Relevant bibliographies by topics / Electronic Speckle Pattern Interferometry

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Electronic Speckle Pattern Interferometry'

Author: Grafiati
Published: 4 June 2021
Last updated: 10 March 2023

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Consult the lists of relevant articles, books, theses, conference reports, and other scholarly sources on the topic 'Electronic Speckle Pattern Interferometry.'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Journal articles on the topic "Electronic Speckle Pattern Interferometry"

1

Petzing, J. N., and J. R. Tyrer. "Recent developments and applications in electronic speckle pattern interferometry." Journal of Strain Analysis for Engineering Design 33, no. 2 (1998): 153–69. http://dx.doi.org/10.1243/0309324981512887.

Full text
Abstract:
Electronic speckle pattern interferometry (ESPI) is a wholefield non-contact optical metrology technique for displacement measurement, based on the optical physics of surface-generated laser speckle. Since its inception during the early 1970s ESPI has gradually evolved into different optical designs and has been applied to a range of engineering and non-engineering applications. Development of ESPI has continued during the 1990s with the introduction of new laser and optical technology into the interferometers, allowing further optimization and extending the potential applicability of the tech
APA, Harvard, Vancouver, ISO, and other styles
2

Ahmadshahi, M. A., Sridhar Krishnaswamy, and S. Nemat-Nasser. "Dynamic Holographic-Electronic Speckle-Pattern Interferometry." Journal of Applied Mechanics 60, no. 4 (1993): 866–74. http://dx.doi.org/10.1115/1.2900995.

Full text
Abstract:
The development of a nondestructive, full-field, quantitative optical technique, and its feasibility to study dynamic deformations of opaque and diffusively reflecting solids under transient loads, are discussed. The technique involves recording a sequence of dynamically changing two-beam speckle interference patterns (also called holographic speckle patterns) of a rapidly deforming body which is doubly illuminated by a laser light source. The time sequence of speckle patterns is recorded by means of a high-speed camera on an ultra-sensitive 35-mm film. The developed negatives are then digitiz
APA, Harvard, Vancouver, ISO, and other styles
3

Yonemura, Motoki, Shigeru Hagihara, and Tsuyoshi Nishisaka. "ENDOSCOPIC ELECTRONIC SPECKLE PATTERN INTERFEROMETRY." JOURNAL OF JAPAN SOCIETY FOR LASER SURGERY AND MEDICINE 5, no. 3 (1985): 339–42. http://dx.doi.org/10.2530/jslsm1980.5.3_339.

Full text
APA, Harvard, Vancouver, ISO, and other styles
4

Sharp, Brad. "Electronic speckle pattern interferometry (ESPI)." Optics and Lasers in Engineering 11, no. 4 (1989): 241–55. http://dx.doi.org/10.1016/0143-8166(89)90062-6.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Gottschalk, Josefine, Erik Krumnow, Kai Henning Lietzau, Andreas H. Foitzik, and Maria Richetta. "Monitoring of Cytotoxic Induced Cellular Displacements by Utilizing Electronic Speckle Pattern Interferometry." Materials Science Forum 941 (December 2018): 2513–17. http://dx.doi.org/10.4028/www.scientific.net/msf.941.2513.

Full text
Abstract:
Modern medical science delivers through innovative chemical or mechanical/physical means new strategies to treat patients mildly and fight diseases accurately. In line with this development a screening procedure for tissue samples under usage of the electronic speckle pattern interferometry is developed at the University of Applied Science Wildau. The paper at hand provides the corner stone for such a procedure in form of an incubation system that is adapted to the properties of an electronic speckle pattern interferometer and allows the incubation as well as study of samples over time. As a r
APA, Harvard, Vancouver, ISO, and other styles
6

Alcalá Ochoa, Noe, Fernando Mendoza Santoyo, Carlos Pérez López, and Bernardino Barrientos. "Multiplicative electronic speckle-pattern interferometry fringes." Applied Optics 39, no. 28 (2000): 5138. http://dx.doi.org/10.1364/ao.39.005138.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

Joenathan, C., P. Haible, and H. J. Tiziani. "Temporal Speckle Pattern Interferometry." Optics and Photonics News 9, no. 12 (1998): 22. http://dx.doi.org/10.1364/opn.9.12.000022.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

