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Journal articles on the topic 'Electronic secondary emission'

Author: Grafiati

Published: 14 September 2024

Last updated: 31 July 2025

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1

Yater, J. E. "Secondary electron emission and vacuum electronics." Journal of Applied Physics 133, no. 5 (2023): 050901. http://dx.doi.org/10.1063/5.0130972.

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Secondary electron emission serves as the foundation for a broad range of vacuum electronic devices and instrumentation, from particle detectors and multipliers to high-power amplifiers. While secondary yields of at least 3–4 are required in practical applications, the emitter stability can be compromised by surface dynamics during operation. As a result, the range of practical emitter materials is limited. The development of new emitter materials with high yield and robust operation would advance the state-of-the-art and enable new device concepts and applications. In this Perspective article

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2

Neugebauer, R., R. Wuensch, T. Jalowy, et al. "Secondary electron emission near the electronic stopping power maximum." Physical Review B 59, no. 17 (1999): 11113–16. http://dx.doi.org/10.1103/physrevb.59.11113.

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3

Klochkov, V. P., and V. L. Bogdanov. "Secondary emission accompanying excitation of high electronic states (Review)." Journal of Applied Spectroscopy 43, no. 1 (1985): 699–714. http://dx.doi.org/10.1007/bf00660572.

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4

Fitting, H. J., and D. Hecht. "Secondary electron field emission." Physica Status Solidi (a) 108, no. 1 (1988): 265–73. http://dx.doi.org/10.1002/pssa.2211080127.

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5

Howie, A. "Threshold Energy Effects in Secondary Electron Emission." Microscopy and Microanalysis 5, S2 (1999): 662–63. http://dx.doi.org/10.1017/s1431927600016639.

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The work function ϕ, the bandgap Eg, the threshold energy level Et, for the inelastic scattering of excited electrons and the threshold energy transfer Ed for the onset of structural ionisation damage are clearly of major significance in various actively developing forms of hot carrier imaging. Two exciting examples here are the ability to image small and dynamic local changes in work function by PEEM and as well as mapping the variations in electronic structure between p and n-type regions of a semiconductor by SE imaging in the SEM. More recently still there have been indications that the SE

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6

Novikov, Yu A. "Modern Scanning Electron Microscopy. 1. Secondary Electron Emission." Поверхность. Рентгеновские, синхротронные и нейтронные исследования, no. 5 (May 1, 2023): 80–94. http://dx.doi.org/10.31857/s102809602305014x.

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The development of modern technologies, including nanotechnology, is based on application of diagnostic methods of objects used in technologies processes. For this purpose most perspective are methods realized in a scanning electron microscope. Thus one of basic methods is the measurement of linear sizes of relief structures of micrometer and nanometer ranges used in micro- and nanoelectronic. In a basis of a scanning electron microscope job the secondary electronic issue of firm body lays. However, practically all researches were spent on surfaces, which relief was neglected. The review of th

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7

Huang, Ling, and Qian Wang. "Study on Secondary Electron Yield of Dielectric Materials." Journal of Physics: Conference Series 2433, no. 1 (2023): 012002. http://dx.doi.org/10.1088/1742-6596/2433/1/012002.

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Abstract The secondary electron emission coefficient of dielectric materials will have an important impact on the performance of electronic devices and equipment. In order to understand the secondary electron emission coefficient of common dielectric materials, the collection electrode negative bias method is introduced in this study. First, the measurement method of secondary electron emission coefficient of dielectric materials is analyzed, and 20 common dielectric materials are introduced, the secondary electron emission coefficients of 20 kinds of common dielectric materials were measured

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8

Vaughan, J. R. M. "A new formula for secondary emission yield." IEEE Transactions on Electron Devices 36, no. 9 (1989): 1963–67. http://dx.doi.org/10.1109/16.34278.

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9

Pintao, Carlos. "Mylar secondary emission-energy distribution and yields." IEEE Transactions on Dielectrics and Electrical Insulation 21, no. 1 (2014): 311–16. http://dx.doi.org/10.1109/tdei.2014.6740754.

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10

Michizono, Shinichiro. "Secondary electron emission from alumina RF windows." IEEE Transactions on Dielectrics and Electrical Insulation 14, no. 3 (2007): 583–92. http://dx.doi.org/10.1109/tdei.2007.369517.

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11

Langbein, W. "Speckle Analysis of Resonant Secondary Emission." physica status solidi (b) 234, no. 1 (2002): 84–95. http://dx.doi.org/10.1002/1521-3951(200211)234:1<84::aid-pssb84>3.0.co;2-y.

