383. http://dx.doi.org/10.3390/s18103383.

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Integral microscopy is a 3D imaging technique that permits the recording of spatial and angular information of microscopic samples. From this information it is possible to calculate a collection of orthographic views with full parallax and to refocus computationally, at will, through the 3D specimen. An important drawback of integral microscopy, especially when dealing with thick samples, is the limited depth of field (DOF) of the perspective views. This imposes a significant limitation on the depth range of computationally refocused images. To overcome this problem, we propose here a new meth

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Mundschau, M., E. Bauer, and W. ᔒwięch. "Methods and Applications of UV Photoelectron Microscopy in Surface Science." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 564–65. http://dx.doi.org/10.1017/s0424820100181579.

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Photoelectron microscopy is sensitive to single atomic or molecular layers on surfaces at submonolayer coverages. A significant advance for fundamental studies in surface science has been the construction of ultra-high vacuum versions of classical photoelectron microscopes and the combination with other techniques of surface analysis - most notably low-energy electron diffraction and microscopy. This is essential for the proper interpretation of the micrographs. The technique is well suited for in situ studies of large flat samples such as silicon wafers, single crystals and polished metallurg

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Incardona, Nicolò, Ángel Tolosa, Gabriele Scrofani, Manuel Martinez-Corral, and Genaro Saavedra. "The Lightfield Microscope Eyepiece." Sensors 21, no. 19 (2021): 6619. http://dx.doi.org/10.3390/s21196619.

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Lightfield microscopy has raised growing interest in the last few years. Its ability to get three-dimensional information about the sample in a single shot makes it suitable for many applications in which time resolution is fundamental. In this paper we present a novel device, which is capable of converting any conventional microscope into a lightfield microscope. Based on the Fourier integral microscope concept, we designed the lightfield microscope eyepiece. This is coupled to the eyepiece port, to let the user exploit all the host microscope’s components (objective turret, illumination syst

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Song, Huixu, Qingwei Li, and Zhaoyao Shi. "Maximum Acceptable Tilt Angle for Point Autofocus Microscopy." Sensors 23, no. 24 (2023): 9655. http://dx.doi.org/10.3390/s23249655.

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The complete and accurate acquisition of geometric information forms the bedrock of maintaining high-end instrument performance and monitoring product quality. It is also a prerequisite for achieving the ‘precision’ and ‘intelligence’ that the manufacturing industry aspires to achieve. Industrial microscopes, known for their high accuracy and resolution, have become invaluable tools in the precision measurement of small components. However, these industrial microscopes often struggle to demonstrate their advantages when dealing with complex shapes or large tilt angles. This paper introduces a

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Gysin, Urs, Thilo Glatzel, Thomas Schmölzer, et al. "Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices." Beilstein Journal of Nanotechnology 6 (December 28, 2015): 2485–97. http://dx.doi.org/10.3762/bjnano.6.258.

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Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices. However, the characterization of conducting or semiconducting power devices with EFM methods requires an accurate and reliable technique from the nanometre up to the micrometre scale. For high force sensitivity it is indispensable to operate the microscope under high to ultra-high vacuum (UHV) conditions to suppress viscous damping of the sensor. Furthermore, UHV environmen

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Diep, Tai The, Sarah Helen Needs, Samuel Bizley, and Alexander D. Edwards. "Rapid Bacterial Motility Monitoring Using Inexpensive 3D-Printed OpenFlexure Microscopy Allows Microfluidic Antibiotic Susceptibility Testing." Micromachines 13, no. 11 (2022): 1974. http://dx.doi.org/10.3390/mi13111974.