Umezaki, Eisaku, Takao Suzuki, and Masamitsu Takahashi. "OS01W0220 Measurement of deformation of wood joints using electronic speckle pattern interferometry." Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics 2003.2 (2003): _OS01W0220. http://dx.doi.org/10.1299/jsmeatem.2003.2._os01w0220.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Moore, Thomas. "Electronic speckle pattern interferometry for modal analysis." Journal of the Acoustical Society of America 118, no. 3 (2005): 1929. http://dx.doi.org/10.1121/1.4780713.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Albertazzi G., Armando. "Radial Metrology with Electronic Speckle Pattern Interferometry." Journal of Holography and Speckle 3, no. 2 (2006): 117–24. http://dx.doi.org/10.1166/jhs.2006.018.

Full text
APA, Harvard, Vancouver, ISO, and other styles

Dissertations / Theses on the topic "Electronic Speckle Pattern Interferometry"

1

LIETZAU, KAI-HENNING. "Electronic speckle pattern interferometry for cancer research." Doctoral thesis, Università degli Studi di Roma "Tor Vergata", 2015. http://hdl.handle.net/2108/202465.

Full text
Abstract:
The determination of mechanical properties is a topic of on-going research and has over the years provided new insights regarding complex biochemical processes such as the cell cycle, the progression of diseases and even influenced new forms of therapeutically treatment. However, this field of biomechanical research strongly depends on the analysis of biological samples and their mechanical behavior under stress. In order to achieve reliable results, a high resolution measurement technology and a gentle stimulation method are needed to examine the samples as close as possible to their or
APA, Harvard, Vancouver, ISO, and other styles
2

Montgomery, Paul C. "Forward looking innovations in electronic speckle pattern interferometry (ESPI)." Thesis, Loughborough University, 1987. https://dspace.lboro.ac.uk/2134/11756.

Full text
Abstract:
Electronic Speckle Pattern Interferometry (ESPI) dates from 1971. Attempts at commercial exploitation were unsuccessful; at the beginning of this decade it remained essentially a laboratory technique. Problems arose from the practical operation of the instrument and the nature of the output. Correlation fringes are intrinsically noisy and their quality depends on many interrelated factors. It is shown that by simplifying the optical design and improving the quality of the optical components, the fringe contrast is greatly improved and the instrument is made easier to use. Extensions and improv
APA, Harvard, Vancouver, ISO, and other styles
3

Albrecht, Daniel J. F. "Electronic Speckle Pattern Interferometry : instruments development, optimisation and applications." Thesis, Loughborough University, 1998. https://dspace.lboro.ac.uk/2134/32474.

Full text
Abstract:
Optical interferometric techniques are being increasingly used in industry. These non contact techniques, using laser methods based on speckle interferometry, assure a greater accuracy in measuring displacements caused by deformations. One such technique, Electronic Speckle Pattern Interferometry (ESPI), has been used successfully, by analysis of the reaction of mechanical components to induced mechanical or thermal stress, for the measurements of in-situ, real time, full-field, in-plane and out-of-plane displacements and the detection of detachments, micro-cracks occurring as internal and ext
APA, Harvard, Vancouver, ISO, and other styles
4

Cavusoglu, Mehmet Cagdas. "Improvements in electronic speckle pattern interferometry for residual stress measurements." Thesis, University of British Columbia, 2007. http://hdl.handle.net/2429/31579.

Full text
Abstract:
Electronic Speckle Pattern Interferometry (ESPI) is an optical technique used for measuring surface displacements in the order of a wavelength of light by comparing interference patterns taken before and after surface deformation. Residual stress measurement is one of the applications where ESPI is useful. The technique is attractive because it provides very detailed information on deformation field and low per-measurement cost. However, ESPI data possess high noise content due to its high sensitivity to disturbances. In this research, factors that affect the quality of ESPI data were studied.
APA, Harvard, Vancouver, ISO, and other styles
5

Eck, Thomas. "Measurement of vibrational energy flow using electronic speckle pattern interferometry." Thesis, Loughborough University, 2007. https://dspace.lboro.ac.uk/2134/35529.