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12

Goncharov, I. N., E. N. Kozyrev, and I. V. Tvauri. "Modeling of Electronic Amplification Processes in Channels of Multipliers on Porous Structures of Aluminum Oxide." Proceedings of Universities. Electronics 25, no. 5 (2020): 402–9. http://dx.doi.org/10.24151/1561-5405-2020-25-5-402-409.

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The secondary-emission multiplier of spatial-distributed flows of electrons – microchannel membrane – determines along with the photocathode, luminescent screen, electron-optical system determines the amplifying characteristics of the electron-optical transformers, photoelectronic multipliers. This, in its turn, determines the application areas and the operating range of the items. The actual task is an improvement of the microchannel membrane parameters and the search for new approaches to manufacture on alternative materials of the secondary-emission multipliers. In the paper the use of self

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13

Budd, P. A., B. Javidi, and J. W. Robinson. "Secondary Electron Emission from a Charged Dielectric." IEEE Transactions on Electrical Insulation EI-20, no. 3 (1985): 485–91. http://dx.doi.org/10.1109/tei.1985.348771.

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14

KITANO, Naomu, Namio MATUDA, Takeshi AZAMI, and Hironori MATUURA. "Secondary Electron Emission from Copper Surface." SHINKU 41, no. 3 (1998): 239–41. http://dx.doi.org/10.3131/jvsj.41.239.

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15

Chiarello, G., R. G. Agostino, A. Amoddeo, L. S. Caputi, and E. Colavita. "Unoccupied electronic states of CuO and Cu2O studied by secondary electron emission." Journal of Electron Spectroscopy and Related Phenomena 70, no. 1 (1994): 45–50. http://dx.doi.org/10.1016/0368-2048(94)02206-f.

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16

Thr�nhardt, A., S. Kuckenburg, A. Knorr, and S. W. Koch. "Coherent and Incoherent Contributions to Secondary Emission." physica status solidi (b) 221, no. 1 (2000): 227–30. http://dx.doi.org/10.1002/1521-3951(200009)221:1<227::aid-pssb227>3.0.co;2-u.

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17

Chenakin, S. P., V. T. Cherepin, A. L. Pivovarov, and M. A. Vasilev. "Secondary Ion Emission from Amorphous Metallic Alloys." physica status solidi (a) 96, no. 1 (1986): K21—K26. http://dx.doi.org/10.1002/pssa.2210960149.

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18

Mashchenko, V. E., V. F. Kharsik, and S. V. Brezhneva. "Secondary emission of excitons in CuCl polycrystals." physica status solidi (b) 135, no. 1 (1986): 201–6. http://dx.doi.org/10.1002/pssb.2221350120.

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19

González-Berríos, Adolfo, Vladimir I. Makarov, Yamila Goenaga-Vázquez, Gerardo Morell, and Brad R. Weiner. "Secondary electron emission from nanocomposite carbon films." Journal of Materials Science: Materials in Electronics 20, no. 10 (2008): 996–1000. http://dx.doi.org/10.1007/s10854-008-9822-y.

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20

Huerta, C. E., M. I. Patino, and R. E. Wirz. "Secondary electron emission from textured surfaces." Journal of Physics D: Applied Physics 51, no. 14 (2018): 145202. http://dx.doi.org/10.1088/1361-6463/aab1ac.

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21

Dvorkin, V. V., N. N. Dzbanovsky, N. V. Suetin, et al. "Secondary electron emission from CVD diamond films." Diamond and Related Materials 12, no. 12 (2003): 2208–18. http://dx.doi.org/10.1016/s0925-9635(03)00320-0.

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22

Gross, B., H. Seggern, and A. Berraissoul. "Surface Chargine of Dielectrics by Secondary Emission and the Determination of Emission Yield." IEEE Transactions on Electrical Insulation EI-22, no. 1 (1987): 23–28. http://dx.doi.org/10.1109/tei.1987.298959.

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23

Feller, W. B. "The dynodized microchannel plate model and secondary electron emission." IEEE Transactions on Electron Devices 32, no. 11 (1985): 2479–81. http://dx.doi.org/10.1109/t-ed.1985.22297.

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24

Schwanz, Daphne, Math Bollen, Oscar Lennerhag, and Anders Larsson. "Harmonic Transfers for Quantifying Propagation of Harmonics in Wind Power Plants." Energies 14, no. 18 (2021): 5798. http://dx.doi.org/10.3390/en14185798.