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Antibiotic susceptibility testing is vital to tackle the emergence and spread of antimicrobial resistance. Inexpensive digital CMOS cameras can be converted into portable digital microscopes using 3D printed x-y-z stages. Microscopic examination of bacterial motility can rapidly detect the response of microbes to antibiotics to determine susceptibility. Here, we present a new simple microdevice-miniature microscope cell measurement system for multiplexed antibiotic susceptibility testing. The microdevice is made using melt-extruded plastic film strips containing ten parallel 0.2 mm diameter mi

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MORALES-SAAVEDRA, OMAR G., JÁKLI ANTAL, HEPPKE GERD, and EICHLER HANS J. "POLAR ORDERING IN THERMOTROPIC MESOGENS RESOLVED BY SCANNING NLO MICROSCOPY." Journal of Nonlinear Optical Physics & Materials 15, no. 04 (2006): 431–46. http://dx.doi.org/10.1142/s0218863506003396.

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A nonlinear optical (NLO) microscope has been developed based on recording the second harmonic generation (SHG) signals of the B 2- and B 4-phases of bent-shaped liquid crystalline (LC) materials. We observed that the microstructures of the polar order can be accurately characterized by 2D scanned images implementing this device. Specifically, we have investigated two bent-core compounds, which have either B 4 or B 2 phases at room temperature and exhibit SHG activity. The NLO microscope was calibrated according to the Maker fringe method allowing the in situ evaluation of the relative SHG eff

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Marshall, J. E. A. "A simple cost-effective infra-red microscope for palynology." Journal of Micropalaeontology 14, no. 2 (1995): 106. http://dx.doi.org/10.1144/jm.14.2.106.

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Abstract. It has long been known that objects which are opaque in transmitted white light can become translucent in infra-red (IR) light. Its application to palynology was shown by Leclercq (1933) who used an IR filter to cut out the visible light from the specimen coupled with an IR-sensitive film to capture the image. Although the significance of this development was recognized (Walton, 1935), it was never generally used since oxidative methods such as Schulze’s solution are normally successful in clearing exines. The exceptions are opaque palynomorphs from thermally over-mature rocks. Such

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Oyibo, Prosper, Satyajith Jujjavarapu, Brice Meulah, et al. "Schistoscope: An Automated Microscope with Artificial Intelligence for Detection of Schistosoma haematobium Eggs in Resource-Limited Settings." Micromachines 13, no. 5 (2022): 643. http://dx.doi.org/10.3390/mi13050643.

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For many parasitic diseases, the microscopic examination of clinical samples such as urine and stool still serves as the diagnostic reference standard, primarily because microscopes are accessible and cost-effective. However, conventional microscopy is laborious, requires highly skilled personnel, and is highly subjective. Requirements for skilled operators, coupled with the cost and maintenance needs of the microscopes, which is hardly done in endemic countries, presents grossly limited access to the diagnosis of parasitic diseases in resource-limited settings. The urgent requirement for the

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Szcześniak, L., B. Hilczer, and K. P. Meyer. "Ferroelectric domain wall studied by scanning electron microscopy and electron microscope decoration technique." Ferroelectrics 172, no. 1 (1995): 227–34. http://dx.doi.org/10.1080/00150199508018480.

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van Benthem, Klaus, Christina Scheu, Wilfried Sigle, Christian Elsässer, and Manfred Rühle. "Electronic Structure Investigations of Metal / SrtiO3 Interfaces Using EELS." Microscopy and Microanalysis 7, S2 (2001): 304–5. http://dx.doi.org/10.1017/s1431927600027598.

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Ni, Pd and Cr thin films were grown on (100)SrTiO3 surfaces by molecular beam epitaxy at substrate temperatures of TNJ, pd=650°C and Tcr =150°C. Electron energy-loss spectroscopy (EELS) and high resolution transmission electron microscopy (HRTEM) were applied to investigate the local electronic structure and the atomic structure of the interfaces, respectively. Analytical microscopy was carried out with a parallel energy-loss spectrometer (PEELS766) attached to a dedicated scanning transmission electron microscope (STEM) operated at 100keV, which has a point resolution of 0.22 nm. HRTEM studie

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Fu, Wen Wu. "Application of Virtual Network Electron Microscopy in Materials Science." Advanced Materials Research 898 (February 2014): 779–82. http://dx.doi.org/10.4028/www.scientific.net/amr.898.779.

