Relevant bibliographies by topics / Electronic secondary emission

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Electronic secondary emission'

Author: Grafiati
Published: 14 September 2024
Last updated: 31 July 2025

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Journal articles on the topic "Electronic secondary emission"

1

Yater, J. E. "Secondary electron emission and vacuum electronics." Journal of Applied Physics 133, no. 5 (2023): 050901. http://dx.doi.org/10.1063/5.0130972.

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Secondary electron emission serves as the foundation for a broad range of vacuum electronic devices and instrumentation, from particle detectors and multipliers to high-power amplifiers. While secondary yields of at least 3–4 are required in practical applications, the emitter stability can be compromised by surface dynamics during operation. As a result, the range of practical emitter materials is limited. The development of new emitter materials with high yield and robust operation would advance the state-of-the-art and enable new device concepts and applications. In this Perspective article
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Neugebauer, R., R. Wuensch, T. Jalowy, et al. "Secondary electron emission near the electronic stopping power maximum." Physical Review B 59, no. 17 (1999): 11113–16. http://dx.doi.org/10.1103/physrevb.59.11113.

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Klochkov, V. P., and V. L. Bogdanov. "Secondary emission accompanying excitation of high electronic states (Review)." Journal of Applied Spectroscopy 43, no. 1 (1985): 699–714. http://dx.doi.org/10.1007/bf00660572.

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Fitting, H. J., and D. Hecht. "Secondary electron field emission." Physica Status Solidi (a) 108, no. 1 (1988): 265–73. http://dx.doi.org/10.1002/pssa.2211080127.

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Howie, A. "Threshold Energy Effects in Secondary Electron Emission." Microscopy and Microanalysis 5, S2 (1999): 662–63. http://dx.doi.org/10.1017/s1431927600016639.

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The work function ϕ, the bandgap Eg, the threshold energy level Et, for the inelastic scattering of excited electrons and the threshold energy transfer Ed for the onset of structural ionisation damage are clearly of major significance in various actively developing forms of hot carrier imaging. Two exciting examples here are the ability to image small and dynamic local changes in work function by PEEM and as well as mapping the variations in electronic structure between p and n-type regions of a semiconductor by SE imaging in the SEM. More recently still there have been indications that the SE
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Novikov, Yu A. "Modern Scanning Electron Microscopy. 1. Secondary Electron Emission." Поверхность. Рентгеновские, синхротронные и нейтронные исследования, no. 5 (May 1, 2023): 80–94. http://dx.doi.org/10.31857/s102809602305014x.

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The development of modern technologies, including nanotechnology, is based on application of diagnostic methods of objects used in technologies processes. For this purpose most perspective are methods realized in a scanning electron microscope. Thus one of basic methods is the measurement of linear sizes of relief structures of micrometer and nanometer ranges used in micro- and nanoelectronic. In a basis of a scanning electron microscope job the secondary electronic issue of firm body lays. However, practically all researches were spent on surfaces, which relief was neglected. The review of th
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Huang, Ling, and Qian Wang. "Study on Secondary Electron Yield of Dielectric Materials." Journal of Physics: Conference Series 2433, no. 1 (2023): 012002. http://dx.doi.org/10.1088/1742-6596/2433/1/012002.

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Abstract The secondary electron emission coefficient of dielectric materials will have an important impact on the performance of electronic devices and equipment. In order to understand the secondary electron emission coefficient of common dielectric materials, the collection electrode negative bias method is introduced in this study. First, the measurement method of secondary electron emission coefficient of dielectric materials is analyzed, and 20 common dielectric materials are introduced, the secondary electron emission coefficients of 20 kinds of common dielectric materials were measured
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Vaughan, J. R. M. "A new formula for secondary emission yield." IEEE Transactions on Electron Devices 36, no. 9 (1989): 1963–67. http://dx.doi.org/10.1109/16.34278.

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Pintao, Carlos. "Mylar secondary emission-energy distribution and yields." IEEE Transactions on Dielectrics and Electrical Insulation 21, no. 1 (2014): 311–16. http://dx.doi.org/10.1109/tdei.2014.6740754.

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Michizono, Shinichiro. "Secondary electron emission from alumina RF windows." IEEE Transactions on Dielectrics and Electrical Insulation 14, no. 3 (2007): 583–92. http://dx.doi.org/10.1109/tdei.2007.369517.

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Dissertations / Theses on the topic "Electronic secondary emission"

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Ludwick, Jonathan. "Physics of High-Power Vacuum Electronic Systems Based on Carbon Nanotube Fiber Field Emitters." University of Cincinnati / OhioLINK, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1613745398331048.