Full text
Abstract:
Vibrational energy flow (VEF) analysis (VEFA) is used to attain vibrational energy flow information within a vibrating structure of interest. Two essential pieces of information are provided, the direction of the energy flow as well as the magnitude of the energy flow. Once this information is available, vibration may be manipulated in order to suppress undesired vibrational phenomena. The measurement of VEF is an important part in providing VEF information from real structures. In the past the measurement of VEF was restricted to single point measurements only. However, recent developments in
APA, Harvard, Vancouver, ISO, and other styles
6

STOLLFUSS, CARSTEN. "Electronic speckle pattern interferometry for vitality tests in life science." Doctoral thesis, Università degli Studi di Roma "Tor Vergata", 2015. http://hdl.handle.net/2108/203013.

Full text
Abstract:
This thesis focuses on the vitality analysis of single cells with the help of an optical measurement system. The Electronic Speckle Pattern Interferometry (ESPI) is an optical measurement method utilising an illuminated optical surface to create a Speckle or Speckle Pattern from a monochromatic light source. A Speckle Pattern is unique to its emitted surface and therefore rich on information about the surface. In addition, it can be used to analyse and classify microscopic specimen and even microscopic biological samples like cells. Its use to classify biological cells is still at a basic stag
APA, Harvard, Vancouver, ISO, and other styles
7

Saif, Babak Nasser. "Simultaneous phase shifted digital speckle pattern interferometry." Diss., The University of Arizona, 2004. http://hdl.handle.net/10150/280499.

Full text
Abstract:
The James Webb Space Telescope (JWST) is an anastigmatic, segmented cryogenic telescope. The stability of the primary mirror back-plane is a major concern in co-phasing the telescope and in the longer term stability of its image quality. The back-plane is a 6.6 meter structure constructed of carbon fiber, and is therefore a "diffuse" object, an object with surface roughness larger than the wavelength of the light. For this reason classical interferometeric measurements will not work. The objective is to design and characterize a Simultaneous phase shifted Digital Speckle Pattern Interferometer
APA, Harvard, Vancouver, ISO, and other styles
8

Lu, Min [Verfasser]. "Adjustable Aperture Multiplexing Technique in Electronic Speckle Pattern Interferometry / Min Lu." Düren : Shaker, 2019. http://d-nb.info/1188553666/34.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Ibrahim, Jamal S. "Analysis of the industrial application of electronic speckle pattern shearing interferometry." Thesis, Loughborough University, 2006. https://dspace.lboro.ac.uk/2134/7953.

Full text
Abstract:
Dunlop Aerospace Braking Systems Plc. (DABS) is an international leading aircraft wheel and brake manufacturer. DABS had two wheel units, which were causing qualification problems in terms of fatigue cracking. Loughborough University (LU) proposed a novel robust non-contact, and non-destructive optical Shearographic Sensor System (SSS) for measuring and studying aircraft wheel deformation and behaviour when subjected to large static structural loading, with the aim to: i) Develop a novel robust optical sensor system for routine industrial use. ii) Demonstrate the novel and routine implementati
APA, Harvard, Vancouver, ISO, and other styles
10

Kerr, David. "Extraction of displacement data from Electronic Speckle Pattern Interferometric fringe patterns using digital image processing techniques." Thesis, Loughborough University, 1992. https://dspace.lboro.ac.uk/2134/28205.

Full text
Abstract:
The commercial exploitation of Electronic Speckle Pattern Interferometry (ESPI) is now gathering pace with manufacturers marketing products in Europe and the USA. The power of the technique both in a research and an industrial inspection role has brought pressure from the engineering community for an automated fringe analysis system.
APA, Harvard, Vancouver, ISO, and other styles

Books on the topic "Electronic Speckle Pattern Interferometry"

1

1960-, Meinlschmidt Peter, Hinsch K. D. 1941-, and Sirohi R. S, eds. Selected papers on electronic speckle pattern interferometry: Principles and practice. SPIE Optical Engineering Press, 1996.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
2

K, Rastogi P., ed. Digital speckle pattern interferometry and related techniques. Wiley, 2001.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
3