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This paper first introduces the combination of virtual network and electronic scanner microscope, and uses nonlinear Burgers method to establish virtual network partial differential equations and the algorithm of scanning electron microscopy, and uses MATLAB software to draw the image of algorithm. It verifies the reliability of program. Finally, by using virtual network technology of scanning electron microscopy we obtained the contrast curve diagram of polypyrrole and sulfonated graphene, the image is displayed by three dimension of the virtual network. This method is extended to the teachin

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Ippolito, Stephen, Sean Zumwalt, and Andy Erickson. "Emerging Techniques in Atomic Force Microscopy: Diamond Milling and Electrostatic Force Microscopy." EDFA Technical Articles 17, no. 3 (2015): 4–10. http://dx.doi.org/10.31399/asm.edfa.2015-3.p004.

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Abstract Atomic force microscopy has been a consistent factor in the advancements of the past decade in IC nanoprobing and failure analysis. Over that time, many new atomic force measurement techniques have been adopted by the IC analysis community, including scanning conductance, scanning capacitance, pulsed current-voltage, and capacitance-voltage spectroscopy. More recently, two new techniques have emerged: diamond probe milling and electrostatic force microscopy (EFM). As the authors of the article explain, diamond probe milling using an atomic force microscope is a promising new method fo

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Holm, Jason. "A Brief Overview of Scanning Transmission Electron Microscopy in a Scanning Electron Microscope." EDFA Technical Articles 23, no. 4 (2021): 18–26. http://dx.doi.org/10.31399/asm.edfa.2021-4.p018.

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Abstract This article provides a brief overview of STEM-in-SEM, discussing the pros and cons, recent advancements in detector technology, and the emergence of 4D STEM-in-SEM, a relatively new method that uses diffraction patterns recorded at different raster positions to enhance images offline in selected regions of interest.

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Ali, Ashfaq, Naveed Ullah, Asim Ahmad Riaz, et al. "Development and Comparative Analysis of Electrochemically Etched Tungsten Tips for Quartz Tuning Fork Sensor." Micromachines 12, no. 3 (2021): 286. http://dx.doi.org/10.3390/mi12030286.

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Quartz Tuning Fork (QTF) based sensors are used for Scanning Probe Microscopes (SPM), in particular for near-field scanning optical microscopy. Highly sharp Tungsten (W) tips with larger cone angles and less tip diameter are critical for SPM instead of platinum and iridium (Pt/Ir) tips due to their high-quality factor, conductivity, mechanical stability, durability and production at low cost. Tungsten is chosen for its ease of electrochemical etching, yielding high-aspect ratio, sharp tips with tens of nanometer end diameters, while using simple etching circuits and basic electrolyte chemistry

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Stemmer, A., A. Engel, R. Häring, R. Reichelt, and U. Aebi. "Scanning tunneling microscopy of biomacromolecules." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 444–45. http://dx.doi.org/10.1017/s0424820100104285.

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Since its invention in the early 1980s the scanning tunneling microscope (STM) has rapidly evolved into a well established tool in solid state physics for surface structure analysis at atomic resolution. Recently a growing interest in the STM for investigating biological matter has been expressed, since surface ‘topographs’ of biomacromolecules can be recorded at ambient pressure or possibly in buffer solutions, thereby eliminating structural alterations induced by specimen dehydration such as required for electron microscopy (EM).As simple as a STM may look, it provides a wealth of informatio

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Piston, David W., Brian D. Bennett, and Robert G. Summers. "Two-photon excitation microscopy in cellular biophysics." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 62–63. http://dx.doi.org/10.1017/s0424820100136684.

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Two-photon excitation microscopy (TPEM) provides attractive advantages over confocal microscopy for three-dimensionally resolved fluorescence imaging and photochemistry. Two-photon excitation arises from the simultaneous absorption of two photons in a single quantitized event whose probability is proportional to the square of the instantaneous intensity. For example, two red photons can cause the transition to an excited electronic state normally reached by absorption in the ultraviolet. In practice, two-photon excitation is made possible by the very high local instantaneous intensity provided

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Wilson, R. J., D. D. Chambliss, S. Chiang, and V. M. Hallmark. "Resolution in the scanning tunneling microscope." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 488–89. http://dx.doi.org/10.1017/s042482010008674x.

