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Journal articles on the topic 'Electronic microscope'

Author: Grafiati

Published: 28 May 2022

Last updated: 31 July 2025

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1

Chen, Xiaodong, Bin Zheng, and Hong Liu. "Optical and Digital Microscopic Imaging Techniques and Applications in Pathology." Analytical Cellular Pathology 34, no. 1-2 (2011): 5–18. http://dx.doi.org/10.1155/2011/150563.

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The conventional optical microscope has been the primary tool in assisting pathological examinations. The modern digital pathology combines the power of microscopy, electronic detection, and computerized analysis. It enables cellular-, molecular-, and genetic-imaging at high efficiency and accuracy to facilitate clinical screening and diagnosis. This paper first reviews the fundamental concepts of microscopic imaging and introduces the technical features and associated clinical applications of optical microscopes, electron microscopes, scanning tunnel microscopes, and fluorescence microscopes.

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Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.

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The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic poten

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Daberkow, I., and M. Schierjott. "Possibilities And Examples For Remote Microscopy Including Digital Image Acquisition, Transfer, and Archiving." Microscopy and Microanalysis 4, S2 (1998): 2–3. http://dx.doi.org/10.1017/s1431927600020134.

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Recent developments promise the possibility to externally control every aspect of microscopes through a computer interface. In combination with high-resolution cameras and feedback to the microscope, this can be leveraged to create highly automatic routines, e.g., to remotely correct astigmatism. Together with the development of fast computer networks this creates a new branch of microscopy, the so-called “telemicroscopy”. The goal of telemicroscopy is the control of a microscope over a large distance including the transfer of images with an acceptable repetition rate. A big advantage for elec

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Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing i

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BIRCH, SARAH, PAUL COCKSHOTT, and KAREN RENAUD. "Putting Electronic Voting under the Microscope." Political Quarterly 85, no. 2 (2014): 187–94. http://dx.doi.org/10.1111/1467-923x.12071.

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Mickols, William, Ignacio Tinoco, Joseph E. Katz, Marcos F. Maestre, and Carlos Bustamante. "Imaging differential polarization microscope with electronic readout." Review of Scientific Instruments 56, no. 12 (1985): 2228–36. http://dx.doi.org/10.1063/1.1138354.

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Kondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi, and Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.

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Recent development of ultra-high vacuum electron microscopy (UHV-EM) is very rapid. This is due to the fact that it can be applied to variety of surface science fields.There are various types of surface imaging in UHV condition; low energy electron microscopy (LEEM) [1], transmission (TEM) and reflection electron microscopy (REM) [2] using conventional transmission electron microscopes (CTEM) (including scanning TEM and REM)), scanning electron microscopy, photoemission electron microscopy (PEEM) [3] and scanning tunneling microscopy (STM including related techniques such as scanning tunneling

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Abe, Eiji. "Electron Microscopy for Atomic/Electronic Structure of Quasicrystals." Acta Crystallographica Section A Foundations and Advances 70, a1 (2014): C1193. http://dx.doi.org/10.1107/s2053273314088068.

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As stated with special emphasis in the Noble Lecture by Dr. Shechtman, the quasicrystal discovery is definitely the victory of electron microscopy – the first icosahedral stereogram was constructed by a series of electron diffraction patterns from a tiny quasicrystalline grain, and the following high-resolution electron microscope images indeed confirmed a unique aperiodic order that can never be consistent with twinning of normal crystals. Almost thirty years after these early electron microscopy studies, we are now in the era of aberration-corrected electron microscopy which realizes a remar

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Dantas de Oliveira, Allisson, Carles Rubio Maturana, Francesc Zarzuela Serrat, et al. "Development of a low-cost robotized 3D-prototype for automated optical microscopy diagnosis: An open-source system." PLOS ONE 19, no. 6 (2024): e0304085. http://dx.doi.org/10.1371/journal.pone.0304085.

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In a clinical context, conventional optical microscopy is commonly used for the visualization of biological samples for diagnosis. However, the availability of molecular techniques and rapid diagnostic tests are reducing the use of conventional microscopy, and consequently the number of experienced professionals starts to decrease. Moreover, the continuous visualization during long periods of time through an optical microscope could affect the final diagnosis results due to induced human errors and fatigue. Therefore, microscopy automation is a challenge to be achieved and address this problem

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Vilà, Anna, Sergio Moreno, Joan Canals, and Angel Diéguez. "A Compact Raster Lensless Microscope Based on a Microdisplay." Sensors 21, no. 17 (2021): 5941. http://dx.doi.org/10.3390/s21175941.