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In this paper, primary and secondary emissions in wind power plants are studied by using transfer admittance and current transfer functions between turbines and the public grid. The use of such transfer functions allows harmonic propagation studies without knowledge of the emission from individual turbines or the background voltage distortion. The transfer functions are calculated for one synthetic and one existing wind power plant, and results are discussed. Primary emission, secondary emission from other turbines and secondary emission from the public grid are shown to be of the same order o

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25

Choi, Chul Hwan, Seon Hyo Kim, Hyo Jin Lee, Yoon Hee Jeong, and Myung Hwa Jung. "Structural, optical, and electronic properties of room temperature ferromagnetic GaCuN film grown by hybrid physical-chemical vapor deposition." Journal of Materials Research 24, no. 5 (2009): 1716–21. http://dx.doi.org/10.1557/jmr.2009.0204.

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Ferromagnetic Cu-doped GaN film was grown on a GaN-buffered sapphire (0001) substrate by a hybrid physical-chemical-vapor-deposition method (HPCVD). The GaCuN film (Cu: 3.6 at.%) has a highly c-axis-oriented hexagonal wurtzite crystal structure, which is similar to GaN buffer but without any secondary phases such as metallic Cu, CuxNy, and CuxGay compounds. Two weak near-band edge (NBE) emissions at 3.38 eV and donor-acceptor-pair (DAP) transition at 3.2 eV with a typical strong broad yellow emission were observed in photoluminescence spectra for GaN buffer. In contrast, the yellow emission wa

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26

Sekioka, T., M. Terasawa, T. Mitamura, M. P. Stöckli, U. Lehnert, and C. Fehrenbach. "Electronic excitation effects on secondary ion emission in highly charged ion–solid interaction." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 182, no. 1-4 (2001): 121–26. http://dx.doi.org/10.1016/s0168-583x(01)00664-4.

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27

Li, Jing, Qiu Ting Yu, Yun Dong Cao, Xiao Ming Liu, and Chong Xu. "A Microscopic Study of Before-Arc Process in Metal Vapor Plasma's Proximal Cathode Region. Part II the Influence of Macroscopic Parameters on the Proximal Cathode Region." Applied Mechanics and Materials 325-326 (June 2013): 1343–46. http://dx.doi.org/10.4028/www.scientific.net/amm.325-326.1343.

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The moment of vacuum breaker contacts opening to arc creating process is an unbalanced gaseous breakdown process. This before-arc process is the foundation of studying arc process. The mechanism of the metal vapor arc is different from other gas medium and contains complex electrode process. The proximal cathode region is the important area for vacuum arc forming and it is affected by many factors. The influences of the different electrode separations, different secondary emission coefficient on electronic density, electronic temperature and electric potential, were analysed in this paper. The

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28

NOVÁK, S., R. HRACH, and B. CALUSINSKT. "Study of secondary electron emission from plasma polymerized materials†." International Journal of Electronics 78, no. 1 (1995): 139–42. http://dx.doi.org/10.1080/00207219508926147.

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29

Heimann, P. A., and J. Blakeslee. "Secondary Electron Emission during Ion Implantation." Journal of The Electrochemical Society 133, no. 4 (1986): 779–80. http://dx.doi.org/10.1149/1.2108675.

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30

Sukamdani, Hariyadi B., and Tatan Sukwika. "Calculation of Primary and Secondary Carbon Footprint in the Environment of Sahid University Jakarta." Journal of Applied Management Research 5, no. 1 (2025): 11–19. https://doi.org/10.36441/jamr.v5i1.3001.

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This study aims to identify and measure the primary and secondary carbon footprints within the environment of Sahid University Jakarta. As an educational institution, a university plays a strategic role in climate change mitigation; however, most campuses in Indonesia have not yet optimally implemented environmentally friendly practices. Sahid University Jakarta is among the institutions that have not been classified as a green campus in the UI GreenMetric rankings. This study was conducted in the Faculty of Engineering using a descriptive-analytical quantitative approach, combining primary da

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31

Savona, V., and E. Runge. "Two Decades of Secondary Emission in Quantum Wells." physica status solidi (b) 234, no. 1 (2002): 96–106. http://dx.doi.org/10.1002/1521-3951(200211)234:1<96::aid-pssb96>3.0.co;2-k.

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32

Frentrup, W., M. Griepentrog, and U. Müller-Jahreis. "Negative Secondary Ion Emission Influenced by Alkali Atoms." physica status solidi (a) 91, no. 2 (1985): 447–52. http://dx.doi.org/10.1002/pssa.2210910213.