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Scanning tunneling microscopy (STM) has been used for many atomic scale observations of metal and semiconductor surfaces. The fundamental principle of the microscope involves the tunneling of evanescent electrons through a 10Å gap between a sharp tip and a reasonably conductive sample at energies in the eV range. Lateral and vertical resolution are used to define the minimum detectable width and height of observed features. Theoretical analyses first discussed lateral resolution in idealized cases, and recent work includes more general considerations. In all cases it is concluded that lateral

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LE, THUC T., and JI-XIN CHENG. "NON-LINEAR OPTICAL IMAGING OF OBESITY-RELATED HEALTH RISKS: REVIEW." Journal of Innovative Optical Health Sciences 02, no. 01 (2009): 9–25. http://dx.doi.org/10.1142/s1793545809000371.

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This review highlights the recent applications of non-linear optical (NLO) microscopy to study obesity-related health risks. A strong emphasis is given to the applications of coherent anti-Stokes Raman scattering (CARS) microscopy where multiple non-linear optical imaging modalities including CARS, sum-frequency generation (SFG), and two-photon fluorescence are employed simultaneously on a single microscope platform. Specific examples on applications of NLO microscopy to study lipid-droplet biology, obesity-cancer relationship, atherosclerosis, and lipid-rich biological structures are discusse

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Yang, Meng Tao, Feng Li, Yu Chao Wang, and Q. Y. Liu. "Synthesis of Selenium Nanoparticles in the Presence of Oyster Polysaccharides and the Antioxidant Activity." Applied Mechanics and Materials 522-524 (February 2014): 1143–46. http://dx.doi.org/10.4028/www.scientific.net/amm.522-524.1143.

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A simple method for synthesis of nanoselenium using oyster polysaccharides as soft template was investigated. The uniform stable selenium polysaccharides were obtained under the condition of reaction temperature 40°C, reaction time 3 h-5 h, the content of oyster polysaccharides 400mg/L and the content of sodium selenite 1mM. The size distribution and morphology of the product were confirmed by scanning electronic microscopy (SEM) and tansmission electronic microscope (TEM). The antioxidant activity of nanoselenium polysaccharides were studied in vitro. The results showed that nanoselenium poly

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Smith, K. C. A. "Sir Charles William Oatley, O. B. E. 14 February 1904–11 March 1996." Biographical Memoirs of Fellows of the Royal Society 44 (January 1998): 331–47. http://dx.doi.org/10.1098/rsbm.1998.0022.

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Charles Oatley made three outstanding contributions to the engineering sciences: he was one of the brilliant team that developed radar in Britain during the Second World War; he revolutionized the teaching of electronics at Cambridge University; and he developed the scanning electron microscope. It is for the last of these that he will be chiefly remembered. He stands with Manfred von Ardenne as one of the two great pioneers of scanning electron microscopy His involvement with the instrument began shortly after the war when, fresh from his experience in the development of radar, he perceived t

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Srisrual, Anusara, Thammaporn Thublaor, and Patthranit Wongpromrat. "CHAPTER 3 Characterisation of Thermal Oxide Scales on Stainless Steels." Solid State Phenomena 300 (February 2020): 47–80. http://dx.doi.org/10.4028/www.scientific.net/ssp.300.47.

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This chapter aims at reviewing the characterisation techniques that are commonly used for high temperature oxidation study, especially on stainless steels. In addition, the experimental studies about the high temperature oxidation i.e. thermogravimetric method and chromium volatilisation measurement are explained. The various kinds of characterisation techniques for physico-chemical and electronic properties of thermal oxide scales are reviewed, starting from optical microscopy (OM), scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDS), focused ion beam coupled with s

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