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Ransley, Chau Diem Nguyen. "Secondary electron emission from organic monolayers." Thesis, University of Cambridge, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.612907.

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Farhang, Mohammad Hossein. "Secondary electron emission yield from carbon samples." Thesis, University of Southampton, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.318220.

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Vempati, Pratyusha. "Analytical fits to Secondary Emission Yield Data." University of Cincinnati / OhioLINK, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1523635397854801.

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Cormier, Pierre Richard Sébastien. "Secondary electron emission properties of molybdenum disulfide thin films." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1998. http://www.collectionscanada.ca/obj/s4/f2/dsk3/ftp04/mq31189.pdf.

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Muellejans, Harald. "Secondary electron emission in coincidence with primary energy losses." Thesis, University of Cambridge, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.240071.

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Vaz, Raquel Maria Amaro. "Studies of the secondary electron emission from diamond films." Thesis, University of Bristol, 2013. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.616564.

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The aim of the present research was the development of an optimised secondary electron emission (SEE) diamond film to use as a dynode material. The project was a partnership between the School of Chemistry in the University of Bristol, the Space Research Centre (SRC) at the University of Leicester and Photek, a company specialized in the manufacture of systems for photon detection. The role of Bristol in this project consisted in the preparation of CVD diamond films and their characterization, before supply to the other collaborators. SEE characterisation of the samples was performed at SRC an
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Thomson, Clint D. "Measurements of the Secondary Electron Emission Properties of Insulators." DigitalCommons@USU, 2005. https://digitalcommons.usu.edu/etd/2093.

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Measurements of the electron-induced electron emission properties of insulators are important to many applications including spacecraft charging, scanning electron microscopy, electron sources, and particle detection technology. However, these measurements are difficult to make since insulators can charge either negatively or positively under charge particle bombardment that in turn alters insulator emissions. In addition, incident electron bombardment can modify the conductivity, internal charge distribution, surface potential, and material structure in ways that are not well understood. A pr
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Haidara, Modibo. "Impulsions de Trichel dans le cyclohexane liquide et les gaz comprimés." Grenoble 1, 1988. http://www.theses.fr/1988GRE10160.

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Resultats d'etude de la conduction electrique de liquides non polaires tres purs (cyclohexane, n-propane) en geometrie pointe-plan, en fonction du rayon de courbure de la pointe et de la pression hydrostatique (p<->10**(7)pa)
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Davies, Robert. "Measurement of Angle-Resolved Secondary Electron Spectra." DigitalCommons@USU, 1999. https://digitalcommons.usu.edu/etd/1698.

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Theoretical formulations of secondary electron emission over the past 20 years have exceeded the confirming ability of available measurements. An instrument has been developed and tested for the purpose of obtaining simultaneous angle- and energy-resolved (AER) secondary and backscattered electron measurements for energetic electrons incident on conducting surfaces. The instrument is found to be in good working order and the data quality found to be excellent for nearly all angles and energies investigated. A representative set of AER measurements has been acquired for 1500 e V electrons norma
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Books on the topic "Electronic secondary emission"

1

International Commission on Radiation Units and Measurements., ed. Secondary electron spectra from charged particle interactions. International Commission on Radiation Units and Measurements, 1996.

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2

M, Asnin Vladimir, Petukhov Andre G, and NASA Glenn Research Center, eds. Secondary electron emission spectroscopy of diamond surfaces. National Aeronautics and Space Administration, Glenn Research Center, 1999.

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3

A, Jensen Kenneth, Roman Robert F, and United States. National Aeronautics and Space Administration. Scientific and Technical Information Division., eds. Secondary electron emission characteristics of molybdenum-masked, ion-textured OFHC copper. National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division, 1990.

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4

United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch., ed. Calculation of secondary electron trajectories in multistage depressed collectors for microwave amplifiers. National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1986.

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United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch., ed. Calculation of secondary electron trajectories in multistage depressed collectors for microwave amplifiers. National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1986.

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6

T, Mearini G., and United States. National Aeronautics and Space Administration., eds. Effects of surface treatments on secondary electron emission from CVD diamond films. National Aeronautics and Space Administration, 1995.

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7

Nauchnyĭ sovet po probleme "Fizicheskai͡a ėlektronika" (Akademii͡a nauk SSSR) and Tashkentskiĭ politekhnicheskiĭ institut im. Abu Raĭkhana Beruni, eds. VII Simpozium po vtorichnoĭ ėlektronnoĭ, fotoėlektronnoĭ ėmissii͡am i spektroskopii poverkhnosti tverdogo tela, Tashkent, 7-9 ii͡uni͡a 1990 goda: Tezisy dokladov. Tashkentskiĭ politekhnicheskiĭ in-t im. Beruni, 1990.