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Lensless microscopy requires the simplest possible configuration, as it uses only a light source, the sample and an image sensor. The smallest practical microscope is demonstrated here. In contrast to standard lensless microscopy, the object is located near the lighting source. Raster optical microscopy is applied by using a single-pixel detector and a microdisplay. Maximum resolution relies on reduced LED size and the position of the sample respect the microdisplay. Contrarily to other sort of digital lensless holographic microscopes, light backpropagation is not required to reconstruct the i

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Erickson, A., D. Adderton, T. Day, and R. Alvis. "Imaging free Carriers in Electronic Material using a Scanning Probe Microscope: Scanning Capacitance Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 956–57. http://dx.doi.org/10.1017/s042482010016724x.

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The development of methods to measure electrical properties, which are suitable to directly yield the desired carrier distributions on a nanometer scale has greatly benefited from the development of scanning probe technology over the last decade. Scanning Probe Microscopes (SPMs) offer inherent two-dimensionality and have been shown to have applications ranging from Magnet force to electro-chemistry. We have used an SPM in contact mode to simultaneously measure topography (and therefore physical structure) and capacitance variations (due to an applied bias) of various electronic materials such

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Incardona, Nicolò, Ángel Tolosa, Gabriele Scrofani, Manuel Martinez-Corral, and Genaro Saavedra. "The Lightfield Microscope Eyepiece." Sensors 21, no. 19 (2021): 6619. http://dx.doi.org/10.3390/s21196619.

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Lightfield microscopy has raised growing interest in the last few years. Its ability to get three-dimensional information about the sample in a single shot makes it suitable for many applications in which time resolution is fundamental. In this paper we present a novel device, which is capable of converting any conventional microscope into a lightfield microscope. Based on the Fourier integral microscope concept, we designed the lightfield microscope eyepiece. This is coupled to the eyepiece port, to let the user exploit all the host microscope’s components (objective turret, illumination syst

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Bornhorst, Julia, Eike Nustede, and Sebastian Fudickar. "Mass Surveilance of C. elegans—Smartphone-Based DIY Microscope and Machine-Learning-Based Approach for Worm Detection." Sensors 19, no. 6 (2019): 1468. http://dx.doi.org/10.3390/s19061468.

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The nematode Caenorhabditis elegans (C. elegans) is often used as an alternative animal model due to several advantages such as morphological changes that can be seen directly under a microscope. Limitations of the model include the usage of expensive and cumbersome microscopes, and restrictions of the comprehensive use of C. elegans for toxicological trials. With the general applicability of the detection of C. elegans from microscope images via machine learning, as well as of smartphone-based microscopes, this article investigates the suitability of smartphone-based microscopy to detect C. e

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Okamoto, Takayuki, and Ichirou Yamaguchi. "Surface plasmon microscope with an electronic angular scanning." Optics Communications 93, no. 5-6 (1992): 265–70. http://dx.doi.org/10.1016/0030-4018(92)90183-r.

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Wilson, R. J., D. D. Chambliss, S. Chiang, and V. M. Hallmark. "Resolution in the scanning tunneling microscope." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 488–89. http://dx.doi.org/10.1017/s042482010008674x.

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Scanning tunneling microscopy (STM) has been used for many atomic scale observations of metal and semiconductor surfaces. The fundamental principle of the microscope involves the tunneling of evanescent electrons through a 10Å gap between a sharp tip and a reasonably conductive sample at energies in the eV range. Lateral and vertical resolution are used to define the minimum detectable width and height of observed features. Theoretical analyses first discussed lateral resolution in idealized cases, and recent work includes more general considerations. In all cases it is concluded that lateral

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Paci, G., E. Haas, L. Kornau, et al. "Microscope in Action: An Interdisciplinary Fluorescence Microscopy Hands-on Resource for Schools." Biophysicist 2, no. 3 (2021): 55–73. http://dx.doi.org/10.35459/tbp.2020.000171.