Steinchen, Wolfgang. Digital shearography: Theory and application of digital Speckle pattern shearing interferometry. SPIE Press, 2003.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
4

Albrecht, Daniel Jacques Felicien. Electronic speckle pattern interferometry instruments development, optimisation and applications. 1998.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
5

Montgomery, P. C. Forward looking innovations in electronic speckle pattern interferometry (ESPI). 1987.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
6

Hinsch, Klaus D., Peter Meinlschmidt, and Rajpal S. Sirohi. Selected Papers on Electronic Speckle Pattern Interferometry: Principles and Practice. SPIE, 1996.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
7

Shellabear, Michael C. Application of electronic speckle pattern interferometry to the study of three-dimensional mechanical vibrations. 1991.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
8

Santoyo, F. Mendoza. On the underlying optical mechanisms of the electronic speckle pattern interferometer (ESPI). 1988.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
9

Rowland, Adrian Charles. Holographic and electronic speckle pattern interferometry applied to the measurement of static and dynamic mechanical properties of elastomers. 1988.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
10

Zhang, Zhong Yi. Visualisation and quantification of the defects in glass-fibre reinforced polymer composite materials using electronic speckle pattern interferometry. 1999.

Find full text
APA, Harvard, Vancouver, ISO, and other styles

Book chapters on the topic "Electronic Speckle Pattern Interferometry"

1

Løkberg, Ole J. "Electronic Speckle Pattern Interferometry." In Optical Metrology. Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6_36.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Yang, Lianxiang, and Xinya Gao. "Electronic Speckle Pattern Interferometry (ESPI)." In Handbook of Laser Technology and Applications, 2nd ed. CRC Press, 2021. http://dx.doi.org/10.1201/9781003130123-5.

Full text
APA, Harvard, Vancouver, ISO, and other styles
3

Dupont, O., L. Joannes, J. L. Dewandel, and J. C. Legros. "Use of Electronic Speckle Pattern Interferometry in Fluid Physics." In Interferometry in Speckle Light. Springer Berlin Heidelberg, 2000. http://dx.doi.org/10.1007/978-3-642-57323-1_47.

Full text
APA, Harvard, Vancouver, ISO, and other styles
4

Soares, O. D. D., A. L. V. S. Lage, and H. Sakowski. "Improvements on Electronic Speckle Pattern Interferometry." In Optical Metrology. Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6_38.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Dewandel, J. L., F. Van Poelvoorde, and J. C. Legros. "Use of Electronic Speckle Pattern Interferometry on the Human Skull Sutures Behaviour." In Interferometry in Speckle Light. Springer Berlin Heidelberg, 2000. http://dx.doi.org/10.1007/978-3-642-57323-1_46.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Rodriguez, D., M. Dapena, M. Gallas, M. T. Abeleira, D. Suárez, and V. Moreno. "A Novel Fiber Illumination System for In-plane Displacement Measurement in Electronic Speckle Pattern Interferometry." In Interferometry in Speckle Light. Springer Berlin Heidelberg, 2000. http://dx.doi.org/10.1007/978-3-642-57323-1_33.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

Maji, A. K., and J. L. Wang. "Electronic Speckle Pattern Interferometry in Characterizing Rock Fracture." In Review of Progress in Quantitative Nondestructive Evaluation. Springer US, 1991. http://dx.doi.org/10.1007/978-1-4615-3742-7_79.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

Yoshida, Sanichiro, David Didie, Jong-Sung Kim, and Ik-Keun Park. "Noise Reduction in Amplitude-Fluctuation Electronic Speckle-Pattern Interferometry." In Advancement of Optical Methods in Experimental Mechanics, Volume 3. Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-63028-1_5.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Vandenrijt, Jean-François, Cédric Thizy, Igor Alexeenko, et al. "Electronic Speckle Pattern Interferometry at Long Infrared Wavelengths. Scattering Requirements." In Fringe 2009. Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-03051-2_102.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Hasegawa, Shun, Tomohiro Sasaki, Sanichiro Yoshida, and Seth L. Hebert. "Analysis of Fatigue of Metals by Electronic Speckle Pattern Interferometry." In Advancement of Optical Methods in Experimental Mechanics, Volume 3. Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-06986-9_13.