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A, Jensen Kenneth, and United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch., eds. Textured carbon on copper: A novel surface with extremely low secondary electron emission characteristics. National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1985.

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9

Novikov, I︠U︡ A. Mekhanizmy vtorichnoĭ ėlektronnoĭ ėmissii relʹefnoĭ poverkhnosti tverdogo tela. Nauka, Fizmatlit, 1998.

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Kovalev, V. P. Vtorichnye ėlektrony. Ėnergoatomizdat, 1987.

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Book chapters on the topic "Electronic secondary emission"

1

Maguire, H. G. "Auger and Secondary Emission Electronic Structural Characteristics in Metals and Insulators." In Springer Series in Surface Sciences. Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-642-75066-3_19.

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Feng, Guobao, Wanzhao Cui, Fang Wang, and Guanghui Miao. "Secondary Electron Emission Model." In Theory and Application of Secondary Electron Emission. CRC Press, 2025. https://doi.org/10.1201/9781003562863-2.

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Schou, Jørgen. "Secondary Electron Emission from Insulators." In NATO ASI Series. Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-2840-1_24.

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Cui, Wanzhao, Guobao Feng, Fang Wang, and Guanghui Miao. "Application of Secondary Electron Emission." In Theory and Application of Secondary Electron Emission. CRC Press, 2025. https://doi.org/10.1201/9781003562863-7.

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Cui, Wanzhao, Guobao Feng, Yongning He, and Ming Ye. "Surface Modification for Secondary Electron Emission." In Theory and Application of Secondary Electron Emission. CRC Press, 2025. https://doi.org/10.1201/9781003562863-4.

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Cui, Wanzhao, Guobao Feng, Fang Wang, and Guanghui Miao. "Secondary Electron Emission Measurement and Database." In Theory and Application of Secondary Electron Emission. CRC Press, 2025. https://doi.org/10.1201/9781003562863-3.

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Reimer, Ludwig. "Emission of Backscattered and Secondary Electrons." In Springer Series in Optical Sciences. Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-540-38967-5_4.

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Yan, Baojun, and Shulin Liu. "Research on the Application of Secondary Electron Emission Phenomenon in Electron Multipliers." In Theory and Application of Secondary Electron Emission. CRC Press, 2025. https://doi.org/10.1201/9781003562863-8.

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Feng, Guobao, and Wanzhao Cui. "Charging Effect and Dynamic Secondary Electrons Emission." In Theory and Application of Secondary Electron Emission. CRC Press, 2025. https://doi.org/10.1201/9781003562863-6.

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Liu, Yifan, Aigen Xie, and Hongjie Dong. "Metal's Photoemission Based on Secondary Electron Emission." In Theory and Application of Secondary Electron Emission. CRC Press, 2025. https://doi.org/10.1201/9781003562863-9.

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Conference papers on the topic "Electronic secondary emission"

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Sizhan, Wang, Wang Zhihao, Nie Xiangyu, and Yang Xiaoyi. "Research on Measurement Method for Secondary Electron Emission Coefficient of Aerospace Material." In 2024 IEEE 7th International Conference on Electronic Information and Communication Technology (ICEICT). IEEE, 2024. http://dx.doi.org/10.1109/iceict61637.2024.10671164.

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Wang, L. "Research on Pulsed High-Current Secondary Electron Emission Cathode." In 2024 IEEE International Conference on Plasma Science (ICOPS). IEEE, 2024. http://dx.doi.org/10.1109/icops58192.2024.10627566.

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Damamme, G., N. Ghorbel, A. Si Ahmed, K. Said, and G. Moya. "Modeling of secondary electron emission and charge trapping in an insulator under an electronic beam." In 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP). IEEE, 2016. http://dx.doi.org/10.1109/ceidp.2016.7785520.

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Kopot, M. A., V. D. Yeryomka, and V. D. Naumenko. "Electronic Shell Generation in the MM-Wave Secondary Emission Magnetron with Cold Cathode." In 2007 17th International Crimean Conference "Microwave and Telecommunication Technology" (CriMiCo '2007). IEEE, 2007. http://dx.doi.org/10.1109/crmico.2007.4368680.