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ABSTRACT Fluorescence microscopy is a ubiquitous technique in the life sciences that uses fluorescent molecules to visualize specific components of biological specimens. This powerful tool has revolutionized biology, and it represents a perfect example of the advancements enabled by biophysical research and technology development. However, despite its central role in contemporary research, fluorescence is hardly covered in typical secondary school curricula, with few hands-on “entry-level” materials available for secondary school teachers to introduce this important method to their students. F

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17

Gibb, Alan G., and Thomas L. Croll. "Linear measurements in middle ear surgery." Journal of Laryngology & Otology 100, no. 6 (1986): 625–28. http://dx.doi.org/10.1017/s0022215100099795.

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AbstractPresent methods of linear measurement in micro-surgical procedures in the middle ear are crude when judged in relation to the delicate structure and functioning of the normal ear.Alternative methods of measurement employing the operating microscope are described. These depend on recording the travel of the microscope between two selected focal points and can be employed in both vertical and horizontal planes. Oblique distances can readily be calculated from the information provided. Minor alterations to existing microscopes would be required to ensure precise recording bv electronic or

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YAMAMOTO, Shinji, Kyohei UMEMOTO, and Ken-ichir YAMASHITA. "Electron Microscope." Journal of The Institute of Electrical Engineers of Japan 133, no. 5 (2013): 298–301. http://dx.doi.org/10.1541/ieejjournal.133.298.

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Novikov, Yu A. "Modern Scanning Electron Microscopy. 1. Secondary Electron Emission." Поверхность. Рентгеновские, синхротронные и нейтронные исследования, no. 5 (May 1, 2023): 80–94. http://dx.doi.org/10.31857/s102809602305014x.

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The development of modern technologies, including nanotechnology, is based on application of diagnostic methods of objects used in technologies processes. For this purpose most perspective are methods realized in a scanning electron microscope. Thus one of basic methods is the measurement of linear sizes of relief structures of micrometer and nanometer ranges used in micro- and nanoelectronic. In a basis of a scanning electron microscope job the secondary electronic issue of firm body lays. However, practically all researches were spent on surfaces, which relief was neglected. The review of th

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Wang, Weiming, Hang Liu, Yan Yu, Fengyu Cong, and Jun Yu. "Rapid Yeast Cell Viability Analysis by Using a Portable Microscope Based on the Fiber Optic Array and Simple Image Processing." Sensors 20, no. 7 (2020): 2092. http://dx.doi.org/10.3390/s20072092.

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A fiber optic array (FOA) can be used as an alternative or a supplement to the lens in a microscope due to its large magnification, high coupling efficiency and extremely low distortion. Based on our previous research, this paper first demonstrated the resolution and field-of-view (FOV) of the microscope based on the FOA. To further validate the FOA microscope’s imaging capability, yeast activity and concentration were investigated by simple image processing. The results showed that the percentages of live and dead yeast cells correctly identified were 92.1% and 84.8%, except for the clusters,

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Hayashi, T., M. Tachiki, and H. Itozaki. "SQUID Probe Microscope Combined With Scanning Tunneling Microscope." IEEE Transactions on Applied Superconductivity 17, no. 2 (2007): 792–95. http://dx.doi.org/10.1109/tasc.2007.898557.

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Faruqi, A. R., and Sriram Subramaniam. "CCD detectors in high-resolution biological electron microscopy." Quarterly Reviews of Biophysics 33, no. 1 (2000): 1–27. http://dx.doi.org/10.1017/s0033583500003577.

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1. Introduction 11.1 The ‘band gap’ in silicon 22. Principles of CCD detector operation 32.1 Direct detection 32.2 Electron energy conversion into light 42.3 Optical coupling: lens or fibre optics? 62.4 Readout speed and comparison with film 83. Practical considerations for electron microscopic applications 93.1 Sources of noise 93.1.1 Dark current noise 93.1.2 Readout noise 93.1.3 Spurious events due to X-rays or cosmic rays 103.2 Efficiency of detection 113.3 Spatial resolution and modulation transfer function 123.4 Interface to electron microscope 143.5 Electron diffraction applications 154

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Shakya, Subarna. "Automated Nanopackaging using Cellulose Fibers Composition with Feasibility in SEM Environment." June 2021 3, no. 2 (2021): 114–25. http://dx.doi.org/10.36548/jei.2021.2.004.