Full text
APA, Harvard, Vancouver, ISO, and other styles

Conference papers on the topic "Electronic Speckle Pattern Interferometry"

1

Lokberg, Ole J. "Electronic Speckle Pattern Interferometry." In Holography Applications, edited by Jingtang Ke and Ryszard J. Pryputniewicz. SPIE, 1988. http://dx.doi.org/10.1117/12.939087.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Tyrer, John. "Electronic Speckle Pattern Interferometry." In Holography. Optica Publishing Group, 1986. http://dx.doi.org/10.1364/holography.1986.mc2.

Full text
Abstract:
Holographic workstations are now enabling the advantages of Holographic Interferometry (HI) to be taken outside research laboratories and placed alongside manufacturing equipment. Most rigidization problems have been overcome but two handicaps still limit its widespread application. They are: i) Relative speed of the recording medium requiring either large expensive lasers or long exposure periods; ii) The analysis of the resultant interferograms which require suitable highly skilled support.
APA, Harvard, Vancouver, ISO, and other styles
3

Sirohi, Rajpal S. "Versatile electronic speckle pattern interferometry." In SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, edited by Malgorzata Kujawinska, Gordon M. Brown, and Mitsuo Takeda. SPIE, 1998. http://dx.doi.org/10.1117/12.312964.

Full text
APA, Harvard, Vancouver, ISO, and other styles
4

Rodríguez-Vera, R., R. R. Cordero, F. Labbe, J. A. Rayas, Amalia Martínez, and F. Mendoza-Santoyo. "Systematic error compensation in electronic speckle pattern shearing interferometry." In Speckle06: Speckles, From Grains to Flowers, edited by Pierre Slangen and Christine Cerruti. SPIE, 2006. http://dx.doi.org/10.1117/12.695375.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Moreno Yeras, Alfredo. "Tube junction study by electronic speckle pattern interferometry." In Speckle Metrology 2003. SPIE, 2003. http://dx.doi.org/10.1117/12.516664.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Tyrer, John R. ""Continuous" Pulsed Electronic Speckle Pattern Interferometry." In 1st Int'l Conf on Vibrational Control in Optics and Metrology, edited by Lionel R. Baker and Daniel Vukobratovich. SPIE, 1987. http://dx.doi.org/10.1117/12.937913.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

Soares, Oliverio D. D. "Synchronous Stroboscopic Electronic Speckle Pattern Interferometry." In 1986 International Symposium/Innsbruck, edited by Robert E. Fischer and Philip J. Rogers. SPIE, 1986. http://dx.doi.org/10.1117/12.938449.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

Mendoza Santoyo, Fernando, Ramon Rodriguez-Vera, and David Kerr. "Surface contouring using electronic speckle pattern interferometry." In Second Intl Conf on Photomechanics and Speckle Metrology: Speckle Techniques, Birefringence Methods, and Applications to Solid Mechanics. SPIE, 1991. http://dx.doi.org/10.1117/12.49512.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Bavigadda, Viswanath, Raghavendra Jallapuram, Vincent Toal, and Emilia Mihaylova. "Vibration phase measurements using holographic optical elements based electronic speckle pattern interferometry." In Speckle 2010, edited by Armando Albertazzi Goncalves, Jr. and Guillermo H. Kaufmann. SPIE, 2010. http://dx.doi.org/10.1117/12.870583.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Patorski, Krzysztof. "Recent developments in electronic speckle pattern interferometry." In 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, edited by Jan Perina, Sr., Miroslav Hrabovsky, and Jaromir Krepelka. SPIE, 2001. http://dx.doi.org/10.1117/12.417816.

Full text
APA, Harvard, Vancouver, ISO, and other styles

Reports on the topic "Electronic Speckle Pattern Interferometry"

1

Pierre, Christophe. An Electronic Speckle Pattern Interferometry System for the Study of Mistuned Bladed Disks. Defense Technical Information Center, 2000. http://dx.doi.org/10.21236/ada374336.

Full text
APA, Harvard, Vancouver, ISO, and other styles
We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!

To the bibliography