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Shibahara, Masahiko, Shin-Ichi Satake, and Jun Taniguchi. "Quantum Molecular Dynamics Study on Energy Transfer to the Secondary Electron in Surface Collision Process of an Ion." In ASME/JSME 2007 Thermal Engineering Heat Transfer Summer Conference collocated with the ASME 2007 InterPACK Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/ht2007-32144.

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It is well known that an emission of secondary electrons is observed in an ion collision process to a surface, such as the focused ion beam (FIB) process. However, the physical effect of secondary electron emission to energy and mass transfer is seldom considered and there are few examples of analysis of the secondary electron emission. It is one of interesting problems as an extreme small scale energy transfer problem how energy is transferred to the electron emitted from the surface by ionic collisions. In the present study the quantum molecular dynamics method was applied to an energy trans
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Martens, V. Ya. "COMPENSATION BY IONS OF THE SPATIAL CHARGE OF THE ELECTRON BEAM, PAIRED AND SECONDARY ELECTRONS." In Plasma emission electronics. Buryat Scientific Center of SB RAS Press, 2023. http://dx.doi.org/10.31554/978-5-7925-0655-8-2023-64-70.

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TROMAYER, Jürgen, Roland KIRCHBERGER, Gerd NEUMANN, and Helmut EICHLSEDER. "Are low-cost, low-tech solutions adequate for small capacity EU III motorcycles?" In Small Engine Technology Conference & Exposition. Society of Automotive Engineers of Japan, 2007. http://dx.doi.org/10.4271/2007-32-0014.

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&lt;div class="section abstract"&gt;&lt;div class="htmlview paragraph"&gt;More and more stringent emission legislation is implemented in the world wide market of motorcycles leading to higher product costs. But not every market is ready for high technological levels. Therefore the main topic of interest is: “Will a small one cylinder motorbike engine need an electronic device for fuel metering or is it possible to use standard carburetors in combination with some smart but simple ideas, to fulfil EU III cold start emission regulations?” The described ideas deal with a novel secondary air suppl
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Sergeev, N. S., and I. A. Sorokin. "MEASUREMENT OF THE TOTAL SECONDARY ELECTRON EMISSION COEFFICIENT IN A LINEAR PLASMA SIMULATOR BPD-PSI." In Plasma emission electronics. Buryat Scientific Center of SB RAS Press, 2023. http://dx.doi.org/10.31554/978-5-7925-0655-8-2023-233-237.

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George, Anoop, Robert A. Schill, Richard Kant, and Stan Goldfarb. "Secondary Electron Emission from Niobium." In IEEE Conference Record - Abstracts. 2005 IEEE International Conference on Plasma Science. IEEE, 2005. http://dx.doi.org/10.1109/plasma.2005.359503.

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Hopman, H. J., and J. Verhoeven. "Secondary electron emission from insulators." In Eighth international symposium on the production and neutralization of negative ions and beams and the seventh european workshop on the production and application of light negative ions. AIP, 1998. http://dx.doi.org/10.1063/1.56369.

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Reports on the topic "Electronic secondary emission"

1

Kirby, R. E. Secondary electron emission from accelerator materials. Office of Scientific and Technical Information (OSTI), 2000. http://dx.doi.org/10.2172/753300.

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Kirby, R. Artifacts in Secondary Electron Emission Yield Measurements. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/827328.

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Wilson, Warren G. Secondary and Backscatter Electron Emission from Conductors. Defense Technical Information Center, 1998. http://dx.doi.org/10.21236/ada359512.

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Kirby, Robert E. Secondary Electron Emission Yields from PEP-II Accelerator Materials. Office of Scientific and Technical Information (OSTI), 2000. http://dx.doi.org/10.2172/784708.

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Furman, M. Probabilistic Model for the Simulation of Secondary Electron Emission. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/826907.

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Zhang S. Y. Secondary Electron Emission at the SNS Storage Ring Collimator. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/1157228.

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M.D. Campanell, A. Khrabrov and I. D. Kaganovich. Absence of Debye Sheaths Due to Secondary Electron Emission. Office of Scientific and Technical Information (OSTI), 2012. http://dx.doi.org/10.2172/1062662.

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Basovic, Milos. Secondary Electron Emission from Plasma Processed Accelerating Cavity Grade Niobium. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1351260.

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George, Anoop. Study of Secondary Electron Emission from Niobium at Cryogenic Temperatures. Office of Scientific and Technical Information (OSTI), 2005. http://dx.doi.org/10.2172/1552175.

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Furman, M. A., and M. T. F. Pivi. Simulation of secondary electron emission based on a phenomenological probabilistic model. Office of Scientific and Technical Information (OSTI), 2003. http://dx.doi.org/10.2172/835149.

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