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By contributing to the system enhancement, the integration of Nano systems for nanosensors with biomaterials proves to be a unique element in the development of novel innovative systems. The techniques by which manipulation, handling, and preparation of the device are accomplished with respect to industrial use are a critical component that must be considered before the system is developed. The approach must be able to be used in a scanning electron microscope (SEM), resistant to environmental changes, and designed to be automated. Based on this deduction, the main objective of this research w

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Schwarzer, Robert. "Orientation Microscopy Using the Analytical Scanning Electron Microscope." Practical Metallography 51, no. 3 (2014): 160–79. http://dx.doi.org/10.3139/147.110280.

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Bond, L. J., D. Barnard, S. Doran, et al. "A novel cryogenic acoustic microscope to evaluate electronic components." Journal of Physics: Conference Series 2822, no. 1 (2024): 012064. http://dx.doi.org/10.1088/1742-6596/2822/1/012064.

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Abstract Electronics to operate at cryogenic temperatures is key to many areas of science, including space exploration and in particle physics. Ensuring circuit functional reliability is mission critical. One system that will use tens of thousands of custom designed application specific integrated circuits (ASIC) is the Deep Underground Neutrino Experiment (DUNE), which will have sensor circuits operating in liquid argon (87 K) for decades. Both functional and nondestructive testing are being used to ensure circuit quality and reliability. Part of this work involves design, testing and data an

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.A, HAMDY, KAWKAB .S .N, KHALIFA .A K, and HASSAN .A.M. "EFFECT OF ZINC ON SPLEENIC CELLS: ELECTRONIC MICROSCOPE EVALUATION." Journal of University of Anbar for Pure Science 1, no. 2 (2007): 23–34. http://dx.doi.org/10.37652/juaps.2007.15306.

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Stewart, Ian. "The Particle Atlas Electronic Edition." Microscopy Today 1, no. 6 (1993): 3. http://dx.doi.org/10.1017/s1551929500068516.

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In his preface to the first edition of The Particle Atlas, Jim Lodge talks of the challenge he posed to Dr. Walter McCrone in the 1950s to come up with a taxonomy for particles to assist in the identification of particles under the microscope. Jim's interest and the support of the Midwest Air Pollution Prevention Association and, laier, the US Public Health Service, gave birth to the first edition of The Particle Ailas. This first edition, published in 1967, was a single volume which combined guidance on particle separation and identification techniques with a collection of optical micrographs

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Marshall, J. E. A. "A simple cost-effective infra-red microscope for palynology." Journal of Micropalaeontology 14, no. 2 (1995): 106. http://dx.doi.org/10.1144/jm.14.2.106.

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Abstract. It has long been known that objects which are opaque in transmitted white light can become translucent in infra-red (IR) light. Its application to palynology was shown by Leclercq (1933) who used an IR filter to cut out the visible light from the specimen coupled with an IR-sensitive film to capture the image. Although the significance of this development was recognized (Walton, 1935), it was never generally used since oxidative methods such as Schulze’s solution are normally successful in clearing exines. The exceptions are opaque palynomorphs from thermally over-mature rocks. Such

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van Benthem, Klaus, Christina Scheu, Wilfried Sigle, Christian Elsässer, and Manfred Rühle. "Electronic Structure Investigations of Metal / SrtiO3 Interfaces Using EELS." Microscopy and Microanalysis 7, S2 (2001): 304–5. http://dx.doi.org/10.1017/s1431927600027598.

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Ni, Pd and Cr thin films were grown on (100)SrTiO3 surfaces by molecular beam epitaxy at substrate temperatures of TNJ, pd=650°C and Tcr =150°C. Electron energy-loss spectroscopy (EELS) and high resolution transmission electron microscopy (HRTEM) were applied to investigate the local electronic structure and the atomic structure of the interfaces, respectively. Analytical microscopy was carried out with a parallel energy-loss spectrometer (PEELS766) attached to a dedicated scanning transmission electron microscope (STEM) operated at 100keV, which has a point resolution of 0.22 nm. HRTEM studie

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Suzuki, T., M. Kudo, Y. Sakai, and T. Ichinokawa. "Material Contrast of Scanning Electron and Ion Microscope Images of Metals." Microscopy Today 16, no. 1 (2008): 6–11. http://dx.doi.org/10.1017/s1551929500054250.