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33

Kuznetsova, T. I. "Secondary Emission of Photonic Crystals under Intense Optical Pumping." Bulletin of the Lebedev Physics Institute 48, no. 11 (2021): 357–62. http://dx.doi.org/10.3103/s1068335621110063.

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34

Imal, Khasanul, and Zulfikar Zulfikar. "Application of the R Program for CO2 Emission Calculations Based on Secondary Carbon Footprint at MTs Bahrul Ulum." NEWTON: Networking and Information Technology 3, no. 2 (2024): 29–34. http://dx.doi.org/10.32764/newton.v3i2.4926.

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Global warming is partly caused by the increasing amount of greenhouse gas emissions accumulating in the Earth's atmosphere, leading to a rise in surface temperatures over time. Carbon dioxide (CO2) emissions are the main component of greenhouse gases. The largest CO2 emissions from the energy sector come from the use of electricity generated by building activities. This study aims to analyze the CO2 emissions produced from electricity use at MTs Bahrul Ulum. Data collection on electricity usage was conducted by measuring the power consumption of air conditioners, lights, PCs, and laptops used

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35

Aguilera, L., I. Montero, M. E. Dávila, et al. "CuO nanowires for inhibiting secondary electron emission." Journal of Physics D: Applied Physics 46, no. 16 (2013): 165104. http://dx.doi.org/10.1088/0022-3727/46/16/165104.

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36

Reichert, Gabriel, and Christoph Schmidl. "SWOT Analysis of Non-Technical and Technical Measures towards “(Nearly) Zero-Emission Stove Technologies”." Energies 16, no. 3 (2023): 1388. http://dx.doi.org/10.3390/en16031388.

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Firewood stoves are widespread and popular for renewable heat supply in Europe. Several new technological measures have been developed recently that aim at improving the appliance performance in terms of emissions and efficiency. In order to support the trend towards “(nearly) zero-emissions technologies”, the objective of this study was to provide a profound overview of the most relevant technical primary and secondary measures for emission reduction and to analyze their functionality, the relevant framework conditions for their application and their costs. Since user behavior is essential fo

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37

Ghodrat, Maryam, Bijan Samali, Muhammad Rhamdhani, and Geoffrey Brooks. "Thermodynamic-Based Exergy Analysis of Precious Metal Recovery out of Waste Printed Circuit Board through Black Copper Smelting Process." Energies 12, no. 7 (2019): 1313. http://dx.doi.org/10.3390/en12071313.

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Exergy analysis is one of the useful decision-support tools in assessing the environmental impact related to waste emissions from fossil fuel. This paper proposes a thermodynamic-based design to estimate the exergy quantity and losses during the recycling of copper and other valuable metals out of electronic waste (e-waste) through a secondary copper recycling process. The losses related to recycling, as well as the quality losses linked to metal and oxide dust, can be used as an index of the resource loss and the effectiveness of the selected recycling route. Process-based results are present

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38

Wünsch, R., R. Neugebauer, T. Jalowy, D. Hofmann, H. Rothard, and K. O. Groeneveld. "Velocity effect in secondary electron emission below and above the electronic stopping power maximum." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 146, no. 1-4 (1998): 82–87. http://dx.doi.org/10.1016/s0168-583x(98)00487-x.

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39

Goldmann, A., G. Rosina, E. Bertel, and F. P. Netzer. "The electronic structure of Rhodium: Angle-resolved studies of photoelectron and secondary electron emission." Zeitschrift f�r Physik B Condensed Matter 73, no. 4 (1989): 479–87. http://dx.doi.org/10.1007/bf01319376.

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40

Michizono, Shinichiro, Yoshio Saito, Takayuki Sato, and Shinichi Kobayashi. "Annealing Effects on Secondary Emission and Charging of Alumina Ceramics." IEEJ Transactions on Fundamentals and Materials 119, no. 5 (1999): 562–67. http://dx.doi.org/10.1541/ieejfms1990.119.5_562.

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41

NISHIWAKI, Michiru, and Shigeki KATO. "Study on Secondary Electron Emission from Carbon Materials." Shinku 48, no. 3 (2005): 118–20. http://dx.doi.org/10.3131/jvsj.48.118.

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42

Slangen, Tim, Thijs van Wijk, Vladimir Ćuk, and Sjef Cobben. "The Propagation and Interaction of Supraharmonics from Electric Vehicle Chargers in a Low-Voltage Grid." Energies 13, no. 15 (2020): 3865. http://dx.doi.org/10.3390/en13153865.