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The rapid technical development of FIM (Focused Ion Beam) technology has spawned an increase in spatial resolution capability in scanning ion microscopy (SIM) technology. Furthermore, FIM has been used for preparation of thin specimens in transmission electron microscopy and micro-fabrication of electronic devices in the semiconductor industry. Recently, a scanning ion microscope with a helium field ion source has been developed. Thus, the contrast formation of emission electron images in scanning ion microscopy has been the object of study for analyzing images of materials specimens, similar

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Canals, Joan, Nil Franch, Victor Moro, et al. "A Novel Approach for a Chip-Sized Scanning Optical Microscope." Micromachines 12, no. 5 (2021): 527. http://dx.doi.org/10.3390/mi12050527.

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The recent advances in chip-size microscopy based on optical scanning with spatially resolved nano-illumination light sources are presented. This new straightforward technique takes advantage of the currently achieved miniaturization of LEDs in fully addressable arrays. These nano-LEDs are used to scan the sample with a resolution comparable to the LED sizes, giving rise to chip-sized scanning optical microscopes without mechanical parts or optical accessories. The operation principle and the potential of this new kind of microscope are analyzed through three different implementations of decre

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Yang, Meng Tao, Feng Li, Yu Chao Wang, and Q. Y. Liu. "Synthesis of Selenium Nanoparticles in the Presence of Oyster Polysaccharides and the Antioxidant Activity." Applied Mechanics and Materials 522-524 (February 2014): 1143–46. http://dx.doi.org/10.4028/www.scientific.net/amm.522-524.1143.

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A simple method for synthesis of nanoselenium using oyster polysaccharides as soft template was investigated. The uniform stable selenium polysaccharides were obtained under the condition of reaction temperature 40°C, reaction time 3 h-5 h, the content of oyster polysaccharides 400mg/L and the content of sodium selenite 1mM. The size distribution and morphology of the product were confirmed by scanning electronic microscopy (SEM) and tansmission electronic microscope (TEM). The antioxidant activity of nanoselenium polysaccharides were studied in vitro. The results showed that nanoselenium poly

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Silaghi, A. M., U. L. Rohde, A. K. Poddar, H. Silaghi, T. I. Ilias, and O. C. Fratila. "Important Aspects of Human Blood Exposure in the Radio and Microwave Field." Scientific Bulletin of Electrical Engineering Faculty 19, no. 1 (2019): 23–27. http://dx.doi.org/10.1515/sbeef-2019-0005.

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AbstractTo expose humans to microwave emissions damages biological welfare. For measuring the dielectric properties of biological tissues, it was studied whether current safety standard recommendations are inappropriate as far as human blood function is concerned. Thirty age and gender matched blood samples will serve as control. For increased accuracy detection of any possible alteration and to help orientate towards the details that are to be studied ultra-structurally, a special stain was used. An electronic microscope analysis will be performed on all the blood samples after specific prepa

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Inoué, Shinya. "Digitally Enhanced, Polarization-Based Microscopy: Reality and Dreams." Microscopy and Microanalysis 7, S2 (2001): 2–3. http://dx.doi.org/10.1017/s1431927600026088.

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Polarized light microscopy is used to identify and image optically anisotropic regions of the specimen; to determine their optical character; and to explore the arrangement of the molecules, fine structure, or atomic lattices that are responsible for the anisotropy. These studies can be carried out non-destructively in real time, and reveal events or structures that lie far below the resolution limit of the light microscope, or indeed at times even the electron microscope.In biology, to study the dynamically changing, minute and weakly anisotropic domains within living cells, the polarizing mi

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Yu, Chengzhuang, Shanshan Li, Chunyang Wei, Shijie Dai, Xinyi Liang, and Junwei Li. "A Cost-Effective Nucleic Acid Detection System Using a Portable Microscopic Device." Micromachines 13, no. 6 (2022): 869. http://dx.doi.org/10.3390/mi13060869.

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A fluorescence microscope is one of the most important tools for biomedical research and laboratory diagnosis. However, its high cost and bulky size hinder the application of laboratory microscopes in space-limited and low-resource applications. Here, in this work, we proposed a portable and cost-effective fluorescence microscope. Assembled from a set of 3D print components and a webcam, it consists of a three-degree-of-freedom sliding platform and a microscopic imaging system. The microscope is capable of bright-field and fluorescence imaging with micron-level resolution. The resolution and f

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Schumacher, H. W., U. F. Keyser, U. Zeitler, R. J. Haug, and K. Eberl. "Nanomachining of mesoscopic electronic devices using an atomic force microscope." Applied Physics Letters 75, no. 8 (1999): 1107–9. http://dx.doi.org/10.1063/1.124611.

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Tersoff, J. "Role of tip electronic structure in scanning tunneling microscope images." Physical Review B 41, no. 2 (1990): 1235–38. http://dx.doi.org/10.1103/physrevb.41.1235.

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Ng, Waiman. "Study of surfaces and interfaces by the maximum SPEM." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 66–67. http://dx.doi.org/10.1017/s0424820100168062.

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Photoemission spectroscopy with synchrotron radiation is a well-established technique for analyzing the electronic and chemical properties of solids and surfaces. However, photoemission suffers from a major limitation in its application to heterogeneous systems, due to large probe size (100μm * 100μm). The development of a photoemission microscope with both high spatial and energy resolution that can overcome this limitation is thus of great interest, and it can provideunique and complementary information to other microscopy techniques. The project MAXIMUM is a scanning photoemission microscop

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Cheng, Zhiheng, Chaolun Wang, Xing Wu, and Junhao Chu. "Review in situ transmission electron microscope with machine learning." Journal of Semiconductors 43, no. 8 (2022): 081001. http://dx.doi.org/10.1088/1674-4926/43/8/081001.

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Abstract Advanced electronic materials are the fundamental building blocks of integrated circuits (ICs). The microscale properties of electronic materials (e.g., crystal structures, defects, and chemical properties) can have a considerable impact on the performance of ICs. Comprehensive characterization and analysis of the material in real time with high-spatial resolution are indispensable. In situ transmission electron microscope (TEM) with atomic resolution and external field can be applied as a physical simulation platform to study the evolution of electronic material in working conditions

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Tang, Xing Chang, Yong Lin Kang, Yan Yan Bo, and Lei Fan. "Effect of Boron on Microstructure and Mechanical Property of High Grade Pipeline Steel." Advanced Materials Research 299-300 (July 2011): 319–22. http://dx.doi.org/10.4028/www.scientific.net/amr.299-300.319.

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The correlation among boron, microstructure and mechanical property of the X120 pipeline steel was investigated in this study. The mechanical properties of the steels were tested with quasi-static tensile testing machine. The microstructure of the steels with different boron contents was observed with scanning electronic microscope (SEM) and transmission electronic microscope (TEM). The result shows that by adding a small amount of boron the mechanical property of pipeline steel can be improved effectively.

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Itoh, J., R. Y. Osamura, and K. Watanabe. "Subcellular visualization of light microscopic specimens by laser scanning microscopy and computer analysis: a new application of image analysis." Journal of Histochemistry & Cytochemistry 40, no. 7 (1992): 955–67. http://dx.doi.org/10.1177/40.7.1607644.

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To identify subcellular organelles or to observe their pathological changes in sections prepared for light microscopy, immuno- and/or enzyme histochemical staining for the marker substances or enzymes of those subcellular organelles are frequently employed. With conventional light microscopes (CLM), however, it is hardly possible to determine whether or not the target organelles are properly stained and to confirm their fine structure. In the present study, the laser scanning microscope (LSM) was employed to obtain highly contrasted images of histochemically stained subcellular organelles at t

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Lindgren, Randy, Wesley Kozan, Noah Fuerst, Douglas Knapp, and Joshua P. Veazey. "A z-axis tunneling microscope for undergraduate labs." American Journal of Physics 90, no. 10 (2022): 795–800. http://dx.doi.org/10.1119/5.0094028.

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We present the design and construction of a laboratory apparatus that provides advanced undergraduates with hands-on observations of electron quantum tunneling and the electronic density of states of various materials. The instrument is inspired by the scanning tunneling microscope (STM), but its implementation is simplified by limiting the tip motion to the single dimension along the tip-sample separation ( z-axis); we refer to the device as the z-axis tunneling microscope (ZTM). Students are able to use the ZTM to measure electron tunneling probability as a function of barrier width, estimat

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Minkel, J. R. "A Tabletop UV Microscope." IEEE Spectrum 43, no. 9 (2006): 16. http://dx.doi.org/10.1109/mspec.2006.1688249.