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The recent increase in large converter-based devices like electric vehicles and photovoltaics increases supraharmonic emissions in low-voltage grids, potentially affecting customer equipment and the grid. This paper aims to give an overview of the different factors influencing supraharmonic emissions from electric vehicles and studies the propagation of supraharmonic currents through a small, low-voltage grid. Measurements in an unique lab representing a possible future household gave valuable insight on the possible developments in primary and secondary supraharmonic emissions in a convention

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43

Ullah, Shakir, A. H. Dogar, and A. Qayyum. "ION-INDUCED SECONDARY ELECTRON EMISSION FROM 58Ni AND 60Ni: EVIDENCE OF SECONDARY ELECTRONS GENERATED BY THE RECOILING TARGET ATOMS." Nucleus 47, no. 3 (2010): 189–92. https://doi.org/10.71330/thenucleus.2010.882.

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We have measured the secondary electron yield of clean 58Ni and 60Ni bombarded with 2-10 keV Ar + ions. It was found that secondary electron yield of 58Ni is consistently high as compared to the 60Ni. This result is not in line with the most theoretical model of kinetic electron emission, which predict strict proportionality between secondary electron yield and electronic stopping power. We have demonstrated that the measured secondary electron yield is also related to the nuclear stopping power. We thus conclude that higher secondary electron yield of 58Ni is due to the larger contribution of

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44

Gorelik, V. S., and E. Yu Nechaeva. "Secondary emission of chiral (mirror symmetric) phases of amino acids." Bulletin of the Lebedev Physics Institute 37, no. 5 (2010): 162–63. http://dx.doi.org/10.3103/s1068335610050106.

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45

Aravosis, G. D. "Twenty-First Century Truck Electronics—Today's Global Challenge." Proceedings of the Institution of Mechanical Engineers, Part D: Journal of Automobile Engineering 203, no. 1 (1989): 1–9. http://dx.doi.org/10.1243/pime_proc_1989_203_141_02.

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The main catalyst for use of state-of-the-art electronics in commercial trucks in the United States is the need to meet EPA emission standards for the 1990s. Important secondary catalysts are fuel economy, anti-lock brake systems and fleet/driver expectations. There are also myriad other forces related to safety, maintainability, servicing and communication which will be satisfied once electronic systems are installed in trucks. The principal economic justification for incurring the cost of electronics at this time is to satisfy these more stringent gaseous emission and particulate regulatory

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46

Tomashpolsky, Yu Ya, and N. V. Sadovskaya. "Secondary electron emission from oxides: Part III. HT superconductors." Ferroelectrics 163, no. 1 (1995): 129–34. http://dx.doi.org/10.1080/00150199508208271.

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47

Alam, M. K., S. P. Eslami, and A. Nojeh. "Secondary electron emission from single-walled carbon nanotubes." Physica E: Low-dimensional Systems and Nanostructures 42, no. 2 (2009): 124–31. http://dx.doi.org/10.1016/j.physe.2009.09.012.

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48

Boubaya, M., and G. Blaise. "Charging regime of PMMA studied by secondary electron emission." European Physical Journal Applied Physics 37, no. 1 (2006): 79–86. http://dx.doi.org/10.1051/epjap:2006128.

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49

Sadovoy, Vladimir Yu, Vladimir D. Blank, Sergey A. Terentiev, Dmitriy V. Teteruk, and Sergey Yu Troschiev. "CRYSTALLOGRAPHIC ORIENTATION INFLUENCE ON SECONDARY ELECTRON EMISSION COEFFICIENT OF A SINGLE CRYSTAL OF SYNTHETIC DIAMOND." IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENIY KHIMIYA KHIMICHESKAYA TEKHNOLOGIYA 59, no. 8 (2018): 21. http://dx.doi.org/10.6060/tcct.20165908.30y.

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Dependence of secondary electron emission coefficient on the chosen crystallographic orientation for a synthetic single crystal diamond of type IIb, grown up by method of a temperature gradient, was investigated. The type IIb of single crystal diamond was chosen because of wide applicability in different areas of microelectronics and the semiconductor properties. Quantitative measurements of secondary electron emission coefficients with energy of primary beam about 7 keV and above for various crystallographic orientations was carried out: the highest coefficient of secondary electronic emissio

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50

Boldasov, V. S., A. I. Kuz'michev, D. S. Fillipychev, and A. Yu Shabarov. "Nitrogen gas-discharge electron source with secondary-emission cathode." Radiophysics and Quantum Electronics 37, no. 4 (1994): 319–25. http://dx.doi.org/10.1007/bf01046033.

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