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Murakami, Hironaru, Naotsugu Uchida, Ryotaro Inoue, Sunmi Kim, Toshihiko Kiwa, and Masayoshi Tonouchi. "Laser Terahertz Emission Microscope." Proceedings of the IEEE 95, no. 8 (2007): 1646–57. http://dx.doi.org/10.1109/jproc.2007.898829.

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RADOJEWSKI, J., H. PAGNIA, and N. SOTNIK. "Optical scanning tunnelling microscope." International Journal of Electronics 73, no. 5 (1992): 1087–89. http://dx.doi.org/10.1080/00207219208925774.

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Ginlünas, L., R. Juškaitis, and S. V. Shatalin. "Scanning fibre-optic microscope." Electronics Letters 27, no. 9 (1991): 724. http://dx.doi.org/10.1049/el:19910450.

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Fan, G. Y., and M. H. Ellisman. "Current State of the Art of Digital Imaging in TEM." Microscopy and Microanalysis 3, S2 (1997): 1087–88. http://dx.doi.org/10.1017/s1431927600012320.

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The increasingly wide use of digital computers, the world-wide-web and electronic publishing has had a fundamental impact on the way scientists conduct research in every discipline of science. Electron microscopy is no exception. A considerable amount of effort has been devoted to the development of digital imaging acquisition systems for transmission electron microscopy (TEM). Digital image acquisition systems for TEM, including complete systems, have been produced by several companies, including: Advanced Microscopy Techniques (Rowley, MA), JEOL (Peabody, MA), Gatan (Warrendale, PA), Princet

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Doroshenko, Olga V., Mikhail V. Golub, Oksana Yu Kremneva, et al. "Automated Assessment of Wheat Leaf Disease Spore Concentration Using a Smart Microscopy Scanning System." Agronomy 14, no. 9 (2024): 1945. http://dx.doi.org/10.3390/agronomy14091945.

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An advanced approach to the automated assessment of a microscopic slide containing spores is presented. The objective is to develop an intelligent system for the rapid and precise estimation of phytopathogenic spore concentration on microscopic slides, thereby enabling automated processing. The smart microscopy scanning system comprises an electronic microscope, a coordinate table, and software for the control of the coordinate table and image processing. The developed smart microscopy scanning system processes the entire microscope slide with multiple exposed strips, which are automatically d

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Enayat, Wahidullah. "Surface analysis using Scanning Tunneling Microscope." Scientific Journal Balkh, Quarterly Natural Science Journal Balkh University 3 (March 10, 2020): 103–10. https://doi.org/10.5281/zenodo.5234664.

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STM is an electronic microscope designed to investigate the structure, properties and surfaces of conductive materials and the biologist is to some extent a conductor, is being studied and used. Scanning tunneling microscope is the first invention of a series of scanning probe microscopes used to create 3D images of atomic precision and high resolution materials. This microscope is based on a phenomenon in physics is called the quantum tunneling effect. Due to the electric current created, there are two operating modes at this microscope: Fixed altitude working mode and Fixed current working m

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Ромащенко, М. А., and Д. В. Васильченко. "DEVELOPMENT HARDWARE FOR OPTICAL DEFECT INSPECTION SYSTEM TOPOLOGY OF ELECTRONIC COMPONENTS." ВЕСТНИК ВОРОНЕЖСКОГО ГОСУДАРСТВЕННОГО ТЕХНИЧЕСКОГО УНИВЕРСИТЕТА 20, no. 2 (2024): 110–15. http://dx.doi.org/10.36622/1729-6501.2024.20.2.017.

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рассматривается один из этапов проекта по разработке, изготовлению и тестированию опытного образца программно-аппаратного комплекса оптической дефектовки топологии электронных компонентов. Сформулирована проблема, обосновывающая необходимость создания подобного комплекса оптической инспекции, а также сложности, возникающие при интеграции в существующий технологический процесс. Поставлена задача данного этапа, заключающаяся в выборе комплектующих для создания аппаратной части системы, определении подхода к их интеграции в существующую конструкцию инспекционного оптического прибора, а также разр

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